Abnormality detection device
JP2024175252APending Publication Date: 2024-12-18HITACHI LTD
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Patent Information
- Application Number
- JP2023092886
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2023-06-06
- Publication Date
- 2024-12-18
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Abstract
To provide an abnormality detection device capable of detecting abnormality of a sensor for detecting at least one apparatus and a physical amount about the apparatus by being used by a device or system including a plurality of apparatuses and a plurality of sensors.SOLUTION: A correlation search part 2 selects at least one correlation sensor having a correlation with an object sensor from among a plurality of sensors S on the basis of a correlation coefficient showing a correlation between a detection value of the object sensor of an abnormality detection object and detection values of non-object sensors other than the object sensor. A virtual output generation part 3 generates a virtual object output and a virtual correlation output obtained by simulating respective detection values of the object sensor and the correlation sensor on the basis of models of an object apparatus and a correlation apparatus being respective detection objects of the object sensor and the correlation sensor among a plurality of apparatuses E. An abnormality determination part 4 determines abnormality of the object apparatus or abnormality of the object sensor on the basis of comparison between the detection value of the correlation sensor and the virtual correlation output in the case that a difference between the detection value of the object sensor and the virtual object output exceeds a prescribed first threshold.SELECTED DRAWING: Figure 1
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