Device and method for measuring beam outgoing time of X-ray machine

Abstract

The invention discloses a device and a method for measuring the beam outgoing time of an X-ray machine, and relates to the field of equipment testing, and the device comprises a signal sampling part, a signal processing part and a timer, the signal sampling part is used for detecting a main loop signal of the X-ray machine in real time; and the signal processing part is used for judging whether the main loop signal is greater than a set threshold value in real time, if so, controlling the timer to start timing, and if not, controlling the timer to stop timing so as to obtain the beam emitting time of the X-ray machine. By automatically controlling the timer to start and stop timing, the action of manually pinching a stopwatch is replaced, it is guaranteed that the timing part and the beam outgoing moment are electrically and synchronously conducted, the starting mode of the to-be-tested X-ray machine and the pressing reaction synchronization problem of an operator do not need to be concerned, synchronous beam outgoing measurement of the to-be-tested X-ray machine can be automatically achieved, and the measurement accuracy is improved. And the measurement efficiency and precision of the beam-out time are improved.

Description

Technical Field

[0001] The present application relates to the field of equipment testing, and in particular to an apparatus and method for measuring the beam emission time of an X-ray machine. Background Art

[0002] To ensure that X-ray machines operate within specified parameters and avoid failures that could lead to unqualified inspections and energy waste, X-ray machines must be calibrated before commissioning or after a certain period of use. The two primary parameters for X-ray machine inspections are KV and beam time. Once the required KV is determined, beam time accuracy is crucial for ensuring good inspection results, making beam time calibration crucial.

[0003] In the past, the method for measuring the beam time of an X-ray machine was that the operator manually activated the X-ray machine's beam start button and started a stopwatch at the same time. This measurement method is inefficient and can cause errors due to many factors, such as operator synchronization, whether the X-ray machine to be measured is pressed or popped up, and some X-ray machines only emit beams after the start button is pressed and a sound reminder is heard. Summary of the Invention

[0004] The purpose of this application is to provide an X-ray machine beam time measurement device and method, which can improve the measurement efficiency and accuracy of the X-ray machine beam time.

[0005] To achieve the above objectives, this application provides the following solutions:

[0006] In a first aspect, the present application provides an X-ray machine beam time measurement device, comprising: a signal sampling component, a signal processing component, and a timer;

[0007] The signal sampling component is used to detect the main circuit signal of the X-ray machine in real time;

[0008] The signal processing component is used to determine in real time whether the main loop signal is greater than a set threshold. If so, the timer is controlled to start timing; if not, the timer is controlled to stop timing to obtain the beam emission time of the X-ray machine.

[0009] Optionally, the main circuit signal is a current signal; the signal sampling component is a current transformer; and the main circuit of the X-ray machine passes through the current transformer.

[0010] Optionally, the signal processing component includes a current sampling circuit and a comparator; the current sampling circuit is used to collect the current signal output by the current transformer; the comparator is used to compare the current signal with a set threshold value. If the current signal is greater than the set threshold value, a high level is output to control the timer to start timing; if not, a low level is output to control the timer to stop timing.

[0011] Optionally, the set threshold is 0.1A.

[0012] Optionally, the main loop signal is a radiation signal; the signal sampling component is a radiation sensor; and the main loop of the X-ray machine passes through the radiation sensor.

[0013] Optionally, the device further comprises a human-computer interaction interface; the human-computer interaction interface is used to display the value of the timer in real time.

[0014] Optionally, the X-ray machine beam time measuring device also includes an input connector and an output connector; the input connector is connected to the output connector, and the signal sampling component is arranged between the input connector and the output connector; the controller of the X-ray machine is connected to the input connector, and the generator of the X-ray machine is connected to the output connector.

[0015] In a second aspect, the present application provides a method for measuring the beam emission time of an X-ray machine, comprising:

[0016] The main circuit signal of the X-ray machine is detected in real time through the signal sampling component;

[0017] The signal processing component is used to determine in real time whether the main loop signal is greater than a set threshold. If so, the timer is controlled to start timing; if not, the timer is controlled to stop timing to obtain the beam emission time of the X-ray machine.

[0018] Optionally, the main circuit signal is a current signal; the signal sampling component is a current transformer; and the main circuit of the X-ray machine passes through the current transformer.

[0019] Optionally, the main loop signal is a radiation signal; the signal sampling component is a radiation sensor; and the main loop of the X-ray machine passes through the radiation sensor.

[0020] According to the specific embodiments provided in this application, this application has the following technical effects:

[0021] The present application provides an X-ray machine beam emission time measurement device and method, which detects the main circuit signal of the X-ray machine in real time, and automatically controls the timer to start timing when the main circuit signal is greater than a set threshold value, and automatically controls the timer to stop timing when the main circuit signal is less than or equal to the set threshold value, thereby replacing the manual stopwatch action, ensuring that the timing part is electrically synchronized with the beam emission moment, and there is no need to worry about the startup method of the X-ray machine to be tested and the synchronization problem of the operator's pressing reaction. It can automatically achieve synchronized beam emission measurement with the X-ray machine to be tested, ensuring the accuracy of the test and improving the efficiency of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0023] Figure 1 Schematic diagram of the conventional X-ray machine beam time measurement method;

[0024] Figure 2 A schematic diagram of an X-ray machine beam time measurement device provided in one embodiment of the present application;

[0025] Figure 3 A schematic diagram of the connection relationship of an X-ray machine beam time measurement device provided in one embodiment of the present application;

[0026] Figure 4 A schematic diagram of the measurement process of an X-ray machine beam time measurement device provided in one embodiment of the present application;

[0027] Figure 5 This is a flow chart of a method for measuring the beam emission time of an X-ray machine provided in one embodiment of the present application. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0029] Previous X-ray machine beam time measurement methods such as Figure 1 As shown, specifically: the operator holds a stopwatch in one hand and presses the timing start button, and presses the beam start button on the controller of the X-ray machine with the other hand, and presses the start button with both hands at the same time, and observes the controller of the X-ray machine at all times. When the controller of the X-ray machine shows that the beam is finished, the operator presses the stopwatch button, records the time when the stopwatch stops, and then compares it with the set beam time for calibration. This measurement method has low efficiency and accuracy.

[0030] The present application uses a device that can sense electrical signals or radiation signals. When the beam-emitting button of the X-ray machine is pressed, the device senses the current signal or radiation signal, automatically starts timing, and automatically stops after the end, thereby realizing automatic and accurate measurement of the beam-emitting time. The application can be applied to the field of testing and evaluation of non-destructive testing instruments for special equipment.

[0031] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0032] In an exemplary embodiment, Figure 2 As shown, an X-ray machine beam time measuring device is provided, including: a signal sampling component 201, a signal processing component 202 and a timer 203.

[0033] The signal processing component 202 is connected to the signal sampling component 201 and the timer 203 respectively.

[0034] The signal sampling component 201 is used to detect the main circuit signal of the X-ray machine in real time.

[0035] The signal processing component 202 is used to determine in real time whether the main loop signal is greater than a set threshold. If so, it controls the timer 203 to start timing. If not, it controls the timer 203 to stop timing to obtain the beam emission time of the X-ray machine. When the timer 203 stops timing, the last timed value is the measured beam emission time.

[0036] In a specific application example, the main circuit signal is a current signal. Figure 3 As shown, the signal sampling component 201 is a current transformer 301 . The main circuit (positive or negative) of the X-ray machine passes through the current transformer 301 .

[0037] The signal processing component 202 includes a current sampling circuit 302 and a comparator 303 .

[0038] The current sampling circuit 302 is used to collect the current signal output by the current transformer 301 .

[0039] The comparator 303 is used to compare the current signal with a set threshold value. If the current signal is greater than the set threshold value, the comparator 303 outputs a high level to control the timer 203 to start timing. If not, the comparator 303 outputs a low level to control the timer 203 to stop timing. The set threshold value is 0.1A. The specific measurement process is as follows: Figure 4 shown.

[0040] In another specific application example, the main loop signal is a radiation signal, the signal sampling component 201 is a radiation sensor, and the main loop (positive or negative) of the X-ray machine passes through the radiation sensor.

[0041] In an exemplary embodiment, the device further includes a human-computer interaction interface 204. The human-computer interaction interface 204 is in communication with the timer 203. The human-computer interaction interface 204 is configured to display the value of the timer 203 in real time. The human-computer interaction interface 204 may be a computer.

[0042] In addition, the operator can also manually control the start and stop of the timer 203 through the human-machine interaction interface 204 .

[0043] In an exemplary embodiment, Figure 3 As shown, the X-ray machine beam time measuring device further includes an input connector 304 and an output connector 305 .

[0044] The input connector 304 is connected to the output connector 305 , and the signal sampling component 201 is disposed between the input connector 304 and the output connector 305 .

[0045] The controller of the X-ray machine is connected to the input connector 304 , and the generator of the X-ray machine is connected to the output connector 305 .

[0046] In addition, the present application can also store the beam emission time obtained from each detection before the X-ray machine is put into use and during use through a memory.

[0047] The operation process of the X-ray machine beam emission time measurement device provided in the present application is: connect the controller of the X-ray machine to be tested to the input connector 304, and connect the X-ray generator to be tested to the output connector 305. After the connection is complete, power on the machine. The personnel only needs to operate the beam emission button of the X-ray machine to be tested normally, wait for the controller of the X-ray machine to stop emitting beams, and the timer 203 synchronization test is completed.

[0048] This application receives the X-ray machine's main circuit signal via a current transformer 301 or a radiation sensor, and automatically generates a start or stop signal for timer 203 based on the main circuit signal, replacing the manual stopwatch action. Specifically, after determining that the current signal or radiation signal on the X-ray machine's main circuit is greater than a certain value, timer 203 is started for synchronous timing, ensuring electrical synchronization between the timing portion and the beam emission moment. Once the current signal or radiation signal falls below a certain value, timer 203 is stopped, and the measurement result is the result of timer 203 at the time of stopping. This solves the problem of errors caused by external factors in measurement in existing technical methods, while also improving work efficiency.

[0049] Based on the same inventive concept, Figure 5 As shown, an embodiment of the present application further provides a method for measuring the beam emission time of an X-ray machine, including the following steps 501 and 502.

[0050] Step 501: Detect the main circuit signal of the X-ray machine in real time through a signal sampling component.

[0051] Step 502: The signal processing component determines in real time whether the main loop signal is greater than a set threshold. If so, the timer is controlled to start timing; if not, the timer is controlled to stop timing to obtain the beam emission time of the X-ray machine.

[0052] This application does not need to worry about the startup method of the X-ray machine to be tested and the synchronization problem of the operator's press response. It can automatically realize the synchronous beam measurement with the X-ray machine to be tested, ensure the accuracy of the test, and improve the efficiency of the test process. At the same time, the expansion of the human-machine interface or computer part is more conducive to the realization of automatic recording and comparison.

[0053] In this application, all actions to obtain signals, information or data are carried out in compliance with the relevant data protection laws and policies of the country where they are located and with the authorization given by the owner of the corresponding device.

[0054] The technical features of the above embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0055] This document uses specific examples to illustrate the principles and implementation methods of this application. The description of the above examples is only intended to help understand the method and core concept of this application. At the same time, for those skilled in the art, based on the concept of this application, there may be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting this application.

Claims

1. An X-ray machine beam time measuring device, characterized in that: The device comprises: a signal sampling component, a signal processing component and a timer; The signal sampling component is used to detect the main circuit signal of the X-ray machine in real time; The signal processing component is used to determine in real time whether the main loop signal is greater than a set threshold. If so, the timer is controlled to start timing; if not, the timer is controlled to stop timing to obtain the beam emission time of the X-ray machine.

2. The X-ray machine beam time measuring device according to claim 1, characterized in that: The main circuit signal is a current signal; the signal sampling component is a current transformer; the main circuit of the X-ray machine passes through the current transformer.

3. The X-ray machine beam time measuring device according to claim 2, characterized in that: The signal processing component includes a current sampling circuit and a comparator; The current sampling circuit is used to collect the current signal output by the current transformer; The comparator is used to compare the current signal with a set threshold value. If the current signal is greater than the set threshold value, the comparator outputs a high level to control the timer to start timing; if not, the comparator outputs a low level to control the timer to stop timing.

4. The X-ray machine beam time measuring device according to claim 2, characterized in that: The set threshold is 0.1A.

5. The X-ray machine beam time measuring device according to claim 1, characterized in that: The main loop signal is a radiation signal; the signal sampling component is a radiation sensor; the main loop of the X-ray machine passes through the radiation sensor.

6. The X-ray machine beam time measuring device according to claim 1, characterized in that: The device also includes a human-computer interaction interface; the human-computer interaction interface is used to display the value of the timer in real time.

7. The X-ray machine beam time measuring device according to claim 1, characterized in that: The X-ray machine beam time measuring device further comprises an input connector and an output connector; The input connector is connected to the output connector, and the signal sampling component is arranged between the input connector and the output connector; The controller of the X-ray machine is connected to the input connector, and the generator of the X-ray machine is connected to the output connector.

8. A method for measuring the beam emission time of an X-ray machine, characterized in that: The method comprises: The main circuit signal of the X-ray machine is detected in real time through the signal sampling component; The signal processing component is used to determine in real time whether the main loop signal is greater than a set threshold. If so, the timer is controlled to start timing; if not, the timer is controlled to stop timing to obtain the beam emission time of the X-ray machine.

9. The method for measuring the beam emission time of an X-ray machine according to claim 8, wherein: The main circuit signal is a current signal; the signal sampling component is a current transformer; the main circuit of the X-ray machine passes through the current transformer.

10. The method for measuring the beam emission time of an X-ray machine according to claim 8, wherein: The main loop signal is a radiation signal; the signal sampling component is a radiation sensor; the main loop of the X-ray machine passes through the radiation sensor.

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