Automatic test tool for nanocrystal relay

Abstract

The application discloses an automatic test tool for nanocrystal relays and relates to the technical field of relay detection.The application comprises a fixing frame, two first conveying rollers rotatably installed on the fixing frame and a first conveying belt arranged around the fixing frame; and a mounting frame mounted on the top of the fixing frame.The application is characterized in that the mounting block and the conductive part are cooperatively designed, the relay to be detected can be moved to the position below the second conveying belt through the mounting block when the first conveying belt rotates, at this time, the single set of conductive parts on the second conveying belt can be in contact with the single set of conductive blocks of the mounting block, so that the circuit conduction between the relay and the test device can be realized, the first conveying roller and the second conveying roller are synchronously driven to rotate, the movement of the relay can be realized, the relay is detected during the movement, compared with the prior art, the device structure of the application is simple, the production cost can be reduced, the maintenance is facilitated, the relay can be continuously detected through the application, and the detection efficiency of the relay can be improved.

Description

Technical Field

[0001] This invention relates to the field of relay testing technology, and specifically to an automated testing fixture for nanocrystalline relays. Background Technology

[0002] A relay is a commonly used electronic control device. Essentially, a relay is an "automatic switch" that uses a smaller current to control a larger current, preventing users from directly controlling large currents and thus avoiding the risk of electric shock. It can perform functions such as automatic adjustment, safety protection, or circuit switching, and is therefore widely used in various machines and equipment. The weight of a relay mainly depends on the efficiency of its magnetic material, i.e., how much electromagnetic force a unit weight of magnetic material can provide. For the same weight, a larger electromagnetic force significantly improves vibration resistance, surge current resistance, and response speed. Therefore, using high-permeability materials to transmit larger magnetic flux through a smaller cross-section is the most effective way to achieve high-performance, high-reliability, and lightweight design. Nanocrystalline materials have extremely low hysteresis and eddy current losses and maintain high permeability in the kHz to MHz high-frequency range, making them suitable for high-frequency switching applications. With the rapid development of 5G, new energy, and other fields, nanocrystalline relays will become a key component of high-precision power electronic systems.

[0003] Nanocrystalline relays typically require connection to a load for power-on testing during production. This process involves moving the relay from the production line to the testing station, driving the testing probe until it contacts the relay pins, and finally testing the relay using a testing device. However, this method has the following drawbacks in practical use: 1. The above process often requires multiple drive sources, resulting in a high automation threshold and high production and maintenance costs; 2. Relay loading and unloading occur after the testing probe has moved, which can affect the relay testing efficiency. To address these issues, this invention proposes an automated testing fixture for nanocrystalline relays. Summary of the Invention

[0004] The purpose of this invention is to provide an automatic testing fixture for nanocrystalline relays in order to solve the technical problems mentioned in the background.

[0005] To achieve the above objectives, the present invention specifically adopts the following technical solution:

[0006] The automated testing fixture for nanocrystalline relays includes:

[0007] A fixed frame on which two first conveyor rollers are rotatably mounted and around which a first conveyor belt is wound;

[0008] The mounting frame is installed on the top of the fixed frame. The mounting frame is provided with two second conveyor rollers, which rotate in the opposite direction to the first conveyor rollers. A second conveyor belt parallel to the first conveyor belt is wound around the two rollers.

[0009] An annular groove is formed on the outside of the first conveyor roller and the second conveyor roller. Multiple mounting blocks are distributed at intervals on the first conveyor belt. Each mounting block is constructed with a positioning groove. A set of conductive blocks is provided on the mounting block, and one end of the conductive block passes through the positioning groove and is connected to a conductive sheet. Several sets of conductive components are distributed on the second conveyor belt. The number of conductive components and conductive blocks in a single set is the same, and the two are in contact with each other and overlap.

[0010] The testing device is mounted on a fixed frame, and the conductive block can be electrically connected to the testing device through conductive components.

[0011] Furthermore, the conductive component includes a stop post, and first mounting plates are provided on both the inner and outer sides of the second transmission belt. One of the first mounting plates is provided with a plurality of first connecting blocks that penetrate the second transmission belt and is connected to another first mounting plate through the first connecting blocks. A sliding groove is provided in the first connecting block. The stop post is slidably installed in the sliding groove, and its end penetrates the other first mounting plate and abuts against the conductive block. A compression spring is provided in the sliding groove, and an annular plate is provided on the outer side of the stop post. The compression spring abuts against the annular plate.

[0012] Furthermore, the end of the abutment is constructed with a spherical abutment block.

[0013] Furthermore, an arc-shaped groove is formed on the top of the conductive block, and the groove opening is constructed with an arc surface.

[0014] Furthermore, a plate is connected to the mounting frame, and its two ends are respectively accommodated by the annular groove on the outer side of the second conveying roller. Multiple strip grooves are linearly distributed at the bottom of the plate, and each of them is connected to a conductive strip. The conductive strips are electrically connected to the testing device, and the end of the abutment is movably connected to the conductive strip.

[0015] Furthermore, a conductive post is rotatably mounted at the end of the abutment post, and both ends of the conductive strip are constructed with arc-shaped surfaces, with the conductive post and the conductive strip rollingly overlapping.

[0016] Furthermore, the conductive strip is made of graphene.

[0017] Furthermore, the abutment includes a first rod and a second rod, with a conductive post mounted on the second rod. The first rod has an internal air chamber, and the end of the second rod slides through the air chamber, with a piston post connected thereto that cooperates with the piston in the air chamber.

[0018] Furthermore, a first gear is rotatably mounted on the fixed frame, and a second gear meshing with one of the first conveying rollers is connected to the end of one of the first conveying rollers. The second gear is connected to one of the second conveying rollers via a chain drive mechanism.

[0019] Furthermore, the bottom of the mounting block is constructed with a plurality of second connecting blocks, the ends of which all penetrate the first conveyor belt and are connected to each other through a second mounting plate. A horizontal plate is connected to the fixing frame, which movably overlaps with the inner top side of the first conveyor belt, and a movable groove for the passage of the second mounting plate is provided on the horizontal plate. A connecting plate is connected to the mounting block, and is wider than the movable groove. A conductive block is disposed on the connecting plate.

[0020] The beneficial effects of this invention are as follows:

[0021] This invention employs a design that combines mounting blocks and conductive components. When the first conveyor belt rotates, the mounting block moves the relay to be tested below the second conveyor belt. At this point, a single set of conductive components on the second conveyor belt contacts a single set of conductive blocks on the mounting block, thus enabling circuit connection between the relay and the testing device. This invention only requires driving the first and second conveyor rollers to rotate synchronously to move the relay and perform testing during the movement. Compared to existing technologies, this invention has a simpler structure, reducing production costs and facilitating maintenance. Furthermore, this invention allows for non-stop testing of the relay, improving testing efficiency. Attached Figure Description

[0022] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0023] Figure 2 This is a three-dimensional structural diagram of the present invention from another angle;

[0024] Figure 3 This is the present invention. Figure 2 A partial sectional side view of the structure;

[0025] Figure 4 This is the present invention. Figure 3 Enlarged view of point A;

[0026] Figure 5 This is a partial structural cross-sectional view of the fixing frame of the present invention;

[0027] Figure 6 This is the present invention. Figure 5 Enlarged view of point B;

[0028] Figure 7 This is a partial structural cross-sectional view of the mounting bracket of the present invention;

[0029] Figure 8 This is a partial sectional bottom view of the mounting bracket of the present invention;

[0030] Reference numerals: 1. Fixing frame; 2. First conveyor roller; 3. First conveyor belt; 4. Mounting frame; 5. Second conveyor roller; 6. Second conveyor belt; 7. Annular groove; 8. Mounting block; 9. Positioning groove; 10. Conductive block; 11. Conductive sheet; 12. Conductive component; 1201. Support column; 12011. First rod; 12012. Second rod; 12013. Air chamber; 12014. Piston column; 1202. First mounting plate; 1203. First connecting block; 1 204. Sliding groove; 1205. Compression spring; 1206. Annular plate; 13. Testing device; 14. Spherical stop block; 15. Arc groove; 16. Arc surface; 17. Plate body; 18. Strip groove; 19. Conductive strip; 20. Conductive column; 21. Arc surface; 22. First gear; 23. Second gear; 24. Chain drive mechanism; 2401. Chain; 2402. Sprocket; 25. Second connecting block; 26. Second mounting plate; 27. Horizontal plate; 28. Movable groove. Detailed Implementation

[0031] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings.

[0032] like Figures 1-8 As shown, an automatic testing fixture for nanocrystalline relays proposed in one embodiment of the present invention includes:

[0033] The fixed frame 1 has two first conveyor rollers 2 rotatably mounted on it, and a first conveyor belt 3 is wound around it. The structure here is similar to the existing conveyor belt conveyor mechanism.

[0034] Mounting frame 4 is mounted on top of fixed frame 1. Mounting frame 4 is provided with two second conveying rollers 5. The second conveying rollers 5 are rotatably mounted on mounting frame 4. The outer diameters of the first conveying roller 2 and the second conveying rollers 5 are equal. However, the distance between the two second conveying rollers 5 is smaller than the distance between the two first conveying rollers 2, and the rotation direction is opposite to that of the first conveying rollers 2. A second conveying belt 6 parallel to the first conveying belt 3 is wound around the two rollers. The second conveying belt 6 is located on top of the first conveying belt 3. When the first conveying rollers 2 and the second conveying rollers 5 rotate, the top of the first conveying belt 3 and the bottom of the second conveying belt 6 move in the same direction. Here, both the first conveying rollers 2 and the second conveying rollers 5 can be driven by a motor.

[0035] An annular groove 7 is formed on the outer side of the first conveyor roller 2 and the second conveyor roller 5, with the annular groove 7 located in the middle of the two. Multiple mounting blocks 8 are spaced apart on the first conveyor belt 3. Each mounting block 8 has a positioning groove 9. A set of conductive blocks 10 is provided on each mounting block 8. The conductive blocks 10 are at the same height, and one end of each conductive block 10 passes through the positioning groove 9 and is connected to a conductive sheet 11. The conductive blocks 10 and conductive sheets 11 are made of copper-nickel alloy. When the relay is movably inserted into the positioning groove 9, the multiple conductive sheets 11 respectively contact the multiple pins of the relay, thereby facilitating the movement of the multiple pins on the relay. The second conveyor belt 6... Several sets of conductive elements 12 are distributed on the upper part. The spacing between each set of conductive elements 12 is the same as the spacing between adjacent mounting blocks 8. When the first conveying roller 2 and the second conveying roller 5 rotate at the same speed, the single set of conductive elements 12 that rotates to the bottom of the second conveyor belt 6 can correspond to the mounting block 8 at the top of the first conveyor belt 3. The number of single sets of conductive elements 12 and conductive blocks 10 is the same, and the two are in contact with each other. At this time, the current can flow between the conductive elements 12 and the conductive blocks 10. When the single set of conductive elements 12 at the bottom of the second conveyor belt 6 rotates to the top of the second conveyor belt 6 through the second conveying roller 5, the conductive elements 12 and the conductive blocks 10 are separated.

[0036] It should be specifically noted here that when the first conveyor belt 3 and the second conveyor belt 6 move, the mounting block 8 and the conductive component 12 can pass through the first conveying roller 2 and the second conveying roller 5 via the annular groove 7.

[0037] The testing device 13 includes a digital multimeter, an LCR meter, a high-speed data acquisition card, an oscilloscope, a timer, a micro-ohmmeter, a high-resistance meter, a withstand voltage tester, etc., and is mounted on a fixed frame 1. The conductive block 10 can be electrically connected to the testing device 13 through the conductive component 12. That is, when it moves to the mounting block 8 below the second conveyor belt 6, the pins of the relay on it are electrically connected to the conductive component 12 and the testing device 13 through the conductive sheet 11, the conductive block 10, and the conductive component 12, so that it can be tested by the testing device 13.

[0038] This invention employs a design that combines mounting block 8 and conductive element 12. When the first conveyor belt 3 rotates, the relay to be tested can be moved below the second conveyor belt 6 via mounting block 8. At this time, a single set of conductive elements 12 on the second conveyor belt 6 can contact a single set of conductive blocks 10 on mounting block 8, thereby enabling circuit connection between the relay and the testing device 13. This invention only requires driving the first conveyor roller 2 and the second conveyor roller 5 to rotate synchronously to move the relay and test it during the movement. Compared with the prior art, the device structure of this invention is simple, which not only reduces production costs but also facilitates maintenance. Furthermore, this invention allows for non-stop testing of the relay, improving the testing efficiency of the relay.

[0039] like Figure 3 and Figure 4The specific structure of the conductive element 12 of the present invention is disclosed. The conductive element 12 includes a stop post 1201, which is made of copper-nickel alloy. First mounting plates 1202 are provided on both the inner and outer sides of the second conveyor belt 6. One of the first mounting plates 1202 has multiple first connecting blocks 1203 that penetrate the second conveyor belt 6 and are connected to the other first mounting plate 1202 through the first connecting blocks 1203. When the second conveyor belt 6 moves, it can drive the first mounting plates 1202 and the first connecting blocks 1203 to move. A sliding groove 1204 is constructed inside the first connecting block 1203, extending along the length direction of the first connecting block 1203. The abutment 1201 is slidably installed in the sliding groove 1204, and its end passes through another first mounting plate 1202 and abuts against the conductive block 10. A compression spring 1205 is provided in the sliding groove 1204, and an annular plate 1206 is constructed on the outside of the abutment 1201. The compression spring 1205 abuts against the annular plate 1206. The compression spring 1205 is used to provide a thrust that forces the abutment 1201 to extend out of the sliding groove 1204. When the mounting block 8 moves towards the lower part of the second conveyor belt 6, the extended end of the abutment 1201 will contact the conductive block 10. At this time, there is an angle between the axis of the abutment 1201 and the first conveyor belt 3. As the first mounting plate 1202 continues to move, such as Figure 4 As shown, the axis of the abutment 1201 will gradually become perpendicular to the first conveyor belt 3. At this time, the abutment 1201 will slide on the surface of the conductive block 10 and retract into the sliding groove 1204 under the contact of the conductive block 10. This ensures that the abutment 1201 and the conductive block 10 are always in close contact. Even if the two vibrate or deviate in position due to movement, the gap can be automatically compensated to avoid poor contact.

[0040] like Figure 4 As shown, the present invention discloses a further technical solution for the abutment 1201. The abutment 1201 has a spherical abutment block 14 at its end. This design allows the abutment 1201 to move smoothly on the surface of the conductive block 10, which can greatly reduce wear during sliding friction and extend the service life of the conductive block 10.

[0041] like Figure 4 and Figure 6 As shown, a further technical solution for the conductive block 10 of the present invention is disclosed. The top of the conductive block 10 is provided with an arc-shaped groove 15, which is similar in shape to a waist hole. When the spherical abutment 14 contacts the conductive block 10, it will enter the arc-shaped groove 15. At this time, the periphery of the spherical abutment 14 contacts the groove wall of the arc-shaped groove 15, thereby increasing the contact area between the two and facilitating the passage of current. During the process of the abutment 1201 retracting the sliding groove 1204, the spherical abutment 14 will slide in the arc-shaped groove 15. The groove opening of the arc-shaped groove 15 is constructed with an arc surface 16. The design of the arc surface 16 facilitates the spherical abutment 14 to enter or leave the arc-shaped groove 15.

[0042] like Figure 3 , Figure 4 , Figure 7 and Figure 8 As shown, the present invention discloses a further technical solution for how the testing device 13 and the abutment 1201 are connected. A plate 17 is connected to the mounting frame 4. The plate 17 is located inside the second conveyor belt 6 ring. Its two ends are respectively accommodated by the outer annular groove 7 of the second conveyor roller 5. The plate 17 is close to the inner bottom surface of the second conveyor belt 6. Multiple strip grooves 18 are linearly distributed at the bottom of the plate 17. The axis of the second conveyor roller 5 is perpendicular to the axis of the strip grooves 18, and each of them is connected to a conductive strip 19. The conductive strips 19 are electrically connected to the testing device 13. The end of the abutment 1201 is movably connected to the conductive strip 19. That is, the testing device 13 is electrically connected to the relay in sequence through the conductive strip 19, the abutment 1201, the conductive block 10, and the conductive sheet 11.

[0043] Specifically, during the rotation of the second conveyor belt 6, only one set of conductive elements 12 will contact the conductive strip 19 at any given time, so that a test device 13 can sequentially test multiple relays by alternating sets of conductive elements 12, thereby further reducing equipment costs.

[0044] like Figure 4 and Figure 8 As shown, a further technical solution of the abutment column 1201 of the present invention is disclosed. A conductive column 20 is rotatably installed at the end of the abutment column 1201. The conductive column 20 is made of the same material as the abutment column 1201, and its axis is parallel to the axis of the second conveying roller 5. Both ends of the conductive strip 19 are constructed with arc-shaped surfaces 21. The conductive column 20 and the conductive strip 19 roll and overlap. The design of the arc-shaped surface 21 facilitates the transition of the conductive column 20. This design can effectively reduce the sliding wear between the conductive strip 19 and the conductive column 20 and extend their service life.

[0045] like Figure 8 As shown, the conductive strip 19 of the present invention is further disclosed. The conductive strip 19 is made of graphene material, and the circuit is made by the rolling overlap of graphene and conductive post 20. It has the following significant advantages:

[0046] 1. Lower coefficient of friction

[0047] Graphene itself has certain lubricating properties. Due to its layered structure, it can reduce friction. Compared with the contact between copper-nickel alloys, the friction coefficient between copper-nickel alloys and graphene is lower, which can further reduce wear and extend service life.

[0048] 2. Excellent electrical conductivity

[0049] Graphene has a much higher electron mobility than copper-nickel alloy, which ensures efficient charge transfer even when the conductive pillar 20 and the conductive strip 19 are in rolling contact.

[0050] like Figure 3 and Figure 4 The specific structure of the abutment 1201 of the present invention is disclosed. The abutment 1201 includes a first rod 12011 and a second rod 12012. A conductive post 20 is installed on the second rod 12012. An annular plate 1206 is located outside the first rod 12011, that is, the first rod 12011 is slidably engaged with the sliding groove 1204. An air chamber 12013 is constructed inside the first rod 12011, and compressed gas is contained in the air chamber 12013. The end of the second rod 12012 slides through the air chamber 12013, and a piston rod 12014 is connected thereto, which engages with the piston of the air chamber 12013. The compressed gas can drive the piston rod 12014 to move, so that the second rod 12012 can extend out of the first rod 12012. Regarding rod 12011, it should be specifically noted that the maximum extension length of the second rod 12012 is much smaller than the sliding distance of the first rod 12011. When the conductive post 20 abuts against the conductive strip 19, the second rod 12012 will retract into the first rod 12011 and compress the gas. This structure is similar to an air spring. Under long-term use, the conductive strip 19 and the conductive post 20 will inevitably wear. By adopting this design, when wear occurs, the compressed gas can push the piston rod 12014 to move, thereby driving the second rod 12012 to extend out of the first rod 12011, thus automatically compensating for the gap between the conductive strip 19 and the conductive post 20.

[0051] like Figure 1 and Figure 2 As shown, a further technical solution for the linkage of the first conveyor belt 3 and the second conveyor belt 6 is disclosed. A first gear 22 is rotatably mounted on the fixed frame 1. A second gear 23 meshes with the end of one of the first conveyor rollers 2. The second gear 23 and one of the second conveyor rollers 5 are connected by a chain drive mechanism 24. The chain drive mechanism 24 includes two sprockets 2402 connected by chains 2401. With this design, when the first conveyor roller 2 is driven to rotate forward, the second gear 23 can drive the first gear 22 to rotate in the opposite direction, and the chain drive mechanism 24 can drive the second conveyor roller 5 to rotate in the opposite direction. This allows the first conveyor roller 2 and the second conveyor roller 5 to be linked, further reducing production costs. It should be specifically noted that, in order to improve the transmission accuracy of the first conveyor belt 3 and the second conveyor belt 6, both first conveyor rollers 2 and both second conveyor rollers 5 can be connected by the chain drive mechanism 24.

[0052] like Figure 3 and Figure 7As shown, a further technical solution for improving the motion stability of the first conveyor belt 3 is disclosed. The bottom of the mounting block 8 has multiple second connecting blocks 25, the ends of which all penetrate the first conveyor belt 3 and are connected by a second mounting plate 26. The mounting block 8 is fixed to the first conveyor belt 3 via the second connecting blocks 25 and the second mounting plate 26. When the first conveyor belt 3 rotates, the second mounting plate 26 can pass through the annular groove 7 and the first conveying roller 2. A horizontal plate 27 is connected to the fixing frame 1, which movably overlaps with the inner top side of the first conveyor belt 3. The length and width of the horizontal plate 27 are both greater than the plate body 17, and the horizontal plate 27 has openings for passage... The second mounting plate 26 passes through the movable groove 28 of the second mounting plate 26, that is, when the first conveyor belt 3 rotates, the second mounting plate 26 on it can pass through the movable groove 28 and pass through the horizontal plate 27. The mounting block 8 is connected to the connecting plate 29, which is wider than the movable groove 28. The conductive block 10 is disposed on the connecting plate 29. By adopting the design of the horizontal plate 27, after the abutment 1201 abuts against the conductive block 10 on the connecting plate 29, the horizontal plate 27 can support the first conveyor belt 3, so that the first conveyor belt 3 is not easily deformed under the pressure of the connecting plate 29. That is, the first conveyor belt 3 is not easily shaken during the movement, and the conductive block 10 and the spherical abutment 14 are not easily worn.

[0053] The above description of the disclosed embodiments enables those skilled in the art to make or use the invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Therefore, the invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. An automatic testing fixture for nanocrystalline relays, characterized in that, include: A fixed frame (1) is rotatably mounted on which two first conveyor rollers (2) are circumferentially mounted and a first conveyor belt (3) is wound around them. Mounting frame (4) is installed on top of fixed frame (1). The mounting frame (4) is provided with two second conveying rollers (5) and the rotation direction is opposite to that of the first conveying roller (2). A second conveying belt (6) parallel to the first conveying belt (3) is wound around the two rollers. An annular groove (7) is opened on the outside of the first conveyor roller (2) and the second conveyor roller (5). Multiple mounting blocks (8) are distributed at intervals on the first conveyor belt (3). Each mounting block (8) is equipped with a positioning groove (9). A set of conductive blocks (10) is provided on the mounting block (8). One end of the conductive block (10) passes through the positioning groove (9) and is connected to a conductive sheet (11). Several sets of conductive components (12) are distributed on the second conveyor belt (6). The number of conductive components (12) and conductive blocks (10) in a single set is the same, and the two are in contact with each other. The test device (13) is mounted on the fixed frame (1), and the conductive block (10) is electrically connected to the test device (13) through the conductive component (12); The conductive component (12) includes a stop post (1201). The second conveyor belt (6) has a first mounting plate (1202) on both its inner and outer sides. One of the first mounting plates (1202) has a plurality of first connecting blocks (1203) that penetrate the second conveyor belt (6) and is connected to another first mounting plate (1202) through the first connecting blocks (1203). The first connecting block (1203) has a sliding groove (1204) inside. The stop post (1201) is slidably installed in the sliding groove (1204) and its end penetrates the other first mounting plate (1202) and abuts against the conductive block (10). The sliding groove (1204) has a compression spring (1205) inside. The outside of the stop post (1201) has an annular plate (1206) and the compression spring (1205) abuts against the annular plate (1206). The mounting frame (4) is connected to a plate (17), both ends of which are respectively accommodated by the annular groove (7) on the outer side of the second conveying roller (5). The bottom of the plate (17) has multiple strip grooves (18) linearly distributed, and each of them is connected to a conductive strip (19). The conductive strips (19) are electrically connected to the testing device (13). The end of the abutment (1201) is movably connected to the conductive strip (19). The end of the abutment (1201) is rotatably mounted with a conductive post (20), and both ends of the conductive strip (19) are constructed with arc-shaped surfaces (21). The conductive post (20) and the conductive strip (19) are rolled and overlapped.

2. The automatic testing fixture for nanocrystalline relays according to claim 1, characterized in that, The end of the abutment (1201) is provided with a spherical abutment block (14).

3. The automatic testing fixture for nanocrystalline relays according to claim 1, characterized in that, The top of the conductive block (10) is provided with an arc-shaped groove (15), and the groove opening of the arc-shaped groove (15) is constructed with an arc surface (16).

4. The automatic testing fixture for the nanocrystalline relay according to claim 1, characterized in that, The conductive strip (19) is made of graphene.

5. The automatic testing fixture for nanocrystalline relays according to claim 1, characterized in that, The abutment (1201) includes a first rod (12011) and a second rod (12012). The conductive post (20) is installed on the second rod (12012). The first rod (12011) has an air chamber (12013) inside. The end of the second rod (12012) slides through the air chamber (12013) and is connected to a piston post (12014) that cooperates with the piston of the air chamber (12013).

6. The automatic testing fixture for the nanocrystalline relay according to claim 1, characterized in that, A first gear (22) is rotatably mounted on the fixed frame (1), and a second gear (23) meshes with the end of one of the first conveying rollers (2). The second gear (23) is connected to one of the second conveying rollers (5) through a chain drive mechanism (24).

7. The automatic testing fixture for nanocrystalline relays according to claim 1, characterized in that, The mounting block (8) has a plurality of second connecting blocks (25) at its bottom. The ends of the plurality of second connecting blocks (25) all pass through the first conveyor belt (3) and are connected to each other through the second mounting plate (26). A horizontal plate (27) is connected to the fixing frame (1). The horizontal plate (27) is movably overlapped with the inner top side of the first conveyor belt (3). The horizontal plate (27) is provided with a movable groove (28) for the passage of the second mounting plate (26). A connecting plate (29) is connected to the mounting block (8) and is wider than the movable groove (28). A conductive block (10) is provided on the connecting plate (29).

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