A test resource reuse method, device and system for embedded devices

Abstract

The present invention discloses a test resource reuse method, device and system for embedded devices. The test resource reuse device includes a script division unit, a planning and scheduling unit and a test execution unit. The test resource reuse system includes a test resource reuse module, a test device and a user interaction module. By determining and executing one or more first test tasks according to the device status of the test device and modifying the device status of the first test device corresponding to the first test task to unavailable, the test resource reuse method, device and system improve the test resource utilization rate of the embedded device.

Description

Technical Field

[0001] The invention relates to the field of test resource reuse of embedded devices, and relates to a test resource reuse method, device and system for embedded devices. Background Art

[0002] An embedded system consists of hardware and software. It is a device that can operate independently. Its software content only includes the software operating environment and its operating system. The hardware content includes many aspects such as signal processors, memory, communication modules, etc.

[0003] In the prior art, embedded testing is usually carried out in four stages through a test platform, namely module testing, integration testing, system testing, and hardware / software integration testing; among them, the first three stages are applicable to the testing of any software, and the hardware / software integration testing stage is unique to embedded software, and its purpose is to verify whether the embedded software can interact correctly with the hardware devices it controls.

[0004] However, the existing technology still has the disadvantage of low test resource utilization. When doing automated testing, the embedded device will be occupied and cannot be used for other test tasks. When the device resources are scarce, the progress of testing and version release will be affected.

[0005] Therefore, there is a need for a test resource reuse method, device and system for embedded devices to solve the above problems in the prior art. Summary of the invention

[0006] In view of the above existing technical problems, an object of the present invention is to provide a test resource reuse method, device and system for an embedded device, so as to improve the test resource utilization rate of the embedded device.

[0007] The present invention provides a test resource reuse method for an embedded device, comprising: dividing a preset test script into a plurality of test partitions according to required test devices; wherein each of the test partitions comprises one or more test tasks; determining one or more first test tasks that are currently executable according to the device status of each test device and the plurality of test partitions; wherein the device status comprises available and unavailable, and the initial device status of each test device is available; executing all first test tasks, and modifying the device status of each first test device required for executing each first test task to unavailable.

[0008] In one embodiment, the test resource reuse method further includes: after each first test task is executed, modifying the device status of the first test device corresponding to the executed first test task to be available.

[0009] In one embodiment, the preset test script is divided into multiple test partitions according to the required test equipment, specifically: obtaining the preset test script, determining the test equipment required for the test script, and establishing a test partition according to each of the test equipment; determining the test equipment required for each test task of the test script, and respectively adding each test task to the test partition corresponding to the required test equipment; wherein, multiple test tasks in the same test partition are sorted according to their respective priorities.

[0010] In one embodiment, the one or more first test tasks that can be executed currently are determined according to the device status of each test device and the multiple test partitions, specifically: respectively obtain the priority test tasks ranked first in each test partition, and respectively determine the priority test device groups required to execute each priority test task; the priority test device groups include one or more test devices required for the corresponding priority test tasks; respectively determine whether there is a resource occupation conflict between each priority test device group; if not, the priority test tasks corresponding to the two priority test device groups are both determined as the first test tasks; if so, among the priority test tasks corresponding to the two priority test device groups, the priority test task with a higher priority is selected and determined as the first test task.

[0011] The present invention also provides a test resource reuse device for an embedded device, the test resource reuse device comprising a script division unit, a planning and scheduling unit, and a test execution unit, wherein the script division unit is used to divide a preset test script into multiple test partitions according to required test devices; wherein each of the test partitions includes one or more test tasks; the planning and scheduling unit is used to determine one or more currently executable first test tasks according to the device status of each test device and the multiple test partitions; wherein the device status includes available and unavailable, and the initial device status of each test device is available; the test execution unit is used to execute all first test tasks, and modify the device status of each first test device required for the execution of each first test task to unavailable.

[0012] The present invention also provides a test resource reuse system for an embedded device, the test resource reuse system comprising a test resource reuse module, a test device and a user interaction module, the test device and the user interaction module are respectively communicatively connected to the test resource reuse module, wherein the test resource reuse module is used to perform testing through the test device according to the test resource reuse method for embedded devices as described above, so as to obtain test results; the user interaction module is used to send the test results to a user and receive user instructions input by the user.

[0013] In one embodiment, the user interaction module includes a touchable / non-touchable display screen, an input keyboard, a virtual keyboard, an indicator light, and a combination of one or more of the above.

[0014] Compared with the prior art, the embodiments of the present invention have the following beneficial effects:

[0015] The present invention provides a test resource reuse method, device and system for an embedded device. The test resource reuse method, device and system improve the test resource utilization rate of the embedded device by determining and simultaneously executing one or more first test tasks according to the device status of the test device, and modifying the device status of the first test device corresponding to the first test task to be unavailable.

[0016] Furthermore, the test resource reuse method, device and system for an embedded device provided by the present invention also realize automatic reuse of the test device by modifying the test status of the corresponding first test device to release test resources for use by other test tasks after the first test task is executed. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The present invention will be further described below in conjunction with the accompanying drawings, wherein:

[0018] Figure 1 A flowchart showing an embodiment of a test resource reuse method for an embedded device according to the present invention is shown;

[0019] Figure 2 A structural diagram showing an embodiment of a test resource reuse device for an embedded device according to the present invention;

[0020] Figure 3 A structural diagram of an embodiment of a test resource reuse system for an embedded device according to the present invention is shown. DETAILED DESCRIPTION

[0021] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention. Specific embodiment 1

[0023] The embodiment of the present invention firstly describes a test resource reuse method for an embedded device. Figure 1 FIG. 1 is a flow chart showing an embodiment of a test resource reuse method for an embedded device according to the present invention. Figure 1 As shown, the method comprises the following steps:

[0024] S1: Divide the preset test script into multiple test partitions according to the required test equipment.

[0025] Since the test equipment related to the entire test script is occupied from beginning to end during automated testing, some test equipment cannot be fully utilized. Therefore, the embodiment of the present invention divides the preset test script into multiple test partitions according to the situation of the test equipment required to be occupied, thereby ensuring that the test equipment is put into testing to the maximum extent during the automated testing process. Each test partition includes one or more test tasks, and the execution of one or more test tasks in each test partition requires the occupation of the test equipment corresponding to the test partition.

[0026] In one embodiment, step S1 specifically includes: obtaining a preset test script, determining the test equipment required for the test script, and establishing a test partition according to each of the test equipment; determining the test equipment required for each test task of the test script, and adding each test task to the test partition corresponding to the required test equipment.

[0027] Among them, multiple test tasks in the same test partition are sorted according to their respective priorities, so that when the device status of the test device corresponding to the test partition is available, each test task is executed in sequence according to its priority to prevent conflict and jamming.

[0028] S2: Determine one or more first test tasks that are currently executable according to the device status of each test device and the multiple test partitions.

[0029] In order to maximize the utilization of test equipment, several first test tasks that can be executed simultaneously should be determined at preset time intervals according to the priority ranking of test tasks in each test partition and the test status of each test equipment, so as to ensure that the test equipment is put into testing uninterruptedly or at short intervals as much as possible.

[0030] Therefore, in one embodiment, step S2 is specifically as follows: respectively obtain the priority test tasks ranked first in each test partition, and respectively determine the priority test equipment groups required to execute each priority test task; respectively determine whether there is a resource occupation conflict between each priority test equipment group; if not, then determine the priority test tasks corresponding to the two priority test equipment groups as the first test task; if so, then select the priority test task with a higher priority from the priority test tasks corresponding to the two priority test equipment groups as the first test task. Wherein, the priority test equipment group includes one or more test equipment required for the corresponding priority test task.

[0031] Considering that one test task may correspond to multiple test devices, and at the same time, the device status of the corresponding multiple devices may not all be available, therefore, in one embodiment, if there is a resource occupation conflict between two priority test device groups, after selecting the priority test task with a higher priority as the first test task, wait for a preset time interval and repeat step S2.

[0032] S3: Execute all first test tasks, and modify the device status of each first test device required for executing each first test task to unavailable.

[0033] In order to prevent one or more first test devices corresponding to the first test task from being preempted by other test tasks during the execution of the first test task, it is necessary to modify the device status of the first test device corresponding to the first test task to unavailable during the execution of the first test task, so as to prevent the above situation.

[0034] In order to make the test proceed smoothly, after one or more first test tasks are determined and executed, the corresponding one or more test results should be stored, all the first test tasks that have been executed should be deleted from each test partition, and steps S2-S3 should be re-executed. Since in step S3, the device status of each first test device has been modified to unavailable during the execution of the corresponding first test task, at this time, in order to smoothly execute steps S2-S3, the test resource reuse method also includes: after each first test task is executed, the device status of the first test device corresponding to the executed first test task is modified to available.

[0035] The present invention provides a test resource reuse method for an embedded device. The test resource reuse method improves the test resource utilization rate of the embedded device by determining and simultaneously executing one or more first test tasks according to the device status of the test device, and modifying the device status of the first test device corresponding to the first test task to be unavailable. Furthermore, the test resource reuse method for an embedded device provided by the present invention also realizes automatic reuse of the test device by modifying the test status of the corresponding first test device to be available for releasing test resources for use by other test tasks after the first test task is executed. Specific embodiment 2

[0037] In addition to the above method, the embodiment of the present invention also describes a test resource reuse device for an embedded device. Figure 2 A structural diagram of an embodiment of a test resource reuse device for an embedded device according to the present invention is shown.

[0038] As shown in the figure, the test resource reuse device includes a script division unit 11, a planning and scheduling unit 12 and a test execution unit 13.

[0039] The script division unit 11 is used to divide the preset test script into a plurality of test partitions according to the required test equipment, wherein each of the test partitions includes one or more test tasks.

[0040] The planning and scheduling unit 12 is used to determine one or more first test tasks that are currently executable according to the device status of each test device and the multiple test partitions, wherein the device status includes available and unavailable, and the initial device status of each test device is available.

[0041] The test execution unit 13 is used to execute all first test tasks, and modify the device status of each first test device required for executing each first test task to be unavailable.

[0042] When it is necessary to implement test resource reuse for embedded devices, the test resource reuse device first divides the preset test script into multiple test partitions according to the required test equipment through the script division unit 11; then, the planning and scheduling unit 12 determines one or more currently executable first test tasks according to the device status of each test equipment and the multiple test partitions; finally, the test execution unit 13 executes all first test tasks, and modifies the device status of each first test equipment required for the execution of each first test task to unavailable.

[0043] The present invention provides a test resource multiplexing device for an embedded device. The test resource multiplexing device improves the test resource utilization rate of the embedded device by determining and simultaneously executing one or more first test tasks according to the device status of the test device, and modifying the device status of the first test device corresponding to the first test task to be unavailable. Furthermore, the test resource multiplexing device for an embedded device provided by the present invention also realizes automatic reuse of the test device by modifying the test status of the corresponding first test device to be available for releasing test resources for use by other test tasks after the first test task is executed. Specific embodiment three

[0045] In addition to the above method and apparatus, the present invention also describes a test resource reuse system for embedded devices. Figure 3 A structural diagram of an embodiment of a test resource reuse system for an embedded device according to the present invention is shown.

[0046] like Figure 3As shown, the test resource reuse system includes a test resource reuse module 1, a test device 2 and a user interaction module 3, wherein the test device 2 and the user interaction module 3 are respectively connected to the test resource reuse module 1. In one embodiment, the number of the test device 2 can be one or more.

[0047] The test resource reuse module 1 is used to perform testing according to the test resource reuse method of the embedded device as described above through the test device 2, so as to obtain the test result. In one embodiment, the test resource reuse module 1 is also used to store the test result. In one embodiment, the test resource reuse module 1 is also used to send the test result to the user interaction module 3. In one embodiment, the test resource reuse module 1 is also used to receive user instructions.

[0048] The user interaction module 3 is used to send the test results to the user, receive user instructions input by the user, and send the user instructions to the test resource reuse module 1. In one embodiment, the user interaction module includes a touchable / non-touchable display screen, an input keyboard, a virtual keyboard, an indicator light, and a combination of one or more of the above.

[0049] In one embodiment, the user instructions include priority scheduling instructions, test equipment query instructions, test equipment reset instructions, historical test query instructions, and test report instructions. Among them, the priority scheduling instructions are used to adjust and modify the priority of the test task; the test equipment query instructions are used to query the device information of all test equipment 2 currently connected to the test resource reuse module 1, and the device information includes the device name and device status; the test equipment reset instructions are used to reset the device status of all test equipment 2 currently connected to the test resource reuse module 1; the historical test query instructions are used to query the test results stored in the test resource reuse module 1; the test report instructions are used to generate a test report according to the test results specified in the test report instructions.

[0050] The present invention provides a test resource reuse system for an embedded device. The test resource reuse system improves the test resource utilization rate of the embedded device by determining and simultaneously executing one or more first test tasks according to the device status of the test device, and modifying the device status of the first test device corresponding to the first test task to be unavailable. Furthermore, the test resource reuse system for an embedded device provided by the present invention also realizes automatic reuse of the test device by modifying the test status of the corresponding first test device to be available for releasing test resources for use by other test tasks after the first test task is executed.

[0051] The specific embodiments described above further illustrate the purpose, technical solutions and beneficial effects of the present invention. It should be understood that the above description is only a specific embodiment of the present invention and is not intended to limit the scope of protection of the present invention. It is particularly pointed out that for those skilled in the art, any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the scope of protection of the present invention.

Claims

1. A test resource reuse method for embedded devices, It is characterized in that include: Divide the preset test script into multiple test partitions according to the required test equipment; wherein each of the test partitions includes one or more test tasks; the method of dividing the preset test script into multiple test partitions according to the required test equipment is specifically as follows: obtain the preset test script, determine the test equipment required for the test script, and establish a test partition according to each of the test equipment; determine the test equipment required for each test task of the test script, and respectively add each test task to the test partition corresponding to the required test equipment; wherein multiple test tasks in the same test partition are sorted according to their respective priorities; Determine one or more first test tasks that are currently executable based on the device status of each test device and the multiple test partitions; wherein the device status includes available and unavailable, and the initial device status of each test device is available; the determination of one or more first test tasks that are currently executable based on the device status of each test device and the multiple test partitions is specifically as follows: respectively obtain the priority test tasks ranked first in each test partition, and respectively determine the priority test device groups required to execute each priority test task; the priority test device groups include one or more test devices required for the corresponding priority test tasks; respectively determine whether there are resource occupation conflicts between each priority test device group; if not, determine the priority test tasks corresponding to the two priority test device groups as the first test tasks; if so, select the priority test task with a higher priority from the priority test tasks corresponding to the two priority test device groups as the first test task; All first test tasks are executed, and the device status of each first test device required for executing each first test task is modified to unavailable.

2. The test resource reuse method for embedded devices according to claim 1, It is characterized in that The test resource reuse method further includes: After each first test task is executed, the device status of the first test device corresponding to the executed first test task is modified to be available.

3. A test resource reuse device for embedded devices, It is characterized in that The test resource reuse device includes a script division unit, a planning and scheduling unit, and a test execution unit, wherein: The script division unit is used to divide the preset test script into multiple test partitions according to the required test equipment; wherein each of the test partitions includes one or more test tasks; the division of the preset test script into multiple test partitions according to the required test equipment is specifically: obtaining the preset test script, and determining the test equipment required for the test script, and establishing a test partition according to each of the test equipment; determining the test equipment required for each test task of the test script, and respectively adding each test task to the test partition corresponding to the required test equipment; wherein multiple test tasks in the same test partition are sorted according to their respective priorities; The planning and scheduling unit is used to determine one or more first test tasks that can be executed currently according to the device status of each test device and the multiple test partitions; wherein the device status includes available and unavailable, and the initial device status of each test device is available; the one or more first test tasks that can be executed currently according to the device status of each test device and the multiple test partitions are determined specifically as follows: respectively obtain the priority test tasks ranked first in each test partition, and respectively determine the priority test device groups required to execute each priority test task; the priority test device groups include one or more test devices required for the corresponding priority test tasks; respectively determine whether there is a resource occupation conflict between each priority test device group; if not, determine the priority test tasks corresponding to the two priority test device groups as the first test tasks; if so, select the priority test task with a higher priority from the priority test tasks corresponding to the two priority test device groups as the first test task; The test execution unit is used for executing all first test tasks and modifying the device status of each first test device required for executing each first test task to be unavailable.

4. A test resource reuse system for embedded devices, It is characterized in that The test resource reuse system includes a test resource reuse module, a test device and a user interaction module, wherein the test device and the user interaction module are respectively connected to the test resource reuse module in communication, wherein: The test resource reuse module is used to perform testing through the test device according to the test resource reuse method for an embedded device according to any one of claims 1 to 2, so as to obtain a test result; The user interaction module is used to send the test result to the user and receive user instructions input by the user.

5. The test resource reuse system for embedded devices according to claim 4, It is characterized in that The user interaction module includes a touchable / non-touchable display screen, an input keyboard, a virtual keyboard, an indicator light, and a combination of one or more of the above.

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