A verification and test system for contactor and relay fault prediction and health management technology

Abstract

The present invention relates to a verification and test system for contactor and relay fault prediction and health management technology. The system mainly consists of a device under test chassis, a signal conditioning chassis, a control and drive chassis, a signal acquisition and processing computer, a status control computer, a main control computer, a load, a power supply, etc. Using this system, it is possible to complete the test and measurement of contactors, the acquisition of operating parameters, the monitoring of health status, and the verification and evaluation of fault prediction and health management technology and algorithms.

Description

Technical Field

[0001] The present invention belongs to technical verification, test devices and systems in the field of low-voltage electrical appliances, and particularly relates to a verification and test system for fault prediction and health management technology of contactors and relays. Background Art

[0002] Contactors and relays, as electrical and signal control electrical devices, are widely used in various power transmission, distribution, power consumption and control occasions. Contactors and relays are typical electromagnetic switch devices. Such devices close or open the main contacts according to the control signals on the control coil to achieve the on-off or signal control of the load. During the working process, the frequent on-off of the main contacts easily leads to arcing of the main contacts. The instantaneous high-temperature arc will damage the main contacts or generate oxidation impurities on the surface of the main contacts, thereby reducing the electrical performance of the device. The health status and faults of the device have a close relationship and important influence on the stable and normal operation of the entire power transmission, distribution, power consumption system and signal control system.

[0003] Fault prediction and health management technology collects and monitors the operating status and characteristic parameter changes of the device to be managed. The characteristic data is processed by a specific algorithm to predict and infer potential faults, calculate information such as the health status of the device, and specifically guide the maintenance and repair work of the device. Using fault prediction and health management technology can effectively reduce the failure rate of the device and improve the operation stability and reliability.

[0004] Developing, verifying and testing fault prediction and health management technology for contactors and relays, and then applying the fault prediction and health management technology to such devices can timely master the health level of the devices, so as to timely repair and maintain them, which is beneficial to improving the operation reliability of contactors, relays and electrical systems.

[0005] Currently, the research and development of fault diagnosis and health management technology specifically for contactors and relays is not yet mature. In addition, there is no system for the verification and test of this technology. The existing technology is not conducive to the research and development of fault prediction and health management technology for contactors and relays. Summary of the Invention

[0006] In order to solve the deficiencies of the prior art, the present invention proposes a verification and test system for fault prediction and health management technology of contactors and relays. Using the verification and test system proposed by the present invention, a series of PHM technology verification and test work for electromagnetic switch devices such as contactors and relays can be completed.

[0007] The present invention provides a verification and test system for contactor fault diagnosis and health management technology, which is characterized by including a main control computer 01, a signal acquisition and processing computer 02, a state control computer 03, a signal conditioning panel box 04, a drive control panel box 05, a contactor under test panel box 06, a power supply 07, and a multi-channel electronic load 08.

[0008] The main control computer 01 is connected to the signal acquisition and processing computer 02 and the state control computer 03 respectively through communication interfaces. The main control computer 01, as the upper computer, conducts data interaction and storage with the two lower computers, runs fault diagnosis and health management algorithms, and sends control instructions to the lower computers.

[0009] The signal acquisition and processing computer 02 is connected to the signal conditioning circuit 041 in the signal conditioning panel box 04 through a communication interface, and receives digital signals after isolation, amplification, attenuation, and analog-to-digital conversion operations by the signal conditioning circuit. The transmission of data from the signal acquisition and processing computer 02 to the main control computer 01 is called data upstream transmission, and the transmission of data and instructions from the main control computer 01 to the signal acquisition and processing computer 02 is called data and instruction downstream transmission.

[0010] The state control computer 03 conducts data and control instruction transmission with the main control computer 01 through a communication interface. The transmission of data from the state control computer 03 to the main control computer 01 is called data upstream transmission, and the transmission of data and instructions from the main control computer 01 to the state control computer 03 is called data and instruction downstream transmission. The state control computer 03 is connected to the drive control circuit 051, the power supply 07, and the multi-channel electronic load 08 respectively through communication interfaces. The state control computer 03 sends drive control signals to the drive control circuit 051 according to control instructions received from the main control computer 01 or according to its own control logic. The state control computer 03 sends drive control signals to the power supply 07 according to control instructions received from the main control computer 01 or according to its own control logic. The state control computer 03 sends drive control signals to the multi-channel electronic load 08 according to control instructions received from the main control computer 01 or according to its own control logic.

[0011] The upper computer in the present invention is the main control computer 01.

[0012] The lower computers in the present invention are the signal acquisition and processing computer 02 and the state control computer 03.

[0013] The signal conditioning panel box 04 includes a signal conditioning circuit 041, a voltage sensor 042, a current sensor 043, a temperature sensor 044, a vibration sensor 045, a noise sensor 046, and a calibration signal injection circuit 047.

[0014] The temperature sensor 044 includes a contact sensor and a non-contact sensor.

[0015] The vibration sensor 045 includes a uniaxial vibration sensor and a multi-axis vibration sensor.

[0016] The drive control panel box 05 includes a drive control circuit 051 and a multi-channel drive circuit 052.

[0017] The measured contactor panel box 06 includes the 1st measured contactor KM1 to the nth measured contactor KMn.

[0018] The power supply 07 is a multi-channel adjustable power supply, capable of supplying power to multiple test channels.

[0019] The multi-channel electronic load 08 can programmatically adjust the load type, load parameters, and controlled switching of the load status internally.

[0020] The present invention can achieve the following beneficial effects:

[0021] Using the contactor relay fault prediction and health management technology verification system designed by the present invention, it is possible to programmatically and automatically perform fault prediction and health management technology verification operations on electromagnetic switch devices such as contactors and relays, automatically test and verify the algorithms and technologies to be verified, and evaluate and verify the performance such as the effectiveness and accuracy of the algorithms and technologies. Compared with manual test verification and semi-automatic test verification systems and methods, the technology verification system designed by the present invention can improve the technology verification efficiency and shorten the technology verification cycle.

[0022] Using the contactor fault prediction and health management test system designed by the present invention, it is possible to programmatically and automatically perform full-life cycle performance tests, aging tests, and accelerated aging tests on electromagnetic switch devices such as contactors and relays. During the test process, it is possible to collect, process, analyze, and store characteristic signals such as voltage, current, vibration, sound pattern, temperature, and infrared of electromagnetic switch devices such as contactors and relays. Combining fault diagnosis and prediction algorithms, it is possible to diagnose and predict the faults of electromagnetic switch devices such as contactors and relays; combining health status assessment algorithms, it is possible to evaluate the health status of electromagnetic switch devices such as contactors and relays. Description of the Drawings

[0023] One or more embodiments are exemplarily illustrated by corresponding drawings. These exemplary illustrations and the drawings do not constitute limitations on the embodiments. Elements with the same reference numerals in the drawings are shown as similar elements. The drawings do not constitute a scale limitation, and among them:

[0024] Figure 1It is a block diagram of a verification and test system structure for contactor and relay fault prediction and health management technology provided by an embodiment of the present disclosure.

[0025] Figure 2 It is a wiring schematic diagram of a voltage sensor of a verification and test system for contactor and relay fault prediction and health management technology provided by an embodiment of the present disclosure.

[0026] Figure 3 It is a wiring schematic diagram of a current sensor of a verification and test system for contactor and relay fault prediction and health management technology provided by an embodiment of the present disclosure.

[0027] Figure 4 It is a layout schematic diagram of temperature signal acquisition points of a verification and test system for contactor and relay fault prediction and health management technology provided by an embodiment of the present disclosure.

[0028] Figure 5 It is a layout schematic diagram of vibration signal acquisition points of a verification and test system for contactor and relay fault prediction and health management technology provided by an embodiment of the present disclosure.

[0029] Figure 6 It is a layout schematic diagram of acoustic signal acquisition points of a verification and test system for contactor and relay fault prediction and health management technology provided by an embodiment of the present disclosure.

[0030] Figure 7 It is a wiring schematic diagram of a multi-channel drive circuit of a verification and test system for contactor and relay fault prediction and health management technology provided by an embodiment of the present disclosure.

[0031] Figure 8 It is a schematic diagram of a signal conditioning circuit of a verification and test system for contactor fault prediction and health management technology provided by an embodiment of the present disclosure. Detailed implementation manners

[0032] In order to make the objectives, technical solutions and advantages of the present application clearer, the present application will be described and explained below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments provided by the present application without creative efforts shall fall within the scope of protection of the present application.

[0033] Obviously, the accompanying drawings in the following description are only some examples or embodiments of the present application. For those of ordinary skill in the art, without creative efforts, the present application can also be applied to other similar scenarios based on these drawings. In addition, it can also be understood that although the efforts made in such a development process may be complex and lengthy, for those of ordinary skill in the art related to the content disclosed in the present application, some design, manufacturing, or production changes based on the technical content disclosed in the present application are only conventional technical means and should not be understood as the insufficient disclosure of the content of the present application.

[0034] In the present application, the mention of "embodiment" means that the specific features, structures, or characteristics described in combination with the embodiment can be included in at least one embodiment of the present application. The appearance of this phrase at various positions in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. Those of ordinary skill in the art explicitly and implicitly understand that the embodiments described in the present application can be combined with other embodiments without conflict.

[0035] Unless otherwise defined, the technical terms or scientific terms involved in the present application should have the ordinary meaning understood by those of ordinary skill in the technical field to which the present application belongs. The similar terms such as "a", "an", "one kind", "the" involved in the present application do not indicate a quantity limitation and can represent a singular or plural number. The terms "comprising", "including", "having" and any variations thereof involved in the present application are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or device including a series of steps or modules (units) is not limited to the listed steps or units, but may further include unlisted steps or units, or may further include other steps or units inherent to these processes, methods, products, or devices.

[0036] The present invention will be further described below in combination with embodiments and the accompanying drawings:

[0037] The core of the present invention is to provide a verification and test system for contactor fault prediction and health management technology. By using the system designed by the present invention, verification and test of contactor fault prediction and health technology can be carried out.

[0038] Such as Figure 1As shown in the figure, the entire system consists of a main control computer, a signal acquisition and processing computer, a status control computer, a signal conditioning panel box, a drive control panel box, a contactor under test panel box, a power supply, and a multi-channel electronic load. Among them, the signal conditioning panel box includes a signal conditioning circuit, a voltage sensor, a current sensor, a temperature sensor, a vibration sensor, and a noise sensor; the drive control panel box consists of a drive control circuit and several drive circuits; several contactors under test are installed inside the contactor under test panel box.

[0039] Specifically, the present invention can be used to complete the verification work of fault prediction and health management algorithms and technologies for contactors. The present invention refers to this kind of function, status, and mode as the PHM algorithm verification mode. In the PHM algorithm verification mode, the programs running on the signal acquisition computer and the status control computer are the algorithm verification mode control programs, and the main control computer runs the PHM algorithm verification mode main program and the PHM algorithm to be verified. In the PHM algorithm verification mode, the research objective is to verify, evaluate, and assess fault prediction and health management technologies, and the research objects of the PHM algorithm verification mode are the methods, computer programs, algorithms, etc. involved in fault prediction and health management technologies.

[0040] In order to enable the system to complete the technology verification work, the entire system needs to be adjusted to the technology verification state. The specific operations and configurations are as follows:

[0041] Load the method to be verified, computer program, and algorithm verification mode control program into the 01 main control computer, and load the algorithm verification mode control program configuration into the 02 signal acquisition and processing computer and the 03 status control computer. The 03 status control computer receives instructions from the 01 main control computer or controls the status of the 051 drive control circuit, 07 power supply, and 08 multi-channel electronic load according to the algorithm verification mode control program inside it, so that these controlled devices operate according to the settings of the algorithm verification mode control program. The 051 drive control circuit receives the control instruction and sends a drive signal to the 052 multi-channel drive circuit, and then the 052 multi-channel drive circuit controls multiple tested contactors such as KM1 to KMn to control the on and off of the contactor contacts according to the program settings. At the same time, the 03 status control computer controls the 07 power supply and the 08 multi-channel electronic load, so that the 07 power supply and the 08 multi-channel electronic load change the power supply state and load state for the test circuit according to the algorithm verification mode control program. The 08 multi-channel electronic load can receive the control of the upper computer to realize operations such as load nature, load parameters, and switching loads, so as to change the working state of the tested contactor and simulate specific working conditions of the tested contactor. The 042 voltage sensor, 043 current sensor, 044 temperature sensor, 045 vibration sensor, and 046 noise sensor detect and collect various parameters of the tested contactor in real time, and upload the data to the 02 signal acquisition and processing computer through the 041 signal conditioning circuit. The 02 signal acquisition and processing computer preprocesses, stores, and transmits the received data. The data transmitted to the 01 main control computer in this working mode is the preprocessed data; in addition, the 02 signal acquisition and processing computer can also upload all the original data to the 01 main control computer through the communication interface. The data processing, analysis, storage, contactor fault prediction, and health management operations are all completed by the 01 main control computer, and the prediction results and health management evaluation results are stored. After completing the entire or a certain stage of the verification test, compare the actual fault occurrence records of the tested contactor with the prediction results, compare the actual operation records of the tested contactor with the health evaluation results, and evaluate the methods, computer programs, and algorithm effects involved in the verified fault prediction and health management technologies according to certain effect evaluation criteria to verify the effectiveness of the PHM algorithm, program, and technology, so as to realize the verification work of the PHM algorithm and technology.

[0042] Specifically, the present invention can also be used to complete the device aging and life test on the contactor under test. The present invention refers to this function, state, and mode as the device aging and life test mode. In the device aging and life test mode, the programs running on the master computer, signal acquisition and processing computer, and state control computer are the aging and life test programs. When conducting the aging and life test on the contactor under test, the research objective is to conduct the device aging and life test on the contactor to be tested and inspected according to the predetermined test standards and procedures. By means of applying different working condition excitations to the contactor under test and changing the test conditions, etc., the state information and parameter changes of the contactor under test are detected, collected, and stored in real time, and the aging test and life test data of the contactor under test are obtained, so as to provide data support for subsequent prediction of faults and assessment of the health state of the contactor under test. At this time, the research object of the system is the contactor under test.

[0043] In order to enable the system to implement the device aging and life test function, the system needs to be configured into the device aging and life test mode. The specific process and operations are as follows:

[0044] Load the aging and life test procedures into the 01 main control computer, 02 signal acquisition and processing computer, and 03 status control computer. According to the settings of the aging and life test procedures, the 03 status control computer sends control signals to the 07 power supply, 08 multi-channel electronic load, and 051 drive control circuit, thereby adjusting the power supply status, load status, and on-off status of the contactor under test. The three types of statuses act alone or in combination to provide multiple different working statuses and working condition excitations for the contactor under test. The 03 status control computer receives instructions from the 01 main control computer or controls the status of the 051 drive control circuit, 07 power supply, and 08 multi-channel electronic load according to the internal aging and life test procedures, so that these controlled devices operate according to the settings of the aging and life test procedures. The 051 drive control circuit receives the control instructions and sends drive signals to the 052 multi-channel drive circuit. Then, the 052 multi-channel drive circuit controls multiple contactors under test, such as KM1 to KMn, to control the on and off of the contactor contacts according to the program settings. At the same time, the 03 status control computer controls the 07 power supply and 08 multi-channel electronic load, so that the 07 power supply and 08 multi-channel electronic load change the power supply status and load status for the test circuit according to the aging and life test procedures. The 08 multi-channel electronic load can receive the control of the upper computer to realize operations such as load nature, load parameters, and switching load, so as to change the working status of the contactor under test and enable the contactor under test to complete the predetermined aging and life test process. The 042 voltage sensor, 043 current sensor, 044 temperature sensor, 045 vibration sensor, and 046 noise sensor detect and collect various parameters of the contactor under test in real time, and upload the data to the 02 signal acquisition and processing computer through the 041 signal conditioning circuit. In the device aging and life test mode, the 02 signal acquisition and processing computer processes, stores, and transmits the received data. The 02 signal acquisition and processing computer can upload all the data to the 01 main control computer through the communication interface, and operations such as data processing, analysis, and storage can also be completed by the 01 main control computer. After completing the entire or a certain stage of the aging and life test, store and export the data during the aging and life test process of the contactor under test to obtain the aging and life test data of the contactor under test, and complete the aging and life test of the contactor under test.

[0045] For contactors and relays, voltage, current, temperature, vibration, and voiceprint are several key characteristic signals that can reflect the fault characteristics and health status of the device. This system needs to collect and monitor voltage, current, temperature, vibration, and voiceprint signals respectively.

[0046] The verification signal injection circuit 047 performs periodic data verification operations at test intervals according to the program settings. The verification signal injection circuit 047 injects a standard verification signal into the signal conditioning circuit 041, and after the signal acquisition and transmission processes, it is transmitted to the signal acquisition and processing computer 02. The signal acquisition and processing computer 02 determines whether the signal is distorted to determine whether there is a fault in the acquisition and transmission process. The verification signal injection circuit 047 is essentially a signal generating circuit that can inject a verification signal into the system according to the settings.

[0047] Figure 2 A voltage sensor wiring method of the present invention is shown, such as Figure 2 As shown, the wiring of the voltage sensor mainly involves 04 signal conditioning panel box, 06 tested contactor panel box, 07 power supply, 08 multi-channel electronic load and other panels and equipment. Figure 2 The wiring of the voltage sensor when testing N devices under test is shown in Figure 06. That is, there are N devices under test in the contactor panel box KM 1 To KM n . Corresponding to the existence of N devices under test, N voltage sensors are set in the 04 signal conditioning box, namely 0421 voltage sensor 1, ..., 042n voltage sensor n. The 041 signal conditioning circuit receives the voltage signals collected from the n voltage sensors, and uploads the signals to the 02 signal acquisition and processing computer after signal conditioning, transmission and other processing. The voltage sensor has two channels, four terminals 1, 2, 3, and 4, of which terminals 1 and 2 are a group, and terminals 3 and 4 are a group. The 07 power supply and the 08 multi-channel electronic load are connected to the main contacts of the N devices under test, that is, connected to the 1st and 2nd terminals of the devices under test. The 07 power supply and the 08 multi-channel electronic load are controlled by the 03 state control computer, and provide corresponding test conditions for the devices under test according to the program settings. The A1 and A2 coil terminals of the devices under test are connected to the 052 multi-channel drive circuit, and the main contacts of the devices under test are controlled to be on and off according to the program settings. The voltage sensor terminals 1 and 2 are connected to the A2 and A1 terminals of the device under test respectively to collect the coil voltage changes of the device under test. The terminals 3 and 4 are connected to the 2 and 1 terminals of the device under test respectively to collect the voltage changes of the main contacts of the device under test.

[0048] Figure 3 A current sensor wiring method of the present invention is shown, such as Figure 3 As shown, the wiring of the current sensor mainly involves 04 signal conditioning panel box, 06 tested contactor panel box, 07 power supply, 08 multi-channel electronic load and other panels and equipment. Figure 3The wiring of the current sensor when testing N devices under test is shown in FIG. 6, that is, there are N devices under test KM1 to KMn in the contactor panel box under test 06. Corresponding to the existence of N devices under test, N current sensors are set in the signal conditioning panel box 04, that is, 0431 current sensor 1, ..., 043n current sensor n. The signal conditioning circuit 041 receives the current signal collected from the n current sensors, and uploads the signal to the signal acquisition and processing computer 02 after signal conditioning, transmission and other processing. The current sensor has two channels, four terminals 1, 2, 3, and 4, of which terminals 1 and 2 are a group, and terminals 3 and 4 are a group. The power supply 07, the current sensor terminal 1, the current sensor terminal 2, the device under test terminal 1, the device under test terminal 2, and the multi-channel electronic load 08 are connected in series to form a closed loop in the main circuit of the device under test. The power supply 07 and the multi-channel electronic load 08 are controlled by the state control computer 03, and provide corresponding test conditions for the device under test according to the program settings. The A2 coil terminal of the device under test, the 052 multi-channel drive circuit, the 4th terminal of the current sensor, the 3rd terminal of the current sensor, and the A1 coil terminal of the device under test are connected in series to form a closed loop in the control circuit. According to the program setting, the main contacts of the device under test are controlled by powering on or off the control coil. The 1st and 2nd terminal channels are connected in series with the main contacts of the device under test to collect the current changes of the main contacts of the device under test. The 3rd and 4th terminal channels are connected in series with the coil of the device under test to collect the current changes of the coil of the device under test.

[0049] Figure 4 This is a schematic diagram of the layout of the temperature and infrared signal test points of the device under test. Figure 4 As shown, temperature signal test points are arranged at the coil, upper end cover, main contact terminal, coil terminal, etc. of the device under test. Contact temperature sensors, non-contact temperature sensors or non-contact infrared sensors can be arranged at the above temperature measurement points to collect and monitor the heat generation of key test parts. The arrangement of temperature and infrared signal test points is not limited to the above positions and parts, and can be adjusted according to specific conditions.

[0050] Figure 5 This is a schematic diagram of the layout of the vibration signal test points of the device under test. Figure 5 As shown, vibration test points are set at the coil, upper end cover, mounting bracket, test platform, etc. of the device under test, and contact or non-contact vibration sensors are used to collect and monitor vibration signals of the above parts. Test point 01 and test point 02 test the spontaneous vibration signal of the device under test, and test point 03 and test piece 04 test the environmental vibration signal of the device under test for later noise reduction and signal processing. The arrangement of vibration signal test points is not limited to the above positions and parts, and can be adjusted according to specific circumstances.

[0051] Figure 6 Schematic diagram of the arrangement of sound fingerprint signal receiving points of the device under test. As Figure 6 shown, sound fingerprint signal acquisition points and receiving points are set at the coil, upper end cover, installation environment, etc. of the device under test, and a sound fingerprint signal sensor and array are used to collect and monitor the sound fingerprint signals of the above parts. Test point 01 and test point 02 test the self-generated sound signals of the device under test, and test point 03 and test piece 04 test the environmental noise signals of the device under test, which are used for later noise reduction and signal processing. The arrangement of the sound fingerprint signal test points and receiving points is not limited to the above positions and parts, and can be adjusted according to specific situations.

[0052] In this embodiment, the 051 drive control circuit selects an ADLINK CPCI-7434 board, and this type of drive board provides up to 64 drive channels at most, which are used to connect the 03 state control computer and the 052 multi-channel drive circuit.

[0053] Figure 7 Schematic diagram of the wiring of the multi-channel drive circuit provided by the present invention. As Figure 7 shown, the multi-channel drive circuit mainly includes a drive signal interface circuit, a drive signal amplification circuit, a drive circuit based on the TD62783 chip, a middle relay, etc. The drive signal interface circuit uses an SCSI-100 type connector to connect the 051 drive control circuit and the 052 multi-channel drive circuit. Among them, RLY01-RLY08, RLY09-RLY16, RLY17-RLY24, and RLY25-RLY32 are divided into a group of 8 signals each, which respectively represent the drive control signals of the 1st - 32nd devices under test. IGND represents the signal ground signal, and VDD1-VDD4 respectively represent the power supply signals of four groups of drive signals. The drive signal amplification circuit is composed of a combination of multiple unit drive circuits with the same topology, and the unit drive circuit is composed of a base resistor, a collector resistor, and a PNP type triode. Taking the 1st drive signal as an example, the drive signal amplification circuit can amplify the 1st drive signal RLY01 with TTL or CMOS level into an intermediate drive signal RLYY01 of about DC24V. The intermediate drive signal RLYY01 is then passed through an isolated 8-channel drive chip TD62783 to obtain an isolated drive signal RLYOUT01 of DC24V. The isolated drive signal RLYOUT01 drives the corresponding middle relay K1, and the middle relay K1 controls the coil of the device under test KM1 to be energized or de-energized according to the signal instruction, so as to control the contact of KM1 to be closed or opened. Figure 7 Among them, AGND is the DC24V analog power ground, POW24 is the positive pole of the DC24V power supply, PGND is the DC24V power ground, RLY01-3 is the 3rd pin signal of the 1st middle relay, and D31 / D41 are energy discharge diodes.

[0054] Figure 8 Several signal conditioning circuit schematics are provided, including a DC current conditioning circuit, a DC voltage conditioning circuit, an AC current conditioning circuit, an AC voltage conditioning circuit, and a reference voltage conditioning circuit.

[0055] The principle of the DC voltage conditioning circuit is shown in the figure. The DC voltage signal on the aircraft DC bus is 28V. After being divided by a precision resistor, the voltage on the sampling resistor is approximately 28 / 16 = 1.75V. The signal enters the operational amplifier through the isolation chip. After signal amplification and voltage following by the operational amplifier, the signal can enter the ADC channel of the data acquisition board. The 3.3V zener diode is used to prevent the +15V power supply from being directly applied to the input of the acquisition board due to the damage of the operational amplifier. The isolation chip uses the AMC1311 enhanced isolation precision amplifier produced by TI. This chip has a high-impedance input voltage range of 2V. The output and input circuits are separated by an isolation gate with extremely strong electromagnetic interference resistance. The rated gain is 1, and it has extremely low gain error, offset error, and temperature drift. The operational amplifier uses the OPA4227 operational amplifier produced by TI. This amplifier has characteristics such as low noise, wide bandwidth, and high precision. Each OPA4227 contains a four-channel operational amplifier, and the amplifiers are independent of each other, reducing the cost per channel and saving space. At the same time, this amplifier has a wide supply voltage range from ±2.5V to ±18V, with a nominal value of ±15V.

[0056] The principle of the DC current conditioning circuit is shown in the figure. The current signal passes through the Hall element LA55-P without the need for further isolation. The current signal output by the current sensor is converted into a corresponding voltage signal through the sampling resistor, and after being proportionally amplified by the operational amplifier and followed by a stage of voltage, a voltage signal within 0 - 3.3V is sent to the ADC channel of the data acquisition board.

[0057] The schematic diagram of the AC voltage conditioning circuit is shown in the figure. Since the AC voltage signal output by the aircraft main power supply is an AC signal of 115V / 400Hz, and the signal range required by the input port of the isolation chip is 0 - 2V, it is necessary to first reduce the peak value of the AC signal to 0.5V through a proportional reduction circuit, and then shift the entire waveform up by 1.5V through an adder circuit to convert the sine signal into a positive voltage signal before sending it to the isolation chip AMC1311. The circuit is as shown below. Vin first passes through a precision resistor voltage division to reduce the voltage peak, and then adds with the 1.5V reference power supply through the adder of the operational amplifier to raise the signal amplitude, becoming 0 - 2V and entering the isolation chip. Then, after being proportionally amplified by the operational amplifier and followed by a stage of voltage, a voltage signal within 3.3V enters the ADC channel of the acquisition board.

[0058] The schematic diagram of the AC voltage conditioning circuit is shown in the figure. The principle is the same as that of the AC voltage conditioning circuit, except that the isolation chip link is omitted, and it can enter the ADC channel of the data acquisition board only through voltage boosting and voltage following.

[0059] The schematic diagram of the reference voltage stabilizing circuit is shown in the figure. The controllable precision voltage stabilizing source TL431 chip is adopted, and its output voltage can be arbitrarily set to any value in the range from Vref (2.5V) to 36V with two resistors. Adopting the typical connection method shown in the figure, TL431 is equivalent to a 2.5V zener diode here, and a 2.5V reference voltage can be output at the output pin 2. After passing through the voltage dividing resistors of 2K and 3K, a reference voltage of 1.5V can be obtained, and after one-stage voltage following by the operational amplifier, it can be used as the reference voltage to boost the AC signal.

[0060] As described above, it is only the preferred specific implementation mode of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that can be easily thought of by those skilled in the art within the technical scope disclosed by the present invention should be covered by the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.

Claims

1. A verification and test system for contactor and relay fault prediction and health management technology, characterized in that: it includes a main control computer, a signal acquisition and processing computer, a status control computer, a signal conditioning panel box, a drive control panel box, a contactor under test panel box, a power supply, and a multi-channel electronic load; the signal conditioning panel box includes a signal conditioning circuit, a voltage sensor, a current sensor, a temperature sensor, a vibration sensor, a noise sensor, and a calibration signal injection circuit; the contactor under test panel box includes the 1st contactor under test KM1 to the nth contactor under test KMn; the drive control panel box includes a drive control circuit and a multi-channel drive circuit; the drive control circuit receives control instructions and sends drive signals to the multi-channel drive circuit, and then the multi-channel drive circuit controls multiple contactors under test KM1 to KMn to control the on and off of the contactor contacts according to the program settings; the calibration signal injection circuit performs periodic data verification operations at test intervals according to the program settings. The calibration signal injection circuit injects a standard calibration signal into the signal conditioning circuit, and after signal acquisition and transmission processes, it is transmitted to the signal acquisition and processing computer, and the signal acquisition and processing computer determines whether the signal is distorted to determine whether there are faults in the acquisition and transmission processes; the calibration signal injection circuit is a signal generation circuit that can inject calibration signals into the system according to the settings; the power supply is a multi-channel adjustable power supply that can supply power to multiple test channels; the multi-channel electronic load can programmatically adjust the load type, load parameters, and controlled switching of the load status inside; the system includes a technology verification mode and an aging life test mode. When performing the technology verification mode, the status control computer receives instructions from the main control computer or controls the status of the drive control circuit, power supply, and multi-channel electronic load according to the algorithm verification mode control program inside it, so that these controlled devices operate according to the settings of the algorithm verification mode control program; when performing the aging life test mode, according to the settings of the aging and life test program, the status control computer sends control signals to the power supply, multi-channel electronic load, and drive control circuit, thereby adjusting the power supply status, load status, and on-off status of the contactor under test. The three types of statuses act alone or in combination to provide multiple different working states and working condition excitations for the contactor under test.

2. A verification and test system for contactor and relay fault prediction and health management technology according to claim 1, characterized in that: the main control computer is respectively connected to the signal acquisition and processing computer and the status control computer through communication interfaces; the main control computer, as the upper computer, conducts data interaction and storage with the two lower computers, runs fault diagnosis and health management algorithms, and sends control instructions to the lower computers. The signal acquisition and processing computer is connected to the signal conditioning circuit in the signal conditioning panel box through a communication interface, and receives the digital signal after isolation, amplification, attenuation, and analog-to-digital conversion operations by the signal conditioning circuit. The transmission of data from the signal acquisition and processing computer to the main control computer is called data upstream transmission, and the transmission of data and instructions from the main control computer to the signal acquisition and processing computer is called data and instruction downstream transmission; The status control computer conducts data and control instruction transmission with the main control computer through a communication interface. The transmission of data from the status control computer to the main control computer is called data upstream transmission, and the transmission of data and instructions from the main control computer to the status control computer is called data and instruction downstream transmission; The status control computer is respectively connected to the drive control circuit, the power supply, and the multi-channel electronic load through communication interfaces. The status control computer sends drive control signals to the drive control circuit according to the control instructions received from the main control computer or according to its own control logic. The status control computer sends drive control signals to the power supply according to the control instructions received from the main control computer or according to its own control logic. The status control computer sends drive control signals to the multi-channel electronic load according to the control instructions received from the main control computer or according to its own control logic.

Images