Stain source identification method, stain source identification device, electronic device, and medium
CN116956285BActive Publication Date: 2026-08-28INSTITUTE OF INFORMATION ENGINEERING CHINESE ACADEMY OF SCIENCES
Patent Information
- Application Number
- CN202310799123.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-06-30
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2043-06-30
AI Technical Summary
Technical Problem
[0004]本发明提供一种污点源识别方法、污点源识别装置、电子设备及介质，用以解决现有技术中固件的二进制程序存在的安全缺陷容易漏报的问题
Benefits of technology
[0026]本发明提供的污点源识别方法、污点源识别装置、电子设备及介质，通过将固件中的每个函数分别对应的行为特征向量和目标特征矩阵进行相似度分析，从而可以分析自定义函数和内存操作函数的行为相似性，然后确定可以作为污点源的目标函数，基于作为污点源的目标函数作对固件进行污点分析，缩短潜在的数据依赖关系，可以有效发现目标固件中二进制程序存在的安全缺陷，还可以在应用于嵌入式设备的目标固件中的二进制程序分析时，避免由于污点源到汇聚点路径距离远、分析难度大而导致的数据依赖关系恢复不准确和不全面的问题。
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Figure CN116956285B_ABST
Abstract
The present application provides a kind of stain source identification method, stain source identification device, electronic equipment and medium.The method comprises: the similarity of the behavior feature vector corresponding to each function in target firmware respectively and target feature matrix is calculated, the similarity score of each function is determined, the behavior feature vector corresponding to each function respectively is determined based on binary program in the target firmware, and the target feature matrix is constructed based on the behavior feature vector corresponding to memory operation function;Based on the similarity score of each function, determine the target function as the stain source, and the target function is used for carrying out stain analysis.The stain source identification method provided by the present application can determine the stain source in the self-defined function of the binary program in the target firmware, and carry out stain analysis, which effectively discovers the security defects existing in binary program.
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Citation Information
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