Electron microscopy support

EP4754798A1Pending Publication Date: 2026-06-10UNITED KINGDOM RESEARCH AND INNOVATION
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Patent Information

Authority / Receiving Office
EP · EP
Patent Type
Applications
Current Assignee / Owner
UNITED KINGDOM RESEARCH AND INNOVATION
Filing Date
2024-07-26
Publication Date
2026-06-10

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Abstract

The present invention relates to an electron microscopy sample support (20), and a method of manufacturing an electron microscopy sample support. The support is particularly useful in cryoEM imaging and sample preparation. The support comprises a metallic foil (21) having one or more holes therethrough and a support member (22), wherein the plane of the metallic foil intersects the support member.
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