Optically Investigating Flaws/Contamination TRIZ Cases

Phase-measuring deflectometry captures periodic pattern shifts to evaluate glazing optical quality near delineated region edges.

Dual-wavelength irradiation captures medicament contours in moving packages using visible and near-infrared light.

Tilted deflection mirrors in a mirror cabinet compensate for central projection distortion, ensuring upright and uniformly sized bottle views.

A protective unit with a dog leg shaped plate-like member blocks direct light paths to reduce specular reflections and flare, improving determination accuracy.

Dioptric and reflection groups focus inspection and monitoring light to a single point.

Pulsed illumination synchronizes with multi-pixel photon counting detectors to correct nonlinearity, resolving sensitivity versus thermal damage trade-offs.

A linear variable filter arrangement enables rapid wavelength selection across a 400 to 900 nm range in metrology illumination systems.

Simultaneous brightfield and darkfield imaging resolves reflectivity variations that degrade single-angle defect detection accuracy.

Multi-angle illumination captures reflectance images to classify particulate contaminants on surfaces based on material gloss properties.

Automated optical scanning identifies surface defects on moving ceramic slabs using infrared illumination.

A UV light device detects fluorescent mold on construction materials without damaging the surface.

Integrated monitoring probe combines dust, temperature, and humidity sensors to resolve the trade-off between measurement precision and system complexity.

Temporal modulation of lidar optical components disambiguates defect signals from background noise, ensuring reliable autonomous vehicle navigation.

A liquid-cooling coincidence detector system uses scintillation and signal comparison to identify illumination events.

A droplet sensor system uses total internal reflection in a window to detect foreign bodies via light attenuation.

A visual inspection device determines target object positions within a volume using reference points and quadrilateration equations.

Automated tablet tooling inspection system measures punch and die parameters using integrated LED micrometer and laser sensors.

A glass bottle inspection device detects mouth and base points to calculate sealing surface inclination.

Oblique illumination and axial imaging resolve front or back surface ambiguity in transparent film inspection.

A laboratory gas measuring device uses a distance sensor to determine container geometry for accurate concentration analysis.

Automated optical inspection system scans rubber crumb on a conveyor using high-intensity lighting and cameras to detect surface contaminants.

Vacuum seal isolates optical objective from thermal chamber vibrations, maintaining focus stability during high-resolution IC testing.

Predictive gain control adjusts photomultiplier tube sensitivity across scan lines to maintain optimal signal levels.

A multi-wavelength detection system uses terahertz scattering cross-section analysis to identify foreign object debris types in gas turbine engines.

Asymmetric lighting highlights wire edges on the sealing surface, resolving the trade-off between mold filling precision and defect formation.

Robust averaging and median calculations suppress wafer-to-wafer noise, enabling high-sensitivity detection of die repeaters without multiple scans.

A spinning probing beam scans object surfaces concurrently with slow linear motion to enable high throughput characterization.

A hypercentric lens subsystem forms converging 3-D panoramic views of fastener surfaces.

An optical module illuminates substrates with polarized light to enhance defect visibility during surface inspection.

Parallel signal processing reduces computational cost while maintaining high sensitivity for detecting various defect shapes on mirror wafers.

A single camera captures multiple product sides via a circular mirror array.

Segmented illumination with distinct radiation parameters resolves fuzzy edge images by increasing reflected light collection.

An inspection substrate with penetrating holes captures satellite droplets on its surface for camera measurement.

Collimated light from a Fresnel lens illuminates only the target can, eliminating reflected light interference between adjacent objects on high-speed conveyors.

Periodic plasma ignition eliminates self-absorption, delivering 60,000 Kelvin radiance for semiconductor metrology.

Automated optical detection corrects workpiece misalignment before inspection imaging, enabling parallel processing to reduce cycle time.

Vertically aligned light source columns project variable patterns to detect bottle seams and embossings on containers.

Laser scanning creates a point cloud that fits a polygonal mesh to detect cracks, resolving the trade-off between measurement precision and device complexity.

Stationary line camera captures interlaced image lines using synchronized stroboscopic lighting configurations for multi-spectral defect detection.

Hardened optical probe resists corrosion damage while enabling precise spectrographic measurements of molten salt impurities.

A catoptric imaging device uses conical and frustoconical surfaces to reflect laser beams onto drill cross-sections for optical profiling.