Universal diode test socket

Abstract

The utility model relates to electronic component testing equipment technical field especially a general diode test seat, including base, upper cover, at least two claw type elastic probe and connecting assembly, the base is along its length direction and is set up through type bearing groove, the both ends of bearing groove length direction are coaxial cylindrical surface end wall, the upper cover is along its length direction and is set up through type cover groove, and the both ends of cover groove length direction are the arc end wall of coaxial with bearing groove end wall, the upper cover is through connecting assembly and covers on the base, makes bearing groove and cover groove position coincidence and forms the restraint cavity of diode middle part limit, claw type elastic probe position corresponds with the restraint cavity position and claw type elastic probe part extends in the outside of base and upper cover, can improve single equipment test containing capacity through the utility model, makes the test efficiency greatly improve.

Description

Technical Field

[0001] This utility model relates to the technical field of electronic component testing equipment, specifically to a general-purpose diode test socket. Background Technology

[0002] With the continuous development of the electronics industry, the demand for electronic components is increasing daily. To ensure the performance of electronic components, they are usually placed in test sockets for testing, screening, and aging experiments to obtain electronic components that meet usage standards. Different electronic components are classified according to their functions, such as resistors, capacitors, semiconductors, or transformers, and different test sockets are required for testing different electronic components.

[0003] For customized high-power diodes with significant physical dimensions (40-70mm in diameter), current testing solutions rely on a planar single-layer architecture. This approach suffers from severe space compression due to the macro-scale characteristics of the devices: the effective capacity of the equipment in a single test cycle is limited to a very low level (typically ≤8 devices), resulting in a decrease in testing efficiency per unit time compared to standard devices. Furthermore, critical thermal coupling and mechanical interference between devices further restrict testing accuracy and reliability, constituting a bottleneck for large-scale testing. Utility Model Content

[0004] To address the shortcomings of existing technologies, the purpose of this invention is to provide a universal diode test socket that can increase the testing capacity of a single device and significantly improve testing efficiency.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a universal diode test socket, comprising a base, a top cover, at least two claw-type elastic probes, and a connecting assembly; the base has a through-type bearing groove along its length, and the two ends of the bearing groove along its length are coaxial cylindrical curved end walls; the top cover has a through-type cover groove along its length, and the two ends of the cover groove along its length are arc-shaped end walls coaxial with the end walls of the bearing groove; the top cover is fitted onto the base through the connecting assembly, so that the bearing groove and the cover groove coincide to form a constraint cavity that limits the center of the diode; the claw-type elastic probes are positioned corresponding to the position of the constraint cavity, and the claw-type elastic probes extend to the outside of the base and the top cover.

[0006] Preferably, the lengths of the bearing groove and the cover groove close to each other are both greater than the diameter of the diode, and the lengths of the bearing groove and the cover groove gradually decrease in the direction away from each other.

[0007] Preferably, the base has a receiving groove in the middle that communicates with the bearing groove, and the bottom of the receiving groove has two slots placed on both sides of the bearing groove, and the slots correspond one-to-one with the claw-type elastic probes.

[0008] Preferably, the claw-type elastic probe is composed of a probe, a support portion and an elastic portion from bottom to top; the support portion is located in the slot, the probe passes through the slot and extends downward to the base, the elastic portion extends above the receiving groove, and both elastic portions are curved structures that tend towards the bearing groove.

[0009] Preferably, the lower end of the upper cover body is provided with two pressing blocks, which are placed on both sides of the cover groove and correspond to the position of the receiving groove; after the upper cover is closed on the base, the pressing blocks extend into the receiving groove and press against the outer side of the elastic part at the corresponding position.

[0010] Preferably, the base has a latch at its first end for locking with the connecting component.

[0011] Preferably, the base has a mounting groove at its tail end; the connecting component includes a hinge pin, a buckle, and a buckle pin; the top cover has a downwardly protruding connecting block at its tail end, the connecting block is located in the mounting groove and is rotatably connected to the base via the hinge pin; the buckle is movably disposed at the head end of the top cover via the buckle pin, and the buckle's locking mechanism is slidably adapted to the latch at the head end of the base.

[0012] Preferably, the connecting component includes a plurality of pins disposed on the upper cover; the base has a plurality of insertion holes that are connected to the corresponding pins.

[0013] Preferably, both the base and the top cover are made of polyphenylene sulfide.

[0014] Preferably, the claw-type elastic probe is an integral copper component.

[0015] Compared with the prior art, the beneficial effects of this utility model are:

[0016] 1. By setting a geometric self-centering structure composed of arc-shaped end walls on the base and top cover, it is possible to quickly and accurately position circular diodes of different diameters in a vertical (standing) posture. Furthermore, during testing, multiple test sockets are arranged at intervals along the length of the test socket to reduce the projected area of ​​the diodes, thereby significantly reducing the space occupied by a single diode on the aging board. This achieves the goal of greatly increasing the number of diodes that can be accommodated at one time on a test fixture of a given area, ultimately greatly improving the testing efficiency.

[0017] 2. After the diode is clamped, both its upper and lower ends are completely exposed to the air and are not blocked by the test socket body. When the test socket is placed on the aging board or other tooling, this open structure greatly optimizes air convection and significantly improves the heat dissipation efficiency of the diode during testing (especially high power and aging tests), preventing the device from overheating and ensuring safe and reliable testing. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the test stand in use according to the present invention;

[0019] Figure 2 For the present utility model Figure 1 A schematic diagram of the radial cross-section of the diode under test in the test socket under use;

[0020] Figure 3 This is a schematic diagram of the base structure of this utility model;

[0021] Figure 4 This is a schematic diagram of the lower side structure of the upper cover of this utility model;

[0022] Figure 5 This is a schematic diagram of the claw-type elastic probe structure of this utility model.

[0023] In the diagram: 1. Base, 2. Top cover, 3. Hinge pin, 4. Snap fastener, 5. Snap fastener pin, 6. Claw-type elastic probe, 7. Diode, 11. Carrier groove, 12. Receiving groove, 13. Slot, 14. Mounting groove, 15. Tongue, 21. Cover groove, 22. Pressing block, 23. Connecting block, 61. Probe, 62. Support part, 63. Elastic part. Detailed Implementation

[0024] The specific embodiments of this utility model are described in detail below with reference to the accompanying drawings, so that those skilled in the art can more clearly understand how to practice this utility model. Although this utility model has been described in conjunction with its preferred embodiments, these embodiments are merely illustrative and not intended to limit the scope of this utility model.

[0025] See Figure 1-5In one embodiment of this utility model, a universal diode test socket is provided for vertical testing of customized high-power diodes 7 with relatively large physical dimensions (diameter 40-70mm). The socket includes: a base 1, a top cover 2, claw-type elastic probes 6, and connecting components. A through-type support groove 11 is formed along the length of the base 1. The two ends of the support groove 11 are constructed as coaxial cylindrical curved end walls, making the support groove 11 a geometrically self-centering structure. When a circular diode 7 is placed in the support groove 11, these curved end walls force the diode's axis to be parallel to the upper plane of the base, thereby achieving vertical testing of the diode 7. Automatic posture positioning; the upper cover 2 has a through-type cover groove 21 along its length direction, and the two ends of the cover groove 21 are also designed as arc-shaped end walls coaxial with the end walls of the bearing groove 11; the upper cover 2 is covered onto the base 1 by a connecting component, so that the bearing groove 11 and the cover groove 21 are aligned and form a constraint cavity for centrally limiting the diode 7; after the diode 7 is clamped, its upper and lower parts extend beyond the test seat body (base 1 and upper cover 2); two claw-type elastic probes 6 are provided, and both are arranged in the corresponding positions of the constraint cavity, so as to realize electrode contact and mechanical clamping of the diode 7.

[0026] Furthermore, the lengths of the slots of the carrier slot 11 and the cover slot 21 that are close to each other are both greater than the diameter of the circular diode. This ensures that the diode can be smoothly placed into the slot and will not get stuck due to the narrowness of the slot during clamping. In addition, the lengths of the carrier slot 11 and the cover slot 21 gradually decrease in the direction away from each other, forming an inwardly curved structure, similar to the shape of a "trumpet". This design can better adapt to the shape of the circular diode and make it more stable during clamping.

[0027] Furthermore, the base 1 has a receiving groove 12 in the middle that communicates with the support groove 11. The bottom of the receiving groove 12 has two slots 13 placed on both sides of the support groove 11, and the two slots 13 correspond one-to-one with the claw-type elastic probes 6. The claw-type elastic probes 6 are integral copper parts, consisting of a probe 61, a support part 62, and an elastic part 63 from bottom to top. After installation, the support part 62 is located in the slot 13, and the probe 61 passes through the slot 13 and extends downwards from the base 1. During testing, the probe 61 is used to connect and energize the aging board. The elastic part 63 extends above the receiving groove 12. At the same time, both elastic parts 63 on both sides are curved structures that tend to move towards the support groove 11, so that the two elastic parts 63 have a natural tendency to move closer together. When the diode 7 is placed in the support groove 11, the elastic parts 63 on both sides of the diode 7 can pre-clamp the diode 7.

[0028] The base 1 has a mounting groove 14 at its tail end and a latch 15 at its head end for locking with the connecting component.

[0029] The lower end of the upper cover 2 body also has two pressing blocks 22. The two pressing blocks 22 are placed on both sides of the cover groove 21, and the two pressing blocks 22 correspond to the position of the receiving groove 12. After the upper cover 2 is closed on the base 1, the two pressing blocks 22 extend into the receiving groove 12 and press against the outer side of the corresponding elastic part 63. At this time, the elastic part 63 is located inside the pressing block 22.

[0030] The squeezing block 22 forces the two elastic parts 63 to move closer together, thereby achieving a strong clamping of the upper part of the diode 7 and significantly improving the test stability.

[0031] The connecting assembly includes a hinge pin 3, a buckle 4, and a buckle pin 5. The tail end of the upper cover 2 is provided with a downwardly protruding connecting block 23. The connecting block 23 is located in the mounting groove 14 and is rotatably connected to the base 1 through the hinge pin 3. Under the action of external force, the upper cover 2 can be flipped up and down relative to the base 1. The buckle 4 is movably set at the head end of the upper cover 2 through the buckle pin 5. Under the action of external force, the buckle 4 can be flipped up and down relative to the upper cover 2. The latch of the buckle 4 is slidably adapted to the latch tongue 15 at the head end of the base 1. After the upper cover 2 is closed, the buckle 4 is operated to lock its latch with the latch tongue 15, ensuring that the upper cover 2 is stable after being placed on the base 1.

[0032] The purpose of the connecting component is to facilitate the closing of the upper cover 2 and the base 1 and to stabilize the closed state. In one embodiment, the upper cover 2 and the base 1 can also be assembled and fixed in other ways. For example, a pin can be provided on the upper cover 2, and a hole corresponding to the position of the pin can be opened on the base 1. The upper cover 2 and the base 1 can be assembled and fixed by plugging. By simplifying the connection method, the production cost of this test socket can be reduced.

[0033] Both the top cover 2 and the base 1 are made of PPS (polyphenylene sulfide), which not only achieves lightweighting but also improves the anti-interference, high temperature resistance, and aging resistance of this fixture.

[0034] Operating status and advantages: During testing, the entire test socket (base 1 is fixed) is fixed on the aging board, and then the aging board is inserted into the test equipment. Diode 7 is stably clamped in the middle of the test socket and maintains a vertical posture. The vertical posture can reduce the projected area of ​​diode 7 on the aging board, making the space occupied by a unit diode on the aging board smaller. Since the upper and lower parts of diode 7 are fully exposed to the air and are not blocked by the test socket, this structure greatly promotes the effective heat dissipation of diode 7 during the test, which is especially suitable for high-power test scenarios.

[0035] This technical solution utilizes a geometric self-centering structure with arc-shaped end walls on the base and top cover. This not only enables the rapid and accurate automatic positioning of circular diodes of different diameters in a vertical (standing) orientation, but also significantly reduces the space occupied by a single diode on the aging board by arranging multiple test sockets at intervals along the length of the test socket during testing, thereby reducing the projected area of ​​the diode. This achieves the goal of greatly increasing the number of diodes that can be accommodated at one time on a test fixture of a given area, ultimately resulting in a significant improvement in testing efficiency.

[0036] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model and are not intended to limit it. Although this utility model has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this utility model without departing from the spirit and scope of the technical solutions of this utility model, and all such modifications or substitutions should be covered within the scope of the claims of this utility model.

Claims

1. A universal diode test socket, characterized in that: The device includes a base (1), a top cover (2), at least two claw-type elastic probes (6), and a connecting assembly. The base (1) has a through-type bearing groove (11) along its length direction, and the two ends of the bearing groove (11) along its length direction are coaxial cylindrical curved end walls. The top cover (2) has a through-type cover groove (21) along its length direction, and the two ends of the cover groove (21) along its length direction are arc-shaped end walls coaxial with the end walls of the bearing groove (11). The top cover (2) is fitted onto the base (1) through the connecting assembly, so that the bearing groove (11) and the cover groove (21) coincide to form a constraint cavity that limits the middle part of the diode. The position of the claw-type elastic probes (6) corresponds to the position of the constraint cavity, and the claw-type elastic probes (6) extend to the outside of the base (1) and the top cover (2).

2. The universal diode test socket according to claim 1, characterized in that: The lengths of the slots of the carrier slot (11) and the cover slot (21) that are close to each other are both greater than the diameter of the diode, and the lengths of the carrier slot (11) and the cover slot (21) gradually decrease in the direction away from each other.

3. A universal diode test socket according to claim 1, characterized in that: The base (1) has a receiving groove (12) in the middle that communicates with the bearing groove (11). The bottom of the receiving groove (12) has two slots (13) placed on both sides of the bearing groove (11). The slots (13) correspond one-to-one with the claw-type elastic probe (6).

4. A universal diode test socket according to claim 3, characterized in that: The claw-type elastic probe (6) consists of a probe (61), a support (62) and an elastic part (63) from bottom to top. The support (62) is located in the slot (13), the probe (61) penetrates the slot (13) and extends downward to the base (1), the elastic part (63) extends to the upper part of the receiving groove (12), and both sides of the elastic part (63) are curved structures that tend towards the bearing groove (11).

5. A universal diode test socket according to claim 4, characterized in that: The lower end of the upper cover (2) body is provided with two pressing blocks (22). The pressing blocks (22) are placed on both sides of the cover groove (21) and correspond to the position of the receiving groove (12). After the upper cover (2) is closed on the base (1), the pressing blocks (22) extend into the receiving groove (12) and press against the outer side of the elastic part (63) at the corresponding position.

6. A universal diode test socket according to claim 1, characterized in that: The base (1) has a latch (15) at its front end for locking with the connecting component.

7. A universal diode test socket according to claim 6, characterized in that: The base (1) has an installation groove (14) at its tail end; the connecting component includes a hinge pin (3), a buckle (4) and a buckle pin (5); the top cover (2) has a downward protruding connecting block (23) at its tail end, the connecting block (23) is located in the installation groove (14) and is rotatably connected to the base (1) through the hinge pin (3); the buckle (4) is movably set at the head end of the top cover (2) through the buckle pin (5), and the buckle (4) is slidably adapted to the latch (15) at the head end of the base (1).

8. A universal diode test socket according to claim 1, characterized in that: The connecting component includes several pins on the upper cover (2); the base (1) has several holes that are connected to the corresponding pins.

9. A universal diode test socket according to claim 1, characterized in that: Both the base (1) and the top cover (2) are made of polyphenylene sulfide.

10. A universal diode test socket according to claim 1, characterized in that: The claw-type elastic probe (6) is an integral copper component.

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