Thin Magnetic Films TRIZ Cases
- MTJ Via Structure Using ALD for Seamless Conductivity
ALD-formed transition metal and tantalum-rich via layers enable small MTJ connections with seamless conductivity and stronger structural integrity.
- TMR Sensor Layer Structure for Out-of-Plane Field Detection
Alternating antiferromagnetic layers create a stable z-axis reference, allowing TMR sensors to detect out-of-plane magnetic field intensity changes.