Testing device and testing system
By using a self-rotating trigger and data acquisition technology, the problem of electrode cracking caused by probe piercing the electrode was solved, enabling accurate identification of short circuit points and thermal runaway research in solid-state batteries, and improving the controllability and efficiency of testing.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- CONTEMPORARY AMPEREX TECHNOLOGY CO LTD
- Filing Date
- 2025-08-29
- Publication Date
- 2026-05-21
AI Technical Summary
In existing technologies, when a probe pierces the electrode of a solid-state battery, it can easily cause the electrode to crack, increasing the difficulty of testing, making it impossible to accurately determine the internal short circuit point, and resulting in an uncontrollable short circuit state.
A self-rotating trigger is used to pierce the electrode, combined with speed and displacement adjustment to reduce stress concentration on the electrode. Data acquisition devices are used to monitor parameters in real time to achieve accurate short circuit point identification.
It reduces the probability of electrode cracking, improves the accuracy of short-circuit points, supports thermal runaway research, and enhances testing efficiency.
Smart Images

Figure CN2025117773_21052026_PF_FP_ABST
Abstract
Description
Test apparatus and test system Cross-references
[0001] This application incorporates Chinese Patent Application No. 202422796342.0, filed on November 15, 2024, entitled “Test Apparatus and Test System”, which is incorporated herein by reference in its entirety. Technical Field
[0002] This application relates to the field of testing tools technology, and in particular to a testing device and testing system. Background Technology
[0003] Solid-state batteries still generate significant heat during high-power discharge or charging, causing the battery temperature to rise. Battery safety is a comprehensive indicator, closely related to both battery design and manufacturing. The challenges in industrializing solid-state batteries also contribute to potential safety risks.
[0004] The nail penetration test is an internal short-circuit test method, which is a safety test to test the battery's ability to withstand internal short circuits. At present, when the probe penetrates the electrode in the nail penetration test of solid-state batteries, it is easy to cause the electrode to crack, thus increasing the difficulty of the test. Summary of the Invention
[0005] In view of the above problems, this application provides a testing device and testing system that can improve the problem of electrode cracking during the process of probe piercing electrode.
[0006] In a first aspect, this application provides a testing device, which includes a support and a testing mechanism. The support has a bearing surface for placing the workpiece to be tested; the testing mechanism includes a trigger and a data acquisition component. The trigger is movably mounted on the support and is located above the bearing surface. The trigger can be controlled to screw into the workpiece to be tested. The data acquisition component is mounted on the trigger and is used to acquire target parameter values during the screwing-in process of the trigger.
[0007] In the technical solution of this application embodiment, during the movement of the detection mechanism, since the triggering element pierces the electrode sheet while rotating and moving, the problem of stress concentration applied to the electrode sheet by the triggering element can be reduced, thereby reducing the probability of the electrode sheet cracking and the short circuit point being unable to be accurately determined, which is helpful for thermal runaway research.
[0008] In some embodiments, the trigger is configured as a drill bit with an internal cavity.
[0009] This design simplifies the structure of the trigger, makes it easier to manufacture, reduces its weight, and facilitates its movement.
[0010] In some embodiments, the detection mechanism further includes a speed adjustment component, which is mounted on a bracket and connected to a trigger component. The speed adjustment component is used to adjust the rotational speed of the trigger component.
[0011] In this way, the rotation speed of the trigger can be adjusted according to the actual situation of the device to be tested, so as to reduce the influence of the trigger on the electrode.
[0012] In some embodiments, the bracket is further provided with a second switch, which is electrically connected to the speed regulating component and is used to control the start and stop of the speed regulation for user operation.
[0013] In some embodiments, the detection mechanism further includes a displacement adjusting member, which is mounted on a support and is drivenly connected to a trigger member and electrically connected to a data acquisition member. The displacement adjusting member drives the trigger member to move according to the signal from the data acquisition member.
[0014] With this setup, the displacement adjustment mechanism can be used to automatically record the specific screw-in depth of the trigger under different conditions, eliminating the need for the user to manually record the specific screw-in depth of the trigger under different conditions, thus improving the accuracy of the recorded target parameter values.
[0015] In some embodiments, the testing apparatus further includes a temperature sensor for electrical connection to the device under test.
[0016] When the triggering device induces thermal runaway at different depths, the temperature sensor can detect the temperature inside the device in real time, so that users can collect temperature data in a timely manner, which is helpful for thermal runaway research.
[0017] In some embodiments, the data acquisition device includes a voltage sensor mounted on the end of the trigger facing the bearing surface.
[0018] When the data acquisition unit contacts the electrode of the device under test, the voltage sensor can acquire the voltage of the device under test and send the voltage data to components such as the display so that the user can view and record it. Based on the data obtained, the depth of the trigger screw and the voltage can be adjusted to obtain more accurate data, which is helpful for thermal runaway research.
[0019] In some embodiments, the support includes a main body and a platform, the platform and the main body being movably connected, and the platform having a bearing surface.
[0020] By designing both the stage and the testing mechanism to be movable relative to the main body, the degree of freedom of the testing device is increased, making it easier to adjust the part to be tested to a preset position for testing.
[0021] In some embodiments, the stage and the main body are detachably connected.
[0022] This design facilitates the assembly of the stage and the main body, and if either the stage or the main body is damaged, the damaged part can be replaced.
[0023] In some embodiments, both the stage and the main body are provided with weight-reduction holes.
[0024] This design reduces the weight of the stage and main body, thereby reducing the overall weight of the testing device.
[0025] In some embodiments, the stage includes a mounting section that secures the object to be tested to the stage via a binding member.
[0026] This prevents the component under test from shifting during testing, thus reducing the probability of inaccurate test positioning. Secondly, the binding material can be adjusted at any time according to the size of the component under test, and the component can be flexibly adjusted according to the location of the short circuit point to be tested.
[0027] In some embodiments, the stage is provided with at least two slots, which are configured as mounting parts. The slots extend along the width direction of the stage, and the binding member is fixed in the slot by a locking member. The binding member can limit the object to be tested to be located on the stage.
[0028] This design simplifies the structure of the mounting section and reduces the difficulty of manufacturing.
[0029] In some embodiments, the bracket is provided with a first switch for controlling the operation of the trigger, and the user can turn the trigger on or off by operating the first switch, which is convenient for the user to operate.
[0030] In some embodiments, the data acquisition device includes a sensor for acquiring target parameter values during the screwing-in process of the trigger.
[0031] This setup simplifies the way the data acquisition device collects target parameter values.
[0032] Secondly, this application provides a testing system that includes the testing apparatus described in the above embodiments.
[0033] The above description is only an overview of the technical solution of this application. In order to better understand the technical means of this application and to implement it in accordance with the contents of the specification, and to make the above and other objects, features and advantages of this application more obvious and understandable, the following are specific embodiments of this application. Attached Figure Description
[0034] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the embodiments of this application will be briefly described below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on the drawings without creative effort. In the drawings:
[0035] Figure 1 is a schematic diagram of the disassembled structure of a battery cell provided in one or more embodiments of this application.
[0036] Figure 2 is a schematic diagram of the structure of a test device provided in one or more embodiments of this application.
[0037] The reference numerals in the detailed embodiments are as follows:
[0038] 100. Battery cell; 10. End cap; 11. Electrode terminal; 20. Housing; 30. Cell assembly;
[0039] 200. Testing device; 210. Support; 211. Main body; 212. Stage; 2121. Mounting part; 220. Detection mechanism; 221. Trigger; 222. Data acquisition component; 230. Speed adjustment component; 240. Weight reduction hole. Detailed Implementation
[0040] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0041] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms “comprising” and “having”, and any variations thereof, in the specification, claims, and foregoing description of the drawings are intended to cover non-exclusive inclusion.
[0042] In the description of the embodiments of this application, technical terms such as "first" and "second" are used only to distinguish different objects and should not be construed as indicating or implying relative importance or implicitly specifying the number, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly defined.
[0043] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.
[0044] In the description of the embodiments of this application, the term "multiple" refers to two or more (including two), similarly, "multiple sets" refers to two or more (including two sets), and "multiple pieces" refers to two or more (including two pieces).
[0045] In the description of the embodiments of this application, the technical terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing the embodiments of this application and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the embodiments of this application.
[0046] In the description of the embodiments of this application, unless otherwise expressly specified and limited, technical terms such as "installation," "connection," "joining," and "fixing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. For those skilled in the art, the specific meaning of the above terms in the embodiments of this application can be understood according to the specific circumstances.
[0047] With the widespread use of batteries, battery safety has become increasingly important. Thermal runaway testing is one such test. Battery thermal runaway refers to the cumulative increase in current and battery temperature during constant-voltage charging, leading to gradual damage. Abnormal conditions may occur during battery use, such as overheating, overcharging, or external impacts. These abnormal conditions can trigger thermal runaway, leading to serious safety accidents, even fires and explosions. Thermal runaway testing aims to evaluate the safety performance of batteries under abnormal conditions, providing a scientific basis for battery design, production, and use, and reducing potential safety hazards.
[0048] Currently, thermal runaway is typically induced by piercing the electrode with a probe. However, during the piercing process, the electrode is prone to cracking, making it impossible to accurately locate the internal short circuit point. Because the short circuit point cannot be confirmed, the resulting short circuit state is uncontrollable, and the ultimate consequences are also uncontrollable.
[0049] Based on the above considerations, in order to solve the problem that during the use of battery cells, the probe piercing the electrode sheet can cause the electrode sheet to crack, making it impossible to accurately locate the internal short circuit point on the electrode sheet, thus leading to an uncontrollable short circuit state, some embodiments of this application provide a testing device. The trigger element of this testing device pierces the electrode sheet of the device under test by rotating, thereby dispersing the stress on the electrode sheet, reducing the probability of excessive stress concentration causing the electrode sheet to crack, and enabling the short circuit point on the electrode sheet to be accurately located, thus improving testing efficiency.
[0050] The testing device disclosed in this application can be applied not only to scenarios where batteries are short-circuited, but also to scenarios where holes are made in the substrate.
[0051] Please refer to Figure 1, which is an exploded structural diagram of a battery cell 100 provided in some embodiments of this application. A battery cell 100 refers to the smallest unit that makes up a battery. As shown in Figure 1, the battery cell 100 includes an end cap 10, a housing 20, a cell assembly 30, and other functional components.
[0052] End cap 10 refers to a component that covers the opening of housing 20 to isolate the internal environment of battery cell 100 from the external environment. The shape of end cap 10 can be adapted to the shape of housing 20 to fit it. Alternatively, end cap 10 can be made of a material with a certain hardness and strength (such as aluminum alloy), so that end cap 10 is less prone to deformation under pressure and impact, enabling battery cell 100 to have higher structural strength and improved safety performance. Functional components such as electrode terminals 11 can be provided on end cap 10. Electrode terminals 11 can be used for electrical connection with cell assembly 30 to output or input electrical energy to battery cell 100. In some embodiments, end cap 10 can also be provided with a pressure relief mechanism for releasing internal pressure when the internal pressure or temperature of battery cell 100 reaches a threshold. The material of end cap 10 can also be various, such as copper, iron, aluminum, stainless steel, aluminum alloy, plastic, etc., and this application embodiment does not impose any special limitations on this. In some embodiments, an insulating element may be provided on the inner side of the end cap 10. The insulating element can be used to isolate the electrical connection components within the housing 20 from the end cap 10 to reduce the risk of short circuits. For example, the insulating element may be made of plastic, rubber, etc.
[0053] The housing 20 is a component used to cooperate with the end cap 10 to form the internal environment of the battery cell 100. This internal environment can accommodate the cell assembly 30, electrolyte, and other components. The housing 20 and the end cap 10 can be independent components. An opening can be provided on the housing 20, and the end cap 10 closes the opening to form the internal environment of the battery cell 100. Alternatively, the end cap 10 and the housing 20 can be integrated. Specifically, the end cap 10 and the housing 20 can form a common connecting surface before other components are inserted into the housing. When it is necessary to encapsulate the interior of the housing 20, the end cap 10 closes the housing 20. The housing 20 can have various shapes and sizes, such as cuboid, cylindrical, hexagonal prism, etc. Specifically, the shape of the housing 20 can be determined according to the specific shape and size of the cell assembly 30. The material of the housing 20 can be various, such as copper, iron, aluminum, stainless steel, aluminum alloy, plastic, etc. This application embodiment does not impose any special limitations on this.
[0054] The cell assembly 30 is the component in the battery cell 100 where the electrochemical reaction occurs. The casing 20 may contain one or more cell assemblies 30. The cell assembly 30 is mainly formed by winding or stacking positive and negative electrode sheets, and typically a separator is provided between the positive and negative electrode sheets. The portions of the positive and negative electrode sheets containing active material constitute the main body of the cell assembly, while the portions of the positive and negative electrode sheets without active material each constitute a tab. The positive and negative tabs may be located together at one end of the main body or separately at both ends of the main body. During the charging and discharging process of the battery, the positive and negative active materials react with the electrolyte, and the tabs connect to the electrode terminals to form a current loop.
[0055] The following description uses the application of the test device 200 in the battery scenario to illustrate the test device 200.
[0056] As shown in Figure 2, this application provides a testing device 200, which includes a support 210 and a testing mechanism 220. The support 210 has a bearing surface for placing the workpiece to be tested. The testing mechanism 220 includes a trigger 221 and a data acquisition unit 222. The trigger 221 is movably mounted on the support 210 and is located above the bearing surface. The trigger 221 can be controlled to screw into the workpiece to be tested. The data acquisition unit 222 is mounted on the trigger 221 and is used to collect target parameter values during the screwing-in process of the trigger 221.
[0057] The support 210 is used to support the device to be tested (such as a battery cell 100), and the support 210 can initially define the position of the device to be tested. The trigger 221 is used to pierce the electrode of the battery cell 100, causing a short circuit in the device to be tested and thus triggering thermal runaway. The part of the trigger 221 used to pierce the electrode may be, but is not limited to, constructed as a probe.
[0058] The connection between the trigger 221 and the bracket 210 can be, but is not limited to, a sliding connection or a snap-fit connection, to change the depth to which the trigger 221 is screwed into the test piece in the screwing direction. This allows the data acquisition unit 222 to acquire the same target parameter value when the trigger 221 is at different depths within the test piece. Simultaneously, the trigger 221 screws into the test piece by rotating, which helps reduce the stress experienced by the electrode when punctured.
[0059] The data acquisition unit 222 may include sensors, such as current sensors, voltage sensors, etc. The data acquisition unit 222 can be disposed at the end of the trigger member 221 facing the bearing surface, so that the data acquisition unit 222 can acquire the target parameter value at the first time.
[0060] The target parameter value can be the current value, voltage value, etc., collected by the data acquisition unit 222 when the trigger 221 is screwed into the trigger at different depths. The following embodiments all use the voltage value collected by the data acquisition unit 222 as an example for illustration.
[0061] For example, the device to be tested can be placed on the support surface of the bracket 210. Then, the testing mechanism 220 can be activated, and the trigger 221 moves towards the support surface. During this movement, the trigger 221 rotates while approaching the device to be tested. Because the data acquisition unit 222 is located at the end of the trigger 221, it will first contact the electrode after the trigger 221 pierces the housing 20 of the device to be tested. After the trigger 221 pierces the electrode, it can cause a short circuit inside the battery cell 100 and trigger thermal runaway.
[0062] When the data acquisition unit 222 first contacts the electrode, it receives a signal and uses the current position of the trigger unit 221 as the starting point. When the trigger unit 221 is screwed into a certain position and thermal runaway is triggered, the distance between the trigger unit 221 and the starting point is recorded as the single screw-in depth of the trigger unit 221, and the target parameter value (such as voltage) acquired by the data acquisition unit 222 at this time is collected. In addition, the user needs to observe the state of the device under test, such as whether the battery is smoking or catching fire, or whether the electrode is cracked, and record the relevant information.
[0063] The following data were obtained after multiple tests. When the trigger element 211 was screwed in to a depth of 0.5 mm, thermal runaway was successfully triggered without electrode cracking. When the trigger element 211 was screwed in to a depth of 1 mm, thermal runaway was successfully triggered without electrode cracking. When the trigger element 211 was screwed in to a depth of 3 mm, thermal runaway was successfully triggered without electrode cracking. When the trigger element 211 was screwed in to a depth of 5 mm, thermal runaway was successfully triggered without electrode cracking. When the trigger element 211 was screwed in to a depth of 7 mm, thermal runaway was successfully triggered without electrode cracking.
[0064] As the screw-in depth of the trigger 221 changes, the relevant data and the degree of thermal runaway of the device under test will also change accordingly. Provided the electrode sheet does not crack, the user can trigger thermal runaway by changing the screw-in depth of the trigger 221 to collect relevant data of the device under test at different screw-in depths. The data recorded when the trigger 221 is at different screw-in depths can be used as data from multiple experiments to facilitate thermal runaway studies.
[0065] In summary, during the movement of the detection mechanism 220, because the trigger 221 pierces the electrode while rotating and moving, the stress concentration problem applied by the trigger 221 to the electrode can be reduced, thereby reducing the probability of electrode cracking and making it impossible to accurately determine the short circuit point, which is helpful for thermal runaway research.
[0066] In some embodiments, the trigger 221 is configured as a hollow drill bit.
[0067] The trigger element 221 can be constructed as a drill bit with a cavity inside. The entire trigger element 221 can be made of materials such as diamond. For example, in one specific embodiment, the drill bit has a shank diameter of 3 mm, a total length of 45 mm, and a cutting edge length of 10 mm. The diameter of the drill bit's end, i.e., the portion containing the cavity, ranges from 1.5 mm to 3 mm.
[0068] This design simplifies the structure of the trigger 221, makes it easier to manufacture, and makes its interior hollow, which reduces the weight of the trigger 221 and makes it easier to move.
[0069] In other embodiments, the bracket 210 is provided with a first switch to control the operation of the trigger 221. The user can turn the trigger 221 on or off by operating the first switch, which is convenient for the user to operate.
[0070] In some embodiments, the detection mechanism 220 further includes a speed adjustment component 230, which is disposed on the bracket 210 and connected to the trigger component 221. The speed adjustment component 230 is used to adjust the rotation speed of the trigger component 221.
[0071] For example, the speed regulator 230 is configured as a drill, which can drive the trigger 221 to rotate and control the speed of the trigger 221. The speed regulation range of the drill is 0-1300 revolutions per second (r / s). The drilling depth range of the drill is 0-100mm. The drill and the trigger 221 are connected by a snap-fit or other easy-to-disassemble method to facilitate the replacement of the trigger 221, thereby accommodating different sized batteries and facilitating the maintenance of the trigger 221.
[0072] In this way, the rotation speed of the trigger 221 can be adjusted according to the actual situation of the device to be tested, so as to reduce the influence of the trigger 221 on the electrode.
[0073] Understandably, the bracket 210 is also equipped with a second switch, which is electrically connected to the speed regulator 230 and is used to control the start and stop of the speed regulation for user operation.
[0074] In some embodiments, the detection mechanism 220 further includes a displacement adjustment member, which is disposed on the bracket 210. The displacement adjustment member is driven to the trigger member 221 and electrically connected to the data acquisition member 222. The displacement adjustment member drives the trigger member 221 to move according to the signal from the data acquisition member 222.
[0075] Displacement adjustment components can be, but are not limited to, stepper motors, cylinders, and other drive components.
[0076] One end of the displacement adjustment member is mounted on the bracket 210, and the other end is connected to the trigger member 221. When the detection mechanism 220 is running, the displacement adjustment member drives the trigger member 221 to move closer to the object to be tested. When the trigger member 221 first contacts the electrode of the object to be tested, the data acquisition unit 222 can send a signal to the displacement adjustment member. The displacement adjustment member receives the signal and takes the current position of the trigger member 221 as the starting point. As the displacement adjustment member continues to drive the trigger member 221 to screw in, the displacement adjustment member can record the depth at which the trigger member 221 pierces the electrode.
[0077] With this setup, the displacement adjustment component can be used to automatically record the specific screw-in depth of the trigger 221 under different conditions, eliminating the need for the user to manually record the specific screw-in depth of the trigger 221 under different conditions, thus improving the accuracy of the recorded data.
[0078] In some embodiments, the testing apparatus 200 further includes a temperature sensor for electrical connection to the test object.
[0079] When the trigger 221 triggers thermal runaway at different depths, the temperature sensor can detect the temperature inside the device under test in real time, so that users can collect temperature data in a timely manner, which is helpful for thermal runaway research.
[0080] In some embodiments, the data acquisition unit 222 includes a voltage sensor mounted on the end of the trigger 221 facing the bearing surface.
[0081] When the data acquisition unit 222 contacts the electrode of the device under test, the voltage sensor can acquire the voltage of the device under test and send the voltage data to the display and other components so that the user can view and record it. The user can also adjust the depth of the trigger 221 and the voltage according to the acquired data to obtain more accurate data, which is helpful for thermal runaway research.
[0082] In some embodiments, the support 210 includes a main body 211 and a platform 212, the platform 212 and the main body 211 are movably connected, and the platform 212 is provided with a bearing surface.
[0083] The main body 211 is used to support the stage 212, and the detection mechanism 220 can also be installed on the main body 211. The connection between the stage 212 and the main body 211 can be, but is not limited to, a threaded connection or a snap-fit connection. The stage 212 can be constructed as a plate, which can move linearly and rotate relative to the main body 211.
[0084] The stage 212 and the testing mechanism 220 are both designed to be movable relative to the main body 211, which increases the degree of freedom of the testing device 200 and allows the test piece to be adjusted to a preset position for testing.
[0085] In some embodiments, the stage 212 includes a mounting part 2121, which uses a binding member to confine the item to be tested to the stage 212.
[0086] For example, the stage 212 is provided with a groove, and the item to be tested is placed on the side of the groove. Then, one end of the binding member can be fixed in the groove, and the other end of the binding member can be wrapped around the item to be tested and fixed in the groove to fix the item to be tested on the stage 212.
[0087] This prevents the component under test from shifting during testing, thus reducing the probability of inaccurate test positioning. Secondly, the binding material can be adjusted at any time according to the size of the component under test, and the component can be flexibly adjusted according to the location of the short circuit point to be tested.
[0088] In some embodiments, the stage 212 is provided with at least two slots, which are configured as mounting portions 2121. The slots extend along the width direction of the stage 212, and the binding member is fixed in the slot by a locking member. The binding member can limit the object to be tested to be located on the stage 212.
[0089] For example, as shown in Figure 1, the stage 212 has two parallel and spaced-apart slots. The cross-section of each slot can be T-shaped, and the middle of the two slots is used to place the part to be tested. When fixing the part to be tested to the stage 212, one end of the binding member can be fixed to the slot, the other end can be wrapped around the part to be tested, and finally fixed in the other slot. In this way, the part to be tested is fixed on the stage 212.
[0090] The above configuration simplifies the structure of the mounting section 2121 and reduces the difficulty of processing.
[0091] In other embodiments, weight-reducing holes 240 can be provided on both the stage 212 and the main body 211 to reduce the weight of the stage 212 and the main body 211, thereby reducing the weight of the entire testing device 200. It should be noted that after the test, the user also needs to clean the bracket 210 for the next use.
[0092] Furthermore, some embodiments of this application provide a testing system that includes the testing apparatus 200 described in the above embodiments. Because the testing system includes the aforementioned testing apparatus 200, it also possesses the technical effects achievable by the testing apparatus, which will not be elaborated further here.
[0093] In one specific embodiment, as shown in Figure 3, the testing device 200 includes a support 210 and a testing mechanism 220. The stage 212 of the support 210 is used to support the object to be tested. The testing mechanism 220 includes a trigger 221, a data acquisition unit 222, a speed adjustment unit 230, and a displacement adjustment unit. The data acquisition unit 222 is located at the end of the trigger 221 facing the stage 212. The speed adjustment unit 230 is used to adjust the speed of the trigger 221, and the displacement adjustment unit is used to drive the trigger 221 to move closer to or further away from the stage 212.
[0094] During the test, the trigger 221, under the combined action of the speed regulator 230 and the displacement regulator, rotates and approaches the test object. When the trigger 221 pierces the housing 20 of the test object, the data acquisition unit 222 first contacts the electrode and receives the signal. The position of the trigger 221 at this point can be used as the starting point. When the trigger 221 is screwed into a certain position and thermal runaway is triggered, the distance between the trigger 221 and the starting point is recorded as the single screwing depth of the trigger 221, and the data acquired by the data acquisition unit 222 at this time (such as voltage) is collected. In addition, the user also needs to observe the state of the test object, such as whether the battery is smoking or catching fire, or whether the electrode is cracked, and record the relevant information.
[0095] As the insertion depth of the trigger 221 changes, the relevant data and the degree of thermal runaway of the device under test also change accordingly. Provided the electrode sheet does not crack, the user can trigger thermal runaway by changing the insertion depth of the trigger 221 to collect relevant data of the device under test at different insertion depths. The data recorded at different insertion depths of the trigger 221 can be used as data from multiple experiments. Because the trigger 221 pierces the electrode sheet while rotating and moving, the stress concentration exerted by the trigger 221 on the electrode sheet can be reduced, thus lowering the probability of electrode sheet cracking and making it difficult to accurately determine the short circuit point, which is helpful for thermal runaway research.
[0096] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0097] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.
Claims
1. A test device, wherein, include: The support has a bearing surface for placing the item to be tested. The testing mechanism includes a trigger and a data acquisition unit. The trigger is movably mounted on the bracket and located above the bearing surface. The trigger can be controlled to screw into the test piece. The data acquisition unit is mounted on the trigger and is used to acquire target parameter values during the screwing-in process of the trigger.
2. The test device of claim 1, wherein, The trigger element is constructed as a hollow drill bit.
3. The test device of claim 1 or 2, wherein, The detection mechanism further includes a speed adjustment component, which is mounted on the bracket and connected to the trigger component. The speed adjustment component is used to adjust the rotation speed of the trigger component.
4. The test device of claim 3, wherein, The bracket is also equipped with a second switch, which is electrically connected to the speed regulator and is used to control the start and stop of the speed regulator.
5. The test device of any one of claims 1 to 4, wherein, The detection mechanism further includes a displacement adjusting component, which is mounted on the bracket. The displacement adjusting component is drivenly connected to the trigger component and electrically connected to the data acquisition component. The displacement adjusting component drives the trigger component to move according to the signal from the data acquisition component.
6. The test device of any one of claims 1 to 5, wherein, The testing device also includes a temperature sensor, which is electrically connected to the test piece.
7. The test device of any one of claims 1 to 6, wherein, The data acquisition device includes a voltage sensor, which is mounted on the end of the trigger facing the bearing surface.
8. The test device of any one of claims 1 to 7, wherein, The support includes a main body and a platform, the platform and the main body are movably connected, and the platform is provided with the bearing surface.
9. The test device of claim 8, wherein, The stage and the main body are detachably connected.
10. The test device of claim 8 or 9, wherein, Both the stage and the main body are provided with weight-reducing holes.
11. The test device of claims 8-10, wherein, The stage includes a mounting part, which uses a binding member to confine the object to be tested to the stage.
12. The test device of claim 11, wherein, The platform is provided with at least two slots, which are configured as the mounting part. The slots extend along the width direction of the platform. The binding member is fixed in the slot by a locking member. The binding member can limit the object to be tested to be located on the platform.
13. The test device of any one of claims 1 to 12, wherein, The bracket is equipped with a first switch that controls the operation of the trigger.
14. The test device of any one of claims 1 to 13, wherein, The data acquisition device includes a sensor, which is used to acquire target parameter values during the screwing-in process of the trigger.
15. A test system, characterized by Includes the test apparatus as described in any one of claims 1 to 14.