Test system for motion control devices

Abstract

The present invention provides a test system for a motion control device, comprising: an EMC test instrument, a functional test device, a host computer and a test instrument platform; the functional test device is connected to an interactive interface of the motion control device to be tested; the functional test device is used to: monitor an interactive signal of the interactive interface; the test instrument platform comprises at least two test instruments, and different test instruments are connected to different circuit modules of the motion control device to be tested to collect operation information of the corresponding circuit modules; the host computer is used to: determine whether an abnormality occurs in the function of the motion control device to be tested corresponding to the interactive signal according to the interactive signal or its state information, and obtain a functional test result for the motion control device to be tested; determine whether an abnormality occurs in the corresponding circuit module according to the received operation information, and obtain a circuit test result for the motion control device to be tested.

Description

Technical Field

[0001] The present invention relates to the field of motion control devices, and in particular to a test system for motion control devices. Background Art

[0002] The motion control device can be understood as a device that can directly or indirectly control the movement of a moving object (such as a cutting head). For example, it can be a motion control board. Taking the cutting head as an example, the motion control device can achieve motion control of the cutting head by controlling the motor of the cutting head or its driver.

[0003] In the existing related technologies, before the motion control device is put into use, the function of the motion control device needs to be tested. In the existing related technologies, manual testing is usually used to achieve this. However, manual testing will lead to problems such as long testing time and low testing efficiency. Summary of the invention

[0004] The present invention provides a test system for a motion control device to solve the problems of long test time and low test efficiency.

[0005] According to a first aspect of the present invention, there is provided a test system for a motion control device, comprising: an EMC test instrument, a functional test device, a host computer and a test instrument platform;

[0006] The EMC test instrument is used to form an EMC test environment to generate electromagnetic interference to the motion control device to be tested in the EMC test environment;

[0007] The functional testing device is connected to the interactive interface of the motion control device to be tested and the host computer; the functional testing device is used to:

[0008] Monitoring an interactive signal of the interactive interface, wherein the interactive signal matches a function performed by the motion control device under the electromagnetic interference;

[0009] Sending the interactive signal or its status information to the host computer;

[0010] The test instrument platform includes at least two test instruments, and different test instruments are connected to different circuit modules of the motion control device to be tested to collect operation information of the corresponding circuit modules; the at least two test instruments are connected to the host computer to send the collected operation information to the host computer;

[0011] The host computer is used for:

[0012] Determine whether the function of the motion control device to be tested corresponding to the interactive signal is abnormal according to the interactive signal and / or its status information, obtain a functional test result for the motion control device to be tested, and send the functional test result to the host computer;

[0013] According to the received operation information, it is determined whether a corresponding circuit module is abnormal, and a circuit test result for the motion control device to be tested is obtained.

[0014] Optionally, the circuit module of the motion control device to be tested includes a processor, and a reset module connected to the periphery of the processor and used for providing a reset timing control signal to the processor when the processor is powered on;

[0015] The at least two test instruments include:

[0016] The reset module testing instrument is used to collect the waveform of the reset timing control signal provided by the reset module when the processor is powered on, and use the collected waveform as the operation information of the reset module.

[0017] Optionally, the circuit module of the motion control device to be tested includes a processor, a burning module connected to the periphery of the processor for burning a program into the processor, and a configuration module connected to the periphery of the processor for configuring the processor;

[0018] The at least two test instruments include:

[0019] A burning module testing instrument, used for collecting the waveform of the burning signal sent by the burning module when burning a program for the processor, and using the collected waveform as the operation information of the burning module;

[0020] The configuration module testing instrument is used to collect the waveform of the configuration signal sent by the configuration module when configuring the processor, and use the collected waveform as the operation information of the configuration module.

[0021] Optionally, the motion control device to be tested includes a processor, and a crystal oscillator module connected to the periphery of the processor and used for providing a clock signal to the processor;

[0022] The at least two test instruments include:

[0023] The crystal oscillator module testing instrument is used to collect frequency information of the crystal oscillator module and use the collected frequency information as operation information of the crystal oscillator module.

[0024] Optionally, the motion control device to be tested includes a power module, and a voltage conversion module for converting the power supply of the power module into a required voltage;

[0025] The at least two test instruments include at least one of the following:

[0026] A power module testing instrument, used for collecting output parameters of the power module in the motion control device to be tested as operation information of the power module; the output parameters of the power module include at least one of the output voltage, output current and output power of the power module;

[0027] A first test instrument for a voltage conversion module, used for collecting input side parameters and / or output side parameters of the voltage conversion module in the motion control device to be tested as operation information of the voltage conversion module, wherein the input side parameters include at least one of an input voltage, an input current and an input power at the input side of the voltage conversion module; and the output side parameters include at least one of an output voltage, an output current and an output power at the output side of the voltage conversion module;

[0028] The second test instrument of the voltage conversion module is used to collect the waveform of the output control signal of the output switch of the voltage conversion module, and use the collected waveform as the operation information of the voltage conversion module.

[0029] Optionally, the motion control device to be tested includes a communication module;

[0030] The at least two test instruments include:

[0031] The communication module testing instrument is used to collect the eye diagram of the input and output signals of the communication module in the motion control device to be tested, and use the collected eye diagram as the operation information of the communication module.

[0032] Optionally, the host computer is also used for:

[0033] If, according to the functional test results, it is determined that the number of abnormal functions exceeds a preset number threshold, and according to the circuit test results, it is determined that any target circuit module among the pre-specified N circuit modules is abnormal, then:

[0034] It is determined that the abnormality occurring in the target circuit module is caused by the abnormality of the target circuit module.

[0035] Optionally, the functional testing device is further used to input control information to at least one interactive interface or other communication interface of the motion control device to be tested, so that the motion control device to be tested performs the function indicated by the control information under the electromagnetic interference.

[0036] Optionally, if the operation information includes a waveform of a signal, the corresponding test instrument includes an oscilloscope;

[0037] If the operation information includes current, the corresponding test instrument includes a multimeter and / or a current detection instrument;

[0038] If the operation information includes voltage, the corresponding test instrument includes a multimeter and / or a voltage detection instrument;

[0039] If the operation information includes an eye diagram of a signal, the corresponding test instrument includes a vector network analyzer and / or an oscilloscope;

[0040] If the operation information includes frequency information, the corresponding test instrument includes a spectrum analyzer.

[0041] Optionally, the motion control device to be tested is a motion control device used to control the movement of a cutting head through an actuator of laser cutting.

[0042] In the test system of the motion control device provided by the present invention, when the motion control device to be tested is in an EMC test environment, the functional test equipment can be used to interact with the motion control device to monitor whether its function execution is abnormal, so that the functional test result can be obtained on the host computer. The circuit test result can also be obtained on the host computer based on the monitoring of different circuit modules by the test instrument platform. It can be seen that the present invention can automatically realize the test under electromagnetic interference, avoid manual testing, and thus effectively save test time and improve test efficiency.

[0043] In addition, the objects monitored and tested by the test system of the present invention include, in addition to the functions of the motion control device, the operating information of different circuit modules. Therefore, the circuit module where the abnormality occurs in the motion control device can be accurately located, and it can be determined whether the local circuit of the motion control device has an abnormality, thereby accurately locating the circuit position where the abnormality occurs. At the same time, by summarizing the circuit test results and the functional test results, it can be helpful to identify the deep-seated cause of the abnormality. It can be seen that the present invention can help to accurately guide the improvement of the motion control device.

[0044] In the optional scheme of the present invention, based on the experience gained in practice, the optional scheme also creatively selects the operation information of various circuit modules (such as crystal oscillator module, configuration module, burning module and reset module, etc.), power supply module, voltage conversion module, etc. around the processor as the objects of monitoring and testing. These circuit modules are related to the realization of part or most of the functions, and they are also circuit modules that are more likely to have abnormalities as proven by practice. Compared with the scheme of only monitoring the interactive signal, this scheme can accurately and precisely locate the abnormal position, which is conducive to accurately and precisely guiding the improvement of the motion control device. At the same time, it can also provide a more precise basis for analyzing the internal causes of functional abnormalities based on the circuit modules that have an influence on the realization of each function. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0046] Figure 1 The structure of the test system of the motion control device in one embodiment of the present invention is schematically shown. Figure 1 ;

[0047] Figure 2 The structure diagram of the test instrument platform and the motion control device to be tested in one embodiment of the present invention is as follows Figure 1 ;

[0048] Figure 3 The structure diagram of the test instrument platform and the motion control device to be tested in one embodiment of the present invention is as follows Figure 2 ;

[0049] Figure 4 It is a schematic diagram of the structure of a host computer, a test instrument platform and a motion control device to be tested in one embodiment of the present invention;

[0050] Figure 5 It is a schematic diagram of the structure of a functional testing device in one embodiment of the present invention.

[0051] Description of reference numerals:

[0052] 1- Functional test equipment;

[0053] 101-MCU;

[0054] 102-ESC controller;

[0055] 103-RJ45 module;

[0056] 104-INPUT module;

[0057] 105-OUTPUT module;

[0058] 106-AD module;

[0059] 107-PWM module;

[0060] 108-DA module;

[0061] 109-485&CAN module;

[0062] 110- encoder module;

[0063] 111-axis port module;

[0064] 112- alarm module;

[0065] 2-Test instrument platform;

[0066] 21- Reset module test instrument;

[0067] 22- Burning module test instrument;

[0068] 23-Configure module test instrument;

[0069] 24-Crystal oscillator module test instrument;

[0070] 25-Power module test instrument;

[0071] 26-voltage conversion module second test instrument;

[0072] 27- voltage conversion module first test instrument;

[0073] 28- Communication module test instrument;

[0074] 3-EMC test equipment;

[0075] 31-EMC test environment;

[0076] 4- Motion control device to be tested;

[0077] 401-Processor;

[0078] 402- Reset module;

[0079] 403-burning module;

[0080] 404-Configuration module;

[0081] 405-crystal oscillator module;

[0082] 406-power module;

[0083] 407-voltage conversion module;

[0084] 408-Communication module.

[0085] 5- Host computer. DETAILED DESCRIPTION

[0086] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0087] The terms "first", "second", "third", "fourth", etc. (if any) in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0088] The technical solution of the present invention is described in detail with specific embodiments below. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described in detail in some embodiments.

[0089] Figure 1 The structure of the test system of the motion control device in one embodiment of the present invention is schematically shown. Figure 1 .

[0090] The motion control device involved in this embodiment can be understood as any device that can control the motion process of a moving object, such as a motion control board, a PLC device or other threshold-like structures, etc. It can be assembled on any electronic device to form a motion control device, and can also be used independently of other devices. The motion control board can, for example, include a board carrier and a circuit provided on the board carrier, wherein the number of board carriers can be one or more, all without departing from the description of this embodiment.

[0091] In addition, the motion control device to be tested can also be described as the electronic product under test (EUT) during the test process.

[0092] Motion control devices are mostly used in the field of industrial control. For example, they can be applied to equipment with at least one of high power or high-frequency changes in working status, such as high-power servos, solenoid valves, and water coolers. The electromagnetic interference environment they face is harsh. To ensure the normal operation of the product, it must meet the relevant electromagnetic compatibility requirements. Therefore, EMC testing is required. Product EMC problems are hidden, complex, and diverse. In traditional EMC testing solutions and corresponding national standards, passing the EMC test is only vaguely defined as normal function or performance. On the one hand, some electronic products have more complex functions, and it is easy to make misjudgments based on appearance or later testing. At the same time, the test phenomena and data cannot be retained. On the other hand, if the EMC test fails, it is difficult to locate the problem.

[0093] This embodiment can be regarded as a system for EMC testing.

[0094] In one example, the motion control device may be a motion control device for controlling the motion of a cutting head through an actuator for laser cutting. The actuator may, for example, include a motor, which may be directly or indirectly controlled by the motion control device; at the same time, an encoder may be provided in the motor or its driver, which may be connected to the motion control device to feed back an encoder signal. In other examples, the motion control card may also be a motion control card for other scenarios.

[0095] Please refer to Figure 1 In this embodiment, the test system of the motion control device includes: an EMC test instrument 3, a functional test device 1, a host computer 5 and a test instrument platform 2.

[0096] The EMC test instrument may be understood as an instrument used to form an EMC test environment. Furthermore, for the motion control device to be tested in the EMC test environment, electromagnetic interference for testing may be generated as required.

[0097] The EMC here specifically refers to Electromagnetic Compatibility, which can be understood as electromagnetic compatibility, which represents the comprehensive evaluation of the electromagnetic field interference size (EMI) and anti-interference ability (EMS) of the motion control device to be tested. Correspondingly, the test system involved in this embodiment can also be understood as an EMC test system, that is, an electromagnetic compatibility test system.

[0098] The test environment may be a test environment required by the national standard GB / T17626 for EMC testing, including test instruments and a corresponding test environment that comply with the national standard.

[0099] The functional test device 1 is connected to the interactive interface of the motion control device 4 to be tested. The interactive interface may include at least one of the following: an interface that can input signals, an interface that can output signals, and an interface that can both input and output signals. Correspondingly, the signal transmitted through the interactive interface may be any one of the following: a signal output from the motion control device, a signal input to the motion control device.

[0100] It can be seen that the interactive signal can be understood as a signal transmitted through the interactive interface that matches the function performed by the motion control device under the electromagnetic interference. Further, it can specifically refer to any signal that can be used to determine whether the function is abnormal.

[0101] In addition, in one embodiment, the functional test device 1 and the motion control device can also transmit control signals using an interactive interface or other communication interface, and further, the functional test device 1 is also used to input control information to at least one interactive interface or other communication interface of the motion control device 4 to be tested, so that the motion control device 4 to be tested performs the function indicated by the control information under the electromagnetic interference. The above process can be implemented by the functional test device 1 under the control or triggering of the host computer 5.

[0102] In one example, the control information sent by the functional test device 1 may be, for example, an encoder signal for testing, a motion control instruction for testing, etc.;

[0103] The encoder signal can be regarded as the encoder signal fed back by the encoder in the motor controlled by the motion control device. If it is a differential signal, it can be further converted into a single-ended signal and then sent to the motion control device. In a specific example, it can be generated by the functional test device 1 autonomously, or it can be fed back by a real motor, or it can be generated and fed back by a host computer;

[0104] The motion control instructions may be understood as instructions for instructing the motion control device to implement corresponding motion control.

[0105] In response to the encoder signal and / or the motion control instruction, the motion control device may feed back a corresponding motion control signal, which is an interactive signal of at least part of the interactive interface at this time.

[0106] Specifically, the number of motors controlled by the motion control device is diverse, the encoder signal corresponding to each motor can be multi-channel, and the feedback motion control signal can also be multi-channel. Therefore, the executed function can be understood as the function of outputting one or more matching motion control signals. When the function itself is completely normal, the motion control signal should match the corresponding encoder signal and motion control instruction.

[0107] In other examples, the control information issued by the functional testing device 1 may further include other information. For example, if it is applied to the field of laser cutting, the control information may also include height information representing the height of the cutting head, light output instructions, etc. Depending on the functions configured by the motion control device, the control information issued by the functional testing device 1 can change accordingly.

[0108] The communication interface may be, for example, any one of an Ethernet interface, an Ethercat interface, a PCI interface, a PCIE interface, a 485 interface, a CAN interface, etc. of the motion control device.

[0109] It can be seen that in this embodiment, the execution of the function is triggered by the functional test device 1. In other embodiments, the execution of the function in the motion control device 4 to be tested may also be triggered by a host computer, a control device or other device, or may be automatically triggered by the motion control device 4 to be tested based on its peripheral circuits. It can be seen that the control information may not be sent by the functional test device to the motion control device.

[0110] In this embodiment, the functional testing device 1 is used for:

[0111] Monitoring an interactive signal of the interactive interface, wherein the interactive signal is generated or requested by the motion control device to be tested when performing a corresponding function under the electromagnetic interference;

[0112] The interactive signal and / or its status information is sent to the host computer.

[0113] The above process may be implemented by the functional testing device 1 under the control or triggering of the host computer.

[0114] Correspondingly, the host computer 5 is used for:

[0115] According to the interactive signal or its status information, determine whether the function of the motion control device to be tested corresponding to the interactive signal is abnormal, obtain a functional test result for the motion control device to be tested, and send the functional test result to the host computer.

[0116] The state information may refer to any information describing the interactive signals of part or all of the interactive interfaces. The functional abnormality may be understood as any situation pre-defined as an abnormality, or a situation different from a pre-defined normal situation. In the specific implementation process, it may be compared with the interactive signal of the same function when the motion control device to be tested is not in the EMC test environment, or it may be compared with the pre-defined standard interactive signal of the same function to determine whether an abnormality has occurred. The motion control instructions given by it, the motion control signal generated by the motion control device, and the encoder information obtained by the functional test equipment may also be compared to determine whether the three match, and the judgment results of the three when not in the EMC test environment may be combined to determine whether an abnormality has occurred. Any existing or improved method of judging abnormalities may be applied to this solution.

[0117] The functional test results may be understood as information used to characterize whether an abnormality occurs in each function being tested, and may further include the interaction signal itself or other information obtained therefrom, and may also include information that further describes the abnormality that occurs.

[0118] Through the above scheme, the functional test equipment can interact with the motion control device to monitor whether its function execution is abnormal, so as to obtain the functional test results on the host computer. Furthermore, for the functional test, the scheme can automatically realize the test under electromagnetic interference, avoid manual testing, and effectively save test time and improve test efficiency.

[0119] In this embodiment, the test instrument platform 2 includes at least two test instruments, and different test instruments are connected to different circuit modules of the motion control device 4 to be tested to collect operating information of the corresponding circuit modules; the at least two test instruments are connected to the host computer to send the collected operating information to the host computer.

[0120] Among them, the process of collecting and sending can be implemented under the control or triggering of the host computer 5. Further, the host computer 5 can preferentially trigger some of the test instruments to perform tests, for example, it can mainly test at least one of the power module, voltage conversion module, reset module, burning module, configuration module, crystal oscillator module, and communication module, and then, according to the needs or according to the functional test results, select the remaining circuit modules for testing. It can be conducive to making full use of instrument resources. If the function is not abnormal and the circuit module tested preferentially is not abnormal, it can also be selected not to test other circuit modules.

[0121] In this embodiment, the host computer 5 is used for:

[0122] According to the received operation information, it is determined whether a corresponding circuit module is abnormal, and a circuit test result for the motion control device to be tested is obtained.

[0123] The abnormality of the circuit module can be understood as any situation pre-defined as abnormal, or a situation different from a pre-defined normal situation. In the specific implementation process, it can be compared with the operation information of the same circuit module when the motion control device to be tested is not in the EMC test environment, or it can be compared with the pre-defined standard operation information of the same circuit module to determine whether an abnormality occurs. Any existing or improved method for determining the abnormality of the circuit module can be applied to this solution.

[0124] The operation information can be understood as any information related to the operation of the corresponding circuit module, for example, it can be information about the electrical signal input to the circuit module, it can be information about the electrical signal output from the circuit module, or it can be other information related to the working mechanism collected based on the working mechanism of the circuit module, wherein the electrical signal can be a digital signal for transmitting information, it can also be an analog signal for transmitting information, or it can also be a signal for transmitting electrical energy. Figures 2 to 4In the related implementation manner, examples may be given for the specific content of the operation information. However, the operation information involved in this embodiment includes these examples, but is not limited to these examples.

[0125] The circuit test results may be understood as information used to characterize whether an abnormality occurs in each circuit module being tested, and may further include the operation information itself or other information obtained therefrom, and may also include information that further describes the abnormality that occurs.

[0126] It can be seen that in the above scheme, different circuit modules can be monitored based on the test instrument platform, and the circuit test results can be obtained on the host computer. It can be seen that the above scheme is aimed at circuit testing, and can automatically realize testing under electromagnetic interference, avoiding manual testing, thereby effectively saving test time and improving test efficiency.

[0127] At the same time, the objects monitored and tested by the test system include, in addition to the functions of the motion control device, the operating information of different circuit modules. Therefore, the circuit module where the abnormality occurs in the motion control device can be accurately located, and it can be determined whether the local circuit of the motion control device has an abnormality.

[0128] In addition, the summary of the circuit test results and the functional test results can be helpful in identifying the underlying cause of the abnormality. It can be seen that the solution of this embodiment can be helpful in accurately guiding the improvement of the motion control device.

[0129] Figure 2 The structure diagram of the test instrument platform and the motion control device to be tested in one embodiment of the present invention is as follows Figure 1 ; Figure 3 The structure diagram of the test instrument platform and the motion control device to be tested in one embodiment of the present invention is as follows Figure 2 ; Figure 4 It is a schematic diagram of the structure of a host computer, a test instrument platform and a motion control device to be tested in one embodiment of the present invention.

[0130] Please refer to Figure 2 The circuit module of the motion control device to be tested includes a processor 401 and its peripheral modules.

[0131] Please refer to Figures 2 to 4According to the experience gained from practice, each optional scheme also creatively selects the operation information of various circuit modules (such as crystal oscillator module, configuration module, burning module and reset module, etc.), power supply module, voltage conversion module, etc. of the processor periphery as the monitoring and testing objects. These circuit modules are related to the realization of part or most functions, and they are also the circuit modules that are more likely to have abnormalities as proven by practice. Compared with the scheme of only monitoring the interactive signal, this scheme can accurately and precisely locate the abnormal position, which is conducive to accurately and precisely guiding the improvement of the motion control device. At the same time, it can also provide a more precise basis for analyzing the internal causes of functional abnormalities based on the circuit modules that have an impact on the realization of each function.

[0132] The processor may be any integrated circuit with data processing capability, such as MCU, CPU, etc.

[0133] The MCU specifically refers to a Microcontroller Unit, which can be characterized as a microprocessor, a microcontroller, a single-chip microcomputer, a microprocessing unit, etc. In a specific example, the MCU can specifically adopt at least one of ARM, DSP, and FPGA.

[0134] The CPU here specifically refers to central processing unit, which can be represented by central processing unit, central processing unit, etc.

[0135] It should also be pointed out that the abnormality of the circuit module and the abnormality of the function may be related or unrelated. One of the improvements of this embodiment is to provide a basis for determining whether they are related and how related they are. Therefore, regardless of whether they are related or not, they do not deviate from the description of this embodiment.

[0136] In one example, the host computer 5 is also used for:

[0137] If, according to the functional test results, it is determined that the number of abnormal functions exceeds a preset number threshold, and according to the circuit test results, it is determined that any target circuit module among the pre-specified N circuit modules is abnormal, then:

[0138] It is determined that the abnormality occurring in the target circuit module is caused by the abnormality of the target circuit module.

[0139] The N circuit modules may be, for example, N circuit modules under test that are peripheral to a processor, but are not limited to circuit modules that are peripheral to a processor, and may also be communication modules, power modules, power conversion modules, and the like.

[0140] Please refer to Figure 2The circuit module of the motion control device to be tested may further include a reset module 402 connected to the periphery of the processor 401 and used for providing a reset timing control signal to the processor 401 when the processor 401 is powered on.

[0141] The reset module can also be represented as an RST module, and RST can also be represented as Reset. Correspondingly, the reset timing control signal can also be represented as an RST signal. When the processor 401 (such as MCU) is powered on, the reset module 402 can provide a timing control signal to it. It has been found in practice that, taking MCU as an example, the RST module of MCU is very easy to be interfered, causing the MCU to restart, and the restart of MCU may also cause abnormalities in the implementation of multiple functions of the motion control device 4 to be tested.

[0142] It can be seen that the reset module 402 has an influence on the realization of multiple functions. Therefore, the abnormality of the function is likely to be caused by the abnormality of the reset module 402. It can be seen that by accurately locating the abnormality of the reset module 402, the accurate positioning of the abnormal position can be achieved, and a more detailed basis can be provided for analyzing the deep causes of the functional abnormality, thereby providing a reliable reference for improvements based on the analysis.

[0143] In a specific example, a high-precision oscilloscope may be used to monitor the waveform of the RST signal, and then feed it back to the host computer, that is, the reset module test instrument may be a high-precision oscilloscope.

[0144] Please refer to Figure 2 The circuit module of the motion control device 4 to be tested further includes a burning module 403 connected to the periphery of the processor 401 for burning the program to the processor 401 , and a configuration module 404 connected to the periphery of the processor 401 for configuring the processor 401 .

[0145] Correspondingly, the at least two testing instruments include:

[0146] A burning module tester 22, used for collecting the waveform of the burning signal sent by the burning module when burning a program for the processor, and using the collected waveform as the operation information of the burning module;

[0147] The configuration module testing instrument 23 is used to collect the waveform of the configuration signal sent by the configuration module when configuring the processor, and use the collected waveform as the operation information of the configuration module.

[0148] The burning module, which can also be characterized as a download module, is easily disturbed during the EMC test, resulting in incorrect burning of the control card (i.e., abnormality in the burning module). When incorrect burning occurs, it is likely to affect the realization of multiple functions of the motion control device.

[0149] The configuration module can also be characterized as a configuration module, which can be used to configure the key information of the circuit board, which may specifically involve the startup, shutdown, working status, etc. of the software system. When the configuration module is disturbed and an abnormality occurs, it will cause the motion control device to work abnormally, and it is also likely to affect the realization of multiple functions of the motion control device.

[0150] It can be seen that the burning module 403 and the configuration module 404 can have an influence on the realization of multiple functions. Therefore, the abnormality of the function is likely to be caused by the abnormality of the burning module 403 and the configuration module 404. By accurately locating the abnormality of the burning module 403 and the configuration module 404, the accurate positioning of the abnormal position can be achieved, and a more detailed basis can be provided for analyzing the deep causes of the functional abnormality, thereby providing a reliable reference for improvements based on the analysis.

[0151] In one example, a high-precision oscilloscope can also be used to monitor the waveforms of the signals of the burning module 403 and the configuration module 404 , that is, the burning module test instrument 22 and the configuration module test instrument 23 can both use a high-precision oscilloscope.

[0152] Please refer to Figure 2 The circuit module of the motion control device 4 to be tested may further include a crystal oscillator module 405 connected to the periphery of the processor 401 and used for providing a clock signal to the processor 401 .

[0153] The at least two test instruments include:

[0154] The crystal oscillator module testing instrument 24 is used to collect frequency information of the crystal oscillator module and use the collected frequency information as operation information of the crystal oscillator module.

[0155] The crystal oscillator module 405 can generate the clock frequency required by the processor (eg, MCU). However, during the EMC test, the crystal oscillator module 405 is susceptible to interference, resulting in timing errors of the processor (eg, MCU), which may further lead to abnormalities in multiple functions.

[0156] It can be seen that the crystal oscillator module 405 can have an influence on the realization of multiple functions. Therefore, the abnormality of the function is likely to be caused by the abnormality of the crystal oscillator module 405. By accurately locating the abnormality of the crystal oscillator module 405, the accurate positioning of the abnormal position can be achieved, and a more detailed basis can be provided for analyzing the deep causes of the functional abnormality, thereby providing a reliable reference for improvements based on the analysis.

[0157] In one example, the crystal oscillator module test instrument may use a spectrum analyzer and its near-field probe, and then, the near-field probe may be used to monitor the working state of the crystal oscillator, and then its frequency information may be obtained therefrom.

[0158] Please refer to Figure 3 The motion control device 4 to be tested may further include a power module 406 and a voltage conversion module 407 for converting the power supplied by the power module 406 into a required voltage; wherein the number of the power module 406 and the voltage conversion module 407 may be one or more, and no matter what the change is, it does not deviate from the motion control device tested in this embodiment.

[0159] Specifically, for the simplicity of the system, the input power supply in the motion control device may be 12V / 24V / 48V, etc., but the voltage required by the internal MCU, communication module, control module, etc. may include 24V / 5V / 3.3V / 2.5V / 1.2V, etc. Therefore, it is necessary to use the voltage conversion module 407 involved above to perform voltage conversion. The voltage conversion module 407 can also be further configured with circuits for filtering, voltage stabilization, etc.

[0160] The at least two test instruments include at least one of the following:

[0161] A power module testing instrument 25, used for collecting output parameters of the power module in the motion control device to be tested as operation information of the power module; the output parameters of the power module include at least one of the output voltage, output current and output power of the power module;

[0162] The first voltage conversion module test instrument 27 is used to collect input side parameters and / or output side parameters of the voltage conversion module 407 in the motion control device to be tested as the operation information of the voltage conversion module 407, wherein the input side parameters include at least one of the input voltage, input current and input power of the input side of the voltage conversion module; and the output side parameters include at least one of the output voltage, output current and output power of the output side of the voltage conversion module;

[0163] The second voltage conversion module tester 26 is used to collect the waveform of the output control signal of the output switch of the voltage conversion module 407, and use the collected waveform as the operation information of the voltage conversion module.

[0164] Among them, the power module 406 and the voltage conversion module 407 may have an influence on the realization of a single function or multiple functions. Therefore, the abnormality of the function is likely to be caused by the abnormality of the power module 406 and the voltage conversion module 407. It can be seen that by accurately locating the abnormality of the power module 406 and the voltage conversion module 407, the accurate positioning of the abnormal position can be achieved, and a more detailed basis can be provided for analyzing the deep causes of the functional abnormality, thereby providing a reliable reference for improvements based on the analysis.

[0165] In one example, the power module test instrument 25 may be, for example, a multimeter, the voltage conversion module first test instrument may be, for example, a multimeter, a voltage probe, a current probe, etc.; the voltage conversion module second test instrument may be, for example, an oscilloscope.

[0166] Please refer to Figure 4 The motion control device to be tested 4 may further include a communication module 408 .

[0167] Through the communication module 408, the motion control device 4 to be tested can communicate with external devices, where the external devices may be, for example, a host computer, a functional testing device, or other devices used to control the motion control device or be controlled by the motion control device, or other devices unrelated to control or being controlled.

[0168] The communication interface mentioned above can be understood as being configured in the corresponding communication module, so the communication module can also be understood as a circuit part including the corresponding communication interface, for example, it can be specifically any one of an Ethernet module including an Ethernet interface, an Ethercat module including an Ethercat interface, a PCI module including a PCI interface, a PCIE module including a PCIE interface, a 485 module including a 485 interface, and a CAN module including a CAN interface. It can be seen that the communication module can also be understood as the communication interface configured by it is not the interactive interface mentioned above.

[0169] The at least two test instruments include:

[0170] The communication module tester 28 is used to collect the eye diagram of the input and output signals of the communication module 408 in the motion control device to be tested, and use the collected eye diagram as the operation information of the communication module 408.

[0171] Taking Ethernet, Ethercat, CAN and other communications as examples, the communication circuit has high requirements on timing, and there is a verification mechanism in the protocol. When EMC interference is coupled in the communication module, it will cause abnormal communication between the motion control device and the host computer or the controlled device.

[0172] Among them, if the realization of the function in the motion control device is based on communication with the functional testing equipment, the host computer, and the control equipment, then the communication module 408 may have an influence on the realization of single or multiple functions, and further, the abnormality of the function may also be caused by the abnormality of the communication module 408. It can be seen that by accurately locating the abnormality of the communication module 408, the accurate positioning of the abnormal position can be achieved, and a more detailed basis can be provided for analyzing the deep causes of the functional abnormality, thereby providing a reliable reference for improvements based on the analysis.

[0173] In one example, the communication module testing instrument 28 may be a network analyzer or an oscilloscope, which can effectively monitor the operation of the communication module.

[0174] In addition, abnormalities in circuit modules such as the communication module, power module, voltage conversion module, reset module, burning module, configuration module, and crystal oscillator module can also cause corresponding problems. Even if they do not affect the implementation of the functions, they can be included in the monitoring to ensure the comprehensiveness of the motion control device test, which is conducive to improving and obtaining high-quality motion control devices.

[0175] The test instrument platform involved above can also be characterized as a workbench hardware platform for multi-slave serial communication. Specifically, the workbench hardware platform can be connected to the host computer through an industrial serial server to achieve serial communication. The industrial serial server can be used to transfer the communication of multiple instruments to the host computer, expand the serial port of the host computer, and achieve multi-slave serial communication.

[0176] Regarding the selected test instruments, it should also be pointed out that instruments with high anti-interference performance should be selected as much as possible. At the same time, in EMS testing, there will be high-voltage interference, so high-voltage probes can be equipped. Differential high-voltage probes can be used when testing current signals, while EMI testing and crystal oscillator testing require near-field probes of spectrum analyzers; these instruments need to have serial communication functions, and the test data and waveforms can be uploaded to the host computer through the serial port.

[0177] The following are specific examples of the test instruments.

[0178] If the operation information includes a waveform of a signal, the corresponding test instrument includes an oscilloscope; if the operation information includes an eye diagram of a signal, the corresponding test instrument includes a vector network analyzer and / or an oscilloscope.

[0179] The oscilloscopes may be used, for example:

[0180] RIGOL oscilloscope MSO8204, which is a 4-channel, 2GHz bandwidth, 10GSa / s sampling rate, high-precision oscilloscope that can test the eye diagram of communication signals and is used to monitor board-level or inter-board communications at rates such as 485 / 232 / CAN communications;

[0181] RIGOL oscilloscope DS2102E, which is a 2-channel, 100Mhz bandwidth, 1GSa / s sampling rate, cost-effective oscilloscope that can test the waveforms of various relatively low-rate signals and key pins;

[0182] In addition, the RIGOL RP1018H high voltage probe can be used to read the signal waveforms at various locations.

[0183] The vector network analyzer can be used for example:

[0184] KEYSIGHT E5071C ENA Vector Network Analyzer: It can analyze the signals in time and frequency domains, so as to monitor various communication signals, such as FSMC / ETHERENT / ETHERCAT, etc.

[0185] If the operation information includes current, the corresponding test instrument includes a multimeter and / or a current detection instrument; if the operation information includes voltage, the corresponding test instrument includes a multimeter and / or a voltage detection instrument;

[0186] The multimeter may be, for example:

[0187] FLUKE 8846A digital high-precision multi-function meter, which is a 6.5-digit high-precision multimeter that can test power supply voltage, current and other signals;

[0188] The voltage detection instrument and the current detection instrument may be, for example:

[0189] RIGOL RP1018H high voltage probe. In this regard, it should be pointed out that during the EMS test, the interference generated is high voltage, so a high voltage probe is needed to read the signal waveform at various locations.

[0190] RIGOL RP1002C current probe. In this regard, it should also be pointed out that during the power supply test, the current probe can be used to test voltage fluctuations.

[0191] If the operation information includes frequency information, the corresponding test instrument includes a spectrum analyzer;

[0192] The spectrum analyzer may be, for example:

[0193] Egret spectrum generator SA2070 (equipped with near-field probe) can be used to test EMI exceeding the standard, crystal oscillator frequency, and points that are severely interfered during EMS testing.

[0194] It can be seen that in the specific example, the test instrument platform can integrate spectrum analyzer, high-precision multimeter, 2GHz oscilloscope (for eye diagram test), 350MHz oscilloscope, network analyzer, high-voltage probe, industrial serial port server, differential current probe and other instruments and equipment, which can monitor the key signals and communications inside the motion control device and identify the problem points. The results are stored and compared by the host computer developed based on Delphi software, which can automatically obtain the EMC test results and locate the problem points.

[0195] For the host computer 5, it can be configured with visual test software developed based on Delphi language, and its functions can be, for example: receiving and controlling functional test equipment (such as a special test board) to monitor the working status of the motion control card; controlling the instrument work of the workbench hardware platform and receiving waveforms to monitor the key waveforms of the control card; automatically comparing the waveforms and working status of the control card to accurately determine whether the EMC test has been passed; automatically comparing data to accurately identify problem points; and automatically recording data.

[0196] It can also be seen that since the test can be implemented under the control of the host computer, it can help avoid the phenomenon of missing tests.

[0197] Figure 5 It is a schematic diagram of the structure of a functional testing device in one embodiment of the present invention.

[0198] The functional testing device 1 can specifically be a dedicated testing board, which can be developed for the functions of the motion control device, can control the realization of part or all of its functions, and test whether its working state is normal; the function of the dedicated testing board will be adjusted accordingly depending on the test object.

[0199] For an example, please refer to Figure 5 , for example, the functional test device 1 of the dedicated test board may include: MCU101, an input module (i.e., INPUT module 104) and an output module (i.e., OUT module 105);

[0200] Among them, MCU101 is connected to the interactive interface of the motion control device to be tested through the interface of the input module and the interface of the output module. In one example, the INPUT module 104 may correspond to 18 Input interfaces, which are used to test whether the 18 interactive interfaces of the OUTPUT module of the motion control device (such as a motion control card) are working properly; the OUT module 105 has 16 OUTPUT interfaces, which are used to test whether the 16 interactive interfaces of the INPUT module of the motion control device (such as a motion control card) are working properly.

[0201] In a further example, the functional testing device 1, such as a dedicated test board, may also include at least one of an analog-to-digital conversion module (i.e., AD module 106), a digital-to-analog conversion module (i.e., DA module 108), a PWM module 107, a motor module 111, an encoder module 110, and the like.

[0202] Among them, taking the motion control device as a motion control card as an example, then:

[0203] If the encoder signal is real motor feedback, the motor module 111 may be, for example, a shaft port module connected to the motor, which may send the motion control signal in the interactive signal of the motion control card to the motor and receive the encoder signal;

[0204] If the encoder signal is simulated by the motor module 111, the motor module 111 may be, for example, a circuit module that can simulate the generation of the encoder signal. For example, it may be an encoder signal that is calculated based on the motion control signal in the interactive signal of the motion control card, or it may be an encoder signal that is actively simulated.

[0205] Furthermore, the encoder signal transmitted from the motor module to the encoder module may be non-differentiated.

[0206] The encoder module 110 can generate an encoder signal for testing, for example, it can convert the non-differential encoder signal received by the motor module 111 into a single-ended encoder signal, and then send it to the MCU 101. The encoder signal for testing can be transmitted to the motion control card as control information via any one of the OUTPUT module 105, the 485&CAN module 109, and the RJ45 module;

[0207] The PWM module 107 can be used to transmit a PWM signal, and the PWM signal can be transmitted to a motion control card or other devices via any one of the OUTPUT module 105, the 485&CAN module 109, and the RJ45 module;

[0208] The AD module 106 and the DA module 108 can perform analog-to-digital conversion and digital-to-analog conversion on the signals to be transmitted, wherein the transmission can refer to the transmission between the functional test device 1 and the motion control card (including input and output), or the transmission between the functional test device 1 and other devices (including input and output). Through this module, the signal form can meet the requirements. Among them, the input pins and output pins of the AD module 106 and the DA module 108 can be connected to the MCU101.

[0209] In a further example, the functional testing device 1 such as a dedicated testing board may also include a 485&CAN module 109 connected to the MCU 101 .

[0210] Through the 485&CAN module 109, the host computer can be connected to realize communication with the host computer, and the motion control card can also be connected to realize communication with the motion control card. Specifically, the 485&CAN communication module 109 can control the motion control card in real time, for example, transmit the control information involved in the above text to the motion control card, monitor its working status at the same time, and upload the test results to the host computer. The interactive signal or its status information can be uploaded to the host computer via the 485&CAN module 109, and the motion control instruction can also be transmitted to the functional test device 1 via the 485&CAN module 109, and then transmitted to the motion control card.

[0211] In a further example, the functional test device 1 such as a dedicated test board may further include an alarm module 112 , an ESC controller 102 , and an RJ45 module 103 , wherein the RJ45 module 103 is connected to the MCU 101 via the ESC controller 102 .

[0212] The alarm module 112 , the shaft port module 111 , the encoder module 110 , the 485&CAN module 109 , the DA module 108 , the PWM module 107 , the AD module 106 , the OUTPUT module 105 , the INPUT module 104 and the like mentioned above can all be connected to the MCU 101 .

[0213] In addition, modules that need to be connected to the outside, such as the OUTPUT module 105, the INPUT module 104, the RJ45 module 103, the 485&CAN module 109, etc., can be configured with corresponding interfaces. Correspondingly, the motion control card or the host computer to which they are connected is also configured with a corresponding communication module and its interface.

[0214] When the above-mentioned systems are actually used for testing, an example of a testing process may be, for example (wherein the motion control card is used as the motion control device 4 and the dedicated test board is used as the functional test device 1 as an example):

[0215] S1: Building a test system involved in the optional solution of this embodiment for the motion control card;

[0216] S2: Without EMC test, use the dedicated test board to complete the test of the motion control card function, confirm that it is normal, and upload the PC software of the host computer through Ethernet.

[0217] S3. Under the condition of not conducting EMC test, use workbench to complete the test of key waveforms and upload the test software through the serial port server

[0218] S4.: Perform EMC test, perform steps S2 and S3 during the test, and record the interference waveform at the same time;

[0219] S5: The test software of the host computer automatically generates the test results. If the test fails, the problem points and functional abnormalities are located;

[0220] S6: Improve EMC for problem points and functional abnormalities, including but not limited to, adding EMC protection devices such as TVS tubes, varistors, common mode inductors, improving grounding, etc.;

[0221] S7: Repeat the above steps S2 / S3 / S4 / S5 until the EUT passes the test.

[0222] To sum up, in the test system of the motion control device provided by the present embodiment, when the motion control device to be tested is in an EMC test environment, the functional test equipment can interact with the motion control device to monitor whether its function execution occurs abnormally, thereby obtaining the functional test result. The circuit test result can also be obtained on the host computer based on the monitoring of different circuit modules by the test instrument platform. It can be seen that the present embodiment can automatically realize the test under electromagnetic interference, avoid manual testing, and thus effectively save test time and improve test efficiency.

[0223] In addition, the objects monitored and tested by the test system of this embodiment include, in addition to the functions of the motion control device, the operating information of different circuit modules. Therefore, the circuit module where the abnormality occurs in the motion control device can be accurately located, and it can be determined whether the local circuit of the motion control device has an abnormality, thereby accurately locating the circuit position where the abnormality occurs. At the same time, the summary of the circuit test results and the functional test results can help identify the underlying cause of the abnormality. It can be seen that this embodiment can help to accurately guide the improvement of the motion control device.

[0224] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A test system for a motion control device, It is characterized in that include: EMC test instruments, functional test equipment, host computer and test instrument platform; The EMC test instrument is used to form an EMC test environment to generate electromagnetic interference to the motion control device to be tested in the EMC test environment; The functional testing device is connected to the interactive interface of the motion control device to be tested and the host computer; the functional testing device is used for: Monitoring an interactive signal of the interactive interface, wherein the interactive signal matches a function performed by the motion control device under the electromagnetic interference; Sending the interactive signal and / or its status information to the host computer; The test instrument platform includes at least two test instruments, and different test instruments are connected to different circuit modules of the motion control device to be tested to collect operation information of the corresponding circuit modules; the at least two test instruments are connected to the host computer to send the collected operation information to the host computer; The host computer is used for: Determine, according to the interaction signal or its status information, whether a function of the motion control device to be tested corresponding to the interaction signal is abnormal, and obtain a function test result for the motion control device to be tested; According to the received operation information, it is determined whether a corresponding circuit module is abnormal, and a circuit test result for the motion control device to be tested is obtained.

2. The motion control device testing system according to claim 1, It is characterized in that The circuit module of the motion control device to be tested includes a processor, and a reset module connected to the periphery of the processor and used for providing a reset timing control signal to the processor when the processor is powered on; The at least two test instruments include: The reset module testing instrument is used to collect the waveform of the reset timing control signal provided by the reset module when the processor is powered on, and use the collected waveform as the operation information of the reset module.

3. The motion control device testing system according to claim 1, It is characterized in that The circuit module of the motion control device to be tested includes a processor, a burning module connected to the periphery of the processor for burning a program into the processor, and a configuration module connected to the periphery of the processor for configuring the processor; The at least two test instruments include: A burning module testing instrument, used for collecting the waveform of the burning signal sent by the burning module when burning a program for the processor, and using the collected waveform as the operation information of the burning module; The configuration module testing instrument is used to collect the waveform of the configuration signal sent by the configuration module when configuring the processor, and use the collected waveform as the operation information of the configuration module.

4. The motion control device testing system according to claim 1, It is characterized in that The motion control device to be tested includes a processor, and a crystal oscillator module connected to the periphery of the processor and used for providing a clock signal to the processor; The at least two test instruments include: The crystal oscillator module testing instrument is used to collect frequency information of the crystal oscillator module and use the collected frequency information as operation information of the crystal oscillator module.

5. The motion control device testing system according to claim 1, It is characterized in that The motion control device to be tested includes a power module, and a voltage conversion module for converting the power supply of the power module into a required voltage; The at least two test instruments include at least one of the following: A power module testing instrument, used for collecting output parameters of the power module in the motion control device to be tested as operation information of the power module; the output parameters of the power module include at least one of the output voltage, output current and output power of the power module; A first test instrument for a voltage conversion module, used for collecting input side parameters and / or output side parameters of the voltage conversion module in the motion control device to be tested as operation information of the voltage conversion module, wherein the input side parameters include at least one of an input voltage, an input current and an input power at the input side of the voltage conversion module; and the output side parameters include at least one of an output voltage, an output current and an output power at the output side of the voltage conversion module; The second test instrument of the voltage conversion module is used to collect the waveform of the output control signal of the output switch of the voltage conversion module, and use the collected waveform as the operation information of the voltage conversion module.

6. The motion control device testing system according to claim 1, It is characterized in that The motion control device to be tested includes a communication module; The at least two test instruments include: The communication module testing instrument is used to collect the eye diagram of the input and output signals of the communication module in the motion control device to be tested, and use the collected eye diagram as the operation information of the communication module.

7. A test system for a motion control device according to any one of claims 1 to 6, It is characterized in that The host computer is also used for: If, according to the functional test results, it is determined that the number of abnormal functions exceeds a preset number threshold, and according to the circuit test results, it is determined that any target circuit module among the pre-specified N circuit modules is abnormal, then: It is determined that the abnormality occurring in the target circuit module is caused by the abnormality of the target circuit module.

8. The motion control device testing system according to any one of claims 1 to 6, It is characterized in that The functional testing device is also used to input control information to at least one interactive interface or other communication interface of the motion control device to be tested, so that the motion control device to be tested performs the function indicated by the control information under the electromagnetic interference.

9. The motion control device test system according to any one of claims 1 to 6, It is characterized in that If the operation information includes the waveform of the signal, the corresponding test instrument includes an oscilloscope; If the operation information includes current, the corresponding test instrument includes a multimeter and / or a current detection instrument; If the operation information includes voltage, the corresponding test instrument includes a multimeter and / or a voltage detection instrument; If the operation information includes an eye diagram of a signal, the corresponding test instrument includes a vector network analyzer and / or an oscilloscope; If the operation information includes frequency information, the corresponding test instrument includes a spectrum analyzer.

10. The motion control device testing system according to any one of claims 1 to 6, It is characterized in that The motion control device to be tested is a motion control device used to control the motion of a cutting head through an actuator of laser cutting.

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