Serial test method, system and storage medium integrating multiple controllers
By using a time-division serial test array and dynamically adjusting switch parameters, the problems of low resource utilization and interference in multi-controller testing in the automotive electronics field are solved, achieving efficient and stable multi-controller serial testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 上海北汇信息科技有限公司
- Filing Date
- 2026-03-10
- Publication Date
- 2026-06-05
AI Technical Summary
In existing serial testing systems for automotive electronics, test resource utilization is low, test efficiency is low, and there are mutual interference and temporal and spatial limitations, making it impossible to achieve parallel testing of multiple controllers.
By employing a time-division serial test array and a time-division selective switch matrix, and through time-division switching and physical isolation of power supply and communication test modules, combined with dynamic adjustment of switch switching parameters and test interval duration, efficient and stable testing of multiple controllers can be achieved.
It improves the utilization rate of test equipment resources, reduces hardware configuration and space occupation costs, avoids electrical faults and signal interference, ensures the accuracy and stability of test results, and optimizes the efficiency of test timing.
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Figure CN122151814A_ABST
Abstract
Description
Technical Field
[0002] This application relates to the technical field of electronic module testing, and in particular to a serial testing method, system, and storage medium integrating multiple controllers. Background Technology
[0004] With the rapid development and widespread application of automotive electronics technology, various in-vehicle electronic control modules have become core components for realizing functions such as power control, body control, intelligent driving, and information interaction in automobiles. To ensure the functional integrity, communication reliability, and operational stability of electronic modules, comprehensive and standardized functional testing must be conducted during both the R&D verification and mass production stages. By simulating real-world working environments and communication scenarios, verification is performed to confirm whether the modules meet design specifications and automotive standards. This is a crucial step in ensuring the safe and reliable operation of the entire vehicle's electronic system.
[0005] In the current automotive electronics field, serial test systems typically require separate configuration of core test hardware, such as power drive modules, CAN / CANFD communication modules, and LIN communication modules, for each controller under test, based on its unique interface protocol, electrical characteristics, and test procedures. All these independently customized test devices are integrated into one or more standard test cabinets, forming multiple independent test channels. During serial testing, the system only activates the single device module matching the model of the controller under test, while the remaining modules, with their hardware deployed and connected, remain in standby mode.
[0006] In traditional serial testing, the test process is executed sequentially according to the object under test. Only one set of corresponding device modules can be activated in a single test, while a large number of other deployed power, communication, and other test hardware modules remain idle and cannot participate in the parallel testing tasks of other controllers. The scheduling and use of test resources have significant temporal and spatial limitations, the utilization rate of core test hardware is low, and the overall test efficiency is low. Summary of the Invention
[0008] To improve the overall testing efficiency of the testing device, this application provides a serial testing method, system, and storage medium integrating multiple controllers.
[0009] Firstly, this application provides a serial testing method integrating multiple controllers, employing the following technical solution:
[0010] A serial testing method integrating multiple controllers includes the following steps:
[0011] Obtain the test equipment list, and extract multiple elements with non-linkage test attributes from the test equipment list according to the preset linkage test attributes as independent test modules. The independent test modules include a power supply test module, a first communication test module, and a second communication test module.
[0012] A time-division serial test array is established, comprising a first time-division unit, a second time-division unit, and a third time-division unit, each having multiple time-division selection switch matrices. Each time-division selection switch matrix contains multiple time-division selection switches, which are used to simultaneously connect multiple controllers under test. The first, second, and third time-division units are also used to simultaneously connect multiple controllers under test. The first time-division unit is used to establish an electrical connection between the power supply test module and multiple controllers under test; the second time-division unit is used to establish an electrical connection between the first communication test module and multiple controllers under test; and the third time-division unit is used to establish an electrical connection between the second communication test module and multiple controllers under test.
[0013] Obtain the time-sharing test sequence instruction, and start the first time-sharing unit, the second time-sharing unit, and the third time-sharing unit in sequence according to the time-sharing test sequence instruction. The first time-sharing unit, the second time-sharing unit, and the third time-sharing unit are not tested at the same time. During testing, the time-sharing selection switch is turned on; when not testing, the time-sharing selection switch is turned off.
[0014] After the first time-sharing unit test is completed, wait for the first duration before testing the second time-sharing unit; after the second time-sharing unit test is completed, wait for the second duration before testing the third time-sharing unit; the second duration is shorter than the first duration.
[0015] By adopting the above technical solutions, we can achieve efficient utilization of various test module resources, avoid mutual interference between different test stages and different controllers through switching on / off and time-sharing testing, optimize the test timing connection by using different waiting times, make the serial test process of multiple controllers more orderly and smoother, effectively improve the overall test device's serial test efficiency for multiple controllers, and ensure the stability of the test process and the accuracy of the test results.
[0016] Optionally, the method further includes the following steps:
[0017] Obtain the test power of the unit under test, and calculate the power ratio as the ratio of the test power to the preset reference power;
[0018] The switching speed of the time-sharing selector switch in the first time-sharing unit is adjusted according to the negative correlation of the power ratio, wherein the switching speed is the time taken for all contacts of the time-sharing selector switch in the first time-sharing unit to complete the switching or the time interval between contact switching; or, the switching amount of the time-sharing selector switch is adjusted according to the negative correlation of the power ratio, wherein the switching amount is the number of contacts in the time-sharing selector switch in the first time-sharing unit that switch simultaneously.
[0019] By adopting the above technical solution, the switching parameters of the switch can be dynamically adapted according to the actual test power requirements, avoiding electrical faults such as arcing and sparking at the power contacts due to excessively fast switching or too many switching contacts at the same time. This effectively ensures the electrical safety of the power supply test process, protects the test equipment components from damage, and extends the service life of the equipment.
[0020] Optionally, the method further includes the following steps:
[0021] Get the duration of the second time-sharing unit completing the current test as the first current duration; get the duration of the second time-sharing unit completing the previous test as the first previous duration;
[0022] The ratio of the first current duration to the first previous duration is calculated as the first duration ratio; the first duration is adjusted according to the positive correlation of the first duration ratio.
[0023] By adopting the above technical solution, the interval between power supply testing and communication testing is dynamically adapted according to the fluctuation of the same test results of adjacent controllers under test. The greater the fluctuation, the longer the first interval is. This allows sufficient time for the test state to stabilize and recover, avoids interference from test result fluctuations on subsequent communication tests, and ensures the accuracy of the communication test.
[0024] Optionally, the method further includes the following steps:
[0025] Get the duration of the current test completed by the third time-sharing unit as the second current duration; get the duration of the previous test completed by the third time-sharing unit as the second previous duration;
[0026] The ratio of the second current duration to the second previous duration is calculated as the second duration ratio; the second duration is adjusted according to the positive correlation of the second duration ratio.
[0027] By adopting the above technical solution, the test interval between the second and third time-sharing units can be dynamically adapted according to the test duration fluctuation of the same communication test items of adjacent controllers under test. The greater the fluctuation of the test results, the longer the second duration is adjusted accordingly, so as to reserve time for the test state to stabilize and recover, and avoid the fluctuation of the preceding communication test from interfering with the subsequent communication test.
[0028] Optionally, the method further includes the following steps:
[0029] Get the duration of the second time-sharing unit completing the current test as the first current duration; get the duration of the second time-sharing unit completing the previous test as the first previous duration;
[0030] The ratio of the first current duration to the first previous duration is calculated as the first duration ratio.
[0031] Get the duration of the current test completed by the third time-sharing unit as the second current duration; get the duration of the previous test completed by the third time-sharing unit as the second previous duration;
[0032] The ratio of the second current duration to the second previous duration is calculated as the second duration ratio.
[0033] The ratio between the second duration ratio and the first duration ratio is calculated as the temporary duration ratio, and the second duration is adjusted according to the positive correlation of the temporary duration ratio.
[0034] By adopting the above technical solution, the overall fluctuation status of the communication test can be judged by combining the duration fluctuations of adjacent tests of the two types of communication test units. In this way, the test interval between the second and third time-sharing units can be dynamically adapted, making the adjustment of the interval duration more in line with the actual fluctuation of the communication test. This allows for a more accurate adaptation time to ensure the stable recovery of the test status, effectively avoids the interference of the superposition of the two types of communication test fluctuations on subsequent tests, and further improves the accuracy of the communication test results of the third time-sharing unit.
[0035] Optionally, the method further includes the following steps:
[0036] The time-division selection switch matrix between the second and third time-division units is set to a local interlock mode; wherein, the time-division selection switches in the time-division selection switch matrix used to connect to the second and third time-division units are independent, share the same communication line, and share the same set of time-division selection switches used to connect to the unit under test.
[0037] By adopting the above technical solutions, the equipment configuration is simplified through hardware sharing, reducing hardware costs and space occupation, and improving the utilization rate of equipment resources in the communication testing process. Furthermore, the design of independent switches and local interlocking avoids signal crosstalk and mutual interference between the two communication test units at the hardware level, ensuring the signal transmission stability and test result accuracy of CAN / CANFD and LIN communication tests.
[0038] Optionally, the method further includes the following steps:
[0039] The temporary fluctuation value is calculated as the percentage fluctuation of the temporary duration ratio within a preset reference duration.
[0040] If the temporary duration ratio is outside the preset reference ratio range, or if the temporary fluctuation value is outside the preset reference fluctuation range, then the second time-sharing unit and the third time-sharing unit exit the local interlocking mode, and the time-sharing selection switch matrix between the second time-sharing unit and the third time-sharing unit becomes completely independent.
[0041] By adopting the above technical solution, the advantages of hardware sharing, cost saving and efficient resource utilization of the local interlocking mode are retained when the test is normal. At the same time, when abnormal fluctuations occur during the test, the signal interference and test result distortion caused by shared lines and switches are avoided from the root cause by the hardware being completely independent. This effectively avoids the test risks under abnormal fluctuations and ensures the stability and accuracy of the communication test under abnormal conditions.
[0042] Secondly, this application provides a serial test system integrating multiple controllers, employing the following technical solution:
[0043] A serial test system integrating multiple controllers includes a processor, wherein the processor performs the steps of the serial test method integrating multiple controllers as described in any one of the preceding claims.
[0044] Thirdly, this application provides a storage medium, which adopts the following technical solution:
[0045] A storage medium storing a program that, when executed by a processor, implements the steps of the serial testing method for integrated multi-controllers as described above.
[0046] In summary, this application includes at least one of the following beneficial technical effects: By extracting independent test modules for power supply and two types of communication and building a time-division serial test array, combined with the physical isolation design of time-division start / stop of each unit and time-division selection switch, and the hardware sharing mode of partial interlocking in the communication test link, it not only significantly improves the resource utilization rate of the test equipment, but also simplifies the hardware configuration and reduces equipment and space occupation costs; at the same time, it dynamically adjusts the switching parameters of the power supply and communication test links for test power and transmission speed respectively, and with independent hardware design, it avoids interference such as electrical faults and signal crosstalk from the software and hardware level, ensuring the accuracy and stability of test results; and By differentiating the basic waiting time and dynamically adjusting the test interval based on the test duration fluctuations of single units and two types of communication units, the method achieves refined and intelligent control of the test sequence, effectively avoiding interference from fluctuations and their superposition, making the test process more orderly and improving overall test efficiency. In addition, the method can dynamically adapt to the test requirements of controllers with different power and transmission speed specifications, and can also intelligently switch the communication test hardware connection mode according to the test fluctuation status. It retains cost advantages when the test is normal and avoids test risks from the root when abnormal, significantly enhancing the test system's adaptability and fault tolerance, and ensuring stable and reliable operation of the system under different operating conditions. Attached Figure Description
[0048] Figure 1 This is a schematic diagram of the shared power supply for the test system.
[0049] Figure 2 This is a schematic diagram of the shared CAN / CANFD communication equipment in the test system.
[0050] Figure 3 This is a schematic diagram of the shared LIN communication devices in the test system. Detailed Implementation
[0052] The embodiments of this application are described in detail below, and examples of the embodiments are shown in the accompanying drawings.
[0053] In the description of this specification, the references to "certain embodiments," "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples" refer to specific features, structures, materials, or characteristics described in connection with the described embodiment or example, which are included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.
[0054] This application discloses a serial testing method integrating multiple controllers. This method expands multiple test channels based on a single core test device, enabling time-division serial testing of power supply, communication, and other requirements of multiple automotive controllers. It effectively solves problems such as low equipment utilization, high test interference, and poor timing coordination in traditional testing solutions. (Refer to...) Figures 1 to 3 Specifically, it includes the following steps:
[0055] Obtain a list of test equipment adapted for automotive electronic controller testing. Based on preset linkage test attributes, filter the equipment modules in the list and extract multiple elements with non-linkage test attributes as independent test modules. Each independent test module can carry out testing independently without linkage constraints in the test process. Specifically, the independent test modules include a power supply test module that meets the power supply test requirements of multiple controllers, a first communication test module corresponding to CAN / CANFD bus communication testing, and a second communication test module adapted to LIN bus communication testing. The three types of modules cover the core test dimensions of automotive electronic controllers.
[0056] Establish a time-division serial test array adapted for multi-controller cluster testing. This array includes:
[0057] Reference Figure 1 The first time-sharing unit is the time-sharing switching array corresponding to the power supply test module. The hardware carrier is a programmable power supply + programmable high-current relay array (1A / 1B, 2A / 2B...8A / 8B). Its function is to establish an electrical connection between the power supply test module and multiple controllers under test, and to realize the time-sharing switching and physical isolation of the power supply test channel through the on and off of the relays.
[0058] Reference Figure 2 The second time-division unit is a time-division switching array corresponding to the first communication test module (CAN / CANFD). The hardware carrier is a CAN / CANFD communication device + a programmable communication-level relay array (1A / 1B, 2A / 2B...8A / 8B). Its function is to establish an electrical connection between the CAN / CANFD communication test module and multiple controllers under test, and to realize the time-division switching and physical isolation of the CAN / CANFD communication test channel by switching the relays on and off.
[0059] Reference Figure 3 The third time-sharing unit is the time-sharing switching array corresponding to the second communication test module (LIN). The hardware carrier is a LIN communication device + a programmable communication-level relay array (1A, 2A...8A). Its function is to establish an electrical connection between the LIN communication test module and multiple controllers under test, and to realize the time-sharing switching and physical isolation of the LIN communication test channel through the on and off of the relays.
[0060] Obtain the time-sharing test sequence instruction planned according to the actual test task. Based on this instruction, start the first time-sharing unit, the second time-sharing unit, and the third time-sharing unit in sequence to carry out the corresponding test work. In order to avoid mutual interference between test links from the root, it is clear that the three time-sharing units do not perform test operations at the same time. When performing test operations, turn on the time-sharing selection switch in the corresponding time-sharing unit to establish an effective test channel. In the non-test state, turn off the corresponding time-sharing selection switch to achieve physical isolation of the test channel.
[0061] Differentiated design is adopted for the timing connection of time-sharing tests. After the first time-sharing unit completes the power supply test, it waits for a first duration before starting the second time-sharing unit to carry out the first communication test. After the second time-sharing unit completes the first communication test, it waits for a second duration before starting the third time-sharing unit to carry out the second communication test. The second duration is set to be shorter than the first duration to adapt to the process characteristics and circuit stability requirements of different test stages.
[0062] By adopting the above technical solutions, in terms of resource utilization, the "single core test module + time-division selection switch matrix" architecture design eliminates the need to configure a dedicated test module for each controller under test, achieving efficient reuse of various test module resources such as power supply and communication. This significantly improves equipment resource utilization while reducing equipment procurement and maintenance costs. In terms of test interference resistance, the physical isolation of test channels is achieved through the on / off control of time-division selection switches. Combined with the execution rules of time-division sequential testing, mutual interference problems such as power fluctuations and bus signal conflicts between different test stages and different controllers under test are completely avoided at the hardware level. In terms of test timing, the waiting time is designed with different lengths based on the process differences of different test stages. A longer first time is reserved after power supply testing to ensure circuit loop stability, and a shorter second time is set between communication tests to improve test connection efficiency. The timing connection logic of multi-controller serial testing is precisely optimized, making the serial testing process of multi-controllers more orderly and smoother. Overall, this method effectively improves the efficiency of serial testing of multiple automotive controllers while ensuring the stability of the testing process and the accuracy of the test results. It is suitable for clustered and batch serial testing scenarios of multiple controllers in the automotive electronics field, and can also simplify the layout of testing equipment and save laboratory space.
[0063] Optionally, considering the characteristics of high-current power supply of different specifications involved in the power supply testing of automotive electronic controllers, and to avoid electrical faults caused by mismatch between power and switching parameters, this method also specifically designs a time-sharing selection switching parameter dynamic adaptation adjustment strategy for the first time-sharing unit. This strategy achieves precise customized adjustment of switching parameters based on the actual power requirements of the unit under test, specifically including the following steps:
[0064] The system acquires the actual test power of the unit under test, which is the power supply test power value matching the rated power supply requirements of the vehicle controller under test. This power is obtained by the system acquiring the power parameters of the controller under test in real time. Simultaneously, it retrieves the pre-calibrated power supply test reference power. This reference power is a standard benchmark power value set based on the power supply test requirements of mainstream controllers in the automotive electronics field and matched with the rated hardware parameters of the first time-sharing unit. This benchmark power serves as the basis for adjusting the switching parameters. The ratio between the acquired actual test power and the preset reference power is calculated using the formula: Power Ratio = Actual Test Power / Preset Reference Power. This specific power ratio is then used as the core criterion for subsequent switching parameter adjustments.
[0065] Based on the calculated power ratio, the switching parameters of the time-sharing selector switch in the first time-sharing unit are dynamically adjusted strictly according to the negative correlation adjustment rule. The adjustment methods are divided into two types: switching speed adjustment and switching amount adjustment. One of them can be selected according to the actual test conditions. Both adjustment methods are set with specific adjustment logic corresponding to the power ratio, and all adjustment operations are implemented through software program control, which is compatible with the hardware characteristics of the programmable high-current relay of the first time-sharing unit. The switching speed is specifically defined as the total time taken for all contacts of the time-sharing selector switch in the first time-sharing unit to complete full switching, or the time interval between adjacent contacts sequentially switching on and off. The switching amount is specifically defined as the number of contacts of the time-sharing selector switch in the first time-sharing unit that simultaneously switch on and off states in a single switching operation.
[0066] Method 1: Adjust the switching speed of the time-sharing selector switch according to the negative correlation of the power ratio:
[0067] The system pre-sets the reference total switching time (the default time for all contacts to complete a full switch) and reference contact switching interval (the default time interval for adjacent contacts to switch sequentially) of the time-sharing selection switch in the first time-sharing unit. These reference parameters match the test requirements of the preset reference power, and the specific adjustment rules are as follows:
[0068] When the power ratio is greater than 1, it indicates that the actual test power of the unit under test is higher than the reference power, which belongs to the high power supply test scenario. In this case, the total switching time is increased proportionally to the power ratio, and the contact switching interval is adjusted proportionally. For example, if the power ratio is 1.5, the reference total switching time is 100ms, and the reference contact switching interval is 20ms, then the total switching time is adjusted to 150ms, and the contact switching interval is adjusted to 30ms. The larger the power ratio, the longer the total switching time and the longer the contact switching interval.
[0069] When the power ratio is 1, it indicates that the actual test power of the unit under test is completely matched with the reference power. At this time, the total reference switching time and the reference contact switching interval remain unchanged, and the switch switching is performed according to the default parameters.
[0070] When the power ratio is less than 1, it indicates that the actual test power of the unit under test is lower than the reference power, which is a low-power power supply test scenario. In this case, the total switching time is reduced proportionally to the power ratio, and the contact switching interval is also reduced proportionally (the reduced interval is not lower than the minimum safe switching interval of the hardware). For example, if the power ratio is 0.6, the reference total switching time is 100ms, the reference contact switching interval is 20ms, and the minimum safe switching interval of the hardware is 10ms, then the total switching time is adjusted to 60ms and the contact switching interval is adjusted to 12ms. The smaller the power ratio, the shorter the total switching time and the shorter the contact switching interval.
[0071] Method 2: Adjust the switching amount of the time-sharing selection switch according to the negative correlation of the power ratio:
[0072] The system pre-sets the reference switching quantity (default number of contacts switching simultaneously in a single operation) and the maximum safe switching quantity (upper limit number of contacts that the hardware is rated to support for simultaneous switching in a single operation) of the time-sharing selection switch in the first time-sharing unit. The reference switching quantity matches the test requirements of the preset reference power, and the maximum safe switching quantity is the safety threshold designed by the hardware to avoid electrical faults caused by excessive switching. The specific adjustment rules are as follows:
[0073] When the power ratio is greater than 1, it indicates that the actual test power of the unit under test is higher than the reference power, which belongs to the high power supply test scenario. In this case, the switching quantity is calculated by the reciprocal of the power ratio and rounded to the nearest integer. The larger the power ratio, the fewer contacts are switched at the same time in a single operation. For example, if the reference switching quantity is 8 and the maximum safe switching quantity is 10, when the power ratio is 2, the switching quantity is adjusted to 8 × (1 / 2) = 4. When the power ratio is 2.5, the switching quantity is adjusted to 3 (rounded to the nearest integer).
[0074] When the power ratio is 1, it indicates that the actual test power of the unit under test is completely matched with the reference power. At this time, the reference switching amount remains unchanged, and a single simultaneous switching is performed according to the default number.
[0075] When the power ratio is less than 1, it indicates that the actual test power of the unit under test is lower than the reference power, which is a low power supply test scenario. In this case, the switching amount is increased in reverse proportion to the power ratio based on the reference switching amount (the increased switching amount does not exceed the maximum safe switching amount). For example, if the reference switching amount is 8 and the maximum safe switching amount is 10, the switching amount can be adjusted to 10 when the power ratio is 0.5 (reaching the maximum safe threshold), and the switching amount can be adjusted to 9 when the power ratio is 0.8 (rounded down).
[0076] By adopting the above technical solution, based on the actual power test requirements of the controller under test, a graded, quantifiable, and implementable method for adjusting the switching parameters of the time-sharing selection switch of the first time-sharing unit can be provided, achieving precise matching between the switching control and the actual power requirements in the power testing process. For high-power power supply testing scenarios, by slowing down the switching speed and reducing the number of contacts switched simultaneously, electrical faults such as arcing, power surges, and current surges at high-current power contacts due to excessively fast switching and too many simultaneous contact switching are completely avoided at the hardware operation level, effectively eliminating electrical safety hazards under high-power testing. For low-power power supply testing scenarios, by appropriately increasing the switching speed and the number of switches per cycle within the hardware safety threshold range, the switching efficiency of the power supply testing process can be improved while ensuring electrical safety, avoiding unnecessary time consumption and balancing the safety and efficiency of power supply testing. Meanwhile, this precise parameter adjustment strategy can effectively reduce electrical erosion, mechanical wear and other losses of the time-sharing selection switch contacts, protect the core components such as the programmable high-current relays and switch contacts in the first time-sharing unit from damage, significantly reduce the failure rate and spare parts replacement cost of the test equipment, and extend the service life of the test equipment and the overall test system. In addition, the standardized graded adjustment rules also make the switch parameter adjustment more operable, adapting to the diverse power supply test needs of different power specification controllers in the automotive electronics field, further ensuring the operational stability of the power supply test process and the accuracy of the test data.
[0077] Optionally, considering the core requirements of distortion-free signal transmission and anti-interference for CAN / CANFD communication tests corresponding to the second time-sharing unit and LIN communication tests corresponding to the third time-sharing unit, as well as the large differences in transmission speed under different communication protocols of the controller under test, this method also designs a dynamic adjustment strategy for the switching amount of the time-sharing selection switch adapted to communication tests to avoid problems such as signal noise and transmission interruption caused by the mismatch between the switch switching amount and the communication transmission speed. This strategy is specifically designed to precisely control the switching amount of the time-sharing selection switch in the second and third time-sharing units, and includes the following steps:
[0078] Optionally, considering that the first time interval between the completion of the power supply test and the start of the CAN / CANFD communication test is a critical timing sequence to ensure the elimination of residual voltage and current in the power supply circuit and to achieve electrical stability, and that the hardware characteristics and power supply test conditions of different controllers under test differ, the communication test time of the second time-sharing unit may fluctuate. This fluctuation directly reflects the change in circuit stability requirements under the current test conditions. To avoid the problem that a fixed first time interval cannot adapt to the fluctuation of the test conditions, this method designs a dynamic adjustment strategy for the first time interval based on the fluctuation of the test time of the second time-sharing unit, so that the interval between the power supply test and the communication test accurately matches the actual test conditions. Specifically, it includes the following steps:
[0079] The system retrieves the actual time taken by the second time-sharing unit to complete the CAN / CANFD communication test of the current controller under test, and records it as the first current duration. This duration is the complete and effective time taken from the start of the test by the second time-sharing unit and the establishment of a valid communication channel to the completion of all message sending and receiving, bus monitoring and other test tasks and the normal closure of the channel. The system automatically removes invalid time such as human intervention and temporary equipment malfunctions during the test. At the same time, the system retrieves the actual effective time taken by the second time-sharing unit to complete the CAN / CANFD communication test of the previous controller under test of the same specification, and records it as the first previous duration. Both durations are valid test times under the same test standards and parameter configurations to ensure the validity and reference value of the duration comparison.
[0080] The ratio of the first current duration to the first previous duration is calculated using the formula: First Duration Ratio = First Current Duration / First Previous Duration. This ratio is a core quantitative indicator reflecting the fluctuations between two adjacent communication test conditions. The magnitude of the ratio directly reflects the complexity of the current test condition and the circuit stability requirements compared to the previous condition. Subsequently, based on the calculated first duration ratio, the first duration is dynamically adjusted strictly according to the positive correlation adjustment rule. The first duration is the waiting interval from when the first time-sharing unit completes the power supply test to when the second time-sharing unit starts the communication test. All adjustment operations are automatically completed by the system program control, and the adjusted first duration is always between the minimum stable duration of the hardware and the maximum reasonable interval duration. The minimum stable duration of the hardware is the basic threshold to ensure that the power circuit completes the electrical state recovery, and the maximum reasonable interval duration is the upper limit threshold to avoid excessive waiting leading to a decrease in test efficiency, thus balancing test stability and efficiency.
[0081] The specific positive correlation adjustment rule is as follows: The system pre-sets a baseline first duration to adapt to the normal test conditions. This baseline value is calibrated in conjunction with the general requirements for circuit stability after the automotive electronic controller power supply test, and serves as the basis for duration adjustment.
[0082] When the first duration ratio is greater than 1, it indicates that the second time-sharing unit takes longer to test the communication of the current controller, reflecting a more complex test condition or higher requirements for the stability of the power supply circuit due to the electrical characteristics of the controller under test. In this case, the reference first duration is adjusted proportionally to the first duration ratio, and the adjusted duration does not exceed the maximum reasonable interval duration. For example, if the reference first duration is 500ms, the maximum reasonable interval duration is 2000ms, and the first duration ratio is 1.8, then the first duration is adjusted to 900ms. The larger the first duration ratio, the longer the adjusted interval duration, allowing more time for the power supply circuit to recover stably.
[0083] When the first duration ratio is 1, it indicates that the time consumption of two adjacent communication tests in the second time-division unit is completely consistent, and there is no significant fluctuation between the current test condition and the previous test condition. At this time, the baseline first duration remains unchanged, and the timing connection is executed according to the default interval.
[0084] When the first duration ratio is less than 1, it indicates that the communication test time of the second time-division unit to the current controller is shorter, reflecting that the current test condition is simpler and the requirement for stable recovery of the power circuit is lower. At this time, the reference first duration is shortened proportionally according to the ratio of the first duration, and the shortened duration is not lower than the minimum stable duration of the hardware. For example, if the reference first duration is 500ms, the minimum stable duration of the hardware is 200ms, and the first duration ratio is 0.6, then the first duration is adjusted to 300ms. Under the premise of ensuring circuit stability, the waiting time is shortened and the efficiency of test timing is improved.
[0085] By adopting the above technical solution, the ratio of the time consumption of two adjacent communication tests in the second time-division unit can be used as a quantitative basis to accurately capture the fluctuations in the current test conditions. Based on this, the first duration from power supply testing to CAN / CANFD communication testing can be dynamically adapted, realizing intelligent and condition-based control of the test interval timing. When the first duration ratio is large and the test conditions fluctuate little, the first duration can be lengthened to provide more sufficient stabilization recovery time for the circuit after power supply testing, completely eliminating electrical interference factors such as residual voltage and current. This avoids problems such as signal noise, packet loss, and communication connection failure caused by the power supply circuit not being fully stable, thus ensuring the accuracy and stability of the communication test from a timing perspective. When the first duration ratio is small and the test conditions are simpler, the first duration can be shortened within the hardware safety threshold, effectively reducing meaningless waiting time, optimizing the overall timing connection efficiency of multi-controller serial testing, and avoiding test efficiency loss caused by fixed long intervals. Meanwhile, this adjustment strategy is automatically collected by the system to collect test duration, calculate ratios, and complete the adjustment, without the need for manual intervention to set interval durations. It is suitable for the batch and cluster-based serial testing needs of multiple controllers in the automotive electronics field, significantly reducing the workload of manual debugging. In addition, through precise timing control, it can also avoid electrical linkage interference between communication test modules and power supply test modules caused by excessively short intervals, protect the operational safety of core hardware such as programmable relays and communication modules, reduce the probability of equipment failure caused by timing conflicts, further improve the operational stability and service life of the entire test system, and make the timing connection of multi-controller serial testing more in line with actual test conditions, taking into account both test accuracy and overall efficiency.
[0086] Optionally, considering that the second duration is a critical interval between the completion of the CAN / CANFD communication test by the second time-sharing unit and the start of the LIN communication test by the third time-sharing unit, this duration is mainly used to eliminate signal residue on the CAN / CANFD bus and reset the signal state of the communication loop. However, the LIN communication protocol configuration and hardware communication interface characteristics of different vehicle controllers under test vary, which can cause fluctuations in the LIN communication test time of the third time-sharing unit. These fluctuations directly reflect the changes in the signal stability recovery requirements of the communication loop under the current test conditions. If a fixed second duration is used, insufficient duration may lead to signal interference, or excessive duration may reduce test efficiency. Therefore, this method specifically designs a dynamic adjustment strategy for the second duration based on the fluctuation of the test duration of the third time-sharing unit, so that the interval between the CAN / CANFD communication test and the LIN communication test accurately matches the actual communication test conditions. Moreover, this adjustment strategy is adapted to the first duration adjustment logic, always maintaining a differentiated setting where the second duration is generally shorter than the first duration. Specifically, it includes the following steps:
[0087] The actual effective time taken by the third time-sharing unit to complete the LIN communication test of the current controller under test is recorded as the second current duration. This duration is the complete time taken from the start of the test by the third time-sharing unit, the establishment of an independent LIN communication link with the controller under test, to the completion of all preset test tasks such as LIN message sending and receiving, bus monitoring, and normal disconnection of the communication channel. The system will automatically remove non-test invalid time such as temporary standby of the device and manual operation intervention during the test to ensure the authenticity of the duration data. At the same time, the actual effective time taken by the third time-sharing unit to complete the LIN communication test of the previous controller under test with the same specifications and parameters is retrieved from the system background and recorded as the second previous duration. Both durations are based on the same LIN communication test standard, the same message sending frequency, and the same monitoring parameter collection to ensure the validity and reference of the comparison between the two adjacent durations, and to provide an accurate data basis for subsequent ratio calculation and duration adjustment.
[0088] Based on the standardized ratio calculation of the second current duration and the second previous duration, the specific second duration ratio is obtained using the formula: Second Duration Ratio = Second Current Duration / Second Previous Duration. This ratio is a core quantitative indicator reflecting the degree of fluctuation between two adjacent LIN communication test conditions. The magnitude of the ratio directly reflects the complexity of the current LIN communication test condition of the controller under test, as well as the actual requirement for the communication loop to recover from the CAN / CANFD test state to the LIN test-ready state. Subsequently, based on the calculated second duration ratio, the second duration is dynamically adjusted according to the positive correlation adjustment rule, where the second duration is the [missing information - likely a specific value or value]. The waiting interval between the completion of the second time-sharing unit test and the start of the third time-sharing unit test is all adjusted automatically by the test system. The adjusted second time is always limited between the minimum stable time of the communication loop and the maximum reasonable interval time of the communication test. The minimum stable time of the communication loop is the hardware basic threshold that ensures the complete elimination of CAN / CANFD bus signal residue and the completion of the communication module's state reset. The maximum reasonable interval time of the communication test is the upper limit threshold that avoids excessive waiting time from causing the overall test timing to be delayed. At the same time, this threshold is always lower than the maximum reasonable interval time of the first time, which conforms to the overall timing design principle that the second time is shorter than the first time.
[0089] The specific positive correlation adjustment rule is as follows: The system pre-determines a second baseline duration adapted to conventional test conditions by combining the general requirements of LIN communication testing in the automotive electronics field and the normal time consumption of CAN / CANFD bus signal reset. This baseline value is significantly lower than the first baseline duration and serves as the basis for adjusting the second duration. The adjustment is implemented in three levels:
[0090] When the second duration ratio is greater than 1, it indicates that the third time-division unit takes longer to perform LIN communication tests on the current controller, reflecting a more complex test condition or a weaker anti-interference capability of the communication interface of the controller under test against the preceding CAN / CANFD signals, requiring a longer reset time for the communication loop. In this case, the reference second duration is proportionally increased by a multiple of the second duration ratio, and the increased duration does not exceed the maximum reasonable interval duration for communication testing. For example, if the reference second duration is 200ms, the maximum reasonable interval duration for communication testing is 800ms, and the second duration ratio is 1.5, then the second duration is adjusted to 300ms. The larger the second duration ratio, the longer the adjusted interval duration, allowing more time for communication loop signal reset and state stabilization.
[0091] When the second duration ratio is 1, it indicates that the time consumption of the two adjacent LIN communication tests in the third time-division unit is completely consistent. The current test condition is not significantly different from the previous condition. The stable recovery requirement of the communication circuit is consistent with the normal condition. At this time, the baseline second duration remains unchanged, and the timing connection of the CAN / CANFD to LIN communication test is performed at the default interval.
[0092] When the second duration ratio is less than 1, it indicates that the third time-sharing unit takes less time to test the LIN communication of the current controller, reflecting a simpler current test condition and a lower requirement for the communication loop to recover from the CAN / CANFD test state. In this case, the reference second duration is shortened proportionally according to the second duration ratio, and the shortened duration is not less than the minimum stable duration of the communication loop. For example, if the reference second duration is 200ms, the minimum stable duration of the communication loop is 100ms, and the second duration ratio is 0.7, then the second duration is adjusted to 140ms. Under the premise of ensuring the stability of the communication loop and no residual signal interference, the waiting time is shortened to the maximum extent, and the timing connection efficiency of the communication test link is improved.
[0093] By adopting the above technical solution, the ratio of the time consumption of two adjacent LIN communication tests in the third time-division unit can be used as a quantitative basis to accurately capture the fluctuations in the current communication test conditions, and dynamically adapt the second duration of the CAN / CANFD to LIN communication test accordingly, thereby realizing intelligent and condition-based precise control of the interval timing of the communication test process. When the second duration ratio is too large and the test conditions fluctuate significantly, lengthening the second duration can effectively eliminate signal residue on the CAN / CANFD bus, allowing the communication test module to complete the state reset from CAN / CANFD mode to LIN mode. This completely avoids signal fluctuations from preceding CAN / CANFD communication tests interfering with subsequent LIN communication tests, preventing issues such as message errors, communication handshake failures, and signal noise on the LIN bus. This ensures the accuracy and stability of the LIN communication test from a timing perspective. When the second duration ratio is too small and the test conditions are simpler, shortening the second duration within the hardware safety threshold effectively reduces meaningless waiting time in the communication test, optimizes the overall timing flow of multi-controller serial testing, avoids test efficiency losses caused by fixed interval durations, and maintains a differentiated design where the second duration is shorter than the first duration, aligning with the differences in process characteristics between power supply testing and communication testing, as well as different types of communication tests. Furthermore, this adjustment strategy automatically completes the duration acquisition, ratio calculation, and parameter adjustment by the test system, eliminating the need for manual intervention to set the interval duration. This significantly reduces the manual debugging workload for batch and clustered multi-controller serial testing in the automotive electronics field, improving the automation level of the testing process. At the same time, precise timing control can also avoid signal interference between CAN / CANFD and LIN communication modules caused by excessively short intervals, protecting the operational safety of core hardware such as programmable communication relays and communication test modules, reducing the probability of equipment failures caused by timing conflicts, further improving the operational stability and hardware lifespan of the entire test system, and making the timing connection of the communication links in multi-controller serial testing more closely match the actual test conditions, maximizing overall test efficiency while ensuring test accuracy.
[0094] Optionally, considering that the second duration serves as the interval between CAN / CANFD communication testing and LIN communication testing, its core function is to eliminate signal cross-interference between the two types of buses and reset the working mode of the communication module. However, in actual testing, the fluctuations of the CAN / CANFD test in the second time-sharing unit and the LIN test in the third time-sharing unit are not independent; the fluctuations of the two types of communication tests may overlap. Adjusting the second duration solely based on the fluctuations of the LIN test duration is difficult to accurately match the overall fluctuation state of the communication test, and may easily lead to a mismatch between the interval duration and the actual fluctuation requirements. Therefore, this method, based on single-dimensional adjustment, designs a two-dimensional comprehensive adjustment strategy that combines the fluctuations of the two types of communication test units. By integrating the duration fluctuation ratios of CAN / CANFD and LIN communication tests, a comprehensive quantitative index is calculated to dynamically adjust the second duration, making the adjustment of the interval duration more closely match the overall actual working conditions of the communication test, while still strictly adhering to the differentiated timing design principle that the second duration is shorter than the first duration. Specifically, it includes the following steps:
[0095] The actual effective time taken by the second time-sharing unit to complete the CAN / CANFD communication test of the current controller under test is recorded as the first current duration. This duration is the complete time taken from the start of the test by the second time-sharing unit, the establishment of an independent CAN / CANFD communication link, to the completion of all preset test tasks such as message transmission and reception, bus monitoring, and protocol matching, and the normal disconnection of the channel. The system automatically excludes non-test invalid time such as manual intervention and temporary equipment standby. At the same time, the actual effective time taken by the second time-sharing unit to complete the CAN / CANFD communication test of the previous controller under test with the same specifications and parameters, as recorded in the system background, is recorded as the first previous duration. Both durations are collected based on a unified test standard, the same bus baud rate, and the same test procedure to ensure the validity of the duration comparison. Based on the collected first current duration and first previous duration, the specific first duration ratio is calculated using the formula First Duration Ratio = First Current Duration / First Previous Duration. This ratio is a quantitative indicator reflecting the degree of fluctuation between two adjacent operating conditions in the CAN / CANFD communication test.
[0096] The actual effective time taken by the third time-sharing unit to complete the LIN communication test of the current controller under test is recorded as the second current duration. This duration is the complete time taken from the start of the test by the third time-sharing unit, the establishment of a stable LIN communication link with the controller under test, to the completion of all LIN message transmission and reception, bus status monitoring, and normal closure of the communication channel, excluding any invalid time. Simultaneously, the actual effective time taken by the third time-sharing unit to complete the LIN communication test of the previous controller under test with the same specifications and parameters is retrieved and recorded as the second previous duration. Both durations follow a unified LIN test protocol and parameter standard to ensure data reliability. Based on the collected second current duration and second previous duration, the specific second duration ratio is calculated using the formula: second duration ratio = second current duration / second previous duration. This ratio is a quantitative indicator reflecting the degree of fluctuation between two adjacent operating conditions in the LIN communication test phase.
[0097] Based on the first and second duration ratios calculated above, a comprehensive quantitative calculation is performed. The temporary duration ratio is calculated using the formula: Temporary Duration Ratio = Second Duration Ratio / First Duration Ratio. This ratio is a core comprehensive quantitative indicator that integrates the fluctuations of both CAN / CANFD and LIN communication tests. Its value directly reflects the degree of change of LIN communication test fluctuations relative to CAN / CANFD communication test fluctuations, and can accurately reflect the overall fluctuation status of the communication test process. Subsequently, based on the calculated temporary duration ratio, the second duration is dynamically adjusted in strict accordance with the positive correlation adjustment rules. All adjustment operations are automatically completed by the test system, and the adjusted second duration is always limited between the minimum stable duration of the communication loop and the maximum reasonable interval duration of the communication test. The minimum stable duration of the communication loop is the hardware basic threshold that ensures the complete elimination of residual signals of both types of buses and the completion of mode reset of the communication module. The maximum reasonable interval duration of the communication test is the upper limit threshold that avoids excessive waiting time from losing test efficiency. At the same time, this upper limit threshold is always lower than the maximum reasonable interval duration of the first duration.
[0098] The specific positive correlation adjustment rule is as follows: The system pre-calculates a second benchmark duration adapted to normal comprehensive operating conditions by combining the common fluctuation characteristics of two types of communication tests in the automotive electronics field and the conventional time consumption of bus signal reset. This benchmark value is significantly lower than the first benchmark duration, serving as the basis for dual-dimensional adjustment. The specific adjustment is implemented in three standardized levels:
[0099] When the temporary duration ratio is greater than 1, it indicates that the fluctuation of the LIN communication test is greater than that of the CAN / CANFD communication test. The overall fluctuation of the communication test is biased towards the LIN side. Under the current conditions, a longer interval is required to complete the signal cancellation and module reset of the two types of buses. At this time, the reference second duration is proportionally increased by a multiple of the temporary duration ratio, and the increased duration does not exceed the maximum reasonable interval duration of the communication test. For example, if the reference second duration is 200ms, the maximum reasonable interval duration of the communication test is 800ms, and the temporary duration ratio is 1.6, then the second duration is adjusted to 320ms. The larger the temporary duration ratio, the longer the adjusted interval duration, allowing more time for the overall stability of the communication test.
[0100] When the temporary duration ratio is 1, it indicates that the fluctuation of the LIN communication test is completely matched with the fluctuation of the CAN / CANFD communication test. The overall fluctuation of the communication test is at a normal level. At this time, the second baseline duration is kept unchanged, and the timing connection of the two types of communication tests is performed according to the default interval, taking into account both state stability and test efficiency.
[0101] When the temporary duration ratio is less than 1, it indicates that the fluctuation of LIN communication test is smaller than that of CAN / CANFD communication test, the overall fluctuation of the communication test is lower, and the stability requirement for the interval duration is correspondingly reduced. At this time, the baseline second duration is shortened proportionally according to the ratio of the temporary duration, and the shortened duration is not lower than the minimum stable duration of the communication loop. For example, if the baseline second duration is 200ms, the minimum stable duration of the communication loop is 100ms, and the temporary duration ratio is 0.6, then the second duration is adjusted to 120ms. Under the premise of ensuring that there is no cross signal interference between the two types of communication tests, the waiting time is shortened to the maximum extent, and the timing connection efficiency of the communication test is optimized.
[0102] By adopting the above technical solution, the limitations of single-dimensional adjustment are overcome. The fluctuations of adjacent operating conditions in CAN / CANFD and LIN communication tests are integrated and analyzed. Using the temporary duration ratio as a comprehensive quantitative indicator, the overall fluctuation state of the communication test is accurately determined. Based on this, the test interval between the second and third time-sharing units is dynamically adapted, upgrading the second duration adjustment from single-dimensional adaptation to dual-dimensional comprehensive matching, which better reflects the actual fluctuation situation of the communication test. For operating conditions where fluctuations from the two types of communication tests overlap, by lengthening the second duration, more precise adaptation time is reserved for the communication module to complete the working mode reset and eliminate signal cross-interference between the two types of buses. This effectively avoids signal noise, message errors, and communication handshake failures caused by the overlap of CAN / CANFD and LIN test fluctuations in subsequent LIN communication tests, further improving the accuracy and reliability of the LIN communication test results in the third time-sharing unit from a timing perspective. For operating conditions with low overall fluctuation, shortening the second duration within the hardware safety threshold can effectively reduce meaningless waiting in the communication test process, optimize the overall timing flow of multi-controller serial testing, avoid test efficiency loss caused by excessively reserved interval duration, and always maintain the differentiated design of the second duration being shorter than the first duration, which is in line with the process characteristics differences between power supply testing and communication testing, and between different types of communication testing. Furthermore, this adjustment strategy is fully automated by the testing system, handling duration acquisition, ratio calculation, and parameter adjustment without manual intervention. This significantly improves the automation and intelligence of the testing process, making it suitable for batch and cluster-based multi-controller serial testing needs in the automotive electronics field. Simultaneously, precise comprehensive timing control avoids signal interference between the two types of communication modules caused by unreasonable interval durations, protecting the operational safety of core hardware such as programmable communication relays, CAN / CANFD communication modules, and LIN communication modules. It reduces the probability of equipment failures caused by signal cross-interference and timing conflicts, further enhancing the operational stability and hardware lifespan of the entire testing system. This ensures that the timing of communication links in multi-controller serial testing better matches actual comprehensive operating conditions, maximizing overall testing efficiency while guaranteeing testing accuracy.
[0103] Optionally, to further improve the hardware resource reuse rate in the communication testing phase while ensuring that CAN / CANFD and LIN communication tests are independent and free from signal cross-interference, and to simplify the hardware configuration of the time-sharing selection switch matrix, deeply aligning with the core design philosophy of high integration, low cost, and space saving of this test system, this method specifically configures the time-sharing selection switch matrix corresponding to the second time-sharing unit (corresponding to CAN / CANFD communication test) and the third time-sharing unit (corresponding to LIN communication test) into a local interlocking mode, considering the hardware connection characteristics of the two units. This mode is a further optimization of the core architecture of "master device + programmable relay branch", taking into account both the requirements of hardware resource sharing and physical isolation of test channels. The specific hardware connection and interlocking design rules are as follows: the time-sharing switch matrix shared by the second and third time-sharing units... In the hardware topology of the selector switch matrix, the core hardware connection nodes of the two types of units are designed differently. Among them, the time-sharing selector switch is specifically used to establish a one-to-one connection with the main CAN / CANFD communication module of the second time-sharing unit and the main LIN communication module of the third time-sharing unit. It maintains a completely independent hardware setting with no connection overlap or signal communication. The test channels of the two types of time-sharing units share the same set of dedicated communication lines adapted to automotive electronic controllers. They also share the same set of time-sharing selector switches used to establish electrical connections with the communication interfaces of multiple units under test. This ultimately forms a locally interlocked hardware layout of "independent main module access switches, shared communication transmission links, and shared connection switches of units under test". Moreover, the on / off control of all switches is implemented by system programmable control, which is highly compatible with the signal transmission characteristics of programmable communication-level relays.
[0104] By adopting the above technical solutions, in terms of hardware resource utilization and cost control, relying on the differentiated design of "independent + shared" in the local interlocking mode, it is not necessary to configure separate communication transmission lines, test unit connection switch groups and interface modules for CAN / CANFD and LIN communication tests. This significantly reduces the amount of hardware components such as programmable communication-level relay contacts, communication cables, and adapter interfaces in the time-division selector switch matrix, directly reducing the hardware procurement and manufacturing costs of the test system. At the same time, it simplifies the hardware layout of the communication test link, reduces the overall footprint of the equipment, and highly complements the "1 main 8 branch" core expansion architecture, further improving the space utilization and hardware resource reuse rate of the test system, making the equipment configuration of the communication test link more in line with the integrated requirements of cluster-based multi-controller testing. In terms of testing anti-interference and signal stability, the time-division selection switches connected to the main communication modules of the two time-division units were designed to be completely independent. A locally interlocked hardware isolation barrier was built from the signal access source of the communication test. Combined with the execution rules of the second and third time-division units testing in sequence, the signal communication path between the CAN / CANFD and LIN communication test units was completely cut off at the hardware level. This effectively avoided mutual interference problems such as signal crosstalk, bus conflict, and signal noise between the two communication test units, ensuring the high-speed distortion-free transmission of the CAN / CANFD bus and the stable low-speed communication of the LIN bus. This ensured the accurate conduct of core test tasks such as message transmission and reception, bus status monitoring, and protocol matching. Furthermore, this local interlocking mode is achieved solely through differentiated hardware topology design, requiring no hardware modifications to the CAN / CANFD and LIN main communication devices. It also allows for flexible mode switching via software control. Subsequent adjustments to the communication test configuration can be made simply by modifying the control logic of the switch matrix in software. This enhances the flexibility and maintainability of the test system, reduces system upgrade and debugging costs, and ultimately ensures signal transmission stability and test result accuracy for CAN / CANFD and LIN communication tests while achieving hardware simplification.
[0105] Optionally, to address sudden fluctuations in operating conditions during communication testing and to avoid risks such as signal interference and test data distortion caused by abnormal fluctuations due to the shared hardware characteristics in the local interlocking mode, this method designs a corresponding dynamic fault-tolerant switching mechanism for the local interlocking modes of the second and third time-division units. This mechanism uses the ratio of temporary duration reflecting the overall fluctuation state of communication testing as the core monitoring indicator. By monitoring its value changes and fluctuation amplitude in real time, it determines whether the test conditions are normal and automatically switches the hardware mode accordingly, ensuring that the hardware configuration for communication testing is accurately adapted to the actual test conditions. Specifically, it includes the following steps:
[0106] The system first pre-calibrates two types of core judgment thresholds and monitoring cycles. The first is a preset reference duration, which is set in conjunction with the conventional working conditions of batch serial testing of multiple controllers in the automotive electronics field. It can be the duration of continuous testing of N controllers or a fixed time period (such as 5 minutes), serving as the time range for collecting temporary duration ratios. The second is a preset reference ratio range, which is calibrated based on the statistical data of temporary duration ratios under conventional testing conditions. It is the numerical boundary for determining whether a single comprehensive fluctuation is normal. The third is a preset reference fluctuation range, which is a reasonable threshold for the percentage fluctuation of the temporary duration ratio within the reference duration. It is the core basis for determining whether the comprehensive fluctuation amplitude over a period of time is normal. During the multi-controller serial testing process, the system continuously collects and records the temporary duration ratio corresponding to each controller under test within a preset reference duration, forming a complete ratio data sequence. Then, according to the fluctuation percentage calculation formula: Temporary fluctuation value = (maximum temporary duration ratio within the reference duration - minimum temporary duration ratio within the reference duration) / average temporary duration ratio within the reference duration × 100%, the temporary fluctuation value within that time period is calculated. This value intuitively reflects the intensity of the overall fluctuation in the communication test process.
[0107] After data acquisition and calculation, the system performs real-time verification of two judgment conditions. If the temporary duration ratio exceeds the preset reference ratio range (i.e., the comprehensive fluctuation of a single communication test exceeds the normal value boundary), or the temporary fluctuation value exceeds the preset reference fluctuation range (i.e., the comprehensive fluctuation amplitude of the communication test is too large over a period of time), the system will immediately trigger a hardware mode switching command to control the second and third time-sharing units to exit the partial interlocking mode and adjust the corresponding time-sharing selection switch matrices to a completely independent mode. In the completely independent mode, the hardware connection of the second and third time-sharing units achieves full-link physical isolation, and no longer retains any shared hardware parts. Not only are the originally independent main communication module access switches kept separate, but the originally shared communication lines and the time-sharing selection switch groups used to connect to the unit under test are also independently split, each configured with its own dedicated hardware link and switch matrix. CAN / CANFD communication test and LIN communication test form two independent test channels with no overlap, and the on / off and control of all hardware are executed completely independently.
[0108] By adopting the above technical solution, dynamic adaptation of the hardware modes of the second and third time-sharing units under different operating conditions is achieved. This allows the hardware sharing advantages of the partial interlocking mode to complement the anti-interference advantages of the completely independent mode, balancing cost control and test stability under abnormal operating conditions. Under normal test conditions, the system maintains the partial interlocking mode. Based on the design of "independent main module access switch and shared communication line and test unit connection switch," hardware configuration is simplified, the number of components used is reduced, and hardware procurement and maintenance costs are lowered. Simultaneously, equipment footprint is saved, and hardware resource utilization in the communication test phase is improved. However, when abnormal fluctuations occur in the communication test phase, and the temporary duration ratio or its fluctuation amplitude exceeds a preset threshold, the system automatically switches to the completely independent mode. Through full-link hardware physical isolation, the signal transmission path between CAN / CANFD and LIN communication tests is fundamentally cut off. This completely avoids signal crosstalk, bus conflicts, and test result distortion problems that may arise from shared lines and switches under the partial interlocking mode, effectively mitigating test risks under abnormal fluctuations. Furthermore, this fault-tolerant switching mechanism is fully automated by the test system, from the acquisition of temporary duration ratios and the calculation of temporary fluctuation values to condition determination and mode switching, all without manual intervention. It boasts a fast response speed, adapting to the batch and cluster-based serial testing needs of multiple controllers in the automotive electronics field, and will not interrupt the normal testing process due to mode switching. Simultaneously, mode switching only adjusts the hardware connection status of the time-division selection switch matrix, without changing the core parameters and test logic of the main test equipment. This ensures the continuity and stability of communication testing under abnormal conditions, further improving the accuracy and reliability of CAN / CANFD and LIN communication test results. In addition, this mechanism also protects core hardware such as programmable communication-grade relays and communication lines, preventing electrical losses caused by signal cross-impact under abnormal fluctuations, reducing the probability of equipment failure, and extending hardware lifespan.
[0109] This application also discloses a serial test system integrating multiple controllers, including a processor, wherein the processor executes the steps of the serial test method integrating multiple controllers as described in any of the above embodiments.
[0110] This application also discloses a storage medium storing a program that, when executed by a processor, implements the steps of the serial testing method for integrated multi-controllers described above.
[0111] Although embodiments of this application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting this application. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of this application.
Claims
1. A serial testing method integrating multiple controllers, characterized in that, Includes the following steps: Obtain the test equipment list, and extract multiple elements with non-linkage test attributes from the test equipment list according to the preset linkage test attributes as independent test modules. The independent test modules include a power supply test module, a first communication test module, and a second communication test module. A time-division serial test array is established, comprising a first time-division unit, a second time-division unit, and a third time-division unit, each having multiple time-division selection switch matrices. Each time-division selection switch matrix contains multiple time-division selection switches, which are used to simultaneously connect multiple controllers under test. The first, second, and third time-division units are also used to simultaneously connect multiple controllers under test. The first time-division unit is used to establish an electrical connection between the power supply test module and multiple controllers under test; the second time-division unit is used to establish an electrical connection between the first communication test module and multiple controllers under test; and the third time-division unit is used to establish an electrical connection between the second communication test module and multiple controllers under test. Obtain the time-sharing test sequence instruction, and start the first time-sharing unit, the second time-sharing unit, and the third time-sharing unit in sequence according to the time-sharing test sequence instruction. The first time-sharing unit, the second time-sharing unit, and the third time-sharing unit are not tested at the same time. During testing, the time-sharing selection switch is turned on; when not testing, the time-sharing selection switch is turned off. After the first time-sharing unit test is completed, wait for the first duration before testing the second time-sharing unit; after the second time-sharing unit test is completed, wait for the second duration before testing the third time-sharing unit; the second duration is shorter than the first duration.
2. The serial testing method for integrated multi-controllers according to claim 1, characterized in that, The method also includes the following steps: Obtain the test power of the unit under test, and calculate the power ratio as the ratio of the test power to the preset reference power; The switching speed of the time-sharing selector switch in the first time-sharing unit is adjusted according to the negative correlation of the power ratio, wherein the switching speed is the time taken for all contacts of the time-sharing selector switch in the first time-sharing unit to complete the switching or the time interval between contact switching; or, the switching amount of the time-sharing selector switch is adjusted according to the negative correlation of the power ratio, wherein the switching amount is the number of contacts in the time-sharing selector switch in the first time-sharing unit that switch simultaneously.
3. The serial testing method for integrated multi-controllers according to claim 1, characterized in that, The method also includes the following steps: Get the duration of the second time-sharing unit completing the current test as the first current duration; get the duration of the second time-sharing unit completing the previous test as the first previous duration; The ratio of the first current duration to the first previous duration is calculated as the first duration ratio. The first duration is adjusted based on a positive correlation with the first duration ratio.
4. The serial testing method for integrated multi-controllers according to claim 1 or 3, characterized in that, The method also includes the following steps: Get the duration of the current test completed by the third time-sharing unit as the second current duration; get the duration of the previous test completed by the third time-sharing unit as the second previous duration; The ratio of the second current duration to the second previous duration is calculated as the second duration ratio. The second duration is adjusted based on a positive correlation with the second duration ratio.
5. The serial testing method for integrated multi-controllers according to claim 1, characterized in that, The method also includes the following steps: Get the duration of the second time-sharing unit completing the current test as the first current duration; get the duration of the second time-sharing unit completing the previous test as the first previous duration; The ratio of the first current duration to the first previous duration is calculated as the first duration ratio. The duration for the third time-sharing unit to complete the current test is obtained as the second current duration; The duration of the third time-sharing unit completing the previous test is the duration of the second previous test; The ratio of the second current duration to the second previous duration is calculated as the second duration ratio. The ratio between the second duration ratio and the first duration ratio is calculated as the temporary duration ratio, and the second duration is adjusted according to the positive correlation of the temporary duration ratio.
6. The serial testing method for integrated multi-controllers according to claim 5, characterized in that, The method also includes the following steps: The time-division selection switch matrix between the second and third time-division units is set to a local interlock mode; wherein, the time-division selection switches in the time-division selection switch matrix used to connect to the second and third time-division units are independent, share the same communication line, and share the same set of time-division selection switches used to connect to the unit under test.
7. The serial testing method for integrated multi-controllers according to claim 6, characterized in that, The method also includes the following steps: The temporary fluctuation value is calculated as the percentage fluctuation of the temporary duration ratio within a preset reference duration. If the temporary duration ratio is outside the preset reference ratio range, or if the temporary fluctuation value is outside the preset reference fluctuation range, then the second time-sharing unit and the third time-sharing unit exit the local interlocking mode, and the time-sharing selection switch matrix between the second time-sharing unit and the third time-sharing unit becomes completely independent.
8. A serial test system integrating multiple controllers, characterized in that, Includes a processor, wherein the steps of the serial test method for an integrated multi-controller system as described in any one of claims 1-7 are performed.
9. A storage medium, characterized in that, The storage medium stores a program that, when executed by a processor, implements the steps of the serial testing method for integrated multi-controllers as described in any one of claims 1-7.