Device for providing a bias current to a Hall sensor

Abstract

A device for providing a bias current to a Hall sensor, comprising: a bias provider configured to provide a bias current to the Hall sensor; and a processor configured to generate a bias current control value based on a node voltage between the Hall sensor and the bias provider, wherein the bias provider is configured to vary the bias current based on the bias current control value.

Description

[0001] Cross - reference to related applications

[0002] This application claims the benefit of priority to Korean Patent Application No. 10 - 2020 - 0073543, filed with the Korean Intellectual Property Office on June 17, 2020, the entire disclosure of which is incorporated herein by reference for all purposes. Technical field

[0003] The following description relates to a device for providing a bias current to a Hall sensor. Background art

[0004] Generally, when a lens module moves according to a force received from an external source, techniques for fixing the relative position of the lens module externally are widely used.

[0005] For example, even when an external force is applied to a camera module, an optical image stabilizer (OIS) can be configured to fix the position of the lens module inside the camera module.

[0006] A Hall sensor can be used to measure position information of the lens module and can output a voltage that varies according to the position of the lens module. As the correspondence accuracy between the output voltage of the Hall sensor and the position information of the lens module increases, the accuracy of the OIS can increase.

[0007] Since the output voltage of the Hall sensor may change slightly according to the temperature of the Hall sensor, and the change in the output voltage according to the temperature of the Hall sensor is substantially independent of the position of the lens module, the temperature change of the Hall sensor may reduce the correspondence accuracy between the output voltage of the Hall sensor and the position information of the lens module. Summary of the invention

[0008] The Summary of the Invention section is intended to introduce, in a brief form, selections of inventive concepts, which will be further described in the Detailed Description section below. The Summary of the Invention section is not intended to identify key features or essential features of the claimed subject matter, nor is it intended to help determine the scope of the claimed subject matter.

[0009] In one general aspect, a device for providing a bias current to a Hall sensor includes: a bias provider configured to provide a bias current to the Hall sensor; and a processor configured to generate a bias current control value based on a node voltage between the Hall sensor and the bias provider, wherein the bias provider is configured to vary the bias current based on the bias current control value.

[0010] The processor can also be configured to provide a Hall sensor output value to the driver, where the Hall sensor output value corresponds to the voltage difference between the first output terminal and the second output terminal of the Hall sensor, and the driver is configured to control the driving of the lens module.

[0011] The apparatus can also include an AD converter configured to: convert a first analog value corresponding to the node voltage between the Hall sensor and the bias provider into a first digital value; and convert a second analog value corresponding to the voltage difference between the first output terminal and the second output terminal of the Hall sensor into a second digital value.

[0012] The apparatus can also include an amplifier configured to amplify the voltage difference between the first output terminal and the second output terminal of the Hall sensor. The second analog value can correspond to the amplified voltage generated by the amplifier.

[0013] The apparatus can also include: an AD converter configured to convert a first analog value corresponding to the node voltage between the Hall sensor and the bias provider into a first digital value; and a switch configured to switch the on and off of the electrical connection between the bias provider and the terminal where the first analog value is input to the AD converter.

[0014] The apparatus can also include a filter configured to filter frequency components having a frequency higher than the cut-off frequency in the node voltage between the Hall sensor and the bias provider.

[0015] The bias provider can include: a first bias provider configured to generate a variable first bias current based on a bias current control value; and a second bias provider configured to generate a second bias current having a smaller correlation with the bias current control value than the first bias current. The first bias current and the second bias current can be provided to the Hall sensor together.

[0016] The first bias provider can include: a first resistor and a second resistor electrically connected to each other; and an intermediate transistor configured to output a current depending on the first bias current to the first resistor and the second resistor. The second resistor can have a variable resistance value that varies according to the bias current control value.

[0017] The first bias provider can also include an operational amplifier configured to input a voltage corresponding to the bias current, output the amplified voltage to the intermediate transistor, and receive feedback from the node between the first resistor and the second resistor.

[0018] The first bias provider can also include a first transistor configured to input the amplified voltage output by the operational amplifier and generate the first bias current. The second bias provider can include a second transistor configured to be input with a reference voltage from a voltage source and generate the second bias current.

[0019] The bias provider may include: a first transistor configured to generate a first bias current; and a second transistor configured to generate a second bias current. The first bias current and the second bias current may be provided to the Hall sensor together. The second transistor may be configured to be input with a voltage that varies based on a bias current control value from a voltage source and generate the second bias current based on the varying voltage.

[0020] The processor may also be configured to receive a Hall sensor output value corresponding to a voltage difference between a first output terminal and a second output terminal of the Hall sensor, and generate a compensated output value by compensating the Hall sensor output value based on a node voltage between the Hall sensor and the bias provider.

[0021] In another general aspect, an apparatus for providing a bias current to a Hall sensor includes: a bias provider configured to provide a bias current to the Hall sensor; and an AD converter. The AD converter is configured to: convert a first analog value corresponding to a node voltage between the Hall sensor and the bias provider into a first digital value; and convert a second analog value corresponding to a voltage difference between a first output terminal and a second output terminal of the Hall sensor into a second digital value. The apparatus includes a processor configured to compensate the second digital value based on the first digital value to generate a compensated output value.

[0022] The processor may also be configured to apply the first digital value as a coefficient of the second digital value to generate a compensated output value.

[0023] The apparatus may further include: a switch configured to switch on and off an electrical connection between the bias provider and a terminal where the first analog value is input to the AD converter; and a filter configured to filter frequency components having frequencies higher than a cut-off frequency in a node voltage between the Hall sensor and the bias provider.

[0024] The processor may also be configured to provide the compensated output value to a driver, where the driver is configured to control the driving of the lens module.

[0025] In another general aspect, a camera module includes: a lens module; a Hall sensor configured to measure position information of the lens module; a driver electrically connected to the Hall sensor and configured to control the driving of the lens module; and a bias provider configured to provide a bias current to the Hall sensor and vary the bias current based on a node voltage between the Hall sensor and the bias provider.

[0026] The camera module may further include a processor configured to generate a bias current control value based on the node voltage. The bias provider may also be configured to vary the bias current based on the bias current control value.

[0027] The processor can also be configured to provide a Hall sensor output value corresponding to a voltage difference between a first output terminal and a second output terminal of the Hall sensor to the driver.

[0028] The processor can also be configured to receive a Hall sensor output value corresponding to a voltage difference between a first output terminal and a second output terminal of the Hall sensor, and provide a compensated output value to the driver by compensating the Hall sensor output value based on the node voltage.

[0029] Other features and aspects will become apparent from the following detailed description, the drawings, and the appended claims. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Figure 1A and Figure 1B are diagrams showing a device for providing a bias current to a Hall sensor according to an embodiment.

[0031] Figure 2A and Figure 2B are circuit diagrams showing a bias provider of a device for providing a bias current to a Hall sensor according to an embodiment.

[0032] Figure 3 is a diagram showing a part (feedback controller) of a processor of a device for providing a bias current to a Hall sensor according to an embodiment.

[0033] Figure 4 is a diagram showing a change in voltage difference between a first Hall sensor output terminal and a second Hall sensor output terminal of a Hall sensor with temperature.

[0034] Figure 5 is a diagram showing a part (temperature compensator) of a processor of a device for providing a bias current to a Hall sensor according to an embodiment.

[0035] Figure 6 is a diagram showing a compensated output value of a device for providing a bias current to a Hall sensor according to temperature compensation according to an embodiment.

[0036] Figure 7 is a diagram showing a structure according to an embodiment, in which a device for providing a bias current to a Hall sensor is included in a lens module control structure.

[0037] Figure 8 is according to an embodiment Figure 7 of the device shown in

[0038] Throughout the drawings and the detailed description, like reference numerals refer to like elements. For clarity, illustration, and convenience, the drawings may not be drawn to scale, and the relative sizes, proportions, and depictions of elements in the drawings may be exaggerated. Detailed Description

[0039] The following detailed description is provided to assist the reader in obtaining a comprehensive understanding of the methods, apparatuses, and / or systems described in this application. However, various changes, modifications, and equivalents of the methods, apparatuses, and / or systems described in this application will be apparent after understanding the disclosure of this application. For example, the order of operations described in this application is merely exemplary and, except for operations that must occur in a specific order, is not limited to the order set forth in this application but may be changed in an obvious manner after understanding the disclosure of this application. Additionally, descriptions of features known in the art may be omitted for greater clarity and conciseness.

[0040] The features described in this application may be implemented in different forms and should not be construed as limited to the examples described in this application. Rather, the examples described in this application are provided merely to illustrate some of the many possible ways of implementing the methods, apparatuses, and / or systems described in this application, which will be apparent after understanding the disclosure of this application.

[0041] It should be noted that in this application, the phrase "may" is used with respect to an example or embodiment, such as with respect to what an example or embodiment may include or achieve, meaning that there is at least one example or embodiment in which such a feature is included or achieved, and all examples and embodiments are not limited thereto.

[0042] Throughout the specification, when an element such as a layer, region, or substrate is described as being "on," "connected to," or "coupled to" another element, the element may be directly "on," directly "connected to," or directly "coupled to" the other element, or there may be one or more other elements between the element and the other element. Conversely, when an element is described as being "directly on," "directly connected to," or "directly coupled to" another element, there may be no other elements between the element and the other element.

[0043] As used in this application, the phrase "and / or" includes any one of the associated listed items and any combination of any two or more of them.

[0044] Although terms such as "first", "second", and "third" may be used in this application to describe various components, parts, regions, layers, or sections, these components, parts, regions, layers, or sections are not limited by these terms. Rather, these terms are only used to distinguish one component, part, region, layer, or section from another. Thus, without departing from the teachings of the examples described in this application, the first component, first part, first region, first layer, or first section mentioned in these examples may also be referred to as the second component, second part, second region, second layer, or second section.

[0045] Spatial relative terms such as "above", "upper", "below", and "lower" may be used in this application for convenience in description to describe the relationship of one element to another as shown in the figures. In addition to covering the orientations depicted in the figures, these spatial relative terms are intended to also cover different orientations of the device during use or operation. For example, if the device in the figures is flipped, an element described as "above" or "upper" relative to another element will be "below" or "lower" relative to that other element. Thus, depending on the spatial orientation of the device, the term "above" covers both the orientation of "above" and "below". The device may also be oriented in other ways (e.g., rotated 90 degrees or in other orientations), and the spatial relative terms used in this application should be interpreted accordingly.

[0046] The terms used in this application are only for describing various examples and are not intended to limit the disclosure. Unless the context clearly indicates otherwise, the articles "a", "an", and "the" are intended to include the plural forms as well. The terms "comprising", "including", and "having" specify the presence of the stated features, numbers, operations, components, elements, and / or combinations thereof, but do not preclude the presence or addition of one or more other features, numbers, operations, components, elements, and / or combinations thereof.

[0047] Due to manufacturing techniques and / or tolerances, variations in the shapes shown in the figures may occur. Thus, the examples described in this application are not limited to the specific shapes shown in the figures but include shape variations that occur during manufacturing.

[0048] The features of the examples described in this application may be combined in various ways that will be apparent after understanding the disclosure of this application. In addition, although the examples described in this application have various configurations, other configurations that will be apparent after understanding the disclosure of this application are also possible.

[0049] Figure 1A and Figure 1BFIG. 0 is a diagram showing an apparatus 100a for providing a bias current to a Hall sensor 300 according to an embodiment. For example, the apparatus 100a may be disposed in a camera module, and the Hall sensor 300 may be configured to measure position information of a lens module.

[0050] Reference Figure 1A , the apparatus 100a includes a bias provider including at least one of, for example, a first bias provider 160a and a second bias provider 170a, and a processor 140a.

[0051] For example, the apparatus 100a may be implemented as an integrated circuit (IC) and may be mounted on a board such as a printed circuit board. The apparatus 100a may be electrically connected to the Hall sensor 300 through the board.

[0052] The bias provider may provide a bias current IB to the Hall sensor 300. For example, the bias provider may be configured to provide a first bias current IT of the first bias provider 160a and a second bias current IS of the second bias provider 170a to the Hall sensor 300.

[0053] The equivalent circuit of the Hall sensor 300 may include a first Hall sensor resistor HR1, a second Hall sensor resistor HR2, a third Hall sensor resistor HR3, and a fourth Hall sensor resistor HR4. The bias current IB may flow through the first Hall sensor resistor HR1 to the fourth Hall sensor resistor HR4. The specific structure of the first Hall sensor resistor HR1 to the fourth Hall sensor resistor HR4 is not limited to the equivalent circuit and may be implemented in various ways.

[0054] The Hall sensor 300 may use the Hall effect to detect magnetic flux passing through the Hall sensor 300. When magnetic flux passes through the Hall sensor 300, the Hall sensor 300 may generate a Hall voltage in a direction perpendicular to the magnetic flux and the bias current IB, and the voltage difference between a first Hall sensor output terminal HP and a second Hall sensor output terminal HN may be used as a value measured with respect to the magnetic flux passing through the Hall sensor 300.

[0055] The resistance values of the first Hall sensor resistor HR1 to the fourth Hall sensor resistor HR4 may vary according to the temperature of the Hall sensor 300. As the resistance values of the first Hall sensor resistor HR1 to the fourth Hall sensor resistor HR4 increase, the voltage difference between the first Hall sensor output terminal HP and the second Hall sensor output terminal HN with respect to a unit magnetic flux passing through the Hall sensor 300 increases.

[0056] That is to say, when the temperature of the Hall sensor 300 changes, the voltage difference between the first Hall sensor output terminal HP and the second Hall sensor output terminal HN with respect to the unit magnetic flux passing through the Hall sensor 300 can change. The voltage difference between the first Hall sensor output terminal HP and the second Hall sensor output terminal HN can be determined by the temperature of the Hall sensor 300 and the magnetic flux passing through the Hall sensor 300.

[0057] Therefore, in terms of extracting the information of the magnetic flux passing through the Hall sensor from the voltage difference between the first Hall sensor output terminal HP and the second Hall sensor output terminal HN, the influence of the changing temperature of the Hall sensor 300 can be understood as part of the information of the magnetic flux passing through the Hall sensor 300. That is to say, it may reduce the accuracy of the extracted magnetic flux information.

[0058] The device 100a can be configured such that according to the changing temperature of the Hall sensor 300, the bias current IB changes in a direction opposite to the acting direction of the voltage difference between the first Hall sensor output terminal HP and the second Hall sensor output terminal HN.

[0059] For example, when the resistance values of the first Hall sensor resistor HR1 to the fourth Hall sensor resistor HR4 increase or decrease with temperature change, based on the assumption that the node between the third Hall sensor resistor HR3 and the fourth Hall sensor resistor HR4 is grounded, the node voltage between the first Hall sensor resistor HR1 and the second Hall sensor resistor HR2 can increase or decrease.

[0060] That is to say, the node voltage VT between the first Hall sensor resistor HR1 and the second Hall sensor resistor HR2 can change with the temperature of the Hall sensor 300 and can depend on the bias current IB.

[0061] The processor 140a can generate a bias current control value CON based on the node voltage VT between the Hall sensor 300 and the first bias provider 160a.

[0062] The bias provider or the first bias provider 160a can be configured such that the bias current IB supplied to the Hall sensor 300 changes based on the bias current control value CON.

[0063] In this regard, the device 100a can significantly reduce the influence of the temperature element among the elements for determining the voltage difference between the first Hall sensor output terminal HP and the second Hall sensor output terminal HN, and improve the accuracy of the magnetic flux information based on the output voltage of the Hall sensor 300.

[0064] In addition, the device 100a may have a structure in which the start and end of the process of reducing the influence of the output voltage of the Hall sensor on the temperature-dependent element utilize a bias current, thereby improving at least one of the efficiency, accuracy, and stability of the process.

[0065] Reference Figure 1A , the device 100a may further include an amplifier 110 configured to amplify the voltage at the output terminal of the Hall sensor 300.

[0066] For example, the amplifier 110 may be implemented as a (non)-inverting amplifier circuit in which an operational amplifier and a plurality of resistive elements (e.g., resistors) are combined, and the amplifier 110 may generate a voltage VLH amplified in proportion to the voltage difference between the first Hall sensor output terminal HP and the second Hall sensor output terminal HN. The amplified voltage VLH may correspond to the voltage difference between the first Hall sensor output terminal HP and the second Hall sensor output terminal HN.

[0067] The gain of the amplifier 110 may be determined according to the relationship of the resistance values of the plurality of resistive elements. In the case where a wide range of detection of the magnetic flux of the Hall sensor 300 is required, it may be advantageous for the amplifier 110 to have a low gain, while in the case where high resolution for detecting the magnetic flux of the Hall sensor 300 is required, it may be advantageous for the amplifier 110 to have a high gain.

[0068] Reference Figure 1A , the device 100a may further include an AD converter 130.

[0069] The AD converter 130 may convert a first analog value VLT corresponding to the node voltage VT between the Hall sensor 300 and the first bias provider 160a into a first digital value DTT, and convert a second analog value corresponding to the voltage difference between the first Hall sensor output terminal HP and the second Hall sensor output terminal HN of the Hall sensor into a second digital value corresponding to the Hall sensor output value DTH. For example, the second analog value may be the voltage VLH.

[0070] The AD converter 130 may have a plurality of AD conversion channels. For example, the first AD conversion channel is a channel to which the first analog value VLT and the first digital value DTT are respectively input and output, and the second AD conversion channel is a channel to which the second analog value and the second digital value are respectively input and output. For example, the AD converter 130 may have a structure in which a plurality of analog-to-digital converter circuits are arranged in parallel with each other, and the plurality of analog-to-digital converter circuits may correspond to the plurality of AD conversion channels.

[0071] Reference Figure 1A, the apparatus 100a may further include a filter 120 configured to filter frequency components having a frequency higher than a cut-off frequency in a node voltage between the Hall sensor and the bias provider. Thus, the apparatus 100a can reduce noise that may affect the stability of the feedback structure of the bias provider or the first bias provider 160a, thereby improving the stability of the change in the bias current IB of the first bias provider 160a.

[0072] For example, the filter 120 may be an RC low-pass filter, in which one of a capacitor and a resistive element (e.g., a resistor) is connected in series, while the other is shunted to ground.

[0073] For example, the processor 140a may include either or both of a temperature compensator 141a and a feedback controller 142. The feedback controller 142 may generate a bias current control value CON based on a first digital value DTT corresponding to a node voltage between the Hall sensor 300 and the first bias provider 160a.

[0074] The temperature compensator 141a of the processor 140a is provided with a Hall sensor output value DTH corresponding to a voltage difference between a first Hall sensor output terminal HP and a second Hall sensor output terminal HN. The temperature compensator 141a may generate a compensated output value TCH by compensating the Hall sensor output value DTH based on the first digital value DTT corresponding to the node voltage between the Hall sensor 300 and the first bias provider 160a. Thus, in terms of extracting information on the magnetic flux passing through the Hall sensor 300 from the voltage difference between the first Hall sensor output terminal HP and the second Hall sensor output terminal HN, the accuracy of the extracted magnetic flux information can be further improved.

[0075] For example, the apparatus 100a may be designed such that the bias current IB has a substantially fixed value without the feedback controller 142.

[0076] Reference Figure 1B , the apparatus 100b for providing a bias current to a Hall sensor according to an exemplary embodiment may have a structure in which the temperature compensator is omitted in the processor 140b.

[0077] In addition, the feedback controller 142 of the processor 140b may be configured to transfer the bias current control value CON to a second bias provider 170a.

[0078] Reference Figure 1B, the apparatus 100b may further include a switch 125 configured to switch on and off an electrical connection between a node between a first Hall sensor resistance HR1 and a second Hall sensor resistance HR2 and a terminal of the AD converter 130 to which a first analog value VLT is input.

[0079] For example, the switch 125 may electrically connect the node of the first Hall sensor resistance HR1 and the second Hall sensor resistance HR2 to the terminal of the AD converter 130 to which the first analog value VLT is input within a predetermined period of time. For example, the switch 125 may include a switching transistor configured to have a control voltage input thereto through a gate terminal, and the switch 125 switches on and off the electrical connection between a source terminal and a drain terminal.

[0080] For example, the processor 140b may determine a change in the voltage VT per unit temperature change based on a difference between the voltage VT when the switch 125 is in a first period and the voltage VT when the switch 125 is in a second period.

[0081] Specifically, for example, the processor 140b may determine a change rate of the voltage VT per unit temperature change based on a trend of a plurality of voltages VT accumulated during a long-term period longer than a predetermined period. The processor 140b may previously input and store the change rate of the voltage VT per unit temperature change. The processor 140b may also calculate resistance values of the first Hall sensor resistance HR1 to the fourth Hall sensor resistance HR4 based on a bias current IB and the voltage VT, and determine a change rate of the voltage VT per unit temperature change based on the calculated resistance values. When the voltage VT changes, the processor 140b may also apply various bias current control values CON to the bias provider or the first bias provider 160a, and determine a change rate of the voltage VT per unit temperature change through a change in the voltage VT.

[0082] For example, the processor 140b may change the bias current control value CON in the second period by changing the bias current control value CON in the first period in proportion to a difference in the voltage VT between when the switch 125 is in the first period and when the switch 125 is in the second period.

[0083] Figure 2A and Figure 2B are circuit diagrams showing bias providers of apparatuses 100c and 100d for providing a bias current to a Hall sensor according to an embodiment.

[0084] Reference Figure 2A , the apparatus 100c for providing a bias current to a Hall sensor includes a bias provider including at least one of, for example, a first bias provider 160b and a second bias provider 170b, and a processor 140a.

[0085] The first bias current IT generated by the first bias provider 160b can vary according to the bias current control value CON, and the correlation between the second bias current IS generated by the second bias provider 170b and the bias current control value CON can be smaller compared to the first bias current IT. The first bias current IT and the second bias current IS can be provided to the Hall sensor 300 together.

[0086] The first bias provider 160b can include a first transistor 163, where the first bias current IT flows between the drain terminal and the source terminal of the first transistor 163. The second bias provider 170b can include a second transistor, where the second bias current IS flows between the drain terminal and the source terminal of the second transistor.

[0087] The second transistor can have a reference voltage from the voltage source 180, the reference voltage is input to the second transistor through the gate terminal, and the second transistor generates the second bias current IS based on the reference voltage. When the voltage provided by the voltage source 180 is substantially fixed, the correlation between the second bias current IS and the bias current control value CON can be smaller compared to the first bias current IT.

[0088] Reference Figure 2A , the first bias provider 160b can include a first resistor R1, a second resistor R2, and an intermediate transistor 162.

[0089] The voltage of the gate terminal of the intermediate transistor 162 can be shared with the voltage of the gate terminal of the first transistor 163. Therefore, the current between the drain terminal and the source terminal of the intermediate transistor 162 can depend on the first bias current IT.

[0090] The first resistor R1 and the second resistor R2 can be electrically connected to each other. The current l1 between the drain terminal and the source terminal of the intermediate transistor 162 can flow through the first resistor R1 and the second resistor R2.

[0091] The second resistor R2 can have a variable resistance value that varies based on the bias current control value CON.

[0092] Assuming that the voltage V2 is almost fixed, as the resistance value of the second resistor R2 increases, the current of the intermediate transistor 162 can decrease. In this regard, the voltage difference between the source terminal and the gate terminal of the intermediate transistor 162 can be very small. The voltage difference between the source terminal and the gate terminal of the first transistor 163 can decrease, and the first bias current IT can decrease. Therefore, the bias current IB provided to the Hall sensor 300 can decrease.

[0093] Reference Figure 2A, the first bias provider 160b may further include an operational amplifier 161 configured to have a voltage VT corresponding to a bias current IB input thereto, output an amplified voltage V1 to an intermediate transistor 162, and receive feedback from a node between a first resistor R1 and a second resistor R2. The higher the gain of the operational amplifier 161, the smaller the difference between the voltage VT and the voltage V2. In the case where the gain of the operational amplifier 161 becomes infinite, the voltage VT and the voltage V2 may be substantially the same.

[0094] Therefore, the correlation between the node voltage V2 between the first resistor R1 and the second resistor R2 and the Hall sensor 300 may be high. The first bias provider 160b may generate a first bias current IT by combining a temperature factor regarding the resistance value of the second resistor R2 at the voltage VT and a temperature factor regarding the Hall sensor 300.

[0095] Reference Figure 2B , the device 100d for providing a bias current to a Hall sensor may include a first bias provider 160b having a fixed resistor with a second resistor R2' and a second bias provider 170b in which the voltage input to a gate terminal varies.

[0096] For example, the processor 140b may provide an analog value of a bias current control value CON to the gate terminal of a second transistor of the second bias provider 170b. The second bias current IS may depend on the bias current control value CON, and the bias current IB provided to the Hall sensor 300 may also depend on the bias current control value CON.

[0097] Figure 3 is a diagram showing a part (feedback controller 142) of a processor of a device for providing a bias current to a Hall sensor according to an example.

[0098] Reference Figure 3 , the feedback controller 142 may control the number of electrical connections of a plurality of switches S1, S2, and S3 based on the bias current control value.

[0099] The second resistor (e.g., Figure 2A the second resistor R2 therein) may include a plurality of second resistors R21, R22, R23, and R24 and may have a resistance value depending on the number of electrical connections of the plurality of switches S1, S2, and S3. Therefore, the resistance of the second resistor R2 may be variable.

[0100] Figure 4 is a diagram showing the change in the voltage difference between a first Hall sensor output terminal and a second Hall sensor output terminal of a Hall sensor with temperature.

[0101] Reference Figure 4 When the temperature TEMP is the first temperature t1 and the second temperature t2, respectively, the voltage VLH corresponding to the voltage difference between the first Hall sensor output terminal and the second Hall sensor output terminal of the Hall sensor can be V1 and V2.

[0102] In this case, the rate of change of the voltage VTA per unit temperature change can depend on Figure 1A the voltage VT shown in

[0103] Formula 1

[0104]

[0105] Figure 5 is a diagram showing a part (temperature compensator 141b) of a processor of a device for providing a bias current to a Hall sensor according to an embodiment.

[0106] Reference Figure 5 The temperature compensator 141b can generate a compensation output value TCH by applying a voltage change rate VTA per unit temperature change as a coefficient of the voltage VLH corresponding to the voltage difference between the first Hall sensor output terminal and the second Hall sensor output terminal.

[0107] Figure 6 is a diagram showing a compensation output value of a device for providing a bias current to a Hall sensor according to an embodiment.

[0108] Reference Figure 6 Before temperature compensation according to the magnetic flux LP of the Hall sensor, the slope of the voltage VLH1 at the first temperature and the slope of the voltage VLH2 at the second temperature can be different.

[0109] Before temperature compensation according to the magnetic flux LP of the Hall sensor, the slope of the compensation output value TCH1 at the first temperature and the slope of the compensation output value TCH2 at the second temperature can be substantially the same.

[0110] Since the change in the slope per unit temperature change of the compensation output value TCH is small, compared with the voltage VLH before temperature compensation, the correlation between the compensation output value TCH and the Hall sensor temperature can be smaller, and the compensation output value TCH can be used to extract more accurate magnetic flux information.

[0111] Figure 7 is a diagram showing a structure according to an embodiment, in which a device 100e for providing a bias current to a Hall sensor is included in a lens module control structure. Figure 8is according to an embodiment Figure 7 is a diagram of the device 100e shown in

[0112] Referring to Figure 7 and Figure 8 , the device 100e for providing a bias current to the Hall sensor can provide a compensation output value TCH to the driver 220, where the driver 220 is electrically connected to the Hall sensor 300 and is configured to control the driving of the lens module 210.

[0113] In an example where the processor 140a does not include the temperature compensator 141a, the device 100e can provide the Hall sensor output value DTH to the driver 220.

[0114] The driver 220 can extract information on the magnetic flux passing through the Hall sensor 300 from the Hall sensor output value DTH or the compensation output value TCH, and generate position information of the lens module 210 based on the magnetic flux information. For example, the driver 220 can be implemented as an IC separately implemented for the device 100e.

[0115] The driver 220 can include an OIS control structure, and can determine the magnitude of the driving current based on the magnetic flux information and output the determined driving current to the driving coil 230.

[0116] The driving coil 230 can generate a magnetic flux based on the driving current, and can be arranged to be close to the magnetic member 211 of the lens module 210. For example, the driving coil 230 and the Hall sensor 300 can be arranged on the first board 240.

[0117] The lens module 210 can respond to the magnetic flux of the driving coil 230 and move according to the force received by the magnetic member 211. In this case, the lens module 210 can move such that the magnetic flux changes in a direction opposite to the direction of change of the magnetic flux passing through the Hall sensor 300. Therefore, the absolute position of the lens module 210 can be substantially fixed, and the image obtained by the lens module 210 can be stable. In some embodiments, the lens module 210 can move under the action of the Lorentz force F.

[0118] The processor 270 can be implemented separately from the processor 140a of the device 100e. The processor 270 can be an image signal processor (ISP). The processor 270 can receive image information from the image sensor 262 on the first support member 261, and provide the processed image information to the driver 220.

[0119] The lens module 210 can be moved one-dimensionally or two-dimensionally according to the rotation of a plurality of guide balls 212 and can be surrounded by a housing 250. The plurality of guide balls 212 can be provided on a second support member 213.

[0120] According to an embodiment disclosed in the present application, a device for providing a bias current to a Hall sensor can reduce the influence of the output voltage of the Hall sensor on a temperature-dependent element without a separate temperature sensor.

[0121] According to an embodiment disclosed in the present application, a device for providing a bias current to a Hall sensor can have a structure in which the start and end of a process of reducing the influence of the output voltage of the Hall sensor on a temperature-dependent element utilize the bias current, and thus at least one of the efficiency, accuracy, and stability of the process can be improved.

[0122] Performing the operations described in the present application Figures 1A to 8The filter 120, the AD converter 130, the processors 140a, 140b and 270, the temperature compensators 141a and 141b, the feedback controller 142, the first bias provider 160a, the second bias provider 170a, and the driver 220 in [the relevant context] are implemented by hardware components configured to perform the operations performed by the hardware components described in this application. In appropriate cases, examples of hardware components that can be used to perform the operations described in this application include controllers, sensors, generators, drivers, memories, comparators, arithmetic logic units, adders, subtracters, multipliers, dividers, integrators, and any other electronic components configured to perform the operations described in this application. In other examples, one or more of the hardware components that perform the operations described in this application are implemented by computing hardware (e.g., by one or more processors or computers). The processor or computer can be implemented by one or more processing elements, such as logic gate arrays, controllers and arithmetic logic units, digital signal processors, microcomputers, programmable logic controllers, field programmable gate arrays, programmable logic arrays, microprocessors, or any other device or combination of devices configured to respond and execute instructions in a prescribed manner to achieve the desired result. In one example, the processor or computer includes (or is connected to) one or more memories that store instructions or software executed by the processor or computer. The hardware components implemented by the processor or computer can execute instructions or software, such as an operating system (OS) and one or more software applications running on the OS, to perform the operations described in this application. The hardware components can also access, manipulate, process, create, and store data in response to the execution of the instructions or software. For simplicity, the singular terms "processor" or "computer" may be used to describe the examples described in this application, but in other examples, multiple processors or computers may be used, or the processor or computer may include multiple processing elements, or multiple types of processing elements, or both. For example, a single hardware component or two or more hardware components can be implemented by a single processor, or two or more processors, or a processor and a controller. One or more hardware components can be implemented by one or more processors, or a processor and a controller, and one or more other hardware components can be implemented by one or more other processors, or another processor and another controller. One or more processors, or a processor and a controller, can implement a single hardware component, or two or more hardware components. The hardware components can have any one or more different processing configurations, examples of which include a single processor, independent processors, parallel processors, single instruction single data (SISD) multiprocessing, single instruction multiple data (SIMD) multiprocessing, multiple instruction single data (MISD) multiprocessing, and multiple instruction multiple data (MIMD) multiprocessing.

[0123] Instructions or software for controlling computing hardware (e.g., one or more processors or computers) to implement the hardware components and perform the methods described above can be written as a computer program, code segment, instruction, or any combination thereof to individually or jointly direct or configure one or more processors or computers to operate as a machine or special-purpose computer to perform the operations performed by the hardware components and the methods described above. In one example, the instructions or software include machine code directly executable by one or more processors or computers, such as machine code generated by a compiler. In another example, the instructions or software include high-level code executable by one or more processors or computers using an interpreter. The instructions or software can be written in any programming language based on the block diagrams and flowcharts shown in the figures and the corresponding descriptions in the specification, which disclose algorithms for performing the operations performed by the hardware components and methods described above.

[0124] Instructions or software for controlling computing hardware (e.g., one or more processors or computers) to implement the hardware components and perform the methods described above, along with any associated data, data files, and data structures, can be recorded, stored, or fixed in or on one or more non-transitory computer-readable storage media. Examples of non-transitory computer-readable storage media include read-only memory (ROM), random access memory (RAM), flash memory, CD-ROM, CD-R, CD+R, CD-RW, CD+RW, DVD-ROM, DVD-R, DVD+R, DVD-RW, DVD+RW, DVD-RAM, BD-ROM, BD-R, BD-R LTH, BD-RE, magnetic tape, floppy disk, magneto-optical data storage device, optical data storage device, hard disk, solid-state disk, and any other device configured to store the instructions or software and any associated data, data files, and data structures in a non-transitory manner and provide the instructions or software and any associated data, data files, and data structures to one or more processors or computers such that the one or more processors or computers can execute the instructions. In one example, the instructions or software and any associated data, data files, and data structures are distributed across a network-connected computer system such that the instructions and software and any associated data, data files, and data structures are stored, accessed, and executed by one or more processors or computers in a distributed manner.

[0125] While the present disclosure includes specific examples, it will be apparent after understanding the disclosure of this application that various changes in form and detail can be made to these examples without departing from the spirit and scope of the claims and their equivalents. The examples described in this application are to be understood in a descriptive sense only and not for purposes of limitation. The description of the features or aspects in each example should be considered applicable to similar features or aspects in other examples. Appropriate results can still be achieved if the described techniques are performed in a different order, and / or if the components in the described systems, architectures, devices, or circuits are combined in a different manner and / or replaced or supplemented by other components or their equivalents. Additionally, the various embodiments can be combined with each other. Accordingly, the scope of the present disclosure is not limited by the specific embodiments, but by the claims and their equivalents, and all variations within the scope of the claims and their equivalents should be understood to be included in the present disclosure.

Claims

1. A device for providing a bias current to a Hall sensor, comprising: A bias provider configured to provide a bias current to the Hall sensor; And A processor configured to generate a bias current control value based on a node voltage between the Hall sensor and the bias provider, Wherein, the bias provider is configured to vary the bias current based on the bias current control value, Wherein, the bias provider includes: A first bias provider configured to generate a variable first bias current based on the bias current control value; and A second bias provider configured to generate a second bias current having a smaller correlation with the bias current control value compared to the first bias current, Wherein, the first bias current and the second bias current are provided to the Hall sensor together, Wherein, the first bias provider includes: A first resistor and a second resistor, the first resistor and the second resistor being electrically connected to each other; and An intermediate transistor configured to output a current depending on the first bias current to the first resistor and the second resistor, and Wherein, the second resistor has a variable resistance value that varies according to the bias current control value.

2. The device according to claim 1, wherein, The processor is further configured to provide a Hall sensor output value to a driver, wherein the Hall sensor output value corresponds to a voltage difference between a first output terminal and a second output terminal of the Hall sensor, and the driver is configured to control the driving of the lens module.

3. The device according to claim 1, further comprising: An AD converter configured to: Convert a first analog value corresponding to the node voltage between the Hall sensor and the bias provider into a first digital value; And Convert a second analog value corresponding to the voltage difference between the first output terminal and the second output terminal of the Hall sensor into a second digital value.

4. The device according to claim 3, further comprising: An amplifier configured to amplify the voltage difference between the first output terminal and the second output terminal of the Hall sensor, Wherein, the second analog value corresponds to the amplified voltage generated by the amplifier.

5. The device according to claim 1, further comprising: An AD converter configured to convert a first analog value corresponding to the node voltage between the Hall sensor and the bias provider into a first digital value; And A switch configured to switch the on and off of the electrical connection between the bias provider and the terminal to which the first analog value is input to the AD converter.

6. The device according to claim 1, further comprising: A filter configured to filter frequency components having a frequency higher than the cut-off frequency in the node voltage between the Hall sensor and the bias provider.

7. The device according to claim 1, wherein, The first bias provider further includes an operational amplifier configured to input a voltage corresponding to the bias current, output the amplified voltage to the intermediate transistor, and receive feedback from the node between the first resistor and the second resistor.

8. The device according to claim 7, wherein, The first bias provider further includes a first transistor configured to input the amplified voltage output by the operational amplifier and generate the first bias current, and Wherein, the second bias provider includes a second transistor configured to be input with a reference voltage from a voltage source and generate the second bias current.

9. The device according to claim 1, wherein, The processor is further configured to receive a Hall sensor output value corresponding to a voltage difference between a first output terminal and a second output terminal of the Hall sensor, and generate a compensated output value by compensating the Hall sensor output value based on a node voltage between the Hall sensor and the bias provider.

10. A device for providing a bias current to a Hall sensor, comprising: A bias provider configured to provide the bias current to the Hall sensor; An AD converter configured to: Convert a first analog value corresponding to a node voltage between the Hall sensor and the bias provider into a first digital value; and Convert a second analog value corresponding to a voltage difference between the first output terminal and the second output terminal of the Hall sensor into a second digital value, and A processor configured to compensate the second digital value based on the first digital value to generate a compensated output value, and configured to generate a bias current control value based on the first digital value, wherein the bias provider includes: A first bias provider configured to generate a variable first bias current based on the bias current control value; and A second bias provider configured to generate a second bias current having a smaller correlation with the bias current control value than the first bias current, wherein the first bias current and the second bias current are provided to the Hall sensor together, wherein the first bias provider includes: A first resistor and a second resistor, the first resistor and the second resistor being electrically connected to each other; and An intermediate transistor configured to output a current depending on the first bias current to the first resistor and the second resistor, and wherein the second resistor has a variable resistance value that varies according to the bias current control value.

11. The apparatus according to claim 10, wherein, The processor is further configured to apply the first digital value as a coefficient of the second digital value to generate the compensated output value.

12. The apparatus according to claim 10, further comprising: A switch configured to switch on and off an electrical connection between the bias provider and a terminal to which the first analog value is input to the AD converter; and A filter configured to filter frequency components having a frequency higher than a cut-off frequency in a node voltage between the Hall sensor and the bias provider.

13. The apparatus according to claim 10, wherein, The processor is further configured to provide the compensated output value to a driver, wherein the driver is configured to control driving of the lens module.

14. A camera module, comprising: A lens module; A Hall sensor configured to measure position information of the lens module; A driver electrically connected to the Hall sensor and configured to control driving of the lens module; A bias provider configured to provide a bias current to the Hall sensor and vary the bias current based on a node voltage between the Hall sensor and the bias provider; and A processor configured to generate a bias current control value based on the node voltage, wherein the bias provider includes: A first bias provider configured to generate a variable first bias current based on the bias current control value; and A second bias provider configured to generate a second bias current having a smaller correlation with the bias current control value than the first bias current, wherein, the first bias current and the second bias current are provided to the Hall sensor together, wherein, the first bias provider includes: a first resistor and a second resistor, the first resistor and the second resistor being electrically connected to each other; and an intermediate transistor configured to output a current depending on the first bias current to the first resistor and the second resistor, and wherein, the second resistor has a variable resistance value, and the variable resistance value changes according to the bias current control value.

15. The camera module according to claim 14, wherein, The processor is further configured to provide a Hall sensor output value corresponding to a voltage difference between a first output terminal and a second output terminal of the Hall sensor to the driver.

16. The camera module according to claim 14, wherein, The processor is further configured to receive a Hall sensor output value corresponding to a voltage difference between a first output terminal and a second output terminal of the Hall sensor, and provide a compensated output value to the driver by compensating the Hall sensor output value based on the node voltage.

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