An experimental device for measuring Young's modulus of metal wire by using a micrometer
By combining a micrometer screw gauge and an autocollimating telescope, the problem of lateral distance measurement error in the traditional optical lever method is solved, achieving high precision in the measurement of Young's modulus of metal wire and simplifying optical path adjustment.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- NANJING COLLEGE OF INFORMATION TECH
- Filing Date
- 2025-04-27
- Publication Date
- 2026-06-23
AI Technical Summary
When measuring the Young's modulus of a metal wire using the traditional optical lever method, the lateral distance between the telescope and the optical lever plane mirror is difficult to measure accurately, leading to increased measurement errors.
A device combining a micrometer screw gauge and an autocollimating telescope is used to measure the minute elongation of a metal wire using the micrometer screw gauge and to calibrate the tilt of the optical lever reflector using the autocollimating telescope, thus avoiding large lateral distance measurement errors between the observation frame and the measuring frame.
It improves the accuracy of Young's modulus measurement of metal wires, reduces errors caused by large spatial distance measurements, and simplifies the optical path adjustment process.
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Figure CN224399121U_ABST