Semiconductor light source and measuring method

EP4751518A1Pending Publication Date: 2026-06-03AMS OSRAM INT GMBH
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Patent Information

Authority / Receiving Office
EP · EP
Patent Type
Applications
Current Assignee / Owner
AMS OSRAM INT GMBH
Filing Date
2024-07-10
Publication Date
2026-06-03

AI Technical Summary

Technical Problem

Existing semiconductor light sources face challenges in reliably detecting errors, particularly in large LED circuits where individual LED monitoring is difficult due to ambient influences and aging, leading to potential security and design issues in applications like the automotive industry.

Method used

A semiconductor light source with multiple light strands and a control unit that includes a comparison module to analyze electrical parameters like forward voltage, allowing for error detection across similar series or parallel circuits, minimizing interference by synchronizing and grouping LEDs under similar conditions, and using ADC measurements for accurate voltage comparisons.

Benefits of technology

This solution enables reliable error detection in large LED circuits, reducing false positives from ambient influences and aging, improving accuracy and reliability while allowing for flexible operation and design flexibility without additional measurement components.

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Abstract

In at least one embodiment, the semiconductor light source (1) comprises a plurality of light sections (2) and a control unit (3), wherein - each of the light sections (2) comprises a plurality of optoelectronic semiconductor chips (21) for generating light, such as µLEDs, - the light sections (2) are operated in the same way, and - the control unit (3) comprises a comparison module (31) which is configured to detect at least one electric parameter (P) of each of the light sections (2) and to use numerical values for the individual light sections (2) of the detected at least one electric parameter (P) for a fault analysis.
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