Management of Distributed Materials Testing Systems

Abstract

This specification describes an example of a distributed materials testing system that collects data from multiple materials testing systems. [Solution] In some examples, a central management server is used to collect data and identify status information, statistical metrics, and / or historical events related to a selected material testing system based on the collected data. In some examples, since a central management server is used, the status information, statistical metrics, and / or historical events can be accessed through any interface communicating with the central management server. In some examples, the status information, statistical metrics, and / or historical events may be used by administrators and / or supervisors to monitor testing activities, identify and / or address issues, and / or plan for future testing.

Description

Technical Field

[0001] [Cross - Reference to Related Applications] This application claims the priority and benefit of U.S. Provisional Patent Application No. 63 / 695,085, filed on September 16, 2024, entitled "MANAGEMENT OF DISTRIBUTED MATERIAL TESTING SYSTEMS". The entire content of this U.S. Provisional Patent Application is incorporated herein by reference.

[0002] This disclosure relates generally to distributed material testing systems and, more particularly, to the management of distributed material testing systems.

Background Art

[0003] Material testing machines are used to test the properties (e.g., tensile strength / compressive strength) of various material specimens. Specific test methods (also referred to as test procedures) can vary for each material specimen and / or material testing machine.

[0004] By comparing such systems with the present disclosure described in the remainder of this application with reference to the drawings, the limitations and disadvantages of conventional and traditional approaches will become apparent to those skilled in the art.

Summary of the Invention

[0005] This disclosure relates to the management of a distributed material testing system that is substantially illustrated by and / or described with respect to at least one of the figures and more fully described in the claims.

[0006] In addition to these and other advantages, aspects, and novel features of the present disclosure, the detailed content of the illustrated examples of the present disclosure will be more fully understood from the following description and the drawings.

Brief Description of the Drawings

[0007] [Figure 1] A diagram showing an exemplary material testing system in accordance with an aspect of the present disclosure.

[0008] [Figure 2] This is a block diagram of the material testing system illustrated in Figure 1, according to an aspect of this disclosure.

[0009] [Figure 3] This is a block diagram of an exemplary dispersed materials testing system according to the embodiments of this disclosure.

[0010] [Figure 4] This flowchart shows a central control process for an example of the distributed materials testing system shown in Figure 3, according to the aspects of this disclosure.

[0011] [Figure 5a] This figure shows an example of a graphical user interface (GUI) that may be shown in the central management process of Figure 4 according to an aspect of this disclosure. [Figure 5b] This figure shows an example of a GUI that may be shown during the central management process in Figure 4, according to the aspects of this disclosure. [Figure 5c] This figure shows an example of a GUI that may be shown during the central management process in Figure 4, according to the aspects of this disclosure. [Figure 5d] This figure shows an example of a GUI that may be shown during the central management process in Figure 4, according to the aspects of this disclosure. [Figure 5e] This figure shows an example of a GUI that may be shown during the central management process in Figure 4, according to the aspects of this disclosure. [Figure 5f] This figure shows an example of a GUI that may be shown during the central management process in Figure 4, according to the aspects of this disclosure. [Figure 5g] This figure shows an example of a GUI that may be shown during the central management process in Figure 4, according to the aspects of this disclosure. [Modes for carrying out the invention]

[0012] The figures are not necessarily on a uniform scale. Where appropriate, the same or similar reference numerals are used in the figures to refer to the same or identical elements. For example, reference numerals with letters (e.g., gripping part 124a, gripping part 124b) refer to the same reference numerals without letters (e.g., gripping part 124).

[0013] This specification discloses examples of distributed materials testing systems that use a central management server to collect data from several materials testing systems that communicate with the central management server. In some examples, the central management server is configured to use the collected data to identify relevant system management information and to allow users to access the system management information from any workstation, terminal, and / or other user interface connected to the central management server. In some examples, the system management information may allow users to easily compare and / or contrast the operational efficiency and / or utilization of different materials testing systems. The system management information can further assist in auditing, monitoring, identifying and / or addressing issues in testing activities and / or planning for future testing.

[0014] Some examples of the present disclosure relate to a non-temporary computer-readable medium, which, when executed by a processing circuit, receives test data from one or more material testing systems, the test data relating to testers, test parameters, test results, or test timing of multiple tests performed using one or more material testing systems, and determines an utilization metric based on the test data, the utilization metric indicating how much or how often a particular material testing system, or one or more of the material testing systems, was used during a selected period, and outputs a human-perceptible representation of the utilization metric via a user interface, the processing circuit includes machine-readable instructions to cause the processing circuit to do so.

[0015] In some examples, the utilization metric includes (i) the number of tests performed by one or more testers, a specific material testing system, or one or more material testing systems during a selected period; (ii) the quantity of samples or subjects tested by one or more testers, a specific material testing system, or one or more material testing systems during a selected period; or (iii) the percentage or rate of one or more testers or one or more material testing systems performing tests at a specific time during the selected period.

[0016] In some examples, the human-perceivable representation includes a first human-perceivable representation, and the non-temporary computer-readable medium, when executed by a processing circuit, further includes a machine-readable command causing the processing circuit to receive system data from one or more material testing systems, the system data relating to information about one or more material testing systems; to identify a particular material testing system based on a user selection received via a user interface; to obtain specific system data relating to a particular material testing system based on the system data, test data, and the particular material testing system; and to output a second human-perceivable representation of the specific system data via the user interface.

[0017] In some examples, specific system data may include a system identifier for a specific materials testing system, the current test status of a specific materials testing system, the current tester for a specific materials testing system, event information relating to one or more events concerning a specific materials testing system, a machine identifier for a specific materials testing machine in a specific materials testing system, the manufacturing date of a specific materials testing machine, a description of a specific materials testing machine, sensor information relating to one or more sensors of a specific materials testing machine, calibration information relating to the calibration of one or more sensors or a specific materials testing machine, a workstation identifier for a specific test workstation in a specific materials testing system, or software information relating to software running on a specific test workstation.

[0018] In some examples, when executed by a processing circuit, a non-transitory computer-readable medium is to receive system data from a particular materials testing system of one or more materials testing systems, where the system data includes error data indicating that a sensor or other mechanical component of the particular materials testing machine of the particular materials testing system is malfunctioning, to determine based on the error data whether the malfunction is a legitimate reason for inspection and repair of the sensor or the particular materials testing machine, and in response to the determination that the malfunction is a legitimate reason for inspection and repair of the sensor or the particular materials testing machine, to output, via a user interface, an inquiry as to whether a service visit should be scheduled, and in response to receiving an affirmative response to the inquiry, to communicate with a service center via a central server to schedule a service visit. The non-transitory computer-readable medium further includes machine-readable instructions causing the processing circuit to perform the above operations.

[0019] In some examples, when executed by a processing circuit, a non-transitory computer-readable medium is to identify one or more qualified service technicians based on a malfunction, error data, the type of sensor or other mechanical component, test data, or service history, and to output, via a user interface, a list identifying the one or more qualified service technicians. The non-transitory computer-readable medium further includes machine-readable instructions causing the processing circuit to perform the above operations. In some examples, when executed by a processing circuit, a non-transitory computer-readable medium is to communicate with a service center to schedule a service visit in response to receiving a selection of a particular service technician via a user interface and identifying the service center of the particular service technician. The non-transitory computer-readable medium further includes machine-readable instructions causing the processing circuit to perform the above operation.

[0020] Some examples of the present disclosure perform multiple tests on multiple material specimens and are configured to transmit test data regarding the testers, test parameters, test results, or test timings of the multiple tests to one or more material testing systems, and a central server configured to receive test data from the one or more material testing systems, the central server comprising a central server processing circuit configured to determine a utilization metric based on the test data, the utilization metric indicating how much or how frequently a particular material testing system or multiple material testing systems were used during a selected period, a central server, and a user interface in communication with the central server and configured to output a human-perceivable display of the utilization metric, a system comprising the user interface.

[0021] In some examples, the utilization metric includes (i) the number of tests performed by one or more testers, a particular material testing system, or one or more material testing systems during a selected period, (ii) the amount of samples or specimens tested by one or more testers, a particular material testing system, or one or more material testing systems during a selected period, or (iii) the percentage or rate of one or more testers or one or more material testing systems that were preparing, performing, or analyzing the results of a test at a particular time during a selected period.

[0022] In some examples, the human-perceivable display includes a first human-perceivable display, the one or more material testing systems are further configured to transmit system data to the central server, the system data relates to information about the one or more material testing systems, the central server processing circuit identifies a particular material testing system based on a user selection and is further configured to obtain particular system data related to the particular material testing system based on the system data, the test data, and the particular material testing system, and the user interface is configured to receive the user selection as an input and output a second human-perceivable display of the particular system data.

[0023] In some examples, specific system data may include a system identifier for a specific materials testing system, the current test status of a specific materials testing system, the current tester for a specific materials testing system, event information relating to one or more events concerning a specific materials testing system, a machine identifier for a specific materials testing machine in a specific materials testing system, the manufacturing date of a specific materials testing machine, a description of a specific materials testing machine, sensor information relating to one or more sensors of a specific materials testing machine, calibration information relating to the calibration of one or more sensors or a specific materials testing machine, a workstation identifier for a specific test workstation in a specific materials testing system, or software information relating to software running on a specific test workstation.

[0024] In some examples, multiple material testing systems are further configured to transmit system data to a central server, which includes error data indicating that a sensor or other mechanical component of a particular material testing machine in a particular material testing system is malfunctioning. The central server processing circuit is further configured to determine, based on the error data, whether the malfunction constitutes a valid reason for inspection or repair of the sensor or the particular material testing machine; to output a query via the user interface regarding whether a service visit should be scheduled, depending on the determination that the malfunction constitutes a valid reason for inspection or repair of the sensor or the particular material testing machine; and to communicate with a service center to schedule a service visit upon receiving a positive response to the query via the user interface.

[0025] In some examples, the central server processing circuit is further configured to identify one or more qualified service technicians based on malfunctions, error data, types of sensors or other mechanical components, test data, or service history, and to output a list of the one or more qualified service technicians via a user interface. In some examples, the user interface is configured to receive a selection of a specific service technician from the list of the one or more qualified service technicians, the central server processing circuit is configured to identify the service center of the specific service technician, and the central server is configured to communicate with the service center to schedule a service visit.

[0026] Some examples of the present disclosure relate to a method for receiving test data from one or more material testing systems to a central server, wherein the test data pertains to testers, test parameters, test results, or test timing of multiple tests performed using one or more material testing systems, and for determining an utilization metric on the central server based on the test data, wherein the utilization metric indicates how much or how often a particular material testing system, or one or more material testing systems, was used for testing during a selected period, and for outputting a human-perceptible representation of the utilization metric via a user interface.

[0027] In some examples, the utilization metric includes (i) the number of tests performed by one or more testers, a specific material testing system, or one or more material testing systems during a selected period; (ii) the quantity of samples or subjects tested by one or more testers, a specific material testing system, or one or more material testing systems during a selected period; or (iii) the percentage or rate of one or more testers or one or more material testing systems performing tests at a specific time during the selected period.

[0028] In some examples, the human-perceivable representation includes a first human-perceivable representation, the method comprising: receiving system data from one or more material testing systems to a central server, wherein the system data relates to information about one or more material testing systems; the central server identifying a particular material testing system based on a user selection received via a user interface; retrieving specific system data relating to a particular material testing system based on the system data, test data, and the particular material testing system; and outputting a second human-perceivable representation of the particular system data via the user interface.

[0029] In some examples, specific system data may include a system identifier for a specific materials testing system, the current test status of a specific materials testing system, the current tester for a specific materials testing system, event information relating to one or more events concerning a specific materials testing system, a machine identifier for a specific materials testing machine in a specific materials testing system, the manufacturing date of a specific materials testing machine, a description of a specific materials testing machine, sensor information relating to one or more sensors of a specific materials testing machine, calibration information relating to the calibration of one or more sensors or a specific materials testing machine, a workstation identifier for a specific test workstation in a specific materials testing system, or software information relating to software running on a specific test workstation.

[0030] In some examples, the method further includes receiving system data from a specific material testing system among one or more material testing systems to a central server, wherein the system data includes error data indicating that a sensor or other mechanical component of a specific material testing machine of the specific material testing system is malfunctioning; the central server determining, based on the error data, whether the malfunction constitutes a valid reason for inspection or repair of the sensor or the specific material testing machine; outputting a query via a user interface regarding whether a service visit should be scheduled in response to the determination that the malfunction constitutes a valid reason for inspection or repair of the sensor or the specific material testing machine; and communicating with a service center via the central server to schedule a service visit in response to the receipt of a positive response to the query.

[0031] In some examples, the method further includes identifying one or more qualified service technicians based on malfunctions, error data, types of sensors or other mechanical components, test data, or service history; outputting a list of the identified one or more qualified service technicians via a user interface; and a central server communicating with service centers to schedule service visits in response to receiving the selection of specific service technicians via the user interface and identifying the service centers of the specific service technicians.

[0032] Figure 1 shows an illustrative materials testing system 100. As shown, the materials testing system 100 includes a materials testing machine 102 (also known as a general-purpose testing machine) and a computing system 200 connected to the materials testing machine 102 via a cable 106. The connection is shown as physically connected, but in some examples it may be wireless instead of wired.

[0033] In the example shown in Figure 1, the material testing machine 102 includes a frame 112. In some examples, the frame 112 provides rigid structural support to other components of the material testing machine 102. As shown, the frame 112 includes an upper plate 114 and a bottom base 116 connected by two support columns 118. In some examples, the support columns 118 of the frame 112 may house guide rails and / or drive shafts 212 of the material testing machine 102 (see, for example, Figure 2).

[0034] In the example in Figure 1, the movable crosshead 120 extends between the support columns 118. In some examples, the movable crosshead 120 may be connected to a guide rail and / or drive shaft 212 housed in the support columns 118 and / or configured to move toward and away from the base 116 through the (e.g., motorized) operation of the drive shaft(s) 212. In the example in Figure 1, one movable crosshead 120 is shown, but in some examples, the material testing machine 102 may have multiple movable crossheads 120 and / or other movable members.

[0035] In the example in Figure 1, the fixture 122 is attached to the bottom base 116 of the frame 112 and to the movable crosshead 120. As shown, the lower fixture 122a includes a gripping portion 124a, and the upper fixture 122b includes both the test sensor 126 and the gripping portion 124b. In the example in Figure 1, one test sensor 126 and two gripping portions 124 are shown, but in some examples, the testing machine 102 may include more or fewer test sensors 126 and / or gripping portions 124.

[0036] In the example in Figure 1, the gripping section 124 holds the test subject 128. The test subject 128 is shown as a rope / wire (e.g., made of steel), but in some examples it may be made of some other type of material and / or component. The gripping sections 124a and / or 124b are shown as rope holders, but in some examples they may be configured as bolt holders, wedge grips, side-acting grips, manual grips, roller grips, capstan grips, and / or syringe holders, either as an alternative or in addition thereto. In some examples one or both of the gripping sections 124 may be replaced by a compression platen configured to compress the test subject 128.

[0037] In the example shown in Figure 1, the test sensor 126 is connected to the gripping portion 124 so that it can measure the force acting on the gripping portion 124 (and / or the subject 128, crosshead 120, etc.). In some examples, the test sensor 126 may be a load cell. In some examples, the test sensor 126 may be some other type of sensor.

[0038] In some examples, the material testing machine 102 may be configured for static mechanical testing. For example, the material testing machine 102 may be configured for compressive strength testing, tensile strength testing, shear strength testing, bending strength testing, deflection strength testing, tear strength testing, peel strength testing (e.g., strength of adhesive bonds), torsional strength testing, and / or any other compressive and / or tensile tests. In addition to or alternative to this, the material testing machine 102 may be configured to perform dynamic testing.

[0039] In some examples, the material testing machine 102 is configured to interface with a computing system 200 to carry out a test method. For example, the computing system 200 may communicate with the controller 214 of the material testing machine 102 (see, for example, Figure 2) to carry out a test method.

[0040] Figure 2 is a block diagram showing details of the calculation system 200 and additional details of the material testing machine 102. In the example in Figure 2, the exemplary material testing machine 102 includes one or more actuators 210 connected to one or more drive shafts 212. In some examples, the actuators 210 may be used to provide force to the drive shafts 212 and / or to guide the movement of the drive shafts 212. In some examples, the actuators 210 may include electric motors, pneumatic actuators, hydraulic actuators, piezoelectric actuators, repeaters, and / or switches.

[0041] The drive shaft 212 is further shown connected to the movable crosshead 120 such that the movement of the drive shaft(s) 212 via the actuator(s) 210 results in the movement of the movable crosshead 120. In the example of Figure 2, the term drive shaft 212 is used, but in some examples, the drive shaft 212 may be any other mechanical means that moves the movable crosshead 120 despite the guidance of the actuator(s) 210.

[0042] The exemplary material testing machine 102 further includes a controller 214 that electrically communicates with actuators 210(or actuators) 210. In some examples, the controller 214 may include a processing circuit and / or a memory circuit. In some examples, the controller 214 may be configured to control the material testing machine 102 based on one or more commands, control inputs, and / or test parameters. In some examples, the controller 214 may be configured to convert commands, control inputs, and / or test parameters (e.g., received from a computing system 200) into appropriate (e.g., electrical) signals that can be delivered to actuators 210(or actuators) 210, thereby controlling the operation of the material testing machine 102 (e.g., via actuators 210(or actuators) 210). For example, the controller 214 may provide one or more signals that instruct actuators 210(or actuators) 210 to increase or decrease the force applied by them.

[0043] In the example in Figure 2, the controller 214 further communicates electrically with the fixture 122 (e.g., the gripping unit 124 and the test sensor(s) 126). In some examples, the controller 214 may be configured to convert commands, control inputs, and / or test parameters (e.g., received from the computing system 200) into appropriate (e.g., electrical) signals that can be delivered to the gripping unit 124, thereby controlling the operation of the gripping unit 124 (e.g., gripping or releasing). In some examples, the controller 214 may be configured to convert commands, control inputs, and / or parameters (e.g., received from the computing system 200) into appropriate (e.g., electrical) signals that can be delivered to the sensor(s) 126, thereby controlling the operation of the sensor(s) 126. In some examples, the controller 214 may be configured to convert measurement data received from the sensor(s) 126 and / or to transmit the measurement data to the computing system 200.

[0044] The exemplary controller 214 further communicates electrically with the control panel 216 of the material testing machine 102. In some examples, the control panel 216 may include one or more input devices (e.g., buttons, switches, slides, knobs, microphones, dials, and / or other electromechanical input devices). In some examples, the control panel 216 may be used by an operator to directly control the material testing machine 102. In some examples, the controller 214 may be configured to control the material testing machine 102 by converting commands, control inputs, and / or test parameters received via the control panel 216 into appropriate (e.g., electrical) signals that can be delivered to the actuator(s) 210 and / or gripping(s) 124.

[0045] The controller 214 is also illustrated as communicating electrically with the communication interface 218b of the material testing machine 102. In some examples, the communication interface 218b includes a network interface. In some examples, the communication interface 218b includes hardware, firmware, and / or software for connecting the material testing machine 102 to a complementary workstation communication interface 218a of the computing system 200. In some examples, the controller 214 may receive information (e.g., commands) from the computing system 200 through the communication interface 218 and / or transmit information (e.g., measurement data from sensors 126) to the computing system 200 through the workstation communication interface 218.

[0046] In the example shown in Figure 2, the computing system 200 includes a test workstation 202 and a user interface (UI) 204 interconnected with each other. As shown, the UI 204 may include one or more input devices 206 configured to receive input from the user and one or more output devices 208 configured to provide output to the user.

[0047] In some examples, one or more input devices 206 may include one or more touchscreens, mice, keyboards, buttons, switches, slides, knobs, microphones, dials, and / or other input devices 206. In some examples, one or more output devices 208 may include one or more displays / touchscreens, speakers, lighting, haptic devices, and / or other output devices 208. In some examples, the output device(s) 208 (e.g., display screens) of the UI 204 may output one or more representations of a material testing process 250 configured to enable a user to set up and / or run a test method and / or analyze the test results of a test method. In some examples, the input device(s) 206 of the UI 204 may receive input from a user and send input data representing user input to the test workstation 202.

[0048] In the example in Figure 2, the exemplary test workstation 202 includes a workstation communication interface 218a. In some examples, one or more of the workstation communication interfaces 218a are network interfaces. In some examples, one or more of the workstation communication interfaces 218a include hardware, firmware, and / or software configured to facilitate communication between the workstation 202 and one or more external networks, servers, systems, and / or devices.

[0049] As shown, one workstation communication interface 218a communicates with the communication interface 218b of the material tester 102 via cable 106. As shown, the test workstation 202 further includes a workstation communication interface 218a that communicates with a network 220 (e.g., the Internet). In the example in Figure 2, the test workstation 202 communicates with a remote interface 230 via the network 220 and the workstation communication interface 218a. In some examples, the test workstation 202 may communicate with one or more other test systems, servers, and / or other devices via the network and / or workstation communication interface(s) 218a. As shown, the workstation communication interface 218a is electrically connected to the common electrical bus 219 of the test workstation 202.

[0050] In some examples, the test workstation 202 may be a computing device. In the example in Figure 2, the test workstation 202 includes a workstation processing circuit 224 connected to a common electric bus 219. In some examples, the workstation processing circuit 224 may include one or more processors. In some examples, the workstation processing circuit 224 is configured to process information received from the UI 204, a data import device(s) 108, and / or a material tester 102.

[0051] In some examples, the workstation processing circuit 224 is configured to transmit commands and / or test parameters to the material testing machine 102 (for example, via a communication interface(s) 218a). In some examples, the workstation processing circuit 224 is configured to output information to the operator through the UI 204. In some examples, the workstation processing circuit 224 is configured to execute machine-readable instructions stored in the workstation memory circuit 226.

[0052] In the example in Figure 2, the test workstation 202 further includes a workstation memory circuit unit 226 connected to a common electric bus 219. As shown, the workstation memory circuit unit 226 includes a material testing process 250. In some examples, the material testing process 250 includes machine-readable instructions. In some examples, the workstation processing circuit unit 224 is configured to execute the machine-readable instructions of the material testing process 250 and communicate with the material testing machine 102 (e.g., the controller 214 of the material testing machine 102) to set up the test of the material sample 128, perform the test of the material sample 128, and / or analyze the test results of the test of the material sample 128.

[0053] In some examples, the user sets up a test on the material sample 128 by specifying several specific parameters for the test, the material sample 128, and / or the analysis of the test results (for example, using UI204). In some examples, the test parameters may include the date on which the test is performed, the test identification information (e.g., number, name, type, description, etc.), the target start / end position of the gripping part(s) 124, the target start / end position of the crosshead 120, the target distance / direction to be moved by the crosshead 120, the target speed of movement of the crosshead 120, the expected test results(s) (e.g., location / type of breakage, distance moved before breakage, force applied before breakage, post-test properties of the sample, etc.), the time(s) at which the sensor(s) 126 should perform the measurement(s), and / or other information relating to a particular test method.

[0054] In some examples, the subject parameters may include the date on which subject 128 was manufactured / shipped / packaged, identification information of subject 128 (e.g., number, name, description, etc.), pre-test characteristics of subject 128 (e.g., actual size / dimensions, material type, weight, color, shape, coefficient, maximum tensile strength, etc.), and / or other information relevant to a particular subject 128. In some examples, the analysis parameters may include one or more algorithms that may be used to evaluate the results of the test method (and / or generate additional test results), one or more test result report formats, and / or one or more thresholds and / or threshold ranges (e.g., which can be used to make a ruling on the test result to determine whether subject 128 passed or failed the test).

[0055] In some examples, some or all of the subject parameters, test parameters, and / or analysis parameters are stored in a test file (for example, in the workstation memory circuit 226 and / or other memory circuit units) (and / or specified by the test file). In some examples, the subject parameters, test parameters, and / or analysis parameters are used by the test workstation 202 when performing the material testing process 250, conducting tests on the material subject 128, and / or analyzing the test results of the tests on the material subject 128.

[0056] In some examples, when a user uses the test workstation 202 (and / or material tester 102) to set up a test on a material sample 128, perform the test on the material sample 128, and / or analyze the test results of the test on the material sample 128, the material testing system 100 is considered to be "used" (and / or in a test state) for testing. In some examples, the utilization and / or test state status of the material testing system 100 may be relevant when identifying statistical metrics and / or other information used to manage the material testing system 100. In some examples, data representing the utilization, test state status, and / or other information regarding the material testing system 100 is sent to a central management server 302 that communicates with the material testing system 100.

[0057] Figure 3 shows an example of a distributed materials testing system 300 having a central management server 302 connected to several materials testing systems 100 via a network 220. While a specific number of materials testing systems 100 are shown in the example in Figure 3, in some examples, the number of materials testing systems 100 connected to the central management server 302 may be greater or less. While a single central management server 302 is shown in the example in Figure 3, in some examples, the central management server 302 may consist of several servers.

[0058] Although the central management server 302 is shown as a separate entity in Figure 3, in some examples it may be implemented by one of the connected material testing systems 100, specifically a test workstation 202. For example, components of the test workstation 202 may operate as components of the central management server 302 (at least at some point in time and / or with some capability). In another example, machine-readable instructions stored in the workstation memory circuit 226 may enable the test workstation 202 to operate as the central management server 302 (at least at some point in time).

[0059] In the example in Figure 3, the central management server 302 includes several server communication interfaces 308. In some examples, the server communication interfaces (which may be more than one) enable and / or facilitate connection and / or communication with the network 220 and / or the material testing system 100 (via the communication interface(s) 218). In some examples, one or more of the server communication interfaces 308 are network interfaces. In some examples, one or more of the server communication interfaces 308 include hardware, firmware, and / or software configured to facilitate communication between the central management server 302 and one or more external networks, systems, and / or devices (e.g., network 220 and / or material testing system 100).

[0060] In some examples, each material testing system 100 transmits data (e.g., previously recorded and / or simultaneously acquired data) to the central management server 302 (and / or server communication interface(s) 308) via a connection to the central management server 302. In some examples, this data may also be transmitted to the central management server 302 in response to user information requests (e.g., provided via UI204 and / or remote interface(s) 230).

[0061] For example, each material testing system 100 may send system data relating to its material testing system 100 to the central management server 302. As another example, each material testing system 100 may send user data relating to the users (and / or teams) using its material testing system 100 to the central management server 302. As yet another example, each material testing system 100 may send event data relating to system events to the central management server 302. As yet another example, each material testing system 100 may send test data relating to tests set up, executed and / or analyzed using its material testing system 100 to the central management server 302.

[0062] In some examples, the test data indicates the date and / or time the material testing process 250 is being performed, the date and / or time the test workstation 202 and / or the test machine 102 are used for setting up the test, performing the test, and / or analyzing the test results, and / or the date and / or time the test workstation 202 and / or the test machine 102 are in a test state (and / or which test state they are in). In some examples, the test data is data representing one or more parameters (e.g., test parameters, subject parameters, analysis parameters, etc.) used for setting up the test, performing the test, and / or analyzing the test results. In some examples, the test data represents the test results of the test of the material test subject 128. In some examples, the test data represents measurement data (e.g., received from the sensor(s) 126 of the material test machine 102 during the test), and / or the date / time the measurement was taken and / or the date / time the measurement data was captured.

[0063] In some examples, each material testing system 100 may additionally or alternatively transmit system data to the central management server 302. In some examples, the system data is data representing information about the material testing system 100. For example, the system data may include the system identifier of the material testing system 100 and / or the operational status of the material testing system 100 (and / or the test workstation 202, material testing machine 102, etc.).

[0064] In some examples, the system data may additionally or alternatively include a workstation identifier, model, software version, and / or other information relating to the test workstation 202 of the material testing system 100. In some examples, the system data may additionally or alternatively include a machine identifier, machine model, manufacturing date, description, and / or other information relating to the material testing machine 102 of the material testing system 100. In some examples, the system data may additionally or alternatively include an identifier, model, description, capability, calibration value, measured value, and / or other information relating to one or more sensors 126 of the material testing machine 102.

[0065] In some examples, each materials testing system 100 may additionally or alternatively transmit user data to the central management server 302. In some examples, user data indicates which user(s) and / or which team(s) are operating the materials testing system 100 on which date(s) / time(s). In some examples, user data may additionally or alternatively indicate which user(s) and / or which team(s) performed (and / or when) the setup of which test(s), the execution of which test(s), and / or the analysis of the results from which test(s).

[0066] In some examples, each material testing system 100 may additionally or alternatively transmit event data to the central management server 302. In some examples, the event data is data representing (and / or relating to) one or more events that have occurred with respect to the material testing system 100. In some examples, the event data may additionally or alternatively include the date / time the event occurred, the type of event that occurred, a description of the event, and / or documentation of the event. In some examples, the event types may include login / logout events, message events, service events, calibration events, test (e.g., setup, execution, analysis, etc.) events, and / or malfunction / error events.

[0067] In some examples, the test workstation 202 automatically records event data when an event occurs. For example, the material testing machine 102 and / or sensor 126 may report to the test workstation 202 when a machine / sensor malfunction / error occurred and / or details of the malfunction / error, and the test workstation 202 may record this information as event data. In another example, the test workstation 202 may automatically record when a user logs in / out, sends a message, and / or sets up a test, performs a test, and / or analyzes the test results, as well as details about the login / logout, message, and / or test.

[0068] In some cases, event data is provided to the test workstation 202 for recording before or after the event occurs, for example, through input by a user using the UI 204. For example, a service technician may manually provide information (and / or documentation) about a service event before or after a service event. In another example, an operator may manually provide information (and / or documentation) about a calibration event before or after a calibration event. The test workstation 202 may then record the event data and / or send the event data to the central management server 302.

[0069] In some examples, a central management server 302 records data transmitted by each material testing system 100. In the example in Figure 3, the central management server 302 includes a server memory circuit 226 through which data can be recorded. In some examples, the server memory circuit 226 includes a central data repository where data is stored. In some examples, the distributed material testing system 100 may, alternatively or additionally, include a separate central data repository that communicates with and stores data from the central management server 302.

[0070] In some examples, by storing data from several material testing systems 100 in a central data repository and / or a central management server 302, the data becomes accessible from any workstation 202, terminal, UI 204, remote interface 230, and / or other interfaces connected to the central management server 302 (e.g., via a network 220). In some examples, the central management server 302 is further configured to use the collected data to identify relevant system management information and to allow users to access the system management information from any workstation 202, terminal, UI 204, remote interface 230, and / or other interfaces connected to the central management server 302.

[0071] In some examples, the collected data and / or identified system management information may be used to compare and / or contrast the operational efficiency and / or utilization of different material testing systems 100. In some examples, the system management information can further assist in auditing, monitoring, identifying and / or addressing issues in testing activities and / or planning for future testing. In some examples, the central management server 302 collects / stores data and / or identifies relevant system management information in response to user input (e.g., provided via UI 204 and / or remote interface(s) 230).

[0072] In the example shown in Figure 3, the central management server 302 further includes a server processing circuit unit 306. In some examples, the server processing circuit unit 306 may comprise one or more processors. In some examples, the server processing circuit unit 224 is configured to execute machine-readable instructions stored in the server memory circuit unit 304 and / or query the central data repository.

[0073] In the example in Figure 3, the server memory circuit 226 is shown as storing the central management process 400. Although the central management process 400 is shown as part of the server memory circuit 226 in the example in Figure 3, in some examples it may be implemented using discrete circuit sections (e.g., the server processing circuit 306). In some examples the central management process 400 is implemented using non-temporary machine-readable instructions stored in the server memory circuit 226 and / or executed by the server processing circuit 306.

[0074] In some examples, the central management process 400 is configured to collect data from the distributed material testing systems 100 and identify relevant system management information (such as status, statistics, and history) relating to those material testing systems 100. By centralizing data collection and system management information identification, the collected data and / or system management information can be accessed from any workstation 202, terminal, UI 204, remote interface 230, and / or other interfaces connected to the central management server 302. In some examples, the collected data and / or identified system management information may be used to compare and / or contrast the operational efficiency and / or utilization of different material testing systems 100. In some examples, the system management information can further assist in auditing, monitoring, identifying and / or addressing issues in testing activities and / or planning for future testing.

[0075] Figure 4 is a flowchart illustrating the operation of an example of the central management process 400. In some examples, before using and / or proceeding with the central management process 400, the user may be required to log in and / or be authenticated (e.g., using user credentials, biometrics, RFID / NFC / Bluetooth® / barcode devices, etc.). In some examples, different instances of the central management process 400 may be run for different users and / or teams. Hereinafter, for the sake of understanding and convenience, the central management process 400 may be described as performing some specific operations, but it should be understood that one or more of the above-described components of the distributed materials testing system 300 (e.g., the server processing circuit unit 306, the remote interface(s) 230, the materials testing system(s) 100, etc.) may undertake these operations on behalf of (and / or in accordance with the instructions of the central management process 400).

[0076] In the example in Figure 4, the central control process 400 is initiated in block 402, where it collects data from various material testing systems 100 of the distributed material testing system 100, as described above. In some examples, the collected data includes test data, system data, and / or event data as described above. In some examples, data is collected in response to a certain input (e.g., user input) (e.g., provided via UI 204 and / or remote interface 230).

[0077] In some examples where the central control server 302 is implemented as part of the test workstation 202 of a specific material testing system 100, the central control process 400 may be concerned only with data relating to that specific test system 100. In such examples, the central control process 400 may collect only data from that specific test system 100 in block 402.

[0078] After block 402, the central management process 400 proceeds to block 404, where it determines various system management information based on the data collected in block 402. After block 404, the central management process 400 proceeds to block 406, where it provides one or more human-perceptible outputs (e.g., graphics, images, sounds, text, vibrations, etc.) of some or all of the system management information determined in block 404, which are output via the UI 204 and / or remote interface 230.

[0079] In some examples, the central management process 400 determines and / or outputs system management information in response to one or more inputs / selections (e.g., made by a user via the UI 204 and / or remote interfaces). In some examples, the central management process 400 determines and / or outputs system management information relating to selected users, teams, and / or material testing systems 100. In some examples, the central management process 400 restricts the users, teams, and / or material testing systems 100 that can be selected, and / or the collected data and / or system management information that can be accessed, based on the permissions and / or authorizations granted to logged-in users / teams, and / or the available / connected material testing systems 100.

[0080] In some examples, the system management information determined in block 404 includes statistical metrics. In some examples, the system management information determined in block 404 includes historical information. In some examples, the system management information determined in block 404 includes system status information.

[0081] In some examples, system status information is information about the identity and / or status of the material testing system 100. For example, system status information may include identifiers, models, and descriptions of the material testing system 100, the material testing machine 102, the test workstation 202, and / or the sensor 126. In some examples, system status information may additionally or alternatively include calibration information for the material testing machine 102 and / or the sensor(s) 126 (e.g., date / time of last calibration, date / time of next calibration, etc.). In some examples, system status information may additionally or alternatively include the operational status and / or connection status of the material testing system 100, the material testing machine 102, the test workstation 202, and / or the sensor(s) 126. In some examples, system status information is presented according to the selection of a particular material testing system 100.

[0082] Figure 5a shows an example of a system status graphical user interface (GUI) 500a that can be used in block 406 to output system status information (e.g., via UI 204 and / or remote interface 230). As shown, the system status GUI 500a includes a system list of different material testing systems 100. Each entry shown in the system list is an identifier for a particular material testing system 100. As shown, each system identifier is positioned adjacent to an "i" icon, which can be selected (e.g., by positioning a selection cursor over the icon) to display more information about a particular material testing system 100.

[0083] The system status GUI 500a is further described as including a drop-down dialog box that can be used to filter the list of selectable material testing systems 100. For example, the system list can be filtered so that only material testing systems 100 to which a particular user / team has been granted usage and / or access rights are shown in the system list. In some examples, the central management process 400 may automatically filter the system list to reflect the permissions and / or authorizations granted to the logged-in user. In some examples, the server memory circuit 226 stores user data and / or authorization data that can be used by the central management process 400 to determine the permissions and / or authorizations granted to the logged-in user.

[0084] In the example in Figure 5a, the user has selected the material testing system 100 corresponding to the system identifier TM12302, as indicated by the highlighting of that particular entry in the system list. Taking this selection into account, a system status GUI 500a is shown, listing system status information for the selected material testing system 100, the material testing machine 102 of the material testing system 100, and the sensors (which may be multiple) 126 of the material testing machine 102 of the material testing system 100. In the example in Figure 5a, the system status GUI 500 is also shown to include a “Detailed Report” button that can be selected to present a more detailed report of the system status information.

[0085] Specific status information relating to the selected material testing system 100 is shown in the system status GUI 500a illustrated in Figure 5a, although in some examples additional or alternative information may be shown. For example, GUI 500a may show whether a test is currently being set up / performed / analyzed (and / or what test is currently being set up / performed / analyzed), the progress of the test, which team / user is currently using the material testing system 100 and / or performing the test, the number of subjects tested / not yet tested in the sample, the current readings of the sensor(s) 126, the current position / displacement of the crosshead 120 and / or fixture(s) 122, and / or other information. In some examples, GUI 500a may use different colors to indicate whether certain status information is good, bad, caution, or neutral.

[0086] In some examples, the system management information determined in block 404 and / or output in block 406 includes one or more statistical metrics (for example, relating to a specific material testing system 100, team, and / or user). In some examples, the statistical metrics include utilization metrics indicating the amount of testing performed by the selected material testing system 100, user, and / or team.

[0087] In some examples, the utilization metric indicates the number or frequency of times a sample was tested, the number or frequency of times a material subject 128 was tested, the number or frequency of times a test was set up / performed, and / or the number or frequency of times test results were analyzed by the selected material tester 102, user, and / or team over a selected period. In some examples, the utilization metric indicates the amount, frequency, and / or rate of time the selected material tester 102 is used / utilized to set up tests, perform tests, and / or analyze test results over a selected period. In some examples, the utilization metric indicates the amount, frequency, and / or rate of time a particular user or team spends setting up tests, performing tests, and / or analyzing test results over a selected period.

[0088] In some examples where the utilization metric determined in block 404 is the utilization rate, the central control process 400 may determine the utilization rate based on the quotient obtained by dividing the active test time by the total time. In some examples, active test time is the time spent in the test state and / or the time spent performing test setup, test execution, and / or test result analysis. In some examples, the time spent actually performing the test may be weighted more heavily and / or considered more / fully active, while the time spent performing test setup and / or test result analysis may be weighted less heavily and / or considered less / incompletely active.

[0089] In some examples, the total time may be the total time over the selected period (e.g., 24 hours if the selected period is one day). In some examples, the total time may be a normal business day / hour (e.g., 9am to 5pm if the selected period is a weekday, and / or no time if the selected period is a weekend). In some examples, the total time may be a customized subset of the selected period determined based on custom activity time information (e.g., user input indicating actual business activity dates / times for a particular system 100, user, and / or team).

[0090] Figures 5b to 5d show examples of statistical metrics presented in the statistical metrics GUI 500b to 500d. In the example in Figure 5b, the statistical metrics GUI 500b shows a line graph plotting the utilization rate over a month for several material testing systems 100 selected from a selectable list of material testing systems 100 (similar to the system list in Figure 5a, except that multiple selections are possible). While one line is shown for each selected material testing system 100 in the example line graph in Figure 5b, in some examples, the line graph may not be so, and may contain only one line representing the utilization rate of the selected material testing systems 100 at a particular point in time.

[0091] In the example in Figure 5c, the statistical metric GUI500c includes a bar chart showing the number of samples tested over a week by a selected team. A list of selectable teams is shown, allowing the user to select one or more teams to include in the bar chart. In the example in Figure 5d, the statistical metric GUI500d includes a pie chart showing the number of material subjects 128 tested over a year by a selected user. A list of selectable users is shown, allowing the user to select one or more users to include in the pie chart. The list of users is also shown ordered by the number of material subjects 128 tested by each user (rather than by name / identifier as in Figures 5b and 5c).

[0092] In some examples, the system management information determined in block 404 and / or output in block 406 includes historical information. In some examples, the historical information is information about one or more events that occurred in the history of the selected material testing system 100, team, and / or user. In some examples, one or more events include login / logout events, message events, service events, calibration events, test (e.g., setup, run, analyze, etc.) events, sensor measurement events, and / or malfunction / error events.

[0093] Figure 5e shows an example of history information presented in the history GUI 500e, which can be output in block 406 (for example, via UI 204 and / or remote interface 230). As illustrated, the history GUI 500e includes a system list of selectable material testing systems 100, similar to the system list in Figures 5a and 5v (however, in some examples, the list may instead be a list of teams and / or users). The history GUI 500e further includes an event history table showing history events for the selected material testing system 100, and history information for each event.

[0094] In the example in Figure 5e, the event history table displays historical information regarding the date / time of the event, the type of the event, the equipment involved in the event (if applicable), a description of the event, and links to additional documentation related to the event. In some examples, the additional documentation may include test results, calibration certificates, service reports, error reports, and / or service requests. While some specific historical information is shown in the example in Figure 5e, in some examples, additional or alternative historical information may be shown when outputting the historical information in block 406 of the central management process 400.

[0095] In the example in Figure 4, after block 406, the central management process 400 proceeds to block 408, where it determines whether one or more of the error events and / or malfunction events determined in block 406 and / or output in block 408 constitute a valid reason for a service visit. In some examples, this determination is based on the severity and / or type of the error, the device involved in the error (e.g., whether such device can be repaired by a service visit), the logged-in user (e.g., whether that user is authorized to arrange a service visit), and / or other information.

[0096] In the example in Figure 4, if the central management process 400 determines that one or more error events and / or malfunction events determined in block 404 warrant a service visit, the central management process 400 proceeds to block 410 after block 408. In block 410, the central management process 400 provides options for the requested service visit. For example, the central management process 400 may provide a service visit request link as part of the output of block 406. Figure 5e shows an example of a service visit link (represented by an exclamation mark in a triangle) presented in an additional documentation column of the history GUI 500e in the example of Figure 5e.

[0097] In the example in Figure 4, after block 410, the central management process 400 proceeds to block 412, where the central management process 400 determines whether a service visit should be scheduled for one or more of the errors / malfunctions provided in block 410. In some examples, this determination is based on whether the user has provided input (e.g., via UI 204 and / or remote interface 230) to select a service visit request link. Figure 5f shows an exemplary service visit option GUI 500f that can be shown to the user to give them the option to schedule a service visit (e.g., in response to the user selecting a service visit request link in GUI 500e in Figure 5e).

[0098] If the central control process 400 determines in block 412 that a service visit should be scheduled, the central control process 400 proceeds to block 414, where it identifies one or more qualified service technicians to inspect and repair the selected error / malfunction. In some examples, the identification of a service technician(s) is based on information about the error / malfunction and / or information about the service technician(s). Relevant information about a service technician that may be considered when identifying a qualified service technician may include proximity to the material testing system 100 having the error / malfunction, recent history of dealing with similar errors / malfunctions, expertise in dealing with similar errors / malfunctions, dates / times the technician is available, and / or other information. In some examples, the central control process 400 may access a list of suitable service technicians and / or service companies (e.g., stored in server memory circuitry 304) when making identification(s) in block 414 for a specific material testing system 100, a specific malfunction / error, and / or generally.

[0099] Figure 5g shows an example of a technician list GUI 500g that includes a list of qualified service technicians and technician information for each service technician. As illustrated, the technician information includes contact information for each service technician. In the example in Figure 5g, some of the contact information is hyperlinked so that the selection of contact information can prompt the system to facilitate contact with the service technician (e.g., via a service center portal / website, email, and / or Voice over Internet Protocol). A “Select” button is further shown, and in some examples, the selection of this button can prompt the central management process 400 to attempt to automatically schedule a service visit (e.g., within a user-specified date, time, location, and / or other parameters). While some exemplary technician information is shown in the example in Figure 5g, in some examples, additional or alternative technician information may be provided.

[0100] In the example in Figure 4, when the user selects a specific service technician in block 414, the central management process 400 proceeds to block 416, where it attempts to schedule a service visit based on the selection in block 414 (and / or within certain user-specified date, time, location, and / or other parameters). In some examples, the central management process 400 may attempt to schedule the service visit using the selected service company's service center portal / website, email, and / or Voice over Internet Protocol. Although the central management process 400 is shown as terminating after block 416 in the example in Figure 4, in some examples it does not, but returns to block 402 after block 416.

[0101] The disclosed distributed materials testing system 300 and central management process 400 use a central management server 302 to collect data from the materials testing system 100 of the distributed materials testing system 100. In some examples, the central management process 400 is configured to use the collected data to identify relevant system management information and to allow users to access the system management information from any workstation 202, terminal, UI 204, remote interface 230, and / or other interface connected to the central management server 302. In some examples, the collected data and / or identified system management information may be used to compare and / or contrast the operational efficiency and / or utilization of different materials testing systems 100. In some examples, the system management information can further assist in auditing, monitoring, identifying and / or addressing issues in testing activities and / or planning for future testing.

[0102] The method and / or system can be implemented in hardware, software, and / or a combination of hardware and software. The method and / or system can be implemented centrally in at least one computing system, or in a distributed manner in which different elements are distributed across several interconnected computing or cloud systems. Any type of computing system or other device adapted to perform the method described herein is suitable. A typical combination of hardware and software may be a general-purpose computing system with a program or other code that, once loaded and executed, controls the computing system to perform the method described herein. Another typical embodiment may include an application-specific integrated circuit or chip. Some embodiments may include a non-temporary machine-readable (e.g., computer-readable) medium (e.g., flash drive, optical disk, magnetic storage disk, etc.) which stores one or more lines of machine-executable code, thereby causing a machine to perform a process such as that described herein.

[0103] While the Method and / or System has been described with reference to several specific embodiments, those skilled in the art will understand that various modifications and substitutions can be made without departing from the scope of the Method and / or System. In addition, many modifications can be made without departing from the scope of the Disclosure to adapt the teachings of the Disclosure to specific circumstances or materials. Thus, the Method and / or System is not limited to the specific embodiments disclosed, but is intended to include all embodiments that fall within the scope of the appended claims.

[0104] As used herein, "and / or" means any one or more items in the list linked by "and / or". For example, "x and / or y" means any element of the three-element set {(x), (y), (x,y)}. In other words, "x and / or y" means "one or both of x and y". As another example, "x, y and / or z" means any element of the seven-element set {(x), (y), (z), (x,y), (x,z), (y,z), (x,y,z)}. In other words, "x, y and / or z" means "one or more of x, y and z".

[0105] As used herein, the term “for example” commences a list of one or more non-limiting examples, cases, or illustrations.

[0106] As used herein, the terms "coupled," "coupled to," and "coupled with" mean a structural and / or electrical connection, whether it be attachment, bonding, joining, fastening, linking, and / or other fastening. As used herein, the term "attach" means to bond, connect, join, fasten, link, and / or otherwise fasten. As used herein, the term "connect" means to attach, bond, join, fasten, link, and / or otherwise fasten.

[0107] As used herein, the terms “circuit” and “circuit section” mean physical electronic components (i.e., hardware) and any software and / or firmware ("code") that can constitute the hardware, that the hardware can execute, and / or that can otherwise be associated with the hardware. As used herein, for example, a particular processor and memory may include a first “circuit” when executing one or more first lines of code, and a second “circuit” when executing one or more second lines of code. As used herein, whenever a circuit section includes hardware and / or code (if either is required) necessary to perform a certain function, the circuit section is “operable” and / or “configured” to perform that function, regardless of whether the performance of that function is disabled or not (e.g., by a user-configurable setting, factory trim, etc.).

[0108] As used herein, the control circuit may include digital and / or analog circuitry, discrete and / or integrated circuits, a microprocessor, a DSP, software, hardware and / or firmware, located on one or more circuit boards used to constitute part or all of the controller and / or to control equipment such as a welding process and / or a power supply or wire feeder.

[0109] As used herein, the term “processor” means a processing unit, device, program, circuit, component, system, and subsystem, whether implemented in hardware, in tangibly embodied software, or both, and whether programmable or not. As used herein, the term “processor” includes, but is not limited to, one or more computing devices, wired circuits, devices and systems for modifying signals, devices and machines for controlling systems, central processing units, programmable devices and systems, field-programmable gate arrays, application-specific integrated circuits, systems on a chip, systems comprising individual elements and / or circuits, state machines, virtual machines, data processors, processing equipment, and any combination thereof. A processor may be, for example, any type of general-purpose microprocessor or general-purpose microcontroller, a digital signal processing (DSP) processor, an application-specific integrated circuit (ASIC), a graphics processing unit (GPU), a reduced instruction set computer (RISC) processor with an advanced RISC machine (ARM) core, etc. A processor may be coupled to and / or integrated into a memory device.

[0110] As used herein, the terms “memory” and / or “memory device” mean computer hardware or circuitry that stores information for use by a processor and / or other digital device. Memory and / or memory devices may be any suitable type of computer memory or any other type of electronic storage medium, such as read-only memory (ROM), random access memory (RAM), cache memory, compact disk read-only memory (CDROM), electro-optical memory, magneto-optical memory, programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), computer-readable media, etc. Examples of memory include non-temporary memory, non-temporary processor-readable media, non-temporary computer-readable media, non-volatile memory, dynamic RAM (DRAM), volatile memory, ferroelectric RAM (FRAM®), first-in, first-out (FIFO) memory, last-in, first-out (LIFO) memory, stack memory, non-volatile RAM (NVRAM), static RAM (SRAM), cache, buffer, semiconductor memory, magnetic memory, optical memory, flash memory, flash card, CompactFlash® card, memory card, secure digital memory card, microcard, minicard, expansion card, smart card, memory stick, multimedia card, picture card, flash storage, subscriber identification module (SIM) card, hard drive (HDD), solid state drive (SSD), etc. Memory can be configured to store code, instructions, applications, software, firmware and / or data, and can be external, internal, or both to the processor.

Claims

1. When executed by the processing circuit, Receiving test data from one or more material testing systems, wherein the test data relates to the testers, test parameters, test results, or test timing of multiple tests performed using the one or more material testing systems. The utilization metric is determined based on the aforementioned test data, wherein the utilization metric indicates how much or how frequently a particular material testing system, or one or more of the material testing systems, was used during a selected period. Outputting a human-perceptible representation of the utilization metric via the user interface, A non-temporary computer-readable medium including machine-readable instructions that cause the processing circuit to perform the above-mentioned operation.

2. The non-temporary computer-readable medium according to claim 1, wherein the utilization metric includes (i) the number of tests performed by one or more testers, the specific material testing system, or the one or more material testing systems during the selected period; (ii) the amount of samples or subjects tested by the one or more testers, the specific material testing system, or the one or more material testing systems during the selected period; or (iii) the percentage or rate of the one or more testers or the one or more material testing systems performing tests at a specific time during the selected period.

3. The aforementioned human-perceivable representation includes a first human-perceivable representation, The non-temporary computer-readable medium, when executed by the processing circuit, Receiving system data from one or more material testing systems, wherein the system data relates to information about the one or more material testing systems. Identifying the specific material testing system based on user selections received via the user interface, Based on the aforementioned system data, the aforementioned test data, and the aforementioned specific material testing system, to obtain specific system data related to the aforementioned specific material testing system, Outputting a second human-perceptible representation of the specific system data via the user interface, The non-temporary computer-readable medium according to claim 1, further comprising a machine-readable instruction causing the processing circuit to perform the above.

4. The non-temporary computer-readable medium according to claim 3, wherein the specific system data includes a system identifier for the specific material testing system, the current test status of the specific material testing system, the current tester for the specific material testing system, event information relating to one or more events concerning the specific material testing system, a machine identifier for the specific material testing machine of the specific material testing system, the manufacturing date of the specific material testing machine, a description of the specific material testing machine, sensor information relating to one or more sensors of the specific material testing machine, calibration information relating to the calibration of one or more sensors or the specific material testing machine, a workstation identifier for the specific test workstation of the specific material testing system, or software information relating to software running on the specific test workstation.

5. When executed by the aforementioned processing circuit, Receiving system data from a specific material testing system among the one or more material testing systems, wherein the system data includes error data indicating that a sensor or other mechanical component of a specific material testing machine in the specific material testing system is malfunctioning. Determining whether the aforementioned malfunction constitutes a valid reason for inspection and repair of the sensor or the specific material testing machine based on the error data, In determining that the malfunction constitutes a valid reason for inspection and repair of the sensor or the specific material testing machine, an inquiry regarding whether a service visit should be scheduled is output via the user interface. Upon receiving a positive response to the aforementioned inquiry, the system communicates with the service center via the central server to schedule the service visit. The non-temporary computer-readable medium according to claim 1, further comprising a machine-readable instruction causing the processing circuit to perform the above.

6. When executed by the aforementioned processing circuit, Identifying one or more qualified service technicians based on the aforementioned malfunction, the aforementioned error data, the aforementioned type of sensor or other mechanical component, the aforementioned test data, or the service history, The user interface outputs a list identifying one or more qualified service technicians, The non-temporary computer-readable medium according to claim 5, further comprising a machine-readable instruction causing the processing circuit to perform the above.

7. The non-temporary computer-readable medium according to claim 6, further comprising a machine-readable instruction, which, when executed by the processing circuit, causes the processing circuit to communicate with the service center and schedule the service visit in response to the reception of the selection of a specific service technician via the user interface and the identification of the service center by the specific service technician.

8. One or more material testing systems configured to perform multiple tests on multiple material samples and to transmit test data relating to the testers, test parameters, test results, or test timing of the multiple tests, A central server configured to receive the test data from one or more material testing systems, the central server comprising a central server processing circuit configured to determine a utilization metric based on the test data, the utilization metric indicating how much or how often a particular material testing system, or the plurality of material testing systems, was used during a selected period, and the central server A user interface that communicates with the central server, and is configured to output a human-perceptible display of the utilization metric, A system equipped with these features.

9. The system according to claim 8, wherein the utilization metric includes (i) the number of tests performed by one or more testers, the specific material testing system, or the one or more material testing systems during the selected period; (ii) the amount of samples or subjects tested by one or more testers, the specific material testing system, or the one or more material testing systems during the selected period; or (iii) the percentage or rate of one or more testers or the one or more material testing systems that were preparing, performing, or analyzing the results of tests at a specific time during the selected period.

10. The aforementioned human-perceivable representation includes a first human-perceivable representation, The one or more material testing systems are further configured to transmit system data to the central server, and the system data relates to information about the one or more material testing systems. The central server processing circuit is further configured to identify the specific material testing system based on user selection, and to obtain specific system data related to the specific material testing system based on the system data, the test data, and the specific material testing system. The system according to claim 8, wherein the user interface is configured to receive the user selection as input and output a second human-perceptible representation of the specific system data.

11. The system according to claim 10, wherein the specific system data includes a system identifier for the specific material testing system, the current test status of the specific material testing system, the current tester for the specific material testing system, event information relating to one or more events concerning the specific material testing system, a machine identifier for the specific material testing machine of the specific material testing system, the manufacturing date of the specific material testing machine, a description of the specific material testing machine, sensor information relating to one or more sensors of the specific material testing machine, calibration information relating to the calibration of one or more sensors or the specific material testing machine, a workstation identifier for the specific test workstation of the specific material testing system, or software information relating to software running on the specific test workstation.

12. The plurality of material testing systems are further configured to transmit system data to the central server, and the system data includes error data indicating that a sensor or other mechanical component of a particular material testing machine in a particular material testing system is malfunctioning. The central server processing circuit unit is Determining whether the aforementioned malfunction constitutes a valid reason for inspection and repair of the sensor or the specific material testing machine based on the error data, In determining that the malfunction constitutes a valid reason for inspection and repair of the sensor or the specific material testing machine, an inquiry regarding whether a service visit should be scheduled is output via the user interface. Upon receiving a positive response to the inquiry via the user interface, the system communicates with the service center to schedule the service visit. The system according to claim 8, further configured to perform the following:

13. The central server processing circuit unit is Identifying one or more qualified service technicians based on the aforementioned malfunction, the aforementioned error data, the aforementioned type of sensor or other mechanical component, the aforementioned test data, or the service history, The user interface outputs a list identifying one or more qualified service technicians, The system according to claim 12, further configured to perform the following:

14. The system according to claim 13, wherein the user interface is configured to receive the selection of a specific service technician from the list that identifies one or more qualified service technicians, the central server processing circuit is configured to identify the service center of the specific service technician, and the central server is configured to communicate with the service center to schedule the service visit.

15. The process involves receiving test data from one or more material testing systems into a central server, wherein the test data relates to the testers, test parameters, test results, or test timing of multiple tests performed using the one or more material testing systems. The utilization metric is determined in the central server based on the aforementioned test data, wherein the utilization metric indicates how much or how frequently a particular material testing system, or one or more material testing systems, was used for testing during a selected period. Outputting a human-perceptible representation of the utilization metric via the user interface, Methods that include...

16. The method according to claim 15, wherein the utilization metric includes (i) the number of tests performed by one or more testers, the specific material testing system, or the one or more material testing systems during the selected period; (ii) the amount of samples or subjects tested by one or more testers, the specific material testing system, or the one or more material testing systems during the selected period; or (iii) the percentage or rate of one or more testers or the one or more material testing systems performing tests at a specific time during the selected period.

17. The aforementioned human-perceivable representation includes a first human-perceivable representation, The aforementioned method, The central server receives system data from one or more material testing systems, wherein the system data relates to information about one or more material testing systems. The central server identifies the specific material testing system based on user selections received via the user interface. Based on the aforementioned system data, the aforementioned test data, and the aforementioned specific material testing system, to obtain specific system data related to the aforementioned specific material testing system, Outputting a second human-perceptible representation of the specific system data via the user interface, The method according to claim 15, further comprising:

18. The method according to claim 17, wherein the specific system data includes a system identifier for the specific material testing system, the current test status of the specific material testing system, the current tester for the specific material testing system, event information relating to one or more events concerning the specific material testing system, a machine identifier for the specific material testing machine of the specific material testing system, the manufacturing date of the specific material testing machine, a description of the specific material testing machine, sensor information relating to one or more sensors of the specific material testing machine, calibration information relating to the calibration of one or more sensors or the specific material testing machine, a workstation identifier for the specific test workstation of the specific material testing system, or software information relating to software running on the specific test workstation.

19. The central server receives system data from a specific material testing system among the one or more material testing systems, wherein the system data includes error data indicating that a sensor or other mechanical component of a specific material testing machine in the specific material testing system is malfunctioning. The central server determines, based on the error data, whether the malfunction constitutes a valid reason for inspection or repair of the sensor or the specific material testing machine. In determining that the malfunction constitutes a valid reason for inspection and repair of the sensor or the specific material testing machine, an inquiry regarding whether a service visit should be scheduled is output via the user interface. Upon receiving a positive response to the aforementioned inquiry, the system communicates with the service center via the central server to schedule the service visit. The method according to claim 15, further comprising:

20. Identifying one or more qualified service technicians based on the aforementioned malfunction, the aforementioned error data, the aforementioned type of sensor or other mechanical component, the aforementioned test data, or the service history, The user interface outputs a list identifying one or more qualified service technicians, and the central server, upon receiving the selection of a specific service technician via the user interface and identifying the service center of the specific service technician, communicates with the service center to schedule the service visit. The method according to claim 19, further comprising:

Images