Tool for assisting ophthalmology slit-lamp microscope in non-contact measurement of anterior chamber depth

By designing tools to assist ophthalmic slit-lamp microscopes, and utilizing a combination of a fixture and a scale, the accuracy problem of measuring the depth of the anterior chamber with slit-lamp microscopes was solved, achieving rapid and accurate non-contact measurement.

CN120859419APending Publication Date: 2025-10-31徐力 +3
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Patent Information

Application Number
CN202511077512.2
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-08-01
Publication Date
2025-10-31

AI Technical Summary

Technical Problem

Existing slit-lamp microscopes are not accurate enough in estimating the depth of the anterior chamber, as they are highly subjective and lack precision.

Method used

A tool for assisting ophthalmic slit-lamp microscopes has been designed, including a frame and a scale. The frame is equipped with a reference plate with standard graduations, and the scale can be installed on the control panel. Through the cooperation of the reference plate and the scale, non-contact measurement of the anterior chamber depth can be achieved.

Benefits of technology

It enables rapid and accurate non-contact measurement of anterior chamber depth, with a simple structure, easy use, and reduced subjective error.

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Abstract

The invention provides a tool for assisting an ophthalmology slit-lamp microscope to measure the depth of the anterior chamber in a non-contact mode, the tool comprises a fixing frame and a ruler provided with standard scales, the fixing frame is provided with a reference clamping plate vertically corresponding to the standard scales, and the ruler can be independently installed on an operation board. The scale and the fixing frame are of a split structure, the scale is installed on the operation board, and the operation board and the scale synchronously move front and back. During use, the operation board and the scale are pushed to focus on the inner surface of a cornea, the starting scale of the scale is recorded, then the operation board and the scale are pushed to focus on the front surface of a crystal, and the end scale of the scale is recorded. Therefore, the depth of the central anterior chamber can be obtained only by calculating the difference value of the two scales. The tool is simple in structure and convenient to use, and can quickly and accurately measure the anterior chamber depth of a patient in a non-contact manner.
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Description

Technical Field

[0001] This invention relates to the field of medical device technology, and in particular to a tool for non-contact measurement of the depth of the anterior chamber using an ophthalmic slit-lamp microscope. Background Technology

[0002] Currently, measuring anterior chamber depth in ophthalmology clinical practice requires specialized examination instruments, such as the UBM ultrasonic biological microscope and biometers. Commonly used instruments in ophthalmology outpatient clinics, such as slit-lamp measurements of anterior segment tissues, including central anterior chamber depth, require slit-lamp illumination to illuminate the cornea and estimate its thickness. The central anterior chamber depth is then estimated in units of corneal thickness, for example, 3.5 CT (corneal thickness). However, this estimation method is not very accurate and is highly subjective.

[0003] A slit lamp is an ophthalmic examination instrument that typically consists of four main components: a slit lamp that provides the light source, a microscope for observation, a control panel that can be moved back and forth, and a support for the patient's head. During use, the patient's ocular tissues can be observed by moving the control panel back and forth. Summary of the Invention

[0004] To address the shortcomings of the existing technology, the purpose of this invention is to provide a tool for non-contact measurement of anterior chamber depth using an ophthalmic slit-lamp microscope, which is simple in structure, easy to use, and can assist in rapid implantation of a flexible tube.

[0005] The present invention achieves the above objectives as follows: A tool is provided to assist in non-contact measurement of anterior chamber depth using an ophthalmic slit-lamp microscope. It includes a frame and a scale with standard graduations. The frame has a reference plate that is perpendicular to the standard graduations. The scale can be installed separately on the control panel.

[0006] Furthermore, the fixing frame includes two columns, left and right, and the two columns are provided with mounting slots along the longitudinal direction. The two ends of the reference plate are horizontally engaged in the mounting slots.

[0007] Furthermore, the mounting slot has multiple through insertion holes arranged longitudinally on both the front and rear sides, and the reference plate has through positioning holes corresponding to the insertion holes at both ends. Positioning pins are inserted through the insertion holes and positioning holes.

[0008] Furthermore, a locking block is movably installed in the mounting slot. The mounting slot has multiple through insertion holes distributed longitudinally at the front and back. The locking block has through mounting holes corresponding to the insertion holes. The insertion holes and mounting holes are inserted through by positioning pins. The two ends of the reference locking plate extend downward to form a flip platform. The flip platform passes through the mounting slot and is locked onto the locking block.

[0009] Furthermore, the scale includes a horizontally arranged scale plate and a stop block with its front end at a right angle to the scale plate. The standard scale is located on the scale plate, and the bottom surface of the stop block is flat.

[0010] Furthermore, the scale extends downward in front to form a longitudinal baffle that can be detachably connected to the operation panel.

[0011] The beneficial effects of this invention are as follows: This invention provides a tool for non-contact measurement of anterior chamber depth using a slit-lamp microscope in ophthalmology. It includes a mounting frame and a scale with standard graduations. The mounting frame has a reference plate perpendicular to the standard graduations. The scale can be mounted separately on the operating panel. The mounting frame can be installed on a non-moving part of the slit-lamp microscope or fixed together with the aforementioned non-moving part on the worktable. The scale and mounting frame are separate structures. The scale is mounted on the operating panel, and the operating panel and scale move synchronously back and forth. The reference plate is above the scale and is positioned perpendicular to the direction of movement of the scale. The operator can see the corresponding graduation position from the top and bottom of the reference plate. During use, the operating panel and scale are pushed to focus on the inner surface of the cornea, and the initial graduation of the scale is recorded. Then, the operating panel and scale are pushed to focus on the anterior surface of the lens, and the final graduation of the scale is recorded. Since the moving distance of the operating panel is the same as the focusing displacement distance of the slit-lamp microscope, the depth of the central anterior chamber can be obtained by calculating the difference between the two graduations. This tool has a simple structure, is easy to use, and can quickly and accurately measure the depth of the patient's anterior chamber without contact. Attached Figure Description

[0012] To make the technical problem to be solved by the present invention, the technical means adopted, and the beneficial effects clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments: Figure 1 This is a schematic diagram of the assembly structure according to an embodiment of the present invention; Figure 2 A schematic diagram of the disassembled structure of one embodiment of the fixing frame; Figure 3 for Figure 2 Schematic diagram of the assembly structure of the embodiment Figure 4 This is a schematic diagram of the assembly structure of the second embodiment of the fixing frame; Figure 5 for Figure 4 Schematic diagram of a partially disassembled structure in the embodiment; Figure 6 For this Figure 1 Top view of the structure of the embodiment; Figure 7 A schematic diagram of an assembly structure for a scale and a control panel; Figure 8This is a schematic diagram of another assembly structure for the scale and control panel.

[0013] In the diagram, 1 is the fixed frame, 11 is the reference plate, 111 is the positioning hole, 112 is the flip table, 2 is the scale, 21 is the standard scale, 12 is the column, 13 is the mounting slot, 14 is the insertion hole, 15 is the locking block, 151 is the mounting hole, 26 is the scale plate, 27 is the clamping block, 28 is the longitudinal baffle, 3 is the positioning pin, 5 is the operating panel, and 6 is the worktable. Detailed Implementation

[0014] The present invention provides a tool for non-contact measurement of anterior chamber depth using an ophthalmic slit-lamp microscope, comprising a mounting frame 1 and a scale 2 with standard graduations 21. The mounting frame 1 is provided with a reference plate 11 that is perpendicular to the standard graduations 21, and the scale 2 can be installed separately on the operating panel 5.

[0015] As attached Figures 1 to 8 As shown, the mounting bracket 1 can be installed on a non-moving part of the slit-lamp microscope, or fixed together with the aforementioned non-moving part on the worktable. The scale 2 and the mounting bracket 1 are separate structures. Before use, the scale 2 is installed on the operating disc 5, which can be fixed by adhesive or fasteners. As the operating disc 5 moves back and forth, the scale 2 on it also moves back and forth synchronously. The reference plate 11 on the mounting bracket 1 is placed above the scale 2, and the reference plate 11 is positioned perpendicular to the direction of movement of the scale 2, so that the operator can see the corresponding scale position looking down from above the reference plate 11. During operation, the operating disc 5 and the scale 2 can be pushed to focus on the inner surface of the cornea, and the initial scale of the scale 2 is recorded. Then, the operating disc 5 and the scale 2 are pushed to focus on the anterior surface of the lens, and the final scale of the scale 2 is recorded. Since the moving distance of the operating disc 5 is the same as the displacement distance of the slit-lamp microscope's focusing, the depth of the central anterior chamber can be obtained by calculating the difference between the two scales. This tool has a simple structure, is easy to use, and can quickly and accurately measure the depth of the patient's anterior chamber without contact.

[0016] Preferably, the fixing frame 1 includes two left and right columns 12, and the two columns 12 are provided with mounting slots 13 along the longitudinal direction. The two ends of the reference plate 11 are horizontally fitted into the mounting slots 13.

[0017] As shown in the attached diagram, two uprights 12 are installed on both sides in front of the slit lamp, leaving an operating space in the middle. Each upright 12 has a mounting slot 13 to allow the reference plate 11 to be installed horizontally across the two mounting slots 13. The space below the reference plate 11 allows the operator to manually push the operating panel, while the space above the reference plate 11 provides visual observation for the operator. The longitudinally formed mounting slots 13 have a certain length, allowing adjustment of the mounting height of the reference plate 11 according to different models or brands of slit lamps.

[0018] Preferably, the mounting slot 13 has multiple through insertion holes 14 arranged longitudinally on its front and rear sides, and the reference plate 11 has through positioning holes 111 at both ends corresponding to the insertion holes 14. Positioning pins 3 are inserted through the insertion holes 14 and the positioning holes 111.

[0019] As shown in the attached diagram, depending on the model or brand of the slit lamp, align both ends of the reference plate 11 with the corresponding insertion holes 14. Then, use the positioning pin 3 to simultaneously pass through both the insertion hole 14 and the positioning hole 111 to position the reference plate 11 at the appropriate height. The positioning pin 3 can be a through bolt, secured with a nut. Because the positioning pin 3 is installed through, the reference plate 11 is stably positioned during use and is not easily misaligned or knocked off.

[0020] Preferably, a locking block 15 is movably installed in the mounting slot 13. The mounting slot 13 has multiple longitudinally distributed through insertion holes 14 at its front and rear. The locking block 15 has through mounting holes 151 corresponding to the insertion holes 14. The insertion holes 14 and mounting holes 151 are inserted through by positioning pins 3. The reference plate 11 extends downward at both ends to form a flip platform 112. The flip platform 112 passes through the mounting slot 13 and is locked onto the locking block 15.

[0021] As shown in the attached diagram, depending on the model or brand of the slit lamp, align the two side locking blocks 15 with the corresponding height insertion holes 14, and then simultaneously pass the positioning pins 3 through the insertion holes 14 and mounting holes 151 to position the locking blocks 15 at the appropriate height. The positioning pins 3 can be through bolts and secured with nuts. When adjusting the height of the reference plate 11, simply remove the locking blocks 15 and align them with the corresponding height insertion holes 14; the operation is simple and convenient. The flip-tops 112 at both ends of the reference plate 11 protrude downwards and can be precisely locked outside the two flip-tops 112, preventing the reference plate 11 from moving left or right. Furthermore, since the reference plate 11 is not fixed, it can be removed at any time when measurement is not required, freeing up space in front of the operating panel 5 for other operations, offering flexibility and versatility.

[0022] Preferably, the scale 2 includes a horizontally arranged scale plate 26 and a clamping block 27 whose front end is at a right angle to the scale plate 26. The standard scale 21 is located on the scale plate 26, and the bottom surface of the clamping block 27 is flat.

[0023] As attached Figure 7As shown, the scale 2 is L-shaped, with a graduated plate 26 on top. The standard graduations 21 can be read by moving the scale 2 back and forth. The stop block 27 in front of the scale 2 is used to press against the operating panel 5. During use, only the operating panel 5 can be pressed against the scale. Because the stop block 27 has sufficient thickness and a flat bottom, the scale 2 can be placed on the worktable 6 facing the operating panel 5. After the stop block 27 is pressed against the operating panel 5, the scale 2 moves synchronously with the operation panel 5 as it moves back and forth. The horizontally positioned graduated plate 26 also moves horizontally synchronously. After measurement, the scale 2 can be easily removed for other operations, making it flexible and convenient to use. This scale 2 utilizes the flat bottom surface of the stop block 27 as a reference for movement, making it more suitable for existing slit lamps with uneven front ends of the operating panel 5. It ensures point contact during pressing, preventing offset or misalignment and guaranteeing the accuracy of the measurement data.

[0024] Preferably, the scale 2 extends downward in front to form a longitudinal baffle 28 that can be detachably connected to the operation panel 5.

[0025] As attached Figure 8 As shown, through holes for mounting bolts can be provided on the longitudinal baffle 28 for detachable fixing to the operation panel 5. Alternatively, a double-sided adhesive layer can be provided on the outside of the longitudinal baffle 28 for detachable fixing to the front end of the operation panel 5.

[0026] In the detailed description of this invention, the terms "upper," "lower," "left," "right," "front," and "rear," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing the invention and do not indicate or imply that the device or element referred to must have a specific orientation or positional relationship. Therefore, they should not be construed as limitations on the invention. It is understood that the above embodiments only illustrate preferred embodiments of the invention, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of the invention. It should be noted that those skilled in the art can freely combine the above technical features and make various modifications and improvements without departing from the concept of the invention; all of these fall within the protection scope of the invention. Therefore, all equivalent transformations and modifications made with respect to the claims and scope of the invention should be covered by the claims of the invention.

Claims

1. A tool for non-contact measurement of anterior chamber depth using an ophthalmic slit-lamp microscope, characterized in that: It includes a mounting bracket (1) and a scale (2) with a standard scale (21). The mounting bracket (1) is provided with a reference plate (11) that is perpendicular to the standard scale (21). The scale (2) can be installed separately on the operation panel (5).

2. The tool for non-contact measurement of anterior chamber depth using an ophthalmic slit-lamp microscope according to claim 1, characterized in that: The fixing frame (1) includes two columns (12) on the left and right sides. The two columns (12) are provided with mounting slots (13) along the longitudinal direction. The two ends of the reference plate (11) are horizontally fitted into the mounting slots (13).

3. The tool for non-contact measurement of anterior chamber depth using an ophthalmic slit-lamp microscope according to claim 2, characterized in that: The mounting slot (13) has multiple through insertion holes (14) arranged longitudinally on both the front and rear sides. The reference plate (11) has through positioning holes (111) at both ends corresponding to the insertion holes (14). Positioning pins (3) are inserted through the insertion holes (14) and positioning holes (111).

4. The tool for non-contact measurement of anterior chamber depth using an ophthalmic slit-lamp microscope according to claim 2, characterized in that: A locking block (15) is movably installed in the mounting slot (13). The mounting slot (13) has multiple longitudinally distributed through insertion holes (14) at the front and back. The locking block (15) has through mounting holes (151) corresponding to the insertion holes (14). The insertion holes (14) and mounting holes (151) are inserted through by positioning pins (3). The reference plate (11) extends downward at both ends to form a flip platform (112). The flip platform (112) passes through the mounting slot (13) and is locked onto the locking block (15).

5. The tool for non-contact measurement of anterior chamber depth using an ophthalmic slit-lamp microscope according to claim 1, characterized in that: The scale (2) includes a horizontally set scale plate (26) and a stop block (27) with its front end at a right angle to the scale plate (26). The standard scale (21) is located on the scale plate (26), and the bottom surface of the stop block (27) is flat.

6. The tool for non-contact measurement of anterior chamber depth using an ophthalmic slit-lamp microscope according to claim 1, characterized in that: The scale (2) extends downward in front to form a longitudinal baffle (28) that can be detachably connected to the operation panel (5).