Automatic calibration device and calibration method for infrared gas analyzer

Abstract

The invention provides an automatic calibration device and calibration method for an infrared gas analyzer, and the calibration device comprises a measurement gas chamber which comprises a first chamber and a second chamber, and nitrogen is packaged in the first chamber and the second chamber; the calibration gas chamber comprises a third chamber and a fourth chamber, nitrogen is packaged in the third chamber, and calibration gas with a proper proportion is packaged in the fourth chamber; in the first state, the first chamber corresponds to the reference chamber, and the second chamber corresponds to the sample chamber; in the second state, the third chamber corresponds to the reference chamber, and the fourth chamber corresponds to the sample chamber. The infrared gas analyzer automatic calibration device and calibration method provided by the invention are used for calibrating the zero end point of the component to be measured, and through the structural arrangement, when the infrared gas analyzer is subjected to zero calibration and range calibration, only nitrogen needs to be prepared on the use site, and range gas does not need to be prepared, so that the calibration efficiency is greatly improved. The problem of emission of flammable and explosive gas or toxic and harmful gas during zero point calibration and range calibration is effectively solved.

Description

Technical Field

[0001] The present invention relates to the technical field of infrared gas analyzer calibration, and in particular to an automatic calibration device and calibration method for an infrared gas analyzer. Background Art

[0002] Infrared gas analyzers are based on the Lambert-Beer absorption law, which states that a gas's absorption of infrared light is proportional to its concentration. When infrared light passes through a chamber containing a specific gas, the gas molecules absorb infrared light of a specific wavelength, causing a change in the energy received by the detector. By measuring this energy change, the gas concentration can be indirectly determined.

[0003] An infrared gas analyzer primarily consists of an infrared radiation source, a light-cutting device, a sample gas chamber, a filter element, and a detector. The sample gas chamber consists of two chambers: a reference chamber and a sample chamber. To ensure measurement accuracy, the infrared gas analyzer requires regular zero and span calibration.

[0004] In the prior art, infrared gas analyzers are primarily calibrated manually, requiring manual switching and evacuation. Furthermore, nitrogen and span gases for various measurement components must be prepared on-site as calibration gases. These endpoints may be high concentrations of flammable and explosive gases, or toxic and hazardous gases. This is a crucial and challenging task for on-site management. Furthermore, the calibration gas is evacuated during zero-point and span calibration of the infrared gas analyzer. Therefore, the calibration gas needs to be replaced regularly. Some calibration gases are very expensive, increasing management costs, and there is no guarantee that the concentration of the calibration gas will be completely consistent each time it is replaced. Summary of the Invention

[0005] The present invention provides an automatic calibration device and calibration method for an infrared gas analyzer, which is used to solve the defect in the prior art that manual calibration requires on-site preparation of nitrogen and span gases of multiple measurement components as calibration gases, which is not only dangerous but also costly. When performing zero point calibration and span calibration, only nitrogen needs to be prepared on-site, and span gas is no longer needed. This effectively solves the problem of emission of flammable and explosive gases and toxic and harmful gases during zero point calibration and span calibration.

[0006] The present invention provides an automatic calibration device for an infrared gas analyzer, which is used for calibrating a sample gas chamber. The sample gas chamber has a reference chamber and a sample chamber, and the reference chamber is filled with reference gas, comprising: The measuring gas chamber comprises a first chamber and a second chamber, wherein the first chamber and the second chamber are both filled with pure nitrogen; A calibration gas chamber, comprising a third chamber and a fourth chamber, wherein the third chamber is filled with pure nitrogen and the fourth chamber is filled with a calibration gas in an appropriate proportion; In a first state, the first chamber corresponds to the reference chamber, and the second chamber corresponds to the sample chamber; In the second state, the third chamber corresponds to the reference chamber, and the fourth chamber corresponds to the sample chamber.

[0007] According to an automatic calibration device for an infrared gas analyzer provided by the present invention, the first state includes a measurement state and a zero point calibration state. In the measurement state, the sample chamber is filled with a sample to be measured; in the zero point calibration state, the sample chamber is filled with pure nitrogen.

[0008] According to the automatic calibration device for an infrared gas analyzer provided by the present invention, the second state is a range calibration state. In the range calibration state, the sample chamber is filled with pure nitrogen.

[0009] An automatic calibration device for an infrared gas analyzer provided according to the present invention further includes a switching device, wherein the switching device is used to switch the automatic calibration device between the first state and the second state.

[0010] According to an automatic calibration device for an infrared gas analyzer provided by the present invention, the switching device includes: A driving motor is provided on the fixed cover, and a core shaft is provided on the fixed cover; A driving gear connected to the driving motor; A calibration gear is engaged with the driving gear; and the calibration gear rotates around the core shaft.

[0011] According to an automatic calibration device for an infrared gas analyzer provided by the present invention, both sides of the first chamber, the second chamber, the third chamber and the fourth chamber are wafers to transmit the infrared beam emitted by the infrared radiation light source of the infrared gas analyzer.

[0012] An automatic calibration device for an infrared gas analyzer provided by the present invention further includes an eccentric positioning device, which is arranged on the fixed cover, and the eccentric positioning device is used to determine and adjust the two extreme positions of the calibration gear.

[0013] According to the present invention, an automatic calibration device for an infrared gas analyzer further includes a guide device, which is arranged on the fixed cover, and the guide device is used to guide when the calibration gear switches positions.

[0014] The present invention also provides an automatic calibration method for an infrared gas analyzer, which utilizes the above-mentioned automatic calibration device for an infrared gas analyzer, comprising: During routine measurement, the sample chamber of the sample gas chamber is filled with the sample to be measured; during zero point calibration, the sample chamber of the sample gas chamber is filled with pure nitrogen; during both routine measurement and zero point calibration, the measuring gas chamber is in the working position; the light beam emitted by the infrared radiation light source passes through the light cutting device, the sample gas chamber, the measuring gas chamber, and the filter element and enters the detector to complete the concentration measurement of the sample and the zero point calibration of the sample; During range calibration, the sample cavity of the sample gas chamber is filled with pure nitrogen, and the light beam emitted by the infrared radiation light source enters the detector through the light cutting device, the sample gas chamber, the calibration gas chamber, and the filter element to complete the range calibration of the sample.

[0015] The automatic calibration method for an infrared gas analyzer provided by the present invention further includes switching one of the measurement gas chamber and the calibration gas chamber to a working position by a switching device.

[0016] The infrared gas analyzer automatic calibration device and calibration method provided by the present invention are used to calibrate a sample gas chamber, the sample gas chamber has a reference chamber and a sample chamber, the reference chamber is filled with reference gas, the automatic calibration device includes a measuring gas chamber and a calibration gas chamber, the measuring gas chamber includes a first chamber and a second chamber, pure nitrogen is encapsulated in the first chamber and the second chamber; the calibration gas chamber includes a third chamber and a fourth chamber, pure nitrogen is encapsulated in the third chamber, and a suitable proportion of calibration gas is encapsulated in the fourth chamber, in a first state, the first chamber corresponds to the reference chamber, and the second chamber corresponds to the sample chamber; in a second state, the third chamber corresponds to the reference chamber, and the fourth chamber corresponds to the sample chamber. Through the above structural setting, when the automatic calibration device is applied, when performing zero point calibration and range calibration on the infrared gas analyzer, only pure nitrogen needs to be prepared at the use site, and span gas no longer needs to be prepared. Therefore, the emission problem of flammable and explosive gases or toxic and harmful gases during zero point calibration and range calibration is effectively solved, management costs are reduced, and consistency during range calibration can be effectively guaranteed.

[0017] Through the automatic calibration device, automatic calibration of the infrared gas analyzer is achieved, the accuracy and stability of the calibration are improved, and automatic control of the infrared gas analyzer is realized, making the calibration process more intelligent and efficient. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the present invention or the prior art, a brief introduction is given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0019] Figure 1 It is a structural schematic diagram of the automatic calibration device for infrared gas analyzer provided by the present invention.

[0020] Figure 2 It is a cross-sectional view of the automatic calibration device for an infrared gas analyzer provided by the present invention.

[0021] Figure 3 This is a schematic diagram comparing the configuration concentration and instrument readings of the infrared gas analyzer C3H8 provided by the present invention.

[0022] Figure 4 This is a schematic diagram comparing the configuration concentration and instrument readings of the infrared gas analyzer provided by the present invention.

[0023] Figure 5 This is a schematic diagram comparing the configuration concentration and instrument readings of the infrared gas analyzer provided by the present invention.

[0024] Reference numerals: 1. Measuring gas chamber; 2. Calibration gas chamber; 3. Switching device; 4. Fixed cover; 31. Drive motor; 32. Core shaft; 33. Drive gear; 34. Calibration gear; 5. Eccentric positioning device; 6. Guide device; 7. Filter element. DETAILED DESCRIPTION

[0025] To make the objectives, technical solutions, and advantages of the present invention more clear, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the embodiments described are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0026] In the description of the embodiments of the present invention, it should be noted that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing the embodiments of the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation, and therefore should not be understood as limiting the embodiments of the present invention. In addition, the terms "first", "second", and "third" are used for descriptive purposes only and should not be understood as indicating or implying relative importance.

[0027] The following combination Figure 1 The automatic calibration device for infrared gas analyzer of the present invention is described.

[0028] The present invention provides an automatic calibration device for an infrared gas analyzer, which is used to calibrate an infrared gas analyzer. The sample gas chamber has a reference chamber and a sample chamber, and the reference chamber is filled with reference gas. The device includes a measuring gas chamber 1 and a calibration gas chamber 2. The measuring gas chamber 1 includes a first chamber and a second chamber, both of which contain pure nitrogen. Nitrogen, as an inert gas, helps reduce background interference and improve measurement accuracy. The calibration gas chamber 2 includes a third chamber and a fourth chamber, with the third chamber containing pure nitrogen and the fourth chamber containing a suitable proportion of calibration gas. In a first state, the first chamber corresponds to the reference chamber, at which point the infrared gas analyzer can measure the absorption characteristics of the reference gas as a calibration benchmark. In the first state, the second chamber corresponds to the sample chamber, and by measuring the current state of the sample chamber, absorption data of the actual gas sample can be obtained. In a second state, the third chamber corresponds to the reference chamber, and the fourth chamber corresponds to the sample chamber.

[0029] In a feasible embodiment of the present invention, the first state includes a measurement state and a zero-point calibration state. In the measurement state, the sample chamber is filled with the sample to be measured; during conventional measurement, the measuring gas chamber 1 is in the working position, and the light beam emitted by the infrared radiation light source passes through the light cutting device, the sample gas chamber, the measuring gas chamber 1, and the filter element into the detector to complete the concentration measurement of the sample.

[0030] In the zero point calibration state, the sample chamber is filled with pure nitrogen, and the light beam emitted by the infrared radiation light source passes through the light cutting device, sample gas chamber, measuring gas chamber, and filter element into the detector to complete the zero point calibration of the sample.

[0031] In one feasible embodiment of the present invention, the second state is a range calibration state. In this state, pure nitrogen gas is introduced into the sample chamber. The infrared radiation light source emits a beam that passes through the light-cutting device, the sample gas chamber, the calibration gas chamber, and the filter element before entering the detector, completing the sample range calibration.

[0032] In one feasible embodiment of the present invention, a switching device 3 and a fixed cover 4 are further included. The switching device 3 is used to switch the automatic calibration device between a first state and a second state. The switching device 3 can generally be an automatic switching device, and its specific structural form is not limited, as long as it can switch the automatic calibration device between the first state and the second state. The fixed cover 4 serves as a fixed support for the entire automatic calibration device.

[0033] More specifically, the switching device 3 includes a drive motor 31, a drive gear 33, and a calibration gear 34. The drive motor 31 is mounted on the fixed cover 4, which is provided with a core shaft 32. The drive gear 33 is connected to the drive motor 31. The calibration gear 34 meshes with the drive gear 33. The calibration gear 34 rotates around the core shaft 32. The measurement chamber 1 and the calibration chamber 2 are mounted on the calibration gear 34, and the measurement chamber 1 and the calibration chamber 2 are arranged side by side. The core shaft 32 secures the calibration gear 34 to the fixed cover 4 and serves as the rotation center of the calibration gear 34. The drive motor 31 drives the drive gear 33 to rotate, and the drive gear 33 meshes with the calibration gear 34, causing the calibration gear 34 to rotate, thereby changing the position of the measurement chamber 1 and the calibration chamber 2. The drive gear 33 is connected to the drive motor 31 and is used to drive the calibration gear 34 to rotate in both forward and reverse directions.

[0034] In one feasible embodiment of the present invention, wafers are positioned on both sides of the first, second, third, and fourth chambers to transmit the infrared beam emitted by the infrared radiation source of the infrared gas analyzer. The first and second chambers are configured to transmit the infrared beam emitted by the infrared radiation source of the infrared gas analyzer. Both the first and second chambers are sealed with pure nitrogen. When the measurement chamber is in the operating position, the two chambers of the measurement chamber 1 align with the reference and sample chambers in the sample chamber, respectively. This allows for measurement and zero-point calibration of the infrared analyzer.

[0035] The third and fourth chambers are sealed with pure nitrogen and sample gas, respectively. When calibration gas chamber 2 is in the operating position, the fourth chamber of calibration gas chamber 2 is aligned with the sample chamber. The infrared radiation source of the infrared gas analyzer emits an infrared beam that passes through the light-cutting device, the sample chamber of the sample gas chamber, and the fourth chamber of calibration gas chamber 2 to enter the detector.

[0036] In a feasible embodiment of the present invention, an eccentric positioning device 5 is further included, which is disposed on the fixed cover 4. The eccentric positioning device 5 is used to determine the two extreme positions of the calibration gear 34, that is, to determine the working positions of the measuring gas chamber 1 and the calibration gas chamber 2. In addition, the eccentric positioning device 5 can fine-tune the position of the calibration gear 34 to ensure that the working positions of the calibration gas chamber 2 and the measuring gas chamber 1 are aligned with the sample gas chamber and detector of the infrared gas analyzer.

[0037] In a feasible embodiment of the present invention, it also includes a guide device 6, which is arranged on the fixed cover 4. The guide device 6 is used to guide when the calibration gear 34 switches its position, ensuring that the calibration gear 34 rotates smoothly, thereby ensuring the accuracy of the working positions of the measuring gas chamber 1 and the calibration gas chamber 2.

[0038] The automatic calibration device for an infrared gas analyzer provided by the present invention not only improves the accuracy and stability of the infrared gas analyzer, but also reduces the need for intervention and improves work efficiency.

[0039] The present invention also provides an automatic calibration method for an infrared gas analyzer, which utilizes the above-mentioned automatic calibration device for an infrared gas analyzer, comprising: During routine measurement, the sample chamber of the sample gas chamber is filled with the sample to be measured; during zero-point calibration, the sample chamber of the sample gas chamber is filled with pure nitrogen; during both routine measurement and zero-point calibration, the measuring gas chamber 1 is in the working position; the light beam emitted by the infrared radiation source passes through the light cutting device, the sample gas chamber, the measuring gas chamber 1, and the filter element 7 and enters the detector to complete the sample concentration measurement and sample concentration calibration; During range calibration, pure nitrogen is introduced into the sample chamber of the sample gas chamber, and the light beam emitted by the infrared radiation light source enters the detector through the light cutting device, the sample gas chamber, the calibration gas chamber 2, and the filter element 7 to complete the range calibration of the sample.

[0040] Furthermore, when switching between zero point calibration and span calibration, the process further includes switching one of the measuring gas chamber 1 and the calibration gas chamber 2 to a working position via the switching device 3 .

[0041] The test scheme of the infrared gas analyzer provided by the present invention is: Debugging the instrument: Operate the drive motor 31 to drive the measuring gas chamber in the automatic calibration device to move it into the optical path, and debug the instrument as a whole. Introduce N2 and full-scale standard gas of each component into the sample gas chamber of the instrument, adjust the amplification of the instrument, so that the signal of each component of the instrument meets the requirements, and then perform zero point calibration and span calibration on each component of the instrument; Concentration ratio experiment of the gas to be measured: the driving motor 31 is operated to drive the calibration gas chamber in the automatic calibration device to move into the optical path. A certain flow rate of N2 is continuously introduced into the sample gas chamber of the instrument. A certain flow rate of different concentrations of the standard gas to be measured (CH4, CO2, C3H8) is introduced into the calibration gas chamber of the automatic calibration device until the instrument reading meets the requirements of automatic calibration. Standard gas procurement: Purchase standard gas according to the test concentration ratio of each component; Experimental verification: The purchased mixed standard gas is packaged into the calibration gas chamber of the automatic calibration device for experimental verification.

[0042] The experimental process of the infrared gas analyzer provided by the present invention is as follows: Step 1. Instrument preparation: The motor drives the automatic calibration device so that its reference gas chamber is in the optical path. 500 ml / min of N2 and full-scale standard gases of CO2, CH4, and C3H8 are respectively introduced into the measuring gas chamber of the instrument. The amplification factor of the instrument is adjusted so that the AD difference of each component of the instrument meets the test requirements. Then, N2 and full-scale standard gases of CO2, CH4, and C3H8 are introduced to perform zero point calibration and span calibration of the instrument. Step 2, CH4 gas distribution process experiment: After the instrument is prepared, N2 is continuously introduced into the test gas chamber tube of the instrument at a flow rate of 500ml / min. The motor drives the sample gas chamber in the automatic calibration device to move it into the light path. Use the gas distribution instrument to configure CH4 of different concentrations and introduce it into the sample gas chamber of the automatic calibration device at a flow rate of 300ml / min. Record the instrument's AD value and concentration until the instrument reading meets the requirements; Step 3: Test C3H8 and CO2 using the same method; The test data is as follows: The test data of C3H8 is shown in Table 1, the test data of CH4 is shown in Table 2, and the test data of CO2 is shown in Table 3. The corresponding line graphs correspond to Figure 3 、 Figure 4 and Figure 5 .

[0043] Among them, Table 1 is as follows: Table 2 is as follows: Table 3 is as follows: Step 4, experimental analysis: The experimental results show that when the mixed gas in the sample chamber of the automatic calibration device contains 21% CH4, 1.1% C3H8 and 1.1% CO2, it can meet the requirements of the instrument's automatic calibration; Step 5: Purchase standard gas: Purchase standard gas according to the concentration ratio of each component in step 4; Step 6. Experimental verification: The purchased mixed standard gas is introduced into the sample gas chamber of the automatic calibration device at a flow rate of 300 ml / min. At this time, 500 ml / min of N2 is introduced into the test gas chamber tube of the instrument. The error rate between the instrument reading and the standard gas is shown in Table 4 below: Table 4 is as follows:

[0044] It should be noted that the error rate of C3H8 is relatively large and can be corrected by software later.

[0045] Step 7, Gas Chamber Sealing: Connect the purchased mixed standard gas to the inflation table, and use the mixed standard gas to repeatedly pump and inflate the sample gas chamber in the automatic calibration device on the inflation table to ensure the purity of the standard gas inside. Finally, use a special tool to seal the gas. Step 8: After the gas sealing is completed, the automatic calibration device is installed on the instrument again, and the instrument debugging process in step 1 is repeated; Step 9, Post-Gas Sealing Verification: After instrument commissioning, continuously flow N2 at a flow rate of 500 ml / min into the instrument's measuring chamber 1. A motor drives the sample chamber in the automatic calibration device into the optical path. Once the instrument reading stabilizes, record the AD values ​​and concentrations of each component. This confirms compliance with the instrument's automatic calibration requirements. This concludes the experiment.

[0046] In the description of the embodiments of the present invention, it should be noted that, unless otherwise specified or limited, the terms "connected" and "connection" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; mechanical connections, electrical connections; and direct connections or indirect connections through an intermediary. Those skilled in the art will understand the specific meanings of the above terms in the embodiments of the present invention based on specific circumstances.

[0047] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "mode", "specific mode", or "some modes" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or mode are included in at least one embodiment or mode of the embodiment of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or mode. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or modes in a suitable manner. In addition, those skilled in the art can combine and combine different embodiments or modes and features of different embodiments or modes described in this specification without contradiction.

[0048] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. An automatic calibration device for an infrared gas analyzer, used for calibrating an infrared gas analyzer, wherein the sample gas chamber comprises a reference chamber and a sample chamber, wherein the reference chamber is filled with reference gas, and wherein: include: A measuring gas chamber (1) comprising a first chamber and a second chamber, wherein pure nitrogen is encapsulated in both the first chamber and the second chamber; A calibration gas chamber (2) comprising a third chamber and a fourth chamber, wherein nitrogen is encapsulated in the third chamber and a calibration gas in an appropriate proportion is encapsulated in the fourth chamber; In a first state, the first chamber corresponds to the reference chamber, and the second chamber corresponds to the sample chamber; In the second state, the third chamber corresponds to the reference chamber, and the fourth chamber corresponds to the sample chamber.

2. The automatic calibration device for infrared gas analyzer according to claim 1, characterized in that: The first state includes a measuring state and a zero-point calibration state. In the measuring state, a sample to be measured is introduced into the sample chamber; in the zero-point calibration state, pure nitrogen is introduced into the sample chamber.

3. The automatic calibration device for infrared gas analyzer according to claim 1, characterized in that: The second state is a range calibration state, in which pure nitrogen gas is introduced into the sample chamber.

4. The automatic calibration device for infrared gas analyzer according to claim 1, characterized in that: It also includes a switching device (3), which is used to switch the automatic calibration device between the first state and the second state.

5. The automatic calibration device for infrared gas analyzer according to claim 4, characterized in that: The switching device (3) comprises: A driving motor (31) is provided on the fixed cover (4), and a core shaft (32) is provided on the fixed cover (4); A driving gear (33) connected to the driving motor (31); A calibration gear (34) is engaged with the driving gear (33); and the calibration gear (34) rotates around the core shaft (32).

6. The automatic calibration device for infrared gas analyzer according to claim 1, characterized in that: Both sides of the first chamber, the second chamber, the third chamber and the fourth chamber are wafers, so as to transmit the infrared beam emitted by the infrared radiation light source of the infrared gas analyzer.

7. The automatic calibration device for infrared gas analyzer according to claim 5, characterized in that: It also includes an eccentric positioning device (5) disposed on the fixed cover (4), and the eccentric positioning device (5) is used to determine and adjust the two extreme positions of the calibration gear (34).

8. The automatic calibration device for infrared gas analyzer according to claim 5, characterized in that: It also includes a guide device (6) disposed on the fixed cover (4), and the guide device (6) is used to guide the calibration gear (34) when switching positions.

9. An automatic calibration method for an infrared gas analyzer, using the automatic calibration device for an infrared gas analyzer according to any one of claims 1 to 8, characterized in that: include: During conventional measurement, the sample to be measured is passed into the sample cavity of the sample chamber; During zero point calibration, pure nitrogen is introduced into the sample chamber of the sample gas chamber; during conventional measurement and zero point calibration, the measuring gas chamber (1) is in the working position; the light beam emitted by the infrared radiation light source passes through the light cutting device, the sample gas chamber, the measuring gas chamber (1), and the filter element (7) and enters the detector to complete the concentration measurement and sample concentration calibration of the sample; During range calibration, pure nitrogen is introduced into the sample cavity of the sample gas chamber, and the light beam emitted by the infrared radiation light source enters the detector through the light cutting device, the sample gas chamber, the calibration gas chamber (2), and the filter element (7), thereby completing the range calibration of the sample.

10. The automatic calibration method for infrared gas analyzer according to claim 9, characterized in that: The method further includes switching one of the measuring gas chamber (1) and the calibration gas chamber (2) to a working position via a switching device (3).

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