Electronic device testing method, system, computer device, and storage medium

Abstract

This invention relates to a testing method, system, computer device, and storage medium for electronic devices. The method includes: receiving user-defined test parameters through a graphical configuration platform; generating a structured test file based on the test parameters, the structured test file including a directed graph model consisting of nodes and transition edges to describe the test process, wherein the nodes indicate test states and / or test actions, and the transition edges indicate state triggering conditions; loading and interpreting the structured test file, generating standardized action instructions based on the interpretation results, converting the standardized action instructions into a control protocol for a specific physical test device, driving the electronic device to perform corresponding test actions according to the nodes of the structured test file, and transferring test states according to the transition edges defined in the directed graph model. This invention enables streamlined and automated testing of electronic devices.

Description

Technical Field

[0001] This invention relates to the field of testing, and more particularly to a testing method, system, computer equipment, and storage medium for electronic devices. Background Technology

[0002] With the increasing popularity of wireless communication products such as Bluetooth headsets, smart speakers, and wearable devices, their functional complexity is constantly increasing, leading to highly diversified and rapidly iterating testing requirements.

[0003] In existing technologies, the test logic of most automated testing systems is typically implemented using hard-coded methods, meaning that test steps, timing controls, and parameter thresholds are all fixed in the program source code. This approach requires significant human intervention, necessitating detailed manual definition of each step, including its start and end points. These test processes are implemented by developers through coding, leading to excessive human involvement, long compilation and deployment cycles, and difficulty in adapting to agile development paces.

[0004] It is evident that existing testing methods and systems are insufficient to meet testing requirements. Summary of the Invention

[0005] In order to solve the above-mentioned technical problems, or at least partially solve the above-mentioned technical problems, the present invention provides an electronic device testing method, system, computer device and storage medium.

[0006] In a first aspect, the present invention provides a method for testing electronic devices, the method comprising: Receive user-defined test parameters through a graphical configuration platform; Based on the test parameters, a structured test file is generated. The structured test file includes a directed graph model consisting of nodes and transition edges to describe the test process. The nodes are used to indicate test states and / or test actions, and the transition edges are used to indicate state triggering conditions. The structured test file is loaded and interpreted, standardized action instructions are generated based on the interpretation results, the standardized action instructions are converted into control protocols for specific physical test equipment, the electronic equipment is driven to perform corresponding test actions according to the nodes of the structured test file, and the test state is transferred according to the migration edges defined by the directed graph model.

[0007] Optionally, the steps of loading and interpreting the structured test file, generating standardized action instructions based on the interpretation results, converting the standardized action instructions into a control protocol for a specific physical test device, driving the electronic device to perform corresponding test actions according to the nodes of the structured test file, and transitioning the test state according to the migration edges defined by the directed graph model include: The structured test file is loaded and interpreted by the model interpretation and execution engine to obtain the starting node, ending node, node sequence, and triggering conditions corresponding to the migration edge; Retrieve the test atomic operations and execution parameters bound to all nodes; Starting from the starting node and ending node, the structured test file is executed according to the test atomic operations and execution parameters bound to the nodes, the node sequence, and the triggering conditions corresponding to the migration edges.

[0008] Optionally, the execution of the structured test file from the starting node to the ending node, based on the test atomic operations bound to the nodes, the execution parameters, the node sequence, and the triggering conditions corresponding to the migration edges, includes: Based on the execution parameters, execute the test atomic operation bound to the current node; Based on the node sequence, obtain at least one next node of the current node; Obtain the migration edges between the current node and all next nodes; Determine whether the triggering condition corresponding to any migration edge is met; If the triggering condition for any migration edge is met, then the user is transferred to the next node corresponding to the migration edge that meets the triggering condition.

[0009] Optionally, the method further includes a hot-loading step: The hot loading includes: Real-time monitoring of changes to the structured test files; If a change to the structured test file is detected and the test of the electronic device is not completed, the changed structured test file is preloaded in the background backup memory area, and the execution status of the structured test file before the change is continuously monitored. When a predefined safe node is reached, the execution pointer is switched so that it points to the modified structured test file, and the modified structured test file is executed.

[0010] Optionally, the method further includes: Real-time monitoring of feedback signals from multiple channels; If any of the aforementioned feedback signals are detected, then: Determine whether the feedback signal meets the triggering condition of any migration edge. If the triggering condition for any migration edge is met, then the node will be moved to the node corresponding to the migration edge that meets the triggering condition.

[0011] Optionally, the directed graph model has preset abnormal branch paths, and the method further includes: When the collected feedback signal is abnormal, the test state is non-linearly switched to a preset abnormal handling node according to the abnormal branch path.

[0012] Optionally, the method further includes: Collect actual test results; Obtain the difference between the actual test results and the expected test results; Provide feedback on the actual test results and the discrepancies.

[0013] Secondly, an electronic device testing system is provided, the system comprising: A graphical configuration unit is used to receive user-defined test parameters through a graphical configuration platform; A test model generator is used to generate a structured test file based on the test parameters. The structured test file includes a directed graph model consisting of nodes and transition edges to describe the test process. The nodes are used to indicate test states and / or test actions, and the transition edges are used to indicate state triggering conditions. The model interpretation and execution engine is used to load and interpret the structured test file, generate standardized action instructions based on the interpretation results, convert the standardized action instructions into control protocols for specific physical test equipment, drive the electronic equipment to perform corresponding test actions according to the nodes of the structured test file, and transfer test states according to the migration edges defined by the directed graph model.

[0014] Thirdly, a computer device is provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor, when executing the computer program, implements the method as described in any of the preceding claims.

[0015] Fourthly, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the method as described in any of the preceding claims.

[0016] This invention provides a method, system, computer device, and storage medium for testing electronic devices. The method receives user-defined test parameters through a graphical configuration platform; based on these parameters, a structured test file is generated. This structured test file includes a directed graph model consisting of nodes and transition edges to describe the test process. The nodes indicate test states and / or test actions, and the transition edges indicate state triggering conditions. The structured test file is loaded and interpreted, and standardized action instructions are generated based on the interpretation results. These standardized action instructions are then converted into control protocols for specific physical test devices. The electronic device is driven to perform corresponding test actions based on the nodes in the structured test file, and test states are transitioned according to the transition edges defined in the directed graph model. This method generates nodes in a structured test file to indicate test states and / or test actions, and transition edges indicate state triggering conditions. By using structured testing to drive the electronic device to perform corresponding test actions based on the nodes in the structured test file, and transitioning test states according to the transition edges defined in the directed graph model, a process-oriented and automated testing of electronic devices is achieved. Attached Figure Description

[0017] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0018] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 The diagram shown illustrates the application environment of the electronic device testing method according to an embodiment of the present invention. Figure 2 The diagram shown is a flowchart of an electronic device testing method according to an embodiment of the present invention. Figure 3 The diagram shown is a schematic representation of a directed graph model according to an embodiment of the present invention. Figure 4 The diagram shown is a structural block diagram of an electronic device testing system according to an embodiment of the present invention. Figure 5 The diagram shown is an internal structural diagram of a computer device in an embodiment of the present invention. Detailed Implementation

[0020] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0021] Figure 1 This is a diagram illustrating the application environment of an electronic device testing method in one embodiment. (Refer to...) Figure 1 This electronic device testing method is applied to an electronic device testing system. The electronic device testing system includes a terminal 110 and a server 120. The terminal 110 and server 120 are connected via a network. The terminal 110 can be a desktop terminal or a mobile terminal; the mobile terminal can be at least one of a mobile phone, tablet computer, or laptop computer. The server 120 can be a standalone server or a server cluster consisting of multiple servers.

[0022] Terminal 110 and / or server 120 can be connected to the test equipment via wired and / or wireless networks, and can drive the test equipment to perform corresponding tests on electronic devices.

[0023] like Figure 2 As shown, in one embodiment, a method for testing electronic devices is provided. This embodiment mainly applies this method to the above-mentioned... Figure 1 Let's take terminal 110 or server 120 as an example for illustration. (Refer to...) Figure 2 The specific steps of this electronic device testing method are as follows: Step 210: Receive user-defined test parameters through the graphical configuration platform; In this embodiment of the invention, the test parameters may include test actions, test duration, test steps, test equipment, etc.

[0024] Test equipment can be robotic arms, current sampling modules, etc.; test actions can be pressing, powering on, lighting up, network connection, etc.; test steps can be which process to test first, which process to test later, etc.

[0025] A graphical configuration platform can be a platform on the setup and testing equipment, and / or server, and / or terminal, etc., used to receive user-defined test parameters.

[0026] Step 220: Generate a structured test file based on the test parameters. The structured test file includes a directed graph model consisting of nodes and migration edges to describe the test process. The nodes are used to indicate test status and / or test actions, and the migration edges are used to indicate state triggering conditions.

[0027] Step 230: Load and interpret the structured test file, generate standardized action instructions based on the interpretation results, convert the standardized action instructions into a control protocol for a specific physical test device, drive the electronic device to perform corresponding test actions according to the nodes of the structured test file, and transfer the test state according to the migration edges defined by the directed graph model.

[0028] This invention provides a method, system, computer device, and storage medium for testing electronic devices. The method receives user-defined test parameters through a graphical configuration platform; based on these parameters, a structured test file is generated. This structured test file includes a directed graph model consisting of nodes and transition edges to describe the test process. The nodes indicate test states and / or test actions, and the transition edges indicate state triggering conditions. The structured test file is loaded and interpreted, and standardized action instructions are generated based on the interpretation results. These standardized action instructions are then converted into control protocols for specific physical test devices. The electronic device is driven to perform corresponding test actions based on the nodes in the structured test file, and test states are transitioned according to the transition edges defined in the directed graph model. This method generates nodes in a structured test file to indicate test states and / or test actions, and transition edges indicate state triggering conditions. By using structured testing to drive the electronic device to perform corresponding test actions based on the nodes in the structured test file, and transitioning test states according to the transition edges defined in the directed graph model, a process-oriented and automated testing of electronic devices is achieved.

[0029] In this embodiment of the invention, step 230, which involves loading and interpreting the structured test file, generating standardized action instructions based on the interpretation results, converting the standardized action instructions into a control protocol for a specific physical test device, driving the electronic device to perform corresponding test actions based on the nodes of the structured test file, and transitioning the test state according to the migration edges defined by the directed graph model, includes: The structured test file is loaded and interpreted by the model interpretation and execution engine to obtain the starting node, ending node, node sequence, and triggering conditions corresponding to the migration edge; Retrieve the test atomic operations and execution parameters bound to all nodes; Starting from the starting node and ending node, the structured test file is executed according to the test atomic operations and execution parameters bound to the nodes, the node sequence, and the triggering conditions corresponding to the migration edges.

[0030] In this embodiment of the invention, the execution of the structured test file from the starting node to the ending node, based on the test atomic operations bound to the nodes, the execution parameters, the node sequence, and the triggering conditions corresponding to the migration edges, includes: Based on the execution parameters, execute the test atomic operation bound to the current node; Based on the node sequence, obtain at least one next node of the current node; Obtain the migration edges between the current node and all next nodes; Determine whether the triggering condition corresponding to any migration edge is met; If the triggering condition for any migration edge is met, then the user is transferred to the next node corresponding to the migration edge that meets the triggering condition.

[0031] In this embodiment of the invention, the test atomic operation can be an operation or action that must be completed once it begins.

[0032] This invention enables streamlined and automated testing of electronic devices through structured test files.

[0033] Figure 3 The diagram shown is a schematic diagram of a directed graph model according to an embodiment of the present invention.

[0034] In a directed graph model, nodes are used to indicate test states and test actions. Test actions can be "press", "power on", "play", etc. The duration of a test action can also be regarded as a test state. For example, "press" can also represent the pressing state.

[0035] Migrating edges can be triggered by state conditions, such as lasting for 30 seconds.

[0036] Figure 3 The directed graph model shown includes nodes 310, 320, 330 and 340. Node 310 is "Waiting for UART serial port feedback confirmation", node 320 is "Bluetooth connection", node 330 is "Recording failed device number" and node 340 is "Button action".

[0037] The migration edge between nodes 320 and 310 is "Bluetooth connection successful", the migration edge between nodes 310 and 330 is "timeout 10 seconds", and the migration edge between nodes 310 and 340 is "UART serial port feedback connection confirmation".

[0038] Figure 3 In the directed model graph, the first execution node is 320.

[0039] The overall test process is as follows: Execution node 320: Electronic devices establish Bluetooth connection.

[0040] The migration edge between node 320 and node 310 is "Bluetooth connection successful". Therefore, after executing node 320, if the Bluetooth connection is successful, the migration will proceed to node 310.

[0041] On node 310, wait for UART serial port feedback confirmation. If the UART serial port feedback confirmation times out by 10 seconds, transfer to node 330 and record the failed device number; if the UART serial port feedback confirmation is received, transfer to node 340 to execute the "button action".

[0042] In this embodiment of the invention, the method further includes a hot-loading step: The hot loading includes: Real-time monitoring of changes to the structured test files; If a change to the structured test file is detected and the test of the electronic device is not completed, the changed structured test file is preloaded in the background backup memory area, and the execution status of the structured test file before the change is continuously monitored. When a predefined safe node is reached, the execution pointer is switched so that it points to the modified structured test file, and the modified structured test file is executed.

[0043] In this embodiment of the invention, after modifying and saving the test parameters, the system monitors the changes in the structured test file, specifically by monitoring changes based on the MD5 value.

[0044] A security node can be the completion of an action, the completion of testing a device, or other system-defined security nodes. In this embodiment, the modified structured test file is pre-loaded. When the test flow reaches the "security node" between the original and modified structured test files, an atomic operation switches the memory pointer, causing the system to point to the modified structured test file. The entire process does not require restarting the main program.

[0045] In one application scenario of this invention, it was found during testing that the play button on certain speaker models requires more force to be reliably triggered.

[0046] The method of this invention uses a hot loading process, which only requires modifying the test parameters, changing the force parameter to 250 grams, and generating a modified structured test file.

[0047] When using the modified structured test file, the test system is currently testing the Nth speaker. The hot-loading module monitors the current state at the "Audio Acquisition" node, which is a test atomic operation. Therefore, it waits at a safe node, specifically at the safe node where the 15th speaker test is completed. While waiting, the modified structured test file can be pre-loaded.

[0048] Once the system enters the safe node between the two test cases, it loads and parses the modified structured test file in the background memory area to verify that the new model has no syntax errors. At the safe point, it performs an atomic switch to release the old model memory and starts testing from the N+1th speaker, using the new 250g force parameter.

[0049] The method of this invention takes about 100 milliseconds to switch between the structured test files before and after the change, and the test production line is uninterrupted.

[0050] In the method of this invention, when product functions change or testing requirements are adjusted, modified structured test files can be generated by resetting test parameters. These modified structured test files enable automatic switching between the pre- and post-modification test processes without restarting the main program, resulting in fast response times, accelerated R&D and testing processes, and reduced costs. Furthermore, for products of the same type but different models, or products with the same or similar test processes, there is no need to develop independent test scripts; existing test programs and processes can be reused, reducing development and maintenance costs.

[0051] In this embodiment of the invention, the method further includes: Real-time monitoring of feedback signals from multiple channels; If any of the aforementioned feedback signals are detected, then: Determine whether the feedback signal meets the triggering condition of any migration edge. If the triggering condition for any migration edge is met, then the node will be moved to the node corresponding to the migration edge that meets the triggering condition.

[0052] In this embodiment of the invention, the directed graph model has preset abnormal branch paths, and the method further includes: When the collected feedback signal is abnormal, the test state is non-linearly switched to a preset abnormal handling node according to the abnormal branch path.

[0053] In this embodiment of the invention, when the triggering condition of the migration edge is detected, the engine automatically jumps to the next state node. For example, if an abnormal situation occurs, a non-linear jump is performed according to the preset abnormal branch path, thereby achieving robust handling of uncertain timing interactions, reducing system downtime, and avoiding accidents.

[0054] In this embodiment of the invention, the method further includes: Collect actual test results; Obtain the difference between the actual test results and the expected test results; Provide feedback on the actual test results and the discrepancies.

[0055] This invention enables streamlined and automated testing of electronic devices. Furthermore, the method described in this invention can automatically collect actual test results and compare them with expected test results, facilitating adjustments to the testing process and accelerating the research and development and testing process. In another embodiment, to further optimize the testing of advanced functions of complex products (such as smart headphones), the system also includes a multimodal state inference layer between the model interpretation and execution engine and the driver adaptation layer.

[0056] This layer is responsible for receiving and synchronizing raw, continuous data streams (such as audio waveforms, current curves, Bluetooth packet capture data, etc.) from multiple physical devices. This layer performs timestamp alignment and data synchronization to ensure that data from different sources can be accurately correlated.

[0057] Data preprocessing, including filtering, noise reduction, and sampling rate conversion, is followed by feature extraction using application-specific algorithms. For example, Fast Fourier Transform (FFT) analysis is performed to calculate noise suppression (dB), identify spatial audio sound field localization features, and detect audio interruptions or distortion. Power consumption features are identified by analyzing current and voltage curves to recognize power consumption characteristics and instantaneous power peaks under different operating modes (e.g., ANC enabled, transparency mode, standby). Bluetooth data monitoring includes signal strength index (RSSI), packet loss rate, and connection / disconnection events to assess connection stability. Combined with a state inference engine, based on the extracted features and predefined rule sets or lightweight models (configurable via a graphical configuration platform), the actual operating state or key performance indicators of the smart headphones are inferred in real time. This transforms the raw data stream into a high-level, semantically clear device operating state or performance indicator (e.g., ANC performance met, seamless switching successful), which is then provided to the model interpretation and execution engine in the form of standardized events to drive state transitions or assertion judgments. This embodiment effectively solves the problems of ambiguity and latency in inferring the actual operating state of a device from a multimodal continuous data stream, further improving the accuracy and efficiency of testing.

[0058] This invention also provides an electronic device testing system. Figure 4 The diagram shown is a schematic of the electronic device testing system of the present invention. Figure 4 As shown, the system includes: The graphical configuration unit 410 is used to receive user-defined test parameters through a graphical configuration platform; Test model generator 420 is used to generate a structured test file based on the test parameters. The structured test file includes a directed graph model consisting of nodes and transition edges to describe the test process. The nodes are used to indicate test states and / or test actions, and the transition edges are used to indicate state triggering conditions. The model interpretation and execution engine 430 is used to load and interpret the structured test file, generate standardized action instructions based on the interpretation results, convert the standardized action instructions into control protocols for specific physical test equipment, drive the electronic equipment to perform corresponding test actions based on the nodes of the structured test file, and transfer the test state according to the migration edges defined by the directed graph model.

[0059] In this embodiment of the invention, the model interpretation and execution engine 430 is further used for: The structured test file is loaded and interpreted by the model interpretation and execution engine to obtain the starting node, ending node, node sequence, and triggering conditions corresponding to the migration edge; Retrieve the test atomic operations and execution parameters bound to all nodes; Starting from the starting node and ending node, the structured test file is executed according to the test atomic operations and execution parameters bound to the nodes, the node sequence, and the triggering conditions corresponding to the migration edges.

[0060] In this embodiment of the invention, the model interpretation and execution engine 430 is further used for: Based on the execution parameters, execute the test atomic operation bound to the current node; Based on the node sequence, obtain at least one next node of the current node; Obtain the migration edges between the current node and all next nodes; Determine whether the triggering condition corresponding to any migration edge is met; If the triggering condition for any migration edge is met, then the user is transferred to the next node corresponding to the migration edge that meets the triggering condition.

[0061] In this embodiment of the invention, the system further includes a hot-loading and management module, used for: Real-time monitoring of changes to the structured test files; If a change to the structured test file is detected and the test of the electronic device is not completed, the changed structured test file is preloaded in the background backup memory area, and the execution status of the structured test file before the change is continuously monitored. When a predefined safe node is reached, the execution pointer is switched so that it points to the modified structured test file, and the modified structured test file is executed.

[0062] In this embodiment of the invention, the system further includes a real-time monitoring module, used for: Real-time monitoring of feedback signals from multiple channels; If any of the aforementioned feedback signals are detected, then: Determine whether the feedback signal meets the triggering condition of any migration edge. If the triggering condition for any migration edge is met, then the node will be moved to the node corresponding to the migration edge that meets the triggering condition.

[0063] In this embodiment of the invention, the real-time monitoring module is further used for: When the collected feedback signal is abnormal, the test state is non-linearly switched to a preset abnormal handling node according to the abnormal branch path.

[0064] In this embodiment of the invention, the real-time monitoring module is further used for: Collect actual test results; Obtain the difference between the actual test results and the expected test results; Provide feedback on the actual test results and the discrepancies.

[0065] The above-mentioned electronic device testing method is derived by utilizing the unique technical features of electronic device testing methods, and achieves the beneficial effect of solving the technical problems raised in the background art.

[0066] This invention also provides a computer device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the following method: receiving user-defined test parameters through a graphical configuration platform; generating a structured test file based on the test parameters, the structured test file including a directed graph model consisting of nodes and transition edges to describe the test process, wherein the nodes indicate test states and / or test actions, and the transition edges indicate state triggering conditions; loading and interpreting the structured test file, generating standardized action instructions based on the interpretation results, converting the standardized action instructions into a control protocol for a specific physical test device, driving the electronic device to perform corresponding test actions according to the nodes of the structured test file, and transferring test states according to the transition edges defined in the directed graph model.

[0067] This invention also provides a computer-readable storage medium storing a computer program. When executed by a processor, the computer program implements the following method: receiving user-defined test parameters through a graphical configuration platform; generating a structured test file based on the test parameters, the structured test file including a directed graph model consisting of nodes and transition edges to describe the test process, wherein the nodes are used to indicate test states and / or test actions, and the transition edges are used to indicate state triggering conditions; loading and interpreting the structured test file, generating standardized action instructions based on the interpretation results, converting the standardized action instructions into a control protocol for a specific physical test device, driving the electronic device to perform corresponding test actions according to the nodes of the structured test file, and transferring test states according to the transition edges defined in the directed graph model.

[0068] The above-described testing method for electronic devices achieves the beneficial effect of solving the technical problems mentioned in the background art.

[0069] Figure 2 This is a flowchart illustrating a testing method for an electronic device in one embodiment. It should be understood that, although... Figure 2 The steps in the flowchart are shown sequentially as indicated by the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order in which these steps are executed, and they can be performed in other orders. Figure 2 At least some of the steps in the process may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be executed in turn or alternately with other steps or at least some of the sub-steps or stages of other steps.

[0070] Figure 5 An internal structural diagram of a computer device in one embodiment is shown. Specifically, this computer device may be... Figure 1 Terminal 110 or server 120 in the middle. For example... Figure 5As shown, the computer device includes a processor, memory, network interface, input device, and display screen connected via a system bus. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores an operating system and may also store computer programs. When executed by the processor, these computer programs enable the processor to implement electronic device testing methods. The internal memory may also store computer programs, which, when executed by the processor, enable the processor to perform electronic device testing methods. The display screen can be an LCD screen or an e-ink screen. The input device can be a touch layer covering the display screen, buttons, a trackball, or a touchpad mounted on the computer device casing, or an external keyboard, touchpad, or mouse.

[0071] Those skilled in the art will understand that Figure 5 The structure shown is merely a block diagram of a portion of the structure related to the present invention and does not constitute a limitation on the computer device to which the present invention is applied. A specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0072] In one embodiment, the electronic device testing system provided by the present invention can be implemented as a computer program, which can be implemented in various ways, such as... Figure 5 It runs on the computer device shown.

[0073] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, storage, databases, or other media used in the embodiments provided by this invention can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), Rambus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0074] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0075] The above description is merely a specific embodiment of the present invention, enabling those skilled in the art to understand or implement the invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Therefore, the present invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features of the invention herein.

Claims

1. An electronic device testing method, characterized by, The method includes: Receive user-defined test parameters through a graphical configuration platform; Based on the test parameters, a structured test file is generated. The structured test file includes a directed graph model consisting of nodes and transition edges to describe the test process. The nodes are used to indicate test states and / or test actions, and the transition edges are used to indicate state triggering conditions. The structured test file is loaded and interpreted, standardized action instructions are generated based on the interpretation results, the standardized action instructions are converted into control protocols for specific physical test equipment, the electronic equipment is driven to perform corresponding test actions according to the nodes of the structured test file, and the test state is transferred according to the migration edges defined by the directed graph model.

2. The method of claim 1, wherein, The process of loading and interpreting the structured test file, generating standardized action instructions based on the interpretation results, converting the standardized action instructions into a control protocol for a specific physical test device, driving the electronic device to perform corresponding test actions according to the nodes of the structured test file, and transitioning the test state according to the migration edges defined by the directed graph model includes: The structured test file is loaded and interpreted by the model interpretation and execution engine to obtain the starting node, ending node, node sequence, and triggering conditions corresponding to the migration edge; Retrieve the test atomic operations and execution parameters bound to all nodes; Starting from the starting node and ending node, the structured test file is executed according to the test atomic operations and execution parameters bound to the nodes, the node sequence, and the triggering conditions corresponding to the migration edges.

3. The method of claim 2, wherein, The process of executing the structured test file from the starting node to the ending node, based on the test atomic operations bound to the nodes, the execution parameters, the node sequence, and the triggering conditions corresponding to the migration edges, includes: Based on the execution parameters, execute the test atomic operation bound to the current node; Based on the node sequence, obtain at least one next node of the current node; Obtain the migration edges between the current node and all next nodes; Determine whether the triggering condition corresponding to any migration edge is met; If the triggering condition for any migration edge is met, then the user is transferred to the next node corresponding to the migration edge that meets the triggering condition.

4. The method according to claim 1, characterized in that, The method further includes a hot-loading step: The hot loading includes: Real-time monitoring of changes to the structured test files; If a change to the structured test file is detected and the test of the electronic device is not completed, the changed structured test file is preloaded in the background backup memory area, and the execution status of the structured test file before the change is continuously monitored. When a predefined safe node is reached, the execution pointer is switched so that it points to the modified structured test file, and the modified structured test file is executed.

5. The method according to claim 1, characterized in that, The method further includes: Real-time monitoring of feedback signals from multiple channels; If any of the aforementioned feedback signals are detected, then: Determine whether the feedback signal meets the triggering condition of any migration edge. If the triggering condition for any migration edge is met, then the node will be moved to the node corresponding to the migration edge that meets the triggering condition.

6. The method of claim 5, wherein, The directed graph model has pre-defined abnormal branch paths, and the method further includes: When the collected feedback signal is abnormal, the test state is non-linearly switched to a preset abnormal handling node according to the abnormal branch path.

7. The method of claim 1, wherein, The method further includes: Collect actual test results; Obtain the difference between the actual test results and the expected test results; Provide feedback on the actual test results and the discrepancies.

8. An electronic device testing system, characterized by, The system includes: A graphical configuration unit is used to receive user-defined test parameters through a graphical configuration platform; A test model generator is used to generate a structured test file based on the test parameters. The structured test file includes a directed graph model consisting of nodes and transition edges to describe the test process. The nodes are used to indicate test states and / or test actions, and the transition edges are used to indicate state triggering conditions. The model interpretation and execution engine is used to load and interpret the structured test file, generate standardized action instructions based on the interpretation results, convert the standardized action instructions into control protocols for specific physical test equipment, drive the electronic equipment to perform corresponding test actions according to the nodes of the structured test file, and transfer test states according to the migration edges defined by the directed graph model.

9. A computer device comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the method of any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the method of any one of claims 1 to 7.

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