Millimeter wave integrated test fixture

Abstract

The present invention provides a millimeter wave integrated test fixture, which belongs to the field of radio frequency microwave component technology, and includes a base plate, a test tool, a guide plate, a test line, a test support plate, and an upper pressure cover. The base plate is provided with a test installation position for placing a TR component; the test tool is arranged at the antenna end of the TR component; the guide plate is fixed to the base plate and is located on the side of the test tool away from the TR component, and can press the test tool against the antenna end of the TR component; the first connector of the test line passes through a guide hole and a jack and is plugged into an insulator; the test support plate is fixed to the base plate and is arranged at the radio frequency end of the TR component; the guide plate, the test support plate, and the upper pressure cover position the TR component on the test installation position of the base plate. The millimeter wave integrated test fixture provided by the present invention ensures the reliability and continuity of the coaxial connection between the test line and the insulator of the TR component through the test tool and the guide plate, thereby ensuring good contact between multi-channel insulators at the same time, and improving the accuracy and test efficiency of the insulator test.

Description

Technical Field

[0001] The present invention belongs to the technical field of radio frequency microwave components, and more specifically, relates to a millimeter wave integrated test fixture. Background Art

[0002] With the rapid development of RF devices, the requirements for RF device S-parameter testing technology are becoming increasingly stringent. Vector network analyzers used for testing typically use coaxial test connections, while device input / output ports are typically non-coaxial. To address this, appropriate test fixtures are typically designed. However, the errors introduced by non-coaxial RF test fixtures are significant and cannot be ignored. This error must be considered during calibration, so studying the errors introduced by non-coaxial RF test fixtures is highly valuable.

[0003] To achieve high-integration and miniaturized design, millimeter-wave phased array radars require integrated T / R components and microstrip antennas. This requires that the antenna output of the T / R component be in the form of a non-coaxial insulator. Therefore, how to perform efficient and accurate testing is a problem that needs to be solved urgently. Summary of the Invention

[0004] The purpose of the present invention is to provide a millimeter wave integrated test fixture, aiming to solve the problem of low accuracy in insulator testing.

[0005] To achieve the above-mentioned purpose, the technical solution adopted by the present invention is as follows: a millimeter wave integrated test fixture is provided, comprising: a base plate, a test fixture, a guide plate, a test line, a test support plate, and an upper pressure cover, wherein the base plate is provided with a test installation position for placing a TR component; the test fixture is arranged at the antenna end of the TR component, and the test fixture is provided with a jack coaxial with the insulator of the TR component; the guide plate is fixed to the base plate and is located on the side of the test fixture away from the TR component, and can press the test fixture against the antenna end of the TR component; the guide plate is provided with a guide hole coaxial with the jack; the first connector of the test line passes through the guide hole, and the jack is plugged into the insulator; the test support plate is fixed to the base plate and is arranged at the RF end of the TR component, and the test support plate is provided with a guide hole coaxial with the RF connector of the TR component; the upper pressure cover is pressed on the TR component, and the guide plate, the test support plate and the upper pressure cover position the TR component on the test installation position of the base plate.

[0006] As another embodiment of the present application, baffles are respectively provided on two opposite sides of the base plate, and both ends of the upper pressure cover are fixed to the baffles by bolts.

[0007] As another embodiment of the present application, a limiting sink is provided on the baffle, and both ends of the upper pressure cover are supported on the limiting sink so that the upper end surface of the upper pressure cover is flush with the upper end surface of the baffle.

[0008] As another embodiment of the present application, the inner side of the baffle is provided with a mounting step protruding toward the center of the base plate, the TR assembly is located between the two mounting steps, and both ends of the guide plate are fixed to the end faces of the mounting steps by bolts.

[0009] As another embodiment of the present application, a raised support platform is further provided on the base plate, and the TR assembly and the test fixture are located on the support platform.

[0010] As another embodiment of the present application, the test fixture further includes an adjustment block disposed between the baffle and the TR assembly.

[0011] As another embodiment of the present application, the adjustment block is fixed to the base plate by bolts.

[0012] As another embodiment of the present application, a square hole is provided on the bottom plate directly below the TR assembly, and a lower cover supporting the TR assembly is provided at the square hole.

[0013] As another embodiment of the present application, a mounting platform is provided at the square hole, and the lower cover is fixed to the mounting platform by bolts so that the outer end surface of the lower cover does not protrude from the lower bottom surface of the base plate.

[0014] As another embodiment of the present application, an upper pressing plate and a lower pressing plate are further provided on the bottom plate, and a long slot hole for the test line to pass through is provided between the upper pressing plate and the lower pressing plate.

[0015] The beneficial effect of the millimeter wave integrated test fixture provided by the present invention is that, compared with the prior art, the millimeter wave integrated test fixture of the present invention ensures the reliability and continuity of the coaxial connection between the first connector of the test line and the insulator of the TR assembly through the test tooling and the guide plate, thereby ensuring good contact between the multi-channel insulators at the same time, ensuring that all insulator channels are tested simultaneously, and can improve the accuracy of insulator testing and improve testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0017] Figure 1Schematic diagram of the three-dimensional structure of the millimeter wave integrated test fixture provided by the embodiment of the present invention Figure 1 ;

[0018] Figure 2 Schematic diagram of the three-dimensional structure of the millimeter wave integrated test fixture provided by the embodiment of the present invention Figure 2 ;

[0019] Figure 3 Schematic diagram of the three-dimensional structure of the millimeter wave integrated test fixture provided by the embodiment of the present invention Figure 3 ;

[0020] Figure 4 Schematic diagram of the three-dimensional structure of the RT component tested in the embodiment of the present invention Figure 1 ;

[0021] Figure 5 Schematic diagram of the three-dimensional structure of the RT component tested in the embodiment of the present invention Figure 2 ;

[0022] Figure 6 Schematic diagram of the three-dimensional structure of the base plate provided in an embodiment of the present invention Figure 1 ;

[0023] Figure 7 Schematic diagram of the three-dimensional structure of the base plate provided in an embodiment of the present invention Figure 2 ;

[0024] Figure 8 A schematic diagram of the three-dimensional structure of a guide plate provided in an embodiment of the present invention;

[0025] Figure 9 Schematic diagram of the three-dimensional structure of the test tool provided in the embodiment of the present invention Figure 1 ;

[0026] Figure 10 Schematic diagram of the three-dimensional structure of the test tool provided in the embodiment of the present invention Figure 2 ;

[0027] Figure 11 A schematic diagram of the three-dimensional structure of the upper gland provided in an embodiment of the present invention;

[0028] Figure 12 A schematic diagram of the three-dimensional structure of the lower cover provided in an embodiment of the present invention.

[0029] In the figure: 1. Test line; 2. Upper pressure plate; 3. Guide plate; 31. Guide hole; 4. Test fixture; 41. Jack; 42. First alignment hole; 5. Upper pressure cover; 6. TR assembly; 61. Insulator; 62. RF connector; 63. Second alignment hole; 7. Test support plate; 8. Bottom plate; 81. Baffle; 82. Installation step; 83. Limit sink; 84. Square hole; 85. Installation sink; 9. Adjustment block; 10. Lower pressure plate; 11. Lower cover. DETAILED DESCRIPTION

[0030] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0031] Please also refer to Figures 1 to 5 、 Figures 8 to 11 The millimeter wave integrated test fixture provided by the present invention is now described. The millimeter wave integrated test fixture includes a base plate 8, a test fixture 4, a guide plate 3, a test line 1, a test support plate 7, and an upper pressure cover 5. The base plate 8 is provided with a test installation position for placing the TR component 6; the test fixture 4 is set at the antenna end of the TR component 6, and the test fixture 4 is provided with a jack 41 coaxial with the insulator 61 of the TR component 6; the guide plate 3 is fixed to the base plate 8 and is located on the side of the test fixture 4 away from the TR component 6, which can press the test fixture 4 against the TR component 6. Antenna end; a guide hole 31 coaxial with the jack 41 is provided on the guide plate 3; the first connector of the test line 1 passes through the guide hole 31, the jack 41 and is plugged into the insulator 61; the test support plate 7 is fixed to the base plate 8 and is arranged at the RF end of the TR component 6, and a guide hole coaxial with the RF connector 62 of the TR component 6 is provided on the test support plate 7; the upper pressure cover 5 is pressed on the TR component 6, and the guide plate 3, the test support plate 7 and the upper pressure cover 5 position the TR component 6 on the test installation position of the base plate 8.

[0032] Compared with the prior art, the millimeter wave integrated test fixture provided by the present invention ensures the reliability and continuity of the coaxial connection between the first connector of the test line 1 and the insulator 61 of the TR assembly 6 through the test tooling 4 and the guide plate 3, thereby ensuring good contact between the multi-channel insulators 61 at the same time and ensuring that all the insulator 61 channels are tested at the same time, which can improve the accuracy of the insulator 61 test and improve the test efficiency.

[0033] As an improved implementation of the test fixture, first alignment holes 42 are provided at both ends of the test fixture 4, which are connected to the corresponding second alignment holes 63 on the TR component 6 through pins passing through the first alignment holes 42 to ensure concentricity with the insulator and improve the positioning accuracy of the insulator.

[0034] As an example, the TR assembly 6 provided in this embodiment is a 2-row 16-channel insulator 61. The test fixture 4 and the guide plate 3 are provided to facilitate the reliability of the coaxial connection between the first connector of the test line 1 and the insulator 61. Especially for the situation where the millimeter wave channels are closely spaced, the insulator 61 outputs, and multiple rows of insulators 61 are tested at the same time, the test fixture can achieve equal amplitude and phase output for all channels, realize multi-channel simultaneous testing, and greatly improve the test efficiency and test accuracy.

[0035] In this embodiment, the first connector of test line 1 uses a floating K-type connector. The beryllium copper of the floating K-type connector passes through test fixture 4 and connects to the outer conductor of insulator 61 on TR assembly 6. This ensures the continuity of the RF signal ground and ensures that all 16 cable K-type connectors are simultaneously grounded to TR assembly 6. RF connector 62 is an SSMP series RF connector.

[0036] As a specific embodiment of the millimeter wave integrated test fixture provided by the present invention, please refer to Figures 1 to 3 、 Figure 6 and Figure 7 Baffles 81 are provided on opposite sides of the base plate 8. The ends of the upper gland 5 are bolted to the baffles 81. The TR assembly 6 is restrained on both sides by the baffles 81. The baffles 81 also provide a mounting platform for the upper gland 5, facilitating its tight compression and position control. This precise positioning of the TR assembly 6 ensures a reliable connection between the test lead 1 and the insulator 61.

[0037] As an improved embodiment of the above-mentioned base plate, please refer to Figures 1 to 3 、 Figure 6 The baffle 81 is provided with a limiting sink 83, and both ends of the upper gland 5 are supported on the limiting sink 83 so that the upper end surface of the upper gland 5 is flush with the upper end surface of the baffle 81. The limiting sink 83 provided on the baffle 81 limits the position of the upper gland 5 and also facilitates the upper gland 5 not to protrude from the end surface of the baffle 81 after sinking.

[0038] Based on the above base plate, as a specific embodiment of the base plate, refer to Figure 2 and Figure 6 The inner side of the baffle 81 is provided with a mounting step 82 protruding toward the center of the bottom plate 8. The TR assembly 6 is located between the two mounting steps 82. The two ends of the guide plate 3 are fixed to the end faces of the mounting steps 82 by bolts. The mounting steps 82 provide a platform for the guide plate 3 to be installed.

[0039] As an improved embodiment of the base plate, see Figures 1 to 2 、 Figure 6The bottom plate 8 is also provided with a raised support platform, on which the TR assembly 6 and the test fixture 4 are located. The support platform is provided to increase the placement height of the TR assembly 6, making it easier to arrange the test fixture 4, the guide plate 3 and the test line 1.

[0040] As a variant implementation of the embodiment of the present invention, please refer to Figures 1 to 2 The test fixture also includes adjustment blocks 9 positioned between baffle 81 and TR assembly 6. Because TR assembly 6 has a T-shaped structure, adjustment blocks 9 can be positioned on both sides of TR assembly 6, filling the gap at the T-shaped notch and achieving optimal positioning of TR assembly 6. In this embodiment, adjustment blocks 9 are symmetrically positioned on both sides of TR assembly 6.

[0041] Optionally, see Figures 1 to 2 The adjusting block 9 is fixed to the base plate 8 by bolts.

[0042] Optionally, see Figure 3 、 Figures 6 and 7 、 Figure 12 , a square hole 84 is provided on the bottom plate 8 directly below the TR assembly 6, and a lower cover 11 is provided at the square hole 84 to support the TR assembly 6. By providing the square hole 84 and the lower cover 11, the bottom plate 8 is separated to achieve the effect of heat dissipation.

[0043] As a specific embodiment of the above-mentioned bottom plate, please refer to the bottom plate with square holes. Figure 7 A mounting sink 85 is provided at the square hole 84 , and the lower cover 11 is fixed to the mounting sink 85 by bolts so that the outer end surface of the lower cover 11 does not protrude from the lower bottom surface of the base plate 8 .

[0044] In combination with the bottom plate with square holes, as a specific implementation of the embodiment of the present invention, please refer to Figures 1 to 2 The bottom plate 8 is further provided with an upper pressing plate 2 and a lower pressing plate 10, and a long slot hole for the test line 1 to pass through is provided between the upper pressing plate 2 and the lower pressing plate 10. The test line 1 is supported and limited by the upper pressing plate 2 and the lower pressing plate 10.

[0045] It should be noted that this embodiment provides a millimeter wave dual-polarization TR component, the antenna interface is a WMP insulator, the co-polarization channel spacing is 6.5 mm, the heteropolarization channel spacing is 3.25 mm, and the antenna array surface is a triangular array.

[0046] An example is as follows: It is more difficult to test insulators using WMP insulators. WMP insulators have 16 channels and two rows of insulators, that is, a 16-pin connector. To ensure test accuracy and efficiency, a 16-pin blind-plug semi-escapement test fixture 4 is set for this type of TR component. To ensure that the floating K-head (first connector) of the test line can make good contact with the insulator 61, the floating K-head of the test line 1 needs to extend out of the guide plate 3 and the test fixture 4 and make good contact with the insulator 61 on the TR component 6 at the same time to ensure a good grounding effect.

[0047] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. Millimeter wave integrated test fixture, characterized by: include: A base plate (8), wherein the base plate (8) is provided with a test installation position for placing the TR component (6); A test fixture (4) is provided at the antenna end of the TR component (6), and a jack (41) coaxial with the insulator (61) of the TR component (6) is provided on the test fixture (4); A guide plate (3) is fixed on the bottom plate (8) and is located on a side of the test fixture (4) away from the TR component (6), capable of pressing the test fixture (4) against the antenna end of the TR component (6); a guide hole (31) coaxial with the jack is provided on the guide plate (3); A test line (1), wherein a first connector of the test line (1) passes through the guide hole (31), the plug hole (41) and is plugged into the insulator (61); A test support plate (7) is fixed on the bottom plate (8) and is arranged at the radio frequency end of the TR component (6), and a guide hole coaxial with the radio frequency connector (62) of the TR component (6) is provided on the test support plate (7); and The upper pressure cover (5) is pressed tightly on the TR assembly (6), and the guide plate (3), the test support plate (7) and the upper pressure cover (5) position the TR assembly (6) on the test installation position of the base plate (8); Baffles (81) are respectively provided on opposite sides of the bottom plate (8), and both ends of the upper gland (5) are fixed to the baffles (81) by bolts; A limiting sink (83) is provided on the baffle (81), and both ends of the upper pressure cover (5) are supported on the limiting sink (83) so that the upper end surface of the upper pressure cover (5) is flush with the upper end surface of the baffle (81); The inner side of the baffle (81) is provided with a mounting step (82) protruding toward the center of the base plate (8), the TR assembly (6) is located between the two mounting steps (82), and both ends of the guide plate (3) are fixed to the end faces of the mounting steps (82) by bolts.

2. The millimeter wave integrated test fixture according to claim 1, characterized in that: A raised support platform is also provided on the bottom plate (8), and the TR assembly (6) and the test fixture (4) are located on the support platform.

3. The millimeter wave integrated test fixture according to claim 2, characterized in that: The test fixture further includes an adjustment block (9) disposed between the baffle (81) and the TR assembly (6).

4. The millimeter wave integrated test fixture according to claim 3, characterized in that: The adjusting block (9) is fixed to the base plate (8) by means of bolts.

5. The millimeter wave integrated test fixture according to claim 1, wherein: A square hole (84) is provided on the bottom plate (8) directly below the TR assembly (6), and a lower cover (11) supporting the TR assembly (6) is provided at the square hole (84).

6. The millimeter wave integrated test fixture according to claim 5, characterized in that: A mounting sink (85) is provided at the square hole (84), and the lower cover (11) is fixed to the mounting sink (85) by bolts so that the outer end surface of the lower cover (11) does not protrude from the lower bottom surface of the bottom plate (8).

7. The millimeter wave integrated test fixture according to claim 1, characterized in that: An upper pressing plate (2) and a lower pressing plate (10) are also provided on the bottom plate (8), and a long slot hole through which the test line (1) passes is provided between the upper pressing plate (2) and the lower pressing plate (10).

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