Substrate processing method and substrate processing system
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- TOKYO ELECTRON LTD
- Filing Date
- 2024-12-10
- Publication Date
- 2026-06-18
AI Technical Summary
Existing methods struggle to efficiently separate and reuse semiconductor wafers while preserving the integrity of the device layer during the transfer process, often leading to misalignment and bonding defects due to wafer deformation and uneven surfaces.
A method involving the formation of a laser absorption layer on one wafer surface, followed by irradiation with laser light to reduce bonding strength, combined with a transparent coating film on the opposite surface to enhance energy absorption and facilitate separation, allowing for the transfer of the device layer to another wafer while enabling reuse of the first wafer.
This approach enables precise separation of wafers with minimal damage, reduces energy loss, and allows for the reuse of the first wafer, improving processing efficiency and reducing costs by minimizing the need for additional film removal processes.
Smart Images

Figure JP2024043682_18062026_PF_FP_ABST