Battery piece electrical performance testing method and device, storage medium and battery piece testing machine

Abstract

The invention relates to a battery piece electrical performance testing method and device, a storage medium and a battery piece testing machine, and the method comprises the steps: enabling a probe of the battery piece testing machine to be in contact with a whole spliced battery piece, and obtaining the testing performance data of the whole spliced battery piece and the testing performance data of a half battery piece; according to the test performance data of the half battery piece, analyzing to obtain performance index reference data; determining a performance index coefficient according to the test performance data and the performance index reference data of the spliced whole battery piece; and correcting the test performance data of the half battery piece according to the performance index coefficient to obtain corrected performance data of the half battery piece. When performance detection is carried out on the half battery piece, the half battery piece is spliced into the whole battery piece to obtain data, the performance index coefficient is analyzed to correct the test performance data of the half battery piece, and the test accuracy of the sliced battery piece is improved.

Description

Technical Field

[0001] This application relates to the field of battery testing technology, and in particular to a method, apparatus, storage medium, and battery cell testing machine for testing the electrical performance of battery cells. Background Technology

[0002] With the rapid development and progress of the photovoltaic industry, the power of crystalline silicon modules is constantly increasing, and high-power crystalline silicon solar modules such as half-cell and tandem modules are gradually becoming the mainstream. Sliced ​​cell module design and packaging can better reduce power loss and increase output power, while optimized circuit design also enhances the module's resistance to hot spots. However, the uneven distribution of defects within crystalline silicon materials and differences in cell manufacturing processes result in inconsistent spectral responses across different regions of the cell, leading to variations in the resulting sliced ​​cells. Under EL (electroluminescence) detection, these inconsistent sliced ​​cells within the same cell string exhibit phenomena such as bright and dark areas, ultimately affecting the overall output power of the module.

[0003] Currently, most photovoltaic equipment manufacturers offer corresponding battery product testing equipment. This equipment greatly facilitates the improvement of battery products and indirectly promotes the improvement of battery electrical performance. However, traditional cell testing equipment is limited in variety, and most are designed for whole cells. When testing sliced ​​cells, the differences between cells can lead to inaccurate testing. Summary of the Invention

[0004] Therefore, it is necessary to provide a method, apparatus, storage medium, and cell testing machine for testing the electrical performance of slicing solar cells to improve the accuracy of slicing cell testing, in order to address the above problems.

[0005] The first aspect of this application provides a method for testing the electrical performance of solar cells, including: The probes of the solar cell testing machine are brought into contact with the spliced ​​whole solar cell to obtain the test performance data of the spliced ​​whole solar cell and the test performance data of half solar cell; the spliced ​​whole solar cell is obtained by splicing half solar cells. Based on the test performance data of the half-cell battery, reference data for performance indicators were obtained through analysis. Based on the test performance data of the assembled battery cell and the performance index reference data, the performance index coefficients are determined; The test performance data of the half-cell is corrected based on the performance index coefficient to obtain the corrected performance data of the half-cell.

[0006] In one embodiment, the test performance data includes test open-circuit voltage, test fill factor, and test short-circuit current.

[0007] In one embodiment, performance index reference data is obtained by analyzing the test performance data of the half-cell, including: The average open-circuit voltage of each half-cell is obtained by averaging the test open-circuit voltages of each half-cell. The average fill factor value of each half-cell is obtained by averaging the test fill factors of each half-cell. The sum of the short-circuit currents of each half of the solar cell is obtained by summing the test short-circuit currents of each half of the solar cell.

[0008] In one embodiment, the performance index coefficient is determined based on the test performance data of the assembled solar cell and the performance index reference data, including: The coefficient a is obtained by dividing the test open-circuit voltage of the spliced ​​whole solar cell by the average open-circuit voltage value of the half solar cell. The coefficient b is obtained by dividing the test fill factor of the spliced ​​whole cell by the average fill factor value of the half cell; The coefficient c is obtained by dividing the test short-circuit current of the spliced ​​whole cell by the sum of the short-circuit currents of the half cells.

[0009] In one embodiment, the test performance data of the half-cell is corrected according to the performance index coefficient to obtain the corrected performance data of the half-cell, including: Multiply the test open-circuit voltage of the half-cell by the coefficient a to obtain the corrected open-circuit voltage of the half-cell. Multiply the test fill factor of the half-cell by the coefficient b to obtain the corrected fill factor of the half-cell. Multiply the test short-circuit current of the half-cell by the coefficient c to obtain the corrected short-circuit current of the half-cell.

[0010] In one embodiment, the test performance data of the half-cell is corrected according to the performance index coefficient to obtain the corrected performance data of the half-cell, and the method further includes: The test efficiency of the half-cell is corrected based on the coefficients a, b, and c to obtain the corrected efficiency of the half-cell; wherein the test efficiency of the half-cell is calculated based on the test open-circuit voltage, test fill factor, and test short-circuit current of the half-cell.

[0011] In one embodiment, the method further includes: By combining the performance index coefficients calculated from several spliced ​​whole solar cells, the standard coefficients of the index are determined. Based on the aforementioned standard coefficients, the test performance data of each half of the battery cell obtained from the next splicing of the entire battery cell are corrected to obtain the corrected performance data of each half of the battery cell.

[0012] A second aspect of this application provides a battery cell electrical performance testing apparatus, comprising: The data acquisition module is used to bring the probes of the cell testing machine into contact with the spliced ​​whole cell to acquire the test performance data of the spliced ​​whole cell and the test performance data of half cell; the spliced ​​whole cell is obtained by splicing half cell cells. The data analysis module is used to analyze and obtain performance index reference data based on the test performance data of the half-cell battery. The coefficient determination module is used to determine the performance index coefficients based on the test performance data of the spliced ​​whole battery cell and the performance index reference data; The data correction module is used to correct the test performance data of the half-cell according to the performance index coefficient, so as to obtain the corrected performance data of the half-cell.

[0013] A third aspect of this application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the above-described method.

[0014] The fourth aspect of this application provides a cell testing machine, including a controller and probes, wherein the controller performs cell electrical performance testing according to the above method.

[0015] The aforementioned method, apparatus, storage medium, and cell testing machine for testing the electrical performance of solar cells involve contacting the probes of the cell testing machine with a spliced ​​whole cell to acquire test performance data for the spliced ​​whole cell and test performance data for half-cell cells. Based on the test performance data of the half-cell cells, performance index reference data is obtained through analysis. Based on the test performance data of the spliced ​​whole cell and the performance index reference data, performance index coefficients are determined. The test performance data of the half-cell cells is then corrected based on these performance index coefficients to obtain corrected performance data for the half-cell cells. By splicing the half-cell cells into a whole cell to acquire data during performance testing, and then analyzing the performance index coefficients to correct the test performance data of the half-cell cells, the accuracy of testing sliced ​​solar cells is improved. Attached Figure Description

[0016] Figure 1 This is a flowchart of a battery cell electrical performance testing method in one embodiment; Figure 2 This is a structural block diagram of a battery cell electrical performance testing device in one embodiment; Figure 3 FIG. 1 is a diagram showing the internal structure of a computer device in one embodiment. Detailed Implementation

[0017] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0018] In one embodiment, such as Figure 1 As shown, a method for testing the electrical performance of solar cells is provided, including: Step S110: Contact the probe of the cell testing machine with the spliced ​​whole cell to obtain the test performance data of the spliced ​​whole cell and the test performance data of half cell.

[0019] The spliced ​​full-size solar cell is obtained by splicing together half-size solar cells. The solar cell testing machine is designed with probes according to the specifications of a full-size solar cell. Therefore, before testing, the half-size solar cells must be manually spliced ​​into a full-size solar cell on the testing machine in sequence. Specifically, the tester can splice two half-size solar cells together, place the resulting spliced ​​full-size solar cell flat on the testing machine, and then contact both the front and back of the full-size solar cell with the corresponding probes to obtain test performance data. The gap between the two half-size solar cells must be small enough, for example, smaller than the probe spacing of the testing machine, to avoid direct contact between the upper and lower probes affecting the test. Any extra probes that do not need to contact the solar cell can be covered with black insulating tape. The parameters of the half-size solar cells and the spliced ​​full-size solar cell are tested sequentially to obtain the test performance data of the spliced ​​full-size solar cell and the test performance data of the half-size solar cells. The type of performance data is not unique; it may include open-circuit voltage Uoc, fill factor FF, and short-circuit current Isc, etc. The fill factor FF represents the ratio of the maximum output power to the limiting output power of the solar cell.

[0020] Step S120: Based on the test performance data of the half-cell solar cells, analyze and obtain reference data for performance indicators. Correspondingly, after measuring the test performance data of two half-cell solar cells, combine the open-circuit voltage Uoc, fill factor FF, and short-circuit current Isc of the half-cell solar cells to analyze and obtain relevant reference data for performance indicators.

[0021] In one embodiment, step S120 includes: averaging the test open-circuit voltages of each half-cell to obtain an average open-circuit voltage value for each half-cell; averaging the test fill factors of each half-cell to obtain an average fill factor value for each half-cell; and summing the test short-circuit currents of each half-cell to obtain a sum of short-circuit currents for each half-cell. That is, the performance indicator reference data includes the average open-circuit voltage value, average fill factor value, and sum of short-circuit currents for each half-cell.

[0022] Specifically, the test open-circuit voltage Uoc of two half-cell solar cells is... i Uoc n Add them together and divide by 2 to get the average open-circuit voltage Uoc of half a solar cell. (i+n) / 2 The test fill factor FF of two half-cell solar cells. i FF n Add them together and divide by 2 to get the average fill factor value FF of half a solar cell. (i+n) / 2 The test short-circuit current Isc of two half-cell solar cells. i , Isc n Summing these values ​​yields the sum of the short-circuit currents of half a solar cell, Isc. i+n .

[0023] Step S130: Determine the performance index coefficients based on the test performance data and performance index reference data of the entire assembled solar cell. Analyze the test performance data obtained from measuring the entire assembled solar cell, combined with the performance index reference data, to determine the performance index coefficients.

[0024] In one embodiment, step S130 includes: measuring the test open-circuit voltage Uoc of the entire spliced ​​solar cell. i&n Divide by the average open-circuit voltage Uoc of half a cell (i+n) / 2 The coefficient a is obtained; the test fill factor FF of the spliced ​​entire battery cell is then calculated. i&n Divide by the average fill factor FF of half a cell (i+n) / 2 The coefficient b is obtained; the test short-circuit current Isc of the spliced ​​entire solar cell is then calculated. i&n Divide by the sum of the short-circuit currents of half a solar cell, Isc i+n We obtain coefficient c. That is, the performance index coefficients include coefficients a, b, and c.

[0025] Step S140: Correct the test performance data of the half-cell according to the performance index coefficient to obtain the corrected performance data of the half-cell. Correspondingly, step S140 includes: multiplying the test open-circuit voltage of the half-cell by coefficient a to obtain the corrected open-circuit voltage of the half-cell; multiplying the test fill factor of the half-cell by coefficient b to obtain the corrected fill factor of the half-cell; and multiplying the test short-circuit current of the half-cell by coefficient c to obtain the corrected short-circuit current of the half-cell.

[0026] Taking one half of a solar cell as an example, its test performance data includes the open-circuit voltage Uoc. i Test fill factor FF i and test short-circuit current Isc i The corrected open-circuit voltage of this half-cell is Uoc = Uoc i×a, the corrected fill factor of this half-cell is FF=FF i ×b, the corrected short-circuit current of this half-cell is Isc = Isc i ×c.

[0027] Further, step S140 also includes: correcting the test efficiency of the half-cell based on coefficients a, b, and c to obtain the corrected efficiency of the half-cell. Wherein, the test efficiency Eta of the half-cell is... i According to the test open-circuit voltage Uoc of half a cell i Test fill factor FF i and test short-circuit current Isc i Calculated. Specifically, the test efficiency Eta i =Uoc i ×FF i ×Isc i / Area × Light Intensity, where area and light intensity are determined based on the actual conditions of the solar cells. For example, in this embodiment, the light intensity is 1000W / m². 2 The area of ​​a full solar cell is 38184 square millimeters, therefore the area of ​​half a solar cell is 38184 / 2 square millimeters. The efficiency Eta of the half-cell is then determined. i Afterwards, the corrected efficiency of the half-cell is Eta = Eta i ×a×b×c.

[0028] As we understand it, the above involves acquiring and analyzing the test performance data of both complete solar cells and half-cells to determine coefficients a, b, and c. These coefficients are then used to correct the test performance data of each half-cell, resulting in more accurate open-circuit voltage Uoc, fill factor FF, short-circuit current Isc, and efficiency Eta. For each complete solar cell assembly, both complete and half-cell test performance data can be collected, and coefficients a, b, and c can be calculated to correct the test performance data of each half-cell. Alternatively, the coefficients a, b, and c can be averaged after accumulating a certain number of measurements, and this average value can be used as the standard coefficient for calibrating the testing machine. Subsequent cell tests can then use only the half-cell test performance data, without needing to acquire the complete solar cell test performance data, and directly use the standard coefficient to correct the half-cell test performance data.

[0029] In one embodiment, the method further includes: determining standard coefficients by combining performance index coefficients calculated from several spliced ​​whole solar cells; and correcting the test performance data of each half solar cell measured in the next spliced ​​whole solar cell according to the standard coefficients, to obtain corrected performance data of each half solar cell.

[0030] In determining the standard coefficients for the performance indicators, data can be collected using a certain number of standard half-cell solar cells, or data can be collected directly using the half-cell to be tested. The performance indicator coefficients are calculated based on the collected data, and the average of these coefficients determines the standard coefficients. When conducting subsequent electrical performance tests on the half-cell to be tested, only the test performance data of each half-cell within the spliced ​​whole solar cell needs to be collected. This data is then corrected using the standard coefficients to obtain the corrected performance data for each half-cell, thus improving testing efficiency while ensuring accuracy.

[0031] Specifically, the testing machine can be calibrated using Fraunhofer Class 1 standard sheets. Prepare 40 half-cell solar cells, numbered 1, 2, 3...40 with a pencil on the corner of the back. Manually assemble half-cells 1 and 2, 3 and 4, 5 and 6, ..., 39 and 40 on the probe array of the testing machine to form a complete cell for electrical performance testing. Cover any excess probes on the testing machine with black insulating tape, change the cell area to half-cell area, and test the half-cells sequentially.

[0032] Add the Uoc and FF values ​​of the two half-cells in sequence and divide by 2, then add the Isc values, and use the Uoc value of the spliced ​​whole cell. i&n FF i&n , Isc i&n Uoc divided by half a cell (i+n) / 2 FF (i+n) / 2 , Isc i+n The coefficients a, b, and c are obtained, and the electrical performance correction Uoc for half a cell is given by Uoc. i ×a、FF=FF i ×b、Isc=Isc i ×c, Eta=Eta i ×a×b×c.

[0033] Table 1

[0034] Table 2

[0035] As shown in Table 1, the test performance data of the spliced ​​whole cell obtained in the "Manual Splicing" column are divided by the corresponding performance index reference data (sum of half cell data divided by 2, or sum of half cell data) to calculate coefficients a, b, and c. Table 1 shows 20 sets of coefficients a, b, and c calculated from 40 half cell data. The average of these 20 sets of coefficients a, b, and c is used as the standard coefficient. By combining the data from the whole cell with the electrical performance correction of the half cell, the calibration of the testing machine can be completed, facilitating subsequent half cell testing.

[0036] As shown in Table 2, subsequent cell testing can eliminate the need to obtain performance data for the entire assembled cell; only the performance data for half a cell needs to be acquired. The performance data for each half cell can then be directly corrected using standard coefficients. It is understood that in other embodiments, for each assembled cell, both the performance data for the entire cell and the performance data for each half cell can be acquired. Coefficients a, b, and c can then be calculated to correct the performance data for each half cell, further improving the accuracy of the electrical performance testing for each half cell.

[0037] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0038] Based on the same inventive concept, this application also provides a battery cell electrical performance testing device for implementing the aforementioned battery cell electrical performance testing method. The solution provided by this device is similar to the solution described in the above method; therefore, the specific limitations in one or more embodiments of the battery cell electrical performance testing device provided below can be found in the limitations of the battery cell electrical performance testing method described above, and will not be repeated here.

[0039] In one embodiment, such as Figure 2 As shown, a battery cell electrical performance testing device is provided, comprising: a data acquisition module 110, a data analysis module 120, a coefficient determination module 130, and a data correction module 140, wherein: The data acquisition module 110 is used to bring the probe of the cell testing machine into contact with the spliced ​​whole cell to acquire the test performance data of the spliced ​​whole cell and the test performance data of half cell; the spliced ​​whole cell is obtained by splicing half cell cells.

[0040] The data analysis module 120 is used to analyze and obtain performance index reference data based on the test performance data of half-cell batteries.

[0041] The coefficient determination module 130 is used to determine the performance index coefficients based on the test performance data and performance index reference data of the spliced ​​whole battery cells.

[0042] The data correction module 140 is used to correct the test performance data of half-cell based on the performance index coefficient to obtain the corrected performance data of half-cell.

[0043] In one embodiment, the data analysis module 120 averages the test open-circuit voltages of each half-cell to obtain the average open-circuit voltage value of the half-cell; averages the test fill factors of each half-cell to obtain the average fill factor value of the half-cell; and sums the test short-circuit currents of each half-cell to obtain the sum of the short-circuit currents of the half-cell.

[0044] In one embodiment, the coefficient determination module 130 divides the test open-circuit voltage of the spliced ​​whole cell by the average open-circuit voltage value of half cell to obtain coefficient a; divides the test fill factor of the spliced ​​whole cell by the average fill factor value of half cell to obtain coefficient b; and divides the test short-circuit current of the spliced ​​whole cell by the sum of the short-circuit currents of half cell to obtain coefficient c.

[0045] In one embodiment, the data correction module 140 multiplies the test open-circuit voltage of half a cell by a coefficient a to obtain the corrected open-circuit voltage of half a cell; multiplies the test fill factor of half a cell by a coefficient b to obtain the corrected fill factor of half a cell; and multiplies the test short-circuit current of half a cell by a coefficient c to obtain the corrected short-circuit current of half a cell.

[0046] In one embodiment, the data correction module 140 is further configured to correct the test efficiency of the half-cell based on coefficients a, b, and c to obtain the corrected efficiency of the half-cell; wherein the test efficiency of the half-cell is calculated based on the test open-circuit voltage, test fill factor, and test short-circuit current of the half-cell.

[0047] In one embodiment, the data correction module 140 is further configured to combine the performance index coefficients calculated from several spliced ​​whole solar cells to determine the index standard coefficients; and based on the index standard coefficients, to correct the test performance data of each half solar cell measured in the next spliced ​​whole solar cell, thereby obtaining the corrected performance data of each half solar cell.

[0048] Each module in the aforementioned battery cell electrical performance testing device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in or independent of the processor in a computer device, or stored in the memory of a computer device as software, so that the processor can call and execute the corresponding operations of each module.

[0049] In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 3 As shown, the computer device includes a processor, memory, input / output interface, communication interface, display unit, and input device. The processor, memory, and input / output interface are connected via a system bus, and the communication interface, display unit, and input device are also connected to the system bus via the input / output interface. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The input / output interface is used for exchanging information between the processor and external devices. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, NFC (Near Field Communication), or other technologies. When the computer program is executed by the processor, it implements a method for testing the electrical performance of battery cells. The display unit is used to form a visually visible image and can be a display screen, projection device, or virtual reality imaging device. The display screen can be an LCD screen or an e-ink screen. The input device of the computer device can be a touch layer covering the display screen, or buttons, trackballs, or touchpads set on the casing of the computer device, or external keyboards, touchpads, or mice, etc.

[0050] Those skilled in the art will understand that Figure 3 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0051] In one embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps of the method described above.

[0052] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the steps of the above-described method.

[0053] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the steps of the above-described method.

[0054] In one embodiment, a cell testing machine is provided, including a controller and probes, wherein the controller performs electrical performance testing of the cell according to the method described above.

[0055] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments described above. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0056] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0057] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person skilled in the art could make various modifications and improvements without departing from the spirit of the present application, all of which fall within the scope of protection of the present application. Therefore, the scope of protection of the present patent application shall be determined by the appended claims.

Claims

1. A method for testing the electrical performance of battery cells, characterized in that, include: The probes of the cell testing machine are brought into contact with the spliced ​​whole cell to obtain the test performance data of the spliced ​​whole cell and the test performance data of half cell. The spliced ​​full battery cell is obtained by splicing together half battery cells; Based on the test performance data of the half-cell battery, reference data for performance indicators were obtained through analysis. Based on the test performance data of the assembled battery cell and the performance index reference data, the performance index coefficients are determined; The test performance data of the half-cell is corrected based on the performance index coefficient to obtain the corrected performance data of the half-cell.

2. The method according to claim 1, characterized in that, The test performance data includes test open-circuit voltage, test fill factor, and test short-circuit current.

3. The method according to claim 2, characterized in that, Based on the test performance data of the half-cell battery, reference data for performance indicators were obtained through analysis, including: The average open-circuit voltage of each half-cell is obtained by averaging the test open-circuit voltages of each half-cell. The average fill factor value of each half-cell is obtained by averaging the test fill factors of each half-cell. The sum of the short-circuit currents of each half of the solar cell is obtained by summing the test short-circuit currents of each half of the solar cell.

4. The method according to claim 3, characterized in that, Based on the test performance data of the assembled solar cell and the performance index reference data, the performance index coefficients are determined, including: The coefficient a is obtained by dividing the test open-circuit voltage of the spliced ​​whole solar cell by the average open-circuit voltage value of the half solar cell. The coefficient b is obtained by dividing the test fill factor of the spliced ​​whole cell by the average fill factor value of the half cell; The coefficient c is obtained by dividing the test short-circuit current of the spliced ​​whole cell by the sum of the short-circuit currents of the half cells.

5. The method according to claim 4, characterized in that, The test performance data of the half-cell is corrected based on the performance index coefficient to obtain the corrected performance data of the half-cell, including: Multiply the test open-circuit voltage of the half-cell by the coefficient a to obtain the corrected open-circuit voltage of the half-cell. Multiply the test fill factor of the half-cell by the coefficient b to obtain the corrected fill factor of the half-cell. Multiply the test short-circuit current of the half-cell by the coefficient c to obtain the corrected short-circuit current of the half-cell.

6. The method according to claim 5, characterized in that, The test performance data of the half-cell is corrected based on the performance index coefficient to obtain the corrected performance data of the half-cell, and the method further includes: The test efficiency of the half-cell is corrected based on the coefficients a, b, and c to obtain the corrected efficiency of the half-cell; wherein the test efficiency of the half-cell is calculated based on the test open-circuit voltage, test fill factor, and test short-circuit current of the half-cell.

7. The method according to any one of claims 1 to 6, characterized in that, Also includes: By combining the performance index coefficients calculated from several spliced ​​whole solar cells, the standard coefficients of the index are determined. Based on the aforementioned standard coefficients, the test performance data of each half of the battery cell obtained from the next splicing of the entire battery cell are corrected to obtain the corrected performance data of each half of the battery cell.

8. A device for testing the electrical performance of battery cells, characterized in that, include: The data acquisition module is used to bring the probes of the cell testing machine into contact with the spliced ​​whole cell to acquire the test performance data of the spliced ​​whole cell and the test performance data of half cell; the spliced ​​whole cell is obtained by splicing half cell cells. The data analysis module is used to analyze and obtain performance index reference data based on the test performance data of the half-cell battery. The coefficient determination module is used to determine the performance index coefficients based on the test performance data of the spliced ​​whole battery cell and the performance index reference data; The data correction module is used to correct the test performance data of the half-cell according to the performance index coefficient, so as to obtain the corrected performance data of the half-cell.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 7.

10. A battery cell testing machine, characterized in that, It includes a controller and a probe, wherein the controller performs electrical performance testing of the solar cell according to any one of claims 1 to 7.

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