Method and device for rapidly filtering surface dust in panel detection

A panel inspection and fast filtering technology, applied in the field of image defects, can solve the problems of large differences in dust levels and more consumption, and achieve the effect of optimizing threshold setting, saving man-hours, and enhancing the adaptability of the inspection environment.

CN108109136AInactive Publication Date: 2018-06-01WUHAN JINGCE ELECTRONICS GRP CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Publication Date
2018-06-01
Estimated Expiration
Not applicable · inactive patent

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Abstract

The invention discloses a method and a device for rapidly filtering surface dust in panel detection. The method includes the steps of acquiring a first detection picture with the dust on the upper surface of a panel as bright spots or bright specks; judging the covering amount of dust on the upper surface of the panel, filtering the dust directly if the dust coverage amount is small, filtering thedust of large particles if the dust coverage amount is large, and carrying out dust rejudgment under the first detection picture by using the defect that is detected in a second detection picture with the dust as dark spots or dark specks. According to the method, the current optical automatic detection algorithm does not need to be fundamentally modified, and only the pre-judging function and the defect re-judgment mechanism of the dust amount coverage degree need to be increased. Meanwhile, the method is simple, effective and more reasonable and optimized, and the accuracy of the detectionresult cannot be influenced. The detection time can be reduced, and the method has the advantages of being easy to realize, saving time and high in practicability.
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Description

technical field

[0001] The invention relates to the field of image defects, in particular to a method and device for quickly filtering surface dust in panel inspection. Background technique

[0002] In the detection of LCD panel defects using AOI, dust filtration on the surface of the panel is a very important part of the detection method, which directly affects the accuracy of defect detection results. During the production process of LCD panels, the surface will inevitably be covered with dust, but the degree of dust coverage on the surface varies greatly. figure 1 For two different dust coverage levels. For the case where the surface of the LCD panel is covered with a small amount of dust, all the dust can be detected and filtered out quickly by the AOI detection method; while for the case where the surface of the LCD panel is covered with a large amount of dust, it takes more TT to detect all the dust. However, in order to ensure the normal operation of the production ...

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Embodiment Construction

[0039] Below in conjunction with accompanying drawing and specific embodiment the present invention will be described in further detail:

[0040] The terms used in the present invention are as follows:

[0041]

[0042] In the prior art, since the dust on the surface of the LCD panel includes the dust on the upper surface and the dust on the lower surface, two images are usually taken separately, the Particle picture and the ParticleDown picture. figure 2 shown. First, in the ParticleDown screen, take the image of the dust on the lower surface. Since the position of the poor light transmission is generally the position of the lower surface, dark spots are detected in the filtered dust image of the lower surface. The dark spots or dark spots are the dust behind. Side dust is filtered using existing technologies, specifically, it can be filtered using a filtering technology based on defect historical track information. This technology refers to the Chinese patent "A Method ...