Antifreeze contaminated single chip performance recovery method, control method, medium and equipment

Abstract

The present invention relates to the field of fuel cell technology, and in particular to a method, control method, medium and equipment for recovering the performance of a single chip contaminated by antifreeze. The present invention reduces the time required for a fuel cell contaminated by antifreeze from starting to loading to the same operating point by 80%, and increases the maximum output current by 2.6 times, by changing the output power of the fuel cell and the shutdown threshold of a single low fault while ensuring that no irreversible damage is caused to the fuel cell, and purifies the antifreeze contaminated area through water produced during the operation of the fuel cell, thereby effectively alleviating the recovery of the single chip performance, enabling the fuel cell to respond normally to the target power, and reducing the restart frequency of the fuel cell system.

Description

Technical Field

[0001] The present invention relates to the technical field of fuel cells, and in particular to a method, a control method, a medium and a device for recovering the performance of a single chip polluted by antifreeze liquid. Background Art

[0002] A fuel cell is a power generation device that directly converts the chemical energy in externally supplied fuel and oxidant into electrical energy, heat energy and other reaction products through electrochemical reactions; antifreeze is mainly used as a coolant to keep the fuel cell within a suitable temperature range and enable the fuel cell to operate in the best condition.

[0003] During the operation of the fuel cell, antifreeze may leak inside the stack, contaminating the proton exchange membrane, causing single-chip performance degradation, increasing the system failure rate, and affecting the service life of the fuel cell.

[0004] A fuel cell system that is contaminated with antifreeze is prone to single-chip low voltage failure, causing the fuel cell to be unable to load normally to the target operating point or to restart frequently, affecting the normal use of the fuel cell system. Summary of the invention

[0005] The technical problem to be solved by the present invention is to provide a method, control method, medium and equipment for recovering the performance of a single chip by changing the output power of the fuel cell and the shutdown threshold of a single low fault under the premise of ensuring that no irreversible damage is caused to the fuel cell, purifying the antifreeze contaminated area through the water produced during the operation of the fuel cell, thereby effectively alleviating the recovery of the performance of the single chip by antifreeze contamination.

[0006] In order to solve the above technical problems, the first technical solution adopted by the present invention is:

[0007] A method for restoring the performance of a single chip contaminated by antifreeze fluid, comprising:

[0008] Determine the lowest single-chip voltage V. If V1<V<V2, the system will reduce the output current to half of the current, and re-determine after the load reduction is completed; if V<V1, the recovery fails; if V>V2, and V continues to rise within t1, if it rises to V3 or above within t1, then load is performed;

[0009] When the current is loaded to I1, it stops and continues to run for t1 at this operating point, and the lowest single-chip voltage is judged: if V4<V<V5, it starts to be loaded to I2. During the loading process from I1 to I2, it is judged whether the total loading time is greater than t2 and whether V is greater than V1 and less than V3. If either of the two is satisfied, the load is reduced to I1; if neither is satisfied, after loading to I2, the lowest single-chip voltage is judged. If V>V5, the recovery is successful. If V≤V5, the cumulative duration of the entire recovery process is judged. If the cumulative duration is>t3, it is considered that the single-chip performance recovery has failed; if the cumulative duration is<t3, it is re-judged whether V rises to V3 or above within t1.

[0010] Preferably, if it is loaded to I1 for the first time, there is no running time limit, and the lowest single-chip voltage V is directly judged. When it is loaded to I1 for the second time, it is necessary to run continuously for t1 at this point before the lowest single-chip voltage V is judged.

[0011] Preferably, during the process of loading to I2, the minimum single-chip voltage V is ensured to be higher than V6; if it is lower than V6, the current operating point is maintained, and when V>V6, loading to I2 continues. When the loading process lasts for t2, loading is stopped and the load is reduced to I1.

[0012] Preferably, V1 is a single chip reverse polarity protection threshold, and V3, V4, V5, and V6 are set according to a system control fault threshold.

[0013] Preferably, the t3 is 30 min.

[0014] Preferably, when V rises to V3 or above within t1, loading is performed, and the loading rate is set to aA / s;

[0015] The limiting loading rate to I2 is aA / s.

[0016] In order to solve the above technical problems, the second technical solution adopted by the present invention is:

[0017] A method for controlling the performance recovery of a chip contaminated by antifreeze fluid, comprising:

[0018] The system is turned on, and the target power is loaded to obtain the current operating point of the system and the voltage of each single chip; it is determined whether the system has been loaded to the target operating point or whether the lowest single chip voltage is less than the fault threshold. If it cannot be loaded to the target operating point or the lowest single chip voltage is less than the fault threshold, the single chip recovery mode is entered, and the single chip recovery mode executes the above-mentioned antifreeze contaminated single chip performance recovery method;

[0019] If the single chip performance recovery is successful, the single chip recovery mode is exited and the system responds to the target power and operates normally; if the single chip performance recovery fails, the system is shut down.

[0020] Preferably, if the target operating point cannot be loaded or the lowest single chip voltage is less than the fault threshold, and the difference between the lowest single chip voltage and the average single chip voltage is greater than a preset value n, and the lowest single chip number is fixed, it is considered that there is an antifreeze contamination problem.

[0021] In order to solve the above technical problems, the third technical solution adopted by the present invention is:

[0022] A computer-readable storage medium stores a computer program, which, when executed by a processor, implements the above-mentioned antifreeze liquid contaminated single chip performance recovery method and / or the above-mentioned antifreeze liquid contaminated single chip performance recovery control method.

[0023] In order to solve the above technical problems, the fourth technical solution adopted by the present invention is:

[0024] A computer device comprises a memory, a processor and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the above-mentioned antifreeze liquid contaminated single chip performance recovery method and / or the above-mentioned antifreeze liquid contaminated single chip performance recovery control method are implemented.

[0025] The beneficial effects of the present invention are as follows: through the antifreeze-contaminated monolithic chip performance recovery method, the time required for the antifreeze-contaminated fuel cell from startup to loading to the same operating point is reduced by 80%, and the maximum output current is increased by 2.6 times; under the premise of ensuring that no irreversible damage is caused to the fuel cell, the output power of the fuel cell and the shutdown threshold of a single low fault are changed, and the antifreeze-contaminated area is purified by the water produced during the operation of the fuel cell, thereby effectively alleviating the recovery of the monolithic chip performance, allowing the fuel cell to respond normally to the target power, and reducing the restart frequency of the fuel cell system. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 The figure is a flow chart of a method for recovering the performance of a single chip contaminated by antifreeze fluid as described in Example 2.

[0027] Figure 2 The figure is a flow chart of a method for controlling the performance recovery of a chip contaminated by antifreeze fluid as described in the second embodiment. DETAILED DESCRIPTION

[0028] In order to explain the technical content, achieved objectives and effects of the present invention in detail, the following is an explanation in combination with the implementation modes and the accompanying drawings.

[0029] Embodiment 1

[0030] Please refer to Figure 1 , a method for recovering the performance of a single chip contaminated by antifreeze fluid, comprising:

[0031] Step 1 S1: Start entering the single chip performance recovery module;

[0032] Step 2 S2: Detect the lowest single-chip voltage. If V1 < lowest single-chip voltage < V2, go to step 3; if the lowest single-chip voltage > V2, go to step 5. Note: V1 is the protection threshold of single-chip reverse polarity, and V2 is an empirical value. If it is lower than this value, the current should not be maintained for a long time and the load should be reduced.

[0033] Step 3 S3: The system output current is reduced to 1 / 2 of the current current;

[0034] Step 4 S4: After the load reduction is completed, check the lowest single-chip voltage again. If V1 < lowest single-chip voltage < V2, return to step 3; if the lowest single-chip voltage < V1, jump directly to step 13; if the lowest single-chip voltage > V2, and the lowest single-chip voltage continues to rise within t1, jump to step 5; Note: t1 and t2 are both empirical values;

[0035] Step 5 S5: If the lowest single-chip voltage rises to V3 or above within t1, loading is performed, and the loading rate is set to aA / s; Note: V3 is set with reference to the system control fault threshold, and the subsequent V4, V5, and V6 are the same; the value of a is set according to the actual technical parameters of the system;

[0036] Step 6 S6: When the current is loaded to I1, stop loading, and continue to run for t1 at this operating point (when loading to I1 for the first time, there is no operating time requirement, and the lowest single-chip voltage is directly judged), and monitor the lowest single-chip voltage at the same time, and make a judgment: if V4 < lowest single-chip voltage < V5, jump to step 7; if the lowest single-chip voltage > V5, jump to step 10 directly; Note: When loading to I1 for the first time, there is no operating time limit, and the lowest single-chip voltage is directly judged. When loading to I1 for the second time, it is necessary to continue running for t1 at this point, and then make a judgment on the lowest single-chip voltage; I1 is the lowest operating point of the system;

[0037] Step 7 S7: Start loading to I2, limit the loading rate to aA / s, and jump to step 8; Note: During the loading process, ensure that the minimum single-chip voltage is higher than V6; if it is lower than V6, maintain the current operating point, wait until the minimum single-chip voltage is greater than V6, and continue loading to I2. When the loading process lasts for t2, stop loading and reduce the load to I1;

[0038] Step 8 S8: During the loading process from I1 to I2, two judgments are made at the same time: whether the total duration of the loading process is greater than t2 and whether V1 < the lowest single-chip voltage < V3. If either of the two conditions is satisfied, the process jumps to step 9; if neither of the two conditions is satisfied, the process jumps to step 10 after loading to I2;

[0039] Step 9 S9: reduce the load to I1;

[0040] Step 10 S10: Determine the lowest single chip voltage. If the lowest single chip voltage is greater than V5, jump to step 11. If the lowest single chip voltage is less than or equal to V5, jump to step 12.

[0041] Step 11 S11: single chip performance is successfully restored;

[0042] Step 12: Determine the cumulative duration of the entire recovery process. If the cumulative duration is greater than t3, it is considered that the single chip performance recovery has failed, and jump to step 13; if the cumulative duration is less than t3, return to step 5; Note: The recommended value of t3 is 30 minutes;

[0043] Step 13 S13: Single chip performance recovery fails.

[0044] Embodiment 2

[0045] Please refer to Figure 2 , a method for controlling the performance recovery of a single chip contaminated by antifreeze fluid, comprising:

[0046] Step 1 S1: Turn on the system and load the target power;

[0047] Step 2 S2: Obtain the current operating point of the system and the voltage of each single chip; determine whether the system has been loaded to the target operating point or whether the lowest single chip voltage is less than the fault threshold. If it cannot be loaded to the target operating point normally or the lowest single chip voltage is less than the fault threshold, proceed to step 3 S3; Note: If it cannot be loaded to the target operating point or the lowest single chip voltage is less than the fault threshold, and the difference between the lowest single chip voltage and the average single chip voltage is greater than n, and the lowest single chip number is fixed, it is considered that there is an antifreeze contamination problem;

[0048] Step 3 S3: The system enters the single chip recovery mode, and after the recovery is completed, it enters the fourth step to judge the recovery effect;

[0049] Step 4 S4: judging whether the recovery is successful according to the lowest single chip voltage or the duration of the entire recovery process, if the single chip performance is successfully recovered, proceed to step 5, if the single chip performance is not recovered, proceed to step 6;

[0050] Step 5 S5: The single chip performance is successfully restored, the single chip recovery mode is exited, and the system responds to the target power and operates normally. After the normal operation is completed, the system is shut down;

[0051] Step 6 S6: The single chip performance recovery fails and the system shuts down.

[0052] The above descriptions are merely embodiments of the present invention and are not intended to limit the patent scope of the present invention. Any equivalent transformations made using the contents of the present invention's specification and drawings, or directly or indirectly applied in related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A method for restoring the performance of a single chip contaminated by antifreeze fluid, characterized in that: include Determine the lowest single-chip voltage V. If V1<V<V2, the system will reduce the output current to half of the current, and re-determine after the load reduction is completed; If V<V1, the recovery fails; if V>V2, and V keeps rising within t1, if it rises to V3 or above within t1, loading is performed; When the current is loaded to I1, it stops and continues to run for t1. If V4<V<V5, it is loaded to I2. During the loading process from I1 to I2, it is judged whether the total duration of the loading process is greater than t2 and whether V is greater than V1 and less than V3. If either of the two conditions is met, the load is reduced to I1. If neither of them is met, after loading to I2, if V>V5, the recovery is successful. If V≤V5, the cumulative duration of the entire recovery process is judged. If the cumulative duration is>t3, the recovery fails. If the cumulative duration is<t3, it is re-judged whether V rises to V3 or above within t1.

2. The method for recovering the performance of a chip contaminated by antifreeze fluid according to claim 1, characterized in that: If it is loaded to I1 for the first time, there is no limit on the running time, and the lowest single-chip voltage V is directly judged. When it is loaded to I1 for the second time, it is necessary to run continuously for t1 at this point before judging the lowest single-chip voltage V.

3. The method for recovering the performance of a chip contaminated by antifreeze fluid according to claim 1, characterized in that: During the loading process to I2, ensure that the minimum single-chip voltage V is higher than V6; if it is lower than V6, maintain the current operating point, wait until V>V6, and continue to load to I2. When the loading process lasts for t2, stop loading and reduce the load to I1.

4. The method for recovering the performance of a chip contaminated by antifreeze liquid according to claim 3, characterized in that: The V1 is a single chip reverse polarity protection threshold, and the V3, V4, V5, and V6 are set according to the system control fault threshold.

5. The method for recovering the performance of a chip contaminated by antifreeze liquid according to claim 1, characterized in that: The t3 is 30 min.

6. The method for recovering the performance of a chip contaminated by antifreeze fluid according to claim 1, characterized in that: If V rises to V3 or above within t1, loading is performed, and the loading rate is set to aA / s; The limiting loading rate to I2 is aA / s.

7. A method for controlling the performance recovery of a chip contaminated by antifreeze fluid, characterized in that: include The system is turned on, and the target power is loaded to obtain the current operating point of the system and the voltage of each single chip; it is determined whether the system has been loaded to the target operating point or whether the lowest single chip voltage is less than the fault threshold. If it cannot be loaded to the target operating point or the lowest single chip voltage is less than the fault threshold, the single chip recovery mode is entered, and the single chip recovery mode executes the antifreeze liquid contaminated single chip performance recovery method described in any one of claims 1-6; If the single chip performance is successfully restored, the single chip recovery mode is exited and the system responds to the target power and operates normally; If the chip performance recovery fails, the system shuts down.

8. The antifreeze liquid contaminated single chip performance recovery control method according to claim 7, characterized in that: If it is impossible to load to the target operating point or the lowest single chip voltage is less than the fault threshold, and the difference between the lowest single chip voltage and the average single chip voltage is greater than the preset value n, and the lowest single chip number is fixed, it is considered that there is an antifreeze contamination problem.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the antifreeze liquid contaminated single chip performance recovery method described in any one of claims 1-6 and / or the antifreeze liquid contaminated single chip performance recovery control method described in any one of claims 7-8 are implemented.

10. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the program, the antifreeze liquid contaminated single chip performance recovery method described in any one of claims 1-6 and / or the antifreeze liquid contaminated single chip performance recovery control method described in any one of claims 7-8 are implemented.

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