HTRB reliability test device and method for power device
By employing PWM technology and IGBT control circuit in the HTRB circuit, high-temperature and high-voltage simulation of power devices is achieved, solving the problem of inaccurate testing in existing technologies, improving testing efficiency and reliability, and shortening the R&D cycle.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- NARI LIANYAN SEMICON CO LTD
- Filing Date
- 2022-09-30
- Publication Date
- 2026-07-10
AI Technical Summary
Existing technologies cannot effectively simulate the high temperature and high pressure conditions of power devices under actual operating conditions, resulting in inaccurate HTRB reliability testing and failing to meet the needs of practical applications.
PWM technology is used to control the power supply in the HTRB circuit. Through the IGBT control circuit and sampling protection circuit, the DSP digital processor generates PWM signals to control the IGBT control switch to turn on and off, simulating high temperature and high pressure conditions.
It improves the efficiency and reliability of HTRB reliability testing, can accurately simulate the actual operating conditions of power devices, and shortens the R&D cycle.
Smart Images

Figure CN115524595B_ABST