Aging test platform for display chips (Micro LED)
CN310060735SActive Publication Date: 2026-06-30RAYSOLVE OPTOELECTRONICS (SUZHOU) CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- RAYSOLVE OPTOELECTRONICS (SUZHOU) CO LTD
- Filing Date
- 2025-12-31
- Publication Date
- 2026-06-30
Smart Images

Figure 000007_ABST
Abstract
1. Name of the product in this design: Aging test platform for display chips (Micro LED). 2. Purpose of this design: For aging tests of Micro LED display chips. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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