A Method, Device and System for Evaluating an SOC Measurement System

Abstract

The present invention discloses a method, device and system for evaluating a SOC measurement system. The evaluation method includes: obtaining the SOC test interval. If the SOC test interval is greater than a set value, obtaining a first SOC value and using the first SOC value as the first SOC evaluation value; otherwise, obtaining a second SOC value and using the second SOC value as the first SOC evaluation value; obtaining the test current and determining a second SOC evaluation value according to the test current; determining a third SOC evaluation value by using the first SOC evaluation value and the second SOC evaluation value; and evaluating the SOC test accuracy of the SOC measurement system by using the third SOC evaluation value. In the SOC measurement system evaluation method proposed by the present invention, the first SOC evaluation value is used as the initial SOC value of the test battery, the second SOC evaluation value is used as the change value of SOC during the charging or discharging process of the test battery, and the sum of the first SOC evaluation value and the second SOC evaluation value is used as the current true SOC value of the test battery. Based on this true SOC value, the measurement accuracy of the SOC measurement system can be accurately judged.

Description

Technical Field

[0001] The embodiments of the present invention relate to SOC testing technology, and particularly to a method, device and system for evaluating an SOC measurement system. Background Art

[0002] The state of charge (SOC) of a battery pack is mainly used to reflect the remaining power of the battery pack. In scenarios where the battery pack is used as a power supply, it is necessary to measure the SOC value of the battery pack in real time to determine the usage status of the battery pack. For example, in the application scenario of new energy vehicles, the battery management system configured in the battery pack collects the terminal voltage and charge / discharge current of the battery pack in real time, calculates the SOC value of the battery pack in real time, and then executes a preset program according to the SOC value.

[0003] To ensure the measurement accuracy of the SOC value, it is usually required that the SOC measurement system (such as the battery management system) has a certain SOC measurement accuracy. In the prior art, the accuracy evaluation methods for the SOC measurement system have the following defects: the SOC reference value used for the accuracy evaluation of the SOC measurement system has a large deviation from the true value; continuous dynamic evaluation of the SOC measurement system cannot be achieved; the evaluation algorithm is complex and requires a long test preprocessing time. Summary of the Invention

[0004] The present invention provides a method, device and system for evaluating an SOC measurement system, so as to achieve the purpose of determining an accurate SOC true value for evaluating the accuracy of the SOC measurement system.

[0005] In a first aspect, an embodiment of the present invention provides a method for evaluating an SOC measurement system, including:

[0006] Obtain an SOC test interval. If the SOC test interval is greater than a set value, obtain a first SOC value and use the first SOC value as a first SOC evaluation value; otherwise, obtain a second SOC value and use the second SOC value as a first SOC evaluation value;

[0007] Obtain a test current and determine a second SOC evaluation value according to the test current;

[0008] Determine a third SOC evaluation value by using the first SOC evaluation value and the second SOC evaluation value;

[0009] Evaluate the SOC test accuracy of the SOC measurement system by using the third SOC evaluation value.

[0010] Optionally, obtaining the first SOC value includes: obtaining the open-circuit voltage of the test battery and determining the first SOC value according to the open-circuit voltage.

[0011] Optionally, obtaining the second SOC value includes: obtaining the previous third SOC evaluation value, and using the previous third SOC evaluation value as the second SOC value.

[0012] Optionally, obtaining the test current and determining the second SOC evaluation value according to the test current includes: integrating the test current over time, and using the integration result as the second SOC evaluation value.

[0013] Optionally, integrating the test current over time and using the integration result as the second SOC evaluation value includes:

[0014] Constructing an integrand of current using the test current parameter and the first coefficient, integrating the integrand of current over time, and using the integration result as the second SOC evaluation value.

[0015] Optionally, constructing an integrand of current using the test current parameter and the first coefficient includes:

[0016] Determining a second coefficient and a third coefficient, and determining the first coefficient according to the second coefficient and the third coefficient;

[0017] Constructing an integrand of current according to the test current parameter and the first coefficient.

[0018] Optionally, determining the second coefficient includes:

[0019] Obtaining the test current and the first input quantity, and determining the second coefficient according to the test current and the first input quantity.

[0020] Optionally, determining the third coefficient includes:

[0021] Obtaining a second input quantity and a third input quantity, and determining the third coefficient according to the second input quantity and the third input quantity.

[0022] In a second aspect, an embodiment of the present invention further provides an SOC measurement system evaluation device, including a test evaluation unit, where the test evaluation unit is configured to:

[0023] Obtain the SOC test interval. If the SOC test interval is greater than a set value, obtain the first SOC value and use the first SOC value as the first SOC evaluation value. Otherwise, obtain the second SOC value and use the second SOC value as the first SOC evaluation value;

[0024] Obtain the test current and determine the second SOC evaluation value according to the test current;

[0025] Determine the third SOC evaluation value using the first SOC evaluation value and the second SOC evaluation value.

[0026] In a third aspect, an embodiment of the present invention further provides a SOC measurement and evaluation system, including a controller configured with an executable program that implements the SOC measurement system evaluation method described in the embodiments of the present invention when running;

[0027] It further includes a current sensor and a voltage sensor. The current sensor is connected in series in the power consumption circuit between the test battery and the load, and the voltage sensor is connected to the test battery;

[0028] The controller is respectively connected to the current sensor and the voltage sensor.

[0029] Compared with the prior art, the beneficial effects of the present invention are as follows: The present invention proposes a SOC measurement system evaluation method. In this method, the first SOC evaluation value is used as the initial SOC value of the test battery, the second SOC evaluation value is used as the change value of SOC during the charging or discharging process of the test battery, and the sum of the first SOC evaluation value and the second SOC evaluation value is used as the current true SOC value of the test battery. The SOC test accuracy of the SOC measurement system is evaluated through this SOC value. Among them, the first SOC evaluation value is determined according to the SOC test interval. When the time interval between two measurements is too long, the first SOC evaluation value is determined according to the open-circuit voltage of the test battery. When the time interval between two measurements is short, the first SOC evaluation value is determined according to the previously determined true SOC value. Based on this, different first SOC evaluation values are selected in different situations, which can improve the accuracy of the first SOC evaluation value and thus improve the accuracy of the true SOC value. Description of the Drawings

[0030] Figure 1 is the flowchart of the SOC measurement system evaluation method in the embodiment;

[0031] Figure 2 is the simulation schematic diagram of the second SOC evaluation value in the embodiment;

[0032] Figure 3 is the structural schematic diagram of the SOC measurement and evaluation system in the embodiment;

[0033] Figure 4 is the structural schematic diagram of the electronic device in the embodiment. Detailed Embodiments

[0034] The present invention will be further described in detail below with reference to the drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the present invention, rather than limiting the present invention. Additionally, it should be noted that for the sake of description, only parts related to the present invention are shown in the drawings, rather than all structures.

[0035] Embodiment 1

[0036] Figure 1 is the flowchart of the SOC measurement system evaluation method in the embodiment. Refer to Figure 1 , the evaluation method includes:

[0037] S101. Obtain the SOC test interval, and determine the first SOC evaluation value according to the SOC test interval.

[0038] Exemplarily, in this embodiment, the evaluation method is used to evaluate the SOC measurement accuracy of the SOC measurement system, and the SOC test interval is used to represent the time interval between two consecutive SOC measurements of the test battery by the SOC measurement system.

[0039] Exemplarily, step S101 specifically includes:

[0040] Obtain the SOC test interval. If the SOC test interval is greater than the set value, obtain the first SOC value and use the first SOC value as the first SOC evaluation value.

[0041] Exemplarily, in this embodiment, the SOC test interval can be determined in the following way:

[0042] Obtain the power-on moment when the SOC measurement system performs this SOC measurement, obtain the power-off moment when the SOC measurement system performs the previous SOC measurement, and determine the SOC test interval according to the above power-on moment and power-off moment.

[0043] Exemplarily, in this embodiment, the set value can be freely set according to the design requirements. For example, the set value can be 30 to 45 seconds.

[0044] Exemplarily, in this embodiment, the first SOC value can be determined in the following way:

[0045] Obtain the open-circuit voltage of the test battery at the measurement start moment when the SOC measurement system performs this SOC measurement, and determine the first SOC value according to the open-circuit voltage.

[0046] Exemplarily, in the above solution, the open-circuit voltage is adopted, and the first SOC value corresponding to it can be determined according to the open-circuit voltage meter.

[0047] Exemplarily, the open-circuit voltage meter can be determined through a calibration test, and the open-circuit voltage meter includes the corresponding relationship between different open-circuit voltages and SOC values.

[0048] The first SOC value can also be determined in the following way:

[0049] Obtain the internal resistance of the test battery at the measurement start moment when the SOC measurement system performs this SOC measurement, and determine the first SOC value according to the internal resistance.

[0050] Exemplarily, in the above solution, the internal resistance can be used to determine the corresponding first SOC value according to an internal resistance meter.

[0051] Exemplarily, the internal resistance meter can be determined through a calibration test, and the internal resistance meter includes the corresponding relationship between different internal resistances and SOC values.

[0052] If the SOC test interval is less than the set value, obtain the second SOC value, and use the second SOC value as the first SOC evaluation value.

[0053] Exemplarily, in this embodiment, the second SOC value can be determined in the following manner:

[0054] Obtain the SOC value (the third SOC evaluation value) of the test battery determined by the evaluation method proposed in this embodiment when the SOC measurement system performed the previous SOC measurement, and use this SOC value as the second SOC value.

[0055] S102. Obtain the test current, and determine the second SOC evaluation value according to the test current.

[0056] Exemplarily, in this embodiment, the test current represents the charging or discharging current of the test battery when the SOC measurement system performs SOC measurement on the test battery.

[0057] Exemplarily, in this embodiment, based on the test current, the real-time SOC of the test battery can be determined by methods such as ampere-hour integration, neural network, etc., and the above real-time SOC is used as the second SOC evaluation value.

[0058] Exemplarily, in an implementable solution, the second SOC evaluation value is determined by the method of ampere-hour integration, which specifically includes:

[0059] Use the test current parameter and the first coefficient to construct an integrand of the current, integrate the integrand of the current over time, and use the integration result as the second SOC evaluation value.

[0060] Exemplarily, in this solution, the value corresponding to the test current parameter is the test current, and the set test power parameter is I c , and the first coefficient is K1, then the integrand of the current can be expressed as f(I c , K1).

[0061] Figure 2 is the simulation schematic diagram of the second SOC evaluation value in the embodiment. Refer to Figure 2 , exemplarily, the function f can be represented by a sixth operation, where the sixth operation can be a multiplication operation.

[0062] Exemplarily, in this solution, determining the first coefficient includes: determining the second coefficient and the third coefficient, and determining the first coefficient according to the second coefficient and the third coefficient.

[0063] Exemplarily, in the above solution, setting the second coefficient as K2 and the third coefficient as K3, the first coefficient K1 can be expressed by the following formula:

[0064] K1 = g(K2, K3)

[0065] Exemplarily, referring to Figure 2 , the function g can be represented by a third operation, where the third operation can be a multiplication operation.

[0066] Exemplarily, in the above solution, determining the second coefficient K2 includes:

[0067] Obtaining the test current parameter and the first input quantity, and determining the second coefficient according to the test current parameter and the first input quantity.

[0068] Exemplarily, referring to Figure 2 , by using the test current parameter and the first input quantity, the second coefficient can be obtained after the first operation and the second operation.

[0069] Exemplarily, the first operation can be a multiplication operation, and the second operation can be an exponential operation, where the input quantity of the second operation is the output quantity after the first operation, and the input quantity of the second operation is used as the base when performing the exponential operation.

[0070] Exemplarily, in the above solution, determining the third coefficient K3 includes:

[0071] Obtaining the second input quantity and the third input quantity, and determining the third coefficient according to the second input quantity and the third input quantity.

[0072] Exemplarily, referring to Figure 2 , by using the second input quantity and the third input quantity, the third coefficient can be obtained after the fourth operation and the fifth operation.

[0073] Exemplarily, the fourth operation can be a gain operation, and the fifth operation can be a sum operation.

[0074] Exemplarily, in this solution, the first input quantity, the second input quantity, and the third input quantity are fixed values, and the values of the three are different from each other. The specific values of each input quantity are related to the application scenario and are not specifically limited in this solution.

[0075] Exemplarily, Figure 2In the shown solution, when the application scenario changes, one or more of the first operation, second operation, third operation, fourth operation, fifth operation, and sixth operation can also be deformed according to the virtual simulation test results of the Model in the Loop (MIL) and Software in the Loop (SIL), where the deformation can be changing the operation rule or replacing the four arithmetic operations with a specified operation function.

[0076] Exemplarily, in the above solution, the virtual simulation test results of the Model in the Loop and Software in the Loop are used to determine that the model accuracy (i.e., calculation error) of the current integrand ≤ 1%.

[0077] S103. Determine the third SOC evaluation value using the first SOC evaluation value and the second SOC evaluation value.

[0078] Exemplarily, in this embodiment, determining the third SOC evaluation value using the first SOC evaluation value and the second SOC evaluation value can be specifically:

[0079] Use the sum of the first SOC evaluation value and the second SOC evaluation value as the third SOC evaluation value.

[0080] Exemplarily, in this embodiment, the third SOC evaluation value is used to evaluate the SOC measurement accuracy of the SOC measurement system for the test battery.

[0081] Specifically, when evaluating the SOC measurement accuracy of the SOC measurement system, the third SOC evaluation value is used as the true SOC value of the test battery, and the SOC value of the test battery measured by the SOC measurement system is compared with the third SOC evaluation value to determine the measurement accuracy of the SOC measurement system in real time.

[0082] This embodiment provides a method for evaluating an SOC measurement system. In this method, the first SOC evaluation value is used as the initial SOC value of the test battery, the second SOC evaluation value is used as the change value of the SOC during the charging or discharging process of the test battery, and the sum of the first SOC evaluation value and the second SOC evaluation value is used as the current true SOC value of the test battery. The SOC test accuracy of the SOC measurement system is evaluated through this SOC value. Among them, the first SOC evaluation value is determined according to the SOC test interval. When the time interval between two measurements is too long, the first SOC evaluation value is determined according to the open-circuit voltage of the test battery. When the time interval between two measurements is short, the first SOC evaluation value is determined according to the previously determined true SOC value. Based on this, different first SOC evaluation values are selected in different situations, which can improve the accuracy of the first SOC evaluation value and thus improve the accuracy of the true SOC value. In addition, the second SOC evaluation value can be determined by integrating the constructed current integral formula over time. Based on the current integral formula, the accuracy of the second SOC evaluation value can be improved to further improve the accuracy of the true SOC value.

[0083] Embodiment 2

[0084] This embodiment provides an SOC measurement system evaluation device, including a test evaluation unit, and the test evaluation unit is used for:

[0085] Obtain the SOC test interval. If the SOC test interval is greater than the set value, obtain the first SOC value and use the first SOC value as the first SOC evaluation value. Otherwise, obtain the second SOC value and use the second SOC value as the first SOC evaluation value;

[0086] Obtain the test current and determine the second SOC evaluation value according to the test current;

[0087] Use the first SOC evaluation value and the second SOC evaluation value to determine the third SOC evaluation value.

[0088] Exemplarily, in this embodiment, the test evaluation unit can determine the first SOC evaluation value, the second SOC evaluation value, and the third SOC evaluation value in any of the ways described in Embodiment 1.

[0089] The beneficial effects of the SOC measurement system evaluation device proposed in this embodiment are the same as those described in Embodiment 1 and will not be elaborated here.

[0090] Embodiment 3

[0091] Figure 3 It is a schematic structural diagram of the SOC measurement and evaluation system in the embodiment. Refer to Figure 3 , this embodiment provides an SOC measurement and evaluation system, including a controller 100, a current sensor 200, and a voltage sensor 300.

[0092] The current sensor 200 is connected in series in the power consumption loop between the test battery 1000 and the load 2000. The voltage sensor 300 is connected to the test battery 1000, and the controller 100 is respectively connected to the current sensor 200 and the voltage sensor 300.

[0093] The current sensor 200 is used to measure the test current of the test battery 1000, and the voltage sensor 300 is used to measure the open-circuit voltage of the test battery 1000.

[0094] Exemplarily, in an implementable embodiment, to ensure the acquisition accuracy of the test current, the current sensor 200 may adopt a high-frequency Hall current acquisition sensor.

[0095] In this embodiment, the controller 100 is configured with an executable program, and when the executable program runs, it implements any one of the SOC measurement system evaluation methods described in Embodiment 1.

[0096] Figure 4 It is a schematic diagram of the structure of the electronic device in the embodiment. Refer to Figure 4 , in an implementable embodiment, the controller can be replaced by an electronic device, and the electronic device is intended to represent various forms of digital computers, such as, laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as, personal digital processors, cellular phones, smart phones, wearable devices (such as helmets, glasses, watches, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are only examples and are not intended to limit the implementation of the present invention described and / or claimed herein.

[0097] As Figure 4 shown, the electronic device 10 includes at least one processor 11, and a memory communicatively connected to the at least one processor 11, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc. Among them, the memory stores a computer program executable by the at least one processor, and the processor 11 can execute various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 into the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. The input / output (I / O) interface 15 is also connected to the bus 14.

[0098] Multiple components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a disk, an optical disc, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices via a computer network such as the Internet and / or various telecommunication networks.

[0099] The processor 11 can be various general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. The processor 11 executes the SOC measurement system evaluation method described above.

[0100] In some embodiments, the SOC measurement system evaluation method can be implemented as a computer program, which is tangibly contained in a computer-readable storage medium, such as the storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or installed onto the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of the SOC measurement system evaluation method described above can be executed. Alternatively, in other embodiments, the processor 11 can be configured to execute the SOC measurement system evaluation method by any other suitable means (e.g., by means of firmware).

[0101] The various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), system-on-a-chip systems (SOCs), complex programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments can include: implemented in one or more computer programs, the one or more computer programs can be executed and / or interpreted on a programmable system including at least one programmable processor, the programmable processor can be a special or general-purpose programmable processor, can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit the data and instructions to the storage system, the at least one input device, and the at least one output device.

[0102] A computer program for implementing the method of the present invention can be written in any combination of one or more programming languages. These computer programs can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when executed by the processor, the computer programs cause the functions / operations specified in the flowchart and / or block diagram to be implemented. The computer programs can be executed entirely on the machine, partially on the machine, as a stand-alone software package partially on the machine and partially on a remote machine, or entirely on a remote machine or server.

[0103] In the context of the present invention, a computer-readable storage medium can be a tangible medium that can contain or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. The computer-readable storage medium can include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination of the foregoing. Alternatively, the computer-readable storage medium can be a machine-readable signal medium. More specific examples of the machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0104] To provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or a trackball) by which the user can provide input to the electronic device. Other kinds of devices can also be used to provide interaction with the user; for example, the feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including acoustic input, speech input, or tactile input).

[0105] The systems and techniques described herein can be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer having a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system can be interconnected to each other by digital data communication in any form or medium (e.g., a communication network). Examples of communication networks include: local area network (LAN), wide area network (WAN), blockchain network, and the Internet.

[0106] A computing system can include a client and a server. The client and the server are generally far from each other and typically interact through a communication network. The client-server relationship is created by computer programs running on respective computers and having a client-server relationship with each other. The server can be a cloud server, also known as a cloud computing server or a cloud host, which is a host product in the cloud computing service system and solves the defects of difficult management and weak business scalability existing in traditional physical hosts and VPS services.

[0107] Note that the above is only a preferred embodiment of the present invention and the applied technical principles. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, re-adjustments, and substitutions can be made by those skilled in the art without departing from the protection scope of the present invention. Therefore, although the present invention has been described in more detail through the above embodiments, the present invention is not limited to the above embodiments. Without departing from the concept of the present invention, it can also include more other equivalent embodiments, and the scope of the present invention is determined by the scope of the appended claims.

Claims

1. A method for evaluating an SOC measurement system, characterized in that Including: Obtain the SOC test interval. If the SOC test interval is greater than the set value, obtain the first SOC value and use the first SOC value as the first SOC evaluation value; otherwise, obtain the second SOC value and use the second SOC value as the first SOC evaluation value. Obtain the test current and determine the second SOC evaluation value according to the test current. Determine the third SOC evaluation value by using the first SOC evaluation value and the second SOC evaluation value. Evaluate the SOC test accuracy of the SOC measurement system by using the third SOC evaluation value. Obtaining the second SOC value includes: Obtain the previous third SOC evaluation value and use the previous third SOC evaluation value as the second SOC value.

2. The method for evaluating an SOC measurement system according to claim 1, characterized in that Obtaining the first SOC value includes: Obtain the open circuit voltage of the test battery and determine the first SOC value according to the open circuit voltage.

3. The method for evaluating the SOC measurement system according to claim 1, wherein Obtain the test current. Determining the second SOC evaluation value according to the test current includes: Integrate the test current over time and use the integration result as the second SOC evaluation value.

4. The SOC measurement system evaluation method according to claim 3, characterized in that Integrating the test current over time and using the integration result as the second SOC evaluation value includes: Construct an integrand of current by using test current parameters and a first coefficient, integrate the integrand of current over time, and use the integration result as the second SOC evaluation value.

5. The SOC measurement system evaluation method according to claim 4, wherein Constructing an integrand of current by using test current parameters and a first coefficient includes: Determine a second coefficient and a third coefficient, and determine the first coefficient according to the second coefficient and the third coefficient. Construct an integrand of current according to the test current parameters and the first coefficient.

6. The SOC measurement system evaluation method according to claim 5, wherein Determining the second coefficient includes: Obtain the test current and a first input quantity, and determine the second coefficient according to the test current and the first input quantity.

7. The SOC measurement system evaluation method according to claim 5, wherein Determining the third coefficient includes: Obtain a second input quantity and a third input quantity, and determine the third coefficient according to the second input quantity and the third input quantity.

8. An evaluation device for an SOC measurement system, characterized in that, Including a test evaluation unit, the test evaluation unit is used for: Obtain the SOC test interval. If the SOC test interval is greater than the set value, obtain the first SOC value and use the first SOC value as the first SOC evaluation value; otherwise, obtain the second SOC value and use the second SOC value as the first SOC evaluation value. Obtain the test current and determine the second SOC evaluation value according to the test current. Determine the third SOC evaluation value by using the first SOC evaluation value and the second SOC evaluation value. Obtaining the second SOC value includes: Obtain the previous third SOC evaluation value and use the previous third SOC evaluation value as the second SOC value.

9. A SOC measurement and evaluation system, characterized in that, Including a controller, the controller is configured with an executable program, and when the executable program runs, it implements the SOC measurement system evaluation method according to any one of claims 1 to 7. It further includes a current sensor and a voltage sensor. The current sensor is connected in series in the power consumption circuit between the test battery and the load, and the voltage sensor is connected to the test battery. The controller is respectively connected to the current sensor and the voltage sensor.

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