An automated test system for digital array multi-channel acquisition and excitation modules

Abstract

The present invention discloses an automated testing system for a digital array multi-channel acquisition and excitation module, comprising an acquisition and reception test section, an emission excitation test section and a clock unit; the acquisition and reception test section comprises a data acquisition unit and a data transmission and processing unit, the clock unit output end is connected to the data acquisition unit input end, and the data acquisition unit output end is connected to the data transmission and processing unit; the emission excitation test section comprises a baseband data unit and a data modulation unit, and the data modulation unit input end is respectively connected to the clock unit output end and the baseband data unit output end. The present invention solves the problem of automated testing of the functional performance of a large-scale channel digital array acquisition and excitation module, can significantly improve the test efficiency, and ensure the consistency and accuracy of the test results.

Description

Technical Field

[0001] The present invention relates to the fields of radar, reactance, measurement and control, communication, and in particular to automated testing of digital array multi-channel acquisition and excitation modules, and is used for large-scale batch testing of digital array multi-channel acquisition and excitation modules. Background Art

[0002] Digital arrays based on digital beamforming (DBF) have flexible and changeable beam control functions. Compared with traditional analog phased arrays, digital arrays have obvious advantages in multi-target tracking, anti-interference ability, instantaneous dynamics, clutter suppression, etc., and their application prospects are broad.

[0003] The T / R component is one of the key cores of the phased array and is used to realize the transmission and reception beam synthesis. The T / R component in the traditional analog phased array uses a microwave digital phase shifter to realize the channel phase shifting function, and uses a microwave digitally controlled attenuator to realize the channel amplitude weighting function. Limited by the control bit width accuracy of the digital phase shifter and the digitally controlled attenuator, the beam control step and accuracy of the analog phased array are limited, and a smaller beam jump cannot be achieved, which affects the performance of the phased array system. Unlike the analog phased array that uses analog T / R components for beam control, the digital array based on DBF technology uses digital T / R components for beam control. The phase control and amplitude compensation between channels are completed in discrete digital signals, which can achieve high-precision phase control and amplitude compensation, overcoming the problem of limited beam control accuracy of analog T / R components.

[0004] According to the function, the digital T / R component can be divided into the RF channel module, the sampling excitation module and the beamforming module. Among them, the RF channel module mainly completes the filtering, amplification, up / down conversion, and transceiver conversion of the RF signal; the sampling excitation module mainly completes the multi-channel synchronous sampling of the downlink intermediate frequency analog signal, and converts the uplink digital baseband signal into an analog intermediate frequency signal; the beamforming module mainly completes the downlink receive beamforming and the uplink transmit beamforming in the digital domain, which is usually completed by FPGA. The acquisition excitation module is the core component of the digital T / R component, and its functional performance indicators directly affect the use efficiency of the digital T / R component and even the digital array. In order to ensure the factory quality of the acquisition excitation module, its functional performance indicators must be factory tested, and the consistency of the test process and test results must be guaranteed. For a large-scale channel digital array, there may be as many as thousands of acquisition excitation modules. The manual detection method cannot guarantee the consistency and accuracy of the test results, and the manual detection method is inefficient and prone to detection errors. Summary of the invention

[0005] The purpose of the present invention is to overcome the shortcomings of the prior art and provide a digital array multi-channel acquisition and excitation module automated testing system, which can efficiently and accurately test the functional performance indicators of the acquisition and excitation module, such as the working bandwidth, input saturation power, output power, channel-band amplitude consistency, channel-to-channel amplitude difference stability, channel-to-channel phase difference stability, and spurious-free dynamic range (SFDR).

[0006] The objective of the present invention is achieved through the following technical solutions:

[0007] A digital array multi-channel acquisition and excitation module automated test system, characterized in that it includes an acquisition and reception test part, a transmission excitation test part and a clock unit; the acquisition and reception test part includes a data acquisition unit and a data transmission and processing unit, the clock unit output end is connected to the data acquisition unit input end, and the data acquisition unit output end is connected to the data transmission and processing unit; the transmission excitation test part includes a baseband data unit and a data modulation unit, and the clock unit output end and the baseband data unit output end are respectively connected to the data modulation unit input end.

[0008] Further, the clock unit is used to complete the clock distribution of 240MHz and 960MHz;

[0009] The clock unit includes an 8-power divider, a 4-power divider, a 240MHz signal source 1 and a 960MHz signal source 2;

[0010] The output end of the 240MHz signal source 1 is connected to the input end of the 8-power divider, and the output end of the 8-power divider is connected to the data acquisition unit and the data modulation unit respectively;

[0011] The output end of the 960MHz signal source 2 is connected to the input end of the 4 power dividers, and the output ends of the 4 power dividers are respectively connected to the data acquisition unit and the data modulation unit.

[0012] Further, the data acquisition unit includes a signal source 3, a filter, a two-power divider, a 16-power divider and a test fixture connected in sequence;

[0013] One channel of data is generated by the signal source 3. After passing through the filter, the data enters the two-way power divider and the 16-way power divider in turn, generating multiple channels of signals that enter the data acquisition input channel of the test fixture respectively, and then the test fixture collects the data.

[0014] Further, the data transmission and processing unit includes a secondary DBF board and a PC host computer, the input end of the secondary DBF board is connected to the data acquisition unit, and the output end of the secondary DBF board is connected to the PC host computer;

[0015] The data collected by the test fixture is transmitted to the secondary DBF board for storage, and the secondary DBF board uploads the data to the PC host computer, which then processes the data.

[0016] Further, the baseband data unit includes a secondary DBF board and a PC host computer, the input end of the secondary DBF board is connected to the PC host computer, and the output end of the secondary DBF board is connected to the data modulation unit;

[0017] The secondary DBF board generates baseband data and sends it to the reference board and the board under test through optical fiber.

[0018] Further, the data modulation unit includes a test fixture, a switch matrix and a vector network ZNL; the test fixture input end is connected to the baseband data unit, the test fixture output end is connected to the switch matrix input end; the switch matrix output end is connected to the vector network ZNL;

[0019] The data modulation unit modulates the received baseband data through the test fixture to generate multi-channel frequency point signals that meet the system output requirements, and then connects the output signals to the lost network ZNL through the switch matrix to test each signal separately.

[0020] Furthermore, the switch matrix includes a first-level 4-to-1 switch, a second-level 4-to-1 switch and a third-level 2-to-1 switch. The first-level 4-to-1 switch switches the multi-channel signals modulated by the DAC in sequence to output 8-channel signals, the second-level 4-to-1 switch switches the signals of the first level in sequence to output 2-channel signals, and the third-level 2-to-1 switch switches the two-channel signals output by the second level again, so that the output signal of the reference board can be input into the INPUT2 channel of the lost network ZNL, so as to achieve some performance indicators of the output signal of the test reference board.

[0021] Furthermore, the test fixture includes a reference plate and a plate to be tested.

[0022] Furthermore, the PC host computer runs fully automatic testing software.

[0023] A digital array multi-channel acquisition and excitation module automatic test system also includes a 120M signal source 4, and the output end of the 120M signal source 4 is connected to the input end of the secondary DBF board.

[0024] Beneficial effects of the present invention:

[0025] The present invention solves the problem of automated testing of the functional performance of a large-scale channel digital array acquisition excitation module, can significantly improve the testing efficiency, and ensure the consistency and accuracy of the testing results.

[0026] 1) The present invention can realize full coverage automatic testing of the functional performance of the digital array acquisition excitation module;

[0027] 2) The present invention can automatically complete channel switching and achieve full coverage of the channels of the module to be tested;

[0028] 3) The present invention can automatically implement statistical analysis of test data and automatically determine whether the module under test has passed the inspection test according to the set determination rules. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying creative work.

[0030] Figure 1 It is a system composition block diagram of the present invention;

[0031] Figure 2 It is a functional principle block diagram of the present invention;

[0032] Figure 3 It is a collection and reception test block diagram of the present invention;

[0033] Figure 4 It is a transmission excitation test block diagram of the present invention;

[0034] Figure 5 It is a principle block diagram of the switch matrix of the present invention. DETAILED DESCRIPTION

[0035] It should be understood that the specific embodiments described herein are only used to explain the present invention, and are not used to limit the present invention.

[0036] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the ability of ordinary technicians in this field to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0037] The present invention provides an automated testing system for a digital array multi-channel acquisition and excitation module, which can efficiently and accurately test functional performance indicators of the acquisition and excitation module, such as working bandwidth, input saturation power, output power, channel-band amplitude consistency, inter-channel amplitude difference stability, inter-channel phase difference stability, and spurious free dynamic range (SFDR).

[0038] like Figure 1-2 As shown, according to the type of test indicators, the automatic test system of the present invention can be divided into receiving acquisition test and transmitting excitation test.

[0039] For the acquisition and reception test part, it mainly consists of the following: clock unit, data acquisition unit, data transmission and processing unit, such as Figure 3 shown.

[0040] Clock unit: including 8 power dividers, 4 power dividers, 240MHz signal source 1 and 960MHz signal source 2, mainly completing 240MHz and 960MHz clock distribution;

[0041] Data acquisition unit: including a signal source 3, a filter, 2 power dividers and 2 16-power dividers connected in sequence, and also including a reference board and a board to be tested; a 345±65MHZ data is generated through the signal source SMB-100B, which enters the 2 16-power dividers after passing through the filter, and generates 2x16 signals which enter the data acquisition input channels of the reference board and the board to be tested respectively, and then the reference board and the board to be tested respectively collect the data;

[0042] Data transmission and processing unit: includes secondary DBF board and PC host computer. Through optical fiber, the data collected by the reference board and the board to be tested are transmitted to the secondary DBF board for storage. The secondary DBF board uploads the data to the PC host computer through the Ethernet port, and the PC host computer then processes the data.

[0043] For the transmission stimulus test part, it is mainly composed of the following: baseband data unit, data modulation unit and clock unit, such as Figure 4 shown.

[0044] Clock unit: including 8 power dividers, 4 power dividers, 240MHz signal source 1 and 960MHz signal source 2, mainly completing 240MHz and 960MHz clock distribution;

[0045] Baseband data unit: includes secondary DBF board and PC host computer. The secondary DBF board generates baseband data and sends it to the reference board and the board to be tested through optical fiber.

[0046] Data modulation unit: includes reference board, test board, switch matrix and vector network ZNL. The received baseband data is modulated through the reference board and the test board to generate multi-channel frequency point signals that meet the system output requirements. Then, the output signals are connected to the vector network ZNL through the switch matrix, and each signal is tested separately.

[0047] Aiming at the problem that the vector network can only test two transmission excitation channels at a time, a switch matrix is ​​designed to connect different transmission excitation channels to the vector network by switching the switch routing, so as to achieve full coverage of all transmission excitation channels to be tested. Figure 5 As shown, it consists of several 4-to-1 and 2-to-1 switches, among which:

[0048] 1) The first-stage 4-to-1 switch switches the multi-channel signals modulated by DAC (16 channels for the reference board and 16 channels for the board under test) into 8-channel signals (4 channels for the reference board and 4 channels for the board under test) in sequence;

[0049] 2) The second-stage 4-to-1 switch switches the first-stage signal in sequence to output 2 signals (1 for the reference board and 1 for the board to be tested);

[0050] 3) The third-level 2-to-1 switch switches the two signals output by the second level again, so that the output signal of the reference board can be input into the INPUT2 channel of the lost network ZNL, so as to achieve some performance indicators of the output signal of the test reference board.

[0051] The data flow of the digital array multi-channel acquisition and excitation module automated test system includes uplink data processing (reference board, board to be tested via secondary DBF board to computer) and downlink data processing (computer data via secondary DBF board to reference board, board to be tested). Among them, uplink data processing mainly completes the upload of AD data and status information; downlink data processing mainly completes the control of DDS and the downlink of control information of matrix switch.

[0052] The function of the host computer human-computer interaction software is to test the functional performance of the multi-channel acquisition excitation module and judge the test results, including the following functions:

[0053] 1) Voltage detection, detecting the power supply voltage status of each point of the multi-channel acquisition excitation module;

[0054] 2) Link building detection, read the link building status of the FPGA system through the network port;

[0055] 3) Substrate testing, testing the functional performance indicators of the substrate;

[0056] 4) Multi-channel acquisition excitation module test, to detect the functional performance indicators of the multi-channel acquisition excitation module;

[0057] 5) Generate a report and save the test results to EXCEL.

[0058] The present invention solves the problem of automated testing of the functional performance of a large-scale channel digital array acquisition excitation module, can significantly improve the test efficiency, and ensure the consistency and accuracy of the test results. The present invention can achieve full coverage automatic testing of the functional performance of the digital array acquisition excitation module; can automatically complete channel switching to achieve full coverage of the channels of the module to be tested; can automatically perform statistical analysis of the test data, and automatically determine whether the module to be tested has passed the inspection test according to the set judgment rules.

[0059] The above is only a preferred embodiment of the present invention. It should be understood that the present invention is not limited to the form disclosed herein, and should not be regarded as excluding other embodiments, but can be used in various other combinations, modifications and environments, and can be modified within the scope of the concept described herein through the above teachings or the technology or knowledge of the relevant field. The changes and modifications made by those skilled in the art shall not deviate from the spirit and scope of the present invention, and shall be within the scope of protection of the claims attached to the present invention.

Claims

1. A digital array multi-channel acquisition and excitation module automated testing system, characterized in that: It includes an acquisition and reception test part, a transmission excitation test part and a clock unit; the acquisition and reception test part includes a data acquisition unit and a data transmission and processing unit, the output end of the clock unit is connected to the input end of the data acquisition unit, and the output end of the data acquisition unit is connected to the data transmission and processing unit; the transmission excitation test part includes a baseband data unit and a data modulation unit, and the output end of the clock unit and the output end of the baseband data unit are respectively connected to the input end of the data modulation unit; The data modulation unit includes a test fixture, a switch matrix and a vector network ZNL; the test fixture input end is connected to the baseband data unit, and the test fixture output end is connected to the switch matrix input end; The output end of the switch matrix is ​​connected to the vector network ZNL; The data modulation unit modulates the received baseband data through the test fixture to generate a multi-channel frequency signal that meets the system requirements, and then connects the output signal to the vector network ZNL through the switch matrix to test each signal separately; The switch matrix includes a first-level 4-to-1 switch, a second-level 4-to-1 switch and a third-level 2-to-1 switch. The first-level 4-to-1 switch switches the multi-channel signals modulated by the DAC in sequence to output 8-channel signals, the second-level 4-to-1 switch switches the first-level signals in sequence to output 2-channel signals, and the third-level 2-to-1 switch switches the two-channel signals output by the second level again, so that the output signal of the reference board can be input into the INPUT2 channel of the vector network ZNL, so as to achieve some performance indicators of the output signal of the test reference board.

2. The digital array multi-channel acquisition and excitation module automated testing system according to claim 1, characterized in that: The clock unit is used to complete the clock distribution of 240MHz and 960MHz; The clock unit includes an 8-power divider, a 4-power divider, a 240MHz first signal source and a 960MHz second signal source; The output end of the first 240MHz signal source is connected to the input end of the 8-power divider, and the output end of the 8-power divider is connected to the data acquisition unit and the data modulation unit respectively; The output end of the 960MHz second signal source is connected to the input end of the 4-power divider, and the output end of the 4-power divider is connected to the data acquisition unit and the data modulation unit respectively.

3. The digital array multi-channel acquisition and excitation module automatic test system according to claim 1 is characterized in that: The data acquisition unit includes a third signal source, a filter, a two-power divider, a 16-power divider and a test fixture connected in sequence; One channel of data is generated by the third signal source. After passing through the filter, the data enters the two-way power divider and the 16-way power divider in turn, generating multiple channels of signals that enter the data acquisition input channel of the test fixture respectively, and then the test fixture collects the data.

4. The digital array multi-channel acquisition and excitation module automated testing system according to claim 1, characterized in that: The data transmission and processing unit includes a secondary DBF board and a PC host computer, the input end of the secondary DBF board is connected to the data acquisition unit, and the output end of the secondary DBF board is connected to the PC host computer; The data collected by the test fixture is transmitted to the secondary DBF board for storage, and the secondary DBF board uploads the data to the PC host computer, which then processes the data.

5. The digital array multi-channel acquisition and excitation module automated testing system according to claim 1, characterized in that: The baseband data unit comprises a secondary DBF board and a PC host computer, the input end of the secondary DBF board is connected to the PC host computer, and the output end of the secondary DBF board is connected to the data modulation unit.

6. A digital array multi-channel acquisition and excitation module automated testing system according to claim 1 or 3, characterized in that: The test fixture comprises a reference plate and a plate to be tested.

7. A digital array multi-channel acquisition and excitation module automated testing system according to claim 4 or 5, characterized in that: The PC host runs the fully automatic test software.

8. The digital array multi-channel acquisition and excitation module automated testing system according to claim 1, characterized in that: It also includes a 120M fourth signal source, and the output end of the 120M fourth signal source is connected to the input end of the secondary DBF board.

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