A display panel and a testing method thereof

Abstract

The present invention discloses a display panel, including: a scanning matrix, a test line; the scanning matrix includes a Gate line, a Source line and a display IC; the Gate line and the Source line are respectively vertically interlaced with the display IC to form a scanning matrix; the test line includes a vertical test line and a horizontal test line; the vertical test line is parallel to the Source line in the scanning matrix, and is arranged above the Gate line in the scanning matrix using SD layer metal wiring; the horizontal test line is parallel to the Gate line in the scanning matrix, and is arranged below the Source line in the scanning matrix using Gate layer metal wiring; one end of at least one vertical test line is interlaced with one end of at least one horizontal test line; one or more of the vertical test lines or the horizontal test lines are provided with a reserved interface for connecting to a test PAD. A testing method is also disclosed. By pre-setting the vertical test line and the horizontal test line, and connecting to the corresponding PAD through the reserved interface, any Gate line and Source line can be tested, which solves the problem that the existing display panel can only test individual signals.

Description

Technical Field

[0001] The present invention relates to the technical field of display panel manufacturing process, and in particular to a display panel and a testing method thereof. Background Art

[0002] The display panel often tests related signals during the lighting stage, but due to the limited space of the display panel, only the test PAD for testing individual signals can be reserved on the display panel, and the signals of the display panel cannot be fully tested. This makes it impossible to test some required signals, affecting the analysis of practitioners.

[0003] In summary, there is an urgent need for a display panel and a testing method that can test any Gate line and Source line signal, so as to provide convenience for analysts, quickly locate problems, and thus solve technical problems existing in the display panel. Summary of the invention

[0004] The existing display panel can only reserve the test PAD of individual signals, so that only individual signals can be tested, which is not conducive to the technicians to quickly locate the technical problems existing in the display panel.

[0005] In view of the above problems, a display panel and a testing method thereof are proposed. The vertical test line and the horizontal test line are pre-set on the outside of the scanning matrix, and the vertical test line and the horizontal test line are respectively set above the Gate line and below the Source line. When testing is needed, the corresponding Gate line and Source line are respectively connected with the vertical test line and the horizontal test line by laser fusion. By connecting the reserved test PAD interface with the corresponding PAD, any Gate line and Source line can be tested, which solves the problem that the existing display panel can only test individual signals.

[0006] In a first aspect, a display panel includes:

[0007] Scan matrix;

[0008] Test line;

[0009] The scanning matrix includes Gate lines, Source lines and a display IC;

[0010] The Gate lines and Source lines are electrically connected to the display IC respectively, and are vertically staggered to form a scanning matrix;

[0011] The test line includes:

[0012] Vertical test line;

[0013] Horizontal test line;

[0014] The vertical test line is arranged outside the scan matrix and is parallel to the Source line in the scan matrix, and is wired above the Gate line in the scan matrix using SD layer metal wiring;

[0015] The horizontal test line is arranged outside the scan matrix and is parallel to the Gate line in the scan matrix, and is wired below the Source line in the scan matrix using Gate layer metal wiring;

[0016] One end of at least one of the vertical test lines is interlaced with one end of at least one of the horizontal test lines;

[0017] One or more of the vertical test lines or the horizontal test lines are provided with a reserved interface for connecting to a test PAD.

[0018] In combination with the display panel of the invention, in a first possible implementation manner, the number of the horizontal test line is 1, and the number of the vertical test line is 1;

[0019] The horizontal test line is arranged above the display panel;

[0020] The vertical test line is arranged on the left side or the right side of the display panel;

[0021] One end of the vertical test line overlaps with one end of the horizontal test line;

[0022] A reserved interface for connecting to a test PAD is provided at one end of the vertical test line or the horizontal test line that is not staggered and overlapped.

[0023] In combination with the first possible implementation manner of the invention, in a second possible implementation manner, the staggered and overlapping ends of the vertical test line and the horizontal test line are connected by vias / laser fusion;

[0024] The vertical test line is connected to the Gate line to be tested by laser fusion;

[0025] The horizontal test line is connected to the Source line to be tested by laser fusion.

[0026] In combination with the display panel of the invention, in a third possible implementation manner, the number of the horizontal test line is 1, and the number of the vertical test lines is 2;

[0027] The horizontal test line is arranged on the upper side of the display panel;

[0028] The vertical test lines are respectively arranged on the left and right sides of the display panel;

[0029] The two ends of the horizontal test line overlap with the vertical test lines on both sides respectively;

[0030] The non-interlaced and overlapped ends of the vertical test lines are respectively provided with reserved interfaces for connecting to the test PADs.

[0031] In combination with the third possible implementation manner of the invention, in a fourth possible implementation manner, the staggered and overlapping ends of the vertical test line and the horizontal test line are connected by vias / laser fusion;

[0032] The vertical test lines are respectively connected to the Gate lines to be tested through laser fusion;

[0033] The horizontal test line is connected to the Source line to be tested by laser fusion.

[0034] In combination with the display panel of the invention, in a fifth possible implementation manner, the number of the horizontal test lines is 2, and the number of the vertical test lines is 2;

[0035] The horizontal test lines are respectively arranged on the upper and lower sides of the display panel;

[0036] The vertical test lines are respectively arranged on the left and right sides of the display panel;

[0037] The horizontal test line and the vertical test line overlap each other end to end, forming a rectangular test line outside the scanning matrix;

[0038] The two ends of the horizontal test line or the vertical test line are respectively provided with reserved interfaces for connecting to the test PAD, so that the four corners of the rectangular test line are respectively provided with reserved interfaces for connecting to the test PAD.

[0039] In combination with the fifth possible implementation manner of the invention, in a sixth possible implementation manner, the vertical test line and the horizontal test line are staggered and overlapped at the head and tail ends and connected by vias / laser fusion;

[0040] The vertical test lines are respectively connected to the Gate lines to be tested through laser fusion;

[0041] The horizontal test line is connected to the Source line to be tested by laser fusion.

[0042] In a second aspect, a display panel testing method is provided, for testing the display panel described in the first aspect, comprising:

[0043] Step 100, vertical test lines and horizontal test lines are respectively arranged in parallel on the outside of the scanning matrix;

[0044] Step 200: Set one or more of the vertical test lines or the horizontal test lines to be connected to a reserved interface of a test PAD;

[0045] Step 300, connecting the staggered overlapping ends of the vertical test line and the horizontal test line, and respectively connecting the vertical test line and the horizontal test line to the Gate line and the Source line to be tested by laser fusion;

[0046] Step 400: Use the reserved interface to connect the test PAD and test the connected Gate line or Source line;

[0047] Wherein, the step 100 comprises:

[0048] Step 110, using the Gate lines and Source lines to be electrically connected to the display IC respectively, and vertically staggered to form a scan matrix;

[0049] Step 120, using SD layer metal to route the vertical test line above the Gate line in the scan matrix;

[0050] Step 130: Use a Gate layer metal lateral test line to route below the Source line in the scan matrix.

[0051] In combination with the display panel testing method described in the second aspect, in a first possible implementation manner, step 300 includes:

[0052] Step 310: setting the horizontal test line on the upper side of the display panel, and setting the vertical test line on the left and right sides of the display panel respectively;

[0053] Step 320, overlapping the two ends of the horizontal test line with the vertical test lines on both sides;

[0054] Step 330, connecting the staggered and overlapping ends of the vertical test line and the horizontal test line through vias / laser fusion;

[0055] Step 340, connecting the vertical test line and the horizontal test line to the Gate line and the Source line to be tested respectively through laser fusion;

[0056] Among them, the number of the horizontal test lines is 1, and the number of the vertical test lines is 2.

[0057] In combination with the display panel testing method described in the second aspect, in a second possible implementation manner, step 300 further includes:

[0058] Step 350: setting the horizontal test lines on the upper and lower sides of the display panel respectively, and setting the vertical test lines on the left and right sides of the display panel respectively;

[0059] Step 360, overlapping the horizontal test line and the vertical test line end to end to form a rectangular test line outside the scanning matrix;

[0060] Step 370, connecting the overlapping ends of the vertical test line and the horizontal test line through vias / laser fusion;

[0061] Step 380, connecting the vertical test line and the horizontal test line to the Gate line and the Source line to be tested respectively through laser fusion;

[0062] Among them, the number of the horizontal test lines is 2, and the number of the vertical test lines is 2.

[0063] A display panel and a test method thereof described in the present invention are implemented by pre-setting vertical test lines and horizontal test lines on the outside of a scanning matrix, and setting the vertical test lines and horizontal test lines above the Gate lines and below the Source lines respectively. When testing is required, the corresponding Gate lines and Source lines are respectively connected to the vertical test lines and horizontal test lines by laser fusion, and connected to the corresponding PAD through a reserved interface. Thus, any Gate line and Source line can be tested, which solves the problem that the existing display panel can only test individual signals. BRIEF DESCRIPTION OF THE DRAWINGS

[0064] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0065] Figure 1 is a first schematic diagram of a first embodiment of a display panel in the present invention;

[0066] Figure 2 is an enlarged schematic diagram of staggered overlapping ends of a first embodiment of a display panel in the present invention;

[0067] Figure 3 is a second schematic diagram of a first embodiment of a display panel in the present invention;

[0068] Figure 4 is a schematic diagram of a second embodiment of a display panel in the present invention;

[0069] Figure 5 is a schematic diagram of a third embodiment of a display panel in the present invention;

[0070] Figure 6 is a schematic diagram of a first embodiment of a display panel testing method in the present invention;

[0071] Figure 7 is a schematic diagram of a second embodiment of a display panel testing method in the present invention;

[0072] Figure 8 is a schematic diagram of a third embodiment of a display panel testing method in the present invention;

[0073] Fig. 9 is a schematic diagram of a fourth embodiment of a display panel testing method in the present invention;

[0074] The names of the parts indicated by the numbers in the accompanying drawings are: 100 - display panel, 110 - scanning matrix, 111 - Source line, 112 - Gate line, 121 - horizontal test line, 122 - vertical test line, 123 - reserved interface, 124 - staggered overlapping end. DETAILED DESCRIPTION

[0075] The following will be combined with the accompanying drawings in the invention to clearly and completely describe the technical solutions in the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, other embodiments obtained by ordinary technicians in this field without creative work are all within the scope of protection of the present invention.

[0076] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0077] The existing display panel 100 can only reserve the test PAD of individual signals, so that only individual signals can be tested, which is not conducive to the technicians to quickly locate the technical problems existing in the display panel 100.

[0078] In view of the above problems, a display panel 100 and a testing method thereof are proposed.

[0079] In a first aspect, a display panel 100 includes a scan matrix and test lines; the scan matrix includes Gate lines 112 , Source lines 111 and a display IC; the Gate lines 112 and Source lines 111 are electrically connected to the display IC respectively, and are vertically staggered to form a scan matrix 110 .

[0080] Those skilled in the art should understand that the display panel 100 also includes fluorescent tubes, light guide plates, polarizing plates, filter plates, glass substrates, alignment films, liquid crystal materials, thin-film transistors, etc., which perform basic functions.

[0081] The present application mainly makes an innovative design for testing the scanning matrix of the display panel 100 , so as to solve the problem in the prior art that all the Gate lines 112 and Source lines 111 cannot be tested.

[0082] Those skilled in the art should understand that the Gate lines 112 of the scan matrix 110 are parallel to each other, the Source lines 111 are parallel to each other, and the Gate lines 112 and the Source lines 111 cross each other and are perpendicular to each other to form the scan matrix 110 .

[0083] The test lines include a vertical test line 122 and a horizontal test line 121; the vertical test line 122 is arranged on the outside of the scan matrix 110 and is parallel to the Source line 111 in the scan matrix 110, and uses SD layer metal wiring above the Gate line 112 in the scan matrix 110; the horizontal test line 121 is arranged on the outside of the scan matrix 110 and is parallel to the Gate line 112 in the scan matrix 110, and uses Gate layer metal wiring below the Source line 111 in the scan matrix 110; one end of at least one vertical test line 122 is staggered with one end of at least one horizontal test line 121; one or more of the vertical test lines 122 or the horizontal test lines 121 are connected to the test PAD.

[0084] The vertical test line 122 is set on the outside of the scanning matrix 110, the horizontal test line 121 is set on the outside of the scanning matrix 110, the vertical test line 122 is set on the outside of the Source line 111 on the left / right edges of the scanning matrix 110, and the horizontal test line 121 is set on the outside of the Gate line 112 on the upper and lower edges of the scanning matrix 110.

[0085] The overlapping parts of the vertical test lines 122 and the horizontal test lines 121 may be connected by vias, or may be connected by laser fusion during testing.

[0086] A reserved interface 123 for connecting to a test PAD may be provided at any end of the vertical test line 122 and the horizontal test line 121 , and the test PAD is connected to test the Gate line 112 and the Source line 111 .

[0087] By pre-setting the vertical test line 122 and the horizontal test line 121 on the outside of the scanning matrix 110, and setting the vertical test line 122 and the horizontal test line 121 above the Gate line 112 and below the Source line 111 respectively, when testing is needed, the corresponding Gate line 112 and Source line 111 are respectively connected to the vertical test line 122 and the horizontal test line 121 by laser fusion, and any Gate line 112 and Source line 111 can be tested through the connected test PAD, which solves the problem that the existing display panel 100 can only test individual signals.

[0088] In one embodiment, if Figure 1 and Figure 3 , Figure 1 It is a first schematic diagram of a first embodiment of a display panel 100 in the present invention.

[0089] Figure 3 This is the second schematic diagram of the first embodiment of a display panel 100 in the present invention; there is one horizontal test line 121 and one vertical test line 122. The horizontal test line 121 is arranged above the display panel 100; the vertical test line 122 is arranged on the left or right side of the display panel 100; one end of the vertical test line 122 overlaps with one end of the horizontal test line 121; the non-overlapping end of the vertical test line 122 or the horizontal test line 121 is connected to the test PAD.

[0090] In this embodiment, if Figure 2 , Figure 2 It is an enlarged schematic diagram of the staggered overlapping ends 124 of the first embodiment of a display panel 100 in the present invention; the staggered overlapping ends 124 of the vertical test line 122 and the horizontal test line 121 are connected through vias / laser fusion; the vertical test line 122 and the Gate line 112 to be tested are connected through laser fusion; the horizontal test line 121 and the Source line 111 to be tested are connected through laser fusion.

[0091] The vertical test line 122 and the horizontal test line 121 may be connected through vias or not before testing. During testing, the vertical test line 122 and the horizontal test line 121 are laser-fused and connected as needed to complete the display panel 100 test.

[0092] Preferably, when there is only one vertical test line 122 and one horizontal test line, a reserved interface 123 for connecting the test PAD is set at the end that does not overlap, that is, when the vertical test line 122 is set on the left side of the scanning matrix 110, a reserved interface 123 for connecting the test PAD is set at the right end of the horizontal test line 121 and the lower end of the vertical test line 122; when the vertical test line 122 is set on the right side of the scanning matrix 110, a reserved interface 123 for connecting the test PAD is set at the left end of the horizontal test line 121 and the lower end of the vertical test line 122.

[0093] The vertical test line 122 crosses all the Gate lines 112, and uses SD layer metal wiring to fuse the Gate line 112 to be tested with the vertical test line 122 through laser fusion technology. The horizontal test line 121 is set below all the Source lines 111, and uses Gate layer metal wiring to fuse the Gate line 112 to be tested with the horizontal test line 121 through laser fusion technology.

[0094] Those skilled in the art should understand that when the test PAD is set at the non-intersecting overlapping end 124 of the horizontal test line 121 / vertical test line 122, and the horizontal test line 121 and the vertical test line 122 are not connected at the intersecting overlapping end 124, in order to be able to test all the Gate lines 112 and the Source lines 111, laser fusion connection can be performed at the intersecting overlapping position of the vertical test line 122 and the horizontal test line 121, so that the horizontal test line 121 is connected to the vertical test line 122, so as to complete the test of all the Gate lines 112 and the Source lines 111.

[0095] In one embodiment, if Figure 4 , Figure 4 It is a schematic diagram of a second embodiment of a display panel 100 in the present invention.

[0096] The number of the horizontal test line 121 is one, and the number of the vertical test lines 122 is two.

[0097] The horizontal test line 121 is arranged on the upper side of the display panel 100; the vertical test lines 122 are arranged on the left and right sides of the display panel 100 respectively; the two ends of the horizontal test line 121 are respectively overlapped with the vertical test lines 122 on both sides; the non-overlapping ends of the vertical test lines 122 are respectively connected to the test PADs.

[0098] In this embodiment, the staggered overlapping ends 124 of the vertical test line 122 and the horizontal test line 121 are connected through vias / laser fusion; the vertical test line 122 is respectively connected to the Gate line 112 to be tested by laser fusion; the horizontal test line 121 is connected to the Source line 111 to be tested by laser fusion.

[0099] In this embodiment, the horizontal test line 121 and the vertical test line 122 form an inverted U-shaped structure, which is inverted outside the scanning matrix 110. Adding the vertical test line 122 on both sides of the display panel 100 scanning matrix 110 can improve the test accuracy of the Gate line 112.

[0100] Although one vertical test line 122 and one horizontal test line can also test all Gate lines 112 and Source lines 111 , the input signal condition close to the Gate line 112 on the side of the scan matrix 110 where the test line is missing cannot be accurately known.

[0101] In one embodiment, if Figure 5 , Figure 5 FIG. 1 is a schematic diagram of a third embodiment of a display panel 100 in the present invention.

[0102] There are 2 horizontal test lines 121 and 2 vertical test lines 122; the horizontal test lines 121 are respectively arranged on the upper and lower sides of the display panel 100; the vertical test lines 122 are respectively arranged on the left and right sides of the display panel 100; the horizontal test lines 121 and the vertical test lines 122 are overlapped end to end, forming a rectangular test line outside the scanning matrix 110; reserved interfaces 123 for connecting to the test PAD are respectively arranged at the beginning and end of the horizontal test line 121 or the vertical test line 122, so that the four corners of the rectangular test line are respectively arranged with reserved interfaces 123 for connecting to the test PAD.

[0103] In this embodiment, the staggered overlapping ends 124 of the vertical test line 122 and the horizontal test line 121 are connected by vias / laser fusion; the vertical test line 122 is respectively connected to the Gate line 112 to be tested by laser fusion; the horizontal test line 121 is connected to the Source line 111 to be tested by laser fusion.

[0104] In this embodiment, the horizontal test line 121 and the vertical test line 122 form a rectangular test line structure, which is enclosed outside the scan matrix 110. Adding the vertical test line 122 on both sides and the bottom of the display panel 100 scan matrix 110 can improve the test accuracy of the Gate line 112.

[0105] In this embodiment, reserved interfaces 123 for connecting to the test PAD can be reserved at the four corners of the rectangular test line structure. Preferably, the horizontal test line on the lower side is arranged between the display IC and the outermost Gate line to test all Gate lines 112, Source lines 111 and their input signals, thereby improving the test accuracy and allowing testers to quickly find problems with the display panel 100.

[0106] Although two vertical test lines 122 and one horizontal test line can also test all Gate lines 112 and Source lines 111 , the input signal conditions close to the IC at the bottom of the scan matrix 110 where there are no test lines cannot be accurately known.

[0107] Second, as Figure 6 , Figure 6 It is a schematic diagram of a first embodiment of a display panel 100 testing method in the present invention; a display panel 100 testing method, used for testing the display panel 100 of the first aspect, comprising: step 100, setting the vertical test line 122 and the horizontal test line 121 in parallel on the outside of the scanning matrix 110 respectively; step 200, setting one or more of the vertical test line 122 or the horizontal test line 121 to connect to the reserved interface 123 of the test PAD; step 300, connecting the staggered overlapping ends 124 of the vertical test line 122 and the horizontal test line 121, and laser fusion connecting the vertical test line 122 and the horizontal test line 121 to the Gate line 112 and the Source line 111 to be tested respectively; step 400, connecting the test PAD using the reserved interface 123, and testing the Gate line 112 or the Source line 111;

[0108] Among them, Figure 7 , Figure 7 It is a schematic diagram of a second embodiment of a display panel 100 testing method in the present invention; step 100 includes: step 110, using Gate lines 112 and Source lines 111 to be electrically connected to the display IC respectively, and vertically staggered to form a scanning matrix 110; step 120, using SD layer metal to route the vertical test line 122 above the Gate line 112 in the scanning matrix 110; step 130, using Gate layer metal to route the horizontal test line 121 below the Source line 111 in the scanning matrix 110.

[0109] Preferably, if Figure 8 , Figure 8 It is a schematic diagram of the third embodiment of a display panel 100 testing method in the present invention; step 300 includes: step 310, setting the horizontal test line 121 on the upper side of the display panel 100, and setting the vertical test line 122 on the left and right sides of the display panel 100 respectively; step 320, staggering and overlapping the two ends of the horizontal test line 121 with the vertical test lines 122 on both sides respectively; step 330, connecting the vertical test line 122 and the staggered overlapping ends 124 of the horizontal test line 121 through vias / laser fusion; step 340, connecting the vertical test line 122 and the horizontal test line 121 respectively and correspondingly with the Gate line 112 and the Source line 111 to be tested through laser fusion.

[0110] In this embodiment, the number of the horizontal test line 121 is one, and the number of the vertical test lines 122 is two.

[0111] Preferably, if Fig. 9 , Fig. 9 It is a schematic diagram of a fourth embodiment of a display panel 100 test method in the present invention; step 300 includes: step 350, respectively setting the horizontal test line 121 on the upper and lower sides of the display panel 100, and respectively setting the vertical test line 122 on the left and right sides of the display panel 100; step 360, overlapping the horizontal test line 121 and the vertical test line 122 end to end, and forming a rectangular test line outside the scanning matrix 110; step 370, connecting the end 124 of the vertical test line 122 and the horizontal test line 121 that overlap end to end through a via / laser fusion; step 380, connecting the vertical test line 122 and the horizontal test line 121 to the Gate line 112 and the Source line 111 to be tested respectively through laser fusion;

[0112] In this embodiment, the number of the horizontal test lines 121 is two, and the number of the vertical test lines 122 is two.

[0113] A display panel 100 and a test method thereof implementing the present invention are implemented by pre-setting a vertical test line 122 and a horizontal test line 121 on the outside of a scanning matrix 110, and respectively setting the vertical test line 122 and the horizontal test line 121 above a Gate line 112 and below a Source line 111. When testing is required, the corresponding Gate line 112 and Source line 111 are respectively connected to the vertical test line 122 and the horizontal test line 121 by laser fusion. Any Gate line 112 and Source line 111 can be tested through the connected test PAD, thereby solving the problem that the existing display panel 100 can only test individual signals.

[0114] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A display panel, characterized in that: include: Scan matrix; Test line; The scanning matrix includes Gate lines, Source lines and a display IC; The Gate lines and Source lines are electrically connected to the display IC respectively, and are vertically staggered to form a scanning matrix; The test line includes: Vertical test line; Horizontal test line; The vertical test line is arranged outside the scan matrix and is parallel to the Source line in the scan matrix, and is wired above the Gate line in the scan matrix using SD layer metal wiring; The horizontal test line is arranged outside the scan matrix and is parallel to the Gate line in the scan matrix, and is wired below the Source line in the scan matrix using Gate layer metal wiring; One end of at least one of the vertical test lines is interlaced with one end of at least one of the horizontal test lines; One or more of the vertical test lines or the horizontal test lines are provided with a reserved interface for connecting to a test PAD; The vertical test line is set outside the scan matrix, the horizontal test line is set outside the scan matrix, the vertical test line is set outside the Source line on the left and right edges of the scan matrix, and the horizontal test line is set outside the Gate line on the upper and lower edges of the scan matrix; The vertical test line and the horizontal test line are connected through vias before testing, or not connected; The intersections of the vertical test lines and the horizontal test lines are connected by laser fusion during testing; the vertical test lines are respectively connected to the Gate lines to be tested by laser fusion; By pre-setting the vertical test lines and horizontal test lines on the outside of the scanning matrix, and setting the vertical test lines and horizontal test lines above the Gate lines and below the Source lines respectively, when testing is needed, the corresponding Gate lines and Source lines are respectively connected to the vertical test lines and horizontal test lines by laser fusion, and any Gate line and Source line is tested through the connected test PAD.

2. The display panel according to claim 1, characterized in that: The number of the horizontal test line is 1, and the number of the vertical test line is 1; The horizontal test line is arranged above the display panel; The vertical test line is arranged on the left side or the right side of the display panel; One end of the vertical test line overlaps with one end of the horizontal test line; A reserved interface for connecting to a test PAD is provided at one end of the vertical test line or the horizontal test line that is not staggered and overlapped.

3. The display panel according to claim 1, characterized in that: The number of the horizontal test lines is 1, and the number of the vertical test lines is 2; The horizontal test line is arranged on the upper side of the display panel; The vertical test lines are respectively arranged on the left and right sides of the display panel; The two ends of the horizontal test line overlap with the vertical test lines on both sides respectively; The non-interlaced and overlapped ends of the vertical test lines are respectively provided with reserved interfaces for connecting to the test PADs.

4. The display panel according to claim 1, characterized in that: The number of the horizontal test lines is 2, and the number of the vertical test lines is 2; The horizontal test lines are respectively arranged on the upper and lower sides of the display panel; The vertical test lines are respectively arranged on the left and right sides of the display panel; The horizontal test line and the vertical test line overlap each other end to end, forming a rectangular test line outside the scanning matrix; The two ends of the horizontal test line or the vertical test line are respectively provided with reserved interfaces for connecting to the test PAD, so that the four corners of the rectangular test line are respectively provided with reserved interfaces for connecting to the test PAD.

5. The display panel according to claim 4, characterized in that: The vertical test line and the horizontal test line are staggered and overlapped at the beginning and the end, and are connected by vias / laser fusion.

6. A display panel testing method, used to test the display panel according to any one of claims 1 to 5, characterized in that: include: Step 100, vertical test lines and horizontal test lines are respectively arranged in parallel on the outside of the scanning matrix; Step 200: Set one or more of the vertical test lines or the horizontal test lines to be connected to a reserved interface of a test PAD; Step 300, connecting the staggered overlapping ends of the vertical test line and the horizontal test line, and respectively connecting the vertical test line and the horizontal test line to the Gate line and the Source line to be tested by laser fusion; Step 400: Use the reserved interface to connect the test PAD and test the connected Gate line or Source line; Wherein, the step 100 comprises: Step 110, using the Gate lines and Source lines to be electrically connected to the display IC respectively, and vertically staggered to form a scan matrix; Step 120, using SD layer metal to route the vertical test line above the Gate line in the scan matrix; Step 130: Use a Gate layer metal lateral test line to route below the Source line in the scan matrix.

7. The display panel testing method according to claim 6, characterized in that: The step 300 includes: Step 310: setting the horizontal test line on the upper side of the display panel, and setting the vertical test line on the left and right sides of the display panel respectively; Step 320, overlapping the two ends of the horizontal test line with the vertical test lines on both sides; Step 330, connecting the staggered and overlapping ends of the vertical test line and the horizontal test line through vias / laser fusion; Step 340, connecting the vertical test line and the horizontal test line to the Gate line and the Source line to be tested respectively through laser fusion; Among them, the number of the horizontal test lines is 1, and the number of the vertical test lines is 2.

8. The display panel testing method according to claim 7, characterized in that: The step 300 further includes: Step 350: setting the horizontal test lines on the upper and lower sides of the display panel respectively, and setting the vertical test lines on the left and right sides of the display panel respectively; Step 360, overlapping the horizontal test line and the vertical test line end to end to form a rectangular test line outside the scanning matrix; Step 370, connecting the overlapping ends of the vertical test line and the horizontal test line through vias / laser fusion; Step 380, connecting the vertical test line and the horizontal test line to the Gate line and the Source line to be tested respectively through laser fusion; Among them, the number of the horizontal test lines is 2, and the number of the vertical test lines is 2.

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