Measurement device and image forming apparatus

Abstract

A measuring device and an image forming apparatus are disclosed. The measuring device includes: a measuring unit having a first mode for measuring the resistance of a recording medium used in the image forming apparatus within a first range of predetermined resistance values, and a second mode for measuring the resistance within a second range of resistance values ​​different from the first range, wherein the second range and the first range are set such that, for the resistance of multiple brands of recording media, the number of brands belonging to the second range is greater than the number of brands belonging to the first range; and a control unit for controlling the measuring unit to execute the second mode preferentially over the first mode.

Description

Technical Field

[0001] This disclosure relates to a measuring device and an image forming device. Background Technology

[0002] Japanese Patent Application Publication No. 2011-137774 discloses a measuring terminal for measuring the resistance of a thin film using a four-terminal method. The four measuring terminals are fixed in position such that the value obtained by dividing the measured voltage value by the current value becomes equal to the sheet resistance value of the thin film. Summary of the Invention

[0003] As a measuring device, consider the following measuring device, which has a first mode for measuring the resistance of a recording medium used in an image forming apparatus within a first range of predetermined resistance values, and a second mode for measuring the resistance within a second range of resistance values ​​different from the first range, wherein the second range and the first range are set such that, with respect to the resistance of multiple brands of recording media, the number of brands belonging to the second range is greater than the number of brands belonging to the first range.

[0004] In the measuring device, the following situation exists: when the first mode is executed before the second mode, the measurement time for measuring the resistance of the recording medium is long.

[0005] The purpose of this disclosure is to shorten the measurement time for measuring the resistance of the recording medium compared to a structure that prioritizes the first mode over the second mode in controlling the measuring unit.

[0006] According to a first aspect of this disclosure, a measuring apparatus is provided, comprising: a measuring unit having a first mode for measuring the resistance of a recording medium used in an image forming apparatus within a first range of predetermined resistance values, and a second mode for measuring the resistance within a second range of resistance values ​​different from the first range, wherein the second range and the first range are set such that, for the resistance of multiple brands of recording media, the number of brands belonging to the second range is greater than the number of brands belonging to the first range; and a control unit for controlling the measuring unit to execute the second mode preferentially over the first mode.

[0007] According to the second aspect of this disclosure, the control unit controls the measuring unit in such a way that when the resistance of the recording medium measured by the second mode is within the second range, the control unit does not execute the first mode.

[0008] According to the third aspect of this disclosure, the control unit controls the measurement unit in the following way: when the resistance of the recording medium measured by the second mode is included in the second range, the control unit executes the third mode, wherein the resistance is measured in the second range, and the number of samples used for resistance measurement is greater than that in the second mode or the measurement time is longer than that in the second mode.

[0009] According to the fourth aspect of this disclosure, the control unit controls the measurement unit in the following way: when the resistance of the recording medium measured by the second mode is not included in the second range, the control unit executes the first mode.

[0010] According to the fifth aspect of this disclosure, the control unit controls the measurement unit as follows: when the resistance of the recording medium measured by the first mode is within the first range, the control unit executes a fourth mode, wherein the resistance is measured within the first range and the number of samples used for resistance measurement is greater than that of the first mode or the measurement time is longer than that of the first mode.

[0011] According to the sixth aspect of this disclosure, the control unit controls the measurement unit in such a way that when the resistance of the recording medium measured by the first mode is not included in the first range, the control unit executes a fifth mode to measure the resistance in a third range of resistance values ​​that are different from the first range and the second range.

[0012] According to the seventh aspect of this disclosure, the second range is set to the range to which the resistance values ​​of more than half of the brands belong.

[0013] According to the eighth aspect of this disclosure, an acquisition unit is included, which acquires an execution instruction to perform the control. When the acquisition unit acquires the execution instruction to perform the control, the control unit performs the control on the measurement unit, and when the acquisition unit does not acquire the execution instruction to perform the control, the control is not performed on the measurement unit.

[0014] According to the ninth aspect of this disclosure, the acquisition unit acquires and executes either a first control execution instruction or a second control execution instruction, which are the control of the acquisition unit. When the acquisition unit acquires the first control execution instruction, the control unit performs the first control on the measurement unit. When the acquisition unit acquires the second control execution instruction, the control unit performs the second control on the measurement unit, causing it to execute both the first mode and the second mode, regardless of the measurement result measured by the measurement unit.

[0015] According to the tenth aspect of this disclosure, an image forming apparatus is provided, comprising: the measuring device; an image forming unit for forming an image on a recording medium on which the resistance is measured by the measuring device; and a control device for controlling the image forming operation of the image forming unit based on the resistance measured by the measuring device.

[0016] (Effect)

[0017] According to the first scheme, compared with the structure that controls the measuring unit to execute the first mode before the second mode, the measurement time for measuring the resistance of the recording medium can be shortened.

[0018] According to the second scheme, compared with the structure that always executes the first mode after executing the second mode, the measurement time for measuring the resistance of the recording medium can be shortened.

[0019] According to the third scheme, compared with the structure that terminates the process without executing the third mode when the resistance of the recording medium measured by the second mode is within the second range, the resistance of the recording medium can be measured with high accuracy.

[0020] According to the fourth scheme, it is possible to determine whether the resistance of the recording medium is a resistance value included in the first range.

[0021] According to the fifth scheme, compared with the structure that terminates the process without executing the fourth mode when the resistance of the recording medium measured by the first mode is within the first range, the resistance of the recording medium can be measured with high precision.

[0022] According to the sixth scheme, it is possible to determine whether the resistance of the recording medium is a resistance value included in the third range.

[0023] According to the seventh scheme, compared with the structure in which the second range is set to the range to which the resistance of less than half of the brands belongs, the measurement time for measuring the resistance of the recording medium can be shortened.

[0024] According to the eighth scheme, it is possible to choose whether to execute the control of the second mode, which takes precedence over the first mode.

[0025] According to the ninth scheme, it is possible to select which of the first control and the second control to execute.

[0026] According to the tenth embodiment, compared with a structure that performs the image forming operation of the image forming unit independently of the resistance of the recording medium, a high-quality image can be formed on the recording medium. Attached Figure Description

[0027] Figure 1 This is a block diagram illustrating the structure of the image forming apparatus of this embodiment.

[0028] Figure 2 This is a schematic diagram showing the structure of the measuring device according to this embodiment.

[0029] Figure 3 This is a diagram used to illustrate the measurement range of the measuring device in this embodiment.

[0030] Figure 4 This is a block diagram illustrating an example of the hardware structure of the control circuit in this embodiment.

[0031] Figure 5 This is a block diagram illustrating an example of the functional structure of the processor in the control circuit of this embodiment.

[0032] Figure 6 This is a flowchart illustrating the control processing flow of this embodiment.

[0033] Figure 7 This is a flowchart illustrating the time-priority processing flow of this embodiment.

[0034] Figure 8 This is a flowchart illustrating the precision-priority processing flow in this embodiment. Detailed Implementation

[0035] Hereinafter, an example of an embodiment of the present disclosure will be described based on the accompanying drawings.

[0036] (Image forming apparatus 10)

[0037] The structure of the image forming apparatus 10 of this embodiment will be described. Figure 1 This is a block diagram illustrating the structure of the image forming apparatus 10 in this embodiment.

[0038] Figure 1 The image forming apparatus 10 shown is an image forming apparatus. Specifically, as... Figure 1 As shown, the image forming apparatus 10 includes an image forming apparatus body 11, a media receiving section 12, an image forming section 14, a conveying mechanism 15, a control device 16, and a measuring device 20. The image forming apparatus 10 can transmit and receive data with a user terminal 19. The following describes each part of the image forming apparatus 10.

[0039] (Image forming apparatus body 11)

[0040] Figure 1 The image forming apparatus body 11 shown is a part in which the various structural parts of the image forming apparatus 10 are disposed. Specifically, the image forming apparatus body 11 includes, for example, a frame formed in the shape of a box. In this embodiment, a media receiving section 12, an image forming section 14, and a conveying mechanism 15 are provided inside the image forming apparatus body 11.

[0041] (Media containment section 12)

[0042] Figure 1 The media receiving section 12 shown is the portion of the image forming apparatus 10 that houses the paper P. The paper P housed in the media receiving section 12 is supplied to the image forming section 14. Furthermore, the paper P is an example of a "recording medium".

[0043] (Image forming unit 14)

[0044] Figure 1 The image forming unit 14 shown has the function of forming an image on the paper P supplied from the media receiving unit 12. Examples of image forming units 14 include inkjet image forming units that form images on paper P using ink, and electrophotographic image forming units that form images on paper P using toner.

[0045] In an inkjet image forming unit, for example, ink droplets are ejected from the ejection section onto a piece of paper P to form an image on the paper P. Alternatively, an inkjet image forming unit may eject ink droplets from the ejection section onto a transfer body and transfer the ink droplets from the transfer body onto the paper P, thereby forming an image on the paper P.

[0046] In an electrophotographic image forming unit, for example, processes such as charging, exposure, development, transfer, and fixing are performed to form an image on paper P. Alternatively, an electrophotographic image forming unit can perform processes such as charging, exposure, development, and transfer to form an image on a transfer medium. After transferring the image from the transfer medium to paper P, the image is fixed onto paper P, thereby forming an image on paper P.

[0047] Furthermore, as an example of an image forming unit, it is not limited to the aforementioned inkjet image forming unit and the aforementioned electrophotographic image forming unit; various image forming units can be used.

[0048] (Transportation Agency 15)

[0049] Figure 1 The conveying mechanism 15 shown is a mechanism for conveying paper P. As an example, the conveying mechanism 15 conveys paper P by conveying members such as conveying rollers and conveying belts (not shown). The conveying mechanism 15 uses a pre-defined conveying path to convey paper P from the media receiving section 12 to the image forming section 14.

[0050] (Summary of user terminal 19, control device 16 and measuring device 20)

[0051] Figure 1The user terminal 19 shown may include, for example, a smartphone, tablet, or personal computer. The user terminal 19 can communicate with the measuring device 20 and the control device 16 wirelessly or via a wired connection. Figure 1 As shown, as an example, the measuring device 20 and the control device 16 are disposed outside the image forming apparatus body 11. Furthermore, the user terminal 19 and the control device 16 are each configured with a control unit (control board), which includes a recording unit containing a memory storing programs and a processor that runs according to the programs.

[0052] In this embodiment, the user of the image forming apparatus 10 (i.e., the user) places a piece of paper P for which an image is to be formed in the measuring device 20 and issues a measurement instruction from the user terminal 19. When the measuring device 20 receives the measurement instruction from the user terminal 19, it measures the physical properties of the paper P and sends measurement value information representing the measured physical properties to the user terminal 19.

[0053] The user of the image forming apparatus 10, for example, takes a piece of paper P that has been measured by the measuring device 20 and places it into the media receiving unit 12, and issues measurement instructions and image forming instructions from the user terminal 19. In addition, the image forming instruction can also serve as the measurement instruction.

[0054] When the control device 16 receives an acquisition instruction from the user terminal 19, it acquires measurement value information from the user terminal 19. When the control device 16 receives an image forming instruction from the user terminal 19, it causes the image forming unit 14 and the transport mechanism 15 to perform image forming operations, and controls the operations of the image forming unit 14 and the transport mechanism 15 based on the measurement value information. Specifically, the control device 16 controls the transport speed of the paper P in the transport mechanism 15, and the transfer voltage and fixing temperature in the image forming unit 14, etc., based on the measurement value information.

[0055] Furthermore, in the aforementioned example, the control device 16 is located outside the image forming apparatus body 11, but it may also be located inside the image forming apparatus body 11. Moreover, the control device 16 acquires the measurement value information of the measuring device 20 via the user terminal 19, but it may also be a structure that directly acquires the measurement value information from the measuring device 20.

[0056] Furthermore, the measuring device 20 is located outside the image forming apparatus body 11, but it can also be located inside the image forming apparatus body 11. Specifically, the measuring device 20 can also be configured as a device for measuring physical properties in the medium receiving section 12 or the transport path of the paper P.

[0057] (Specific structure of measuring device 20)

[0058] Figure 2This is a schematic diagram showing the structure of the measuring device 20 according to this embodiment. In the diagram, arrow UP indicates the top (vertical top) of the device, and arrow DO indicates the bottom (vertical bottom) of the device. Furthermore, arrow LH indicates the left side of the device, and arrow RH indicates the right side. Also, arrow FR indicates the front of the device, and arrow RR indicates the rear of the device. These directions are provided for ease of explanation, and the device structure is not limited to these directions. Additionally, the term "device" may sometimes be omitted in the description of the various directions of the device. That is, for example, "above the device" may sometimes be simply referred to as "above".

[0059] Furthermore, in the following explanations, "up and down direction" is sometimes used to mean "both the directions above and below" or "either the directions above and below." "Left and right direction" is sometimes used to mean "both the directions to the right and left" or "either the directions to the right and left." "Left and right direction" can also be called the horizontal direction or the lateral direction. "Front and back direction" is sometimes used to mean "both the directions to the front and back" or "either the directions to the front and back." The front and back direction can also be called the horizontal direction or the lateral direction. Moreover, the up and down, left and right, and front and back directions are intersecting directions (specifically, orthogonal directions).

[0060] Furthermore, the "×" symbol within the "○" in the diagram indicates an arrow pointing from the front of the paper towards the depths. Also, the "·" symbol within the "○" in the diagram indicates an arrow pointing from the depths of the paper towards the front.

[0061] The measuring device 20 is an apparatus for measuring the physical properties of the paper P used in the image forming apparatus 10. Specifically, the measuring device 20 measures the basis weight, resistivity, and presence or absence of a coating on the paper P. Furthermore, "measuring" refers to measuring the value (i.e., degree) of a physical property, but the value of the physical property includes the concept of 0 (zero). In other words, "measuring" includes: measuring whether the value of the physical property is 0 (zero), that is, measuring whether the physical property exists.

[0062] Specifically, such as Figure 2 As shown, the measuring device 20 includes a first frame 21, a second frame 22, a weight measuring unit 30, a resistance measuring unit 50, and a coating measuring unit 70. The following describes each part of the measuring device 20.

[0063] (First frame 21)

[0064] The first frame 21 is a portion of the various structural parts of the measuring device 20. The first frame 21 forms the lower side portion of the measuring device 20. The first frame 21 has a facing surface 21A facing the lower surface of the paper P. The facing surface 21A is also a support surface that supports the paper P from below. Inside the first frame 21, a portion of the basis weight measuring unit 30 and a portion of the resistance measuring unit 50 are disposed.

[0065] (Second frame 22)

[0066] The second frame 22 is another part of the structure of the measuring device 20. The second frame 22 forms the upper side of the measuring device 20. The second frame 22 has a facing surface 22A facing the upper surface of the paper P. Inside the second frame 22, another part of the basis weight measuring unit 30, the coating measuring unit 70, and another part of the resistance measuring unit 50 are arranged. In the measuring device 20, a piece of paper P, which is an example of the object to be measured, is arranged between the first frame 21 and the second frame 22.

[0067] Furthermore, the second frame 22, for example, adopts a structure in which it can move relative to the first frame 21 in a direction that approaches and isolates it (specifically, in the vertical direction). After the paper P is positioned between the first frame 21 and the second frame 22, it moves relative to the first frame 21 in a direction that approaches it, so as to be located in... Figure 2 The location shown.

[0068] (Weight Measurement Section 30)

[0069] Figure 2 The basis weight measuring unit 30 shown has a method for measuring the basis weight [g / m] of paper P by vibrating it with ultrasound. 2 The function of performing measurements. Specifically, such as... Figure 2 As shown, the weight measuring unit 30 includes a drive circuit 31, a transmitting unit 32, a receiving unit 35, and a processing unit 36.

[0070] The transmitting unit 32 has the function of transmitting ultrasonic waves toward the paper P. The transmitting unit 32 is disposed in the second frame 22. That is, the transmitting unit 32 is disposed in a position facing one side (specifically, the upper surface) of the paper P. In addition, an opening 24 is formed on the lower side of the transmitting unit 32 in the second frame 22 to allow the ultrasonic waves from the transmitting unit 32 to pass toward the paper P.

[0071] The drive circuit 31 drives the transmitting unit 32. By driving the transmitting unit 32 through the drive circuit 31, the transmitting unit 32 imparts ultrasonic waves from the upper surface of the paper P, causing the paper P to vibrate. The vibrating paper P causes the air below the paper P to vibrate. In other words, the ultrasonic waves from the transmitting unit 32 pass through the paper P.

[0072] The receiving unit 35 has the function of receiving ultrasonic waves that have passed through the paper P. The receiving unit 35 is disposed in the first frame 21. That is, the receiving unit 35 is disposed facing the other side (specifically, the lower surface) of the paper P. The receiving unit 35 receives ultrasonic waves that have passed through the paper P, thereby generating a received signal. In addition, an opening 23 is formed on the upper side of the receiving unit 35 in the first frame 21 to allow ultrasonic waves from the paper P side to pass towards the receiving unit 35.

[0073] Thus, in the basis weight measuring unit 30, the transmitting unit 32 and the receiving unit 35 constitute a detection unit (specifically a detection sensor) that detects information indicating the basis weight of the paper P (specifically, ultrasonic waves transmitted through the paper P). The driving circuit 31 constitutes a circuit that drives the detection unit.

[0074] The processing unit 36 ​​performs amplification and other processing on the received signal acquired from the receiving unit 35 to obtain a measurement value. Then, the processing unit 36 ​​outputs measurement value information representing the obtained measurement value to the user terminal 19. As an example, the processing unit 36 ​​includes circuitry containing an amplifier circuit or the like.

[0075] The measurement values ​​obtained by the processing unit 36 ​​are values ​​related to the basis weight of the paper P. Therefore, the measurement in the basis weight measuring unit 30 includes not only measuring the basis weight of the paper P itself, but also measuring the measurement values ​​related to the basis weight of the paper P.

[0076] Furthermore, in the basis weight measuring unit 30, the basis weight of paper P can also be calculated based on the measured value obtained by the processing unit 36. Specifically, the basis weight measuring unit 30 calculates the basis weight, for example, based on correlation data indicating the relationship between the measured value and the basis weight.

[0077] (Coating Measurement Unit 70)

[0078] Figure 2 The coating measuring unit 70 shown has the function of measuring the presence or absence of a coating on paper P. A coating is a layer formed by applying a coating agent to the surface of the paper. In other words, the coating measuring unit 70 measures whether paper P is coated paper (i.e., coated paper). Specifically, as... Figure 2 As shown, the coating measurement unit 70 includes a drive circuit 71, a light irradiation unit 72, a light receiving unit 75, and a processing unit 76.

[0079] The light irradiation unit 72 has the function of irradiating light onto the paper P. The light irradiation unit 72 is disposed in the second frame 22. That is, the light irradiation unit 72 is disposed in a facing position with a gap relative to one side (specifically the upper surface) of the paper P. In addition, an opening 28 is formed on the lower side of the light irradiation unit 72 in the second frame 22 to allow light from the light irradiation unit 72 to pass through toward the paper P.

[0080] The driving circuit 71 is a circuit that drives the light irradiation unit 72. By driving the light irradiation unit 72 through the driving circuit 71, the light irradiation unit 72 irradiates light onto the paper P, and the light is reflected by the paper P.

[0081] The light-receiving portion 75 has the function of receiving reflected light reflected by the paper P. The light-receiving portion 75 is disposed in the second frame 22. That is, the light-receiving portion 75 is disposed in a facing position with a gap relative to one side (specifically the upper surface) of the paper P. The light-receiving portion 75 receives the reflected light reflected by the paper P, thereby generating a light-receiving signal. In addition, an opening 29 is formed on the lower side of the light-receiving portion 75 in the second frame 22 to allow light from the paper P side to pass through the light-receiving portion 75.

[0082] Thus, in the coating measurement unit 70, a detection unit (specifically a detection sensor) is formed by the light irradiation unit 72 and the light receiving unit 75 to detect information indicating the presence or absence of a coating on the paper P (specifically, reflected light reflected by the paper P). The drive circuit 71 forms the circuit for driving the detection unit.

[0083] The processing unit 76 performs amplification and other processing on the light-receiving signal acquired from the light-receiving unit 75 to obtain a measurement value. Then, the processing unit 76 outputs measurement value information representing the obtained measurement value to the user terminal 19. As an example, the processing unit 76 includes circuitry containing amplifier circuitry, etc.

[0084] The measurement values ​​obtained by the processing unit 76 are values ​​related to the presence or absence of the coating on the paper P. Therefore, the measurement in the coating measurement unit 70 includes not only measuring the presence or absence of the coating on the paper P itself, but also measuring the measurement values ​​related to the presence or absence of the coating on the paper P.

[0085] Furthermore, in the coating measurement unit 70, the presence or absence of a coating on the paper P can also be determined based on the measurement values ​​obtained by the processing unit 76. Specifically, the presence or absence of a coating is determined, for example, based on whether the measurement value exceeds a predetermined threshold.

[0086] (Resistance measuring section 50)

[0087] Figure 2 The resistance measuring unit 50 shown has the function of measuring the surface resistance value [Ω] of paper P. The resistance measuring unit 50 is an example of a "measuring unit". Surface resistance is an example of "resistance". Specifically, as... Figure 2 As shown, the resistance measuring unit 50 includes a circuit 51, a pair of terminals 52, a power supply 53, a pair of opposing members 54, a detection circuit 55, and a processing unit 56.

[0088] A pair of terminals 52 are disposed, for example, in the first frame 21. The pair of terminals 52, spaced apart from each other in the left-right direction, contact the lower surface of the paper P through an opening 25 formed in the first frame 21. Each pair of terminals 52 is electrically connected to a power supply 53 via a circuit 51.

[0089] A pair of opposing members 54 face each other with a piece of paper P disposed between each pair of terminals 52. Each pair of opposing members 54 contacts the upper surface of the paper P through an opening 26 formed in the second frame 22. That is, the paper P is sandwiched between each opposing member of the pair of opposing members 54 and each terminal of the pair of terminals 52. As an example, each opposing member of the pair of opposing members 54 and each terminal of the pair of terminals 52 includes a roller.

[0090] Power supply 53 applies a predetermined voltage (V) to a pair of terminals 52 via circuit 51. Consequently, a current corresponding to the surface resistance of the paper P flows between the pairs of terminals 52. Detection circuit 55 is electrically connected to the pairs of terminals 52. Detection circuit 55 generates a detection signal by detecting the current flowing between the pairs of terminals 52.

[0091] Thus, in the resistance measuring unit 50, a pair of terminals 52 and a detection circuit 55 constitute a detection unit (specifically a detection sensor) that detects information representing the surface resistance of the paper P (specifically, the current flowing through the paper P). The circuit 51 constitutes a circuit that drives the detection unit.

[0092] The processing unit 56 amplifies and processes the detection signal acquired from the detection circuit 55 to obtain a measured value (specifically, a current value [A]). Then, the processing unit 56 outputs the measured value information, representing the obtained measured value, to the user terminal 19. As an example, the processing unit 56 includes circuitry containing an amplifier circuit, etc.

[0093] The measured value obtained by the processing unit 56 is a value related to the surface resistance value of the paper P. Therefore, the measurement in the resistance measuring unit 50 includes not only measuring the surface resistance value of the paper P itself, but also measuring the measured value related to the surface resistance value of the paper P. In addition, the surface resistance value of the paper P can also be calculated in the resistance measuring unit 50 based on the measured value obtained by the processing unit 56.

[0094] Furthermore, the resistance measuring unit 50 employs a structure in which a predetermined voltage is applied to a pair of terminals 52, and the surface resistance value is determined by detecting the current flowing between the pair of terminals 52. However, this is not a limitation. For example, a structure could also be used in which a predetermined current value is allowed to flow through the pair of terminals 52, and the voltage between the pair of terminals 52 is detected to determine the surface resistance value.

[0095] (Measurement mode of resistance measuring unit 50)

[0096] The resistance measuring unit 50 has multiple measuring modes. Specifically, the resistance measuring unit 50 has a first measuring mode, a second measuring mode, a third measuring mode, a fourth measuring mode, and a fifth measuring mode. The first measuring mode, the second measuring mode, the third measuring mode, the fourth measuring mode, and the fifth measuring mode are modes that measure within a predetermined range of surface resistance values.

[0097] The first and fourth measurement modes cover a measurement range exceeding 11.5 [logΩ] and below 14.5 [logΩ] (hereinafter referred to as the high resistance measurement range). Figure 3 The first and fourth measurement modes are used to measure surface resistance. In the first and fourth measurement modes, the voltage applied to the paper P and the magnification in the amplification process are set to correspond to the high resistance measurement range.

[0098] Furthermore, the fourth measurement mode is a mode that measures surface resistance with higher precision than the first measurement mode. Specifically, in the fourth measurement mode, the number of samples used for measuring surface resistance is greater than in the first measurement mode, or the measurement time is longer than in the first measurement mode. More specifically, the processing unit 56 performs processes such as increasing the number of detection signals acquired from the detection circuit 55 (i.e., the number of samples) and calculating an average based on the detection signals to obtain the measured value.

[0099] Hereinafter, the first measurement mode will be referred to as the "high resistance measurement mode," and the fourth measurement mode will be referred to as the "high resistance measurement mode (high precision)." Additionally, the high resistance measurement mode can be an example of the "first mode," and the high resistance measurement mode (high precision) can be an example of the "fourth mode." The high resistance measurement range can be an example of the "first range."

[0100] The second and third measurement modes cover a measurement range exceeding 9 [logΩ] and below 11.5 [logΩ] (hereinafter referred to as the medium resistance measurement range). Figure 3 The measurement is performed in two modes. In the second and third measurement modes, the voltage applied to the paper P and the amplification rate in the amplification process are set corresponding to the medium resistance measurement range. Specifically, in the second and third measurement modes, at least one of the voltage and amplification rate in the high resistance measurement mode is set to low. That is, in the high resistance measurement mode, at least one of the voltage applied to the paper P and the amplification rate is set to be higher than in the second and third measurement modes. This is because, in the high resistance measurement range, the current is less likely to flow than in the medium resistance measurement range, and the current detected by the detection circuit 55 becomes very small.

[0101] Furthermore, the third measurement mode is a mode that measures the surface resistance value with higher precision than the second measurement mode. Specifically, in the third measurement mode, the number of samples used for measuring the surface resistance value is greater than in the second measurement mode, or the measurement time is longer than in the second measurement mode. More specifically, the processing unit 56 performs processes such as increasing the number of detection signals acquired from the detection circuit 55 (i.e., the number of samples) and calculating an average based on the detection signals to obtain the measured value.

[0102] Hereinafter, the second measurement mode will be referred to as the "medium resistance measurement mode," and the third measurement mode will be referred to as the "medium resistance measurement mode (high precision)." Furthermore, the medium resistance measurement mode is an example of the "second mode," and the medium resistance measurement mode (high precision) is an example of the "third mode." The medium resistance measurement range is an example of the "second range."

[0103] The fifth measurement mode is a measurement range exceeding 4 [logΩ] and below 9 [logΩ] (hereinafter referred to as the low resistance measurement range (refer to...)). Figure 3 The fifth measurement mode is used to measure the surface resistance value. In the fifth measurement mode, the voltage applied to the paper P and the magnification in the amplification process are set corresponding to the low resistance measurement range. Specifically, in the fifth measurement mode, at least one of the voltage and amplification in the medium resistance measurement mode is set to low. That is, in the medium resistance measurement mode, at least one of the voltage applied to the paper P and the amplification is set to be higher than in the fifth measurement mode. This is because, within the medium resistance measurement range, current flows more slowly than in the low resistance measurement range, and the current detected by the detection circuit 55 becomes very small.

[0104] Hereinafter, the fifth measurement mode will be referred to as the "low resistance measurement mode". Furthermore, the low resistance measurement mode is an example of the "fifth mode". The low resistance measurement range is an example of the "third range".

[0105] Here, as Figure 3 As shown, the medium resistance measurement range and the high resistance measurement range are set such that, for the resistance of multiple brands of paper P, the number of brands belonging to the medium resistance measurement range is greater than the number of brands belonging to the high resistance measurement range.

[0106] The high resistance measurement range and low resistance measurement range are set such that, for the resistance of paper P from multiple brands, the number of brands belonging to the high resistance measurement range is greater than the number belonging to the low resistance measurement range. Therefore, the number of brands belonging to each measurement range is set to increase in the order of low resistance measurement range, high resistance measurement range, and medium resistance measurement range.

[0107] in addition, Figure 3 This is a graph depicting the surface resistivity values ​​of all brands (e.g., 2506 brands) of paper P used in the image forming apparatus 10. (See image forming apparatus 10 for details.) Figure 3As shown, the medium resistance measurement range is set to the range of surface resistance values ​​belonging to more than half of all brands. Specifically, the medium resistance measurement range is set to the range of surface resistance values ​​belonging to more than 90% of all brands.

[0108] (Control circuit 80)

[0109] The control circuit 80 has a control function to control the operation of the resistance measuring unit 50. Specifically, as follows: Figure 4 As shown, the control circuit 80 has a processor 81, a memory 82, and a storage unit 83.

[0110] The term "processor" refers to processors in a broad sense. As processors 81, they include general-purpose processors (such as central processing units (CPUs)) and dedicated processors (such as graphics processing units (GPUs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), programmable logic devices, etc.).

[0111] Memory 83 stores control program 83A (see reference) Figure 5 The storage device 83 contains various programs and data. Specifically, the storage device 83 is implemented using recording devices such as hard disk drives (HDDs), solid state drives (SSDs), and flash memory.

[0112] Memory 82 is a working area for processor 81 to execute various programs. During processing, processor 81 temporarily records various programs or data. Processor 81 reads various programs, including control program 83A, from memory 83 into memory 82 and uses memory 82 as a working area to execute programs.

[0113] In the control circuit 80, the processor 81 executes the control program 83A, thereby realizing various functions. The functional structure achieved through the cooperation of the processor 81 (a hardware resource) and the control program 83A (a software resource) will be described below. Figure 5 This is a block diagram representing the functional structure of processor 81.

[0114] like Figure 5 As shown, in the control circuit 80, the processor 81 performs the functions of the acquisition unit 81A and the control unit 81B by executing the control program 83A.

[0115] The acquisition unit 81A acquires either an execution instruction for time-priority control or an execution instruction for precision-priority control from the user terminal 19, and uses it as a measurement instruction. Alternatively, in this embodiment, the measurement instruction may be only an execution instruction for either time-priority control or precision-priority control. Time-priority control is an example of "first control," and precision-priority control is an example of "second control."

[0116] When the acquisition unit 81A receives an execution instruction for performing time-priority control, the control unit 81B performs time-priority control on the resistance measuring unit 50. When the acquisition unit 81A receives an execution instruction for performing accuracy-priority control, the control unit 81B performs accuracy-priority control on the resistance measuring unit 50. In other words, when the acquisition unit 81A does not receive an execution instruction for performing time-priority control, the control unit 81B does not perform time-priority control on the resistance measuring unit 50.

[0117] Time-priority control is a control that prioritizes the execution of the medium resistance measurement mode over the low resistance measurement mode and the high resistance measurement mode. Specifically, in time-priority control, the control unit 81B performs the following control: when the surface resistance value of the paper P measured by the medium resistance measurement mode is within the medium resistance measurement range, the low resistance measurement mode and the high resistance measurement mode are not executed. That is, when the surface resistance value of the paper P measured by the medium resistance measurement mode is within the medium resistance measurement range, the control unit 81B terminates the process without executing the low resistance measurement mode and the high resistance measurement mode.

[0118] Furthermore, in time-priority control, the control unit 81B performs the following control: when the surface resistance value of the paper P measured by the medium resistance measurement mode is within the medium resistance measurement range, the medium resistance measurement mode (high precision) is executed.

[0119] Furthermore, in time-priority control, the control unit 81B performs the following control: when the surface resistance value of the paper P measured by the medium resistance measurement mode is not included in the medium resistance measurement range, the high resistance measurement mode is executed.

[0120] Furthermore, in time-priority control, the control unit 81B performs the following control: when the surface resistance value of the paper P measured by the high resistance measurement mode is included in the high resistance measurement range, the high resistance measurement mode (high precision) is executed.

[0121] Furthermore, in time-priority control, the control unit 81B performs the following control: when the surface resistance value of the paper P measured by the high resistance measurement mode is not included in the high resistance measurement range, the low resistance measurement mode is executed.

[0122] On the other hand, in accuracy-priority control, the control unit 81B performs the following control: regardless of the measurement results obtained through the low resistance measurement mode, it executes all of the high resistance measurement mode, medium resistance measurement mode, and low resistance measurement mode. Specifically, in accuracy-priority control, the control unit 81B performs, for example, the following control: it executes all of these modes in the order of low resistance measurement mode, medium resistance measurement mode, and high resistance measurement mode.

[0123] In this embodiment, the control circuit 80 is an example of a "control unit". Alternatively, the processor 81 or the control unit 81B can also be understood as an example of a "control unit".

[0124] (The function of this implementation method)

[0125] The following is an example illustrating the function of this embodiment. Figure 6 , Figure 7 as well as Figure 8 It is a flowchart representing the control process executed by the control circuit 80.

[0126] This process is performed by the processor 81 reading from the memory 83 and executing the control program 83A. As an example, this process begins when the processor 81 receives a measurement instruction from the user terminal 19.

[0127] like Figure 6 As shown, firstly, the processor 81 determines whether it has obtained an execution instruction for time priority control from the user terminal 19 as a measurement instruction (step S101). If it is determined that an execution instruction for time priority control has been obtained as a measurement instruction (step S101: Yes), the processor 81 causes the resistance measurement unit 50 to perform time priority control that prioritizes the execution of the medium resistance measurement mode over the high resistance measurement mode (step S102).

[0128] On the other hand, if it is determined that no execution instruction for execution time priority control has been obtained as a measurement instruction (step S101: No), the processor 81 causes the resistance measurement unit 50 to execute accuracy priority control (step S103).

[0129] Furthermore, in this embodiment, the measurement instruction may be only an execution instruction of either time-priority control or precision-priority control. Therefore, "the case where the execution instruction of time-priority control is not obtained as the measurement instruction" is equivalent to "the case where the execution instruction of precision-priority control is obtained as the measurement instruction".

[0130] In time priority control (step S102), such as Figure 7As shown, the processor 81 first causes the resistance measuring unit 50 to execute the medium resistance measuring mode (step S201). Next, the processor 81 determines whether the surface resistance value of the paper P measured by the medium resistance measuring mode is within the medium resistance measuring range (step S202). When it is determined that the surface resistance value is within the medium resistance measuring range (step S202: Yes), the processor 81 causes the resistance measuring unit 50 to execute the medium resistance measuring mode (high precision) (step S203), and ends the process. In other words, when the processor 81 determines that the surface resistance value is within the medium resistance measuring range (step S202: Yes), it does not cause the resistance measuring unit 50 to execute the high resistance measuring mode or the low resistance measuring mode, and ends the process.

[0131] When it is determined that the surface resistance value is not within the medium resistance measurement range (step S202: No), the processor 81 causes the resistance measurement unit 50 to execute the high resistance measurement mode (step S204). Next, the processor 81 determines whether the surface resistance value of the paper P measured by the high resistance measurement mode is within the high resistance measurement range (step S205). When it is determined that the surface resistance value is within the high resistance measurement range (step S205: Yes), the processor 81 causes the resistance measurement unit 50 to execute the high resistance measurement mode (high precision) (step S206), and ends the process. In other words, when it is determined that the surface resistance value is within the high resistance measurement range (step S205: Yes), the processor 81 does not cause the resistance measurement unit 50 to execute the low resistance measurement mode and ends the process.

[0132] When it is determined that the surface resistance value is not included in the high resistance measurement range (step S205: No), the processor 81 causes the resistance measurement unit 50 to execute the low resistance measurement mode (step S207) and ends the process.

[0133] In precision-priority control (step S103), such as Figure 8 As shown, the processor 81 first causes the resistance measuring unit 50 to execute a low resistance measuring mode (step S301). Next, the processor 81 causes the resistance measuring unit 50 to execute a medium resistance measuring mode (step S302). Next, the processor 81 causes the resistance measuring unit 50 to execute a high resistance measuring mode (step S303), and the process ends.

[0134] In this way, in accuracy-priority control, the results of the surface resistance values ​​of the paper P measured in each measurement mode are not judged. Instead, the resistance measuring unit 50 is made to execute all modes of low resistance measurement, medium resistance measurement, and high resistance measurement. That is, in accuracy-priority control, the processor 81 makes the resistance measuring unit 50 execute all these modes in the order of low resistance measurement, medium resistance measurement, and high resistance measurement, regardless of the measurement results measured in each measurement mode.

[0135] As described above, in this embodiment, for example, when a user of the image forming apparatus 10 measures the surface resistivity of paper P, they can choose whether to perform time-priority control based on whether time or accuracy takes priority. That is, when measuring the surface resistivity of paper P, the user of the image forming apparatus 10 can, for example, choose to perform time-priority control if time is the priority, and choose to perform accuracy-priority control if accuracy is the priority.

[0136] Furthermore, when the processor 81 obtains an execution instruction for time priority control from the user terminal 19 as a measurement instruction (step S101: Yes), it causes the resistance measurement unit 50 to perform time priority control that prioritizes the execution of the medium resistance measurement mode over the high resistance measurement mode (step S102).

[0137] Therefore, the measurement of the medium resistance measurement range, which has more brands within its measurement range than the high resistance measurement range, is prioritized. Thus, compared to the structure that prioritizes the high resistance measurement mode over the medium resistance measurement mode (hereinafter referred to as Structure A), the measurement results can be obtained earlier. As a result, the measurement time for determining the surface resistance value of paper P is shorter compared to Structure A.

[0138] In this embodiment, such as Figure 3 As shown, the medium resistance measurement range is set to the range of surface resistance values ​​belonging to more than half of all brands. Therefore, compared with the structure where the medium resistance measurement range is set to the range of surface resistance values ​​belonging to less than half of all brands, the measurement time for measuring the surface resistance value of paper P is shortened.

[0139] In time-priority control, when the surface resistance value of the paper P measured by the medium resistance measurement mode is within the medium resistance measurement range (step S202: Yes), the processor 81 causes the resistance measurement unit 50 to execute the medium resistance measurement mode (high precision) (step S203).

[0140] Therefore, compared to the structure where the processor 81 terminates the process without executing the medium resistance measurement mode (high precision) when the surface resistance value is within the medium resistance measurement range (step S202: Yes), the surface resistance value of the paper P can be measured with high precision.

[0141] Thus, when the surface resistance value is within the medium resistance measurement range (step S202: Yes), the processor 81 will terminate the process by not causing the resistance measurement unit 50 to execute the high resistance measurement mode and the low resistance measurement mode.

[0142] Therefore, compared to a structure that always performs high resistance measurement mode and low resistance measurement mode after performing medium resistance measurement mode, the measurement time for measuring the surface resistance value of paper P is shortened.

[0143] Furthermore, in time-priority control, when the surface resistance value is not included in the medium resistance measurement range (step S202: No), the processor 81 causes the resistance measurement unit 50 to execute the high resistance measurement mode (step S204). Thus, it is possible to determine whether the surface resistance value of the paper P is a surface resistance value included in the high resistance measurement range.

[0144] Furthermore, in time-priority control, when the surface resistance value of the paper P measured by the high resistance measurement mode is included in the high resistance measurement range (step S205: Yes), the processor 81 causes the resistance measurement unit 50 to execute the high resistance measurement mode (high precision) (step S206).

[0145] Therefore, compared to the structure where the processor 81 terminates the process without executing the high resistance measurement mode (high precision) when the surface resistance value is within the high resistance measurement range (step S205: Yes), the surface resistance value of the paper P can be measured with high precision.

[0146] Furthermore, in time-priority control, when the surface resistance value of paper P measured by the high resistance measurement mode is not included in the high resistance measurement range (step S205: No), the processor 81 causes the resistance measurement unit 50 to execute the low resistance measurement mode (step S207). Thus, it is possible to determine whether the surface resistance value of paper P is a surface resistance value included in the low resistance measurement range.

[0147] Furthermore, in this embodiment, when the control device 16 receives an image forming instruction from the user terminal 19, it causes the image forming unit 14 and the conveying mechanism 15 to perform an image forming operation, and controls the operation of the image forming unit 14 and the conveying mechanism 15 based on the measured value information. Therefore, compared with a structure that performs an image forming operation regardless of the physical properties of the paper P, a high-quality image can be formed on the paper P.

[0148] (Modified Example)

[0149] In this embodiment, either time-priority control or precision-priority control can be selectively executed, but it is not limited to this. For example, it can also be a structure that can only execute time-priority control.

[0150] In this embodiment, such as Figure 3As shown, the medium resistance measurement range is set to the range of surface resistance values ​​belonging to more than half of all brands, but it is not limited to this. For example, the medium resistance measurement range can also be set to the range of surface resistance values ​​belonging to less than half of all brands. In this case, for example, it can be set such that, regarding the surface resistance values ​​of paper P from multiple brands, the number of brands belonging to the medium resistance measurement range is greater than the number of brands belonging to the high resistance measurement range and the low resistance measurement range, respectively.

[0151] In time-priority control, when the surface resistance value of the paper P measured by the medium resistance measurement mode is within the medium resistance measurement range (step S202: Yes), the processor 81 causes the resistance measurement unit 50 to execute the medium resistance measurement mode (high precision) (step S203), but it is not limited to this. For example, when the surface resistance value of the paper P measured by the medium resistance measurement mode is within the medium resistance measurement range (step S202: Yes), the processor 81 may not execute the medium resistance measurement mode (high precision), and instead use the measurement value measured by the medium resistance measurement mode in step S202 as the measurement result. In this case, the medium resistance measurement mode (high precision) may also be executed in step S202.

[0152] Furthermore, in time-priority control, when the surface resistance value of the paper P measured by the high-resistance measurement mode is within the high-resistance measurement range (step S205: Yes), the processor 81 causes the resistance measurement unit 50 to execute the high-resistance measurement mode (high precision) (step S206), but it is not limited to this. For example, when the surface resistance value of the paper P measured by the high-resistance measurement mode is within the high-resistance measurement range (step S205: Yes), the processor 81 may not execute the high-resistance measurement mode (high precision), and instead use the measurement value measured by the high-resistance measurement mode in step S205 as the measurement result. In this case, the high-resistance measurement mode (high precision) may also be executed in step S205.

[0153] Furthermore, the processor 81 may also cause the resistance measuring unit 50 to execute a low-resistance measuring mode in step S204, and determine in step S205 whether the surface resistance value of the paper P measured by the low-resistance measuring mode is included in the low-resistance measuring range. At this time, if the processor 81 determines that the surface resistance value is included in the low-resistance measuring range (step S205: Yes), it causes the resistance measuring unit 50 to execute a low-resistance measuring mode (high precision) (step S206), ending the process. On the other hand, if the processor 81 determines that the surface resistance value is not included in the low-resistance measuring range (step S205: No), it causes the resistance measuring unit 50 to execute a high-resistance measuring mode (step S207), ending the process. The low-resistance measuring mode (high precision) is a mode that measures the surface resistance value with higher precision than the low-resistance measuring mode. Specifically, in the low-resistance measuring mode (high precision), the number of samples used for measuring the surface resistance value is greater than in the low-resistance measuring mode, or the measurement time is longer than in the low-resistance measuring mode. More specifically, the processing unit 56 performs processes such as increasing the number of detection signals acquired from the detection circuit 55 (i.e., the number of samples) and calculating the average based on the detection signals to obtain a measurement value.

[0154] Furthermore, in this embodiment, paper P is used as an example of the recording medium, but it is not limited to this. As an example of the recording medium, it may also be a sheet-like recording medium other than paper P, such as a metal or resin film.

[0155] In this embodiment, the measuring device 20 includes a weight measuring unit 30 and a coating measuring unit 70, but is not limited thereto. The measuring device 20 may also be a structure that does not include at least one of the weight measuring unit 30 and the coating measuring unit 70, as long as it includes at least a resistance measuring unit 50.

[0156] In this embodiment, as an example of a measuring unit, a resistance measuring unit 50 is used to measure the surface resistance value of paper P, but it is not limited to this. As an example of a measuring unit, it may also be a measuring unit that measures other physical properties such as the volume resistivity of a recording medium. That is, as an example of resistance, it may also be other physical properties such as the volume resistivity of a recording medium.

[0157] This disclosure is not limited to the described embodiments, and various modifications, alterations, and improvements can be made without departing from its spirit. For example, the structures contained in the modified examples shown above can also be appropriately combined to form a configuration.

Claims

1. A measuring device, comprising: The measuring unit has a first mode for measuring the resistance of a recording medium used in an image forming apparatus within a first range of predetermined resistance values, and a second mode for measuring the resistance within a second range of resistance values ​​different from the first range. In the measuring unit, the second range and the first range are set such that, for the resistance of multiple brands of recording media, the number of brands belonging to the second range is greater than the number of brands belonging to the first range. as well as The control unit controls the measurement unit to execute the second mode in a way that prioritizes the first mode.

2. The measuring device according to claim 1, wherein... The control unit controls the measurement unit in such a way that when the resistance of the recording medium measured by the second mode is within the second range, the control unit does not execute the first mode.

3. The measuring device according to claim 2, wherein... The control unit controls the measurement unit in the following way: when the resistance of the recording medium measured by the second mode is within the second range, the control unit executes a third mode, wherein the resistance is measured within the second range, and the number of samples used for resistance measurement is greater than that of the second mode or the measurement time is longer than that of the second mode.

4. The measuring device according to claim 2 or 3, wherein The control unit controls the measurement unit in the following way: when the resistance of the recording medium measured by the second mode is not included in the second range, the control unit executes the first mode.

5. The measuring device according to claim 4, wherein... The control unit controls the measurement unit in the following way: when the resistance of the recording medium measured by the first mode is within the first range, the control unit executes a fourth mode, wherein the resistance is measured within the first range and the number of samples used for resistance measurement is greater than that of the first mode or the measurement time is longer than that of the first mode.

6. The measuring apparatus according to claim 4 or 5, wherein The control unit controls the measurement unit in the following way: when the resistance of the recording medium measured by the first mode is not included in the first range, the control unit executes a fifth mode to measure the resistance in a third range of resistance values ​​that are different from the first range and the second range.

7. The measuring apparatus according to any one of claims 1 to 6, wherein The second range is set to the range to which the resistance values ​​of more than half of the brands belong.

8. The measuring apparatus according to any one of claims 1 to 7, comprising: The acquisition unit acquires the execution instructions for performing the control. When the acquisition unit receives an execution instruction to perform the control, the control unit performs the control on the measurement unit. The control unit does not perform the control on the measurement unit when the acquisition unit does not acquire the execution instruction to perform the control.

9. The measuring apparatus according to claim 8, wherein The acquisition unit acquires and executes either the execution instruction of the first control or the execution instruction of the second control, which are used as the control. When the acquisition unit receives an execution instruction to perform the first control, the control unit performs the first control on the measurement unit. When the acquisition unit acquires an execution instruction to perform the second control, the control unit performs the second control on the measurement unit to execute both the first mode and the second mode, regardless of the measurement result measured by the measurement unit.

10. An image forming apparatus, comprising: The measuring apparatus as described in any one of claims 1 to 9; The image forming unit forms an image on a recording medium on which the resistance has been measured by the measuring device; as well as The control device controls the image forming operation of the image forming unit based on the resistance measured by the measuring device.

Images