Systems and methods for constructing a radiography system

Abstract

An exemplary method of configuring a radiographic system 100 having a radiation emitter 106 and a radiation detector 108 includes using a processing circuit to analyze a reference image captured using a first value of a first power parameter for the radiation emitter to determine a value of a focus size for the radiation emitter, and based on the determined relationship between the first value of the first power parameter and the value of the focus size, outputting an indication as to whether a selected value of the first power parameter results in a value of an unsharpness parameter that satisfies an unsharpness threshold, and controlling the radiographic system using the selected power parameter to execute a radiographic process to obtain one or more radiographic images that satisfy the unsharpness threshold.

Description

Technical Field

[0001] [Related Applications] This application claims the benefit of U.S. Provisional Patent Application No. 63 / 389,664, filed Jul. 15, 2022, entitled “Systems and Methods to Configure Radiography Systems”. The entire disclosure of U.S. Provisional Patent Application No. 63 / 389,664 is incorporated herein by reference.

[0002] The present disclosure generally relates to industrial radiographic imaging processes, and more specifically, to systems and methods for configuring radiographic systems.

Background Art

[0003] Industrial radiographic imaging systems are used to acquire two-dimensional (2D) radiographic images, 2D sinograms, and / or three-dimensional (3D) volume data of parts used in industrial applications. Such industrial applications can include, for example, aerospace, automotive, electronics, medical, pharmaceutical, military, and / or defense applications. 2D radiographic images can be evaluated to inspect parts for cracks, flaws, defects, discontinuities, and / or anomalies, which may or may not be visible to the human eye, and / or to determine internal and / or external measurements of the part(s).

[0004] By comparing such systems with the present disclosure described in the remainder of this application with reference to the drawings, the limitations and disadvantages of conventional and traditional approaches will become apparent to those skilled in the art.

Summary of the Invention

[0005] The present disclosure relates to systems and methods for configuring a radiographic system, substantially as illustrated by and / or described in connection with at least one of the figures, and as fully set forth in the claims.

[0006] In addition to these and other advantages, aspects, and novel features of the present disclosure, the detailed content of the illustrated examples of the present disclosure will be more fully understood from the following description and the drawings.

Brief Description of the Drawings

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DETAILED DESCRIPTION OF THE INVENTION

[0017] The drawings are not necessarily to scale. Where appropriate, the same or similar reference numerals are used in the drawings to refer to like or identical elements.

[0018] In computed tomography (CT) applications and other industrial radiographic applications, spatial resolution is a parameter used to describe the size of features that can be resolved in the resulting radiographic image. Unsharpness appears as blur (blur) around the edges of the object being inspected in the radiographic image. Unsharpness is related to several parameters of the radiographic configuration, including the geometric shape, size, and emitter voltage, emitter current, emitter wattage, and other factors that affect the focus. Generally, unsharpness increases with increasing focus size and increasing geometric magnification.

[0019] In some conventional radiographic system designs, the focus is set to a specific size, and the wattage is limited with respect to the set focus size. The focus size varies slightly with changes in emitter voltage, emitter current, and / or emitter wattage. In some other conventional radiographic systems, the focus size increases as the wattage increases, and the focus size of the emitter is proportional to the emitter wattage to some extent. Some conventional radiographic systems assume a focus size based on the wattage. However, due to the assumption of the focus size, the operator is also required to estimate or predict the operating parameters. As a result of incorrect parameter settings, conventional systems may generate radiographic images with higher (or higher than acceptable) unsharpness than desired, and / or may require a longer radiographic process time to obtain an image with acceptable unsharpness. Additionally, the radiographic emitter may deteriorate over time or undergo other changes, which may change the relationship between the focus size and the wattage. Additionally or alternatively, detector degradation may affect spatial resolution, resulting in a need to increase geometric magnification, which may in turn require a change in the emitter configuration.

[0020] The disclosed system and method perform a measurement of the focal spot size to determine and / or guide the selection of one or more parameters of a radiographic system that performs a radiographic process. By measuring the actual focal spot size, for a given radiographic technique or application, the true unsharpness of the radiographic system can be understood, thereby enabling a more accurate representation of blur in the image. In some examples, the radiographic system can be input with measurement data regarding the emitter wattage, emitter voltage, emitter current, focal spot size in one or more dimensions, two-dimensional spatial resolution and / or three-dimensional spatial resolution, voxel size, pixel pitch, and / or geometric magnification for the radiographic system. The stored measurement data can be updated and / or supplemented using measurements taken after installation of the radiographic system.

[0021] The disclosed exemplary systems and methods provide recommendations for one or more radiographic imaging parameters based on measuring the focal spot of a radiographic system to provide unsharpness below a threshold without causing an increase in imaging process time associated with reducing the unsharpness significantly below the predetermined threshold. For example, the exemplary systems and methods can attempt to optimize the balance between unsharpness and imaging process time (e.g., photon count, frames per second, total process time, etc.) by maximizing the wattage while maintaining the unsharpness below the threshold. In some examples, reducing the blur further below the size of a single pixel may result in undetectable and disadvantageous changes in image quality, so the unsharpness threshold corresponds to the pixel size or voxel size or pixel pitch of the radiographic detector. On the other hand, in other examples where sub-pixel spatial resolution is used, the unsharpness threshold (or the upper limit of the target unsharpness range) can be less than the pixel pitch of the detector. Image quality increases as unsharpness decreases. When the image improves due to a change in imaging parameters, the focal spot size for a particular geometric magnification is improved. The disclosed exemplary systems and methods utilize a single pixel threshold by measuring the focal spot size to determine a particular unsharpness value for a given geometric magnification and wattage.

[0022] Although the exemplary systems and methods are disclosed below with respect to unsharpness parameters or unsharpness values, other examples can use similar measures, equivalent measures, or related measures such as sharpness or spatial resolution. The terms "unsharpness" and "blur" are used interchangeably herein.

[0023] As used herein, the terms "effective pixel pitch" and "voxel size" are used interchangeably.

[0024] An exemplary method disclosed for configuring a radiographic imaging system having a radiation emitter and a radiation detector uses a processing circuit to analyze a reference image captured using a first value of a first power parameter for the radiation emitter, determine a value for a focus size for the radiation emitter, and output an indication as to whether a selected value of the first power parameter results in a value of a blur parameter that meets a blur threshold (such that the selected value of the first power parameter causes the value of the blur parameter to meet the blur threshold), and control the radiographic imaging system using the selected power parameter to perform a radiographic imaging process and obtain one or more radiographic images that meet the blur threshold.

[0025] Some exemplary methods further include receiving an updated value of the first power parameter and outputting an indication as to whether the updated value of the first power parameter results in a value of a blur parameter that meets a blur threshold. Some exemplary methods further include outputting a recommended change to the value of the first power parameter that results in a value of a blur parameter that meets a blur threshold.

[0026] Some exemplary methods further include outputting an indication as to whether a detected magnification value results in a value of a blur parameter that meets a blur threshold. Some exemplary methods further include outputting a recommended change to the magnification value that results in a value of a blur parameter that meets a blur threshold for the value of the first power parameter.

[0027] In some exemplary methods, the blur threshold is based on at least one of the pixel size of the radiation detector or the pixel pitch of the radiation detector. In some exemplary methods, the blur threshold is set to one of the dimensions of the pixels of the radiation detector or the pixel pitch of the radiation detector. In some exemplary methods, analyzing the reference image involves analyzing the reference image to determine one or more dimensions of the reference feature based on a predetermined gauge device. Some exemplary methods further involve measuring one or more dimensions of the blur in the reference image and storing the one or more dimensions in a storage device in association with at least one of a first power parameter, a location of the measurement in the reference image, a current focus size, a voxel size, an effective pixel pitch, or a magnification parameter.

[0028] In some exemplary methods, the radiation emitter includes an X-ray tube and the radiation detector includes a digital X-ray detector. Some exemplary methods further involve determining a value of the blur parameter based on the measured focus size and the magnification parameter.

[0029] The disclosed exemplary radiographic system includes a user interface, a radiation detector, a radiation emitter configured to emit radiation toward the radiation detector, an object positioner configured to position an object to be inspected between the radiation detector and the radiation emitter, and a computing device configured to analyze a reference image captured using a first value of a first power parameter for the radiation emitter, determine a value of a focus size for the radiation emitter, and output, via the user interface, an indication of whether a selected value of the first power parameter results in a value of a blur parameter that meets a blur threshold based on the determined relationship between the first value of the first power parameter and the value of the focus size, and control the radiation emitter using the selected power parameter to execute a radiographic process and obtain one or more radiographic images that meet the blur threshold, the computing device comprising a processing circuit configured to perform the foregoing.

[0030] In some exemplary radiography systems, the user interface is configured to receive an updated value of a first power parameter, and the processing circuitry is configured to output an indication as to whether the updated value of the first power parameter results in a value of an unsharpness parameter that meets an unsharpness threshold. In some exemplary radiography systems, the processing circuitry is configured to output a recommended change to a value of the first power parameter that results in a value of the unsharpness parameter that meets the unsharpness threshold.

[0031] In some exemplary radiography systems, the processing circuitry is configured to output an indication as to whether a detected magnification value results in a value of an unsharpness parameter that meets an unsharpness threshold. In some exemplary radiography systems, the processing circuitry is configured to output a recommended change to a magnification value that results in a value of the unsharpness parameter that meets the unsharpness threshold.

[0032] In some exemplary radiography systems, the unsharpness threshold is based on at least one of a pixel size of a radiation detector or a pixel pitch of the radiation detector. In some exemplary radiography systems, the unsharpness threshold is set to one of a dimension of a pixel of a radiation detector or a pixel pitch of the radiation detector. In some exemplary radiography systems, the processing circuitry is configured to analyze a reference image to determine one or more dimensions of a reference feature based on a predetermined gauge device. In some exemplary radiography systems, the processing circuitry is configured to measure one or more dimensions of blur in the reference image and store the one or more dimensions in a storage device in association with at least one of a first power parameter, a location of the measurement in the reference image, a current focus size, a voxel size, an effective pixel pitch, or a magnification parameter.

[0033] FIG. 1 shows an exemplary industrial X-ray radiography system 100. In some examples, the X-ray radiography system 100 can be used for non-destructive testing (NDT), digital radiography (DR) scans, computerized tomography (CT) scans, and / or other applications performed on an object 102. In some examples, the object 102 can be an industrial member and / or an assembly of members (e.g., engine castings, microchips, bolts, etc.). In some examples, the object 102 can be relatively small so that a more fine-grained, detailed, and higher-resolution radiography imaging process can be useful. Although primarily described with respect to X-rays for simplicity, in some examples, the industrial X-ray radiography system 100 described herein can also use radiation at other wavelengths (e.g., gamma rays, neutron rays, terahertz waves, etc.).

[0034] In the example of FIG. 1, the X-ray radiography system 100 directs X-ray radiation 104 from an X-ray emitter 106 through the object 102 to an X-ray detector 108. In some examples, the X-ray emitter 106 can include an X-ray tube configured to emit conical or fan-shaped X-ray radiation. In some examples, the X-ray emitter 106 can emit X-ray radiation within an energy range of 20 kiloelectron volts (keV) to 15 megaelectron volts (MeV).

[0035] In some examples, a two-dimensional (2D) digital image (e.g., a radiography image, an X-ray image, etc.) can be generated based on the X-ray radiation 104 incident on the X-ray detector 108. In some examples, the 2D image can be generated by the X-ray detector 108 itself. In some examples, the 2D image can be generated by combining the X-ray detector 108 with a computing system that communicates with the X-ray detector 108.

[0036] In some examples, the 2D image can be continuously captured / acquired at a given frame rate by the X-ray detector 108 (e.g., in a free-running mode) as long as the X-ray detector 108 is powered on. However, in some examples, the 2D image can be fully generated by the X-ray detector 108 (and / or an associated computing system(s)) only when a scan / imaging process is selected and / or operating. Similarly, in some examples, the 2D image can be stored in a persistent (i.e., non-volatile) memory only when a scan / imaging process is selected and / or operating.

[0037] In some examples, 2D images generated by the X-ray detector 108 (and / or an associated computing system(s)) can be combined to form a three-dimensional (3D) volume and / or a 3D image. In some examples, 2D image slices of the 3D volume / image can also be formed. The term "image" is used herein as an abbreviation, but it should be noted that an "image" can include its representative data until the representative data is visually rendered by one or more suitable components (e.g., a display screen, a graphics processing unit, the X-ray detector 108, etc.).

[0038] In some examples, the X-ray detector 108 can include a flat panel detector (FDA), a linear diode array (LDA), and / or a lens-coupled scintillation detector. In some examples, the X-ray detector 108 can include a fluoroscopy detection system and / or a digital image sensor configured to receive an image indirectly via scintillation. In some examples, the X-ray detector 108 can be implemented using a sensor panel (e.g., a charge coupled device (CCD) panel, a complementary metal-oxide-semiconductor (CMOS) panel, etc.) configured to directly receive X-rays and generate a digital image. In some examples, the X-ray detector 108 can include a scintillation layer / screen that absorbs X-rays and emits visible light photons, which are then detected by a solid state detector panel (e.g., a CMOS X-ray panel and / or a CCD X-ray panel) coupled to the scintillation screen.

[0039] In some examples, the X-ray detector 108 (e.g., a solid state detector panel) can include pixels. In some examples, the pixels can correspond to portions of the scintillation screen. In some examples, the size of each pixel can range from several tens of micrometers to several hundreds of micrometers. In some examples, the pixel size of the X-ray detector 108 can be within the range of 25 micrometers to 250 micrometers (e.g., 200 micrometers). Pixel pitch refers to the distance between the centers of adjacent pixels. The pixel pitch can be the same or different along different directions or axes of the X-ray detector 108.

[0040] In some examples, the 2D images captured by the X-ray detector 108 (and / or associated computing system) may include features that are finer than the pixel size of the X-ray detector 108 (e.g., smaller features, denser features, etc.). For example, a computer microchip may have very fine features that are smaller than a pixel. In such examples, it may be useful to use sub-pixel sampling to achieve a higher and more detailed resolution than may be possible without using sub-pixel sampling.

[0041] In the example of FIG. 1, the X-ray system 100 includes a detector positioner 150 configured to move the X-ray detector 108 to different detector positions (e.g., positions for sub-pixel sampling). As shown, the detector positioner 150 includes two parallel struts 152 connected by two parallel rails 154. As shown, the X-ray detector 108 is held on the rails 154. In some examples, the X-ray detector 108 can be held on (and / or attached to) the rails 154 by one or more intermediate supports.

[0042] In some examples, the object 102 can be moved by the object positioner 110 so that the X-ray detector 108 can be moved by the detector positioner 150. In the example of FIG. 1, the object positioner 110 holds the object 102 within the path of the X-ray radiation 104 between the X-ray emitter 106 and the detector 108. In some examples, the object positioner 110 can be configured to move the object 102 closer to and / or farther from the X-ray emitter 106 and / or the X-ray detector 108, thereby changing the geometric magnification (defined as the distance between the X-ray emitter 106 and the X-ray detector 108 divided by the distance between the X-ray emitter 106 and the object 102). In some examples, the object positioner 110 can be configured to move and / or rotate the object 102 so that the desired portion and / or orientation of the object 102 is located within the path of the X-ray radiation 104. In some examples, the object positioner 110 can position the object 102 at various angles / orientations relative to the X-ray emitter 106 and / or the X-ray detector 108 to obtain 2D images in various orientations. These 2D images can then be used to generate one or more three-dimensional (3D) images of the object 102.

[0043] In the example of FIG. 1, the object positioner 110 includes a rotatable fixture 112 on which the object 102 is positioned. As shown, the rotatable fixture 112 is a circular plate. As shown, the rotatable fixture 112 is attached to a motorized spindle 116 through which the rotatable fixture 112 can rotate about an axis defined by the spindle 116. In some examples, one or more alternative and / or additional rotation mechanisms can be provided.

[0044] In the example of FIG. 1, the rotatable fixture 112 is supported by a support structure 118. In some examples, the support structure 118 may be configured to translate the rotatable fixture 112 (and / or object 102) toward and / or away from the X-ray emitter 106 and / or the X-ray detector 108. Further, the support structure 118 may be configured to translate the rotatable fixture 112 (and / or object 102) horizontally or vertically relative to the emitter 106 and detector 108. In some examples, the support structure 118 may include one or more actuators configured to provide the translation(s). In some other examples, the X-ray emitter 106 and / or the X-ray detector 108 can move relative to the stationary or movable fixture and support structure 118. For example, the X-ray emitter 106 and / or the X-ray detector 108 can be moved up and / or down relative to the fixture, toward and / or away from the fixture, rotated around the fixture, and / or otherwise moved and / or reoriented while the fixture remains stationary or is moved and / or reoriented.

[0045] One exemplary object positioner 110 is shown in the example of FIG. 1, but in some examples, different object positioners 110 can be used. For example, a robotic object positioner can be used to translate and / or rotate the object 102. Similarly, the rotatable fixture 112 is shown as a circular plate in the example of FIG. 1, but in some examples, instead, it can include different fixtures such as, for example, clamps, fasteners, grippers, and / or other holding mechanisms.

[0046] FIG. 2 shows an example of an X-ray imaging system 200 including an X-ray imaging system 100 such as the X-ray imaging system 100 shown in FIG. 1. As shown, the X-ray imaging system 200 also includes a computing system 202, a user interface (UI) 204, and a remote computing system 299. In the example of FIG. 2, one X-ray imaging system 100, a computing system 202, a UI 204, and a remote computing system 299 are shown, but in some examples, the X-ray imaging system 200 can include multiple X-ray imaging systems 100, computing systems 202, UIs 204, and / or remote computing systems 299.

[0047] In the example of FIG. 2, in the X-ray imaging system 100, an emitter 106, a detector 108, a detector positioner 150, and an object positioner 110 are enclosed within a housing 199. As shown, the X-ray imaging system 100 is connected to and / or communicates with the computing system(s) 202 and the UI(s) 204. In some examples, the X-ray imaging system 100 can also communicate electrically with the remote computing system(s) 299. In some examples, the communication and / or connection can be electrical, electromagnetic, wired, and / or wireless.

[0048] In the example of FIG. 2, UI 204 includes one or more input devices 206 and / or output devices 208. In some examples, the one or more input devices 206 can include one or more touchscreens, mice, keyboards, buttons, switches, slides, knobs, microphones, dials, and / or other electromechanical input devices. In some examples, the one or more output devices 208 can include one or more display screens, speakers, lights, tactile devices, and / or other devices. In some examples, a user can provide input to and / or receive output from the X-ray imaging machine(s) 100, the computing system(s) 202, and / or the remote computing system(s) 299 via the UI(s) 204.

[0049] In some examples, the UI(s) 204 can be part of the computing system 202. In some examples, the computing system 202 can implement one or more controllers of the X-ray imaging machine(s) 100. In some examples, the computing system 202, together with the UI(s) 204, can constitute an image acquisition system of the X-ray imaging system 200. In some examples, the remote computing system(s) 299 can be the same as or similar to the computing system 202.

[0050] In the example of FIG. 2, computing system 202 communicates (e.g., electrically) with an X-ray radiography machine(s) 100, a UI(s) 204, and a remote computing system(s) 299. In some examples, the communication can be direct communication (e.g., via wired and / or wireless media), or can be indirect communication via, for example, one or more wired and / or wireless networks (e.g., local area network and / or wide area network), etc. As shown, computing system 202 includes a processing circuitry 210, a memory circuitry 212, and a communication circuitry 214 that are interconnected with each other via a common electrical bus.

[0051] In some examples, processing circuitry 210 can include one or more processors. In some examples, communication circuitry 214 can include one or more wireless adapters, wireless cards, cable adapters, wired adapters, radio frequency (RF) devices, wireless communication devices, Bluetooth® devices, IEEE 802.11 compliant devices, WiFi devices, cellular devices, GPS devices, Ethernet ports, network ports, Lightning cable ports, cable ports, etc. In some examples, communication circuitry 214 can be configured to facilitate communication via one or more wired media and / or protocols (e.g., Ethernet cable(s), universal serial bus cable(s), etc.), and / or wireless media and / or protocols (e.g., near field communication (NFC), ultra-high frequency radio (commonly known as Bluetooth®), IEEE 802.11x, Zigbee®, HART, LTE, Z-Wave, WirelessHD, WiGig, etc.).

[0052] In the example of FIG. 2, the memory circuit unit 212 includes and / or stores one or more focus measurement processes and / or imaging processes. In some examples, the one or more focus measurement processes and / or imaging processes are implemented via machine-readable (and / or processor-executable) instructions 216 stored in the memory circuit unit 212 and / or executed by the processing circuit unit 210. In some examples, the one or more focus measurement processes and / or imaging processes are executed as part of a larger scan process and / or imaging process of the X-ray radiation imaging system 200. The exemplary memory circuit unit 212 can further include data such as a reference table or look-up table including measurement data.

[0053] The exemplary radiation imaging systems 100 of FIGS. 1 and 2 execute a focus measurement process to measure the focus for the configuration of the radiation imaging system 100. The focus measurement process can be executed manually or automatically. This configuration can be associated with a specific wattage and / or geometric magnification for the emitter 106. The focus measurement process can be executed periodically (e.g., daily or at other set periods), aperiodically, at a scheduled time, on demand, in response to a predetermined criterion (e.g., before an imaging process), and / or at any other time.

[0054] To measure the focal spot size, a reference image is acquired using a known reference object having a predetermined dimension. For example, a standard reference gauge device such as a tungsten wire crosshair or a circular plate or a cylindrical plate can be used with the geometric shapes of the emitter 106 and the detector 108 and has a predetermined dimension and the position of the reference gauge device as the object 102 for measuring the focal spot size through measurement of the blurriness of the reference image. The reference image can be captured at one or more predetermined reference positions that can involve a predetermined distance between the emitter 106, the detector 108, and / or the object 102. The reference image can be acquired as a live image and / or can be based on a pre-captured image (e.g., an image captured using the same power parameter(s)).

[0055] FIG. 3A shows an exemplary focal measurement configuration 300 that can be implemented using the radiography system 100 of FIGS. 1 and 2 and can measure the focal spot size 302 using configured parameters. The configuration 300 includes an emitter 106, a detector 108 disposed at a first distance 304 from the emitter 106, and an object 102 disposed at a second distance 306 from the emitter 106. The resulting geometric magnification of the configuration 300 is the ratio of the first distance 304 to the second distance 306 (e.g., as the object 102 approaches the emitter 106, the geometric magnification increases).

[0056] Based on the distances 304, 306 and a predetermined dimension of the object 102 (e.g., tungsten wire crosshairs), the radiography system 100 determines the predicted size 308 of the object 102 generated in the reference image 310. The exemplary radiography system 100 analyzes the reference image 310 and determines the applicable dimensions of the reference feature based on the predetermined dimension of the object 102. For example, the dimensions can include one or more dimensions of the object 102 in the image 310 and / or one or more dimensions of the blur present in the image 310. The radiography system 100 further determines the observed size 312 of the object 102 generated in the reference image. Thereafter, the blur is determined based on the difference between the observed size 312 and the predicted size 308. The radiography system 100 can then calculate the focal size based on the measured unsharpness (Ug), for example, using common industry accepted formulas (e.g., ASTM E2903, ASTM E1165, etc.) for measuring unsharpness.

[0057] FIG. 3B shows another exemplary focus measurement configuration 320 that can be used to measure the focal size using the parameters implemented and configured using the radiography system 100 of FIGS. 1 and 2. The exemplary configuration 320 is similar to the configuration 300 of FIG. 3A. However, the exemplary object 102 is a circular plate or a cylindrical plate, or a spherical object, and as a result, the reference image 322 has a different size and shape.

[0058] The exemplary radiographic system 100 of FIG. 1 determines the expected size 324 of an object in a reference image 322 (e.g., based on a geometric shape) and the measured size 326 of the object. The radiographic system 100 then determines the measured focal size based on the measured blur. Since the blur in the reference image 322 of FIG. 3B is non-uniform, the radiographic system 100 determines the blur as an average blur or other filtered value based on samples 328 taken around the object in the reference image and / or by fitting a function to the blur to obtain an average blur value, a maximum blur value, or other filtered blur values. The radiographic system 100 can then calculate the focal size and shape based on the measured unsharpness (Ug). For example, when a circular or spherical object is imaged, the radiographic system 100 can calculate measured values of the focal size and shape in multiple dimensions. Depending on the shape of the focus (e.g., the size in two or more directions), the radiographic system 100 can select the geometric magnification and / or wattage for a given application so as not to exceed the unsharpness threshold in two or more directions. Although some of the examples disclosed herein are discussed with respect to one dimension, any of these exemplary systems and methods can be adapted to measure and configure for multiple dimensions of the focus.

[0059] FIG. 4 shows an exemplary user interface 400 that can be implemented using the radiographic system 100 of FIGS. 1 and 2 (e.g., user interface(s) 204). The exemplary user interface 400 includes a pixel pitch input 402, a geometric magnification input 404, an emitter voltage input 406, an emitter current input 408, a voxel size input 410, and an unsharpness limit value input 412. The exemplary interface 400 further includes a calculated current unsharpness value output 414.

[0060] Any of the exemplary inputs 402 - 412 can also be selected to output a recommended value based on the others of the inputs 402 - 412. After the focal size is measured, the exemplary radiographic system 100 can recommend or determine one or more imaging parameters based on one or more input parameters. For example, if an operator inputs (or configures) a specific geometric magnification via the geometric magnification input 404, the radiographic system 100 can set or recommend the wattage (e.g., voltage and / or current) of the emitter 106 such that the unsharpness value Ug is less than the unsharpness threshold (e.g., less than the width of 1 pixel, less than the pixel pitch). For example, the interface 400 can display the recommended wattage, recommended voltage, and / or recommended current by displaying values in the voltage input 406 and / or current input 408 fields.

[0061] Additionally or alternatively, if an operator inputs (or configures) a specific wattage for the emitter 106 (e.g., via the emitter voltage input 406 and / or emitter current input 408), the radiographic system 100 can set or recommend the geometric magnification (e.g., the physical configuration of the emitter 106, the detector 108, and the object 102) to achieve an unsharpness value Ug less than the unsharpness threshold. For example, the interface 400 can display the recommended geometric magnification by displaying a value in the geometric magnification field 404. In yet another example, the operator can specify any of the voxel size limits (e.g., a specific voxel size, minimum voxel size, maximum voxel size), spatial resolution limits (e.g., minimum spatial resolution), effective pixel pitch, and / or any other relevant parameter(s). Based on the input requirements or limitations, the radiographic system 100 can determine any of the focal size, wattage, voltage, current, geometric magnification, and / or any other parameter and / or configuration for performing the radiographic imaging process according to the input parameters.

[0062] The exemplary interface 400 further includes a button (or other input device) by which an operator can specify which of one or more parameters the operator desires to receive a recommended value for. For example, the interface 400 includes a "Recommend Magnification" button 416 that causes the radiography system 100 to determine a geometric magnification value (e.g., based on pixel pitch 402, emitter voltage 406, emitter current 408, and unsharpness limit 412, effective pixel pitch or voxel size 410, and / or the required focal size). The interface 400 further includes a "Recommend Voltage" button 418 and a "Recommend Current" button 420 that cause the radiography system 100 to determine a voltage value and / or a current value for emitter 106 (e.g., based on pixel pitch 402, geometric magnification 404, effective pixel pitch or voxel size 410, and unsharpness limit 412, and / or the required focal size).

[0063] The exemplary interface 400 further includes a "Determine Effective Pixel Pitch / Effective Voxel Size Value" button 422 that causes the radiography system 100 to determine a set of parameters (e.g., geometric magnification, emitter voltage, emitter current) for a specified voxel size input 410 and unsharpness limit 412 (e.g., based on pixel pitch 402). For example, if an operator specifies a 40 micron voxel requirement for a given radiography process, the radiography system 100 determines the required geometric magnification based on pixel pitch and voxel size (e.g., geometric magnification = pixel pitch / voxel size). The radiography system 100 can then use this geometric magnification to determine the wattage based on the measured focal size and the determined geometric magnification.

[0064] In some examples, the radiography system 100 stores data 218 (e.g., a reference table, a look-up table, or an equivalent function) in a storage device (e.g., the memory circuit unit 212 of FIG. 2). This data relates the emitter wattage, emitter voltage, emitter current, geometric magnification, pixel size, pixel pitch, voxel size, focal spot size, and / or any other parameters to the unsharpness. The reference table can be pre-entered using data obtained by the manufacturer, installer, maintenance personnel, and / or operator during or after the manufacture of the radiography system 100 and / or during or after the installation. Additionally or alternatively, the radiography system 100 can supplement or update the reference table based on subsequent focal spot measurements.

[0065] The exemplary radiography system 100 refers to the reference table and determines radiographic parameters based on the input parameters. For example, the reference table can be used when the operator does not desire to perform a focal spot measurement within a defined time window before and / or after the radiographic process. Table 1 below shows a portion of an exemplary reference table that can be stored in the memory circuit unit 212, referred to for determining parameters, and / or updated. [Table 1]

[0066] FIG. 5 is a graph 500 representing exemplary stored focus data that can be used to determine a focus based on a configured wattage. Graph 500 shows a series of focus sizes corresponding to emitter wattage values. The value 502 of the reference set corresponds to 1 W / μm which is the default or assumed value of the focus size. The observed focus size values 504 of the first set are measured at the first emitter voltage (X kV), and the observed focus size values of the second set are measured at the second emitter voltage (Y kV). The data can include additional voltages and / or can be measured for multiple dimensions of the detector 108.

[0067] When the radiation imaging system 100 performs focus measurement, the radiation imaging system 100 can add data points to the observed values 504, 506. In some examples, the radiation imaging system 100 replaces an existing data point with an updated data point when the new data point has the same emitter wattage.

[0068] In some examples, instead of measuring the absolute focus size, stored values (e.g., the above reference table, values 504, 506, etc.) can be used to determine an adjustment for the current configuration. For example, if a particular emitter wattage corresponds to a measured unsharpness value that exceeds or significantly falls below an unsharpness threshold, the radiation imaging system 100 can determine an increment or decrement of the wattage based on a value in a table or graph 500 for achieving the desired unsharpness (e.g., the corresponding focus size for achieving the unsharpness).

[0069] By storing and updating data, the radiography system 100 can characterize data points and use machine learning algorithms to identify trends, degradation (e.g., degradation of emitter 106 and / or detector 108), and / or any other changes over time in the radiography system 100. For example, the radiography system 100 can identify threshold values for standard focal sizes at various wattage values and / or control upper and lower limits to identify variations outside the standard range. Additionally or alternatively, the machine learning algorithm can learn to adjust values and / or limits over time and / or over the life of the system to detect and / or predict changes in the imaging system and the resulting impact on image quality. The operator can then tolerate these potential effects to enable system learning based on those data points. If a data point is considered outside the acceptable range (e.g., based on a determined threshold), the operator can be provided with the option to correct the hardware and / or imaging setup.

[0070] FIG. 6 is a flowchart representing exemplary machine-readable instructions 600 that can be implemented by the exemplary x-ray radiography system 100 of FIGS. 1 and 2 to determine imaging parameters for a radiography process based on a measured focus. The exemplary instructions 600 can be stored in a memory device (e.g., the memory circuit 212 of FIG. 2) and executed by a processing circuit (e.g., the processing circuit 210 of FIG. 2).

[0071] In block 602, the x-ray detector 108 captures a reference image (e.g., reference image 310 of FIG. 3A) in a reference configuration. For example, the reference configuration can involve a predetermined arrangement of the radiation emitter 106, the reference object 102 under inspection, and the x-ray detector 108. This predetermined arrangement can be pre-measured as a preferred arrangement to achieve accurate measurement of blur and / or focal size.

[0072] In block 604, the processing circuitry 210 measures the blur in the reference image 310. For example, the processing circuitry 210 can calculate the expected size 308 of an object in the reference image 310 and measure the actual size 312 of the object in the image. The processing circuitry 210 then determines the blur as one half of the difference between the expected size 308 and the actual size 312. The blur can be measured in multiple dimensions. In block 606, the processing circuitry 210 determines a focus size based on the measured blur.

[0073] In block 608, the processing circuitry 210 records the focus size, the actual magnification, the calculated magnification, the emitter voltage, the power parameter(s), and the blurriness (e.g., in a reference table). For example, in addition to recording the magnification used to capture the reference image, the processing circuitry 210 can calculate and store the magnification at which the determined focus size achieves a predetermined blurriness threshold. The recorded data can be used to update the reference table with the current data.

[0074] In block 610, the processing circuitry 210 calculates the blurriness for configuring the imaging process to be executed. The configuration of the imaging process can be the same as or different from the reference configuration. For example, the arrangement may vary even when using the same emitter wattage parameter, resulting in different magnifications and different blurriness levels.

[0075] In block 612, the processing circuit unit 210 determines whether the calculated blur is within the target blur range for the process configuration. For example, the target blur range can be equivalent to the pixel size or pixel pitch, or based on the pixel size or pixel pitch, to cause the processing circuit unit 210 to determine whether the blur is less than equivalent to 1 pixel. In other examples, the calculated blur can be compared with the voxel size. However, any other desired threshold can also be used.

[0076] In some examples, the processing circuit unit 210 can determine, in block 612, whether the calculated blur is below the upper blur threshold and / or above the lower blur threshold. In some examples, the lower blur threshold is determined as a threshold slightly (e.g., a predetermined amount or percentage of the threshold) below the upper blur threshold, thereby avoiding an unnecessarily long process time to achieve substantially the same image quality.

[0077] If the calculated blur is not within the target blur range for the process configuration (block 612), in block 614, the processing circuit unit 210 determines whether to adjust (e.g., correct) the power parameters (e.g., wattage, voltage, current). For example, the processing circuit unit 210 can determine whether the geometric magnification is fixed and / or whether the operator has requested a recommendation for the power parameter(s). In some examples, the processing circuit unit 210 determines whether to adjust (e.g., correct) the geometric magnification parameter instead of the power parameter. For example, the processing circuit unit 210 can determine whether the power parameter is fixed and / or whether the operator has requested a recommendation for the magnification.

[0078] When the power parameter is adjusted (block 614), at block 616, the processing circuit unit 210 obtains one or more power parameters based on the geometric magnification and the blur threshold. For example, the processing circuit unit 210 can search for the wattage, voltage, and / or current in a reference table (e.g., data 218 in FIG. 2) based on the geometric magnification and the blur threshold. In some examples, obtaining this power parameter can include interpolation between a set of data points in the table. Obtaining this power parameter can further involve outputting a display indicating that the selected value(s) of the power parameter(s) result in a value of the blur parameter that satisfies the blur threshold.

[0079] When the power parameter is not adjusted (block 614), at block 618, the processing circuit unit 210 obtains the geometric magnification based on one or more power parameters and the blur threshold. For example, the processing circuit unit 210 can search for the geometric magnification in a reference table (e.g., data 218 in FIG. 2) based on the wattage, voltage, and / or current, and the blur threshold. In some examples, obtaining this geometric magnification can include interpolation between a set of data points in the table. Obtaining this geometric magnification can further involve outputting a display indicating that the selected value of the geometric magnification results in a value of the blur parameter that satisfies the blur threshold.

[0080] After determining the geometric magnification correction (block 618), after determining the power parameter correction(s) (block 616), if none of the parameters are corrected (block 618), and / or if the calculated blur is within the target blur range (block 612), in block 620, the processing circuitry 210 controls the imaging process based on the configured parameters. For example, the processing circuitry 210 controls the emitter 106 and the detector 108 to generate one or more 2D and / or radiographic images for 3D data (e.g., for 3D CT scans, etc.) using the parameters recommended via blocks 602 - 618 based on the measured focal size. The exemplary instructions 600 then end.

[0081] FIGS. 7A and 7B show a flowchart 700 representing other exemplary machine - readable instructions that can be implemented by the exemplary x - ray imaging system of FIGS. 1 and 2 to determine imaging parameters for a radiographic process based on a measured focus. The exemplary instructions 700 can be stored in a memory device (e.g., the memory circuitry 212 of FIG. 2) and executed by a processing circuitry (e.g., the processing circuitry 210 of FIG. 2).

[0082] In block 702, the processing circuitry 210 receives power parameter inputs and geometric magnification inputs (e.g., via the user interface 214 of FIG. 2 and the user interface 400 of FIG. 4). For example, an operator can input wattage, voltage, and / or current, and the geometric magnification into the user interface 400. In other examples, the power parameter inputs and geometric magnification inputs can be automatically received in association with the object 102 being inspected using the system 100 (e.g., from a remote computing device, a data storage device).

[0083] In block 704, the X-ray detector 108 captures a reference image (e.g., reference image 310 in FIG. 3A) in a reference configuration. This reference configuration can include the received power input and geometric magnification input, or a predetermined power and geometric magnification. For example, the reference configuration can be associated with a predetermined arrangement of the radiation emitter 106, the reference object 102 to be inspected, and the X-ray detector 108. This predetermined arrangement can be pre-measured as a preferred arrangement to achieve an accurate measurement of blur and / or focal size.

[0084] In block 706, the processing circuitry 210 measures the blur in the reference image 310. For example, the processing circuitry 210 can calculate the expected size 308 of an object in the reference image 310 and measure the actual size 312 of the object in the image. The processing circuitry 210 then determines the blur as one-half of the difference between the expected size 308 and the actual size 312. The blur can be measured in multiple dimensions. In block 708, the processing circuitry 210 determines the focal size based on the measured blur.

[0085] In block 710, the processing circuitry 210 records the focal size, the actual geometric magnification, the calculated geometric magnification, the power parameter(s), and the defocus (e.g., in a reference table). For example, in addition to recording the geometric magnification used to capture the reference image, the processing circuitry 210 can calculate and store the geometric magnification at which the determined focal size acquires a predetermined defocus threshold. The actual geometric magnification and the power parameter(s) can be the received geometric magnification and power parameter input if used to generate the reference image 310. The recorded data can be used to update the reference table using the current data.

[0086] In block 712, the processing circuit 210 determines whether the measured blur is within the target blur range for the process configuration. For example, the upper threshold of the target blur range can be equivalent to or based on the pixel size or pixel pitch to cause the processing circuit 210 to determine whether the blur is less than equivalent to 1 pixel. In other examples, the calculated blur can be compared with the voxel size. However, any other desired threshold can also be used.

[0087] In some examples, in block 712, the processing circuit 210 can determine whether the calculated blur is below the upper blur threshold and / or above the lower blur threshold. In some examples, the lower blur threshold is determined as a threshold slightly (e.g., a predetermined amount or percentage of the threshold) below the upper blur threshold, thereby avoiding an unnecessarily long process time to achieve substantially the same image quality.

[0088] If the calculated blur is not within the target blur range for the process configuration (block 712), in block 714, the processing circuit 210 determines whether to adjust (e.g., correct) the power parameters (e.g., wattage, voltage, current). For example, the processing circuit 210 can determine whether the geometric magnification is fixed and / or whether the operator has requested a recommendation for the power parameter(s). In some examples, the processing circuit 210 determines whether to adjust (e.g., correct) the geometric magnification parameter instead of the power parameter(s). For example, the processing circuit 210 can determine whether the power parameter(s) is fixed and / or whether the operator has requested a recommendation for the magnification.

[0089] When the power parameter is adjusted (block 714), in block 716, the processing circuit unit 210 obtains one or more power parameters based on the geometric magnification and the blur threshold. For example, the processing circuit unit 210 can search for the wattage, voltage, and / or current in a reference table (e.g., data 218 in FIG. 2) based on the geometric magnification and the blur threshold. In some examples, obtaining this power parameter can include interpolation between a set of data points in the table. Obtaining this power parameter can further involve outputting a display indicating that the selected value(s) of the power parameter(s) result in a value of the blur parameter that satisfies the blur threshold. The control then returns to block 704 to repeat the focus measurement and comparison of the blur with the threshold.

[0090] Referring to FIG. 7B, when the power parameter(s) is not adjusted (block 714), in block 718, the processing circuit unit 210 obtains the geometric magnification based on one or more power parameters and the blur threshold. For example, the processing circuit unit 210 can search for the geometric magnification in a reference table (e.g., data 218 in FIG. 2) based on the wattage, voltage, and / or current, and the blur threshold. In some examples, obtaining this geometric magnification can include interpolation between a set of data points in the table. Obtaining this geometric magnification can further involve outputting a display indicating that the selected value of the geometric magnification results in a value of the blur parameter that satisfies the blur threshold.

[0091] In block 720, the processing circuit unit 210 calculates an updated blur value based on the measured focus size and the obtained geometric magnification.

[0092] In block 722, the processing circuit 210 determines whether the calculated blurriness is within the target blurriness range for the process configuration. Block 722 can be the same as, similar to, or different from block 712. If the calculated blurriness is within the target blurriness range (block 722), then in block 724, the processing circuit 210 determines whether the imaging parameters for the updated parameters and / or configuration are improved with respect to the previous parameters. For example, the processing circuit 210 can determine whether the imaging process time is longer or shorter than the previous iteration while maintaining a state below the blurriness threshold. If the imaging parameters are improved (block 724), or if the calculated blurriness is not below the blurriness threshold (block 722), the control returns to block 704 to repeat the focus measurement (e.g., focus measurement using a different configuration) to improve the parameters.

[0093] In this way, the processing circuit 210 can repeatedly obtain acceptable, improved, or optimal parameters and configurations for the desired radiation imaging process.

[0094] If the imaging parameters are not improved (block 724), then in block 726, the processing circuit 210 selects the best parameters identified for the imaging process. These parameters can be stored, for example, in a reference table for each calculated blurriness value and configuration.

[0095] If the calculated blurriness is less than the blurriness threshold (block 712) or if the power parameter(s) and geometric magnification are not adjusted (block 718), or after selecting the identified best parameters (block 726), at block 728, the processing circuitry 210 controls the imaging process based on the configured parameters. For example, the processing circuitry 210 controls the emitter 106 and the detector 108 to generate one or more 2D radiographs and / or radiographies for 3D data (e.g., 3D CT scan, etc.) using the parameters recommended via blocks 702 - 726 based on the measured focus size. The exemplary instruction 700 then ends.

[0096] FIG. 8 is a flowchart representing another exemplary machine - readable instruction 800 that can be implemented by the exemplary X - ray imaging system 100 of FIGS. 1 and 2 to determine imaging parameters for a radiographic process based on a specified effective pixel pitch and / or effective voxel size. The exemplary instruction 800 can be stored in a storage device (e.g., the memory circuitry 212 of FIG. 2) and executed by a processing circuitry (e.g., the processing circuitry 210 of FIG. 2). The instruction 800 can be executed, for example, in response to the input of a voxel size input 410 and the selection of an “Effective Pixel Pitch / Effective Voxel Size” button 420 via the interface 400.

[0097] At block 802, the processing circuitry 210 receives the effective pixel pitch and / or effective voxel size (e.g., via the user interface 400 of FIG. 4) and receives a blurriness threshold. In some examples, the blurriness threshold can be calculated from the pixel pitch and / or effective voxel size. The processing circuitry 210 can receive the pixel pitch and / or effective voxel size, and the blurriness threshold, automatically from a remote computing system (e.g., the system 299 of FIG. 2) and / or via manual input.

[0098] In block 804, the processing circuit 210 determines whether the focus size is known (e.g., previously measured or determined in another way). For example, if the focus size was determined (e.g., measured) in less than a threshold time before using the measured wattage, the processing circuit 210 can search for the focus size in the reference table. If the focus size is known (block 804), in block 806, the processing circuit 210 searches the memory device for the geometric magnification and power parameter values based on the focus size, the blur threshold, and the pixel pitch and / or the effective voxel size.

[0099] If the focus size is not known (block 804), in block 808, the processing circuit 210 measures the focus size. Block 808 can be implemented, for example, by executing blocks 602 - 606 of FIG. 6.

[0100] In block 810, the processing circuit 210 determines whether the calculated blur is within the target blur range for the process configuration. For example, the upper threshold of the target blur range can be made equal to or based on the pixel size or the effective pixel pitch to cause the processing circuit 210 to determine whether the blur is less than equivalent to 1 pixel. In other examples, the calculated blur can be compared to the voxel size. However, any other desired threshold can also be used.

[0101] In some examples, in block 810, the processing circuit 210 can further determine whether the calculated blur is below the upper blur threshold and / or above the lower blur threshold. In some examples, the lower blur threshold is determined as a threshold slightly (e.g., a predetermined amount or percentage of the threshold) below the upper blur threshold, thereby avoiding an unnecessarily long process time to achieve substantially the same image quality.

[0102] If the calculated blurriness is not within the target blurriness range for the process configuration (block 810), at block 812, the processing circuitry 210 determines whether to adjust (e.g., correct) one or more power parameters (e.g., wattage, voltage, current). For example, the processing circuitry 210 can determine whether the geometric magnification is fixed and / or whether the operator has requested a recommendation for the power parameter(s). In some examples, the processing circuitry 210 determines whether to adjust (e.g., correct) a geometric magnification parameter instead of the power parameter(s). For example, the processing circuitry 210 can determine whether the power parameter(s) is fixed and / or whether the operator has requested a recommendation for the magnification.

[0103] If the power parameter(s) is adjusted (block 812), at block 814, the processing circuitry 210 determines one or more power parameters based on the geometric magnification and the blurriness threshold. For example, the processing circuitry 210 can search for wattage, voltage, and / or current in a reference table (e.g., data 218 of FIG. 2) based on the geometric magnification and the blurriness threshold. In some examples, determining this power parameter can include interpolation between a set of data points in the table. Determining this power parameter can further involve outputting an indication that the selected value(s) of the power parameter(s) results in a value of the blurriness parameter that meets the blurriness threshold.

[0104] When the power parameter(s) are not corrected (block 812), in block 816, the processing circuit unit 210 obtains a geometric magnification based on one or more power parameters and an unsharpness threshold. For example, the processing circuit unit 210 can search a reference table (e.g., data 218 in FIG. 2) for the geometric magnification based on the wattage, voltage, and / or current, and the unsharpness threshold. In some examples, obtaining this geometric magnification can include interpolation between a set of data points in the table. Obtaining this geometric magnification can further involve outputting an indication indicating that the selected value of the geometric magnification results in a value of the unsharpness parameter that satisfies the unsharpness threshold.

[0105] After obtaining the geometric magnification correction (block 816), after obtaining the power parameter correction(s) (block 814), when none of the parameters are corrected (block 816), and / or after searching for the geometric magnification and voltage parameter values (block 806), in block 818, the processing circuit unit 210 controls the imaging process based on the configured parameters. For example, the processing circuit unit 210 controls the emitter 106 and the detector 108 to generate one or more 2D and / or radiographic images for 3D data (e.g., 3D CT scan, etc.) using the parameters recommended via block 806 or blocks 808 - 818 based on the measured focal size. The exemplary instruction 800 then ends.

[0106] In addition to or as an alternative to the automatic setting of the power parameter(s) and / or geometric magnification, the exemplary X-ray imaging system 100 can guide the operator to select the power parameter(s) and / or adjust the geometric magnification by providing an indication of the calculated unsharpness and / or whether the unsharpness is within an acceptable range. This acceptable range can be determined, for example, based on the techniques developed for the object 102. This acceptable range can have an unsharpness upper limit, an unsharpness lower limit, or both.

[0107] In one example of guiding an operator, the X-ray imaging system 100 can determine a focal size based on a reference image in a method similar to or the same as the method described above. The X-ray imaging system 100 calculates an unsharpness value for the configured geometric magnification and the configured power parameter(s). The X-ray imaging system 100 can compare the calculated unsharpness value with an acceptable range and output a display indicating whether the power parameter value(s) and / or the geometric magnification result in a value of the unsharpness parameter that satisfies the acceptable unsharpness range. This display can be output by displaying an icon or other text or graphic to the operator via a user interface 204 such as a display. This display can notify the user whether the calculated unsharpness is within the acceptable unsharpness range. If the calculated unsharpness is not within the acceptable range, the display can further instruct the user as to which parameter(s) and / or configuration(s) can be adjusted to adjust the unsharpness with respect to the acceptable unsharpness range, and / or how to adjust the parameter(s) and / or configuration(s). For example, the user interface 204 can also display only the result of the comparison between the calculated unsharpness value and the acceptable unsharpness range, or can further indicate that increasing the wattage reduces the unsharpness higher than the acceptable range.

[0108] FIG. 9 is a flowchart representing an exemplary machine-readable instruction 900 that can be implemented by the exemplary X-ray imaging system 100 of FIGS. 1 and 2 to provide guidance for imaging parameters for a radiographic process based on a measured focus. The exemplary instruction 900 can be stored in a storage device (e.g., the memory circuit 212 of FIG. 2) and executed by a processing circuit (e.g., the processing circuit 210 of FIG. 2).

[0109] In block 902, the X-ray detector 108 captures a reference image (e.g., the reference image 310 in FIG. 3A) in a reference configuration. For example, the reference configuration can involve a predetermined arrangement of the radiation emitter 106, the reference object 102 to be inspected, and the X-ray detector 108. This predetermined arrangement can be pre-measured as a preferred arrangement to achieve an accurate measurement of blur and / or focal size.

[0110] In block 904, the processing circuitry 210 measures the blur in the reference image 310. For example, the processing circuitry 210 can calculate the expected size 308 of an object in the reference image 310 and measure the actual size 312 of the object in the image. The processing circuitry 210 then determines the blur as one half of the difference between the expected size 308 and the actual size 312. The blur can be measured in multiple dimensions. In block 906, the processing circuitry 210 determines the focal size based on the measured blur.

[0111] In block 908, the processing circuitry 210 records (e.g., in a reference table) the focal size, the actual geometric magnification, the calculated geometric magnification, the emitter voltage, the power parameter(s), and the unsharpness. For example, in addition to recording the geometric magnification used to capture the reference image, the processing circuitry 210 can calculate and store the geometric magnification at which the determined focal size acquires a predetermined unsharpness threshold. The recorded data can be used to update the reference table using the current data.

[0112] Blocks 902-908 can be implemented in a manner similar to or the same as blocks 602-608 of FIG. 6. In other examples, the processing circuitry 210 can use different focal measurement positions for the emitter 106, the detector 108, and / or the object positioner 110. During the focal measurement procedure, the processing circuitry 210 can store geometric magnification values (e.g., those input by an operator, those obtained from stored techniques, etc.) for subsequent use during subsequent scans.

[0113] At block 910, the processing circuitry 210 receives the geometric magnification and / or power parameter(s) via the user interface 204. For example, an operator may input and change the wattage and / or configured geometric magnification. In some examples, the processing circuitry 210 may automatically calculate and / or store the current geometric magnification (e.g., before moving to the focus measurement position) based on the relative positions of the emitter 106, the X-ray detector 108, and the object positioner 110 and / or the rotatable fixture 112. The stored geometric magnification may correspond to the technique magnification, and the system 100 may be configured using the stored geometric magnification after the focus measurement(s).

[0114] In block 912, processing circuitry 210 calculates the blur for the imaging process configuration entered by the operator. For example, processing circuitry 210 can determine the blur at the same focus size for the same power parameters as during focus measurement, using the same or a different magnification, and / or can determine the blur at different focus sizes for the same geometric magnification (e.g., based on a lookup table).

[0115] At block 914, processing circuitry 210 outputs (e.g., via user interface 204) an indication of whether the power parameter value(s) and / or geometric scaling factor result in a value of the blur parameter that satisfies the blur range. This indication may indicate to the operator whether the calculated blur is within the blur range, and if not, may display instructions on how to modify the parameter(s) and / or configuration to achieve acceptable blur. For example, processing circuitry 210 may output instructions to increase or decrease the wattage and / or instructions to increase or decrease the geometric scaling factor.

[0116] In block 916, the processing circuit unit 210 determines whether to start the imaging process. For example, an operator can command the X-ray imaging system 100 to start scanning via the user interface 204. If the imaging process is not started (block 916), the control returns to block 910 to continue configuring the test and obtaining the blur value.

[0117] Upon receiving a command to start the imaging process (block 916), in block 918, the processing circuit unit 210 controls the imaging process based on the configured parameters. For example, the processing circuit unit 210 controls the emitter 106 and the detector 108 to generate one or more 2D and / or radiographic images for 3D data (e.g., 3D CT scan, etc.) using the parameters set by the operator in block 910. The exemplary instruction 900 then ends.

[0118] In some other examples, blocks 812 - 816 in FIG. 8 can be modified and / or replaced with an output indicating whether the selected power parameter(s) and / or geometric magnification result in a blur value within an acceptable range (e.g., determined based on the effective pixel pitch and / or effective voxel size).

[0119] In still other examples, the processing circuit unit 210 can implement a loop where the operator inputs the desired power parameter, focal size, and / or geometric magnification of the technique, the system 100 measures the actual focal size, and outputs an indication of whether the blur is within an acceptable range. The operator can then adjust the parameter and / or geometric shape until the desired blur range is reached and can re-measure the focal size. In some examples, the processing circuit unit 210 can provide guidance to the operator for adjusting the parameter and / or geometric shape.

[0120] FIG. 10 is a flowchart representing another example of machine-readable instructions 1000 that can be implemented by the exemplary X-ray imaging system 100 of FIGS. 1 and 2 to provide guidance for imaging parameters for a radiographic process based on a specified effective pixel pitch and / or effective voxel size. The exemplary instructions 1000 can be stored in a memory device (e.g., memory circuit 212 of FIG. 2) and executed by a processing circuit (e.g., processing circuit 210 of FIG. 2). The exemplary instructions 1000 guide the selection of parameters and / or magnification by outputting an indication of whether the measured focal spot size and geometric shape result in a desired blur (e.g., instead of automatic selection of parameters and / or magnification). The instructions 1000 can be executed in response to, for example, the input of a voxel size input 410 via interface 400 and the selection of an "Effective Pixel Pitch / Effective Voxel Size" button 420.

[0121] In block 1002, the processing circuit 210 receives an effective pixel pitch and / or an effective voxel size (e.g., via user interface 400 of FIG. 4) and receives a blur threshold. In some examples, the blur threshold can be calculated from the pixel pitch and / or the effective voxel size. The processing circuit 210 can receive the pixel pitch and / or the effective voxel size, and the blur threshold, automatically via a manual input and / or from a remote computing system (e.g., system 299 of FIG. 2).

[0122] In block 1004, the processing circuit unit 210 determines whether the focus size is known (e.g., previously measured or obtained by another method). For example, if the focus size was obtained (e.g., measured) in less than a threshold time before using the measured wattage, the processing circuit unit 210 can search for the focus size in a reference table. If the focus size is known (block 1004), the processing circuit unit 210 can search for the geometric magnification and power parameter values from the memory device based on the focus size, the blur threshold value, and the pixel pitch and / or the effective voxel size.

[0123] If the focus size is not known (block 1004), in block 1006, the processing circuit unit 210 measures the focus size. Block 1006 can be implemented, for example, by executing blocks 602 to 606 of FIG. 6.

[0124] In block 1008, the processing circuit unit 210 determines whether the calculated blur is within the target blur range for the process configuration. For example, the upper threshold of the target blur range can be set to be equivalent to or based on the pixel size or the effective pixel pitch to cause the processing circuit unit 210 to determine whether the blur is less than 1 pixel equivalent. In other examples, the calculated blur can be compared with the voxel size. However, any other desired threshold can also be used.

[0125] In some examples, in block 1008, the processing circuit unit 210 can further determine whether the calculated blur is below the upper blur threshold and / or above the lower blur threshold. In some examples, the lower blur threshold is determined as a threshold slightly (e.g., a predetermined amount or percentage of the threshold) below the upper blur threshold, thereby avoiding an unnecessarily long process time to achieve substantially the same image quality.

[0126] If the calculated blurriness is not within the target blurriness range for the process configuration (block 1008), at block 1010, the processing circuitry 210 outputs an indication (e.g., via the user interface 204) indicating that the value of a blurriness parameter for which a power parameter value(s) and / or geometric magnification is outside the blurriness range results in the blurriness.

[0127] At block 1012, the processing circuitry 210 determines whether an adjustment(s) for the power parameter(s) has been received (e.g., via the user interface 204). For example, an operator can select different values of wattage or other power parameters to change the focus and blurriness. Alternatively, the processing circuitry 210 can also correct the power parameter(s) based on a stored relationship between the power parameter(s) and blurriness (or focus).

[0128] If no adjustment for the power parameter(s) has been received or requested (block 1012), at block 1014, the processing circuitry 210 determines whether an adjustment(s) for the geometric magnification has been received (e.g., via the user interface 204). For example, an operator can select different values of geometric magnification via the user interface 204, and / or the processing circuitry 210 can adjust the geometric shapes of the emitter 106, detector 108, and / or object positioner 210 from which it calculates the geometric magnification. Alternatively, the processing circuitry 210 can also correct the geometric magnification (and / or the configured geometric shape of the system 100) based on a stored relationship between the magnification and blurriness (or focus).

[0129] If no adjustment for the geometric magnification has been received or is requested (block 1014), the control returns to block 1010 and continues to output an indication that the blur is out of range. On the other hand, when an adjustment for the power parameter(s) has been received or is requested (block 1012), or when an adjustment for the geometric magnification has been received or is requested (block 1014), the control returns to block 1006 to re-measure the focus size.

[0130] When the calculated blur is within the target blur range (block 1008), at block 1016, the processing circuitry 210 outputs an indication (e.g., via the user interface 204) that the power parameter value(s) and / or the geometric magnification result in a value of the blur parameter that is within the blur range.

[0131] At block 1018, the processing circuitry 210 controls the imaging process based on the configured parameters. For example, the processing circuitry 210 controls the emitter 106 and the detector 108 to generate one or more 2D and / or radiographs for 3D data (e.g., 3D CT scan, etc.). The exemplary instruction 1000 then ends.

[0132] The present method and / or system can be implemented in hardware, software, and / or a combination of hardware and software. The present method and / or system can be implemented in a centralized manner in at least one computing system, or in a distributed manner in which different elements are distributed over several interconnected computing and / or remote computing systems. Any type of computing system or other device adapted to execute the methods described herein is suitable. A typical combination of hardware and software can include a general-purpose computing system together with a program or other code that, when loaded and executed, controls the computing system to execute the methods described herein. Another typical embodiment can include an application-specific integrated circuit or chip. Some embodiments can include a non-transitory machine-readable (e.g., computer-readable) medium (e.g., a flash drive, an optical disk, a magnetic storage disk, etc.), such non-transitory machine-readable media storing one or more instructions (e.g., lines of code) executable by a machine, thereby causing the machine to execute a process as described herein.

[0133] As used herein, the term "for example" begins a list of one or more non-limiting examples, instances, or illustrations.

[0134] As used herein, the terms "coupled," "coupled to," and / or "coupled with" mean structural and / or electrical connection, whether by attachment, adhesion, connection, joining, fastening, linking, and / or otherwise fixed. As used herein, the term "attach" means to adhere, couple, connect, join, fasten, link, and / or otherwise fix. As used herein, the term "connect" means to attach, adhere, couple, join, fasten, link, and / or otherwise fix.

[0135] As used herein, the terms "circuit" and "circuitry" refer to physical electronic components (i.e., hardware) and any software and / or firmware ("code") that can configure the hardware, that the hardware can execute, and / or that can otherwise be associated with the hardware. As used herein, for example, a particular processor and memory can include a first "circuit" when executing the first one or more lines of code, and can include a second "circuit" when executing the second one or more lines of code. As utilized herein, circuitry is "operable" and / or "configured" to perform its function whenever it includes the hardware and code (if either is required) necessary to perform that function, regardless of whether the performance of that function is disabled (e.g., by user-configurable settings, factory trim, etc.) or not enabled.

[0136] As used herein, a control circuit can include digital and / or analog circuitry, discrete and / or integrated circuitry, microprocessors, DSPs, etc., software, hardware, and / or firmware that constitutes part or all of a controller and / or is located on one or more substrates used to control a radiography system to perform a radiography process.

[0137] As used herein, the term "processor" means a processing device, apparatus, program, circuit, component, system, and subsystem, whether implemented in hardware, implemented in tangibly embodied software, or implemented in both, and whether programmable or not. As used herein, the term "processor" includes, but is not limited to, one or more computing devices, circuits connected by wiring, devices and systems that change signals, devices and machines for controlling a system, a central processing unit, programmable devices and systems, field programmable gate arrays, application specific integrated circuits, system on a chip, systems comprising individual elements and / or circuits, state machines, virtual machines, data processors, processing facilities, and any combination of the foregoing. A processor can be, for example, any type of general purpose microprocessor or general purpose microcontroller, a digital signal processing (DSP) processor, an application specific integrated circuit (ASIC), a graphics processing unit (GPU), a reduced instruction set computer (RISC) processor with an advanced RISC machine (ARM) core, etc. A processor may be coupled to and / or integrated with a memory device.

[0138] As used herein, the terms "memory", "memory circuitry", and / or "memory device" mean computer hardware or circuitry for storing information for use by a processor and / or other digital device. The memory, memory circuitry, and / or memory device can be any suitable type of computer memory or any other type of electronic storage device medium, such as read-only memory (ROM), random access memory (RAM), cache memory, compact disc read-only memory (CDROM), electro-optical memory, magneto-optical memory, programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), computer-readable medium, etc. The memory can be, for example, non-transitory memory, non-transitory processor-readable medium, non-transitory computer-readable medium, non-volatile memory, dynamic RAM (DRAM), volatile memory, ferroelectric RAM (FRAM (registered trademark)), first-in first-out (FIFO) memory, last-in first-out (LIFO) memory, stack memory, non-volatile RAM (NVRAM), static RAM (SRAM), cache, buffer, semiconductor memory, magnetic memory, optical memory, flash memory, flash card, compact flash (registered trademark) card, memory card, secure digital memory card, micro card, mini card, expansion card, smart card, memory stick, multimedia card, picture card, flash storage, subscriber identity module (SIM) card, hard drive (HDD), solid state drive (SSD), etc. The memory can be configured to store code, instructions, applications, software, firmware, and / or data, and can be external to, internal to, or both with respect to the processor.

[0139] As used herein, "and / or" means any one or more of the items in the list connected by "and / or". By way of example, "x and / or y" means any of the three elements of the set {(x), (y), (x,y)}. In other words, "x and / or y" means "one or both of x and y". As another example, "x, y and / or z" means any of the seven elements of the set {(x), (y), (z), (x,y), (x,z), (y,z), (x,y,z)}. In other words, "x, y and / or z" means "one or more of x, y and z". As used herein, the term "exemplary" serves as a non-limiting example, instance or illustration. As used herein, the term "for example" begins a list of one or more non-limiting examples, instances or illustrations.

[0140] Although the method and / or system has been described with reference to certain embodiments, those skilled in the art will understand that various changes can be made and equivalents can be substituted without departing from the scope of the method and / or system. For example, the disclosed example blocks and / or components can be combined, divided, rearranged, and / or otherwise changed. In addition, many modifications can be made to adapt the teachings of this disclosure to a particular situation or material without departing from the scope of this disclosure. Accordingly, the method and / or system is not limited to the particular embodiments disclosed. Instead, the method and / or system includes all embodiments that fall within the scope of the appended claims, literally or under the doctrine of equivalents.

Claims

1. A method of configuring a radiation imaging system having a radiation emitter and a radiation detector, comprising: analyzing, using a processing circuit unit, a reference image captured using a first value of a first power parameter for the radiation emitter to determine a value of a focal spot size for the radiation emitter; outputting an indication as to whether a selected value of the first power parameter results in a value of an unsharpness parameter that meets an unsharpness threshold based on a determined relationship between the first value of the first power parameter and the value of the focal spot size; controlling the radiation imaging system using the selected power parameter to perform a radiation imaging process to obtain one or more radiation imaging images that meet the unsharpness threshold; The method comprising.

2. The method of claim 1, further comprising receiving an updated value of the first power parameter and outputting an indication as to whether the updated value of the first power parameter results in the value of the unsharpness parameter that meets the unsharpness threshold.

3. The method of claim 1, further comprising outputting a recommended change to the value of the first power parameter to cause the value of the first power parameter to result in the value of the unsharpness parameter that meets the unsharpness threshold.

4. The method of claim 1, further comprising outputting an indication as to whether a detected magnification value results in the value of the unsharpness parameter that meets the unsharpness threshold.

5. The method of claim 4, further comprising outputting a recommended change to the magnification value to cause the value of the first power parameter to result in the value of the unsharpness parameter that meets the unsharpness threshold.

6. The method of claim 1, wherein the unsharpness threshold is based on at least one of a pixel size of the radiation detector or a pixel pitch of the radiation detector.

7. The method of claim 1, wherein the unsharpness threshold is set to one of a dimension of a pixel of the radiation detector or a pixel pitch of the radiation detector.

8. The method of claim 1, wherein analyzing the reference image comprises analyzing the reference image to determine one or more dimensions of a reference feature based on a predetermined gauge device.

9. Furthermore, measuring one or more dimensions of the blur in the reference image; and associating the one or more dimensions with at least one of the first power parameter, the location of the measurement in the reference image, the current focus size, the voxel size, the effective pixel pitch, or the magnification parameter and storing in a storage device; The method according to claim 8, comprising:

10. The method according to claim 1, wherein the radiation emitter includes an X-ray tube and the radiation detector includes a digital X-ray detector.

11. Furthermore, determining the value of the unsharpness parameter based on the measured focus size and magnification parameter; The method according to claim 1, comprising:

12. A radiation imaging system, comprising: a user interface; a radiation detector; a radiation emitter configured to emit radiation toward the radiation detector; an object positioner configured to position an object to be inspected between the radiation detector and the radiation emitter; a computing device comprising a processing circuit, the processing circuit analyzing a reference image captured using a first value of a first power parameter for the radiation emitter to determine a value of a focus size for the radiation emitter; outputting, via the user interface, an indication of whether a selected value of the first power parameter results in a value of an unsharpness parameter that satisfies an unsharpness threshold based on a determined relationship between the first value of the first power parameter and the value of the focus size; controlling the radiation emitter using the selected power parameter to perform a radiation imaging process to obtain one or more radiation imaging images that satisfy the unsharpness threshold; A computing device configured to perform; A radiation imaging system comprising:

13. The radiation imaging system according to claim 12, wherein the user interface is configured to receive an updated value of the first power parameter, and the processing circuit is configured to output an indication of whether the updated value of the first power parameter results in the value of the unsharpness parameter that satisfies the unsharpness threshold.

14. The radiation imaging system according to claim 12, wherein the processing circuit unit is configured to output a recommended change to the value of the first power parameter so as to bring about the value of the unsharpness parameter for which the value of the first power parameter satisfies the unsharpness threshold value.

15. The radiation imaging system according to claim 12, wherein the processing circuit unit is configured to output a display indicating whether the detected magnification value brings about the value of the unsharpness parameter that satisfies the unsharpness threshold value.

16. The radiation imaging system according to claim 15, wherein the processing circuit unit is configured to output a recommended change to the magnification value so as to bring about the value of the unsharpness parameter for which the value of the first power parameter satisfies the unsharpness threshold value.

17. The radiation imaging system according to claim 12, wherein the unsharpness threshold value is based on at least one of a pixel size of the radiation detector or a pixel pitch of the radiation detector.

18. The radiation imaging system according to claim 12, wherein the unsharpness threshold value is set to one of a dimension of a pixel of the radiation detector or a pixel pitch of the radiation detector.

19. The radiation imaging system according to claim 12, wherein the processing circuit unit is configured to analyze the reference image by analyzing one or more dimensions of a reference feature based on a predetermined gauge device.

20. The processing circuit unit is measuring one or more dimensions of blur in the reference image; associating the one or more dimensions with at least one of the first power parameter, a location of the measurement in the reference image, a current focal size, a voxel size, an effective pixel pitch, or a magnification parameter and storing the result in a storage device; The radiation imaging system according to claim 19, wherein the processing circuit unit is configured to perform the above operations.

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