Quality analysis device

JP7871588B2Active Publication Date: 2026-06-09SHIMADZU SEISAKUSHO LTD
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Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
SHIMADZU SEISAKUSHO LTD
Filing Date
2022-04-13
Publication Date
2026-06-09

AI Technical Summary

Benefits of technology

【0012】 本発明に係る質量分析装置の上記態様によれば、真空槽内が減圧されて真空槽の壁面が変形した場合でも、真空槽の内面に形成された段差部に載置された基礎部は変形しない。これにより、該基礎部に支持手段で支持された質量分離手段の全体又はその一部に応力が加わることが抑制され、質量分解能の低下も発生しない。

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Abstract

To provide a mass spectroscope that suppresses stress from being applied to the whole or part of mass separation means arranged in a vacuum chamber and suppresses a decrease in mass resolution even when the wall surface of the vacuum chamber is deformed.SOLUTION: A mass spectroscope including a vacuum chamber CH and mass separation means UN disposed within the vacuum chamber includes a plurality of step portions 6, 6' formed on the inner surface of the vacuum chamber CH, a base portion FP placed on the step portion and arranged to span between the step portions, and the whole or part of the mass separation means UN is supported by support means SP fixed to the base portion FP.SELECTED DRAWING: Figure 4
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Claims

1. In a mass spectrometer having a vacuum chamber and a mass separation means disposed within the vacuum chamber, Multiple stepped portions formed on the inner surface of the vacuum chamber, It has a base that is placed directly on the stepped portion and is positioned across the stepped portion, At least a portion of the contact surface between the mounting surface of the stepped portion and the mounting surface of the base portion is set to be relatively movable. A mass spectrometer in which all or part of the mass separation means is supported by a support means fixed to the base.

2. A mass spectrometer according to claim 1, wherein at least a portion of the means for fixing the stepped portion and the base portion is set such that at least a portion of the contact surface between the mounting surface of the stepped portion and the mounting surface of the base portion is relatively movable.

3. A mass spectrometer according to claim 1 or 2, wherein a plurality of bases are provided, and spacers are arranged between each base to maintain the relative position of each base.

4. A mass spectrometer according to claim 1 or 2, wherein the mass separation means is a multi-turn time-of-flight mass separator.

5. A mass spectrometer according to claim 1 or 2, wherein an ion source and an ion trap means are arranged prior to the mass separation means.

6. A mass spectrometer according to claim 1 or 2, wherein a matrix-assisted laser desorption ionization ion source is arranged prior to the mass separation means.

Citation Information

Patent Citations

  • Isolation of charged particle optics from vacuum chamber deformations

    CN106716594A

  • Mass spectrometers, mass spectrometers, and related methods

    JP2014531119A

  • Time of flight mass spectrometer and method of mass spectrometry

    JP2021141063A

  • Multipole with a holding device for holding the multipole, holding device of a multipole, mass spectrometer with such a multipole, mounting unit for positioning the multipole and method for positioning a holding device relative to a multipole

    US20180286654A1

  • Ion trap mass spectrometer

    WO2008072377A1