Optically Investigating Flaws/Contamination TRIZ Cases

Removing anti-blooming allows charge overflow to extend the defect sizing range by analyzing signals across multiple pixels.

Four optical blocks with mirror assemblies capture eight simultaneous views to detect marks on containers regardless of orientation.

Drive optics modify the point spread function to shift plasma emission from ultraviolet into a desired wavelength band, reducing component solarization.

Coplanar sensor and emitter surfaces enable visual focus checking via a reference figure, eliminating complex equipment and reducing installation time.

Acquisition circuit captures position and wavelength data from laser reflections on stationary structures to identify abnormal locations.

A laser detection device calculates surface inclination from reflected light to identify substrate defects.

Segmented light sources and a universal detector identify foreign body layers within displays, resolving precision versus complexity trade-offs.

Integrating an IR reference spectrum over a specific range determines surface impairment indicators, eliminating complex multi-step cleaning schedules.

Pulsed ultraviolet illumination synchronizes with detection thresholds to distinguish fluorescing waste from ambient light, reducing false positives.

Oblique front lighting suppresses glare and edge shadows to measure opacity and detect decoration defects on transparent media.

An adaptive inspection apparatus selects optimal imaging conditions dynamically to detect surface anomalies without manual setup.

Fluorescence spectroscopy identifies aromatic hydrocarbons in groundwater without chemical reagents, eliminating complex sample pretreatment procedures.

Spatially sensitive fibers determine the real-time location of visual inspection devices, resolving inconsistent diagnoses caused by subjective human analysis.

A camera calibration system positions an optical target within a viewing area using a drive mechanism.

Automated optical inspection replaces manual visual checks with image processing algorithms to detect scratches, cracks, and stains on mobile phone displays.

An inspecting device prevents false debris detection on glass substrates by absorbing penetrating laser beams through a specialized platform coating.

A terahertz system detects metallic particles in polymer sheets with high resolution.

A defect inspection apparatus uses a segmented single image sensor to capture parallel images from multiple light sources.

A wafer inspection system uses multiple measurement volumes with distinct interfringe distances to determine defect sizes via cross-checked visibility values.

Constant-frequency vibration shifts focal plane to resolve friction-induced deformation limits while expanding inspection range.