Scattering Properties Measurements TRIZ Cases
- Laser Inspection System for Flat Panel Displays
Parallel dual-laser inspection reduces processing time while managing device complexity through modular architecture.
- Optical Element Configuration for Wafer Inspection
A computer subsystem selects optical element configurations to generate distinct images for wafer inspection.
- Deformable Mirror Wavefront Optimization
A deformable mirror device encodes binary off-axis holograms to modulate light phase, overcoming slow switching speeds in biological imaging.
- Particle Detector Using Semispherical Film and Elliptical Mirror
A particle detector uses a semispherical reflective film to redirect reaction light through a lens portion toward an elliptical mirror.
- Fire Position Estimation Using Gas Propagation Speeds
A fire sensing system estimates fire position using gas propagation speeds calculated from concentration changes at three sensors.
- Optical Sensor Package Recesses for Crosstalk Reduction
Recess portions in the package structure alter light scattering paths, reducing direct transmission and optical crosstalk between emitter and detector.
- Foreign Substance Inspection Apparatus Edge Exclusion
A foreign substance inspection apparatus excludes substrate steps from detection regions to prevent optical receiver signal saturation.
- Multi-Wavelength Smoke Detection with Ambient Light Correction
Smoke detector uses multiple wavelengths to identify particles and an ambient-light sensor for measurement correction.
- Flow Cytometer Event Validation via Time-of-Flight and Peak Height
A flow cytometer validates particle events using high-resolution time-stamping to distinguish valid cells from noise artifacts.
- Calibration Device with Diffuse Scattering Layer
A hollow body device uses a diffusely scattering layer to illuminate specimens and calibrate photo-detectors via fixed positions.
- Turbidity Measurement Using Scattered and Reflected Light
A measuring arrangement detects scattered and reflected light signals to determine turbidity in a medium.
- Multiply Patterned Metrology Target for Pitch Walk Measurement
A multiply patterned metrology target encodes pitch walk as a measurable overlay between left and right features.
- Deployable Rail Inspection System for Inverted Third Rails
A deployable optical measurement system extends a reflecting assembly beyond vehicle clearance envelopes to analyze rail surfaces.
- Specular Gloss Material Classification via Multi-Angle Illumination
Multi-angle illumination captures specular reflections to classify materials by glossiness properties.
- Non-linear Frequency Scan Optical Fiber Reflectometry
A non-linearly-scanning optical interrogation signal generates a beat detection profile for an optical fiber using a predefined function.
- Two-Mode Raman Optical Projection Tomography for Label-Free 3D Imaging
Dual-channel optical projection tomography system acquires structural and chemical data simultaneously.
- Diffractive Optical Element Asymmetric Arrangement
A diffractive optical element uses two layers with basic units arranged in different directions to generate stable light intensity.
- Non-collimated Laser Component Measurement Apparatus
Removing the collimating lens simplifies assembly while non-invasive glucose detection reduces physical pain.
- FPGA Resampling of OCT Signals Using Low-Frequency K-Clock
An FPGA-based signal processing system resamples optical coherence tomography data using a low-frequency clock.
- Surface Property Investigation Apparatus with Movable Optical Filters
Movable optical filters enable fluorescence detection in a stationary light source setup, reducing device complexity and failure risk.
- Transparent Article Inspection via Edge Illumination
Edge illumination triggers total internal reflection within the substrate, revealing surface and subsurface defects that conventional top-down imaging misses.
- Turbidity Sensor Noise Model for Single-Beam Accuracy
A turbidity sensor uses chronological scattered light intensity analysis to determine mean values via calibration models.
- Axial Chromatic Aberration Optical Observation for Irregular Surfaces
An optical observation apparatus uses axial chromatic aberration to focus broadband light across varying surface heights.
- Laser Conditioning Control by Substrate Reflectivity
A laser conditioning system measures substrate reflectivity to determine precise energy and duration parameters for contaminant removal.
- Optical Vital Signs Sensor Light Shaping for Accuracy
A light shaping unit constrains the angular range of an optical vital signs sensor to enhance measurement accuracy.
- Ion Implanter Electrode Cooling and Plasma Gap Design
Coolant circulation through aluminum supports cools electrodes while a tortuous gap prevents plasma leaks that cause short circuits.