Inspection unit and inspection device

Abstract

To provide an inspection unit capable of achieving the efficiency of inspection and the maintenance of an inspection element compatibly.SOLUTION: An inspection unit 100 includes an inspection element 11 and can inspect a defect of a subject P passing across in front of the inspection element 11. The inspection unit 100 also includes: a shutter 30 capable of opening and closing the front of the inspection element 11; and a structure for switching the shutter 30 from a closed state or an open state to the open state or the closed state according to a passing situation of the subject P. The closed state is such a state that the front of the inspection element 11 is covered, and the open state is such a state that the front of inspection element 11 is uncovered.SELECTED DRAWING: Figure 4

Description

Technical Field

[0001] The present disclosure relates to an inspection unit and an inspection apparatus.

Background Art

[0002] An inspection apparatus is known in which a specimen is placed in front of an inspection element to inspect for defects in the specimen (see Patent Document 1).

Prior Art Documents

Patent Documents

[0003]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0004] Patent Document 1 describes an ultrasonic inspection apparatus including a transmission unit and a reception unit. The transmission unit has a transmission surface that transmits an ultrasonic beam toward a specimen, and the reception unit has a reception surface that receives the ultrasonic beam that has passed through the specimen. The ultrasonic inspection apparatus described in Patent Document 1 is configured to be able to determine the presence or absence of a defect in a specimen by placing the specimen between the transmission surface and the reception surface and receiving, at the reception surface, the ultrasonic wave transmitted from the transmission surface and passing through the specimen.

[0005] In an inspection apparatus for inspecting the presence or absence of a defect in a specimen, it is desirable to achieve both improvement in inspection efficiency and preservation of the apparatus during inspection.

[0006] On the other hand, depending on the configuration described in Patent Document 1, there is a risk that foreign matter such as dust may adhere to the transmission surface or the reception surface during inspection.

[0007] The present disclosure has been made based on such circumstances, and an object of one aspect of the present disclosure is to provide an inspection unit capable of achieving both improvement in inspection efficiency and preservation of the inspection element.

Means for Solving the Problem

[0008] (1) An inspection unit according to an aspect of the present disclosure includes an inspection element, and is an inspection unit capable of inspecting a defect of a subject passing across the front of the inspection element, and includes a shutter capable of opening and closing the front of the inspection element, and a mechanism for switching the shutter from a closed state to an open state or from the open state to the closed state according to the passing state of the subject. The closed state is a state in which the front of the inspection element is covered, and the open state is a state in which the front of the inspection element is opened.

[0009] (2) In the above (1), the shutter may be in the open state when the subject passes in front of the inspection element, and may be in the closed state after the subject has passed in front of the inspection element.

[0010] (3) In the above (1) or (2), the shutter may swing between the closed state and the open state.

[0011] (4) In any one of the above (1) to (3), the shutter has a contact surface that contacts the subject when the subject passes, and the contact surface may be pushed by the subject to switch to the open state.

[0012] (5) In any one of the above (1) to (4), the mechanism may include a rotation axis that rotatably supports the shutter upstream of the inspection element in the passing direction of the subject.

[0013] (6) In the above (5), the rotation axis extends in the horizontal direction, and the shutter may switch from the open state to the closed state by its own weight.

[0014] (7) In any one of the above (1) to (6), the mechanism may have an elastic member that pulls the shutter so as to switch from the open state to the closed state.

[0015] (8) In any one of (1) to (7) above, the inspection element may be an ultrasonic transmission element or an ultrasonic reception element.

[0016] (9) In any one of (1) to (8) above, the shutter may have an overlapping portion that faces the subject from the inspection element side or the opposite side of the inspection element in the open state.

[0017] (10) In (9) above, the overlapping portion may be in a long shape with the passing direction of the subject as the longitudinal direction.

[0018] (11) An inspection apparatus according to another aspect of the present disclosure includes a first inspection member having a first inspection element, and a second inspection member having a second inspection element facing the first inspection element with a space therebetween, and is an inspection apparatus capable of inspecting a defect of a subject passing between the first inspection element and the second inspection element, and includes a shutter that can open and close in front of at least one of the first inspection element and the second inspection element, and a mechanism for switching the shutter from a closed state to an open state or from an open state to a closed state according to the passing situation of the subject, wherein the closed state is a state in which at least one of the front of the first inspection element and the second inspection element is covered, and the open state is a state in which at least one of the front of the first inspection element and the second inspection element is opened.

[0019] In (11) above, the shutter may have a first surface that covers the front of the first inspection element in the closed state and a second surface that covers the front of the second inspection element in the closed state.

[0020] In the present disclosure, "in front of the inspection element" means the direction in which the subject is inspected as seen from the inspection element. The state where "the front of the inspection element is covered" may be a state where the front of the inspection element is completely covered, or may be a state where a part of the front of the inspection element is covered. That the shutter is "openable and closable" is not limited to a configuration in which the shutter automatically opens and closes, and includes a configuration in which it opens and closes passively.

Advantages of the Invention

[0021] The inspection unit according to one aspect of the present disclosure can achieve both the improvement of inspection efficiency and the preservation of inspection elements.

Brief Description of the Drawings

[0022]

Figure 1

Figure 2

Figure 3

Figure 4

Figure 5

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Figure 8

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Figure 10

Figure 11

Figure 12

Figure 13

Figure 14

[0023] Hereinafter, embodiments of the present disclosure will be described in detail with appropriate reference to the drawings. Regarding the numerical values described in this specification, it is possible to adopt only one of the described upper limit value and lower limit value, or to arbitrarily combine the upper limit value and the lower limit value. In this specification, all combinable numerical ranges are described as preferred ranges. Also, each figure is schematic and may not match the actual dimensions, ratios, etc. In the present disclosure, the descriptions of "first" and "second" are for distinguishing the components to which they are attached and do not limit the number, order, priority, etc.

[0024] [First Embodiment] The inspection device 1 shown in FIGS. 1 and 2 includes inspection elements. More specifically, the inspection device 1 includes a first inspection member 10 having a first inspection element 11 and a second inspection member 20 having a second inspection element 21 that faces the first inspection element 11 with a space therebetween. As shown in FIG. 2, the inspection device 1 is configured to be able to inspect for defects in the specimen P that passes between the first inspection element 11 and the second inspection element 21. In the inspection device 1, the specimen P passes through the gap between the first inspection member 10 and the second inspection member 20 in a horizontal one direction (the positive X direction in each figure). The inspection device 1 includes a shutter 30 that can open and close in front of at least one of the first inspection element 11 and the second inspection element 21, and a mechanism (switching mechanism 40) for switching the shutter 30 from a closed state to an open state or from an open state to a closed state according to the passing state of the specimen P. As shown in FIG. 3, the closed state S1 is a state in which at least one of the front sides of the first inspection element 11 and the second inspection element 21 is covered. Also, the open state is a state in which at least one of the front sides of the first inspection element 11 and the second inspection element 21 is opened. More specifically, the open state is a state in which the front side of the inspection element whose front side was covered in the closed state S1 among the first inspection element 11 and the second inspection element 21 is opened.

[0025] As shown in FIG. 4, the inspection device 1 includes an inspection unit 100. In the present embodiment, the inspection unit 100 is configured as the first inspection member 10 or as a part of the first inspection member 10. The inspection unit 100 includes the first inspection element 11 and is capable of inspecting for defects in the specimen P that passes across the front of the first inspection element 11. The inspection unit 100 includes a shutter 30 that can open and close in front of the first inspection element 11, and a mechanism (switching mechanism 40) for switching the shutter 30 from a closed state to an open state or from an open state to a closed state according to the passing state of the specimen P. As shown in FIGS. 4, 6, and 9, the closed state S1 is a state in which the front of the first inspection element 11 is covered. Also, as shown in FIGS. 7 and 8, the open state S2 is a state in which the front of the first inspection element 11 is opened.

[0026] Since the inspection unit 100 can inspect the defects of the subject P by passing the subject P across the front of the first inspection element 11, the efficiency of the inspection can be improved. Further, since the inspection unit 100 can switch the shutter 30 from the closed state S1 to the open state S2 or from the open state S2 to the closed state S1 according to the passing state of the subject P, it is possible to prevent foreign matters such as dust from adhering to the first inspection element 11. More specifically, the inspection unit 100 can set the shutter 30 to the open state S2 only when the subject P passes in front of the first inspection element 11, and can cover the front of the first inspection element 11 with the shutter 30 except when inspecting the subject P. Therefore, it is possible to prevent foreign matters such as dust from adhering to the first inspection element 11. Accordingly, the inspection unit 100 can achieve both the improvement of the inspection efficiency and the preservation of the inspection element.

[0027] Since the inspection apparatus 1 can inspect the defects of the subject P by passing the subject P between the first inspection element 11 and the second inspection element 21, the efficiency of the inspection can be improved. Further, since the inspection apparatus 1 can switch the shutter 30 from the closed state S1 to the open state S2 or from the open state S2 to the closed state S1 according to the passing state of the subject P, it is possible to prevent foreign matters such as dust from adhering to at least one of the first inspection element 11 and the second inspection element 21. Accordingly, the inspection apparatus 1 can achieve both the improvement of the inspection efficiency and the preservation of the inspection element.

[0028] Both the inspection apparatus 1 and the inspection unit 100 are aspects of the present disclosure. Hereinafter, after describing the inspection unit 100, the inspection apparatus 1 including the inspection unit 100 will be described.

[0029] <Inspection Unit> As described above, the inspection unit 100 can detect defects of the subject P that passes across the front of the first inspection element 11. In the inspection unit 100, the subject P may decelerate or may stop once when passing in front of the first inspection element 11. However, in the inspection unit 100, it is preferable that the subject P passes in front of the first inspection element 11 while maintaining a constant speed. According to this configuration, the inspection efficiency of the subject P can be improved.

[0030] 〔Subject〕 The subject P is not particularly limited, and examples thereof include a container having a seal portion. The container is not particularly limited, and examples thereof include a bag body such as a pouch having a heat seal portion 101. When the subject P is the pouch, the inspection unit 100 can be used to inspect defects such as a defective seal of the heat seal portion 101. Note that the inspection target by the inspection unit 100 is not limited to a defective seal. The inspection unit 100 may inspect, for example, the presence or absence of air bubbles in the subject P, or may inspect both the defective seal and the presence or absence of air bubbles.

[0031] As shown in FIG. 4, the inspection unit 100 includes a first inspection element 11 and a first housing 12 in which the first inspection element 11 is disposed. The inspection unit 100 further includes a shutter 30 that is movably disposed with respect to the first housing 12, and a switching mechanism 40 that movably connects the shutter 30 to the first housing 12.

[0032] The first housing 12 has a first wall 13 that defines a passage through which the subject P passes. The first inspection element 11 is arranged so as to face the passage. The first inspection element 11 is arranged, for example, on the inner surface of the first wall 13 (the surface on the opposite side of the surface of the first wall 13 that defines the passage), or is embedded in the first wall 13. The first wall 13 is provided with a window portion 13a for exposing the first inspection element 11 to the passage. Note that the first inspection element 11 may be arranged on the outer surface of the first wall 13 (the surface that defines the passage). In this case, the first wall 13 may not be provided with the window portion 13a. In the present disclosure, "arranged on the first wall" includes not only a configuration directly arranged on the first wall but also a configuration indirectly arranged via other members.

[0033] The first inspection element 11 has a first inspection surface 11a that faces the passage. The first inspection surface 11a is a surface that functions to inspect for defects in the subject P. In the present embodiment, the front of the first inspection surface 11a means "in front of the first inspection element".

[0034] The first inspection element 11 only needs to be able to inspect the defects of the subject P when used together with, for example, the aforementioned second inspection element 21, and its specific configuration is not particularly limited. The first inspection element 11 may be, for example, an element that transmits or receives sound waves such as ultrasonic waves, an element that transmits or receives electromagnetic waves such as X-rays, infrared rays, and near-infrared rays, or an element for acquiring an image of the subject P. Among them, the first inspection element 11 is preferably an ultrasonic transmitting element or an ultrasonic receiving element. When the first inspection element 11 is an ultrasonic transmitting element, the second inspection element 21 is configured as an ultrasonic receiving element, and when the first inspection element 11 is an ultrasonic receiving element, the second inspection element 21 is configured as an ultrasonic transmitting element. By being an ultrasonic transmitting element or an ultrasonic receiving element, the first inspection element 11 can easily suppress false inspections caused by inspection conditions such as the outside air and the appearance and material of the subject P. Further, when the first inspection element 11 is an ultrasonic transmitting element or an ultrasonic receiving element, the distance between the first inspection element 11 and the second inspection element 21 in the inspection apparatus 1 tends to be small. As a result, it is easy to cover the fronts of both the first inspection element 11 and the second inspection element 21 with one shutter 30. Further, when the fronts of both the first inspection element 11 and the second inspection element 21 are covered with one shutter 30, it is easy to reduce the distance between the first inspection element 11 and the second inspection element 21 and the shutter 30. For this reason, both the first inspection element 11 and the second inspection element 21 can be easily protected by one shutter 30.

[0035] As shown in FIG. 5, the shutter 30 is plate-shaped. More specifically, the shutter 30 has a thickness direction in the direction in which the first inspection element 11 and the second inspection element 21 face each other (the normal direction of the outer surface of the first wall 13. The Y direction in each figure), and is long and has a major axis perpendicular to this thickness direction. The shutter 30 has a contact surface 30a that contacts the object P. The contact surface 30a is constituted by the thickness surface of the shutter 30, and more specifically, is constituted by a surface extending in the major axis direction among the thickness surfaces. Further, the shutter 30 has a through-hole 30b into which a rotation shaft 40a described later is inserted. The through-hole 30b penetrates in the thickness direction at one end side in the longitudinal direction of the shutter 30 (the upstream side (negative X direction) in the passing direction of the object P) (hereinafter, the upstream side in the passing direction of the object P is also simply referred to as the "upstream side").

[0036] The shutter 30 is made of, for example, resin. As will be described later, the shutter 30 swings when pushed by the object P. Therefore, it is desirable that the shutter 30 is lightweight. From such a viewpoint, the shutter 30 may have one or more openings. In the present disclosure, "plate-shaped" means a shape in which the thickness is small with respect to the length and width, and is not limited to a shape in which the plate surface (the surface orthogonal to the thickness direction) is flat. For example, the plate surface may have irregularities formed thereon.

[0037] The shutter 30 has a first surface 30c that faces the outer surface of the first wall 13. In the closed state S1, the first surface 30c covers the front of the first inspection element 11, thereby suppressing foreign matter such as dust from adhering to the first inspection element 11. As the upper limit of the distance between the shutter 30 and the first wall 13 (more specifically, the periphery of the window portion 13a on the outer surface of the first wall 13) in the closed state S1, from the viewpoint of suppressing foreign matter from entering the window portion 13a, it may be 2 mm or 1 mm. On the other hand, the lower limit of the distance is not particularly limited and can be 0 mm or more.

[0038] The shutter 30 is in the open state S2 when the subject P passes in front of the first inspection element 11, and becomes in the closed state S1 after the subject P has passed in front of the first inspection element 11. According to this configuration, it is possible to easily and surely suppress foreign matter such as dust from adhering to the first inspection element 11. Hereinafter, the shutter 30 and the switching mechanism 40 will be described in conjunction with the operation of the shutter 30.

[0039] As shown in FIGS. 4, 6, 7, and 9, the shutter 30 swings between the closed state S1 and the open state S2. The inspection unit 100 has, as a switching mechanism 40, a rotation shaft 40a that is inserted into the through hole 30b of the shutter 30 and connected to the first wall 13. The shutter 30 swings on the outer surface of the first wall 13 around the rotation shaft 40a along this outer surface. By being configured in this way, it is possible to efficiently open and close the shutter 30 while suppressing foreign matter from adhering to the first inspection element 11. Further, according to this configuration, since a power source such as a motor is not required to open and close the shutter 30, the inspection unit 100 can be miniaturized and the shutter 30 can be opened and closed with a simple mechanism.

[0040] As described above, the shutter 30 has a contact surface 30a. The contact surface 30a contacts the subject P when the subject P passes. The shutter 30 switches to the open state S2 when the contact surface 30a is pushed by the subject P. With reference to FIGS. 4, 6, and 7, the procedure for the shutter 30 to switch from the closed state S1 to the open state S2 will be described.

[0041] In the inspection unit 100, as shown in FIG. 4, when the shutter 30 is in the closed state S1, the subject P passes along the outer surface of the first wall 13. The shutter 30 is swingable about the rotation axis 40a, and the end on the downstream side (positive side in the X direction) of the rotation axis 40a in the passing direction of the subject P is configured as a swing end (hereinafter, the downstream side in the passing direction of the subject P is also simply referred to as the "downstream side"). In the closed state S1, the shutter 30 is provided at a position where the portion on the upstream side of the rotation axis 40a in the longitudinal direction does not contact the subject P, and a part on the downstream side of the rotation axis 40a is arranged to block the inside of the passage of the subject P. At this time, the contact surface 30a constitutes the lower surface of the shutter 30, and on the downstream side of the rotation axis 40a, it constitutes an inclined surface that inclines downward from the upstream side to the downstream side in the passing direction of the subject P. The inclined surface may be a flat surface. Note that the shutter 30 is held in the closed state S1 when not in contact with the subject P. The shutter 30 may be configured to be held in the closed state S1, for example, by being supported by another member so that the swing end does not drop below the closed state S1.

[0042] As shown in FIG. 6, when the subject P is conveyed to the downstream side of the rotation axis 40a, the upper end thereof contacts the contact surface 30a. Further, as shown in FIG. 7, after contacting the contact surface 30a, the subject P continues to move straight along the outer surface of the first wall 13 while pushing the contact surface 30a upward. As a result, the shutter 30 is pushed up to the open state S2, and the front of the first inspection element 11 is opened.

[0043] Since the shutter 30 is configured to switch to the open state S2 when the contact surface 30a is pushed by the subject P, it is possible to efficiently open and close the shutter 30 while suppressing the attachment of foreign matter to the first inspection element 11. Further, according to this configuration, since no additional member is required to open the shutter 30, the miniaturization of the inspection unit 100 is promoted, and the opening and closing of the shutter 30 can be performed with a simple mechanism.

[0044] As the upper limit of the inclination angle α (see FIG. 4) of the contact surface 30a (inclined surface) with respect to the passing direction of the subject P in the closed state S1, from the viewpoint of enabling the subject P to easily push up the contact surface 30a, 60° is preferable, 30° is more preferable, and 10° is even more preferable. On the other hand, as the lower limit of the inclination angle α, from the viewpoint of suppressing the shutter 30 from becoming too long, etc., 3° is preferable, and 5° is more preferable.

[0045] The rotation shaft 40a rotatably supports the shutter 30 on the upstream side of the first inspection element 11 in the passing direction of the subject P. According to this configuration, the shutter 30 can be easily switched from the closed state S1 to the open state S2 in response to the passage of the subject P.

[0046] As shown in FIG. 9, when the subject P passes by, the shutter 30 swings down by its own weight at the swinging end. More specifically, the rotation shaft 40a extends in the horizontal direction, and the shutter 30 switches from the open state S2 to the closed state S1 by its own weight. According to this configuration, the shutter 30 can be easily switched from the open state S2 to the closed state S1 in response to the passage of the subject P. Also, according to this configuration, since no additional member is required to close the shutter 30, the miniaturization of the inspection unit 100 is promoted, and the opening and closing of the shutter 30 can be performed with a simple mechanism.

[0047] <Inspection device> Next, an inspection apparatus 1 including the inspection unit 100 will be described. As shown in FIGS. 1 and 2, the inspection apparatus 1 includes a first inspection member 10 and a second inspection member 20. Further, the inspection apparatus 1 includes a top plate 15 fixed to the upper surfaces of the first inspection member 10 and the second inspection member 20, and a transport mechanism 50 that allows a specimen P to pass between a first inspection element 11 and a second inspection element 21. The transport mechanism 50 has a holding portion 51 that holds the specimen P. The transport mechanism 50 transports the specimen P so that the heat seal portion 101 of the specimen P passes between the first inspection element 11 and the second inspection element 21. The transport mechanism 50 transports the specimen P so that the heat seal portion 101 continuously passes between the first inspection element 11 and the second inspection element 21 from one end to the other end. That is, the transport mechanism 50 transports the specimen P along the longitudinal direction of the heat seal portion 101. The transport mechanism 50 transports the specimen P in the vertical direction. Hereinafter, the first inspection member 10 and the second inspection member 20 will be described.

[0048] (First inspection member) As described above, the first inspection member 10 includes the inspection unit 100. The first inspection member 10 includes a first inspection element 11, a first housing 12 in which the first inspection element 11 is disposed, a shutter 30 movably disposed with respect to the first housing 12, and a switching mechanism 40 that movably connects the shutter 30 to the first housing 12. The first housing 12 has a first wall 13 that defines a passage through which the specimen P passes. Further, the first inspection member 10 has a first guide portion 14 for guiding the specimen P on the outer surface of the first wall 13. The first guide portion 14 is continuously provided at the upstream end of the first wall 13. The first guide portion 14 has, for example, a first guide surface 14a that inclines so as to narrow the passage along the passing direction of the specimen P.

[0049] As described above, the first inspection element 11 may be an element that transmits or receives sound waves such as ultrasonic waves, may be an element that transmits or receives electromagnetic waves such as X-rays, infrared rays, and near-infrared rays, or may be an element for acquiring an image of the subject P. In the inspection apparatus 1 of FIGS. 1 and 2, the first inspection element 11 is, for example, an ultrasonic receiving element. The first inspection element 11 has an ultrasonic receiving surface as the first inspection surface 11a. In the inspection apparatus 1, a plurality of first inspection elements 11 may be arranged in an array so as to be exposed from the window portion 13a of the first wall 13.

[0050] (Second inspection member) The second inspection member 20 includes a second inspection element 21 and a second housing 22 in which the second inspection element 21 is arranged. The second housing 22 has a second wall 23 that defines a passage through which the subject P passes. The second inspection element 21 is arranged, for example, on the inner surface of the second wall 23 (the surface on the opposite side of the surface of the second wall 23 that defines the passage) or embedded in the second wall 23. The second wall 23 is provided with a window portion 23a for exposing the second inspection element 21 to the passage. Note that the second inspection element 21 may be arranged on the outer surface of the second wall 23 (the surface that defines the passage). In this case, the second wall 23 may not be provided with the window portion 23a. In the present disclosure, "arranged on the second wall" includes a configuration directly arranged on the second wall and a configuration indirectly arranged via other members.

[0051] Further, the second inspection member 20 has a second guide portion 24 for guiding the subject P on the outer surface of the second wall 23. The second guide portion 24 is continuously provided at the upstream end of the second wall 23. The second guide portion 24 is arranged at a position facing the first guide portion 14 with the passage therebetween. The second guide portion 24 has, for example, a second guide surface 24a that inclines so as to narrow the passage along the passing direction of the subject P.

[0052] The second inspection element 21 is disposed at a position facing the first inspection element 11 with the passage therebetween. The second inspection element 21 has a second inspection surface 21a facing the passage. The second inspection surface 21a is a surface that undertakes the function of inspecting for defects of the subject P. In the present embodiment, the front of the second inspection surface 21a means "the front of the second inspection element". Examples of the second inspection element 21 include an element that transmits or receives acoustic waves such as ultrasonic waves, an element that transmits or receives electromagnetic waves such as X-rays, infrared rays, and near-infrared rays, and an element for acquiring an image of the subject P. The second inspection element 21 is configured corresponding to the type of the first inspection element 11. In the inspection apparatus 1 of FIGS. 1 and 2, the second inspection element 21 is, for example, an ultrasonic transmitting element. The second inspection element 21 has an ultrasonic transmitting surface as the second inspection surface 21a. A plurality of second inspection elements 21 may be arranged in an array so as to be exposed from the window portion 23a of the second wall 23 in the inspection apparatus 1.

[0053] The distance D (see FIG. 2) between the first wall 13 and the second wall 23 can be set according to the thickness of the subject P. From the viewpoint of allowing the subject P to easily pass between the first wall 13 and the second wall 23, the lower limit thereof may be 0.5 mm, 1.0 mm, or 1.5 mm. On the other hand, from the viewpoint of allowing variations in the position of the subject P between the first wall 13 and the second wall 23, the upper limit of the distance D may be 40 mm, 15 mm, 10 mm, or 5 mm. In the inspection apparatus 1, by setting the distance D within the above range, while forming the plate thickness of the shutter 30 in accordance with the distance D, the weight of the shutter 30 can be reduced. As a result, while facilitating the swinging of the shutter 30, it is easy to enhance the protection effect of the first inspection element 11 and the second inspection element 21 by the shutter 30.

[0054] (Shutter) The shutter 30 is provided so as to cover the fronts of both the first inspection element 11 and the second inspection element 21 in the closed state S1 and to open the fronts of both the first inspection element 11 and the second inspection element 21 in the open state S2.

[0055] As shown in FIG. 3, the shutter 30 has a first surface 30c that covers the front of the first inspection element 11 in the closed state S1, and a second surface 30d that covers the front of the second inspection element 21 in the closed state S1. According to this configuration, it is possible to suppress the adhesion of foreign matter to the first inspection element 11 and the second inspection element 21.

[0056] When the shutter 30 covers the front of the second inspection element 21 in the closed state S1, the upper limit of the distance between the shutter 30 and the second wall 23 (more specifically, the periphery of the window portion 23a on the outer surface of the second wall 23) in the closed state S1 may be 2 mm or 1 mm from the viewpoint of suppressing the entry of foreign matter into the window portion 23a. On the other hand, the lower limit of the distance is not particularly limited and can be 0 mm or more.

[0057] [Second Embodiment] <Inspection Unit> The inspection unit 200 in FIG. 10 includes a first inspection element 11 and can inspect defects of a subject that passes across the front of the first inspection element 11. The inspection unit 200 includes a shutter 30 that can open and close the front of the first inspection element 11, and a mechanism (switching mechanism 60) for switching the shutter 30 from the closed state to the open state or from the open state to the closed state according to the passing state of the subject. Further, the inspection unit 200 includes a first housing 12 in which the first inspection element 11 is disposed. The inspection unit 200 can be disposed in the inspection apparatus 1 of the first embodiment instead of the inspection unit 100 of the first embodiment, for example. In the inspection unit 200, the configuration other than the switching mechanism 60 can be the same as that of the inspection unit 100 of the first embodiment. Therefore, only the switching mechanism 60 will be described below.

[0058] (Switching Mechanism) The switching mechanism 60 has a rotation shaft 60a that rotatably supports the shutter 30 on the upstream side of the first inspection element 11 in the passing direction of the subject, and an elastic member 60b that pulls the shutter 30 so as to switch from the open state to the closed state.

[0059] The rotating shaft 60a can have the same configuration as the rotating shaft 40a in the first embodiment. The elastic member 60b is, for example, a spring member. The elastic member 60b is connected to a portion of the shutter 30 upstream of the rotating shaft 60a and the first housing 12. The elastic member 60b is configured such that, for example, when the shutter 30 is in the closed state, no tension is applied to the shutter 30. Further, the elastic member 60b is configured to pull the shutter 30 so that the shutter 30 is in the closed state when the shutter 30 is in the open state. The elastic member 60b is preferably disposed outside the passage of the subject.

[0060] Since the inspection unit 200 has the switching mechanism 60 having the rotating shaft 60a and the elastic member 60b, after the subject passes through the shutter 30, the shutter 30 can be more reliably switched to the closed state. According to the inspection unit 200, for example, even when the rotating shaft 60a does not extend in the horizontal direction and the shutter 30 is not switched to the closed state by its own weight, it is possible to easily suppress foreign matter from adhering to the first inspection element 11.

[0061] [Third Embodiment] <Inspection Unit> The inspection unit 300 in FIG. 11 includes a first inspection element 11 and is capable of inspecting defects of a subject P that passes across the front of the first inspection element 11. The first inspection element 11 is an ultrasonic transmission element or an ultrasonic reception element. The inspection unit 300 includes a shutter 70 that opens and closes the front of the first inspection element 11, and a mechanism (switching mechanism 40) for switching the shutter 70 from a closed state to an open state or from an open state to a closed state according to the passing state of the subject P. Further, the inspection unit 300 includes a first housing 12 in which the first inspection element 11 is disposed. The inspection unit 300 can be disposed in the inspection apparatus 1 of the first embodiment instead of the inspection unit 100 of the first embodiment, for example. In the inspection unit 300, the configuration other than the shutter 70 can be the same as that of the inspection unit 100 of the first embodiment. Therefore, only the shutter 70 will be described below. Note that the inspection unit 300 can also employ the switching mechanism 60 of the second embodiment instead of the switching mechanism 40.

[0062] (Shutter) As shown in FIG. 12, the shutter 70 has a main body 71 and an overlapping portion 72. The main body 71 has a contact surface 71a that contacts the subject P. The main body 71 can have the same configuration as the shutter 30 of the first embodiment. As shown in FIGS. 11 and 13, in the open state, the overlapping portion 72 faces the subject P from the side of the first inspection element 11 (positive side in the Y direction) or the opposite side of the first inspection element 11 (negative side in the Y direction).

[0063] The overlapping portion 72 blocks or deflects ultrasonic waves transmitted from or received by the first inspection element 11. That is, when the shutter 70 does not have the overlapping portion 72, the ultrasonic waves sent toward the gap between the shutter 70 and the subject P travel straight from the ultrasonic wave transmitting element toward the ultrasonic wave receiving element through this gap. As a result, the ultrasonic waves passing through this gap can cause false inspections. On the other hand, since the shutter 70 has the overlapping portion 72, the ultrasonic waves transmitted toward the gap between the shutter 70 and the subject P are blocked or deflected by the overlapping portion 72, and thus do not reach the ultrasonic wave receiving element or the arrival time at the ultrasonic wave receiving element becomes delayed. As a result, the ultrasonic wave receiving element can selectively receive only the ultrasonic waves transmitted through the subject P at an appropriate timing, and the risk of false inspections can be reduced.

[0064] As shown in FIGS. 11 and 13, it is preferable that the overlapping portion 72 is provided so as not to face the heat seal portion 101 of the subject P in the open state. According to this configuration, it is possible to suppress the ultrasonic waves transmitted through the heat seal portion 101 from being blocked or deflected by the overlapping portion 72, and the inspection of the defects of the heat seal portion 101 can be performed more accurately.

[0065] The overlapping portion 72 protrudes, for example, from the side edge of the contact surface 71a of the main body 71. The overlapping portion 72 may have an elongated shape with the passing direction of the subject P as the longitudinal direction. According to this configuration, the overlapping portion 72 can guide the passage of the subject P. As a result, the inspection of the subject P can be performed smoothly.

[0066] [Other Embodiments] The above-described embodiments do not limit the configuration of the present invention. Therefore, based on the description in this specification and common technical knowledge, it is possible to omit, substitute, or add components of each part of the above-described embodiments, and all of them should be interpreted as belonging to the scope of the present invention.

[0067] The specific configurations of the inspection unit and the inspection apparatus in the present disclosure are not limited to the configurations described in the above embodiments. For example, in the above embodiments, the configuration in which the subject is conveyed longitudinally has been described, but the subject may be configured to be conveyed laterally. Even with such a configuration, for example, by configuring the switching mechanism to have the elastic member, the shutter can be easily switched between the closed state and the open state.

[0068] The configuration of the shutter is not limited to the configuration described in the above embodiments. For example, the shutter may be configured to have flexibility and may be provided to deform partially according to the passage situation of the subject. For example, the shutter may be provided to turn up partially or entirely according to the passage situation of the subject, or may be provided to slide partially or entirely. Further, the shutter may be configured not to have the aforementioned contact surface.

[0069] When the shutter has the overlapping portion, this overlapping portion may be provided to define the passage of the subject. For example, as shown in FIG. 14, the facing surface 82a of the overlapping portion 82 with the subject P is arranged in the same plane as the outer surface 83a of the first wall 83, and both the outer surface 83a and the facing surface 82a may be configured to define the passage of the subject P.

[0070] In the third embodiment, as an example of the case where the shutter has the overlapping portion, the configuration in which the first inspection element is an ultrasonic transmission element or an ultrasonic reception element has been described. However, in the present disclosure, the specific configuration of the first inspection element in the case where the shutter has the overlapping portion is not limited to the ultrasonic transmission element or the ultrasonic reception element. For example, the first inspection element may be an element that transmits or receives electromagnetic waves such as X-rays, infrared rays, and near-infrared rays, may be an element for acquiring an image of the subject, or may be other elements.

[0071] The configuration of the switching mechanism is not limited to the configuration described in the above embodiment. For example, the switching mechanism may be configured to detect the position of the subject by a sensor or the like and switch the shutter between a closed state and an open state based on the detected position. Further, the mechanism for switching the shutter from the closed state to the open state and the mechanism for switching the shutter from the open state to the closed state may be provided separately.

[0072] In the inspection apparatus, the shutter may be configured to cover only in front of one of the first inspection element and the second inspection element. In this case, the inspection apparatus may include another shutter that covers in front of the other of the first inspection element and the second inspection element.

[0073] The inspection apparatus may also be configured to inspect a defect of the subject using only the inspection elements arranged in one inspection unit. For example, the inspection element may also function as both a transmitter and a receiver of ultrasonic waves. Specifically, the inspection apparatus may be configured to inspect a defect of the subject by receiving ultrasonic waves transmitted from the inspection element and reflected by the subject with the inspection element.

Explanation of Reference Numerals

[0074] 1 Inspection apparatus 10 First inspection member 11 First inspection element 11a First inspection surface 12 First housing 13, 83 First wall 13a, 23a Window portion 14 First guide portion 14a First guide surface 15 Top plate 20 Second inspection member 21 Second inspection element 21a Second inspection surface 22 Second housing 23 Second wall 24 Second guide portion 24a Second guide surface 30 shutter 30a, 71a contact surface 30b through-hole 30c first surface 30d second surface 40, 60 switching mechanism 40a, 60a rotating shaft 50 conveying mechanism 51 holding part 60b elastic member 70 shutter 71 body 72, 82 overlapping part 82a opposing surface 83a outer surface 100, 200, 300 inspection unit 101 heat-sealing part D distance between the first wall and the second wall P specimen S1 closed state S2 open state α inclination angle of the contact surface with respect to the passing direction of the specimen

Claims

1. An inspection unit comprising an inspection element and capable of inspecting a defect of a subject passing across the front of the inspection element, a shutter capable of opening and closing the front of the inspection element, and a mechanism for switching the shutter from a closed state to an open state or from an open state to a closed state according to the passing state of the subject is provided, wherein the closed state is a state in which the front of the inspection element is covered, and the open state is a state in which the front of the inspection element is opened Inspection unit.

2. The inspection unit according to claim 1, wherein the shutter is in the open state when the subject passes in front of the inspection element and in the closed state after the subject has passed in front of the inspection element.

3. The inspection unit according to claim 1, wherein the shutter swings between the closed state and the open state.

4. The inspection unit according to claim 1, wherein the shutter has a contact surface that contacts the subject when the subject passes, and the contact surface is pushed by the subject to switch to the open state.

5. The inspection unit according to claim 1, wherein the mechanism includes a rotating shaft that rotatably supports the shutter on the upstream side of the inspection element in the passing direction of the subject.

6. The rotating shaft extends in the horizontal direction, and the inspection unit according to claim 5, wherein the shutter switches from the open state to the closed state by its own weight.

7. The inspection unit according to claim 5, wherein the mechanism has an elastic member that pulls the shutter so as to switch from the open state to the closed state.

8. The inspection unit according to claim 1, wherein the inspection element is an ultrasonic transmitting element or an ultrasonic receiving element.

9. The inspection unit according to claim 1, wherein the shutter has an overlapping portion facing the subject from the inspection element side or the opposite side of the inspection element in the open state.

10. The inspection unit according to claim 9, wherein the overlapping portion is elongated with the passing direction of the subject as the longitudinal direction.

11. An inspection device comprising a first inspection member having a first inspection element and a second inspection member having a second inspection element facing the first inspection element with a space therebetween, and capable of inspecting a defect of a subject passing between the first inspection element and the second inspection element, a shutter capable of opening and closing at least one of the front of the first inspection element and the front of the second inspection element, A mechanism for switching the shutter from a closed state to an open state or from an open state to a closed state according to the passage state of the subject, and comprising the closed state is a state in which at least one of the front sides of the first inspection element and the second inspection element is covered, and the open state is a state in which at least one of the front sides of the first inspection element and the second inspection element is open inspection device. **Claim 12** The inspection device according to claim 11, wherein the shutter has a first surface that covers the front of the first inspection element in the closed state and a second surface that covers the front of the second inspection element in the closed state.

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