Cbtc automatic self-test method and device
By constructing a low-redundancy test sequence based on an event graph and conducting tests on an event-driven CBTC automated testing platform, the problems of CBTC system testing complexity and resource consumption are solved, and efficient automated testing is achieved.
CN114624525BActive Publication Date: 2026-06-05CRRC IND INST CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CRRC IND INST CO LTD
- Filing Date
- 2021-12-13
- Publication Date
- 2026-06-05
AI Technical Summary
Technical Problem
The testing process of existing CBTC systems is complex and difficult to refactor, which makes it difficult to analyze test results and consumes a lot of human and material resources.
Method used
By constructing test sequences based on event graphs, generating low-redundancy test sequences using event tree optimization algorithms, and conducting tests on the CBTC automated testing platform based on the event-driven model, automated testing is achieved.
Benefits of technology
It improves the automation and efficiency of CBTC system testing, reduces test redundancy, simplifies the testing process, and reduces the consumption of human and material resources.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN114624525B_ABST
Abstract
The application provides a CBTC automatic self-test method and device, the method comprising: obtaining a first test sequence based on an event graph, wherein the first test sequence comprises a correct complete event sequence and a fault complete event sequence; optimizing the first test sequence based on an event tree optimized test sequence optimization algorithm to obtain a second test sequence with lower redundancy; and testing the second test sequence based on a CBTC automatic test platform of an event-driven model to obtain a test result.
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