Phase offset calibration method for instantaneous position of field-free point in magnetic particle imaging
By acquiring and modulating magnetic particle response signals and current intensity signals, and combining automatic phase modulation and eigenvalue solving, automatic phase calibration of the instantaneous position of a point without a magnetic field is achieved. This solves the problems of large workload and complicated adjustment in existing technologies, and provides a simplified calibration method and clear evaluation criteria.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BEIHANG UNIV
- Filing Date
- 2023-07-18
- Publication Date
- 2026-05-29
AI Technical Summary
Existing methods for calibrating the phase shift of instantaneous positions of points without magnetic fields in magnetic particle imaging require individual measurement or calculation of each device in the MPI device, resulting in a large workload, long calibration time, and complicated adjustments, and lack of clear evaluation criteria.
A phase offset calibration method for the instantaneous position of a point without a magnetic field in magnetic particle imaging is adopted. By acquiring the magnetic particle response signal and current intensity signal of the target sample, and combining them with the set modulation parameters, the phase is automatically modulated to obtain the target feature value and phase offset. The automatic phase modulation process curve is plotted and the optimal solution is solved to realize the automatic phase calibration of the instantaneous position.
It reduces the difficulty of phase modulation, simplifies the operation process, provides clear evaluation criteria and a visualized calibration process, is suitable for calibration of one-dimensional and three-dimensional MPI systems, and has strong scalability.
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Figure CN116930843B_ABST
Abstract
Citation Information
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