Measurement device and data glove
A measuring device with a first and second member and calculation unit simplifies multi-directional behavior measurement, enabling applications like data gloves for VR experiences.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- DIVER-X INC
- Filing Date
- 2024-10-15
- Publication Date
- 2026-04-23
AI Technical Summary
Existing measuring devices become complicated when required to measure behavior in multiple directions, such as those involving ball joints, leading to increased complexity.
A measuring device comprising a first and second member with changing electrical characteristics, a measuring instrument, and a calculation unit to separately calculate deformation amounts in parallel and perpendicular planes, using electrical characteristic values.
Enables a simpler configuration for measuring devices capable of detecting multi-directional behavior, facilitating applications like data gloves for VR experiences.
Smart Images
Figure JP2024036641_23042026_PF_FP_ABST
Abstract
Description
Measuring device and data glove
[0001] The present invention relates to a measuring device and a data glove.
[0002] In some cases, a measuring device is required to measure the behavior (e.g., deformation, displacement, rotation) of a measurement target in a plurality of directions. For example, there is a ball joint as a structure that allows rotation around a plurality of axes. As a technique for detecting the rotation angle around each axis in a ball joint, there is a technique proposed in Patent Document 1 below. When providing a configuration for measuring the behavior of a target for each direction in a measuring device, there is a concern that the device will become complicated.
[0003] Japanese Patent No. 456044
[0004] According to a first aspect of the present invention, there is provided a measuring device including: a first member provided on a deformable measurement target, the electrical characteristic value of which changes due to deformation; a second member provided at a position separated from the first member in a first direction in the measurement target, the electrical characteristic value of which changes due to deformation; a measuring instrument that measures the electrical characteristic value of the first member and the electrical characteristic value of the second member; and a calculation unit that separates and calculates a first deformation amount indicating the deformation of the measurement target in a plane parallel to the first direction and a second deformation amount indicating the deformation of the measurement target in a plane perpendicular to the first direction, using the electrical characteristic value of the first member and the electrical characteristic value of the second member measured by the measuring instrument.
[0005] According to a second aspect of the present invention, there is provided a data glove including the measuring device according to the first aspect and a body that covers at least a part of the measurement target and holds the measuring device.
[0006] According to the present invention, for example, a measuring device with a simple configuration can be provided. This measuring device can be applied to, for example, a data glove that uses the detection result of hand movement as an input. This data glove can provide various experiences, for example, by VR. Such a present invention contributes to the achievement of, for example, Goal 4 of the Sustainable Development Goals (SDGs) led by the United Nations, "Ensure inclusive and equitable quality education for all and promote lifelong learning opportunities."
[0007] This figure shows a measuring device according to an embodiment. This figure shows an example of applying the measuring device to the measurement of hand deformation. (A) is a figure showing the first member, second member, and measuring instrument according to an embodiment, and (B) is a figure showing the relationship between the resistance change rate and strain of the resistive film according to an embodiment. (A) is a figure showing the deformation of the resistive film according to an embodiment, and (B) is a figure showing the relationship between the resistance change rate and strain of the resistive film according to an embodiment. (A) is a figure showing the deformation of the resistive film according to an embodiment, and (B) is a figure showing the relationship between the resistance change rate and strain of the resistive film according to an embodiment. This figure shows an information processing system according to an embodiment. This figure shows a data glove according to an embodiment.
[0008] (Measuring device) A measuring device according to an embodiment will now be described. Figure 1 is a diagram showing a measuring device according to an embodiment. The measuring device 1 shown in Figure 1(A) is a device for measuring the behavior of the object to be measured 2. The measuring device 1 measures the deformation of the object to be measured 2 or its accessories as a result of the behavior of the object to be measured 2. For example, the measuring device 1 measures the amount of deformation of the object to be measured 2, which indicates the level to which the object to be measured 2 has deformed.
[0009] The measuring device 1 comprises a first member 3, a second member 4, a measuring instrument 5, and a calculation unit 6. The first member is provided on the deformable object to be measured 2, and its electrical characteristic value changes due to deformation. The second member 4 is provided on the object to be measured 2 at a position away from the first member 3 in a first direction (e.g., the X direction), and its electrical characteristic value changes due to deformation. Each of the first member 3 and the second member 4 is, for example, a thin plate-shaped member and extends in a direction nonparallel to the first direction (e.g., the Y direction). The measuring instrument 5 measures the electrical characteristic value of the first member 3 and the electrical characteristic value of the second member 4.
[0010] Here, as shown in Figure 1(B), the object to be measured 2 is assumed to be a cantilever beam with one end in the Y direction as a fulcrum, and the object to be measured 2 is assumed to be bent in the Z direction (appropriately referred to as deformation around the X direction). In deformation around the X direction, the first member 3 and the second member 4 curve, for example, with respect to the center of curvature c1 on a plane parallel to the YZ plane. The first member 4 curves, for example, with approximately the same radius of curvature r1 as the first member 3. In this case, the amount of change in the electrical characteristic value of the second member 4 before and after deformation is approximately the same as the amount of change in the electrical characteristic value of the first member 3 before and after deformation.
[0011] Furthermore, as shown in Figure 1(C), the object to be measured 2 is assumed to be a cantilever beam with one end in the Y direction as a fulcrum, and the object to be measured 2 is assumed to be bent in the X direction (or, as appropriate, deformed around the Z direction). The first member 3 and the second member 4 are curved, for example, with respect to the center of curvature c2 on a plane parallel to the XY plane. Since the second member 4 is positioned away from the first member 3 in the X direction, it is curved with a different radius of curvature than the first member 3, for example. For example, in Figure 1(C), the second member 4 is positioned away from the first member 3 with respect to the center of curvature c2 in the first direction (e.g., the X direction), so the radius of curvature r3 of the second member 4 is larger than the radius of curvature r2 of the first member 3. The strain of the first member 3 and the strain of the second member 4 are values corresponding to the radius of curvature, and the electrical characteristic values (e.g., electrical resistance values) of each member are values corresponding to the strain. The change in the electrical characteristics of the second member 4 before and after deformation will be a different value from, for example, the change in the electrical characteristics of the first member 3 before and after deformation.
[0012] The calculation unit 6 uses the electrical characteristic values of the first member 3 and the second member 4 measured by the measuring instrument 5 to separately calculate a first deformation amount (e.g., the level of deformation around the Z direction) that indicates the deformation of the object to be measured 2 in a plane parallel to the first direction (e.g., the X direction) (e.g., the XY plane), and a second deformation amount (e.g., the level of deformation around the X direction) that indicates the deformation of the object to be measured in a plane perpendicular to the first direction (e.g., the X direction) (e.g., the YZ plane). For example, the difference between the first member 3 and the second member 4 in terms of the change in electrical characteristic values before and after deformation in the Z direction is relatively large compared to the difference between the first member 3 and the second member 4 in terms of the change in electrical characteristic values before and after deformation in the X direction. The calculation unit 6 can, for example, approximate the difference between the electrical characteristic values of the first member 3 and the electrical characteristic values of the second member 4 as an amount corresponding to the deformation around the Z direction, and calculate the deformation amount around the Z direction. The calculation unit 6 can, for example, calculate the deformation amount in the X direction by subtracting an amount corresponding to the deformation amount in the Z direction from the change in the electrical characteristic value of the first member 3.
[0013] Figure 2 shows an example of applying the measuring device 1 to the measurement of hand deformation (e.g., finger bending). The measuring device 1 is used, for example, in a data glove (later shown in Figures 6 and 7) for measuring the behavior of fingers. The measuring device 1 measures, for example, the bending and straightening of fingers and the distance between fingers relative to adjacent fingers. In this embodiment, an example is described in which the measurement target 2 is the fingers of the hand (abbreviated as fingers as appropriate). In the following description, the measurement target 2 will be referred to as hand 2 as appropriate. The measuring device 1 measures, for example, the amount of deformation of the measurement target 2, which represents the bending around the finger joints. For example, the measuring device 1 measures the Euler angle of the finger (e.g., proximal phalanx 9) when the finger (e.g., index finger) is bent with the joint (e.g., MP joint h1) as the fulcrum, as the amount of deformation of the measurement target 2. In the following description, the state in which each finger of the hand is extended and each finger is brought close to the adjacent finger will be referred to as the reference state as appropriate.
[0014] In the following explanation, the XYZ Cartesian coordinate system shown in Figure 1, etc., will be referred to as appropriate. In this XYZ Cartesian coordinate system, the X direction is the direction in which the index finger, middle finger, ring finger, and little finger are aligned in the reference state (referred to as the width direction of the fingers as appropriate). The Y direction is the direction connecting the base of the fingers and the fingertips in the reference state (referred to as the length direction of the fingers as appropriate). The Z direction is the direction perpendicular to the palm in the reference state (referred to as the thickness direction of the fingers as appropriate). Furthermore, for each of the X, Y, and Z directions, the direction in the same direction as the arrow will be referred to as the + direction (e.g., +X direction) or the + side (e.g., +X side), and the direction opposite to the arrow will be referred to as the - direction (e.g., -X direction) or the -X side as appropriate. For example, the +Y direction is the direction from the base of the fingers to the fingertips in the reference state, and the -Y direction is the direction from the fingertips to the base of the fingers in the reference state. For example, the +Z direction, in the reference state, is the direction perpendicular to the palm (the thickness direction of the fingers) from the back of the hand towards the palm, and the -Z direction, in the reference state, is the direction from the palm towards the back of the hand.
[0015] In Figure 2, the first member 3 and the second member 4 are provided on the fingers of the hand 2, which is the object to be deformed and measured. Each finger has a first joint h1 and a first branch h2 supported by the first joint h1. The first joint h1 is, for example, the joint at the base of each finger of the hand (e.g., the MP joint). The first branch h2 is, for example, the proximal phalanx. In Figure 2, the reference numeral h3 represents the portion of the object to be measured 2 opposite to the first branch h2 with respect to the first joint h1 (e.g., the metacarpal bone).
[0016] The first branch h2 is movable in a second direction (e.g., the Z direction) with the first joint h1 as a pivot point, at least a portion of which is movable. For example, in Figure 2(A), the index finger of hand 2 is bent from a reference state (extended finger) towards the fingertip in the direction of -Z. When the index finger transitions from the extended state to the bent state, it rotates around the rotation axis AX1 of the joint h1, and at least a portion of it moves in a plane perpendicular to the rotation axis AX1, the rotation axis AX1 being, for example, an axis passing through the center of curvature c1 shown in Figure 1(B) and parallel to the X direction. The deformation modes of the first member 3 and the second member 4 in Figure 2(A) correspond to the deformation modes of the first member 3 and the second member 4 shown in Figure 1(B).
[0017] The first branch h2 is movable in a first direction (e.g., the X direction) with the first joint h1 as a pivot point, at least a portion of which is movable. The first direction is perpendicular to the second direction. For example, in Figure 2(B), the index finger of hand 2 is bent from a base state (close to the adjacent finger) to a state where it is bent toward the -X direction towards the fingertip (the middle finger and index finger are spread apart). When the index finger transitions from the base state to the bent state, it rotates around the rotation axis AX2 of joint h1, and at least a portion of it moves in a plane perpendicular to the rotation axis AX2, the rotation axis AX2 being, for example, an axis parallel to the Z direction passing through the center of curvature c2 shown in Figure 1(C). The deformation modes of the first member 3 and the second member 4 in Figure 2(B) correspond to the deformation modes of the first member 3 and the second member 4 shown in Figure 1(C).
[0018] As shown in Figure 2(B), the first member 3 and the second member 4 each extend in the Y direction. The second member 4 is positioned on the same finger as the first member 3. For example, the first member 3 and the second member 4 are each positioned at the first joint h1. The first member 3 is positioned so as to deform when the finger is bent at the first joint h1. The second member 4 is positioned so as to deform when the finger is bent at the first joint h1. For example, the first member 3 and the second member 4 are each provided across the fingertip side and the opposite side of the first joint h1. For example, the first member 3 and the second member 4 are each provided on the back of the hand side of the finger. The second member 4 is provided at a position in the measurement object 2 that is away from the first member 3 in the first direction (X direction). The first member 3 is positioned on one side of the finger with respect to the center of the finger in the width direction of the hand. The second member is positioned on the opposite side of the second member 4 with respect to the center of the finger. In Figure 2, a controller 7 is positioned on the back of the hand 2. The controller 7 is equipped with a measuring instrument 5 and a calculation unit 6.
[0019] Figure 3(A) shows the first member, second member, and measuring instrument according to the embodiment. Figure 2(B) shows the relationship between the rate of change of resistance and strain in the resistive film according to the embodiment. The first member 3 includes a sensor part 10a. The sensor part 10a includes, for example, a resistive film 12a, a support 13a, an electrode terminal 14a, and an electrode terminal 15a.
[0020] The support 13a supports the resistive film 12a, electrode terminal 14a, and electrode terminal 15a. The support 13a is, for example, a plate-shaped member (e.g., a film). The support 13a has a degree of flexibility that allows it to deform in accordance with the behavior of the object to be measured 2. The resistive film 12a, electrode terminal 14a, and electrode terminal 15a are arranged, for example, on the opposite side of the support 13a from the object to be measured 2 (e.g., in the +Z direction).
[0021] The resistive film 12a has the characteristic that its electrical characteristic value changes due to its own deformation. The electrical characteristic value is, for example, electrical resistance. The resistive film 12a is, for example, a strain-sensitive resistive film. The electrical resistance value of the resistive film 12a is correlated (e.g., proportional) with the strain of the resistive film 12a. For example, as shown in Figure 2(B), when the strain generated in the resistive film 12a is tensile strain, the rate of resistance change increases as the strain increases. Also, when the strain generated in the resistive film 12a is compressive strain, the rate of resistance change decreases as the strain increases. The strain is correlated with the radius of curvature r1 shown in Figure 1. For example, the larger the radius of curvature r1, the greater the strain. The strain is also correlated with the radius of curvature r2 shown in Figure 1. For example, the larger the radius of curvature r2, the greater the strain. The electrical characteristic values of the first member 3 and the second member 4 change in accordance with the deformation of the object to be measured 2. In the first component 3, the electrical resistance value of the resistive film 12a changes as the sensor portion 10a deforms in response to the deformation of the object to be measured 2.
[0022] The resistive film 12a has a degree of flexibility that allows it to deform in accordance with the behavior of the object to be measured 2. The resistive film 12a is, for example, a film formed on a support 13a. The material of the resistive film 12a is, for example, a paste or dispersion in which a conductive material (e.g., conductive particles) is dispersed in a resin. The shape of the resistive film 12a is, for example, U-shaped when viewed from the Z direction. Electrode terminals 14a and 15a are provided at the ends of the resistive film 12a. As the sensor part 10a, for example, the BS series bending sensor manufactured by Sensia Technology Co., Ltd. can be used. Electrode terminals 14a and 15a are electrically connected to the measuring instrument 5, respectively.
[0023] The second member 4 includes a sensor section 10b. The sensor section 10b includes a support 13b, a resistive film 12b, an electrode terminal 14b (electrode), and an electrode terminal 15b (electrode). The sensor section 10b is the same as the sensor section 10a of the first member 3. The support 13b, resistive film 12b, electrode terminal 14b, and electrode terminal 15b in the second member 4 are the same as the support 13a, resistive film 12a, electrode terminal 14a, and electrode terminal 15a in the first member 3, respectively. The electrode terminals 14b and 15b are electrically connected to the measuring instrument 5, respectively. The first member 3 and the second member 4 are individually connected to the measuring instrument 5. In the second member 4, the electrical resistance value of the resistive film 12b changes as the sensor section 10b deforms in response to the deformation of the object to be measured 2.
[0024] Returning to the explanation of Figure 1, the measuring instrument 5 measures the electrical characteristic values of the first member 3 and the second electrical characteristic values. The measuring instrument 5 is, for example, an electrical resistance meter that measures electrical resistance. The measuring instrument 5 measures the electrical characteristic values of the first member 3 and the electrical characteristic values of the second member 4 individually. The measuring instrument 5 repeatedly measures the electrical characteristic values of the first member 3 and the electrical characteristic values of the second member 4. For example, the measuring instrument 5 measures the electrical characteristic values of the first member 3 and the electrical characteristic values of the second member 4 at a predetermined sampling frequency. The measuring instrument 5 is electrically connected to the calculation unit 6. The electrical characteristic values of the first member 3 and the electrical characteristic values of the second member 4 measured by the measuring instrument 5 are transmitted to the calculation unit 6 and acquired by the calculation unit 6.
[0025] The calculation unit 6 uses the difference between the electrical characteristic values of the first member 3 and the electrical characteristic values of the second member 4 measured by the measuring instrument 5 to separately calculate a first deformation amount, which indicates the deformation of the object to be measured 2 in a plane parallel to the first direction (e.g., the X direction) (e.g., the XY plane), and a second deformation amount, which indicates the deformation of the object to be measured 2 in a plane perpendicular to the first direction (e.g., the X direction) (e.g., the YZ plane).
[0026] Next, the processing performed by the calculation unit 6 will be explained with reference to Figures 4 and 5. Figure 4(A) shows the deformation of the first member 3 and the second member 4 in a plane (e.g., the YZ plane) perpendicular to the first direction (e.g., the X direction). Figure 4(B) shows the relationship between strain and resistance change rate when the first member 3 and the second member 4 deform in a plane (e.g., the YZ plane) perpendicular to the first direction (e.g., the X direction). The deformation modes of the first member 3 and the second member 4 in Figure 4(A) correspond to the deformation modes when bending a finger back and forth (see Figure 2(A)).
[0027] Figure 5(A) shows the deformation of the first member 3 and the second member 4 in a plane (e.g., the XY plane) parallel to the first direction (e.g., the X direction). Figure 5(B) shows the relationship between strain and resistance change rate when the first member 3 and the second member 4 deform in a plane (e.g., the XY plane) parallel to the first direction (e.g., the X direction). The deformation modes of the first member 3 and the second member 4 in Figure 5(A) correspond to the deformation modes when bending fingers from side to side (see Figure 2(B)).
[0028] The calculation unit 6 uses the electrical resistance value of the first member 3 measured by the measuring instrument 5 and the electrical resistance value of the second member 4 measured by the measuring instrument 5 to separately calculate a first deformation amount indicating the deformation of the object to be measured 2 in a plane parallel to the first direction (e.g., the X direction) (e.g., the XY plane) and a second deformation amount indicating the deformation of the object to be measured 2 in a plane perpendicular to the first direction (e.g., the X direction) (e.g., the YZ plane).
[0029] First, a simplified method for calculating the first and second deformation amounts will be explained. The electrical resistance value of the first member 3 measured by the measuring instrument 5 (hereinafter referred to as R3m) includes the electrical resistance value of the first member 3 in a non-expanded state (appropriately referred to as the natural length state) (hereinafter referred to as R3), the change in the electrical resistance value of the first member 3 due to the deformation shown in Figure 4(A) (hereinafter referred to as ΔR3yz), and the change in the electrical resistance value of the first member 3 due to the deformation shown in Figure 5(A) (hereinafter referred to as ΔR3xy). The electrical resistance value of the first member 3 in the natural length state is known, for example, measured in advance. Since the measured electrical resistance value R3m and the electrical resistance value R3 in the natural length state are known, one relationship between ΔR3yz and ΔR3xy can be obtained using these values.
[0030] The electrical resistance value of the second member 4 measured by the measuring instrument 5 (hereinafter referred to as R4m) includes the electrical resistance value of the second member 4 in its natural length state (hereinafter referred to as R4), the change in the electrical resistance value of the second member 4 due to the deformation shown in Figure 4(A) (hereinafter referred to as ΔR4yz), and the change in the electrical resistance value of the second member 4 due to the deformation shown in Figure 5(A) (hereinafter referred to as ΔR4xy). The electrical resistance value of the second member 4 in its natural length state is known, for example, having been measured in advance. Since the measured electrical resistance value R4m and the electrical resistance value R4 in the natural length state are known, one relationship between ΔR4yz and ΔR4xy can be obtained using these values.
[0031] Here, we approximate the deformation shown in Figure 4(A) as being the same as the strain of the second member 4 as the strain of the first member 3. Then, the change in the electrical resistance of the second member 4 due to the deformation shown in Figure 4(A) (ΔR4yz) can be approximated as being the same as the change in the electrical resistance of the first member 3 due to the deformation shown in Figure 4(A) (ΔR3yz). Using this approximation, the relationship between ΔR3xy and ΔR4xy can be obtained from the difference between the relationship between ΔR3yz and ΔR3xy and the relationship between ΔR4yz and ΔR4xy.
[0032] The change in the electrical resistance of the first member 3 (ΔR3xy) is a function with strain as a parameter, as shown in Figure 5(B), and the strain of the first member 3 is a function of the radius of curvature r2 shown in Figure 1(C). The change in the electrical resistance of the second member 4 (ΔR4xy) is a function with strain as a parameter, as shown in Figure 5(B), and the strain of the second member 3 is a function of the radius of curvature r3 shown in Figure 1(C). Therefore, the relationship between the change in the electrical resistance of the first member 3 (ΔR3xy) and the change in the electrical resistance of the second member 4 (ΔR4xy) can be expressed using the radius of curvature r2 of the first member 3 and the radius of curvature r3 of the second member 4.
[0033] The difference between the radius of curvature r3 of the second member 4 and the radius of curvature r2 of the first member 3 (r3-r2) is determined by the positional relationship between the first member 3 and the second member 4, as shown in Figure 1(C), for example. For example, the difference between the radius of curvature r3 and the radius of curvature r2 (r3-r2) corresponds to the distance that the second member 4 is separated from the first member 3 in a first direction (e.g., the X direction), and is known. Using this, a relationship between the radius of curvature r2 and the radius of curvature r3 can be obtained.
[0034] As described above, one relationship equation between the radius of curvature r2 of the first member 3 and the radius of curvature r3 of the second member 4 can be obtained from the measured electrical resistance values, and one relationship equation between the radius of curvature r2 and the radius of curvature r3 can be obtained from the positional relationship between the first member 3 and the second member 4. Since there are two relationship equations for the two unknowns (r2, r3), the radius of curvature r2 of the first member 3 and the radius of curvature r3 of the second member 4 can be calculated by solving these relationship equations simultaneously. From the calculated radius of curvature r2 of the first member 3 and the relationship between strain and resistance change rate shown in Figure 5(B), the change in the electrical resistance value of the first member 3 (ΔR3xy) can be calculated. A relationship equation between ΔR3yz and ΔR3xy has been obtained from the measured electrical resistance value of the first member 3, and ΔR3yz can be calculated using this relationship equation and the calculated ΔR3xy. From the calculated change in the electrical resistance of the first member 3 (ΔR3yz) and the relationship between strain and resistance change rate shown in Figure 4(B), the radius of curvature r1 of the first member 3 in a plane perpendicular to the first direction (e.g., the X direction) (e.g., the YZ plane) (see Figure 1(B)) is calculated.
[0035] The calculation unit 6 calculates, for example, the radius of curvature r1 as a value representing the amount of deformation of the first member 3 in a plane perpendicular to the first direction (e.g., the X direction) (e.g., the YZ plane), according to the calculation method described above. The calculation unit 6 calculates, for example, the radius of curvature r2 as a value representing the amount of deformation of the first member 3 in a plane parallel to the first direction (e.g., the X direction) (e.g., the YZ plane), according to the calculation method described above. The calculation unit 6 calculates, for example, the radius of curvature r1 as a value representing the amount of deformation of the first member 3 in a plane perpendicular to the first direction (e.g., the X direction) (e.g., the YZ plane), according to the calculation method described above. The calculation unit 6 calculates, for example, the radius of curvature r3 as a value representing the amount of deformation of the second member 4 in a plane parallel to the first direction (e.g., the X direction) (e.g., the XY plane), according to the calculation method described above.
[0036] The hand position shown in Figure 2(A) corresponds to the position where the index finger is bent from an extended position towards the palm (e.g., the finger is bent forward and backward). In the position shown in Figure 2(A), the first branch h2 of the finger, which is the object of measurement 2, is rotated around the axis AX1 with the first joint h1 as the pivot point. In the following description, the angle of rotation obtained when the first branch h2 rotates around the axis AX1 with the first joint h1 as the pivot point, starting from the extended finger position, will be referred to as the first rotation angle. In the following description, the first rotation angle will be considered positive when viewed from the width direction (e.g., the -X direction) as shown in Figure 2(A), with counterclockwise rotation being positive.
[0037] In the state shown in Figure 2(A), the electrical characteristics of the first member 3 and the electrical characteristics of the second member 4 are correlated with the first rotation angle. For example, when the first rotation angle is relatively large, the strain of the first member 3 is relatively large, and the change in the electrical resistance of the first member 3 is relatively large. The relationship between the first rotation angle and the change in the electrical characteristics of the first member 3 is derived in advance, for example, by measurement. The calculation unit 6 calculates, for example, the change in electrical resistance ΔR3yz due to bending the finger forward and backward as described above, and uses the calculated ΔR3yz and the relationship between the first rotation angle and the electrical characteristics of the first member 3, which has been derived in advance, to calculate the first rotation angle.
[0038] In Figure 2(B), the arrow on the index finger indicates the movement of the finger (e.g., the movement of the fingertip from side to side) when transitioning from the state in which the first member 3 is at its natural length to a state in which the finger is brought closer to the adjacent finger (e.g., the fingers are closed) or a state in which the finger is separated from the adjacent finger (e.g., the fingers are spread). In the finger movement shown in Figure 2(B), the first branch h2 of the finger, which is the object of measurement 2, rotates around the axis of rotation AX2 with the first joint h1 as the pivot point. In the following description, the angle of rotation obtained when the first branch h2 rotates around the axis of rotation AX2 with the first joint h1 as the pivot point, from the state in which the first member 3 is at its natural length, will be referred to as the second angle of rotation. In the following description, the second angle of rotation will be considered positive when counterclockwise, as viewed from the back of the hand (e.g., in the +Z direction) as shown in Figure 2(B).
[0039] In the state shown in Figure 2(B), the electrical characteristics of the first member 3 and the electrical characteristics of the second member 4 are correlated with the second rotation angle. For example, when the index finger is rotated counterclockwise around the rotation axis AX2 (e.g., finger open, index finger separated from middle finger), compressive strain occurs in the first member 3, and the larger the second rotation angle, the more negative the rate of change in the electrical resistance of the first member 3 becomes, and the larger its absolute value. The relationship between the second rotation angle and the amount of change in the electrical characteristics of the first member 3 is derived in advance, for example, by measurement. The calculation unit 6 calculates, for example, the amount of change in electrical resistance ΔR3xy due to bending the finger left and right as described above, and uses the calculated ΔR3xy and the relationship between the second rotation angle and the electrical characteristics of the first member 3, which was derived in advance, to calculate the second rotation angle.
[0040] The method for separately calculating the first deformation amount and the second deformation amount may be other than that described above. For example, the deformation amount of the first member 3 includes a component of deformation of the resistive film 12a in a plane perpendicular to the first direction (e.g., the X direction) (e.g., the YZ plane) and a component of deformation of the resistive film 12a in a plane parallel to the first direction (e.g., the X direction) (e.g., the XY plane). The electrical characteristic value of the first member 3 is expressed by a first function with the component of deformation of the resistive film 12a in a plane perpendicular to the first direction (e.g., the X direction) (e.g., the YZ plane) and the component of deformation of the resistive film 12a in a plane parallel to the first direction (e.g., the X direction) (e.g., the XY plane) as variables. The first function can be derived in advance, for example, by systematically changing the first rotation angle and the second rotation angle described above while measuring the electrical characteristic value (e.g., electrical resistance value) of the resistive film 12a. Furthermore, the amount of deformation of the second member 4 includes a component of deformation of the resistive film 12b in a plane perpendicular to the first direction (e.g., the X direction) (e.g., the YZ plane) and a component of deformation of the resistive film 12b in a plane parallel to the first direction (e.g., the X direction) (e.g., the XY plane). The electrical characteristic value of the second member 4 is expressed as a second function with the component of deformation of the resistive film 12b in a plane perpendicular to the first direction (e.g., the X direction) (e.g., the YZ plane) and the component of deformation of the resistive film 12b in a plane parallel to the first direction (e.g., the X direction) (e.g., the XY plane) as variables. The third function can be derived in advance, for example, by systematically changing the first and second rotation angles described above while measuring the electrical characteristic value (e.g., electrical resistance) of the resistive film 12b. The calculation unit 6 calculates the first rotation angle and the second rotation angle by, for example, solving a system of equations obtained by substituting the measured electrical characteristic value of the resistive film 12a into the first function and the measured electrical characteristic value of the resistive film 12b into the second function.
[0041] The first and second functions described above may be expressed by mathematical formulas or by numerical tables (e.g., lookup tables). Furthermore, the first and second functions may be expressed by inference models obtained through machine learning (e.g., AI models). For example, in this machine learning, the measured electrical characteristics of the first member 3 and the measured electrical characteristics of the second member 4 are used as input training data. The measurement results, measured as deformation components on each surface, are used as output training data. These deformation components on each surface can be obtained, for example, by optically measuring the shape of the resistive film.
[0042] As described above, the measuring device 1 of this embodiment includes a first member 3 provided on the deformable object to be measured 2, the electrical characteristic value of which changes due to deformation; a second member 4 provided on the object to be measured 2 at a position away from the first member 3 in a first direction, the electrical characteristic value of which changes due to deformation; a measuring instrument 5 that measures the electrical characteristic value of the first member 3 and the electrical characteristic value of the second member 4; and a calculation unit 6 that uses the difference between the electrical characteristic value of the first member 3 and the electrical characteristic value of the second member 4 measured by the measuring instrument 5 to separately calculate a first deformation amount indicating the deformation of the object to be measured in a plane parallel to the first direction and a second deformation amount indicating the deformation of the object to be measured in a plane perpendicular to the first direction. The measuring device 1 of this embodiment can have a simpler configuration compared to, for example, a device that measures deformation in two directions independently.
[0043] (Information Processing System and Data Glove) An information processing system SYS and a data glove according to an embodiment will be described. Figure 6 is a diagram of the information processing system SYS according to an embodiment. Figure 7 is a diagram of a data glove to which the measuring device according to an embodiment is applied. In Figure 7, the dotted line represents the skeleton of a human hand.
[0044] The information processing system SYS shown in FIG. 6 includes a data glove 20 and an information processing device 21. The data glove 20 detects the movement of the fingers on the user's hand 23 by the measuring device 1. The information processing system SYS detects the movement of the fingers on the user's hand 23 by the data glove 20, processes the detection result of the data glove 20 by the information processing device 21, and causes the display device 24 to display an image 30 (e.g., an image of VR content).
[0045] The data glove 20 includes a body 26 that holds the measuring device 1. The body 26 has a shape that covers at least a part of the user's hand 23 (appropriately called a glove shape). The body 26 is arranged to cover at least a part of the user's hand 23. The body 26 is worn on the user's hand 23. The data glove 20 is used in a state where the body 26 is worn on the user's hand 23. For example, a measuring device 1 and a controller 27 are attached to the body 26. The controller 27 includes the controller 7 shown in FIG. 2. The data glove 20 may include a tactile device that presents a sense of touch to the user.
[0046] As shown in FIG. 7, the measuring device 1 includes a plurality of pairs of first members 3 and second members 4. The pair of first members 3 and second members 4 are provided on each finger (thumb, index finger, middle finger, ring finger, little finger) of the human hand that is the measurement object 2. Each finger of the hand has a first joint h1 and a first branch h2 supported by the first joint h1. The first branch h2 is movable in a first direction (e.g., the X direction in FIG. 2(B)) and a second direction perpendicular to the first direction (e.g., the Z direction in FIG. 2(A)) with the first joint h1 as a fulcrum. The measuring device 1 is positioned on the body 26 such that the first members 3 and the second members 4 are arranged at the positions of the joints of each finger in a state where the body 26 is worn on the hand 23. The first member 3 and the second member 4 are arranged at positions including the first joint h1 of each finger in a state where the body 26 is worn on the user's hand 23 (see FIG. 7).
[0047] The controller 27 is provided with a measuring instrument 5 and a calculation unit 6 of the measuring device 1. The controller 27 acquires the measurement result of the measuring device 1 and calculates the position information of each finger of the hand using the measurement result of the measuring device 1.
[0048] In this embodiment, the measuring device 1 performs measurements repeatedly (e.g., periodically). Each time the measuring device 1 performs a measurement, or each time the measuring device 1 performs multiple measurements, the controller 27 calculates the position information of each finger of the hand using the measurement results of the measuring device 1.
[0049] The information processing device 21 processes information using the position information of each finger of the hand calculated by the controller 27. The information processing device 21 is, for example, a computer system including one or more computers. The information processing device 21 is communicably connected to the controller 27. The information processing device 21 acquires the finger position information output by the controller 27. Application software is installed in the information processing device 21. The information processing device 21 appropriately processes the finger position information output by the data glove 20 and uses it as an input to the application software.
[0050] For example, at least one of the commands on the application software is pre-associated with a finger pattern (e.g., finger posture, gesture). The information processing device 21 discriminates (e.g., identifies, estimates) the finger pattern from the finger position information and causes the application software to execute processing by the command corresponding to the discriminated finger pattern. The command may cause a process to change an object in the cyber space, a process to switch content, or other processes to be executed.
[0051] The application software includes, for example, a VR application that provides VR content. The VR application generates, for example, an image 30 representing the movement of the hand in the cyber space according to the movement of the user's hand 23 in the real space. The VR application generates, for example, an image 30B representing an object in the cyber space that does not exist in the real space. The VR application outputs data of an image 30 including the image 30A of the hand in the cyber space and the image 30B of the object.
[0052] The display device 24 is, for example, a head-mounted display, which presents images to a user in real space. The display device 24 may be part of the information processing system SYS or an external device to the information processing system SYS. The display device 24 is connected to the information processing device 21 in a communicative manner. The display device 24 acquires image data output from the information processing device 21. Using the acquired image data, the display device 24 displays an image 30 that includes an image of a hand 30A and an image of an object 30B. For example, by viewing the image 30 displayed by the display device 24, the user can obtain an experience different from that of real space.
[0053] For example, a user can view game images on a display device 24 while controlling an in-game avatar using a data glove 20. For example, a user can simulate various manual tasks, such as material processing or medical procedures, using the information processing system SYS to improve their skills in these tasks. For example, a user can play content that recreates a residence in VR using the information processing system SYS and confirm its livability through a simulated experience of touching the equipment inside the residence. For example, a user can communicate with other users in remote locations using the information processing system SYS and experience things like shaking hands or playing sports with other users.
[0054] The technical scope of the present invention is not limited to the embodiments described above. One or more of the requirements described above may be omitted. Furthermore, the requirements described above may be combined as appropriate. In addition, to the extent permitted by law, all disclosures of the documents cited above shall be incorporated as part of the description herein.
[0055] The measuring device 1 may detect the behavior of a finger using only the electrical characteristic values of the first member 3 and the second member 4, which are placed on one finger, or it may detect the behavior of a finger using the electrical characteristic values of the first member 3 and the second member 4, which are placed on one finger, along with other information. For example, the measuring device 1 may detect the behavior of a finger using either or both of the electrical characteristic values of the first member 3 and the second member 4, which are placed on the index finger, and the electrical characteristic values of the first member 3 and the second member 4, which are placed on the middle finger. For example, the behavior of a hand can involve one finger moving independently or multiple fingers moving in conjunction. In the case of multiple fingers moving in conjunction, the behavior of one finger may be estimated by referring to the behavior of the other fingers. In Figure 7, the measuring device 1 includes a first member 3 and a second member 4, which are placed on each finger. However, the first member 3 and the second member 4 may be provided on only one finger, or they may be provided on two or more fingers.
[0056] In the embodiments described above, an example was shown where the object to be measured 2 is a finger, but the invention is not limited to this example. For example, the object to be measured 2 may include a part of a human or an animal other than a human, a part of a living organism other than an animal, or a part of an inanimate object such as a machine. For example, the object to be measured 2 may have a structure such as a ball joint and be able to rotate around two axes. The object to be measured 2 is not limited to a finger, and may have a joint and a branch supported by the joint, and the branch may be movable in a first direction (e.g., the X direction) and a second direction perpendicular to the first direction (e.g., the Z direction) with the joint as a pivot point.
[0057] 1... Measuring device, 2... Object to be measured, 3... First component, 4... Second component, 5... Measuring instrument, 6... Calculation unit, 7... First joint h1... First branch, 10a, 10b... Sensor unit, 12a, 12b... Resistive film, 13a, 13b... Support, 14a, 14b, 15a, 15b... Electrode terminals, 20... Data globe, 21... Information processing device, 24... Display device, 26... Body, 27... Controller, 30, 30A, 30B... Image, SYS... Information processing system
Claims
1. A measuring device comprising: a first member provided on a deformable object to be measured, the electrical characteristic value of which changes due to deformation; a second member provided on the object to be measured at a position away from the first member in a first direction, the electrical characteristic value of which changes due to deformation; a measuring instrument for measuring the electrical characteristic value of the first member and the electrical characteristic value of the second member; and a calculation unit that uses the electrical characteristic value of the first member and the electrical characteristic value of the second member measured by the measuring instrument to separately calculate a first deformation amount indicating the deformation of the object to be measured in a plane parallel to the first direction and a second deformation amount indicating the deformation of the object to be measured in a plane perpendicular to the first direction.
2. The measuring device according to claim 1, wherein the calculation unit calculates the second deformation amount using the difference between the electrical characteristic value of the first member and the electrical characteristic value of the second member measured by the measuring instrument.
3. The measuring device according to claim 1, wherein the object to be measured has a first joint and a first branch supported by the first joint, the first branch is movable in a first direction and a second direction perpendicular to the first direction with the first joint as a pivot point, and the first member and the second member are each positioned at the first joint.
4. The measuring device according to claim 3, wherein the calculation unit calculates, as the first deformation amount, the angle at which the first branch rotates around an axis parallel to the first direction with the first joint as a pivot point, and as the second deformation amount, the angle at which the first branch rotates around an axis perpendicular to the first direction with the first joint as a pivot point.
5. A data globe comprising: a measuring device according to any one of claims 1 to 4; and a body positioned to cover at least a portion of the object to be measured and to hold the measuring device.