A test pin resource allocation method and system based on odd-even allocation

Abstract

The present invention provides a method for allocating test pin resources based on odd-even allocation, comprising: obtaining a pin connection group to be allocated of a test circuit; the pin connection group includes at least one pair of external pins, and the pair of external pins includes an odd external pin and an even external pin; determining an internal pin from the corresponding internal pin set for each external pin during allocation; obtaining several pin allocation modes of the test circuit; respectively calculating the number of resources of the pin allocation modes; and determining the pin allocation mode with the smallest number of resources as the pin allocation mode of the test circuit. By calculating the number of resources by defining the odd-even of the pins, and determining the pin allocation mode by the number of resources, the accuracy is high and the operation of the program can be accelerated to improve the work efficiency. The present invention also provides a test pin resource allocation system, which has corresponding advantages due to the execution of the test pin resource allocation method of the present invention.

Description

Technical Field

[0001] The invention belongs to the technical field of semiconductor design and production, and in particular relates to a test pin resource allocation method based on odd-even allocation and a corresponding test pin resource allocation system. Background Art

[0002] In chip circuit testing, the commonly used methods are two-terminal test method and four-terminal test method. For example, the two-terminal test is to conduct the two pins of the test circuit and test to obtain relevant results. In actual operation, in order to facilitate testing, it is generally necessary to connect a group of pins determined by the two-terminal test to the test pins adjacent to the external logical address. It can be seen that how to scientifically and effectively allocate pins for each test circuit so that it occupies the least number of external test pins and improves the utilization rate of the logic address pins is a very critical issue.

[0003] At the same time, with the increasing complexity of pin allocation scenarios, and in order to meet the time requirements of application scenarios for pin resource allocation and the accuracy requirements of pin allocation algorithms, there is a practical and urgent need to study an efficient and accurate pin resource allocation method. Summary of the invention

[0004] The present invention is to solve all or part of the problems of the above-mentioned prior art. On one hand, the present invention provides a test pin resource allocation method based on odd-even allocation, which is suitable for selecting the least external pins in an actual circuit to achieve the connectivity of the test circuit. Another aspect of the present invention provides a test pin resource allocation system for executing the test pin resource allocation method based on odd-even allocation of the present invention to automatically allocate pins.

[0005] The present invention provides a method for allocating test pin resources based on odd-even allocation, comprising: step S1. obtaining a pin connection group to be allocated of a test circuit; (each) the pin connection group comprises at least one pair of external pins, a pair of the external pins comprises an odd external pin and an even external pin; (each) the external pin corresponds to an internal pin set, and the internal pin set corresponding to the odd external pin is defined as a first set, the first set includes odd internal pins, and the internal pin set corresponding to the even external pin is defined as a second set, the second set includes even internal pins; step S2. pin allocation, comprising: when allocating, Each external pin of the pin connection group to be assigned determines an internal pin from its corresponding internal pin set; after completing the assignment of all the pin connection groups to be assigned, the pin assignment method of the test circuit is obtained; according to the different pin assignments in the pin connection group, several pin assignment methods of the test circuit are obtained; step S3. The number of resources of the pin assignment methods are calculated respectively, and the number of external pin resources occupied by a type of internal pins (even internal pins or odd internal pins) in the pin assignment method is used as the number of resources of the pin assignment method; the pin assignment method with the smallest number of resources is determined as the pin assignment method of the test circuit.

[0006] Because some external pins can be shared, different pin allocation methods will occupy different external pin resources. By calculating the number of resources of the pin allocation methods respectively, the number of resources is used to quantify the pin resources occupied by different pin allocation methods, and the one with the smallest number of resources among all the pin allocation methods is used as the actual pin allocation method of the test circuit, so that the pin allocation method that occupies the least pin resources can be found. By defining the number of resources by odd and even definitions of the internal pins corresponding to the external pins, it is conducive to quickly and accurately calculating the allocation method with the smallest number of resources, and scientifically and effectively allocating pins to each test circuit, which is suitable for pin allocation scenarios with high complexity. The pin allocation is efficient and is conducive to further meeting the time requirements of the application scenario for pin resource allocation. It should be noted that the present invention does not limit the execution order of step S2 and step S3: each time a pin allocation method is obtained, its resource number can be calculated in real time and the pin allocation method with the smallest number of resources can be updated; it is also possible to obtain all pin allocation methods first, and then calculate the resource number of each pin allocation method separately, and finally determine the pin allocation method with the smallest number of resources.

[0007] In general, the pin connection groups to be allocated obtained in step S1 are all the pin connection groups to be allocated of the test circuit.

[0008] In the step S3, the number of external pin resources occupied by a type of internal pins with a smaller number in the pin allocation method is used as the number of resources of the pin allocation method.

[0009] The internal pin refers to an internal pin of a test circuit, and the external pin refers to an external test pin. The internal pin is allocated to the external pin for connection to connect the test circuit.

[0010] The method for defining the type of the external pins is as follows: the external pins are sorted in sequence according to the logical addresses and assigned natural number serial numbers, the external pins with odd serial numbers are defined as odd external pins, and the external pins with even serial numbers are defined as even external pins.

[0011] The step S12 is further included between step S1 and step S2: traversing all the pin connection groups to be assigned obtained in step S1 to determine whether there are conflicting internal pins that exist in both the first set and the second set; if so, eliminating the conflicting internal pins. Using ordinary traversal to eliminate possible conflicting internal pins not only occupies less computing resources, but also can better meet the accuracy requirements of the pin assignment algorithm in specific application scenarios.

[0012] In the step S12, the method for eliminating the conflicting internal pins includes: if there are other internal pins in both the first set and the second set of the conflicting internal pins, the conflicting internal pins in the first set and the second set are directly deleted; if there are only the conflicting internal pins in one of the internal pin sets in the first set and the second set of the conflicting internal pins, only the conflicting internal pins in the other internal pin set are deleted; if there is only one internal pin, namely the conflicting internal pin, in both the first set and the second set of the conflicting internal pins, an error is reported.

[0013] In some embodiments, the pin connection group includes a pair of external pins, namely an odd-numbered external pin and an even-numbered external pin (eg, PinI1 and PinI2, or PinV1 and PinV2), which are used to connect the test circuit for two-terminal testing.

[0014] In some embodiments, the pin connection group includes two pairs of external pins (eg, PinI1, PinI2, and PinV1, PinV2) for connecting a test circuit to perform a four-terminal test.

[0015] In step S3, the step of calculating the number of resources of the pin allocation method includes: step 1. Compare the number of the even-numbered internal pins used in the pin allocation method with the number of the odd-numbered internal pins, and record the number of the smaller type of internal pins as n, set the type of internal pins as Pi, i∈[1,n], set the number of resources as resource, initialize resource=0, initialize i=1; step 2. Update resource according to the connection relationship of the internal pin Pi: if Pi is only connected to one internal pin of another type, then resource=resource +1; if Pi is connected to m internal pins of another type, then resource = 2×(m-1); Step three. Determine whether i is equal to n: if i < n, set i = i+1, and execute to step two; if i = n, set resource = resource+n-1, and continue with subsequent steps; wherein m is a natural number greater than 1; Step four. Count the number of another type of internal pins reused in the pin allocation method and record it as k, set resource = resource-k, and use the value of resource as the number of resources of the pin allocation method.

[0016] By looping through the loop, the number of resources can be calculated effectively and the calculation time is short.

[0017] Another aspect of the present invention provides a test pin resource allocation system based on parity allocation, including a storage device, wherein the storage device stores a plurality of instructions suitable for being loaded and executed by a processor: the above-mentioned test pin resource allocation method based on parity allocation.

[0018] Compared with the prior art, the main beneficial effects of the present invention are:

[0019] 1. A test pin resource allocation method based on parity allocation of the present invention uses the definition of parity of pins to calculate the number of resources of the pin allocation method, which can perform scientific and effective pin allocation for each test circuit, and can quickly and accurately calculate the external pin resources required by the test circuit under fixed rules, so as to select the pin allocation method with the minimum number of resources for the connection of the actual test circuit. Reduce the waste of resources in automated testing; the steps are simple, and no complex depth search or breadth search is required, and ordinary loop traversal is sufficient, which can reduce space complexity and reduce the consumption of computer memory; at the same time, the variables recorded and utilized are also very few, and no excessive processing is required, which can reduce time complexity and speed up the operation of the program, providing a feasible solution for further improving work efficiency.

[0020] 2. A test pin resource allocation system of the present invention can automatically execute the test pin resource allocation method based on odd-even allocation of the present invention and has corresponding advantages. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 Schematic diagram of a test pin resource allocation method according to Embodiment 1 of the present invention.

[0022] Figure 2 The figure is a flow chart of calculating the number of resources of the pin allocation method according to the first embodiment of the present invention. DETAILED DESCRIPTION

[0023] The technical solutions in the specific embodiments of the present invention are described clearly and completely below. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0024] In the following embodiments, operations of the embodiments are described in specific sequences. The description of these sequences is for better understanding of the details in the embodiments and for a comprehensive understanding of the present invention, but it is not intended to limit the scope of the present invention.

[0025] Embodiment 1

[0026] In the first embodiment of the present invention, a test pin resource allocation system based on parity allocation is provided, including a storage device, in which a plurality of instructions are stored, and the instructions are suitable for being loaded and executed by a processor: the test pin resource allocation method based on parity allocation of this embodiment. Figure 1 As shown, the test pin resource allocation method based on odd-even allocation includes:

[0027] Step S1. Obtain the pin connection group to be assigned of the test circuit; each pin connection group includes at least one pair of external pins, and a pair of external pins includes an odd external pin and an even external pin; each external pin corresponds to an internal pin set, and the internal pin set corresponding to the odd external pin is defined as the first set, and the first set contains odd internal pins, and the internal pin set corresponding to the even external pin is the second set, and the second set contains even internal pins.

[0028] Step S2. Pin allocation, including: when allocating, for each external pin of the pin connection group to be allocated, an internal pin is determined from the corresponding internal pin set; after completing the allocation of all the pin connection groups to be allocated, the pin allocation method of the test circuit is obtained. According to the different pin allocations in the pin connection groups, several pin allocation methods of the test circuit are obtained. In this embodiment, in step S2, after completing the allocation of all the pin connection groups to be allocated in one allocation method, a pin allocation method of the test circuit is obtained. Generally speaking, in the first allocation method obtained, a certain external pin is allocated to a certain pin in its corresponding internal pin set, and in the second allocation method, another pin is selected, so according to different pin allocations, several pin allocation methods are obtained.

[0029] Step S3. Calculate the number of resources of the pin allocation method respectively, and use the number of external pin resources occupied by a type of internal pins (even internal pins or odd internal pins) in the pin allocation method as the number of resources of the pin allocation method; determine the pin allocation method with the smallest number of resources as the pin allocation method of the test circuit.

[0030] In this embodiment, the pin connection group obtained in step S1 is the entire pin connection group to be allocated of the test circuit. The example internal pins refer to the internal pins of the test circuit, and the example external pins refer to the external test pins. The internal pins are allocated to the external pins for connection to connect the test circuit.

[0031] In this embodiment, in step S3, the number of external pin resources occupied by a type of internal pins with a smaller number in the pin allocation method is used as the number of resources of the pin allocation method.

[0032] In this embodiment, the method of defining the type of external pins is as follows: the external pins are sorted in sequence according to the logical addresses and assigned natural number serial numbers, the external pins with odd serial numbers are defined as odd external pins, and the external pins with even serial numbers are defined as even external pins.

[0033] In this embodiment, the pins are first defined to be odd or even, and then all the pin allocation methods are traversed. Then, in step S3, the number of resources of each pin allocation method is calculated, and the pin allocation method with the smallest number of resources among all the pin allocation methods is used as the actual pin allocation method of the test circuit. This process, i.e., the process of determining which pin allocation method the test circuit adopts, finds the allocation method that occupies the least external pin resources. Both the calculation efficiency and accuracy are optimized. In some embodiments, each time a pin allocation method is obtained, its number of resources is calculated in real time and the pin allocation method with the smallest number of resources is updated. The actual operation order of step S2 and step S3 is not limited here.

[0034] In a specific practice of the example of this embodiment, step S12 is also included between step S1 and step S2: traverse all the pin connection groups to be assigned obtained in step S1 to determine whether there are conflicting internal pins that exist in both the first set and the second set; if so, eliminate the conflicting internal pins. In the example step S12, the method of eliminating the conflicting internal pins includes: if there are other internal pins in both the first set and the second set of conflicting internal pins, directly delete the conflicting internal pins in the first set and the second set; if there are only conflicting internal pins in one of the first set and the second set of conflicting internal pins, only delete the conflicting internal pins in the other set of internal pins; if there is only one internal pin, namely the conflicting internal pin, in both the first set and the second set of conflicting internal pins, an error is reported.

[0035] In step S3 of the example, the specific process of calculating the number of resources in the pin allocation method is as follows: Figure 2 As shown, it includes: step 1. Compare the number of even-numbered internal pins and the number of odd-numbered internal pins used in the pin allocation method, and record the number of a type of internal pins with a smaller number as n, set the type of internal pins as Pi, i∈[1,n], set the number of resources as resource, initialize resource=0, and initialize i=1; step 2. Update resource according to the connection relationship of the internal pin Pi: if Pi is only connected to one internal pin of another type, then resource=resource+1; if Pi is connected to m internal pins of another type, then resource=2×(m-1); step 3. Determine whether i is equal to n: if i<n, then set i=i+1, and execute to step 2; if i=n, then set resource=resource+n-1, and continue with subsequent steps; step 4. Count the number of another type of internal pins reused in the pin allocation method and record it as k, set resource=resource-k, and use the value of resource as the number of resources of the pin allocation method.

[0036] Embodiment 2

[0037] A specific method of allocating test pin resources is described through Example 2, which can enable professionals in the field to understand the present invention more comprehensively, but does not limit the present invention in any way.

[0038] The definition of the pin connection group (hereinafter referred to as pc) example is as follows:

[0039] The test circuit performs a two-terminal test, and the pin connection group includes a pair of external pins, namely an odd external pin and an even external pin, for two-terminal testing. 2pin connection, the corresponding external pin is PinI*, PinI* represents the serial number of the external pin, as shown in Table 1. Among them, the value of * can only be 1 or 2, 1 and 2 represent odd external pins and even external pins respectively. The internal pins pin1, pin2, ... (oddpins) corresponding to (connected to) PinI1 can only be connected to odd external pins, and the internal pins pin3, pin4, ... (evenpins) corresponding to (connected to) PinI2 can only be connected to even external pins.

[0040] Table 1

[0041] PinI1 pin1, pin2, ... PinI2 pin3, pin4, ...

[0042] The pin connection group contains two pairs of external pins, 4pin connection, and the corresponding external pins are PinI* and PinV*, as shown in Table 2, which are used for four-terminal testing. Among them, the value of * can only be 1 or 2, 1 and 2 represent odd external pins and even external pins respectively. The internal pins pin1 and pin3 (odd pins) corresponding to (connected to) PinI1 and PinV1 can only be connected to odd external pins, and the internal pins pin2 and pin4 (even pins) corresponding to (connected to) PinI2 and PinV2 can only be connected to even external pins.

[0043] Table 2

[0044] PinI1 pin1 PinI2 pin2 PinV1 pin3 PinV2 Pin4

[0045] In this embodiment, the specific method of allocating test pin resources includes:

[0046] Step S1: Obtain the pin connection groups to be allocated as defined in Table 3 below: pc1, pc2 and pc3. These three pin connection groups to be allocated are all pin connection groups for two-terminal testing; among them, PinI1 is an odd-numbered external pin, PinI2 is an even-numbered external pin, and correspondingly, their corresponding internal pins are also odd-numbered internal pins and even-numbered internal pins, respectively.

[0047] Table 3

[0048]

[0049] Step S2: Pin Assignment:

[0050] The pin pairs obtained from pc1 are: (pin3, pin1), (pin3, pin2), (pin6, pin1), (pin6, pin2);

[0051] The pin pairs obtained from pc2 are: (pin3, pin4), (pin3, pin5), (pin6, pin4), (pin6, pin5);

[0052] The pin pair obtained from pc3 is: (pin3, pin6).

[0053] All pin pair combinations can be obtained by performing permutations and combinations, that is, several pin allocation methods:

[0054] {(pin3,pin1),(pin3,pin4),(pin3,pin6)};

[0055] {(pin3,pin1),(pin3,pin5),(pin3,pin6)};

[0056] {(pin3,pin1),(pin6,pin4),(pin3,pin6)};

[0057] {(pin3,pin1),(pin6,pin5),(pin3,pin6)};

[0058] {(pin3,pin2),(pin3,pin4),(pin3,pin6)};

[0059] {(pin3,pin2), (pin3,pin5), (pin3,pin6)};

[0060] {(pin3,pin2),(pin6,pin4),(pin3,pin6)};

[0061] {(pin3,pin2),(pin6,pin5),(pin3,pin6)};

[0062] {(pin6,pin1),(pin3,pin4),(pin3,pin6)};

[0063] {(pin6,pin1),(pin3,pin5),(pin3,pin6)};

[0064] {(pin6,pin1),(pin6,pin4),(pin3,pin6)};

[0065] {(pin6,pin1),(pin6,pin5),(pin3,pin6)};

[0066] {(pin6,pin2),(pin3,pin4),(pin3,pin6)};

[0067] {(pin6,pin2),(pin3,pin5),(pin3,pin6)};

[0068] {(pin6,pin2),(pin6,pin4),(pin3,pin6)};

[0069] {(pin6,pin2), (pin6,pin5), (pin3,pin6)}.

[0070] Step S3: Determine the pin allocation method using the number of resources:

[0071] Calculate the number of resources for each pin assignment method. The following takes the first pin assignment method {(pin3, pin1), (pin3, pin4), (pin3, pin6)} as an example. The same is true for other groups.

[0072] Get the odd-even connection relationship of the first group as follows:

[0073] Odd-numbered pins: 1. Pin3 connects {pin1, pin4, pin6};

[0074] Even-numbered pins: 1. pin1 connected to {pin3}, 2. pin4 connected to {pin3}, 3. pin6 connected to {pin3};

[0075] The number of connection groups of odd-numbered pins is one, and the number of connection relationship groups of even-numbered pins is three, so the connection relationship of the odd-numbered pins is selected as the connection relationship actually used.

[0076] Since pin3 is connected to three pins and there is only one set of connection relationships, then through the formula: resource = 2 × (3-1); resource = resource + (1-1). Calculation results in resource = 4. Since there are no duplicates among all the pins connected to pin3, the number of resources for this pin allocation method is 4.

[0077] According to the above calculation method, all pin allocation methods are traversed, and the minimum resource value is finally obtained to be 4, that is, the first pin allocation method is the optimal pin allocation method for the test circuit.

[0078] In order to facilitate the description, some common English nouns or letters used in the present invention are only used for exemplary reference rather than restrictive interpretation or specific usage, and the protection scope of the present invention should not be limited by their possible Chinese translations or specific letters.

[0079] It should also be noted that, in this document, relational terms such as "first" and "second" are merely used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations.

[0080] The above embodiments are only used to help understand the method and core idea of ​​the present invention. It should be noted that, for those skilled in the art, several improvements and modifications can be made to the present invention without departing from the principles of the present invention, and these improvements and modifications also fall within the scope of protection of the claims of the present invention.

Claims

1. A test pin resource allocation method based on odd-even allocation, characterized in that: include: Step S1. Obtain a pin connection group to be assigned of a test circuit; the pin connection group includes at least one pair of external pins, and the pair of external pins includes an odd external pin and an even external pin; the external pins correspond to an internal pin set, and the internal pin set corresponding to the odd external pins is defined as a first set, and the first set includes odd internal pins, and the internal pin set corresponding to the even external pins is defined as a second set, and the second set includes even internal pins; Step S2. Pin allocation, including: determining an internal pin from the corresponding internal pin set for each external pin of the pin connection group to be allocated during allocation; after completing the allocation of all the pin connection groups to be allocated, obtaining the pin allocation method of the test circuit; According to different pin assignments in the pin connection group, several pin assignment modes of the test circuit are obtained; Step S3. Calculate the number of resources of the pin allocation method respectively, and use the number of external pin resources occupied by a type of internal pins with a smaller number in the pin allocation method as the number of resources of the pin allocation method, including: comparing the number of the even-numbered internal pins and the number of the odd-numbered internal pins used in the pin allocation method, and use the number of external pin resources occupied by a type of internal pins with a smaller number as the number of resources of the pin allocation method; The pin allocation method with the smallest number of resources is determined as the pin allocation method of the test circuit.

2. The test pin resource allocation method based on odd-even allocation according to claim 1, characterized in that: The internal pin refers to an internal pin of a test circuit, and the external pin refers to an external test pin. The internal pin is allocated to the external pin for connection to connect the test circuit.

3. The test pin resource allocation method based on odd-even allocation according to claim 1, characterized in that: The method for defining the type of the external pins is as follows: the external pins are sorted in sequence according to the logical addresses and assigned natural number serial numbers, the external pins with odd serial numbers are defined as odd external pins, and the external pins with even serial numbers are defined as even external pins.

4. The test pin resource allocation method based on odd-even allocation according to claim 1, characterized in that: The step S12 is further included between the step S1 and the step S2: All the pin connection groups to be allocated obtained in step S1 are traversed to determine whether there are conflicting internal pins that exist in both the first set and the second set; if so, the conflicting internal pins are eliminated.

5. The test pin resource allocation method based on odd-even allocation according to claim 4, characterized in that: In step S12, the method of eliminating the conflicting internal pins includes: If there are other internal pins in both the first set and the second set of the conflicting internal pins, directly delete the conflicting internal pins in the first set and the second set; If there are conflicting internal pins in the first set and the second set, and one of the internal pin sets contains only the conflicting internal pins, then only the conflicting internal pins in the other internal pin set are deleted; If there is only one internal pin, namely the conflicting internal pin, in both the first set and the second set of the conflicting internal pins, an error is reported.

6. The test pin resource allocation method based on odd-even allocation according to claim 1, characterized in that: The pin connection group includes a pair of external pins for connecting a test circuit to perform a two-terminal test.

7. The test pin resource allocation method based on odd-even allocation according to claim 1, characterized in that: The pin connection group includes two pairs of external pins for connecting the test circuit to perform a four-terminal test.

8. The test pin resource allocation method based on odd-even allocation according to any one of claims 1 to 7, characterized in that: In step S3, the step of calculating the number of resources in the pin allocation method includes: Step 1. Compare the number of the even-numbered internal pins and the number of the odd-numbered internal pins used in the pin allocation method, and record the number of the smaller type of internal pins as n, set the type of internal pins as Pi, i∈[1,n], set the number of resources as resource, initialize resource=0, and initialize i=1; Step 2. Update resource according to the connection relationship of internal pin Pi: if Pi is only connected to one internal pin of another type, then resource = resource + 1; if Pi is connected to m internal pins of another type, then resource = 2 × (m-1); Step 3. Determine whether i is equal to n: if i < n, set i = i + 1 and proceed to step 2; if i = n, set resource = resource + n - 1 and proceed to the subsequent steps; Step 4. Count the number of another type of internal pins that are reused in the pin allocation method and record it as k, set resource=resource-k, and use the value of resource as the number of resources in the pin allocation method.

9. A test pin resource allocation system, characterized in that: It comprises a storage device, in which a plurality of instructions are stored, and the instructions are suitable for being loaded and executed by a processor: the test pin resource allocation method based on parity allocation as described in any one of claims 1 to 8.

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