Ground deformation determination method and device, computer equipment and readable storage medium

Abstract

This invention discloses a method, apparatus, computer equipment, and readable storage medium for determining surface deformation, relating to the field of deformation measurement. The method includes: acquiring radar images of a target surface in two consecutive time phases based on a primary and secondary antenna interferometric radar system; determining the length of the corresponding image baseline based on the radar images of the two consecutive time phases; if the length exceeds a preset critical baseline length, acquiring a first elevation and a second elevation of the target surface in the radar images of the two consecutive time phases; and determining the surface deformation of the target surface based on the first elevation and the second elevation. Thus, this invention enables the calculation of surface deformation when the baseline length exceeds the critical baseline, and further enables the calculation of surface deformation with arbitrary baseline lengths, thereby enabling real-time monitoring of the surface state and avoiding the limitations of surface deformation calculation in shipborne or vehicle-mounted differential interferometry systems.

Description

Technical Field

[0001] This invention relates to the field of deformation measurement, and more particularly to a method, apparatus, computer equipment, and readable storage medium for determining surface deformation. Background Technology

[0002] In surface deformation measurement methods based on Differential Interferometry (DInSAR), radar images of the same area at different time phases are typically used to calculate the surface deformation of the area based on differential interferometry.

[0003] Understandably, this measurement method requires that the baseline length of the two images cannot exceed the critical baseline length; if it does, the results calculated based on differential interferometry are invalid. However, in a shipborne differential interferometry system, with the rise and fall of the river / lake tides, the difference in water level between corresponding images at different times will cause the baseline length to exceed the critical baseline, making deformation measurement impossible. Summary of the Invention

[0004] In view of this, the present invention provides a method, apparatus, computer equipment and readable storage medium for determining surface deformation, which improves the current situation where deformation measurement cannot be performed when the length of the image baseline corresponding to two time periods exceeds the critical baseline.

[0005] In a first aspect, embodiments of the present invention provide a method for determining surface deformation, applied to a primary and secondary antenna interferometric radar system, the method comprising:

[0006] Acquire radar images of the target surface in two consecutive time phases;

[0007] Based on the radar images from the two consecutive time phases, determine the length of the corresponding image baseline;

[0008] If the length exceeds the preset critical baseline length, then the first elevation and the second elevation of the target surface in the radar images of the two consecutive time phases are obtained;

[0009] Based on the first elevation and the second elevation, the surface deformation of the target surface is determined.

[0010] Optionally, in one feasible embodiment of the present invention, the method further includes:

[0011] If the length is less than or equal to the critical baseline length, then based on the differential interferometry calculation principle, the surface deformation of the target surface is determined according to the radar images of the two consecutive time phases.

[0012] Optionally, in one feasible embodiment of the present invention, acquiring radar images of the target surface in two consecutive time phases includes:

[0013] Acquire initial radar images of the target surface in two consecutive time phases;

[0014] The initial radar image is subjected to image correction and multi-temporal coherent processing to obtain a radar image.

[0015] Optionally, in one feasible embodiment of the present invention, if the length exceeds a preset critical baseline length, obtaining the first elevation and the second elevation of the target surface in the radar images of two consecutive time phases includes:

[0016] If the length exceeds the preset critical baseline length, the pose parameters of the main and auxiliary antenna interferometric radar system in the two consecutive time phases are obtained, wherein the pose parameters include the elevation of the main and auxiliary antennas, the observation slant range, the antenna tilt angle, and the phase difference between the two radar images;

[0017] Based on a preset formula, the first elevation and the second elevation of the target surface in the radar images of the two consecutive time phases are calculated using the pose parameters of the two time phases.

[0018] Optionally, in one feasible embodiment of the present invention, the preset formula includes:

[0019] ;

[0020] ;

[0021] ;

[0022] In the formula, h This indicates either the first elevation or the second elevation. H Indicates the elevation of the main antenna. R 1 represents the observation slant range of the main antenna. R 2 represents the observation slant range of the auxiliary antenna. θ This represents the angle between the slant range observed by the main antenna and the downward direction of gravity. B This indicates the length of the image baseline. α This indicates the angle between the baseline and the horizontal plane. This indicates the interference phase corresponding to the first elevation and the second elevation.

[0023] Optionally, in one feasible embodiment of the present invention, if the length exceeds a preset critical baseline length, obtaining the pose parameters of the primary and secondary antenna interferometric radar system in two consecutive time phases includes:

[0024] If the length exceeds a preset length threshold, then from the radar images of the two preceding and following time phases, and the radar images of the time phases before and after the two preceding and following time phases, a first reference radar image with the preceding time phase and a second reference radar image with the following time phase are selected. Specifically, the length of the image baselines corresponding to the first and second reference radar images exceeds a preset lower limit length; the observation slant range of the primary and secondary antennas corresponding to the first and second reference radar images is greater than a preset slant range; the tilt angle of the primary and secondary antennas corresponding to the first and second reference radar images is greater than a preset tilt angle; the phase difference between the first and second reference radar images is less than a preset phase difference; and the preset lower limit length is greater than the critical baseline length.

[0025] The pose parameters of the main and auxiliary antenna interferometric radar system for the first and second reference radar images at two consecutive time phases are obtained.

[0026] Secondly, embodiments of the present invention provide a device for determining surface deformation, applied to a primary and secondary antenna interferometric radar system, the device comprising:

[0027] The image acquisition module is used to acquire radar images of the target surface in two consecutive time phases.

[0028] The length determination module is used to determine the length of the corresponding image baseline based on the radar images from two consecutive time phases.

[0029] An elevation acquisition module is used to acquire the first elevation and the second elevation of the target surface in the radar images of two consecutive time phases if the length exceeds a preset critical baseline length.

[0030] The first determining module is used to determine the surface deformation of the target surface based on the first elevation and the second elevation.

[0031] Optionally, in one feasible embodiment of the present invention, the apparatus further includes:

[0032] The second determining module is used to determine the surface deformation of the target surface based on the radar images of two consecutive time phases, if the length is less than or equal to the critical baseline length.

[0033] Thirdly, embodiments of the present invention provide a computer device, including a memory and a processor, wherein the memory stores a computer program, and the computer program, when run on the processor, executes a method for determining surface deformation as disclosed in any of the first aspects.

[0034] Fourthly, embodiments of the present invention provide a computer-readable storage medium storing a computer program, which, when run on a processor, executes a method for determining surface deformation as disclosed in any of the first aspects.

[0035] In the method for determining surface deformation provided by this invention, firstly, radar images of the target surface in two consecutive time phases are acquired based on a primary and secondary antenna interferometric radar system. Next, the length of the corresponding image baseline is determined based on the radar images of the two consecutive time phases. If the length exceeds a preset critical baseline length, it indicates that the surface deformation calculated based on differential interferometry will be invalid. Therefore, this invention acquires the first elevation and the second elevation of the target surface in the radar images of the two consecutive time phases to calculate the surface deformation based on the elevation of the target surface. Finally, the surface deformation of the target surface is determined based on the first elevation and the second elevation. Based on this, this invention realizes the calculation of surface deformation when the baseline length exceeds the critical baseline, and further realizes the calculation of surface deformation when the baseline length takes any value. This enables real-time monitoring of the surface state and avoids the limitations of surface deformation calculation in shipborne or vehicle-mounted differential interferometric measurement systems. Attached Figure Description

[0036] To more clearly illustrate the technical solution of the present invention, the accompanying drawings used in the embodiments will be briefly described below. It should be understood that the following drawings only show some embodiments of the present invention and should not be regarded as a limitation on the scope of protection of the present invention. In the various drawings, similar components are numbered similarly.

[0037] Figure 1 A flowchart illustrating the first method for determining surface deformation provided by an embodiment of the present invention is shown.

[0038] Figure 2 A flowchart illustrating the second method for determining surface deformation provided by an embodiment of the present invention is shown.

[0039] Figure 3 This illustration shows a schematic diagram of the imaging geometry of a radar image provided by an embodiment of the present invention;

[0040] Figure 4 A schematic diagram of the structure of the surface deformation device provided in an embodiment of the present invention is shown. Detailed Implementation

[0041] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments.

[0042] The components of the embodiments of the invention described and illustrated herein can typically be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the invention without inventive effort are within the scope of protection of the invention.

[0043] In the following, the terms “comprising,” “having,” and their cognates, which may be used in various embodiments of the invention, are intended only to indicate a particular feature, number, step, operation, element, component, or combination thereof, and should not be construed as excluding, firstly, the presence of one or more other features, numbers, steps, operations, elements, components, or combinations thereof, or adding the possibility of one or more features, numbers, steps, operations, elements, components, or combinations thereof.

[0044] Furthermore, the terms "first," "second," and "third" are used only to distinguish descriptions and should not be interpreted as indicating or implying relative importance.

[0045] Unless otherwise specified, all terms used herein (including technical and scientific terms) shall have the same meaning as commonly understood by one of ordinary skill in the art to which the various embodiments of the invention pertain. Terms (such as those defined in commonly used dictionaries) shall be interpreted as having the same meaning as in their contextual meaning in the relevant technical field and shall not be interpreted as having an idealized or overly formal meaning, unless clearly defined in the various embodiments of the invention.

[0046] Example 1

[0047] Reference Figure 1 The diagram illustrates a flowchart of a first method for determining surface deformation according to Embodiment 1 of the present invention. This method is applied to a primary and secondary antenna interferometric radar system. The method includes:

[0048] Step S110: Acquire radar images of the target surface in two consecutive time phases.

[0049] That is, in the embodiments of the present invention, a primary and secondary antenna interferometric radar system is used to periodically detect the surface deformation of each target. Specifically, radar images of the target surface in two consecutive time phases are acquired in each detection cycle, so as to determine the deformation of the target surface based on the radar images in the two consecutive time phases.

[0050] Optionally, to avoid a decrease in the accuracy of subsequently calculated deformation due to low radar image quality, step S110 in one feasible embodiment of the present invention specifically includes:

[0051] Acquire initial radar images of the target surface in two consecutive time phases;

[0052] The initial radar image is subjected to image correction and multi-temporal coherent processing to obtain a radar image.

[0053] In other words, after acquiring radar images, the embodiments of the present invention will perform image correction and multi-temporal coherence processing on the radar images to improve the quality of the radar images, eliminate the negative impacts caused by distortions such as perspective shrinkage and / or image shadows, and make the radar images of two consecutive time phases coherent.

[0054] Therefore, based on the above-mentioned radar image preprocessing, the embodiments of the present invention ensure the quality of radar images, thereby providing effective data support for the calculation of surface deformation and improving the accuracy of surface deformation calculation.

[0055] Step S120: Determine the length of the corresponding image baseline based on the radar images from the two consecutive time phases.

[0056] It is understood that if the length of the image baseline corresponding to the radar image exceeds the critical baseline length, the surface deformation calculated based on differential interferometry will be invalid. Therefore, before calculating the deformation in this embodiment of the invention, the length of the image baseline corresponding to the radar image will be determined in order to determine the specific calculation method of the surface deformation.

[0057] It is understood that the specific method for determining the length of the image baseline can be set according to the actual situation, and can be referred to the prior art. This embodiment of the invention does not limit this.

[0058] Step S130: If the length exceeds the preset critical baseline length, then obtain the first elevation and the second elevation of the target surface in the radar images of the two consecutive time phases.

[0059] That is, when the length of the image baseline corresponding to the radar image exceeds the critical baseline length / preset critical baseline length, it indicates that the radar image currently used to calculate surface deformation cannot obtain effective surface deformation based on differential interferometry. In this case, the embodiments of the present invention will use the elevation of the target surface to calculate the surface deformation.

[0060] It is easy to understand that if the length of the image baseline corresponding to the radar image is less than or equal to the critical baseline length, then effective surface deformation can still be calculated based on differential interferometry at the current moment. Therefore, in one feasible embodiment of the present invention, the method further includes:

[0061] Step S150: If the length is less than or equal to the critical baseline length, then based on the differential interferometry calculation principle, the surface deformation of the target surface is determined according to the radar images of the two consecutive time phases.

[0062] Based on this, the embodiments of the present invention enable the calculation of surface deformation in any observation period to be completed in a way with high computational accuracy. That is, when the length of the image baseline exceeds the critical baseline length, the surface deformation is calculated based on the elevation of the target surface, while when the length of the image baseline is less than or equal to the critical baseline length, the deformation of the target surface is calculated directly based on the differential interferometry calculation principle.

[0063] Step S140: Determine the surface deformation of the target surface based on the first elevation and the second elevation.

[0064] It is easy to understand that the change / difference in the elevation of the target surface at different times / phases represents the degree / variable deformation of the target surface. Therefore, embodiments of the present invention utilize the difference in elevation of the target surface at different phases to represent the surface deformation of the target surface.

[0065] Based on this, the embodiments of the present invention realize the calculation of surface deformation when the baseline length exceeds the critical baseline, and further realize the calculation of surface deformation when the baseline length takes any value, thereby enabling real-time monitoring of the surface state and avoiding the limitations of surface deformation calculation in shipborne or vehicle-mounted differential interferometry systems.

[0066] Optional, see reference Figure 2 The diagram illustrates a flowchart of a second method for determining surface deformation provided by an embodiment of the present invention. In this feasible mode, step S130 specifically includes:

[0067] S131, if the length exceeds the preset critical baseline length, then obtain the pose parameters of the main and auxiliary antenna interferometric radar system in two consecutive time phases, wherein the pose parameters include the elevation of the main and auxiliary antennas, the observation slant range, the antenna tilt angle, and the phase difference between the two radar images.

[0068] S132, based on a preset formula, calculate the first elevation and the second elevation of the target surface in the radar images of the two consecutive time phases using the pose parameters of the two consecutive time phases.

[0069] That is, in the case where the surface deformation obtained by differential interferometry calculation is invalid, the present invention calculates the elevation of the target surface in the two time phases based on the pose parameters of the radar images generated by the main and auxiliary antenna interferometric radar system in the two time phases and the geometric relationship during imaging, and then obtains the surface deformation based on the elevation difference in subsequent steps.

[0070] It should be understood that, based on the InSAR (Interferometric Synthetic Aperture Radar) elevation measurement principle, the elevation of the Earth's surface can be obtained from two observations by a SAR (Synthetic Aperture Radar) sensor in the same time phase, the sensor's pose at the time of observation, and the geometric relationship.

[0071] To better illustrate this feasible approach, please refer to [link / reference]. Figure 3 , Figure 3 This diagram illustrates the imaging geometry of a radar image according to an embodiment of the present invention, wherein... S 1 and S 2 represents the main antenna and the auxiliary antenna, respectively. H Indicates the elevation of the main antenna. R 1 indicates the observation slant range of the main antenna. R 2 indicates the observation slant range of the auxiliary antenna. B This indicates the length of the image baseline corresponding to the radar image. α This indicates the angle between the baseline and the horizontal plane. P Indicates the target surface. h Indicates the elevation of the target surface.

[0072] It is not difficult to see that, based on Figure 3 The elevation of the target's surface in the radar image can be calculated by combining the geometric relationships shown and the pose parameters of the main and auxiliary antenna interferometric radar system when generating radar images.

[0073] Furthermore, in one feasible embodiment of the present invention, the specific method for calculating the first elevation and the second elevation, namely the aforementioned preset formula, specifically includes:

[0074] (1)

[0075] (2)

[0076] (3)

[0077] In the formula, h This indicates either the first elevation or the second elevation. H Indicates the elevation of the main antenna. R 1 represents the observation slant range of the main antenna. R 2 represents the observation slant range of the auxiliary antenna. θ This represents the angle between the slant range observed by the main antenna and the downward direction of gravity. B This indicates the length of the image baseline. α This indicates the angle between the baseline and the horizontal plane. This indicates the interference phase corresponding to the first elevation and the second elevation.

[0078] Understandably, the aforementioned preset formula reveals the elevation of the target surface. h By understanding the relationship between the pose parameters and the given parameters, and then substituting these parameters into the aforementioned preset formula, the elevation of the target surface can be obtained. h .

[0079] It is also understood that, in the embodiments of the present invention This refers to the interferometric phase corresponding to the first and second elevations, which is the interferometric phase when InSAR observes the target surface.

[0080] Furthermore, it is not difficult to understand that since the InSAR in this embodiment of the invention is equipped with a primary and secondary dual antenna, that is, it adopts the "one transmit, two receive" imaging mode for observation, the signal phase difference only exists in the signal return segment. Therefore, the slant range difference in equation (2) is... R 2- R 1) With interference phase It will be calculated within a 2π period.

[0081] Optionally, in one feasible embodiment of the present invention, step S132 includes:

[0082] If the length exceeds a preset length threshold, then from the radar images of the two preceding and following time phases, and the radar images of the time phases before and after the two preceding and following time phases, a first reference radar image with the preceding time phase and a second reference radar image with the following time phase are selected. Specifically, the length of the image baselines corresponding to the first and second reference radar images exceeds a preset lower limit length; the observation slant range of the primary and secondary antennas corresponding to the first and second reference radar images is greater than a preset slant range; the tilt angle of the primary and secondary antennas corresponding to the first and second reference radar images is greater than a preset tilt angle; the phase difference between the first and second reference radar images is less than a preset phase difference; and the preset lower limit length is greater than the critical baseline length.

[0083] The pose parameters of the main and auxiliary antenna interferometric radar system for the first and second reference radar images at two consecutive time phases are obtained.

[0084] It should be understood that, based on the above-mentioned preset formula, the calculation of surface deformation can be referenced to the following formula.

[0085] (3)

[0086] In the formula, h Represents surface deformation. h 1 indicates the first elevation. h 2 indicates the first elevation.

[0087] Assuming that only one pose parameter changes during the preceding and following phases, then differentiating the above formula (3) yields:

[0088]

[0089]

[0090]

[0091]

[0092]

[0093] Based on the above differential results, the applicant analyzed the case where only one parameter changed while all other parameters remained unchanged, and drew the following conclusions:

[0094] Compared to baseline inclination, baseline distance, and phase measurement errors, elevation is least affected by slant distance error. Analysis of the relationship between elevation error and slant distance error reveals that, for a given slant distance measurement error, the effects of baseline inclination error and baseline distance error on elevation are opposite to those of interferometric phase error. When the interferometric phase is small, the impact of slant distance error on elevation decreases, while the impact of baseline distance and baseline inclination error increases as baseline distance and baseline inclination decrease.

[0095] The impact of baseline distance error on elevation is 10 2 The magnitude of the error in baseline distance is greater than that in elevation. Furthermore, this effect increases with the measurement slant distance. When the interferometric phase is small, the impact of baseline distance error decreases. In actual observations, the primary and secondary antennas of the primary and secondary antenna interferometric radar system are fixed at both ends of the scale, allowing for precise observation of the baseline distance. Therefore, the baseline distance error has a relatively small impact on elevation. The magnitude of the impact of phase error on elevation is much smaller than that of baseline distance error. When the phase measurement error is constant, its impact increases with long-distance observations. However, as the baseline distance, baseline tilt angle, and observation slant distance increase, the impact of phase error on elevation decreases. Compared to the three interferometric parameters mentioned above, the baseline tilt angle error has the greatest impact on elevation. At this point, the error in long-distance, short-baseline, and large interferometric phase observations will have a greater impact on elevation.

[0096] Therefore, when using the elevation-based method for calculating surface deformation provided in this embodiment of the invention, the SAR system should employ long baselines, short line-of-sight, large baseline inclination, and small interferometric phases during the observation process to reduce the impact of observation errors on surface deformation.

[0097] Based on this, when calculating surface deformation based on elevation, this embodiment of the invention will also select reference radar images from two consecutive time phases that meet the conditions of long baseline, short line-of-sight, large baseline dip angle, and small interferometric phase. Specifically, from radar images of each time phase, reference radar images from two consecutive time phases are selected where the observation slant range is greater than a preset slant range, the dip angle is greater than a preset dip angle, the phase difference is less than a preset phase difference, and the length of the image baseline exceeds a preset lower limit. Based on the pose parameters of the reference radar images from the consecutive time phases, the corresponding elevation velocity and surface deformation are calculated, thereby ensuring the accuracy of the surface deformation calculations.

[0098] Example 2

[0099] Corresponding to the method for determining surface deformation provided in Embodiment 1 of the present invention, Embodiment 2 of the present invention also provides a device for determining surface deformation, referring to... Figure 4 The diagram shows a schematic representation of the surface deformation determination device provided in an embodiment of the present invention. The surface deformation determination device 200 provided in an embodiment of the present invention includes:

[0100] Image acquisition module 210 is used to acquire radar images of the target surface in two consecutive time phases;

[0101] The length determination module 220 is used to determine the length of the corresponding image baseline based on the radar images of the two consecutive time phases.

[0102] The elevation acquisition module 230 is used to acquire the first elevation and the second elevation of the target surface in the radar images of two consecutive time phases if the length exceeds the preset critical baseline length.

[0103] The first determining module 240 is used to determine the surface deformation of the target surface based on the first elevation and the second elevation.

[0104] Optionally, in one feasible embodiment of the present invention, the apparatus further includes:

[0105] The second determining module is used to determine the surface deformation of the target surface based on the radar images of two consecutive time phases, if the length is less than or equal to the critical baseline length.

[0106] Optionally, in one feasible embodiment of the present invention, the image acquisition module includes:

[0107] The raw image acquisition submodule is used to acquire initial radar images of the target surface in two consecutive time phases.

[0108] The preprocessing submodule is used to perform image correction and multi-temporal coherent processing on the initial radar image to obtain a radar image.

[0109] Optionally, in one feasible embodiment of the present invention, the elevation acquisition module includes:

[0110] The parameter acquisition submodule is used to acquire the pose parameters of the main and auxiliary antenna interferometric radar system in two consecutive time phases if the length exceeds the preset critical baseline length. The pose parameters include the elevation of the main and auxiliary antennas, the observation slant range, the antenna tilt angle, and the phase difference between the two radar images.

[0111] The calculation submodule is used to calculate the first elevation and the second elevation of the target surface in the radar images of the two consecutive time phases based on a preset formula and using the pose parameters of the two consecutive time phases.

[0112] Optionally, in one feasible embodiment of the present invention, the preset formula includes:

[0113] ;

[0114] ;

[0115] ;

[0116] In the formula, h This indicates either the first elevation or the second elevation. H Indicates the elevation of the main antenna. R 1 represents the observation slant range of the main antenna. R 2 represents the observation slant range of the auxiliary antenna. θ This represents the angle between the slant range observed by the main antenna and the downward direction of gravity. B This indicates the length of the image baseline. α This indicates the angle between the baseline and the horizontal plane. This indicates the interference phase corresponding to the first elevation and the second elevation.

[0117] Optionally, in one feasible embodiment of the present invention, the parameter acquisition submodule includes:

[0118] An image selection unit is configured to, if the length exceeds a preset length threshold, select a first reference radar image from radar images of the preceding and following time phases, and radar images of the time phases before and after the preceding and following time phases, wherein the length of the image baselines corresponding to the first and second reference radar images exceeds a preset lower limit length, the observation slant range of the primary and secondary antennas corresponding to the first and second reference radar images is greater than a preset slant range, the tilt angle of the primary and secondary antennas corresponding to the first and second reference radar images is greater than a preset tilt angle, the phase difference between the first and second reference radar images is less than a preset phase difference, and the preset lower limit length is greater than the critical baseline length.

[0119] The pose parameter acquisition unit is used to acquire the pose parameters of the main and auxiliary antenna interferometric radar system for two consecutive time phases corresponding to the first reference radar image and the second reference radar image.

[0120] The surface deformation determination device 200 provided in this application embodiment can realize each process of the surface deformation determination method corresponding to Embodiment 1, and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0121] This invention also provides a computer device, including a memory and a processor. The memory stores a computer program, and the computer program executes the method for determining surface deformation as described in Embodiment 1 when it runs on the processor.

[0122] This invention also provides a computer-readable storage medium storing a computer program, which, when run on a processor, executes the method for determining surface deformation as described in Embodiment 1.

[0123] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can also be implemented in other ways. The apparatus embodiments described above are merely illustrative; for example, the flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of apparatus, methods, and computer program products according to various embodiments of the present invention. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that, as an alternative implementation, the functions marked in the blocks may occur in a different order than those marked in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in the block diagram and / or flowchart, and combinations of blocks in the block diagram and / or flowchart, can be implemented using a dedicated hardware-based system that performs the specified function or action, or using a combination of dedicated hardware and computer instructions.

[0124] In addition, the functional modules or units in the various embodiments of the present invention can be integrated together to form an independent part, or each module can exist independently, or two or more modules can be integrated to form an independent part.

[0125] If the aforementioned functions are implemented as software functional modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this invention, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a smartphone, personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0126] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in the present invention should be included within the scope of protection of the present invention.

Claims

1. A method of determining ground deformation, characterized in that, The method, applied to a primary and secondary antenna interferometric radar system, includes: Acquire radar images of the target surface in two consecutive time phases; Based on the radar images from the two consecutive time phases, determine the length of the corresponding image baseline; If the length exceeds the preset critical baseline length, then the first elevation and the second elevation of the target surface in the radar images of the two consecutive time phases are obtained; Based on the first elevation and the second elevation, the surface deformation of the target surface is determined; If the length exceeds a preset critical baseline length, then obtaining the first elevation and second elevation of the target surface in the radar images of the two consecutive time phases includes: If the length exceeds the preset critical baseline length, the pose parameters of the main and auxiliary antenna interferometric radar system in the two consecutive time phases are obtained, wherein the pose parameters include the elevation of the main and auxiliary antennas, the observation slant range, the antenna tilt angle, and the phase difference between the two radar images; Based on a preset formula, the first elevation and the second elevation of the target surface in the radar images of the two time phases are calculated using the pose parameters of the two time phases. If the length exceeds a preset critical baseline length, then the pose parameters of the primary and secondary antenna interferometric radar system in the preceding and following time phases are obtained, including: If the length exceeds a preset length threshold, then from the radar images of the two preceding and following time phases, and the radar images of the time phases before and after the two preceding and following time phases, a first reference radar image with the preceding time phase and a second reference radar image with the following time phase are selected. Specifically, the length of the image baselines corresponding to the first and second reference radar images exceeds a preset lower limit length; the observation slant range of the primary and secondary antennas corresponding to the first and second reference radar images is greater than a preset slant range; the tilt angle of the primary and secondary antennas corresponding to the first and second reference radar images is greater than a preset tilt angle; the phase difference between the first and second reference radar images is less than a preset phase difference; and the preset lower limit length is greater than the critical baseline length. The pose parameters of the main and auxiliary antenna interferometric radar system for the first and second reference radar images at two consecutive time phases are obtained.

2. The method for determining surface deformation according to claim 1, characterized in that, The method further includes: If the length is less than or equal to the critical baseline length, then based on the differential interferometry calculation principle, the surface deformation of the target surface is determined according to the radar images of the two consecutive time phases.

3. The method for determining surface deformation according to claim 1, characterized in that, The acquisition of radar images of the target surface in two consecutive time phases includes: Acquire initial radar images of the target surface in two consecutive time phases; The initial radar image is subjected to image correction and multi-temporal coherent processing to obtain a radar image.

4. The method for determining surface deformation according to claim 1, characterized in that, The preset formula includes: ； ； ； In the formula, h This indicates either the first elevation or the second elevation. H Indicates the elevation of the main antenna. R 1 represents the observation slant range of the main antenna. R 2 represents the observation slant range of the auxiliary antenna. θ This represents the angle between the slant range observed by the main antenna and the downward direction of gravity. B This indicates the length of the image baseline. α This indicates the angle between the baseline and the horizontal plane. This indicates the interference phase corresponding to the first elevation and the second elevation.

5. A device for determining surface deformation, characterized in that, The device, used in a primary and secondary antenna interferometric radar system, comprises: The image acquisition module is used to acquire radar images of the target surface in two consecutive time phases. The length determination module is used to determine the length of the corresponding image baseline based on the radar images from two consecutive time phases. An elevation acquisition module is used to acquire the first elevation and the second elevation of the target surface in the radar images of two consecutive time phases if the length exceeds a preset critical baseline length. The first determining module is used to determine the surface deformation of the target surface based on the first elevation and the second elevation; If the length exceeds a preset critical baseline length, then obtaining the first elevation and second elevation of the target surface in the radar images of the two consecutive time phases includes: If the length exceeds the preset critical baseline length, the pose parameters of the main and auxiliary antenna interferometric radar system in the two consecutive time phases are obtained, wherein the pose parameters include the elevation of the main and auxiliary antennas, the observation slant range, the antenna tilt angle, and the phase difference between the two radar images; Based on a preset formula, the first elevation and the second elevation of the target surface in the radar images of the two time phases are calculated using the pose parameters of the two time phases. If the length exceeds a preset critical baseline length, then the pose parameters of the primary and secondary antenna interferometric radar system in the preceding and following time phases are obtained, including: If the length exceeds a preset length threshold, then from the radar images of the two preceding and following time phases, and the radar images of the time phases before and after the two preceding and following time phases, a first reference radar image with the preceding time phase and a second reference radar image with the following time phase are selected. Specifically, the length of the image baselines corresponding to the first and second reference radar images exceeds a preset lower limit length; the observation slant range of the primary and secondary antennas corresponding to the first and second reference radar images is greater than a preset slant range; the tilt angle of the primary and secondary antennas corresponding to the first and second reference radar images is greater than a preset tilt angle; the phase difference between the first and second reference radar images is less than a preset phase difference; and the preset lower limit length is greater than the critical baseline length. The pose parameters of the main and auxiliary antenna interferometric radar system for the first and second reference radar images at two consecutive time phases are obtained.

6. The device for determining surface deformation according to claim 5, characterized in that, The device further includes: The second determining module is used to determine the surface deformation of the target surface based on the radar images of two consecutive time phases, if the length is less than or equal to the critical baseline length.

7. A computer device, characterized in that, It includes a memory and a processor, the memory storing a computer program that, when run on the processor, executes the method for determining surface deformation as described in any one of claims 1-4.

8. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed on a processor, performs the method for determining surface deformation as described in any one of claims 1-4.

Images