Polarization-sensitive test and parameter optimization method for liquid crystal focusing lens without polarizer

Abstract

This invention relates to the field of performance optimization technology, specifically to a method for polarization sensitivity testing and parameter optimization of a non-polarized liquid crystal focusing lens. The method includes the following steps: collecting test information to establish a basic driving condition set; collecting light field interference fringe images to generate a phase delay matrix set; subtracting the elements of the phase matrix to obtain a deformation stress distribution matrix; determining the numerical magnitude relationship to obtain a stress over-limit judgment and characterization set; and adjusting the voltage specifications to generate a set of independent dual-layer adjustment commands. In this invention, basic driving conditions are established by extracting allowable stress and interlayer elastic parameters; the light intensity distribution is analyzed and the phase state is compared to extract deformation; global characterization scalars are calculated to determine over-limit actions; pulse width voltage is readjusted to issue commands; and based on full-aperture interferometry and dual-layer differential comparison, interlayer coupling stress is quantified and perceived, constructing a dynamic adjustment closed loop for polarization response fluctuations and rotational deviations.

Description

Technical Field

[0001] This invention relates to the field of performance optimization technology, and in particular to a method for polarization sensitivity testing and parameter optimization of non-polarized liquid crystal focusing lenses. Background Technology

[0002] The field of performance optimization technology mainly covers the core aspects of physical characteristic evaluation, error compensation, and parameter adjustment for various device systems. It aims to make the output state of the device approach a set benchmark through quantitative testing methods and underlying physical fine-tuning processes. This field not only involves the precise measurement of internal stress distribution and response hysteresis phenomena of the device, but also includes the establishment of specific physical error models and the use of multi-dimensional driving parameters to correct the adverse responses caused by manufacturing size deviations or material physical anisotropy. The traditional method for polarization sensitivity testing and parameter optimization of non-polarized liquid crystal focusing lenses addresses technical issues such as refractive power fluctuations and optical path difference shifts caused by interlayer bonding stress and assembly orthogonal rotation errors when light of different polarization states is incident on orthogonal double-layer liquid crystal focusing lenses. This method employs a stepper motor-driven polarizer assembly to change the incident polarization azimuth angle of a continuous-wave laser in specific angular steps. A Thyman-Green interferometer is used to collect the phase delay of each individual liquid crystal layer in the orthogonal double-layer structure point-by-point to perform polarization sensitivity testing. Subsequently, based on a factory-calibrated single liquid crystal cell voltage phase response lookup table, a fixed bias voltage obtained from the lookup table is directly applied to each of the two liquid crystal cells to perform polarization sensitivity optimization. Simultaneously, during the dual-cell matching and temperature compensation process, a thermistor attached to the lens edge collects the real-time ambient temperature and retrieves a pre-set two-dimensional array of temperature gradient voltage compensation coefficients from the read-only memory. The obtained voltage correction scalar is directly superimposed onto the pulse width modulation drive signal output by the waveform generator to form the excitation waveform for the dual liquid crystal cells.

[0003] Traditional techniques for dual-layer focusing structures employ specific angular step sizes to change the polarization azimuth angle, rely on interferometers to collect single-layer phase delay measurements point by point for testing, and apply a fixed bias voltage based on a single lookup table for optimization. Combined with edge thermistors to retrieve preset arrays, the correction scalar is directly superimposed onto the drive signal. The operation mode based on independent single-layer calibration and fixed scalar superposition cannot accurately reflect the interlayer stress coupling effect and assembly orthogonal rotation deviation under the bonding state, and cannot dynamically respond to the global deformation distribution, resulting in significant diopter fluctuations and optical path difference shifts. Summary of the Invention

[0004] To address the technical problems existing in the prior art, embodiments of the present invention provide a method for polarization sensitivity testing and parameter optimization of a polarization-free liquid crystal focusing lens.

[0005] To achieve the above objectives, the present invention adopts the following technical solution: a method for polarization sensitivity testing and parameter optimization of a polarization-free liquid crystal focusing lens, comprising the following steps: S1: Collect test information of target test batch in local solid-state memory, filter engineering allowable stress tolerance scalar, voltage conversion sensitivity constant and interlayer stress elastic matrix, identify basic pulse width modulation voltage specifications, adjust the step angle drive specifications of rotary stepper motor, and establish a set of hardware basic drive conditions. S2: Call the hardware basic driving condition set, adjust the continuous rotation state of the laser emitter polarizer, synchronously send the trigger level to the dedicated wavefront sensor, collect the solid light field interference fringe image of the orthogonal double-layer liquid crystal focusing lens, convert the pixel light intensity signal into the corresponding phase delay scalar, and generate the full aperture phase delay matrix set. S3: Using the full aperture phase delay matrix set, subtract the corresponding elements of the preceding phase matrix and the following phase matrix corresponding to the initial polarization to obtain the deformation stress distribution matrix. S4: Based on the deformation stress distribution matrix, filter the top N extreme values ​​that exceed the preset deformation threshold, calculate the arithmetic summation value of the selected head elements, output the global stress characterization scalar, determine the numerical magnitude relationship between the global stress characterization scalar and the engineering allowable stress tolerance scalar, and obtain the stress over-limit judgment and global characterization set. S5: Based on the stress over-limit judgment and the global characterization set, identify the deflection angle control action triggered by the stress over-limit judgment, calculate the global stress characterization scalar multiplied by the voltage conversion sensitivity constant, adjust the basic pulse width modulation voltage specification, and generate a set of dual-layer independent adjustment commands.

[0006] As a further embodiment of the present invention, the hardware basic driving condition set includes a motor drive topology, an initial power supply frequency band, and port mapping nodes; the full aperture phase delay matrix set includes a spatial coordinate array, a relative optical path difference array, and a regional refractive index mapping map; the deformation stress distribution matrix includes internal force gradient, mechanical torsion amplitude, and structural forced region; the stress over-limit judgment and global characterization set includes risk rating alarm tags, limit deviation amplitude scale, and safety margin range; and the dual-layer independent adjustment instruction set includes an upper-layer targeted control code stream, a lower-layer gain waveform segment, and a differential compensation timing period.

[0007] As a further aspect of the present invention, the specific steps of S1 are as follows: S101: Collect test information of the target test batch in the local solid-state memory, extract the material property vector and stress load record in the test batch, compare the material property vector with the set standard deformation displacement threshold scalar, screen and separate the engineering allowable stress tolerance scalar and voltage conversion sensitivity constant, extract the interlayer deformation feature sequence and splice to reconstruct the interlayer stress elastic matrix, and arrange and fuse the reconstructed matrix and the separated parameters in a time sequence to establish an initial component characteristic parameter table; S102: Call the initial component characteristic parameter table, extract the voltage conversion sensitivity constant and the engineering allowable stress tolerance scalar, multiply the independently extracted constant and scalar to obtain the driving voltage reference value, compare the driving voltage reference value with the power supply equipment output level limit range, extract the intersection value that meets the conditions to map the pulse width duty cycle configuration code, identify the basic pulse width modulation voltage specification indicated by the corresponding duty cycle configuration code, and obtain the driving voltage specification configuration set; S103: Based on the drive voltage specification configuration set, retrieve the interlayer stress elastic matrix, extract the numerical feature values ​​of the main diagonal elements to calculate the motor step length compensation coefficient, calculate the motor microstep angle parameter based on the motor step length compensation coefficient and voltage specification parameters, adjust the step angle drive specification in the control port of the rotary stepper motor, and encapsulate the step angle drive specification and the basic pulse width modulation voltage specification through protocol loading to establish a hardware basic drive condition set.

[0008] As a further aspect of the present invention, the specific steps of S2 are as follows: S201: Call the hardware basic driving condition set, extract the bias angle reference parameter and timing synchronization period constant, adjust the continuous rotation state of the laser emitter polarizer according to the bias angle reference parameter, record the instantaneous deflection angle value, compile the waveform sequence according to the timing synchronization period constant, synchronously send the trigger level to the dedicated wavefront sensor, combine the instantaneous deflection angle value and the waveform sequence, and establish a polarization trigger state mapping table. S202: Using the polarization trigger state mapping table, read the instantaneous deflection angle value and level pulse node, activate the image acquisition circuit according to the level pulse node, acquire the solid light field interference fringe image of the orthogonal double-layer liquid crystal focusing lens, scan the pixel coordinate nodes in the interference fringe image, extract the light intensity signal distribution parameter at the coordinate node, bind and fuse the pixel coordinate node and the light intensity signal distribution parameter to obtain the pixel light intensity amplitude array. S203: Retrieve the light intensity signal distribution parameters within the pixel light intensity amplitude array, compare the light intensity signal distribution parameters with the reference conversion scale, extract the projection values ​​of the light intensity fluctuation range, perform spatial frequency domain projection conversion to analyze the phase step characteristics of the projection values, convert the pixel light intensity signal into the corresponding phase delay scalar, reorganize the phase delay scalar according to the coordinate node arrangement order, and generate a full aperture phase delay matrix set.

[0009] As a further aspect of the present invention, the specific steps of S3 are as follows: S301: Extract the polarization orientation associated tag sequence within the full aperture phase delay matrix set, retrieve the initial polarization time marker node within the polarization orientation associated tag sequence, traverse the spatial arrangement grid within the full aperture phase delay matrix set, segment and extract the phase delay scalar array bound to the marker node, combine the scalar values ​​within the array with the grid coordinate points, and establish the preceding phase distribution matrix. S302: Compare the associated labels of the remaining undivided meshes in the full aperture phase delay matrix set with the rotation termination time marker nodes, extract the phase delay scalar arrays corresponding to the associated labels and marker nodes in the same mesh, project the extracted scalar arrays onto the reference orthogonal coordinate system to generate an arrangement topology, fuse the arrangement topology with the scalar values ​​in the extracted arrays, reconstruct the array dimension parameters, and obtain the post-phase distribution matrix. S303: For the preceding phase distribution matrix and the following phase distribution matrix, extract the row and column dimension boundary scale parameters, determine that the row and column dimension boundary scale parameters are in an equal value state, scan the corresponding position elements in the preceding phase distribution matrix and the following phase distribution matrix that have the same row number and column number index features, perform a subtraction operation on the phase delay scalar carried in the corresponding position element, integrate the subtraction operation difference in the entire aperture area, and construct the deformation stress distribution matrix.

[0010] As a further aspect of the present invention, the initial phase scalar included in the corresponding position elements in the preceding phase distribution matrix is ​​extracted as the preceding operation object, and the terminating phase scalar included in the corresponding position elements in the following phase distribution matrix that have the same row number and column number index features is extracted as the following operation object. Perform the subtraction operation between the preceding and following operands to obtain the absolute difference parameter. Define the absolute difference parameter as the difference of the subtraction operation and store it in the corresponding coordinate point in a preset blank matrix with the same dimensional scale as the full aperture region.

[0011] As a further aspect of the present invention, the specific steps of S4 are as follows: S401: Based on the deformation stress distribution matrix, extract the stress values ​​of all nodes in the global domain, perform a descending sorting operation on the stress values ​​of all nodes in the global domain to generate a stress gradient sequence, set the index of the head-level truncation node, filter the elements in the stress gradient sequence that are located in the preceding interval of the truncation node, extract the deformation coordinate parameters carried by the preceding interval elements, bind and fuse the deformation coordinate parameters with the elements to generate a local extreme stress cluster. S402: Call the local extreme stress cluster, retrieve all hierarchical elements in the corresponding deformation stress distribution matrix, extract the absolute deformation amplitude parameter of the element, perform continuous arithmetic accumulation traversal operation on the absolute deformation amplitude parameter, obtain the total value of global deformation amplitude, compare the total value of deformation energy with the total number of grid nodes, perform algebraic division operation, calculate the arithmetic summation value of the selected head element, and obtain the global stress characterization scalar; S403: For the global stress characterization scalar, retrieve the engineering allowable stress tolerance scalar from the initial component characteristic parameter table, compare the global stress characterization scalar with the engineering allowable stress tolerance scalar, perform numerical magnitude difference operation, extract the differential operation feedback boundary overflow amplitude parameter, determine the state of the safety judgment interval mapped by the boundary overflow amplitude parameter, assemble the overflow amplitude parameter and attribute label, and obtain the stress over-limit judgment and global characterization set.

[0012] As a further aspect of the present invention, the independent scalars included in the stress values ​​of all nodes are extracted and pairwise numerical comparisons are performed. A one-dimensional queue is constructed according to the numerical arrangement from largest to smallest. The nodes in the one-dimensional queue are assigned incremental numerical labels, and the one-dimensional queue with the added incremental numerical labels is defined as a stress gradient sequence. The total number of nodes included in the statistical stress gradient sequence is calculated. The preset scaling factor is multiplied by the total number of nodes to obtain the product floating-point parameter. The product floating-point parameter is then rounded down to generate a discrete integer parameter. Discrete integer parameters are mapped to stress gradient sequences and defined as head-level truncation node indices.

[0013] As a further aspect of the present invention, the specific steps of S5 are as follows: S501: Through the stress over-limit judgment and global characterization set, extract the boundary overflow amplitude parameter and risk attribute label, compare the risk assessment numerical parameter with the over-limit judgment benchmark threshold scalar, extract the abnormal nodes associated with the over-threshold interval, map the associated abnormal nodes to the drive deflection angle adjustment channel, filter the corresponding intervention instruction code triggered for the over-limit situation in the channel, and establish the deflection angle control action sequence. S502: Based on the deflection angle control action sequence, call the global stress characterization scalar, retrieve the voltage conversion sensitivity constant in the initial component characteristic parameter table, perform an algebraic multiplication operation on the global stress characterization scalar and the voltage conversion sensitivity constant, extract the multiplication to obtain the product feedback value, convert the product feedback value into the level pulse width adjustment quantization coefficient, and construct the voltage regulation compensation scale. S503: Extract the level pulse width adjustment quantization coefficient within the voltage regulation compensation scale, retrieve the basic pulse width modulation voltage specification within the drive voltage specification configuration set, superimpose the level pulse width adjustment quantization coefficient onto the duty cycle period parameter corresponding to the basic voltage specification, perform parameter superposition update and replacement operation, perform dual-channel instruction protocol splitting and mapping on the updated duty cycle parameter configuration code, separate the control level signal corresponding to the orthogonal dual-layer structure, and generate a set of dual-layer independent adjustment instructions.

[0014] As a further aspect of the present invention, the high-level data segment and the low-level data segment included in the updated duty cycle parameter configuration code are extracted, and a serial-to-parallel conversion logic operation is performed on the high-level data segment to obtain a horizontally independent data stream, and a serial-to-parallel conversion logic operation is performed on the low-level data segment to obtain a vertically independent data stream. The independent data streams in the horizontal dimension are input into the preset horizontal level control channel to generate the first physical pulse sequence, and the independent data streams in the vertical dimension are input into the preset vertical level control channel to generate the second physical pulse sequence. The first physical pulse sequence and the second physical pulse sequence are combined, and the resulting level sequence is defined as the control level signal corresponding to the orthogonal double-layer structure.

[0015] Compared with the prior art, the advantages and positive effects of the present invention are as follows: In this invention, basic driving conditions are established by extracting the allowable stress tolerance scalar and the interlayer elastic matrix. The polarizer is continuously rotated and the wavefront sensor collects the solid optical field interference image simultaneously. The light intensity signal is converted into a full-aperture phase delay distribution matrix. The deformation stress distribution is extracted by subtracting and comparing the pre- and post-phase states. The global characterization scalar is calculated based on the head element and the arithmetic integration value. It is compared with the engineering tolerance to determine the over-limit action. Then, the pulse width modulation voltage specification is adjusted in combination with the sensitivity constant to generate independent fine-tuning instructions. Based on the full-aperture interference analysis and the double-layer differential comparison, the interlayer coupling stress is quantitatively perceived, and a dynamic adjustment closed loop for polarization response fluctuations and rotation deviations is constructed. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a schematic diagram of the steps of the present invention; Figure 2 This is a detailed schematic diagram of S1 of the present invention; Figure 3This is a detailed schematic diagram of S2 of the present invention; Figure 4 This is a detailed schematic diagram of S3 of the present invention; Figure 5 This is a detailed schematic diagram of S4 of the present invention; Figure 6 This is a detailed schematic diagram of S5 of the present invention. Detailed Implementation

[0018] The technical solution of the present invention will now be described with reference to the accompanying drawings.

[0019] To make the technical problems, technical solutions and advantages of the present invention clearer, a detailed description will be given below in conjunction with the accompanying drawings and specific embodiments.

[0020] Please see Figure 1 This invention provides a method for testing the polarization sensitivity and optimizing the parameters of a polarization-free liquid crystal focusing lens, including the following steps: S1: Collect test information of target test batch in local solid-state memory, filter engineering allowable stress tolerance scalar, voltage conversion sensitivity constant and interlayer stress elastic matrix, analyze the basic pulse width modulation voltage specification input into the multi-channel programmable voltage drive source, adjust the step angle drive specification of rotary stepper motor, and establish a set of hardware basic drive conditions. S2: Call the hardware basic driving condition set, adjust the continuous rotation state of the laser emitter polarizer, synchronously send the trigger level to the dedicated wavefront sensor, collect the physical light field interference fringe image of the orthogonal double-layer liquid crystal focusing lens, convert the light intensity signal of the pixel in the image into the corresponding phase delay scalar, and generate the full aperture phase delay matrix set. S3: Filter the pre-phase matrix corresponding to the initial polarization and the post-phase matrix corresponding to the vertical polarization within the full aperture phase delay matrix set. Subtract the corresponding elements of the pre-phase matrix and the post-phase matrix to output the orthogonal phase subtraction matrix. Analyze the division results between the elements of the orthogonal phase subtraction matrix and the corresponding elements of the interlayer stress elastic matrix within the hardware basic driving condition set to obtain the deformation stress distribution matrix. S4: Analyze the results of the elements in the deformation stress distribution matrix arranged in descending order, filter the top N extreme values ​​that exceed the preset deformation threshold, classify them into the set of severe stress characteristic scalars, calculate the arithmetic summation value of the head elements selected in the set of severe stress characteristic scalars, output the global stress characterization scalar, determine the numerical magnitude relationship between the global stress characterization scalar and the engineering allowable stress tolerance scalar in the set of hardware basic driving conditions, and obtain the stress over-limit judgment and global characterization set; S5: By using stress over-limit judgment and global characterization set, identify the deflection angle control action caused by the stress over-limit judgment, calculate the global stress characterization scalar multiplied by the voltage conversion sensitivity constant in the hardware basic drive condition set, output voltage bias compensation amount, adjust the basic pulse width modulation voltage specification and perform addition and subtraction operations in combination with the voltage bias compensation amount, calculate the pre-update drive voltage specification and the post-update drive voltage specification, and generate a set of dual-layer independent adjustment instructions; The hardware foundation driving condition set includes motor drive topology, initial power supply frequency band, and port mapping nodes; the full aperture phase delay matrix set includes spatial coordinate array, relative optical path difference array, and regional refractive index mapping map; the deformation stress distribution matrix includes internal force gradient, mechanical torsion amplitude, and structural forced region; the stress over-limit judgment and global characterization set includes risk rating alarm label, limit deviation amplitude scale, and safety margin range; and the dual-layer independent adjustment instruction set includes upper-layer targeted control code stream, lower-layer gain waveform segment, and differential compensation timing period.

[0021] Please see Figure 2 The specific steps of S1 are as follows: S101: Collect test information of the target test batch in the local solid-state memory, extract the material property vector and stress load record in the test batch, compare the material property vector with the set standard deformation displacement threshold scalar, screen and separate the engineering allowable stress tolerance scalar and voltage conversion sensitivity constant, extract the interlayer deformation feature sequence and splice to reconstruct the interlayer stress elastic matrix, and arrange and fuse the reconstructed matrix and the separated parameters in a time sequence to establish an initial component characteristic parameter table; The test information text file for the target test batch is read from the local solid-state storage address range 0x00A1 to 0x00F5 via the data interface channel. This text file is parsed to obtain the material property vector containing Young's modulus and Poisson's ratio within the test batch. Simultaneously, stress load records containing applied force and duration are extracted. For the extracted stress load records, rows with null values ​​are removed, and median filtering is used to eliminate abnormal high-frequency spike noise data. Then, a standard normalization process is performed to map all stress load records to a standard normal distribution range with a mean of 0 and a standard deviation of 1. The standard deformation displacement threshold scalar set in the storage area is called, and the Young's modulus value in the material property vector is compared with the standard deformation displacement threshold scalar. For cases where the Young's modulus is greater than the threshold scalar, the engineering allowable stress tolerance scalar and the voltage conversion sensitivity constant are filtered and separated. The interlayer deformation feature sequence within the test batch is read. This sequence originates from a text file containing test information of the target test batch, accessed via a data interface channel from the local solid-state storage address. This feature sequence is a known array inherent in the factory test file. A matrix is ​​obtained through sequential recombination. The array is then reassembled according to the sequence timestamp order, resulting in a 3x3 interlayer stress elasticity matrix. The reconstructed matrix data, along with the separated engineering allowable stress tolerance scalar and voltage conversion sensitivity constant, are sequentially arranged and fused to establish an initial component characteristic parameter table. The process for setting the standard deformation displacement threshold scalar involves collecting deformation data from a standard silicon wafer sample at an ambient temperature of 25 degrees Celsius. After 50 repeated pressing tests, the deformation displacement values ​​are recorded and averaged as the baseline setting. For example, if the Young's modulus of a certain batch of material is found to be 150 gigapascals, and the equivalent modulus limit corresponding to the set standard deformation displacement threshold scalar is set to 120 gigapascals, the comparison reveals that 150 is greater than 120. Subsequently, the allowable stress tolerance scale of 200 megapascals was determined, and the voltage conversion sensitivity constant of 5 millivolts per pascal was determined. These values ​​were then written into the initial component characteristic parameter table.

[0022] S102: Call the initial component characteristic parameter table, extract the voltage conversion sensitivity constant and the engineering allowable stress tolerance scalar, multiply the independently extracted constant and scalar to obtain the driving voltage reference value, compare the driving voltage reference value with the power supply equipment output level limit range, extract the intersection value that meets the conditions to map the pulse width duty cycle configuration code, identify the basic pulse width modulation voltage specification indicated by the corresponding duty cycle configuration code, and obtain the driving voltage specification configuration set; The driving voltage reference value is obtained by algebraically multiplying the independently extracted voltage conversion sensitivity constant with the engineering allowable stress tolerance scalar. The advantage of this calculation logic is that it quickly defines the required base voltage boundary value by directly multiplying and fusing the material's physical tolerance limit parameter with the electrical conversion parameter. For example, if the extracted voltage conversion sensitivity constant is 5 mV / Pa and the engineering allowable stress tolerance scalar is 200 Pa, substituting the values ​​5 and 200 into the product operation yields a driving voltage reference value of 1000 mV. Subsequently, this 1000 mV driving voltage reference value is compared with the power supply output level limit range, which consists of the minimum output of 500 mV to the maximum output of 1500 mV as specified by the factory. The value 1000 is determined to fall within the range of 500 to 1500, and the intersection value of these values, 1000 mV, is selected. The value 1000 is used as the mapping reference input to the pulse width modulation lookup table function, which maps the pulse width duty cycle configuration code to a hexadecimal value of 0x5A. The basic pulse width modulation voltage specification referred to by this 0x5A duty cycle configuration code is identified, which is characterized by a 60% duty cycle and a frequency of 10 kHz. This basic pulse width modulation voltage specification is stored in a specified register address to obtain the drive voltage specification configuration set.

[0023] S103: Based on the drive voltage specification configuration set, retrieve the interlayer stress elastic matrix, extract the numerical feature values ​​of the main diagonal elements to calculate the motor step length compensation coefficient, calculate the motor microstepping angle parameter based on the motor step length compensation coefficient and voltage specification parameters, adjust the step angle drive specification in the control port of the rotary stepper motor, and encapsulate the step angle drive specification and the basic pulse width modulation voltage specification through protocol loading to establish a hardware basic drive condition set. The interlayer stress elasticity matrix containing 3 rows and 3 columns of data is retrieved, and the eigenvalues ​​of the main diagonal elements located in the first row and first column, the second row and second column, and the third row and third column are extracted. These three eigenvalues ​​are summed arithmetically to obtain the trace of the matrix. This trace is divided by the natural number 3 to calculate the motor step length compensation coefficient. For example, if the three main diagonal elements of the matrix are 1.2, 1.5, and 1.8, substituting them into the summation operation yields a result of 4.5. Dividing 4.5 by 3 gives a motor step length compensation coefficient of 1.5. Next, the initial reference step angle of the stepper rotation control terminal is obtained as 1.8 degrees. Based on the motor step length compensation coefficient of 1.5 and the base voltage amplitude coefficient of 0.8 in the voltage specification parameters, the initial reference step angle is divided by the motor step length compensation coefficient, and the quotient is multiplied by the base voltage amplitude coefficient to calculate the motor microstepping step angle parameter. Substituting the values ​​1.8, 1.5, and 0.8 into the above logical operation process, specifically, 1.8 divided by 1.5 yields 1.2, and then 1.2 multiplied by 0.8 yields the motor microstepping angle parameter of 0.96 degrees. The stepping angle drive specification within the rotary stepper control port is adjusted to 0.96 degrees. The 0.96-degree stepping angle drive specification and the basic pulse width modulation voltage specification are packaged into a communication protocol data packet in object spectrum format, and the protocol loading and encapsulation operation is performed. The encapsulated data is written to a non-volatile storage area to establish the hardware basic drive condition set. Table 1 is the parameter table for the test batch, showing some data parameters of the preprocessing step.

[0024] Table 1: Test Batch Parameter Table Table 1 shows the results of the key test batch parameters derived from the above process.

[0025] Please see Figure 3 The specific steps of S2 are as follows: S201: Call the hardware basic drive condition set, extract the bias angle reference parameter and timing synchronization period constant, adjust the continuous rotation state of the laser emitter polarizer according to the bias angle reference parameter, record the instantaneous deflection angle value, compile the waveform sequence according to the timing synchronization period constant, synchronously send the trigger level to the dedicated wavefront sensor, combine the instantaneous deflection angle value and the waveform sequence, and establish a polarization trigger state mapping table. Based on the extracted bias angle reference parameter, a pulse modulation signal is sent to the digital control pin of the beam polarization port to adjust the continuous rotation state of the polarization layer. During the rotation, the current physical rotation angle data is captured in real time at a sampling rate of 100 Hz through a high-precision rotation encoding node, and the instantaneous deflection angle value is recorded. According to the timing synchronization period constant, the built-in instruction set of the waveform generation function is called to compile and generate a square wave trigger waveform sequence. Through the universal serial bus communication interface, a trigger signal in a high-level state is synchronously sent to the dedicated wavefront sensing node. The recorded instantaneous deflection angle value and the compiled square wave trigger waveform sequence are aligned and spliced ​​according to the corresponding timestamp nodes to combine the instantaneous deflection angle value and the waveform sequence. The combined data array is written to the high-speed cache area to establish a polarization trigger state mapping table. For example, if the extracted bias angle reference parameter is 45 degrees and the timing synchronization period constant is 10 milliseconds, a signal is sent to the control pin to execute the rotation, and the instantaneous deflection angle value of 46.5 degrees is recorded at a specific moment. A continuous square wave sequence is generated based on a 10-millisecond period. The 46.5 degrees is combined with the specific square wave sequence at the same timestamp and stored in a mapping table.

[0026] S202: Using a polarization trigger state mapping table, the instantaneous deflection angle value and level pulse node are read. The image acquisition circuit is activated according to the level pulse node to acquire the solid light field interference fringe image of the orthogonal double-layer liquid crystal focusing lens. The pixel coordinate nodes in the interference fringe image are scanned, and the light intensity signal distribution parameters at the coordinate nodes are extracted. The pixel coordinate nodes and the light intensity signal distribution parameters are bound and fused to obtain the pixel light intensity amplitude array. Based on the rising edge signal of the high-level pulse node, the electronic switch node of the image acquisition circuit is closed, activating the image acquisition circuit. Through the charge-coupled image acquisition node, a grayscale image file of the solid light field interference fringes of the orthogonal double-layer liquid crystal focusing lens is acquired under 500 nm wavelength monochromatic light illumination. Data cleaning and preprocessing operations are performed on the acquired raw image file. Specifically, the cleaning process involves removing invalid noise regions 10 pixels wide from the image edges and smoothing the pixels within the image using a 3x3 window Gaussian filter algorithm to eliminate high-frequency noise caused by ambient stray light. Each pixel coordinate node in the preprocessed interference fringe image is scanned using row and column addressing operations. The absolute grayscale value at the coordinate node is extracted as a light intensity signal distribution parameter. Two-dimensional horizontal and vertical pixel coordinate nodes and their corresponding grayscale light intensity signal distribution parameters are combined to form a three-dimensional data tuple, and a binding and fusion operation is performed. The tuples are sequentially written into the data array according to the horizontal and vertical spatial arrangement order to obtain a pixel light intensity amplitude array. For example, a pixel node with coordinates of 150 on the horizontal axis and 200 on the vertical axis is read, and its grayscale value is extracted to be 185. The horizontal axis 150, the vertical axis 200, and the grayscale value 185 are combined to form a data tuple containing three values, which is then stored in the corresponding address of the pixel light intensity amplitude array. The advantage of this operation is that it obtains clean, raw spatial light intensity data at the underlying level through a high-level trigger mechanism combined with a filtering and cleaning algorithm.

[0027] S203: Retrieve the light intensity signal distribution parameters within the pixel light intensity amplitude array, compare the light intensity signal distribution parameters with the reference conversion scale, extract the projection values ​​of the light intensity fluctuation range, perform spatial frequency domain projection conversion to analyze the phase step characteristics of the projection values, convert the pixel light intensity signal into the corresponding phase delay scalar, reorganize the phase delay scalar according to the coordinate node arrangement order, and generate a full aperture phase delay matrix set. The algorithm retrieves a preset reference conversion scale from the non-volatile storage area. This scale is obtained by directly illuminating the sensor node with a standard reference beam in a non-interference state, using the average value of the background light intensity. The retrieved light intensity signal distribution parameter is then compared with this reference conversion scale using a difference operation. The projected value within the effective fluctuation range of -100 to +100 after the difference operation is extracted, and a spatial frequency domain projection conversion operation is performed to extract the phase angle parameter of the fundamental frequency component, analyzing the phase step characteristics corresponding to the projected value. The direct signal source for frequency domain analysis and fundamental frequency extraction is the projected value within the effective fluctuation range of -100 to +100 after the difference operation between the light intensity signal distribution parameter and the reference conversion scale. In other words, the algorithm first performs background noise reduction on the original interference fringes using difference, and then performs spatial frequency domain projection conversion on the purified projected value. In the field of optical interference fringe analysis, the spatial domain to frequency domain transformation (such as the classic Fourier transform) is performed on the interference intensity signal after removing the DC background. The phase angle data obtained from the frequency domain analysis is then converted into an absolute phase delay scalar by arctangent algebra operation, which corresponds to each pixel. Based on the original horizontal and vertical arrangement of the pixel coordinate nodes, all absolute phase delay scalars are filled into the corresponding positions in a two-dimensional empty matrix, and a recombination operation is performed to generate a set of full-aperture phase delay matrices. For example, the light intensity signal distribution parameter of a certain pixel is extracted as 150, and the reference conversion scale is retrieved as 100. Substituting the values ​​150 and 100 into the difference calculation yields a projected value of 50. Determining that the value 50 falls within the range of -100 to +100, the phase delay scalar is found to be 1.2 radians, which is then filled into the two-dimensional recombination matrix according to the coordinates.

[0028] Please see Figure 4 The specific steps of S3 are as follows: S301: Extract the polarization orientation associated tag sequence within the full aperture phase delay matrix set, retrieve the initial polarization time marker node within the polarization orientation associated tag sequence, traverse the spatial grid within the full aperture phase delay matrix set, segment and extract the phase delay scalar array bound to the marker node, combine the scalar values ​​within the array with the grid coordinate points, and establish the preceding phase distribution matrix. For the polarization orientation associated tag sequence, a string matching search operation is performed to find time marker nodes whose characteristic characters are the initial polarization state. After locating the initial polarization time marker node, the entire 1024-row and 1024-column two-dimensional spatial grid of the full aperture phase delay matrix set is traversed. Through index slicing, a specific phase delay scalar array strictly bound to the initial polarization time marker node in terms of timestamp is extracted. All floating-point scalar values ​​in this segmented array are extracted, and their corresponding original grid row and column coordinates are obtained. The scalar values ​​and grid coordinates in the array are combined to establish a 1024x1024 pre-phase distribution matrix. The construction process of this pre-matrix involves allocating continuous random access memory space and writing the scalar values ​​one by one according to the obtained row and column coordinates. For example, if the timestamp corresponding to the retrieved time marker node is 12 milliseconds, the scalar array corresponding to the 12 millisecond time is extracted. The coordinates of a point in this array are read as row 5, column 10, corresponding to a scalar value of 0.5 radians. Combine this value of 0.5 radians with the coordinates row 5 and column 10, and directly assign it to the corresponding position in row 5 and column 10 of the preceding phase distribution matrix to establish the preceding phase distribution matrix.

[0029] S302: Compare the labels of the remaining undivided meshes in the full aperture phase delay matrix set with the rotation termination time marker nodes, extract the phase delay scalar arrays corresponding to the meshes with the labels and marker nodes, project the extracted scalar arrays onto the reference orthogonal coordinate system to generate the arrangement topology, fuse the arrangement topology with the scalar values ​​in the extracted arrays, reconstruct the array dimension parameters, and obtain the post-phase distribution matrix. The phase delay scalar array corresponding to the mesh containing the node whose associated label time attribute is completely identical to the node marking the end of the rotation is extracted. A coordinate transformation function is called to project the extracted scalar array from its original polar coordinate form to a reference orthogonal Cartesian coordinate system, generating a mesh-like topology. The coordinate indices of this topology are fused with the actual scalar values ​​within the extracted array, and data formatting is performed to reconstruct the row and column dimensions of the array, standardizing it to a 1024x1024 two-dimensional data specification to obtain the post-phase distribution matrix. For example, if the timestamp corresponding to the node marking the end of the rotation is matched to 50 milliseconds, the scalar array corresponding to this 50 millisecond moment is extracted. In the original array, a certain data point has a polar coordinate with a radius of 10 and a polar angle of 45 degrees. This polar coordinate is projected to an orthogonal coordinate system to obtain an x-coordinate of 7.07 and a y-coordinate of 7.07. This is mapped to the nearest integer mesh node in row 7 and column 7. The corresponding scalar value of 0.8 radians is then incorporated into this mesh node. Reconstruct and generate a 1024x1024 post-phase distribution matrix.

[0030] S303: For the pre-phase distribution matrix and the post-phase distribution matrix, extract the row and column dimension boundary scale parameters, determine that the row and column dimension boundary scale parameters are in an equal value state, scan the corresponding position elements in the pre-phase distribution matrix and the post-phase distribution matrix that have the same row number and column number index features, perform a subtraction operation on the phase delay scalar carried in the corresponding position elements, integrate the subtraction operation difference in the entire aperture area, and construct the deformation stress distribution matrix; Compare the row and column parameters of the preceding and following matrices to determine if their row and column dimension boundary scale parameters are absolutely equal, i.e., confirm that both have 1024 rows and 1024 columns. After confirming the equality, initiate the dual-loop scan control logic. Scan the corresponding elements with the same row and column index characteristics in the preceding and following phase distribution matrices row by row and column by column. For the absolute phase delay scalar carried in the corresponding elements of the two matrices, use the scalar value of the following matrix as the minuend and the scalar value of the preceding matrix as the subtrahend, and perform an algebraic subtraction operation. Save the difference of the subtraction operation at all corresponding positions to the corresponding coordinate node of the new empty matrix, integrating all the difference of the subtraction operation within the entire 1024x1024 aperture area. For example, when scanning to the 100th row and 200th column position, extract the scalar value of 0.5 radians in the preceding matrix and 0.8 radians in the following matrix. The subtraction operation yields a difference of 0.3 radians. This value of 0.3 is then assigned to the 100th row and 200th column of the deformation stress distribution matrix to construct the matrix.

[0031] Please see Figure 5 The specific steps of S4 are as follows: S401: Based on the deformation stress distribution matrix, extract the stress values ​​of all nodes in the global domain, perform a descending sorting operation on the stress values ​​of all nodes in the global domain to generate a stress gradient sequence, set the index of the head-level truncation node, filter the elements in the stress gradient sequence that are located in the preceding interval of the truncation node, extract the deformation coordinate parameters carried by the preceding interval elements, bind and fuse the deformation coordinate parameters with the elements to generate local extreme stress clusters. The stress values ​​corresponding to all row and column coordinate nodes in the matrix are extracted, and all extracted global node stress values ​​are fed into the quicksort processing logic. A descending sort operation is performed based on the numerical values, generating a one-dimensional stress gradient sequence that decreases sequentially from largest to smallest. In the generated stress gradient sequence, the index of the first-order truncation node is set to the 50th element position. Based on this index, elements within the stress gradient sequence located in the preceding interval of the truncation node, i.e., from the 1st to the 50th position, are selected. The coordinate mapping dictionary of the original deformation stress distribution matrix is ​​called to extract the horizontal and vertical deformation coordinate parameters carried by these preceding interval elements. The extracted deformation coordinate parameters and the corresponding stress gradient elements are bound and fused at the data structure level to generate a set of local extreme stress clusters containing the spatial locations and specific values ​​of high-risk stress points. For example, a total of 10,000 node stress values ​​are extracted globally. After descending sorting, the stress value at the first position is 8.5 MPa, and the stress value at the 50th position is 6.2 MPa. Extract the first 50 data points between 8.5 and 6.2. Extract the original matrix coordinates corresponding to the first-ranked value, 8.5, into a matrix with 50 rows and 60 columns. Store these coordinates as a coordinate-value pair in a local extremum stress cluster.

[0032] S402: Call the local extreme stress cluster, retrieve all hierarchical elements in the corresponding deformation stress distribution matrix, extract the absolute deformation amplitude parameter of the element, perform continuous arithmetic accumulation traversal operation on the absolute deformation amplitude parameter, obtain the total value of global deformation amplitude, compare the total value of deformation energy with the total number of grid nodes, perform algebraic division operation, calculate the arithmetic summation value of the selected head element, and obtain the global stress characterization scalar; Retrieve all data elements at all levels within the corresponding deformation stress distribution matrix. By calling the absolute value function, convert all data elements that originally had positive and negative directional characteristics into absolute deformation amplitude parameters. Initialize a double-precision floating-point accumulator variable for all absolute deformation amplitude parameters. Perform continuous arithmetic accumulation traversal operation, adding each absolute amplitude to the accumulator sequentially to obtain the value representing the total deformation amplitude of the entire domain. Simultaneously, read the dimension parameter of the deformation stress distribution matrix to calculate the total number of grid nodes. Compare the accumulated total deformation energy value with the total number of grid nodes. Use the total deformation energy value as the dividend and the total number of grid nodes as the divisor to perform algebraic division. Calculate the arithmetic summation value of the selected head elements to obtain the global stress characterization scalar. For example, traversing a matrix block containing 100 nodes, taking the absolute value and performing accumulation operation, the total deformation amplitude value of the entire domain is 350. The total number of grid nodes is read as 100. Dividing the value 350 by the value 100 yields an arithmetic summation value of 3.5 for the selected head elements. This value of 3.5 is set as the global stress characterization scalar. Table 2 shows some of the stress characterization parameters, illustrating the core parameters involved in the calculation process.

[0033] Table 2: Local Stress Parameters Table 2 lists in detail the values ​​of various stress characterization parameters obtained based on the aforementioned logical deduction.

[0034] S403: For the global stress characterization scalar, retrieve the engineering allowable stress tolerance scalar in the initial component characteristic parameter table, compare the global stress characterization scalar with the engineering allowable stress tolerance scalar, perform numerical magnitude difference operation, extract the differential operation feedback boundary overflow amplitude parameter, determine the state of the safety judgment interval mapped by the boundary overflow amplitude parameter, assemble the overflow amplitude parameter and attribute label, and obtain the stress over-limit judgment and global characterization set; The global stress characterization scalar is compared with the allowable stress tolerance scalar of the engineering project. The allowable stress tolerance scalar of the engineering project is subtracted from the global stress characterization scalar, and a numerical differential operation is performed. The absolute value of the differential operation is extracted as the boundary overflow amplitude parameter. The local safety judgment interval configuration file is called, which is set to 0 to 1.5 MPa, to determine whether the extracted boundary overflow amplitude parameter falls within the safety judgment interval. Subsequently, a corresponding risk attribute label is assigned to the boundary overflow amplitude parameter. If it falls within the safety interval, a normal operation label is assigned; if it exceeds the safety interval, a high-risk out-of-bounds label is assigned. The boundary overflow amplitude parameter and the assigned risk attribute label are combined into a key-value pair data format, assembled, and written to a temporary memory area to obtain the stress over-limit judgment and global characterization set.

[0035] Please see Figure 6 The specific steps of S5 are as follows: S501: By using stress over-limit judgment and global characterization set, extract boundary overflow amplitude parameters and risk attribute labels, compare risk assessment numerical parameters with over-limit judgment benchmark threshold scalar, extract abnormal nodes associated with the over-threshold interval, map the associated abnormal nodes to the drive deflection angle adjustment channel, screen the corresponding intervention instruction code triggered in the channel for over-limit situations, and establish a deflection angle control action sequence. The data structure is analyzed to extract the boundary overflow amplitude parameter and its corresponding risk attribute label. The boundary judgment benchmark threshold scalar, fixed in the underlying read-only storage area, is retrieved. The risk level value corresponding to the extracted risk attribute label is compared with this boundary judgment benchmark threshold scalar. For the judgment result exceeding the benchmark threshold range, the coordinate data of abnormal nodes with spatial mapping correlation in the local extreme stress cluster is extracted. These correlated abnormal node coordinate data are mapped to the drive deflection angle adjustment channel of the underlying hardware via a mapping bus. In the instruction library of the adjustment channel control program, the corresponding intervention instruction code triggered for this type of boundary overflow is selected based on the coordinate distribution location. Multiple intervention instruction codes are combined and concatenated according to their execution priority. For example, the risk attribute label corresponds to a risk level of 3. The boundary judgment benchmark threshold scalar is set to 2. The comparison shows that the value 3 is greater than the value 2, indicating that the boundary overflow range has been exceeded. The coordinates of the correlated abnormal nodes are extracted as row 50, column 60. After mapping the coordinates to the drive deflection angle adjustment channel, the counter-clockwise fine-tuning intervention command code with the hexadecimal value 0xBB is selected. This command code is written to the first position of the execution queue to establish the final deflection angle control action sequence.

[0036] S502: Based on the deflection angle control action sequence, call the global stress characterization scalar, retrieve the voltage conversion sensitivity constant in the initial component characteristic parameter table, perform an algebraic multiplication operation on the global stress characterization scalar and the voltage conversion sensitivity constant, extract the multiplication to obtain the product feedback value, convert the product feedback value into the level pulse width adjustment quantization coefficient, and construct the voltage regulation compensation scale. The voltage conversion sensitivity constant stored in the initial component characteristic parameter table is retrieved via pointer address. The retrieved global stress characterization scalar and voltage conversion sensitivity constant are input into the arithmetic logic processing thread to perform an algebraic product operation. The product feedback value is extracted. Subsequently, the linear quantization function program is called to divide the product feedback value by the preset maximum reference voltage constant, and the resulting quotient is multiplied by the maximum duty cycle count value of 255. This is converted into an integer level pulse width adjustment quantization coefficient in the range of 0 to 255, thus constructing the voltage regulation compensation scale set. For example, if the global stress characterization scalar is 3.5, the retrieved voltage conversion sensitivity constant is 5. The sensitivity constant is a preset parameter obtained by separating and obtaining the test information text file of the target test batch for a specific test batch. In the fields of industrial automation and precision instrument control, for devices with different designs, materials, or processes, the inherent attribute data (such as this constant) calibrated before leaving the factory is written into solid-state memory for the system to use as a lookup table or product coefficient during subsequent operation. This is a very standard and mature technical approach. The numerical values ​​3.5 and 5 are algebraically multiplied, and the resulting feedback value is 17.5. The preset maximum reference voltage constant is set to 100. Dividing 17.5 by 100 yields 0.175, which is then multiplied by 255 to obtain 44.625. This is then converted into a pulse width modulation quantization coefficient of 45 using rounding logic. This coefficient of 45 is stored in the voltage regulation compensation scale set.

[0037] S503: Extract the level pulse width modulation quantization coefficient within the voltage regulation compensation scale, retrieve the basic pulse width modulation voltage specification within the drive voltage specification configuration set, superimpose the level pulse width modulation quantization coefficient onto the duty cycle period parameter corresponding to the basic voltage specification, perform parameter superposition update and replacement operation, perform dual-channel instruction protocol splitting and mapping on the updated duty cycle parameter configuration code, separate the control level signal corresponding to the orthogonal dual-layer structure, and generate a set of dual-layer independent adjustment instructions; Retrieve the base pulse width modulation voltage specification from the initial stage drive voltage specification configuration set generated in the non-volatile memory area. Extract the initial duty cycle parameter corresponding to this specification. Directly superimpose the level pulse width adjustment quantization coefficient onto the initial duty cycle parameter corresponding to the base pulse width modulation voltage specification, and perform a parameter superposition update and replacement operation. For the updated duty cycle parameter, reconfigure and encode it into a hexadecimal instruction string according to the underlying communication protocol specification. The control level signals corresponding to the orthogonal double-layer structure are separated, and the encoded instructions are sent to the dual-channel distribution port to perform a dual-channel instruction protocol splitting and mapping operation. Specifically, the high-level and low-level data segments included in the updated duty cycle parameter configuration encoding are extracted. For the high-level data segments, a serial-to-parallel conversion logic operation is performed to obtain a horizontally independent data stream; for the low-level data segments, a serial-to-parallel conversion logic operation is performed to obtain a vertically independent data stream. The horizontally independent data stream is input into a preset horizontal level control channel to generate a first physical pulse sequence, and the vertically independent data stream is input into a preset vertical level control channel to generate a second physical pulse sequence. The first and second physical pulse sequences are combined, and the resulting level sequence is defined as the control level signal corresponding to the orthogonal double-layer structure. Independent control level signal sequences corresponding to the upper and lower lenses are separated through decoding. A set of dual-layer independent adjustment instructions containing two independent signals is generated and sent to the physical pins. For example, the level pulse width adjustment quantization coefficient is extracted to be 45. The basic pulse width modulation duty cycle period parameter is retrieved to be 100. The values ​​45 and 100 are superimposed to obtain the updated duty cycle parameter of 145. The value 145 is then converted to configuration code 0x91. A protocol splitting and mapping operation is performed on 0x91 to separate the level signal instruction 72 controlling the upper lens and the level signal instruction 73 controlling the lower lens. These are combined to generate the instruction set and control the hardware actions.

[0038] Table 3: Hardware Output Control Table Table 3 shows the results of the various independent control parameters separated in the final stage of the entire processing flow.

[0039] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of protection of the described technical solutions.

Claims

1. A method for testing the polarization sensitivity and optimizing the parameters of a non-polarizing liquid crystal focusing lens, characterized in that, Includes the following steps: S1: Collect test information of target test batch in local solid-state memory, filter engineering allowable stress tolerance scalar, voltage conversion sensitivity constant and interlayer stress elastic matrix, identify basic pulse width modulation voltage specifications, adjust the step angle drive specifications of rotary stepper motor, and establish a set of hardware basic drive conditions. S2: Call the hardware basic driving condition set, adjust the continuous rotation state of the laser emitter polarizer, synchronously send the trigger level to the dedicated wavefront sensor, collect the solid light field interference fringe image of the orthogonal double-layer liquid crystal focusing lens, convert the pixel light intensity signal into the corresponding phase delay scalar, and generate the full aperture phase delay matrix set. S3: Using the full aperture phase delay matrix set, subtract the corresponding elements of the pre-phase matrix and the post-phase matrix corresponding to the initial polarization to obtain the deformation stress distribution matrix.

2. The method for polarization sensitivity testing and parameter optimization of a non-polarizing liquid crystal focusing lens according to claim 1, characterized in that, The method further includes: S4: Based on the deformation stress distribution matrix, filtering the top N extreme values ​​that exceed the preset deformation threshold, calculating the arithmetic summation value of the filtered head elements, outputting the global stress characterization scalar, determining the numerical magnitude relationship between the global stress characterization scalar and the engineering allowable stress tolerance scalar, and obtaining the stress over-limit judgment and global characterization set.

3. The method for polarization sensitivity testing and parameter optimization of a non-polarizing liquid crystal focusing lens according to claim 1, characterized in that, The method further includes: S5: through the stress over-limit judgment and the global characterization set, identify the deflection angle control action caused by the stress over-limit judgment, calculate the global stress characterization scalar multiplied by the voltage conversion sensitivity constant, adjust the basic pulse width modulation voltage specification, and generate a set of dual-layer independent adjustment instructions.

4. The method for polarization sensitivity testing and parameter optimization of a non-polarizing liquid crystal focusing lens according to claim 1, characterized in that, The specific steps of S1 are as follows: S101: Collect test information of the target test batch in the local solid-state memory, extract the material property vector and stress load record in the test batch, compare the material property vector with the set standard deformation displacement threshold scalar, screen and separate the engineering allowable stress tolerance scalar and voltage conversion sensitivity constant, extract the interlayer deformation feature sequence and splice to reconstruct the interlayer stress elastic matrix, and arrange and fuse the reconstructed matrix and the separated parameters in a time sequence to establish an initial component characteristic parameter table; S102: Call the initial component characteristic parameter table, extract the voltage conversion sensitivity constant and the engineering allowable stress tolerance scalar, multiply the independently extracted constant and scalar to obtain the driving voltage reference value, compare the driving voltage reference value with the power supply equipment output level limit range, extract the intersection value that meets the conditions to map the pulse width duty cycle configuration code, identify the basic pulse width modulation voltage specification indicated by the corresponding duty cycle configuration code, and obtain the driving voltage specification configuration set; S103: Based on the drive voltage specification configuration set, retrieve the interlayer stress elastic matrix, extract the numerical feature values ​​of the main diagonal elements to calculate the motor step length compensation coefficient, calculate the motor microstep angle parameter based on the motor step length compensation coefficient and voltage specification parameters, adjust the step angle drive specification in the control port of the rotary stepper motor, and encapsulate the step angle drive specification and the basic pulse width modulation voltage specification through protocol loading to establish a hardware basic drive condition set.

5. The method for polarization sensitivity testing and parameter optimization of a non-polarizing liquid crystal focusing lens according to claim 4, characterized in that, The specific steps of S2 are as follows: S201: Call the hardware basic driving condition set, extract the bias angle reference parameter and timing synchronization period constant, adjust the continuous rotation state of the laser emitter polarizer according to the bias angle reference parameter, record the instantaneous deflection angle value, compile the waveform sequence according to the timing synchronization period constant, synchronously send the trigger level to the dedicated wavefront sensor, combine the instantaneous deflection angle value and the waveform sequence, and establish a polarization trigger state mapping table. S202: Using the polarization trigger state mapping table, read the instantaneous deflection angle value and level pulse node, activate the image acquisition circuit according to the level pulse node, acquire the solid light field interference fringe image of the orthogonal double-layer liquid crystal focusing lens, scan the pixel coordinate nodes in the interference fringe image, extract the light intensity signal distribution parameter at the coordinate node, bind and fuse the pixel coordinate node and the light intensity signal distribution parameter to obtain the pixel light intensity amplitude array. S203: Retrieve the light intensity signal distribution parameters within the pixel light intensity amplitude array, compare the light intensity signal distribution parameters with the reference conversion scale, extract the projection values ​​of the light intensity fluctuation range, perform spatial frequency domain projection conversion to analyze the phase step characteristics of the projection values, convert the pixel light intensity signal into the corresponding phase delay scalar, reorganize the phase delay scalar according to the coordinate node arrangement order, and generate a full aperture phase delay matrix set.

6. The method for polarization sensitivity testing and parameter optimization of a non-polarized liquid crystal focusing lens according to claim 5, characterized in that, The specific steps for S3 are as follows: S301: Extract the polarization orientation associated tag sequence within the full aperture phase delay matrix set, retrieve the initial polarization time marker node within the polarization orientation associated tag sequence, traverse the spatial arrangement grid within the full aperture phase delay matrix set, segment and extract the phase delay scalar array bound to the marker node, combine the scalar values ​​within the array with the grid coordinate points, and establish the preceding phase distribution matrix. S302: Compare the associated labels of the remaining undivided meshes in the full aperture phase delay matrix set with the rotation termination time marker nodes, extract the phase delay scalar arrays corresponding to the associated labels and marker nodes in the same mesh, project the extracted scalar arrays onto the reference orthogonal coordinate system to generate an arrangement topology, fuse the arrangement topology with the scalar values ​​in the extracted arrays, reconstruct the array dimension parameters, and obtain the post-phase distribution matrix. S303: For the preceding phase distribution matrix and the following phase distribution matrix, extract the row and column dimension boundary scale parameters, determine that the row and column dimension boundary scale parameters are in an equal value state, scan the corresponding position elements in the preceding phase distribution matrix and the following phase distribution matrix that have the same row number and column number index features, perform a subtraction operation on the phase delay scalar carried in the corresponding position element, integrate the subtraction operation difference in the entire aperture area, and construct the deformation stress distribution matrix.

7. The method for polarization sensitivity testing and parameter optimization of a non-polarizing liquid crystal focusing lens according to claim 6, characterized in that, The initial phase scalars included in the corresponding position elements in the preceding phase distribution matrix are extracted as the preceding operation objects, and the terminating phase scalars included in the corresponding position elements with the same row number and column number index features in the following phase distribution matrix are extracted as the following operation objects. Perform the subtraction operation between the preceding and following operands to obtain the absolute difference parameter. Define the absolute difference parameter as the difference of the subtraction operation and store it in the corresponding coordinate point in a preset blank matrix with the same dimensional scale as the full aperture region.

8. The method for polarization sensitivity testing and parameter optimization of a non-polarized liquid crystal focusing lens according to claim 6, characterized in that, The specific steps of S4 are as follows: S401: Based on the deformation stress distribution matrix, extract the stress values ​​of all nodes in the global domain, perform a descending sorting operation on the stress values ​​of all nodes in the global domain to generate a stress gradient sequence, set the index of the head-level truncation node, filter the elements in the stress gradient sequence that are located in the preceding interval of the truncation node, extract the deformation coordinate parameters carried by the preceding interval elements, bind and fuse the deformation coordinate parameters with the elements to generate a local extreme stress cluster. S402: Call the local extreme stress cluster, retrieve all hierarchical elements in the corresponding deformation stress distribution matrix, extract the absolute deformation amplitude parameter of the element, perform continuous arithmetic accumulation traversal operation on the absolute deformation amplitude parameter, obtain the total value of global deformation amplitude, compare the total value of deformation energy with the total number of grid nodes, perform algebraic division operation, calculate the arithmetic summation value of the selected head element, and obtain the global stress characterization scalar; S403: For the global stress characterization scalar, retrieve the engineering allowable stress tolerance scalar from the initial component characteristic parameter table, compare the global stress characterization scalar with the engineering allowable stress tolerance scalar, perform numerical magnitude difference operation, extract the differential operation feedback boundary overflow amplitude parameter, determine the state of the safety judgment interval mapped by the boundary overflow amplitude parameter, assemble the overflow amplitude parameter and attribute label, and obtain the stress over-limit judgment and global characterization set.

9. The method for polarization sensitivity testing and parameter optimization of a non-polarized liquid crystal focusing lens according to claim 8, characterized in that, Extract the independent scalars included in the stress values ​​of all nodes and perform pairwise numerical comparisons. Construct a one-dimensional queue according to the numerical arrangement from largest to smallest, assign incremental numerical labels to the nodes in the one-dimensional queue, and define the one-dimensional queue with additional incremental numerical labels as a stress gradient sequence. The total number of nodes included in the statistical stress gradient sequence is calculated. The preset scaling factor is multiplied by the total number of nodes to obtain the product floating-point parameter. The product floating-point parameter is then rounded down to generate a discrete integer parameter. Discrete integer parameters are mapped to stress gradient sequences and defined as head-level truncation node indices.

10. The method for testing the polarization sensitivity and optimizing the parameters of a polarization-free liquid crystal focusing lens according to claim 8, characterized in that, The specific steps of S5 are as follows: S501: Through the stress over-limit judgment and global characterization set, extract the boundary overflow amplitude parameter and risk attribute label, compare the risk assessment numerical parameter with the over-limit judgment benchmark threshold scalar, extract the abnormal nodes associated with the over-threshold interval, map the associated abnormal nodes to the drive deflection angle adjustment channel, filter the corresponding intervention instruction code triggered for the over-limit situation in the channel, and establish the deflection angle control action sequence. S502: Based on the deflection angle control action sequence, call the global stress characterization scalar, retrieve the voltage conversion sensitivity constant in the initial component characteristic parameter table, perform an algebraic multiplication operation on the global stress characterization scalar and the voltage conversion sensitivity constant, extract the multiplication to obtain the product feedback value, convert the product feedback value into the level pulse width adjustment quantization coefficient, and construct the voltage regulation compensation scale. S503: Extract the level pulse width adjustment quantization coefficient within the voltage regulation compensation scale, retrieve the basic pulse width modulation voltage specification within the drive voltage specification configuration set, superimpose the level pulse width adjustment quantization coefficient onto the duty cycle period parameter corresponding to the basic voltage specification, perform parameter superposition update and replacement operation, perform dual-channel instruction protocol splitting and mapping on the updated duty cycle parameter configuration code, separate the control level signal corresponding to the orthogonal dual-layer structure, and generate a set of dual-layer independent adjustment instructions.

11. The method for testing the polarization sensitivity and optimizing the parameters of a polarization-free liquid crystal focusing lens according to claim 10, characterized in that, Extract the high-level and low-level data segments included in the updated duty cycle parameter configuration code. Perform serial-to-parallel conversion logic operation on the high-level data segments to obtain a horizontally independent data stream. Perform serial-to-parallel conversion logic operation on the low-level data segments to obtain a vertically independent data stream. The independent data streams in the horizontal dimension are input into the preset horizontal level control channel to generate the first physical pulse sequence, and the independent data streams in the vertical dimension are input into the preset vertical level control channel to generate the second physical pulse sequence. The first physical pulse sequence and the second physical pulse sequence are combined, and the resulting level sequence is defined as the control level signal corresponding to the orthogonal double-layer structure.

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