Systems, devices, and methods for detecting beam axis misalignment

Abstract

Embodiments of the system, device, and method relate to a beam system. An exemplary method for detecting beam misalignment of a beam system includes detecting beam misalignment in an injector system of the beam system. The exemplary method further includes detecting beam misalignment in an accelerator system of the beam system. In one embodiment, the method further includes deactivating the beam propagating through the beam injector upon determining that the beam is misaligned.

Description

Technical Field

[0001] (Cross - Reference to Related Applications) This application claims priority to U.S. Provisional Application No. 63 / 070,799, filed Aug. 26, 2020, and U.S. Provisional Application No. 63 / 071,185, filed Aug. 27, 2020, both entitled "SYSTEMS, DEVICES, AND METHODS FOR BEAM MISALIGNMENT DETECTION", the entire contents of both of which are incorporated herein by reference for all purposes. (Technical Field)

[0002] The subject matter described herein generally relates to systems, devices, and methods for detecting, adjusting, and safely aborting a beam in an accelerator system. Axis misalignment

Background Art

[0003] Boron neutron capture therapy (BNCT) is a modality for treating various types of cancer, including some of the most difficult types. BNCT is a technique that uses boron compounds to selectively target tumor cells while avoiding normal cells. A substance containing boron is injected into the bloodstream, and the boron concentrates within the tumor cells. The patient then undergoes radiation therapy using neutrons (e.g., in the form of a neutron beam). The neutrons react with the boron, killing the tumor cells while reducing harm to surrounding normal cells. Long - term clinical studies have demonstrated that a neutron beam with an energy spectrum within 3 - 30 kiloelectron volts (keV) is preferred to achieve more efficient cancer treatment while reducing the radiation burden on the patient. This energy spectrum or range is frequently referred to as epithermal.

[0004] Most conventional methods for generating epithermal neutrons (e.g., epithermal neutron beams) are based on nuclear reactions between protons and either beryllium or lithium (e.g., beryllium targets or lithium targets).

[0005] Regarding electrostatic accelerator-based solutions, beam diagnostics are an essential part of charged particle beamline design. A critical task in beam transport is to ensure that the beam is correctly positioned within the beamline (e.g., that there are no direct beam interactions with beamline components and walls). Since beam destructive force increases with beam energy, the effects of either the installation or use of such beam diagnostics can be proportional to the beam energy. This is especially true for direct current (DC) beam transport, where irreversible damage to beamline components and patients receiving beam-based treatment can occur on a millisecond timescale. Therefore, continuous monitoring of beam position is essential. Axis misalignment The ability to quickly abort or adjust a detected beam is key to successful beam transport in accelerator-based solutions.

[0006] For these and other reasons, transport in accelerator-based solutions Axis misalignment There is a need for improved, efficient, and compact systems, devices, and methods to safely monitor beams and enable their termination. [Overview of the project] [Problems that the invention aims to solve]

[0007] Beams in the injector system and accelerator system of a neutron beam system Axis misalignment Exemplary embodiments of systems, devices, and methods for detection are described herein. Exemplary embodiments include beam systems in which beams Axis misalignment Regarding the detection of... [Means for solving the problem]

[0008] In various embodiments, beam Axis misalignment This can be detected in the beam injector or injector system of a beam system based on obtaining current measurements from the magnetic elements of the beam injector or obtaining voltage measurements from the biased components of the beam injector. The beam is detected when the current measurement is outside the nominal range or when the voltage measurement is outside the nominal range. Axis misalignment It can be determined that this is the case.

[0009] In various embodiments, beam Axis misalignment This can be detected in the accelerator system of a beam system by obtaining various parameters associated with the charge exchange device of the accelerator system for evaluating the input beam current, output beam current, and beam loss of the accelerator system. When the detected beam loss exceeds the beam loss threshold, Axis misalignment It can be determined that this is the case.

[0010] Other systems, devices, methods, features, and advantages of the subject matter described herein are or will become apparent to those skilled in the art in consideration of the following figures and detailed description. All such additional systems, methods, features, and advantages are included in this description, within the scope of the subject matter described herein, and are intended to be protected by the accompanying claims. In no way should the features of the exemplary embodiments be construed as limiting the accompanying claims, even if a clear enumeration of such features is absent in the claims. The present invention provides, for example, the following: (Item 1) Beam in a beam injector Axis misalignment A method for detecting, wherein the method is Obtaining at least one current measurement from at least one magnetic element of the beam injector and at least one voltage measurement from at least one biased component of the beam injector, When one or more of the following occur: the at least one current measurement taken from the at least one magnetic element of the beam injector is outside the aligned current range, or the at least one voltage measurement taken from the at least one biased component of the beam injector is outside the aligned voltage range, the beam propagating through the beam injector Axis misalignment To decide that Methods that include... (Item 2) The method according to item 1, wherein the beam injector is equipped with a beam position monitor. (Item 3) When the output signal from the beam position monitor indicates that the signals at one or more individual electrodes of the beam position monitor are contrary to a certain condition, the beam propagating through the beam injector Axis misalignment The method described in item 2, further including determining that it is so. (Item 4) When the output signal from the beam position monitor indicates that a first magnitude current in one or more individual electrodes of the beam position monitor exceeds or falls below a first current threshold, the beam propagating through the beam injector Axis misalignment The method described in item 2, further including determining that it is so. (Item 5) The beam injector comprises one or more scraper members, according to the method of item 1. (Item 6) Obtaining one or more measurements from at least one of the aforementioned scraper members, When one or more measurements obtained from the at least one scraper member fall outside the alignment threshold, the beam propagating through the beam injector Axis misalignment To decide that The method described in item 5, further including the method described in item 5. (Item 7) The method according to any one of items 1-6, wherein the at least one magnetic element comprises a beam steering magnet or a solenoid. (Item 8) The at least one biased component comprises an ion source, a pre-accelerator tube, or an electrostatic lens, the method according to any one of items 1-7. The beam injector injects a beam into an accelerator system, the method according to any one of items 1-8. (Item 9) The beam injector injects a beam into an accelerator system, the method according to any one of items 1-8. (Item 10) Once it is determined that the beam Axis misalignment is as such, further comprising deactivating the beam propagating through the beam injector, the method according to any one of items 1-9. (Item 11) Once it is determined that the beam Axis misalignment is as such, further comprising signaling the beam to a control system or a computing device, the method according to any one of items 1-10. Axis misalignment Once it is determined that the beam (Item 12) A system for detecting a beam in a beam injector, the system comprising Axis misalignment a beam injector, and a control system comprising at least one processor and at least one memory storing instructions, and the instructions, using the at least one processor, to obtain at least one current measurement from at least one magnetic element of the beam injector and at least one voltage measurement from at least one biased component of the beam injector, and when at least one of the at least one current measurement obtained from the at least one magnetic element of the beam injector is outside an alignment current range or at least one of the at least one voltage measurement obtained from the at least one biased component of the beam injector is outside an alignment voltage range, determining that the beam propagating through the beam injector is as such, and configuring the control system to perform Axis misalignment such, a system. configuring the control system to perform (Item 13) The beam injector is the system described in item 12, which includes a beam position monitor. (Item 14) The at least one memory stores instructions, and the instructions are processed by the at least one processor. When the output signal from the beam position monitor indicates that the signals at one or more individual electrodes of the beam position monitor are contrary to a certain condition, the beam propagating through the beam injector Axis misalignment The system according to item 13, further configured to determine that the control system is as follows. (Item 15) The at least one memory stores instructions, and the instructions are processed by the at least one processor. When the output signal from the beam position monitor indicates that a first magnitude current in one or more individual electrodes of the beam position monitor exceeds or falls below a first current threshold, the beam propagating through the beam injector Axis misalignment The system according to item 13, further configured to determine that the control system is as follows. (Item 16) The beam injector comprises one or more scraper members, as described in item 12. (Item 17) The at least one memory stores instructions, and the instructions are processed by the at least one processor. Obtaining one or more measurements from at least one of the aforementioned scraper members, When one or more measurements obtained from the at least one scraper member fall outside the alignment threshold, the beam propagating through the beam injector Axis misalignment To decide that The system according to item 16, further configured to perform the control system. (Item 18) The system according to any one of items 12-17, wherein the at least one magnetic element comprises a beam steering magnet or a solenoid. (Item 19) The system according to any one of items 12-18, wherein the at least one biased component comprises an ion source, a pre-accelerator tube, or an electrostatic lens. (Item 20) The beam injector is configured to inject a beam into an accelerator system, as described in any of items 12-19. (Item 21) The at least one memory stores instructions, and the instructions are processed by the at least one processor. The beam Axis misalignment The system according to any of items 12-20, wherein, upon determining that, the control system is further configured to deactivate the beam propagating through the beam injector. (Item 22) The at least one memory stores instructions, and the instructions are processed by the at least one processor. The beam Axis misalignment Once it is determined that, the beam Axis misalignment The system according to any of items 12-21, further configuring the control system to transmit signals to a computing device. (Item 23) Beams in accelerator systems Axis misalignment A method for detecting, wherein the method is To acquire the input beam current at the input aperture of the accelerator system, To acquire the output beam current at the output aperture of the accelerator system, When the difference between the output beam current and the input beam current indicates a beam loss exceeding the beam loss threshold, the beam propagating through the accelerator system Axis misalignment To decide that Methods that include... (Item 24) The input beam current is determined from the first current monitor measurement and the first scraper member measurement, as described in item 23. (Item 25) The output beam current is determined from the second current monitor measurement and the second scraper member measurement, as described in item 23. (Item 26) The beam Axis misalignment The method described in any of items 23-25, further comprising signaling to a control system or computing device that this is the case. (Item 27) The method according to any one of items 23-25, further comprising signaling the difference between the output beam current and the input beam current to a control system or computing device. (Item 28) The beam Axis misalignment If it is determined that this is the case, it further includes stopping beam propagation. or the method described in any of items 23-27. (Item 29) Beams in accelerator systems Axis misalignment A method for detecting, wherein the method is To acquire the input beam current at the input aperture of the accelerator system, To acquire the output beam current at the output aperture of the accelerator system, When the difference between the current of the accelerator system and the sum of the output beam current and the input beam current is greater than zero, the beam propagating through the accelerator system Axis misalignment To decide that Methods that include... (Item 30) The method according to item 29, wherein the input beam current consists of a first current monitor measurement and a first scraper member measurement. (Item 31) The output beam current is determined by the method described in item 29, comprising a second current monitor measurement and a second scraper member measurement. (Item 32) The beam Axis misalignment The method described in any of items 29-31, further comprising signaling to a control system or computing device that it is the case. (Item 33) The method according to any one of items 29 or 31, further comprising signaling the difference between the output beam current and the input beam current to a control system or computing device. (Item 34) The beam Axis misalignment If it is determined that this is the case, the method described in any of items 29-31 further includes halting beam propagation. (Item 35) Beams in accelerator systems Axis misalignment A method for detecting, wherein the method is The flow rate of the coolant in the target exchange cooling device of the accelerator system, the energy of the particles colliding with the charge exchange device of the accelerator system, and the temperature difference of the coolant between the inlet and outlet of the charge exchange cooling device are obtained. When the beam loss calculated based on the flow rate, energy, and temperature difference exceeds the beam loss threshold, the beam propagating through the accelerator system Axis misalignment To decide that Methods that include... (Item 36) The beam Axis misalignment The method of item 35, further comprising signaling to a control system or computing device that this is the case. (Item 37) The method according to any one of items 35-36, further comprising signaling the flow rate, energy, and temperature difference to a control system or computing device. (Item 38) The beam Axis misalignment If it is determined that this is the case, the method described in any of items 35-37 further includes halting beam propagation. (Item 39) Beams in accelerator systems Axis misalignmentA method for detecting, wherein the method is To acquire the input beam current at the input aperture of the accelerator system, To obtain the output beam current at the output aperture of the accelerator system, or The flow rate of the coolant in the charge exchange cooling device of the accelerator system, the energy of the particles colliding with the charge exchange device of the accelerator system, and the temperature difference of the coolant between the inlet and outlet of the charge exchange cooling device are obtained. When the difference between the output beam current and the input beam current indicates a beam loss exceeding the beam loss threshold, the beam propagating through the accelerator system Axis misalignment To determine that, When the difference between the current of the accelerator system and the sum of the output beam current and the input beam current is greater than zero, the beam propagating through the accelerator system Axis misalignment To determine that, When the beam loss calculated based on the flow rate, energy, and temperature difference exceeds the beam loss threshold, the beam propagating through the accelerator system Axis misalignment To decide that One or more of the above Methods that include... (Item 40) Beams in accelerator systems Axis misalignment A system for detecting, the system is Accelerator system and, A control system comprising at least one processor and at least one memory for storing instructions. Equipped with, The instruction configures the control system to perform the method described in any of items 23-39 using the at least one processor. (Item 41) The system according to item 40, further comprising a first current monitor located at the input aperture of the accelerator system and a second current monitor located at the output aperture of the accelerator system. (Item 42) The system according to item 40, further comprising a first scraper member positioned at the input opening of the accelerator system and a second scraper member positioned at the output opening of the accelerator system. (Item 43) The system described in item 40, further comprising a charge exchange device and a charge exchange cooling device. (Item 44) A beam system, wherein the system is Beam in a beam injector as described in any of items 12-22 Axis misalignment A system for detecting, Beam in an accelerator system as described in any of items 40-43 Axis misalignment A system for detecting A beam system equipped with this feature. (Item 45) Beams in beam systems Axis misalignment A method for detecting, wherein the method is Beam injector of beam system according to one of the methods described in item 1-11 Axis misalignment To detect, or The beam in the accelerator system of the beam system according to the method described in any of items 23-39 Axis misalignment To detect A method that includes one or more of the following. [Brief explanation of the drawing]

[0011] Details of the subject matter described herein, both in terms of its structure and operation, can be made clear by a close examination of the accompanying diagrams, where similar reference numbers point to similar parts. Components in the diagrams are not necessarily to scale, but rather the emphasis is on illustrating the principles of the subject matter. Furthermore, all diagrams are intended to convey concepts, and relative sizes, shapes, and other detailed attributes may be illustrated graphically rather than literally or precisely.

[0012] [Figure 1A] Figure 1A is a schematic diagram of an exemplary embodiment of a neutron beam system for use with embodiments of the present disclosure.

[0013] [Figure 1B] Figure 1B is a schematic diagram of an exemplary embodiment of a neutron beam system for use in boron neutron capture therapy (BNCT).

[0014] [Figure 2] Figure 2 illustrates an exemplary pre-accelerator system or ion beam injector for use with embodiments of the present disclosure.

[0015] [Figure 3] Figure 3 is a perspective view of an exemplary embodiment of the beam position monitor (BPM) of the ion beam injector system shown in Figure 2.

[0016] [Figure 4A] Figure 4A is a perspective view of the ion source and ion source vacuum box shown in Figure 2.

[0017] [Figure 4B] Figure 4B is an exploded perspective view depicting an exemplary embodiment of the Einzel lens shown in Figure 4A.

[0018] [Figure 5] Figure 5 illustrates an exemplary front-end accelerator tube for use with embodiments of the present disclosure.

[0019] [Figure 6] Figure 6 illustrates exemplary operation of an exemplary embodiment of the present disclosure.

[0020] [Figure 7] Figure 7 illustrates a block diagram of a system in which an embodiment of the present disclosure may operate.

[0021] [Figure 8]Figure 8 illustrates an exemplary computing device that may be specifically configured according to embodiments of the present disclosure. [Modes for carrying out the invention]

[0022] Before the subject matter is described in detail, it should be understood that this disclosure is not limited to the specific embodiments described and is therefore naturally subject to change. Furthermore, it should be understood that the terminology used herein is for the purpose of describing specific embodiments only and is not intended to limit the scope of this disclosure, as it will be limited only by the appended claims.

[0023] The term “particle” is used herein in a broad sense and, unless otherwise limited, may be used to describe an electron, proton (or H+ ion), or neutron, and species having two or more electrons, protons, and / or neutrons (e.g., other ions, atoms, and molecules).

[0024] Boron neutron capture therapy (BNCT) involves deploying high-energy (e.g., 2-3 megaelectron volts (MeV)) and high-current (e.g., up to 20 milliamperes (mA)) DC proton beams for cancer treatment. Such powerful beams... Axis misalignment This can result in the generation of adverse events that could be triggered by interruptions, failures of beamline components, or the development of beam instability. For example, direct interaction between the beam and the beamline wall can lead to irreversible damage within milliseconds.

[0025] Embodiments of this disclosure relate to a beam diagnostic instrument and beam Axis misalignment Detection and Axis misalignment The use of a control system configured to employ methods for adjusting or suspending the beam enables monitoring and prevention of such undesirable events during system operation.

[0026] Beam transport simulations are typically performed to determine a "safe path" for various beam characteristics, including, but not limited to, beam deviation from the optimal path in spatial and phase coordinates, beam size limitations, and beam energy variations. These simulations are complex and sometimes imprecise due to uncertainties in initial conditions and inherent inaccuracies in the methods applied; however, simulations can be benchmarked with experiments to ensure the reliability of the results. Benchmarking simulation results relies on accurate beam characterization and monitoring during machine or system commissioning and operation, achievable through non-invasive diagnostic tools.

[0027] Non-invasive measurements of beam characteristics are difficult to perform, particularly with respect to high-power DC beams (where invasive diagnostics are inappropriate). Considering spatial constraints and other limitations acting along the beamline, a practical set of beam diagnostics may only be able to provide partial information about the beam. Exemplary embodiments of this disclosure overcome such spot-like beam coverage by enabling reliable interlock systems and methods for demonstrating the safety and reliability of beam transport. The described embodiment enables timely and reliable interpretation of relevant signals from a beam diagnostic instrument, followed by the initiation of beam abortion if necessary.

[0028] Embodiments described herein may include dedicated non-invasive or minimally invasive beam diagnostics that introduce minimal beam perturbation or disturbance during measurement. That is, beam measurements using interruptive or invasive beam diagnostics affect beam properties through beam-probe interactions. For example, beam space and phase profiles are generally affected beam properties and beam energy. Therefore, interruptive or invasive beam diagnostics are generally suitable only for use during machine commissioning phases or during machine maintenance or inspection.

[0029] Embodiments described herein can further enable redundant measurements of various beam characteristics or parameters. In one exemplary embodiment, redundancy can be achieved by comparing two or more signals from different measurements to determine the resulting signal. In one exemplary embodiment, redundancy can further be achieved by comparing different measurements based on various dynamic or fixed calculations of the beam. Axis misalignment Redundancy can be achieved by a method for determining whether or not to exhibit it. Redundancy can be achieved, as specified herein, through the use of hardware, software, or a combination of both.

[0030] Time-resolved measurements of beam parameters can be affected by different phenomena that may be considered based on the accuracy of the measurement. For example, the aggregation of beam particles on the surface of the electrical probe, which enables the estimation of beam current, is accompanied by a phenomenon known as secondary particle emission. Secondary particle emission generally leads to an erroneous estimation of beam current, and with respect to negative ion beams, the beam current may be underestimated due to such emitted secondary electrons. Applying a bias to the electrical probe and / or an external magnetic field in its specific configuration can reduce the effect of secondary particle emission. However, other charged particles are attracted by the electrical probe from the nearby generated plasma, and thus can limit the accuracy of the electrical probe-generated signal.

[0031] Since beam particles can be generated exclusively by the ion source (e.g., 12), the beam current preferably does not increase as the beam propagates downstream through the beam system (e.g., 10). Such conditions can be employed herein to detect erroneous readings of beam diagnostics. For example, with respect to j≧i, I i ≥I j In the formula, i and j are the indices of the beam diagnostics in the beamline (e.g., beam system 10) incremented from the ion source (e.g., 12), and I i (or I j) are the measured beam parameters. For example, the total beam current measured at the exit of the ion source (e.g., 12) should not be less than the total beam current injected into the accelerator system (e.g., 16), measured at the entrance of the accelerator system (e.g., 16).

[0032] Exemplary embodiments of the systems, devices, and methods described herein may include pre-accelerator systems for use with particle accelerators. Particle accelerators are general examples, and the embodiments described herein may be used with any type of particle accelerator or in any particle accelerator application involving the generation of a charged particle beam at a specified energy for supply to a particle accelerator. While embodiments of this pre-accelerator system or ion beam injector are suitable for supplying a negative particle beam to a tandem accelerator, this is merely an exemplary type of accelerator. The pre-accelerator embodiments described herein may be implemented in particle accelerators used as scientific tools for nuclear physics research, etc.; particle accelerators used in industrial or manufacturing processes such as semiconductor chip manufacturing; accelerators for modifying material properties (surface treatment, etc.); particle accelerators for food irradiation; and particle accelerators for pathogen destruction in medical sterilization. The embodiments are... Furthermore, it can be used for imaging applications such as cargo or container inspection. Another non-exclusive example is that the embodiment can be used in particle accelerators for medical applications such as medical diagnostic systems, medical imaging systems, or radiotherapy systems.

[0033] One such radiotherapy system is a BNCT system. For ease of explanation, many embodiments described herein would be made in the context of neutron beam systems for use in BNCT, but embodiments are not limited to neutron beams or BNCT applications only. Embodiments of the present disclosure enable the configuration of an accelerator system (also referred to herein as a pre-accelerator system) for generating a proton beam with parameters suitable for a neutron source for BNCT using a neutron generating target such as lithium (Li) or beryllium (Be).

[0034] For efficient generation of epithermal neutrons on a lithium target, a proton beam with an energy of 1.9–3.0 MeV may be desirable. Formation of a neutron beam with a favorable flux density over a reasonably short treatment time in such applications can also be accompanied by a proton beam current exceeding 5 mA. A source of negative hydrogen ions may be preferred for employing a tandem accelerator system in such applications.

[0035] Embodiments of the present disclosure may be useful for any type of electrostatic accelerator for negative ions with beam currents exceeding several milliamperes. Embodiments disclosed herein may have any additional elements, including ion optics and beam diagnostics, before, during, or after the pre-accelerator system, depending on the requirements of the particular application.

[0036] Embodiments of the present disclosure can be used in conjunction with a neutron beam system (NBS) that provides a continuous or modulated proton beam. The proton beam can have a wide range of energies and currents. For example, in some embodiments, the proton beam has a particle energy in the range of 1.9 to 3.0 MeV with a beam current of 5 to 15 mA. In other embodiments, the proton beam has energies and / or currents outside these ranges. The beam can be directed towards a lithium target to generate a neutron beam, or the NBS can be used with a target having other materials for neutron generation, such as beryllium, instead of lithium.

[0037] In some embodiments, the ion source generates a beam of negative hydrogen ions with a current of up to 15 mA (or higher). The beam particles can be accelerated to an energy of 30 keV (or higher) in the ion source. The ion source can be connected to a pre-accelerator system (with one or more intervening components) which provides additional acceleration of the negative ion beam particles to an energy of 120–150 keV (or higher). The beam can also be focused within the pre-accelerator system with a focal length corresponding to the distance to the input aperture of the tandem accelerator input chamber, e.g., a distance of less than 1 meter (m). The pre-accelerator system may include an electrostatic lens (e.g., an Einzel lens), a pre-accelerator device (e.g., a pre-accelerator tube with multiple terminals), and / or magnetic elements (e.g., one or more solenoids) for shaping and accelerating the ion beam to higher energies, standing to be injected into the tandem accelerator.

[0038] The electrostatic lens of the pre-accelerator system can be positioned between the ion source and the pre-accelerator tube, such that the electrostatic lens is downstream from the ground lens of the ion source. The electrostatic lens can reduce the divergence of the ion beam from the ion source and can also bypass and collect ionized backflow particles.

[0039] The magnetic elements (or magnetic focusing devices) of the pre-accelerator system are connected to the pre-accelerator tube in tandem. It can be positioned between the accelerator and the beam, allowing for fine-tuning of the beam towards the focal spot. The magnetic element could be, for example, a solenoid.

[0040] Exemplary embodiments of the systems, devices, and methods described herein also relate to beams in the beamline of beam system 10. Axis misalignment This facilitates high-speed beam position monitoring for detection. In one exemplary embodiment, the beam position monitor (BPM) may include a plurality of electrodes extending into the beamline of a neutron beam system (NBS). In these embodiments, the beam position monitor (BPM) can be operated by collecting beam halo current by electrodes. The electrodes can be DC-isolated from the BPM walls and biased using an external power source. Biasing the BPM walls can reduce the contribution of secondary electron emission (SEE) current to the signal and increase the beam halo current collected from the beam-generating plasma.

[0041] In an exemplary embodiment, a beam position monitor (BPM) is configured to signal or indicate to a control system when a beam advancing through a beamline is off-axis.

[0042] A beam position monitor (BPM) may include a detection sensitivity level associated with reducing or eliminating beam-induced damage to beamline components while minimizing disturbances to the beam advancing through the beamline. That is, the minimum amount of beam current in the beam passing through the beamline components can be reduced as a result of current collection by electrodes. Exemplary embodiments of a BPM may, advantageously, operate with a direct current (DC) beam, have a millisecond (or faster) response time, and / or be able to receive beam powers of 2.5 MeV (and higher) per nucleus.

[0043] In some exemplary embodiments, the beam-processor (BPM) may be part of a beam system configured to produce a neutron beam from an ion beam. The beam system may include a low-energy beamline (LEBL) acting as an ion beam injector system, a high-voltage (HV) tandem accelerator coupled to the ion beam injector system, and a high-energy beamline (HEBL) extending from the tandem accelerator to a neutron target assembly housing a neutron production target. In these exemplary embodiments, the ion beam injector may include an ion source, a beam optics system incorporated within a low-energy beamline extending from the ion source, a pre-accelerator tube, a beam diagnostics system, and a pressurized chamber coupled to the tandem accelerator. The ion source can generate charged particles in a plasma volume, which can be extracted, accelerated, conditioned, and ultimately used to produce neutrons when delivered to a neutron production target. Such improved, efficient, and compact systems, devices, and methods for monitoring beam position enable the maintenance of neutron beam system equipment while maintaining operational efficiency.

[0044] Figure 1A is a schematic diagram of an exemplary embodiment of a beam system 10 for use with embodiments of the present disclosure. Here, the beam system 10 includes a source 12, a low-energy beamline (LEBL) 14, an accelerator 16 coupled to the low-energy beamline (LEBL) 14, and a high-energy beamline (HEBL) 18 extending from the accelerator 16 to a target 100. The LEBL 14 is configured to transport the beam from the source 22 to the input of the accelerator 16, which is then configured to generate the beam by accelerating the beam transported by the LEBL 14. The HEBL 18 transports the beam from the output of the accelerator 16 to the target 100. The target 100 may be a structure configured to produce a desired result in response to a stimulus applied by the incident beam, or it may be able to modify the properties of the beam. The target 100 may be a component of the system 10, or it may be a workpiece that is at least partially tuned or fabricated by the system 10.

[0045] Figure 1B is a schematic diagram illustrating another exemplary embodiment of the neutron beam system 10 for use in boron neutron capture therapy (BNCT). Here, source 12 is an ion source and accelerator 16 is a tandem accelerator. The neutron beam system 10 includes a pre-accelerator system 20 that acts as a charged particle beam injector, a high-voltage (HV) tandem accelerator 16 coupled to the pre-accelerator system 20, and a HEBL 18 extending from the tandem accelerator 16 to a neutron target assembly 200 housing a target 100 (not shown). In this embodiment, target 100 is configured to generate neutrons in response to the influence of protons of sufficient energy and may be referred to as a neutron generating target. The neutron beam system 10 and pre-accelerator system 20 can also be used for other applications, such as other examples of those described herein, and are not limited to BNCT.

[0046] The pre-accelerator system 20 is configured to transport the ion beam from the ion source 12 to the input (e.g., the input aperture) of the tandem accelerator 16, and therefore also functions as the LEBL 14. Powered by a coupled high-voltage power source 42, the tandem accelerator 16 can generally produce a proton beam with an energy equal to twice the voltage applied to the accelerating electrodes located within the accelerator 16. The energy level of the proton beam can be achieved by accelerating a beam of negative hydrogen ions from the input of the accelerator 16 to the innermost high-potential electrode, taking two electrons from each ion, and then accelerating the resulting protons downstream by the same applied voltage.

[0047] HEBL18 can transfer a proton beam from the output of accelerator 16 to a target in a neutron target assembly 200 located at the end of a beamline tributary 70 extending into a patient treatment room. System 10 can be configured to direct the proton beam to any number of one or more targets and associated treatment areas. In this embodiment, HEBL18 includes three tributaries 70, 80, and 90 that may extend into three different patient treatment rooms, each tributary which can be terminated in the target assembly 200 and a downstream beam shaping device (not shown). HEBL18 may include a pump chamber 51, quadrupole magnets 52 and 72 for preventing beam defocusing, dipole or bending magnets 56 and 58 for steering the beam into the treatment room, a beam corrector 53, diagnostics such as current monitors 54 and 76, a high-speed beam position monitor 55 section, and a scanning magnet 74.

[0048] The design of HEBL18 depends on the configuration of the treatment facility (e.g., a single-story treatment facility, a two-story treatment facility, etc.). The beam can be delivered to a target assembly 200 (e.g., located near the treatment room) by the use of a bending magnet 56. A quadrupole magnet 72 may then be included to focus the beam to a certain size on the target. The beam then passes through one or more scanning magnets 74, which provide lateral movement of the beam on the target surface in a desired pattern (e.g., spiral, curved, stepped in rows and columns, combinations thereof, and others). Lateral beam movement can help achieve a smooth and uniform time-averaged distribution of the proton beam on the lithium target, prevent overheating, and make neutron generation as uniform as possible within the lithium layer.

[0049] After being incident on the scanning magnet 74, the beam can be delivered into the current monitor 76, which measures the beam current. The target assembly 200 can be physically separated from the HEBL volume using a gate valve 77. The primary function of the gate valve is to separate the target from the vacuum volume of the beamline while loading targets and / or replacing used targets with new ones. In this embodiment, the beam cannot be bent 90 degrees by the bending magnet 56, but rather travels in a straight line to the right in Figure 1B and is then incident on the quadrupole magnet 52, which is located in the horizontal beamline. The beam is subsequently built by another bending magnet 58. And depending on the room configuration, it can be bent to the required angle. Otherwise, the bending magnet 58 can be replaced with a Y-shaped magnet to split the beamline in two directions for two different treatment rooms located on the same floor.

[0050] Figure 2 illustrates an example of a pre-accelerator system or ion beam injector for use with embodiments of the present disclosure. In this example, the pre-accelerator system 20 (e.g., LEBL 14) includes an Einzel lens 30 (not shown), a pre-accelerator tube 26, and a solenoid 510, and is configured to accelerate a negative ion beam injected from an ion source 12. The pre-accelerator system 20 is configured to provide acceleration of the beam particles to the energy required for the tandem accelerator 16 and to provide overall focusing of the negative ion beam to match the input aperture area at the input aperture or entrance of the tandem accelerator 16. The pre-accelerator system 20 is further configured to minimize or defocus backflow as it passes from the tandem accelerator 16 through the pre-accelerator system, reducing the possibility of damage to the ion source 12 and / or backflow reaching the ion source filaments.

[0051] In this embodiment, the ion source 12 can be configured to provide a negative ion beam upstream of the Einzel lens 30, and the negative ion beam continues to pass through the pre-accelerator tube 26 and a magnetic focusing device (e.g., a solenoid) 510. The solenoid 510 can be positioned between the pre-accelerator tube 26 and the tandem accelerator 16 and can be electrically coupled to a power source. The negative ion beam passes through the solenoid 510 to the tandem accelerator 16.

[0052] The pre-accelerator system 20 may also include an ion source vacuum box 24 for removing gas and a pump chamber 28, which together with the pre-accelerator tube 26 and other elements described above, are part of a relatively low-energy beamline leading to the tandem accelerator 16. The ion source vacuum box 24, in which the Einzel lens 30 may be positioned, extends from the ion source 12. The pre-accelerator tube 26 may be coupled to the ion source vacuum box 24 and the solenoid 510. The vacuum pump chamber 28 for removing gas may be coupled to the solenoid 510 and the tandem accelerator 16. The ion source 12 serves as a source of charged particles, which can be accelerated, conditioned, and ultimately used to produce neutrons when delivered to a neutron-generating target. Exemplary embodiments will be described herein with reference to an ion source that generates a negative hydrogen ion beam, but embodiments are not limited to such, and other positive or negative particles may also be generated by the source.

[0053] The pre-accelerator system 20 may have zero, one, or more magnetic elements for purposes such as focusing and / or aligning the beam. For example, any such magnetic elements may be used to align the beam to the beamline axis and the acceptance angle of the tandem accelerator 16. The ion vacuum box 24 may have an ion optics system located therein.

[0054] Generally, there are two types of negative ion sources 12, namely surface type and volume type, which differ in their mechanisms of negative ion generation. Surface type generally requires the presence of cesium (Cs) on a specific internal surface. Volume type relies on the formation of negative ions within the volume of a high-current discharge plasma. While both types of ion sources can deliver the desired flow of negative ions for applications related to tandem accelerators, surface type negative ion sources are undesirable for modulation. That is, for the modulation of the negative ion beam in the embodiments described herein, a volume type negative ion source (e.g., one that does not employ cesium (Cs)) is preferred.

[0055] An injector system (e.g., a pre-accelerator system 20, e.g., LEBL14) can enable the generation of beam particles, beam formation, beam transport, and beam matching to the accelerator system (e.g., 16). The beam energy in the injector system (e.g., a pre-accelerator system 20, e.g., LEBL14) can be relatively small (e.g., 50-200 kiloelectron volts (keV)), and it is the beam Axis misalignment Depending on (for example, and direct beam-wall interaction), the probability of irreversible injector system damage can be reduced. However, the beam in the injector system (e.g., 20, 14) Axis misalignment This could lead to significant consequences related to beam transport downstream of the injector system (e.g., downstream within accelerator 16 and HEBL 18). Axis misalignment (For example, mismatched) beams are likely to be the root cause of mechanical performance degradation or even malfunction and damage.

[0056] In the embodiment, the beam in the injector system (e.g., pre-accelerator system 20, e.g., LEBL14) Axis misalignmentThis can be detected based on obtaining current measurements from one or more magnetic elements of the beam injector system (e.g., 20, 14). That is, the performance of a magnetic type ion optics system, steering magnet shifter, magnetic element, or solenoid can be monitored via time-resolved current magnitude readings. Any deviation of the current measurements obtained from these components from nominal conditions or from the aligned current range indicates that the beam passing through the injector system is Axis misalignment This can be used to transmit a signal indicating that...

[0057] In the embodiment, the beam in the injector system (e.g., pre-accelerator system 20, e.g., LEBL14) Axis misalignment This can be detected by taking voltage measurements from at least one biased component of the beam injector system (e.g., 20, 14). That is, the performance of one or more biased components, such as an ion source (e.g., 12), a pre-accelerator tube (e.g., 26), or an electrostatic lens (e.g., 30), can be evaluated or monitored via time-resolved readings of the applied voltage magnitude associated with each component. Any deviation of the voltage measurements obtained from these components from the nominal conditions or from the aligned voltage range indicates that the beam passing through the injector system is Axis misalignment This can be used to transmit a signal indicating that...

[0058] For example, in embodiments described herein, when at least one current measurement obtained from at least one magnetic element of the beam injector is outside the aligned current range, the beam propagating through the beam injector Axis misalignment It can be determined that the beam propagating through the beam injector is when at least one voltage measurement taken from at least one biased component of the beam injector is outside the alignment voltage range. Axis misalignment It can be determined that this is the case.

[0059] Embodiments described herein further involve the use of one or more beam position monitors (not shown in Figure 2) along the beam injector system to control the beam in the beam injector system. Axis misalignment This allows for redundancy in the detection of beams in the beam injector system through the use of one or more scraper members (not shown in Figure 2) along the beam injector system. Axis misalignment This allows for redundancy in detection. Each scraper member can be configured as a plate, panel, or column extending in close proximity to the beam. The plate, panel, or column can be configured to surround the beam and, for example, may have an opening through which the beam passes. Annular members are also preferred. Beam deviation from the optimal axis can cause the beam or beam halo to collide with the scraper member.

[0060] Beam in a beam injector system Axis misalignment Detection is beam Axis misalignment This can be determined based on the presence of signals (e.g., current measurements) obtained from the magnetic elements of the beam injector that violate the conditions indicating (e.g., outside the threshold of the nominal conditions or outside the aligned current range). Axis misalignment Detection is beam Axis misalignment This can be determined based on the presence of signals (e.g., voltage measurements) obtained from the biased components of the beam injector that violate the conditions indicating (e.g., outside the nominal condition threshold or outside the alignment voltage range). Axis misalignment The detection of this can be determined based on a signal received from a beam position monitor indicating that the beam is off-axis. Axis misalignment The detection can be determined based on measurement signals from one or more scraper members. Axis misalignmentThe detection can further be determined based on a combination of two or more of the aforementioned conditions, and in some embodiments, the beam Axis misalignment The decision is based on two or more Axis misalignment It can only be reached if the conditions are met.

[0061] The control system (described with respect to Figure 7) may be configured to adjust beam parameters or halt beam propagation or system operation based on either of the above decisions or detections.

[0062] Looking at Figure 3, the exemplary beam position monitor (BPM) (e.g., a high-speed beam position monitor) 300 includes a cylindrical wall 302 extending between a pair of flanges 304 adapted to mount the beam position monitor (BPM) 300 along a beamline (e.g., a low-energy beamline (LEBL) 14 (e.g., a pre-accelerator or injector system 20), an accelerator 16, and a high-energy beamline (HEBL) 100). In the example where the beam position monitor (BPM) 300 is mounted along a low-energy beamline (LEBL), the beam position monitor (BPM) 300 can be mounted between the pre-accelerator tube 26 and the pressure chamber 28. The beam position monitor (BPM) 300 may be electrically coupled using one or more electrical wire connectors (310). The operation of the beam position monitor (BPM) 300 may be based on the collection of beam halo current by electrodes 306 protruding from the wall 302 and extending into the interior of the beamline. In exemplary embodiments, the electrode 306 can be cooled using one or more cooling devices. In exemplary embodiments, one or more cooling devices may include water cooling devices (e.g., water cooling tubes 308).

[0063] In Figure 3, the beam position monitor (BPM) 300 is shown to include four electrodes 306, but embodiments are not limited to four electrodes (e.g., any number of electrodes can be employed within the scope of this disclosure). The electrodes 306 are preferably formed as cylinders to increase resistance to heat flux and are made from one or more of tantalum (Ta) or tungsten (W). The electrodes 306 can also be made from composite materials and different shapes capable of withstanding the thermal load generated by the beam. The insertion length of the electrodes 306 (e.g., the electrode extension distance into the interior of the beamline) can be adjusted separately for each electrode 306 (e.g., using a control system not shown in Figure 3) to allow the user to adapt the beam position monitor (BPM) 300 for beams of arbitrary dimensions. The electrodes 306 are intended to be exposed to beam halo currents, and therefore the collected power flux is expected to be much lower. Furthermore, the plasma formed near the beam-residual gas interaction region extends to the outer beam boundary, forming an additional signal for the beam position monitor (BPM) 300.

[0064] Electrode 306 is DC-isolated from the BPM wall 302 and can be biased using an external power source. Biasing the BPM wall 302 can a) reduce the contribution of secondary electron emission (SEE) current to the signal and b) increase the beam halo current collected from the beam-generating plasma.

[0065] While the beam system is operating and the beam is being extracted from a source (e.g., 12) and propagated through the components (e.g., 20(14), 16, 18, 100) of an exemplary beam system (e.g., 10), the beam position monitor (BPM) 300 allows the control system to actively monitor the beam position. Each electrode 306 can be associated with a current threshold (e.g., a signal threshold). If the current (e.g., signal) collected by a given electrode exceeds its current threshold, the beam can be considered to be deflected excessively far toward that electrode and therefore off-axis. The beam position monitor (300) can provide the control system with an indication that the current collected by an electrode has exceeded its current threshold, and the control system can adjust the parameters of one or more components of the entire beam system (e.g., 10) to move the beam back onto the axis. Examples of adjustable parameters may include inputs provided to a beam steering magnet so that its position is modified to move the beam back onto the desired axis. Thus, the beam position monitor (BPM) 300, together with the control system, provides continuous / repeatable and real-time feedback to the beam steering magnets and / or other components of the beam system.

[0066] In the embodiment, the current threshold associated with a given electrode may differ from the current threshold associated with another electrode of the beam position monitor (300). Furthermore, a given electrode can be associated with multiple current thresholds for finer detection of beam position. That is, multiple current thresholds can be used with the electrodes of the beam position monitor (300). Detection of off-axis beam movement in the direction between electrodes can be based on multiple current thresholds associated with adjacent electrodes.

[0067] For example, both adjacent electrodes may show an increase in signal level (e.g., collected current), however, the increase in signal level may exceed a second lower current threshold associated with each electrode of the adjacent electrode pair. In such an example, a signal level exceeding the second lower current threshold associated with each electrode of the adjacent electrode pair can indicate that the beam is off-axis between the electrodes.

[0068] Therefore, the control system can adjust the beam steering magnets based on an indication that the signal level exceeds a single threshold for a single electrode of the beam position monitor (BPM) 300, or based on an indication that the signal level exceeds two lower thresholds for adjacent electrodes.

[0069] Furthermore, the control system can monitor the magnitude of the signal on each electrode and estimate the degree of beam deflection in a particular direction based on the signal magnitude (for example, independently of or in combination with one or more current thresholds associated with the electrode). The control system can then adjust the beam steering magnet or other parameters based on the estimated degree of beam deflection to compensate for the beam deflection and return the beam to its desired axis. In such an example, the control system can continuously and in real time adjust beamline parameters, such as the position of the beam steering magnet, based on the minimum amount of deflection detected (e.g., a deflection threshold).

[0070] Looking at Figure 4A, the ion source vacuum box 24 of the ion beam injector 20(14) may include an Einzel lens 30 positioned therein. As shown in detail in Figure 4B, the Einzel lens 30, which may be mounted downstream of the grounding lens 25 of the ion source 12 within the vacuum box 24, includes a mounting plate 32, two grounded electrodes 34 mounted on the mounting plate 32 and coupled to each other in a spaced-out relationship using mounting rods 35, and a fed (biased) electrode 38 positioned between the two grounded electrodes 34. The electrodes 34 and 38 are configured as cylindrical apertures and assembled to have axial axes that coincide with the beam path. The fed electrode 38 is supported by an isolator (or insulator) 36 extending between the grounded electrodes or apertures 34.

[0071] The standoff isolator 36 may have a geometric design configured to inhibit the development of electron avalanches and suppress streamer formation and propagation that could lead to flashover formation. The geometric design of the standoff isolator 36 can, in part, screen for external electric fields on the insulator surface that drive electron avalanches and effectively increase path length. In addition, the material of the insulator / isolator 36 tends to reduce the formation of conductive coatings on the insulator or isolator surface, which can lead to sputtering effects, loss of negative ions on the surface, volumetric contamination, and a decrease in electrical intensity.

[0072] Functionally, the action of the Einzel lens 30 on a beam of charged particles advancing from the ion source 12 is analogous to the action of an optical focusing lens on a beam of light. That is, the Einzel lens 30 focuses the incoming and diverging beam into a spot at the focal plane. However, here, the electric field formed between the pair of fed electrodes 38 and the two grounded electrodes 34 determines the focusing intensity (focal distance) of the Einzel lens. By mounting the Einzel lens 30 downstream of the ion source grounding lens 25, it reduces beam free-space transport when the beam is exposed to divergence due to its inherent space charge. The axially or nearly axially symmetric dimensions of the Einzel lens 30 are optimized to avoid direct interaction between the extracted ions and the exposed surface of the Einzel lens 30.

[0073] Figure 5 illustrates an exemplary pre-accelerator tube 26 for use with embodiments of the present disclosure. The exemplary pre-accelerator tube 26 may be cylindrical in shape and includes a first pre-accelerator tube end 26A and a second pre-accelerator tube end 26B. In embodiments, the first pre-accelerator tube end 26A includes an accessory (e.g., terminals or electrodes) projecting outward from the inner cylindrical structure of the pre-accelerator tube. In embodiments, the second pre-accelerator tube end 26B includes an accessory (e.g., terminals or electrodes) projecting outward from the inner cylindrical structure of the pre-accelerator tube. That is, the accessory projecting outward from the inner cylindrical structure of the pre-accelerator tube is cylindrical in shape but may have a larger diameter than that of the inner cylindrical structure. In the embodiment, the pre-accelerator tube 26 includes a plurality of pre-accelerator tube terminals 27-1, 27-2, 27-3, 27-4, 27-5, 27-6 that are uniformly spaced apart from a first pre-accelerator tube end 26A to a second pre-accelerator tube end 26B. The first pre-accelerator tube end 26A may be referred to as the proximal pre-accelerator tube end 26A in relation to the second pre-accelerator tube 26B, which is the distal pre-accelerator tube end 26B in some implementations. Each pair of adjacent pre-accelerator tube terminals (e.g., pre-accelerator tube terminals 27-1, 27-2, 27-3, 27-4, 27-5, 27-6) may have one or more resistors connected between them, and the resistors may have the same (preferably) or different resistance values. In this embodiment, the first terminal 27-1 at the first pre-accelerator tube end 26A can be electrically coupled to the first power supply, while the second terminal 27-2 at the second pre-accelerator tube end 26B can be electrically coupled to ground. Therefore, the voltage can be uniformly distributed across the pre-accelerator tube 26.

[0074] Figure 6 illustrates exemplary operation associated with exemplary embodiments of the present disclosure. Beam in an accelerator system Axis misalignmentTurning to detection, the accelerator system (e.g., 16) is where the charged particles of the beam are accelerated to a desired energy. Embodiments of the accelerator system (e.g., 16) rely on the extraction of two electrons from each negative ion during a charge exchange process to generate a beam with twice the energy of the applied voltage. Optimized for efficient beam transport, acceleration, and electron extraction, the exemplary accelerator system may have conditions (strong electric field, spatial constraints, high potential) that hinder the use of direct beam diagnostics. Such conditions make beam monitoring inside the accelerator system (e.g., 16) extremely difficult. It can be turned into a task.

[0075] Due to the high voltage applied to the accelerating electrodes (e.g., 601A, 601B, 601C, 601D), the accelerator system (e.g., 16) can be characterized by the presence of dark current, even without beam transport. In contrast to other particle accelerators, tandem accelerators rely on charge removal to achieve tandem-type acceleration of particles. Therefore, the vacuum conditions inside the tandem facilitate beam interaction with the charge exchange medium (e.g., argon), leading to the development of dark current. This process can result in incomplete voltage breakdown events that affect the beam energy. While the tandem accelerator may still continue to operate, the accelerated beam may no longer be safe for downstream beamline components and should be terminated.

[0076] Embodiments herein enable multiple detection points for beam loss inside an accelerator system (e.g., 16) such that beam-wall interactions are detected and limited to sub-millisecond durations. One or more of the multiple detection points are such that the beam is Axis misalignment The control system may consider whether a beam-wall interaction exists (for example, whether beam-wall interaction is present), whether a signal should be sent to one or more beamline components to adjust beam parameters, or whether a signal should be sent to one or more beamline components to abort beam or beam system operation.

[0077] As shown in Figure 6, the total beam currents upstream and downstream of the accelerator system 16 can be monitored using beam current monitors 603A and 603B (e.g., non-invasive diagnostics), respectively. The difference in the measured currents obtained using beam current monitors 603A and 603B can indicate the beam loss incurred inside the accelerator system 16.

[0078] For example, comparing the input beam current and the output beam current can represent beam loss in an accelerator system.

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[0079] The first scraper member 610A can be positioned at the inlet or input aperture of the accelerator system 16, and the second scraper member 610B can be positioned at the outlet or output aperture of the accelerator system 16. In exemplary embodiments, the scraper members 610A and 610B can be configured to interrupt or reduce the beam halo current and act as limiters. The first scraper member 610A, positioned at the inlet or input aperture, can be configured to absorb a significant portion of the beam current. The scraper members 610A and 610B are preferably configured to measure the incident flux of charged particles (e.g., current). Both members 610A and 610B can be biased to suppress secondary emission and configured to signal or provide an indication of the collected current to a control system.

[0080] The output voltage and current of the power supply source of accelerator system 16 were also measured, and the beam Axis misalignmentIt can be monitored as part of the detection process. The accelerator (e.g., tandem) current containing the extracted electrons is measured as follows:

number

[0081] If parasitic discharges develop inside the accelerator system, the above equality will not be satisfied. Therefore, the condition

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[0082] The flow rate and temperature of the charge exchange device coolant can also be measured at the inlet and outlet within the accelerator system 16. During the long-term operation of the accelerator system 16, beam losses inside the charge exchange (CEX) device 605, which has or contains a charge exchange medium, can also be estimated via the following exemplary thermal equilibrium equation.

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[0083] Here, q is the flow rate of the coolant (oil), and c p And ρ are the specific heat and density of the oil, dT is the temperature difference of the coolant between the inlet (e.g., IN) and the outlet (e.g., OUT), and E beam This is the energy of the particle colliding with the CEX device 605. These indirectly measured beam losses on the charge exchange device 605 are

number

[0084] Figure 7 is a block diagram illustrating an exemplary embodiment of a control system in which embodiments of the present disclosure may operate. For example, the illustrated exemplary system includes a beam system 10 and one or more computing devices 3002. In embodiments, the beam system 10 may be part of an exemplary neutron beam system (e.g., system 10 described above). In such embodiments, the beam system 10 may employ one or more control systems 3001A, which the one or more computing devices 3002 may use to communicate with the systems and components of the beam system 10 (e.g., neutron beam system 10). Each of these devices and / or systems is configured to communicate with each other directly or via a local network such as network 3004.

[0085] The computing device 3002 can be embodied by various user devices, systems, computing equipment, etc. For example, the first computing device 3002 may be a desktop computer associated with a particular user, another computing device 3002 may be a laptop computer associated with a particular user, and yet another computing device 3002 may be a mobile device (e.g., a tablet or smart device). Each of the computing devices 3002 may be configured to communicate with the beam system 10, for example, through a user interface accessible via the computing device. For example, a user may run a desktop application on the computing device 3002, which is configured to communicate with the beam system 10.

[0086] By using the computing device 3002 to communicate with the beam system 10, the user can provide operating parameters (e.g., operating voltage, etc.) for the beam system 10 according to the embodiments described herein.

[0087] The control system 3001A can be configured to receive measurements, signals, or other data from the components of the beam system 10. For example, the control system 3001A can receive measurements, signals, or other data from the beam passing through the beam system 10. Axis misalignment The signal that shows this is illustrative. Axis misalignment It can be received from the detection system 3010. The control system 3001A is Axis misalignment Depending on the degree or signal, the control system 3001A can provide adjustment of the inputs of one or more beamline components 3020 to modify the beam position according to the methods described herein. The control system 3001A can also, or alternatively, cause the beam system to stop or interrupt beam propagation, for example, by not biasing the extraction electrode on the ion source. The control system 3001A can also beam Axis misalignment Instructions or beam Axis misalignment The degree of this can be output to the computing device 3002 (and the user). Similarly, the control system 3001A, Axis misalignment Information collected from any of the components of the beam system 10, including the detection system 3010, can be provided to the computing device 3002 either directly or via the communication network 3004.

[0088] The communication network 3004 may include any wired or wireless network, such as a wired or wireless local area network (LAN), personal area network (PAN), city-wide network (MAN), wide area network (WAN), etc., and any hardware, software, and / or firmware required to implement it (e.g., a network router). For example, the communication network 3004 may include 802.11, 802.16, 802.20, and / or WiMAX networks. Furthermore, the communication network 3004 may include public networks such as the Internet, private networks such as intranets, or a combination thereof, and may utilize various networking protocols currently available or to be developed in the future, including but not limited to TCP / IP-based networking protocols.

[0089] Computing device 3002, Axis misalignment The detection system 3010 and the control system 3001A can be embodied by one or more computing systems, such as the device 3100 shown in Figure 8. As illustrated in Figure 8, the device 3100 may include a processor 3102, memory 3104, input and / or output network 3106, and communication device or network 3108. It should also be understood that some of these components 3102-3108 may include similar hardware. For example, both of the two components may have duplicate hardware required for each device. Thus, the use of the same processor, network interface, storage medium, etc., can be utilized to perform their associated functions. The use of the terms “device” and / or “circuit network” as used herein with respect to the components of the device can therefore encompass specific hardware configured with software for performing the functions associated with that particular device, as described herein.

[0090] The terms “device” and / or “network” should be understood broadly to include hardware, and in some embodiments, the device and / or network may also include software to configure the hardware. For example, in some embodiments, the device and / or network may include processing networks, storage media, network interfaces, input / output devices, etc. In some embodiments, other elements of the apparatus 3100 may provide or complement the functionality of a particular device. For example, the processor 3102 may provide processing functionality, the memory 3104 may provide storage functionality, and the communication device or network 3108 may provide network interface functionality, etc.

[0091] In some embodiments, the processor 3102 (and / or a coprocessor or any other processing network assisting or otherwise associated with the processor) can communicate with the memory 3104 via a bus to pass information between components of the device. The memory 3104 may be non-transient and may include, for example, one or more volatile and / or non-volatile memories. In other words, for example, the memory may be an electronic storage device (e.g., a computer-readable storage medium). The memory 3104 may be configured to store information, data, content, applications, instructions, etc., to enable the device to perform various functions according to exemplary embodiments of the present disclosure.

[0092] The processor 3102 can be embodied in several different ways, for example, by including one or more processing devices configured to operate independently. In addition, or alternatively, the processor can include one or more processors that work together via a bus and are configured to enable independent execution of instructions, pipelines, and / or multithreads. The use of the terms “processing device” and / or “processing network” can be understood to include single-core processors, multi-core processors, multiple processors, and / or remote or “cloud” processors within the device.

[0093] In exemplary embodiments, the processor 3102 may be configured to execute instructions stored in memory 3104 or otherwise accessible to the processor. Alternatively, or in addition, the processor may be configured to execute hardcoded functionality. Thus, whether configured by hardware or software methods, or by a combination of hardware and software, the processor may, while appropriately configured, represent entities capable of performing operations according to certain embodiments of the present disclosure (e.g., physically embodied in a network). Alternatively, as another example, if the processor is embodied as an executor of software instructions, the processor may be specifically configured such that, upon execution of the instructions, the processor performs algorithms and / or operations described herein.

[0094] In some embodiments, the device 3100 may include an input / output device 3106 which then communicates with a processor 3102 to provide output to the user and, in some embodiments, can receive input from the user. The input / output device 3106 may include a user interface, such as a web user interface or a mobile application. The system may include a device display such as a user device display, which may include a client device, etc. In some embodiments, the input / output device 3106 may also include a keyboard, mouse, joystick, touchscreen, touch area, soft key, microphone, speaker, or other input / output mechanism. The processor and / or user interface network including the processor may be configured to control one or more functions of one or more user interface elements through computer program instructions (e.g., software and / or firmware) stored on memory accessible to the processor (e.g., memory 3104 and / or equivalent).

[0095] The communication device or network 3108 may be any means such as a device or network embodied in either hardware or a combination of hardware and software configured to receive and / or transmit data to / from any other device or network communicating with the device 3100. In this regard, the communication device or network 3108 may include, for example, a network interface for enabling communication with a wired or wireless communication network. For example, the communication device or network 3108 may include one or more network interface cards, antennas, buses, switches, routers, modems, and supporting hardware and / or software, or any other device suitable for enabling communication over the network. In addition, or alternatively, the communication interface may include a network for interacting with an antenna and causing the transmission of signals through the antenna, or for handling the reception of signals received through the antenna. These signals can be transmitted by device 3100 using any of several wireless personal area network (PAN) technologies, including current and future Bluetooth® standards (including Bluetooth® and Bluetooth® Low Energy (BLE)), infrared radio (e.g., IrDA), FREC, ultra-wideband (UWB), and inductive radio transmission. In addition, it should be understood that these signals may be transmitted using Wi-Fi, near-field communication (NFC), worldwide interoperability for microwave access (WiMAX), or other proximity-based communication protocols.

[0096] Any such computer program instructions and / or other types of code can be loaded onto a network of a computer, processor, or other programmable device, and a machine can be produced such that the computer, processor, or other programmable network that executes the code on the machine generates means for implementing various functions, including those described herein.

[0097] As described above, embodiments of the present disclosure can be configured as systems, methods, mobile devices, backend network devices, etc. Thus, embodiments can include a variety of structures that include entirely hardware or any combination of software and hardware. Furthermore, embodiments can take the form of a computer program product on at least one non-transient computer-readable storage medium having computer-readable program instructions (e.g., computer software) embodied within the storage medium. Any suitable computer-readable storage medium, including non-transient hard disks, CD-ROMs, flash memory, optical storage devices, or magnetic storage devices, can be used.

[0098] A processing network for use with embodiments of the present disclosure may include one or more processors, microprocessors, controllers, and / or microcontrollers, each of which may be a separate chip or several different chips (and part thereof). ) can be distributed among them. The processing network for use with embodiments of the present disclosure may include a digital signal processor which may be implemented in the hardware and / or software of the processing network for use with embodiments of the present disclosure. The processing network for use with embodiments of the present disclosure may be communicatively coupled with other components in the figures herein. The processing network for use with embodiments of the present disclosure may execute software instructions stored in memory which cause the processing network to perform a set of different actions and control other components in the figures herein.

[0099] Memory for use with embodiments of the present disclosure may be shared by one or more of various functional units, or distributed among two or more of them (e.g., as separate memories located on different chips). Memory may also be its own separate chip. Memory may be non-transient, volatile (e.g., RAM) and / or non-volatile (e.g., ROM, flash memory, F-RAM).

[0100] Computer program instructions for performing the actions described can be written in any combination of one or more programming languages, including object-oriented programming languages ​​such as Java®, Java Script, Smalltalk, C++, C#, Transact-SQL, XML, and PHP, as well as traditional procedural programming languages ​​such as the C programming language or similar languages.

[0101] Various aspects of this subject matter are described below as a review of and / or complement to the embodiments described above, with the interrelationships and interchangeability of the following embodiments being emphasized here. In other words, it is emphasized that each feature of an embodiment can be combined with any other feature unless otherwise explicitly stated or logically impossible.

[0102] In some embodiments, the beam in the beam injector Axis misalignmentA method for detecting this includes obtaining at least one current measurement from at least one magnetic element of the beam injector and at least one voltage measurement from at least one biased component of the beam injector. In some of these embodiments, the method further determines that a beam propagating through the beam injector is out of alignment current range when one or more of the following are true: at least one current measurement obtained from at least one magnetic element of the beam injector is out of alignment current range, or at least one voltage measurement obtained from at least one biased component of the beam injector is out of alignment voltage range. Axis misalignment This includes determining that it is so.

[0103] In some of these embodiments, the beam injector includes a beam position monitor. In some of these embodiments, the method further indicates that when the output signal from the beam position monitor is contrary to a certain condition, the beam propagating through the beam injector Axis misalignment This includes determining that the beam propagating through the beam injector is Axis misalignment This includes determining that it is so.

[0104] In some of these embodiments, the beam injector includes one or more scraper members. In some of these embodiments, the method further includes obtaining one or more measurements from at least one of the one or more scraper members, When one or more measurements obtained from at least one scraper member fall outside the alignment threshold, the beam propagating through the beam injector Axis misalignment This includes determining that something is the case.

[0105] In some of these embodiments, at least one magnetic element includes a beam steering magnet or solenoid.

[0106] In some of these embodiments, at least one biased component includes an ion source, a pre-accelerator tube, or an electrostatic lens.

[0107] In some of these embodiments, the beam injector injects the beam into the accelerator system.

[0108] In some of these embodiments, the method further involves the beam Axis misalignment Once it is determined that this is the case, the process includes deactivating the beam propagating through the beam injector.

[0109] In some of these embodiments, the method further involves the beam Axis misalignment Once it is determined that, the beam Axis misalignment This includes transmitting signals to a control system or computing device.

[0110] In some embodiments, the beam in the beam injector Axis misalignment A system for detecting a beam injector includes a beam injector, at least one processor, and at least one memory storing instructions for configuring the control system to use the at least one processor to acquire at least one current measurement from at least one magnetic element of the beam injector and at least one voltage measurement from at least one biased component of the beam injector. In some of these embodiments, the at least one memory uses the at least one processor to determine if, when one or more of the following occur, the beam propagating through the beam injector is out of alignment current range, or at least one voltage measurement acquired from at least one biased component of the beam injector is out of alignment voltage range. Axis misalignmentThe control system is further configured to determine that it is, and the instructions are stored.

[0111] In some of these embodiments, the beam injector includes a beam position monitor.

[0112] In some of these embodiments, at least one memory, using at least one processor, indicates that when the output signal from the beam position monitor is contrary to a certain condition, the beam propagating through the beam injector is Axis misalignment The control system is further configured to determine that it is, and the instructions are stored.

[0113] In some of these embodiments, at least one memory, using at least one processor, determines when an output signal from the beam position monitor indicates that a current of a first magnitude at one or more individual electrodes of the beam position monitor is above or below a first current threshold, and the beam propagating through the beam injector Axis misalignment The control system is further configured to determine that it is, and the instructions are stored.

[0114] In some of these embodiments, the beam injector includes one or more scraper members.

[0115] In some of these embodiments, at least one memory uses at least one processor to acquire one or more measurements from at least one of the scraper members, and when one or more measurements acquired from at least one scraper member fall outside the alignment threshold, the beam propagating through the beam injector Axis misalignment The control system is further configured to determine that it is, and the instructions are stored.

[0116] In some of these embodiments, at least one magnetic element includes a beam steering magnet or solenoid.

[0117] In some of these embodiments, at least one biased component includes an ion source, a pre-accelerator tube, or an electrostatic lens.

[0118] In some of these embodiments, the beam injector is configured to inject the beam into the accelerator system.

[0119] In some of these embodiments, at least one memory is used with at least one processor to generate beams Axis misalignment Once it is determined that this is the case, the control system is further configured to deactivate the beam propagating through the beam injector, and the instruction is stored.

[0120] In some of these embodiments, at least one memory is used with at least one processor to generate beams Axis misalignment Once it is determined that, the beam Axis misalignment The control system is further configured to transmit signals to computing devices, and to store instructions.

[0121] In some embodiments, beams in accelerator systems Axis misalignment The method for detecting this involves obtaining the input beam current at the input aperture of the accelerator system, obtaining the output beam current at the output aperture of the accelerator system, and when the difference between the output beam current and the input beam current exceeds the beam loss threshold, indicating beam loss, the beam propagating through the accelerator system is Axis misalignment This includes determining that something is the case.

[0122] In some of these embodiments, the input beam current is determined from a first current monitor measurement and a first scraper member measurement.

[0123] In some of these embodiments, the output beam current is determined from a second current monitor measurement and a second scraper member measurement.

[0124] In some of these embodiments, the method further involves the beam Axis misalignment This includes signaling to a control system or computing device that this is the case.

[0125] In some of these embodiments, the method further includes signaling the difference between the output beam current and the input beam current to a control system or computing device.

[0126] In some of these embodiments, the method further involves the beam Axis misalignment If it is determined that this is the case, it includes halting beam propagation.

[0127] In some embodiments, beams in accelerator systems Axis misalignment The method for detecting this involves obtaining the input beam current at the input aperture of the accelerator system, obtaining the output beam current at the output aperture of the accelerator system, and the current and output beam current of the accelerator system. When the difference between the current and the sum of the input beam currents is greater than zero, the beam propagating through the accelerator system Axis misalignment This includes determining that something is the case.

[0128] In some of these embodiments, the input beam current consists of a first current monitor measurement and a first scraper member measurement.

[0129] In some of these embodiments, the output beam current consists of a second current monitor measurement and a second scraper member measurement.

[0130] In some of these embodiments, the method further involves the beam Axis misalignment This includes signaling to a control system or computing device that this is the case.

[0131] In some of these embodiments, the method further includes signaling the difference between the output beam current and the input beam current to a control system or computing device.

[0132] In some of these embodiments, the method further involves the beam Axis misalignment If it is determined that this is the case, it includes halting beam propagation.

[0133] In some embodiments, beams in accelerator systems Axis misalignment A method for detecting this includes obtaining the flow rate of the coolant in the target exchange cooling device of the accelerator system, the energy of the particles colliding with the charge exchange device of the accelerator system, and the temperature difference of the coolant between the inlet and outlet of the charge exchange cooling device. In some of these embodiments, the method further determines when the beam loss calculated based on the flow rate, energy, and temperature difference exceeds a beam loss threshold, indicating that the beam propagating through the accelerator system is Axis misalignment This includes determining that it is so.

[0134] In some of these embodiments, the method further involves the beam Axis misalignment This includes signaling to a control system or computing device that this is the case.

[0135] In some of these embodiments, the method further includes signaling flow rate, energy, and temperature differences to a control system or computing device.

[0136] In some of these embodiments, the method further involves the beam Axis misalignment If it is determined that this is the case, it includes halting beam propagation.

[0137] In some embodiments, beams in accelerator systems Axis misalignmentMethods for detecting beam loss include obtaining the input beam current at the input aperture of the accelerator system, obtaining the output beam current at the output aperture of the accelerator system, or obtaining the flow rate of the coolant in the charge exchange cooling device of the accelerator system, the energy of particles colliding with the charge exchange device of the accelerator system, and the temperature difference of the coolant between the inlet and outlet of the charge exchange cooling device. In some of these embodiments, the method further determines that when the difference between the output beam current and the input beam current indicates beam loss exceeding a beam loss threshold, the beam propagating through the accelerator system is Axis misalignment To determine that, or when the difference between the accelerator system current and the sum of the output beam current and the input beam current is greater than zero, the beam propagating through the accelerator system is Axis misalignment To determine that, or when the beam loss calculated based on flow rate, energy, and temperature difference exceeds the beam loss threshold, the beam propagating through the accelerator system is Axis misalignment This includes determining that something is true.

[0138] In some embodiments, beams in accelerator systems Axis misalignment A system for detecting includes an accelerator system and a control system which includes at least one processor and at least one memory storing instructions, the control system which uses the at least one processor to carry out the method according to any of the embodiments described above.

[0139] In some of these embodiments, the system further includes a first current monitor located at the input aperture of the accelerator system and a second current monitor located at the output aperture of the accelerator system. In some of these embodiments, the system further includes a first scraper member located at the input aperture of the accelerator system and a second scraper member located at the output aperture of the accelerator system.

[0140] In some of these embodiments, the system further includes a charge exchange device and a charge exchange cooling device.

[0141] In some embodiments, the beam system is a beam in a beam injector according to any of the above embodiments. Axis misalignment The system includes a system for detecting the beam. In some of these embodiments, the beam system further includes a system for detecting the beam in the accelerator system according to any of the embodiments described above. Axis misalignment Includes a system for detection.

[0142] In some embodiments, beams in a beam system Axis misalignment A method for detecting the beam injector of the beam system is to detect the beam injector in accordance with any of the methods of the embodiments described above. Axis misalignment This includes detecting the beam in the accelerator system of the beam system according to the method of any of the embodiments described above. Axis misalignment This includes detecting.

[0143] It should be noted that all features, elements, components, functions, and things described in relation to any embodiment provided herein are intended to be freely combined and substituted with those from any other embodiment. Where a feature, element, component, function, or thing is described in relation to only one embodiment, it should be understood that that feature, element, component, function, or thing may be used with all other embodiments described herein unless otherwise expressly stated. This paragraph therefore serves as a premise and descriptive aid for the introduction of claims that may, from time to time, combine features, elements, components, functions, and things from different embodiments, or substitute features, elements, components, functions, and things from one embodiment with those from another embodiment, even if the following description does not explicitly state that such combinations or substitutions are possible in particular cases. In particular, it is explicitly recognized that a clear enumeration of all possible combinations and substitutions would be undue burdensome, given that the permissibility of any such combinations and substitutions would be readily apparent to those skilled in the art.

[0144] To the extent that embodiments disclosed herein include or operate in association with memory, storage devices, and / or computer-readable media, such memory, storage devices, and / or computer-readable media are non-transient. Thus, to the extent that memory, storage devices, and / or computer-readable media are covered by one or more claims, such memory, storage devices, and / or computer-readable media are merely non-transient.

[0145] As used herein and in the appended claims, the singular forms “a,” “an,” and “the” include plural nouns unless the context otherwise clearly determines.

[0146] The embodiments are subject to various modifications and alternative forms, specific examples of which are shown in the drawings and described in detail herein. However, it should be understood that these embodiments are not limited to any particular form disclosed, but rather encompass all modifications, equivalents, and alternatives that fall within the spirit of this disclosure. Furthermore, any feature, function, thing, or element of an embodiment may be enumerated or added to the claims, along with any feature, function, thing, or element that does not fall within its scope, thereby defining the inventive scope of the claims.

Claims

1. A method for detecting beam axis misalignment in a beam injector, wherein the beam injector is equipped with a beam position monitor, the beam position monitor is equipped with one or more individual electrodes, and the method is Obtaining at least one measurement from at least one magnetic element of the beam injector and at least one measurement from at least one biased component of the beam injector, When one or more of the following are true, the beam propagating through the beam injector is misaligned: at least one measurement taken from at least one magnetic element of the beam injector is outside the alignment current range, or at least one measurement taken from at least one biased component of the beam injector is outside the alignment voltage range. The process involves biasing one or more individual electrodes with respect to the wall of the beam position monitor, When the output signal from the beam position monitor indicates that a first magnitude current in one or more individual electrodes of the beam position monitor exceeds or falls below a first current threshold, it is determined that the beam propagating through the beam injector is misaligned. Methods that include...

2. The beam injector comprises one or more scraper members, The aforementioned method, Obtaining one or more measurements from at least one of the one or more scraper members, When one or more measurements obtained from at least one scraper member fall outside the alignment threshold, it is determined that the beam propagating through the beam injector is misaligned. The method according to claim 1, further comprising:

3. The method according to claim 1, wherein the beam injector injects a beam into an accelerator system.

4. The method according to claim 1, further comprising, when it is determined that the beam is misaligned, deactivating the beam propagating through the beam injector.

5. The method according to claim 1, further comprising determining that the beam is misaligned, and then signaling the beam misalignment to a control system or computing device.

6. A system for detecting beam axis misalignment in a beam injector, wherein the system is Beam injector and A beam position monitor comprising one or more individual electrodes, wherein the one or more individual electrodes are biased against the wall of the beam position monitor, A control system comprising at least one processor and at least one memory storing instructions. Equipped with, The instruction is performed using the at least one processor, Obtaining at least one measurement from at least one magnetic element of the beam injector and at least one measurement from at least one biased component of the beam injector, When one or more of the following are true, the beam propagating through the beam injector is misaligned: at least one measurement taken from at least one magnetic element of the beam injector is outside the alignment current range, or at least one measurement taken from at least one biased component of the beam injector is outside the alignment voltage range. When the output signal from the beam position monitor indicates that a first magnitude current in one or more individual electrodes of the beam position monitor exceeds or falls below a first current threshold, it is determined that the beam propagating through the beam injector is misaligned. A system configured to perform the aforementioned control system.

7. The system according to claim 6, wherein the beam injector comprises one or more scraper members.

8. The at least one memory stores instructions, and the instructions are processed by the at least one processor. Obtaining one or more measurements from at least one of the one or more scraper members, When one or more measurements obtained from at least one scraper member fall outside the alignment threshold, it is determined that the beam propagating through the beam injector is misaligned. The system according to claim 7, further configured to perform the control system.

9. The system according to claim 6, wherein the at least one magnetic element comprises a beam steering magnet or a solenoid.

10. The system according to claim 6, wherein the at least one biased component comprises an ion source, a pre-accelerator tube, or an electrostatic lens.

11. The system according to claim 6, wherein the beam injector is configured to inject a beam into an accelerator system.

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