Testing apparatus for optical test pieces and methods for testing optical test pieces
The apparatus efficiently measures polarization axis and centering of optical test pieces in a single step, addressing the complexity and space issues of traditional methods by integrating a radiation source, filter, rotation, and detection units for compact and rapid assessment.
TWI934257BActive Publication Date: 2026-08-01TRIOPTICS GMBH
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Patent Information
- Application Number
- TW113131280
- Authority / Receiving Office
- TW · TW
- Patent Type
- Patents
- Current Assignee / Owner
- Priority Date
- 2023-08-21
- Filing Date
- 2024-08-20
- Publication Date
- 2026-08-01
- Estimated Expiration
- 2044-08-19
AI Technical Summary
Technical Problem
Existing testing apparatuses for optical test pieces require multiple steps and significant installation space to measure polarization axis centering and alignment, leading to long measurement periods and increased design complexity.
Method used
A testing apparatus and method that simultaneously determines the eccentricity and polarization characteristics of optical test pieces using a radiation source, filter element, rotating unit, detector unit, and evaluation unit, allowing for compact and efficient measurement of both parameters.
Benefits of technology
The method enables simultaneous measurement of polarization axis and centering, reducing structural space and measurement time, while maintaining high accuracy and precision.
✦ Generated by Eureka AI based on patent content.
Abstract
The method presented herein provides a testing apparatus (100) for an optical test piece (105), wherein the testing apparatus (100) includes a beam source (145) for emitting a beam (115) along an optical axis (117). Furthermore, the testing apparatus (100) includes an optical element configured as a filter element (125) for applying or filtering a specific polarization direction of light from or reflected from the test piece (105) or transmitted from the test piece (105). The testing apparatus (100) also includes a rotation unit (135) configured to rotate the test piece (105) located on the optical axis (117) relative to the filter element (125) by a rotation angle (140). Finally, the testing apparatus (100) includes a detector unit (147) configured to determine the polarization axis of the test piece (105) and a measure of the test piece's eccentricity based on the rotation angle (140) and the beam of light (115) reflected from or transmitted through the test piece (105).
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