Indication device
The display device achieves high resolution and reliability by using varied organic compound layer thicknesses and sacrificial/insulating layers, along with photolithography, to address misalignment issues in manufacturing.
JP7873233B2Active Publication Date: 2026-06-11SEMICON ENERGY LAB CO LTD
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- SEMICON ENERGY LAB CO LTD
- Filing Date
- 2022-06-06
- Publication Date
- 2026-06-11
AI Technical Summary
Technical Problem
Existing display devices face challenges in achieving high resolution and reliability due to misalignment and deformation of fine metal masks during the manufacturing process, leading to variations in film thickness and reduced yield.
Method used
A display device design incorporating specific thickness variations in organic compound layers and the use of sacrificial and insulating layers to maintain uniformity and alignment, combined with photolithography to reduce spacing between layers.
Benefits of technology
This approach enables high-resolution and highly reliable display devices by minimizing layer misalignment and deformation, improving manufacturing yield and device reliability.
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Smart Images
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Abstract
Provided is a high-definition display device. The display device has a first light emission device, a second light emission device positioned next to the first light emission device, a third light emission device positioned next to the second light emission device, a first insulating layer, and a second insulating layer. The first insulating layer has a first region between the first light emission device and the second light emission device, and a second region between the second light emission device and the third light emission device. The second insulating layer has a region positioned on a lower electrode of the third light emission device. The thickness of a third organic compound layer of the third light emission device is different from the thickness of a first organic compound layer of the first light emission device. The thickness of the third organic compound layer of the third light emission device is different from the thickness of a second organic compound layer of the second light emission device. In a cross-sectional view, the first insulating layer is provided so that the height from the lower surface of the lower electrode of the third light emission device is aligned with the height from the lower surface of a lower electrode of the second light emission device.
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