High-temperature reverse bias aging test method and system, terminal, and medium

Abstract

A high-temperature reverse bias aging test method and system, a terminal, and a medium. The high-temperature reverse bias aging test method comprises: acquiring a test instruction (S100); on the basis of the test instruction, acquiring product information of a device under test (S200); on the basis of the product information of said device, acquiring a test duration, a test environment, and a corresponding test voltage (S300); on the basis of the test duration, the test environment, and the corresponding test voltage, testing said device, and acquiring a test result (S400); and if the test result does not meet a high-temperature aging standard condition, outputting warning information (S500). The method can improve the test precision and reliability.

Description

A high-temperature reverse polarization aging test method, system, terminal and medium Technical Field

[0001] This application relates to the field of high-temperature reverse polarization aging test technology, and in particular to a high-temperature reverse polarization aging test method, system, terminal and medium. Background Technology

[0002] High Temperature Reverse Bias (HTRB) test refers to continuously supplying 80% or other specifications of reverse voltage to the power semiconductor device under test under high temperature conditions. Under long-term operation, the reverse leakage current of the test sample is required to remain stable within the specified range.

[0003] Existing high-temperature aging test methods typically include: manually setting aging test conditions, such as temperature and voltage, and manually recording the test results; or using a semi-automatic method, where test parameters are manually input, and the equipment automatically performs the test and partially records the results. Another method involves using computer-aided automation to automatically adjust the test environment according to preset test conditions, enabling automatic data acquisition and analysis.

[0004] However, existing manual or semi-automatic methods suffer from low testing efficiency and are prone to deviations in test results due to human factors. Even with computer-controlled automation, there are still shortcomings such as insufficient intelligence in the testing process and incomplete and inaccurate analysis of test data. In particular, during high-temperature reverse polarization aging tests, it is difficult to achieve real-time monitoring and evaluation of test results, thus affecting test accuracy and reliability. Summary of the Invention

[0005] Firstly, in order to improve the accuracy and reliability of the test, this application provides a high-temperature reverse polarization aging test method.

[0006] This application provides a high-temperature reverse polarization aging test method, which adopts the following technical solution:

[0007] A high-temperature reverse polarity aging test method, comprising:

[0008] Get test instructions;

[0009] Obtain product information of the device under test according to the test instructions;

[0010] The test duration, test environment, and corresponding test voltage are obtained based on the product information of the device under test.

[0011] The device under test is tested based on the test duration, test environment, and corresponding test voltage, and the test results are obtained; and

[0012] If the test results do not meet the high-temperature aging standard conditions, a warning message will be output.

[0013] By establishing clear procedures (obtaining instructions, product information, and setting test parameters), the testing process becomes more standardized, reducing the possibility of operational errors. Furthermore, based on the specific information of the device under test (such as materials and design parameters), the test duration, environment, and voltage are dynamically adjusted to ensure the adaptability of test conditions, thereby improving the accuracy and effectiveness of the test. By monitoring and evaluating the test results in real time and outputting warning messages accordingly, non-compliant test results can be fed back in real time, thus improving the accuracy and reliability of the test.

[0014] Preferably, the step of testing the device under test and obtaining test results based on the test duration, test environment, and corresponding test voltage includes:

[0015] Adjust the ambient temperature and humidity based on the test environment and obtain real-time environmental information;

[0016] If the real-time environmental information fails to synchronize with the set environmental information within a set time, a fault message will be output and the test will be stopped.

[0017] In response to real-time environmental information, the system synchronizes with the set environmental information within a set time, sets the required test duration based on the test duration, and sets the reverse voltage to be input based on the test voltage.

[0018] Based on the set time length and reverse voltage, the device under test is tested in a test environment corresponding to the set environmental information, and the real-time current and real-time resistance information of the device under test are obtained; and

[0019] Test results are generated based on real-time current and resistance information.

[0020] By adjusting the ambient temperature and humidity, the test conditions are made consistent with the actual application environment, thereby improving the reliability and relevance of the test results. When the environmental conditions do not meet the set values, fault information is output in a timely manner and the test is stopped. This can effectively avoid testing under unsuitable conditions, thereby protecting the device under test and reducing the potential risk of damage.

[0021] Preferably, after the step of outputting a warning message if the test result does not meet the high-temperature aging standard conditions, the method further includes:

[0022] Get the retest command;

[0023] Based on the retest command, check the device status of the device under test and generate retest product information;

[0024] In response to the device status meeting the retesting standard, retesting parameters are set based on the retesting product information. The retesting parameters include test duration, test environment, and test voltage.

[0025] The device under test is retested based on the retest parameters, and the retest results are output; and

[0026] If the retest result does not meet the retest conditions, an unqualified message will be output.

[0027] By performing status checks based on retesting commands, the reliability of the initial test results can be confirmed, misjudgments caused by accidental factors can be avoided, and the accuracy of the final results can be ensured. Retesting is only performed when the retesting criteria are met, which can save testing resources and time and improve overall testing efficiency.

[0028] Preferably, the step of responding to the real-time environmental information failing to synchronize with the set environmental information within a set time, outputting fault information and stopping the test includes:

[0029] In response to the real-time environmental information not being synchronized with the set environmental information within a set time, acquire the temperature change curve and humidity change curve;

[0030] Analyze the characteristics of the temperature and humidity change curves; and

[0031] Fault information is determined based on curve features.

[0032] Real-time monitoring and recording of environmental changes helps identify potential sources of problems, such as equipment failure or external influences; obtaining temperature and humidity change curves can help gain a deeper understanding of fluctuations in environmental conditions, providing more information to support fault analysis and improve the accuracy of fault diagnosis.

[0033] Preferably, after the step of starting the test on the device under test based on the test duration, test environment, and corresponding test voltage and obtaining the test results, the method further includes:

[0034] Establish a historical database based on product information and test results;

[0035] The pass rate of the current device under test is calculated based on the historical database;

[0036] The pass rate was compared with the set standard; and

[0037] If the pass rate does not meet the set standard, the test device is deemed unqualified and a quality report is output.

[0038] By adopting the above technical solutions, a historical database can be established to accumulate test data over a long period of time. The pass rate can be calculated based on the historical data, so that the pass rate can reflect the actual production situation, which helps to identify potential problems in a timely manner. By comparing the pass rate with the set standards, non-conforming products can be quickly identified, ensuring the effectiveness of quality control and reducing the risk of non-conforming products entering the market.

[0039] Preferably, the method further includes:

[0040] Obtain historical test data of the same product based on the product information of the device under test;

[0041] The system compares and analyzes historical test data and real-time test results, and generates comparison results;

[0042] Based on the comparison results, feedback information is dynamically generated and displayed on the human-computer interaction interface.

[0043] By adopting the above technical solution, real-time test results can be compared with historical data to identify anomalies, promptly discover potential problems, and improve the accuracy of testing; dynamic feedback information is generated and displayed on the interface, enabling testers to quickly obtain test results and analysis information, and supporting real-time adjustments.

[0044] Preferably, the product information includes product model, product material, rated pressure, operating environment, and operating specifications.

[0045] By adopting the above technical solutions, detailed product information can ensure that test conditions match product characteristics, improve the relevance and effectiveness of testing, and thus obtain more accurate test results. In the event of non-compliance or failure, the problem can be quickly located based on information such as product model and materials, which facilitates fault analysis and improvement.

[0046] Secondly, in order to improve the accuracy and reliability of the test, this application provides a high-temperature reverse polarization aging test system, which adopts the following technical solution:

[0047] A high-temperature reverse polarization aging test system, comprising:

[0048] The instruction acquisition module is used to acquire test instructions;

[0049] The product information reading module is used to obtain product information of the device under test according to the test instructions;

[0050] The test parameter acquisition module is used to acquire the test duration, test environment, and corresponding test voltage based on the product information of the device under test.

[0051] The test module is used to perform tests on the device under test based on the test duration, test environment, and corresponding test voltage, and to obtain the test results; and

[0052] The warning module is used to output warning messages in response to test results that do not meet the high-temperature aging standard conditions.

[0053] Thirdly, this application provides a smart terminal, including a memory and a processor, wherein the memory stores a computer program that can be loaded by the processor and executed as described above for a high-temperature reverse polarization aging test method.

[0054] Fourthly, this application provides a computer-readable storage medium storing a computer program that can be loaded by a processor and executed as described above for a high-temperature reverse polarization aging test method. Attached Figure Description

[0055] Figure 1 is a flowchart of a high-temperature reverse polarization aging test method according to an embodiment of this application, mainly showing steps S100-S500.

[0056] Figure 2 is a flowchart of a high-temperature reverse polarization aging test method according to an embodiment of this application, mainly showing steps S410-S450.

[0057] Figure 3 is a flowchart of a high-temperature reverse polarization aging test method according to an embodiment of this application, mainly showing steps S510-S550. Detailed Implementation

[0058] The present application will be further described in detail below with reference to all the accompanying drawings.

[0059] This application discloses a high-temperature reverse polarization aging test method. Referring to Figure 1, a high-temperature reverse polarization aging test method includes:

[0060] Step S100: Obtain test instructions.

[0061] Specifically, the host computer connects to the device under test (DUT) and receives instructions from the tester. The tester can trigger test instructions through the host computer's human-machine interface. The host computer can be an eBOX560-522-FL industrial computer, supporting high-speed data acquisition and real-time monitoring, providing powerful data logging and report generation functions, and supporting interface interfaces with various sensors and test equipment. The test equipment can be a T / 60 / V2 high-temperature test chamber and an aging board placed inside the high-temperature test chamber. The aging board has multiple contact points or slots for connecting DUTs of different package types. These contact points typically include pads, pins, terminals, or quick connectors to establish an electrical connection with the DUT. Instructions can be acquired through mechanical button triggering or virtual button triggering. For mechanical button triggering, the command can be acquired automatically after powering on by pressing the power button, or by pressing the corresponding trigger button again after powering on. For virtual button triggering, the command can be acquired by pressing the relevant virtual trigger button in the corresponding software interface.

[0062] Step S200: Obtain product information of the device under test according to the test instructions.

[0063] Specifically, based on the obtained test instructions, the host computer reads the product information stored in the database, including: product model, product material, rated withstand voltage, operating environment (such as temperature and humidity), and usage specifications (such as power and size). The data in the database can be obtained from the network or uploaded by the test personnel. The engineer inputs the basic information of the device under test, such as product model, product material, rated withstand voltage, operating environment (such as temperature and humidity), and usage specifications (such as power and size), through the operation interface.

[0064] Step S300: Obtain the test duration, test environment, and corresponding test voltage based on the product information of the device under test.

[0065] Specifically, define the testing standards for each product, including: test duration (e.g., several hours to several days), test environment (e.g., high temperature, humidity control), and test voltage (the voltage set according to the rated withstand voltage).

[0066] Step S400: Start testing the device under test based on the test duration, test environment, and corresponding test voltage, and obtain the test results.

[0067] Referring to Figure 2, the specific steps of the test include:

[0068] Step S410: Adjust the ambient temperature and humidity based on the test environment and obtain real-time environmental information;

[0069] Step S420: If the real-time environmental information is not synchronized with the set environmental information within the set time, output fault information and stop the test;

[0070] Step S430: If the real-time environmental information is synchronized with the set environmental information within the set time, set the required test time based on the test duration and set the input reverse voltage based on the test voltage;

[0071] Step S440: Based on the set time length and reverse voltage, test the device under test in a test environment corresponding to the set environmental information and obtain the real-time current information and real-time resistance information of the device under test.

[0072] Step S450: Generate test results based on real-time current and real-time resistance information.

[0073] Specifically, the host computer automatically matches and obtains the aforementioned test standards based on product information, automatically inputs the target ambient temperature and humidity values, and gradually adjusts the test environment by controlling the test equipment to ensure that the host computer can monitor real-time temperature and humidity information. During this process, temperature and humidity sensors can be installed in the test environment to collect data in real time. The data acquisition module (such as Arduino, Raspberry Pi, etc.) periodically reads the sensor data and sends it to the main control system. The designer sets a time window according to the specifications of the environmental test chamber, and continuously compares the real-time temperature and humidity information with the target value within the set time. If the target value is not reached within the set time, a fault message is output and a stop test command is triggered. If the real-time environmental information meets the requirements, the system sets the test parameters according to the preset test duration and voltage value, and uses the control interface of the test equipment to set the reverse voltage to start the test. The equipment applies the reverse voltage within the set test duration, and collects current and resistance data in real time during the test. Real-time data can be read using a data acquisition card or testing instrument. The acquired real-time current and resistance information can be stored in a database or file. The changes in current and resistance can be analyzed according to a preset calculation formula (such as Ohm's law). Finally, a test report is generated, which includes: test duration, test environment information (temperature, humidity), test voltage, real-time current and resistance information, and the result obtained by comparison with the standard (pass / fail). The acquired current information can include real-time current and maximum current, and the acquired resistance information can include real-time resistance and maximum resistance.

[0074] Step S500: If the test results do not meet the high-temperature aging standard conditions, output a warning message.

[0075] Specifically, the test results are compared with predefined high-temperature aging standards, and thresholds are set (such as maximum allowable current, temperature, etc.). If the test results do not meet the standards, a warning message is automatically generated and the operator is notified. This can be displayed through an interface, specifically a warning character with a red border on the human-machine interface page.

[0076] For example, during testing, the device under test (DUT) is a semiconductor diode. The tester inputs the product model and test commands. The industrial control computer automatically retrieves the DUT's product information based on the input commands and determines the test duration, test environment, and corresponding test voltage (Diode SF58G: Test duration: 1 hour, Test environment: Ambient temperature: 150℃, Ambient humidity: 50%, Reverse voltage: 420V). By controlling the temperature inside the high-temperature chamber, the DUT is gradually heated to 150℃, and the humidity is adjusted to 50%. During this process, the system continuously monitors real-time environmental information. If there is a deviation between the ambient temperature and humidity sensors, and the system fails to adjust to the set environment within the set time range (e.g., within 3 minutes), the system will output a fault message and stop the test. The fault message may include: Fault type: Environment not up to standard or unstable; Fault time: The specific time the fault occurred; Fault description: Ambient temperature and humidity did not meet the set conditions. After ensuring stable temperature and humidity, the test system begins to apply a 420V reverse voltage to the DUT to simulate an electrical load under long-term high temperature. During testing, the system monitors key parameters of the device in real time, such as reverse current magnitude, forward and reverse resistance of diodes, temperature changes, and performance changes. It collects and records this data and determines whether it meets the high-temperature aging standard conditions. These standard conditions can be pre-input by the designer. The system compares the real-time monitored test data with preset high-temperature aging standard thresholds to determine if the device under test meets the high-temperature aging standard conditions. For example, under normal operating conditions, the reverse current should remain within a certain range (e.g., less than 1μA); the resistance should remain stable without significant drift. If the real-time monitored reverse current exceeds 1μA, it is considered that the device's insulation performance has deteriorated or there is a defect. The forward / reverse resistance values ​​exceed the allowable fluctuation range of the initial nominal value (e.g., ±5%), which may indicate material deterioration or poor contact. Therefore, during testing, if the system detects that the reverse current exceeds the set safety range at a certain point in time, or that the resistance changes abnormally, the system will output a warning message, including: Warning type: High-temperature aging test result unqualified; Abnormal description: Exceeding current range / excessive resistance drift; Suggested action: Stop the test and check the device. If it meets the high-temperature aging standard conditions, it can be tested multiple times to avoid errors.

[0077] Referring to Figure 3, if the test results do not meet the high-temperature aging standard conditions, a retest is required. The specific steps include:

[0078] Step S510: Obtain the retest instruction;

[0079] Step S520: Check the device status based on the retest command and generate retest product information;

[0080] Step S530: If the device status meets the retesting standard, set the retesting parameters based on the retesting product information. The retesting parameters include test duration, test environment and test voltage.

[0081] Step S540: Retest the device under test based on the retest parameters and output the retest results;

[0082] Step S550: If the retest result does not meet the retest conditions, output the non-compliance information.

[0083] Specifically, the operator inputs a retest instruction via buttons or commands. After receiving the instruction, the system queries the status of the device to be retested based on previous test records, including: test results (pass / fail), environmental conditions (temperature, humidity, etc.), and voltage information. This status information is integrated into retest product information, including: product ID, last test result, current environmental information, and parameters required for retesting. Retesting standards are defined according to product standards, such as current and voltage ranges; environmental condition limitations, which can be derived from multiple experiments. The current device status is compared with the retesting standards to confirm compliance. If the device status meets the standards, retesting parameters are extracted and set from the retest product information, including: test duration: set based on previous testing experience or product specifications; test environment: readjusted or kept consistent as needed, including temperature and humidity settings (standards can be lowered when the product ages to a certain extent); test voltage: reverse voltage set according to previous tests or product specifications. The device to be retested is connected to the testing equipment, and the retesting program is started. The system applies a retest voltage within the set test duration, monitors the current and resistance in real time, and records the real-time current and resistance information to the database. It analyzes the collected data and generates retest results, including: retest current and resistance information; and the criteria for pass / fail judgment. The retest results are displayed through the user interface, including: retest current and resistance values, and the judgment result (pass / fail). If the retest results do not meet the retest conditions, the system will automatically output a failure message, which can be communicated to the operator via interface pop-ups, email notifications, etc., and the device with that ID will be marked as unqualified in the database for easy differentiation later.

[0084] In addition, if the real-time environmental information fails to synchronize with the set environmental information within the set time, a fault analysis needs to be performed. The specific steps include:

[0085] Step SA1: If the real-time environmental information is not synchronized with the set environmental information within the set time, obtain the temperature change curve and humidity change curve;

[0086] Step SA2: Analyze the curve characteristics based on the temperature change curve and humidity change curve;

[0087] Step SA3: Determine fault information based on curve features.

[0088] Specifically, environmental data is monitored within a set time period. If the temperature or humidity does not reach the set value, a fault handling process is triggered. When environmental conditions are not met, temperature and humidity data within that time window are collected. This data is then compiled into a time series for curve plotting. Data visualization tools (such as Matplotlib or Excel) are used to plot the collected temperature and humidity data as curves, analyzing curve characteristics, including: peaks and troughs (maximum and minimum values), rising and falling trends, and periods of sustained deviation from the set value, to determine if any anomalies exist, such as: temperature or humidity consistently exceeding or falling below the set range; sudden fluctuations or drastic changes. Machine learning algorithms (such as classification algorithms) can also be used to help determine the cause of the fault. Based on the extracted features, fault information is generated, including the location of the damaged temperature and humidity control equipment and maintenance recommendations.

[0089] It can also establish a historical database to calculate the product pass rate. The specific steps include:

[0090] Step SB1: Establish a historical database based on product information and test results;

[0091] Step SB2: Calculate the pass rate of the current device under test based on the historical database;

[0092] Step SB3: Compare the pass rate with the set standard;

[0093] Step SB4: If the pass rate does not meet the set standard, the test device is deemed unqualified and a quality report is output.

[0094] Specifically, under the set test duration and environment, the device under test is tested using the corresponding test voltage. Test results for each device are collected, including pass / fail status. A historical database is designed, containing the following fields: product information (e.g., model, version), test result (pass / fail), test duration, test environment (e.g., temperature, humidity), and test voltage. The results and related information of each test are recorded in the database. Relational databases (e.g., MySQL, PostgreSQL) or non-relational databases (e.g., MongoDB) can be used. A query script is written to extract all test records for the current device under test from the historical database. Based on the extracted data, the number of pass and fail tests is counted. A pass rate standard is set, pre-input by the designer. Exceeding this pass rate will affect the product yield. The calculated pass rate is compared with the set standard. If the pass rate is lower than the set standard, the tested device is deemed unqualified. If the pass rate is equal to or higher than the standard, it is deemed qualified. If deemed unqualified, a quality report is generated, which should include: product information, test results, pass rate, comparison standard, and judgment result (pass / fail). Finally, archive the quality report for each test for future reference and analysis.

[0095] It also includes a real-time feedback step, specifically including:

[0096] Step SC1: Obtain historical test data of the same product based on the product information of the device under test;

[0097] Step SC2: Compare and analyze historical test data and real-time test results, and generate comparison results;

[0098] Step SC3: Based on the comparison results, dynamically generate feedback information and display the feedback information on the human-computer interaction interface.

[0099] Specifically, when testing a batch of products, the system queries historical databases for test records of the same product using the product information of the device under test (such as model and version). SQL queries or similar database access tools can be used to extract relevant historical test data. Real-time test results are obtained and formatted with the same structure as historical data for easy comparison. Appropriate comparison metrics are selected, such as pass rate, test result distribution (number of pass / fail), and performance metrics (such as voltage and power consumption). Based on the comparative analysis results, a detailed comparison report is generated, including: real-time test results of the device under test, historical test results of the same product, and difference analysis (such as changes in pass rate and performance fluctuations). Feedback information is generated based on the comparison results, which may include: whether the performance of the tested device conforms to historical trends, suggested areas for improvement (such as adjusting test parameters), and expectations for future testing (such as estimated pass rate). This information is then displayed on the human-computer interaction page using tables and charts.

[0100] This application discloses a high-temperature reverse polarization aging test system, comprising:

[0101] The instruction acquisition module is used to acquire test instructions;

[0102] The product information reading module is used to obtain product information of the device under test according to the test instructions;

[0103] The test parameter acquisition module is used to acquire the test duration, test environment, and corresponding test voltage based on the product information of the device under test.

[0104] The test module is used to test the device under test based on the test duration, test environment, and corresponding test voltage and obtain the test results.

[0105] The warning module is used to output a warning message if the test results do not meet the high-temperature aging standard conditions.

[0106] This application provides a smart terminal, including a memory and a processor, wherein the memory stores a computer program that can be loaded by the processor and executed as described above for a high-temperature reverse polarization aging test method.

[0107] This application provides a computer-readable storage medium storing a computer program that can be loaded by a processor and executed as described above for a high-temperature reverse polarization aging test method.

[0108] The implementation principle of the high-temperature reverse polarization aging test method, system, terminal, and medium in this application embodiment is as follows: through clear steps (acquiring instructions, product information, test parameter settings, etc.), the test process is made more standardized, reducing the possibility of operational errors. Furthermore, based on the specific information of the device under test (such as materials and design parameters), the test duration, environment, and voltage are dynamically adjusted to ensure the adaptability of test conditions, improve the accuracy and effectiveness of the test, monitor and evaluate the test results in real time, and provide real-time feedback on test results that do not meet the standards by outputting warning information, thereby improving the accuracy and reliability of the test.

[0109] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A high temperature reverse bias burn-in test method, characterized by, include: Get test instructions; Obtain product information of the device under test according to the test instructions; The test duration, test environment, and corresponding test voltage are obtained based on the product information of the device under test. The device under test is tested based on the test duration, the test environment, and the corresponding test voltage, and the test results are obtained, including: Based on the test environment, adjust the ambient temperature and humidity and obtain real-time environmental information; If the real-time environmental information fails to synchronize with the set environmental information within a set time, a fault message is output and the test is stopped. In response to the real-time environmental information being synchronized with the set environmental information within the set time, the required test duration is set based on the test duration and the reverse voltage to be input is set based on the test voltage; Based on the set time duration and the reverse voltage, the device under test is tested in a test environment corresponding to the set environmental information, and the real-time current and real-time resistance information of the device under test are obtained; and The test results are generated based on the real-time current information and the real-time resistance information; and if the test results do not meet the high-temperature aging standard conditions, a warning message is output.

2. The high temperature reverse bias burn-in test method of claim 1, wherein, After the step of outputting a warning message if the test results do not meet the high-temperature aging standard conditions, the method further includes: Get the retest command; Based on the retest command, check the device status of the device under test and generate retest product information; In response to the device status meeting the retesting standard, retesting parameters are set based on the retesting product information, including the test duration, the test environment, and the test voltage; Based on the retest parameters, the device under test is retested and the retest results are output; and If the retest result does not meet the retest conditions, an unqualified message is output.

3. The high temperature reverse bias burn-in test method of claim 1, wherein, The step of responding to the real-time environmental information failing to synchronize with the set test environment within the set time, outputting the fault information and stopping the test, includes: In response to the real-time environmental information not being synchronized with the set test environment within the set time, temperature change curves and humidity change curves are acquired. The characteristics of the curves are analyzed based on the temperature change curve and the humidity change curve; and The fault information is determined based on the curve characteristics.

4. The high temperature reverse bias burn-in test method of claim 1, wherein: After the steps of testing the device under test based on the test duration, the test environment, and the corresponding test voltage and obtaining the test results, the method further includes: A historical database will be established based on the product information and the test results. The pass rate of the device under test is calculated based on the historical database. Compare the pass rate with the set standard; and In response to the fact that the pass rate does not meet the set standard, the device under test is determined to be unqualified and the quality report is output.

5. The high temperature reverse bias burn-in test method of claim 1, wherein, The method further includes: Based on the product information of the device under test, obtain historical test data of the same product. The historical test data and real-time test results are compared and analyzed to generate comparison results; and Based on the comparison results, feedback information is dynamically generated and displayed on the human-computer interaction interface.

6. The high temperature reverse bias burn-in test method of claim 1, wherein, The product information includes product model, product material, rated pressure, operating environment, and usage specifications.

7. A high temperature reverse bias burn-in test system, characterized by, include: The instruction acquisition module is used to acquire test instructions; The product information reading module is used to obtain product information of the device under test according to the test instructions; The test parameter acquisition module is used to acquire the test duration, test environment, and corresponding test voltage based on the product information of the device under test. The testing module is used to test the device under test based on the test duration, the test environment, and the corresponding test voltage, and to obtain the test results. as well as The warning module is used to output a warning message in response to the test results not meeting the high-temperature aging standard conditions.

8. A smart terminal, characterized by It includes a memory and a processor, wherein the memory stores a computer program that can be loaded by the processor and executed as described in any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that, It stores a computer program capable of being loaded by a processor and executing the high-temperature reverse polarization aging test method as described in any one of claims 1 to 6.

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