Aging test platform for display chips (Micro LED)

CN310060735SActive Publication Date: 2026-06-30RAYSOLVE OPTOELECTRONICS (SUZHOU) CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
RAYSOLVE OPTOELECTRONICS (SUZHOU) CO LTD
Filing Date
2025-12-31
Publication Date
2026-06-30

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Abstract

1. Name of the product in this design: Aging test platform for display chips (Micro LED). 2. Purpose of this design: For aging tests of Micro LED display chips. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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