A static correction processing method and apparatus for seismic data

Abstract

This invention provides a static correction processing method and apparatus for seismic data, comprising: calculating multiple static correction quantities using multiple static correction methods on the seismic data; separating multiple low-frequency components and multiple high-frequency components corresponding to the multiple static correction quantities; determining a target low-frequency component from the multiple low-frequency components; determining a first section with unsatisfactory imaging effect and a second section with satisfactory imaging effect through a stacked profile; perturbing the high-frequency component corresponding to the first section to obtain multiple perturbed high-frequency components corresponding to the first section; determining the target high-frequency component corresponding to the first section from the multiple perturbed high-frequency components; and fusing the target low-frequency component, the target high-frequency component corresponding to the first section, and the high-frequency component corresponding to the second section to obtain the target static correction quantity. This achieves the purpose of improving the stacking effect of local sections in the stacked profile.

Description

Technical Field

[0001] This invention relates to the field of seismic exploration technology, and in particular to a static correction processing method and a static correction processing device for seismic data. Background Technology

[0002] With continuous economic development, the demand for oil and gas resources is increasing, and seismic exploration is now facing the challenge of expanding into complex surface areas such as mountainous regions. This is especially true in western my country, where numerous Mesozoic and Cenozoic basins are foreland basins, containing abundant oil and gas resources. Therefore, conducting seismic exploration in complex surface areas is of great significance.

[0003] For processing seismic data in complex mountainous areas, static correction is the first step and a key factor affecting the quality of the seismic profile. Existing near-surface modeling techniques can only grasp the general trend of velocity changes, and the resulting static correction values ​​only include low-frequency components and some high-frequency components. Among them, the low-frequency components in the static correction values ​​affect the attitude morphology, while the high-frequency components affect the imaging accuracy of the seismic stacking profile.

[0004] In the vast Loess Plateau region, due to the dramatic surface undulations, some single shots are severely affected by external interference, making it difficult to identify the first arrival. This results in inaccurate calculation of the residual static correction amount of the first arrival wave. Existing static correction algorithms are unable to obtain satisfactory static correction amounts to improve the superposition effect of local segments of the profile. Furthermore, the traditional static correction method for the relative residual short wavelength of reflected waves also fails to improve the imaging quality of local segments of the superimposed profile from poor to good. Summary of the Invention

[0005] Given that existing static correction algorithms are unable to obtain satisfactory static correction amounts to improve the stacking effect of local sections of the profile, and that traditional static correction methods using reflected waves relative to the remaining short wavelengths also fail to improve the imaging quality of local sections of the stacked profile, this invention proposes an embodiment to provide a static correction processing method for seismic data and a corresponding static correction processing device for seismic data that overcomes or at least partially solves the above problems.

[0006] This invention discloses a static correction processing method for seismic data, comprising:

[0007] Various static correction quantities were calculated from seismic data using multiple static correction methods.

[0008] The various low-frequency components and various high-frequency components corresponding to the various static correction quantities are separated and obtained respectively;

[0009] The target low-frequency component is determined from the plurality of low-frequency components;

[0010] By overlaying profiles, the first area where the imaging effect did not meet the requirements and the second area where the imaging effect met the requirements were determined;

[0011] The high-frequency components corresponding to the first location are perturbed to obtain multiple perturbed high-frequency components corresponding to the first location, and the target high-frequency component corresponding to the first location is determined from the multiple perturbed high-frequency components.

[0012] By fusing the target low-frequency component, the target high-frequency component corresponding to the first section, and the high-frequency component corresponding to the second section, the target static correction amount is obtained.

[0013] Optionally, the step of determining the first area where the imaging effect does not meet the requirements and the second area where the imaging effect meets the requirements by superimposing profiles includes:

[0014] The various static corrections are applied to the seismic data for stacking processing to obtain various stacked profiles corresponding to the various static corrections.

[0015] The first area where the imaging effect does not meet the requirements and the second area where the imaging effect meets the requirements are determined by the multiple superimposed profiles.

[0016] Optionally, the perturbation processing of the high-frequency components corresponding to the first location segment to obtain multiple perturbed high-frequency components corresponding to the first location segment includes:

[0017] The high-frequency components corresponding to the first location are perturbed by various preset trigonometric functions to obtain the various perturbed high-frequency components corresponding to the first location.

[0018] Optionally, determining the target high-frequency component corresponding to the first location from the multiple disturbed high-frequency components includes:

[0019] The high-frequency components after various disturbances are fused with the target low-frequency components respectively, and then applied to the seismic data for superposition processing to obtain the superimposed profiles of the various disturbances corresponding to the high-frequency components after various disturbances.

[0020] The corresponding high-frequency components of the target in the first area are determined by superimposing the profiles after various perturbations.

[0021] This invention also discloses a static correction processing device for seismic data, comprising:

[0022] The static correction calculation module is used to calculate various static corrections from seismic data using multiple static correction methods.

[0023] The high-low frequency separation module is used to separate and obtain the various low-frequency components and various high-frequency components corresponding to the various static correction quantities;

[0024] A target low-frequency component determination module is used to determine a target low-frequency component from the plurality of low-frequency components;

[0025] The site determination module is used to determine the first site that does not meet the imaging requirements and the second site that meets the imaging requirements by overlaying profiles;

[0026] The high-frequency component perturbation module is used to perturb the high-frequency components corresponding to the first location to obtain multiple perturbed high-frequency components corresponding to the first location, and to determine the target high-frequency component corresponding to the first location from the multiple perturbed high-frequency components.

[0027] The high-low frequency fusion module is used to fuse the target low-frequency component, the target high-frequency component corresponding to the first section, and the high-frequency component corresponding to the second section to obtain the target static correction amount.

[0028] Optionally, the site determination module includes:

[0029] The overlay submodule is used to apply the various static corrections to the seismic data for overlay processing to obtain various overlay profiles corresponding to the various static corrections.

[0030] The site determination submodule is used to determine, through the multiple superimposed profiles, a first site where the imaging effect does not meet the requirements and a second site where the imaging effect meets the requirements.

[0031] Optionally, the high-frequency component perturbation module includes:

[0032] The high-frequency component perturbation submodule is used to perturb the high-frequency components corresponding to the first location using various preset trigonometric functions to obtain various perturbed high-frequency components corresponding to the first location.

[0033] Optionally, the high-frequency component perturbation module includes:

[0034] The high-frequency component superposition submodule is used to fuse the various perturbed high-frequency components with the target low-frequency component, and apply them to the seismic data for superposition processing to obtain the superimposed profiles of the various perturbed high-frequency components respectively.

[0035] The high-frequency component determination submodule is used to determine the corresponding target high-frequency component of the first area through the superimposed profile after the various disturbances.

[0036] This invention also discloses an electronic device, comprising:

[0037] A processor and a storage medium, the storage medium storing machine-readable instructions executable by the processor, wherein when the electronic device is running, the processor executes the machine-readable instructions to perform the method as described in any one of the embodiments of the present invention.

[0038] This invention also discloses a computer-readable storage medium storing a computer program, which, when executed by a processor, performs the method described in any one of the embodiments of this invention.

[0039] The embodiments of the present invention have the following advantages:

[0040] In this embodiment of the invention, multiple static correction quantities are calculated by applying various static correction methods to seismic data; multiple low-frequency components and multiple high-frequency components corresponding to the multiple static correction quantities are separated; a target low-frequency component is determined from the multiple low-frequency components; a first section with unsatisfactory imaging effect and a second section with satisfactory imaging effect are determined by stacking profiles; the high-frequency component corresponding to the first section is perturbed to obtain multiple perturbed high-frequency components corresponding to the first section, and a target high-frequency component corresponding to the first section is determined from the multiple perturbed high-frequency components; the target low-frequency component, the target high-frequency component corresponding to the first section, and the high-frequency component corresponding to the second section are fused to obtain the target static correction quantity. This allows perturbing the first section with unsatisfactory imaging effect and fusing the perturbed high-frequency components to obtain the target static correction quantity. By employing complementary methods of high-frequency components in the static correction quantity with good imaging accuracy, the overall imaging accuracy of the stacked profile is improved, thereby achieving the goal of improving the stacking effect of local sections in the stacked profile. The imaging effect of seismic data with complex terrain is significantly improved. Attached Figure Description

[0041] To more clearly illustrate the technical solution of the present invention, the accompanying drawings used in the description of the present invention will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0042] Figure 1 This is a flowchart of the steps of a static correction processing method for seismic data provided in an embodiment of the present invention;

[0043] Figure 2 This is a schematic diagram of low-frequency and high-frequency components obtained after separating static correction quantities according to an embodiment of the present invention;

[0044] Figure 3A This is a schematic diagram of a static correction amount calculated using a tomographic inversion method, provided in an embodiment of the present invention.

[0045] Figure 3B This is a schematic diagram of a static correction amount calculated using the generalized linear inversion method provided in an embodiment of the present invention;

[0046] Figure 4 This is a schematic diagram of the effect of superimposed profiles before and after perturbation optimization of static correction amount provided by an embodiment of the present invention;

[0047] Figure 5A This is a schematic diagram of a preset trigonometric function curve provided in an embodiment of the present invention;

[0048] Figure 5B This is a schematic diagram of the water ripple feature after perturbation using a preset trigonometric function, provided by an embodiment of the present invention;

[0049] Figure 5C This is a schematic diagram of another water ripple feature after perturbation using a preset trigonometric function, provided by an embodiment of the present invention;

[0050] Figure 6A This is a schematic diagram of the static correction curve and the difference before and after optimization provided by an embodiment of the present invention;

[0051] Figure 6B This is a schematic diagram of another static correction curve and difference before and after optimization provided by an embodiment of the present invention;

[0052] Figure 7 This is a structural block diagram of a static correction processing device for seismic data provided in an embodiment of the present invention. Detailed Implementation

[0053] To make the above-mentioned objects, features, and advantages of the present invention more apparent and understandable, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0054] To address the challenges of existing static correction algorithms failing to obtain satisfactory static correction values ​​to improve the stacking effect of local sections of the seismic profile, and the inability of traditional static correction methods using reflected waves relative to residual short wavelengths to improve the imaging quality of local sections of the stacked profile, this invention provides a static correction processing method for seismic data. This method maintains the low-frequency components of the static correction value unchanged while perturbing the high-frequency components. The improved high-frequency components obtained from the perturbation process are then incorporated into the initial static correction value. Finally, new shot point static correction values ​​and receiver point static correction values ​​are output as optimized static correction values, thereby improving the stacking effect of local sections of the seismic profile.

[0055] Specifically, multiple static correction quantities are calculated by applying various static correction methods to the seismic data; multiple low-frequency components and multiple high-frequency components corresponding to the multiple static correction quantities are separated; a target low-frequency component is determined from the multiple low-frequency components; a first section with unsatisfactory imaging effect and a second section with satisfactory imaging effect are determined by overlaying profiles; the high-frequency component corresponding to the first section is perturbed to obtain multiple perturbed high-frequency components corresponding to the first section, and the target high-frequency component corresponding to the first section is determined from the multiple perturbed high-frequency components; the target low-frequency component, the target high-frequency component corresponding to the first section, and the high-frequency component corresponding to the second section are fused to obtain the target static correction quantity. This allows for perturbation processing of the first section where the imaging effect does not meet the requirements, and the high-frequency components after perturbation are fused to obtain the target static correction value. By adopting the complementary advantage of the high-frequency components in the static correction value with good imaging accuracy, the imaging accuracy of the entire stacked profile is improved, thereby achieving the purpose of improving the stacking effect of local sections in the stacked profile. The imaging effect of seismic data in complex terrain is obvious. For example, the problem of poor imaging in local sections of the thick loess plateau can be well solved after processing by this scheme.

[0056] Reference Figure 1 The diagram illustrates a flowchart of an embodiment of a static correction processing method for seismic data provided by the present invention, which may specifically include the following steps:

[0057] Step 101: Various static correction values ​​are calculated from the seismic data using multiple static correction methods;

[0058] Specifically, seismic data related to static correction in the seismic exploration area can be obtained. This seismic data may include source and receiver location data corresponding to the source and receiver points in the seismic exploration area, or near-surface survey data such as topographic data.

[0059] Since different static correction methods produce varying effects on seismic data, multiple static correction values ​​can be calculated by applying various static correction methods to the acquired seismic data. This allows for the fusion of advantageous sections obtained from different static correction methods. These various static correction methods may include, but are not limited to, layered modeling, first-arrival-time-based refraction, or tomographic inversion methods, and each static correction value in the set corresponds one-to-one with the different static correction methods used.

[0060] Step 102: Separate the various low-frequency components and various high-frequency components corresponding to the various static correction quantities;

[0061] Specifically, the static correction quantity shot-detector curve is separated into high- and low-frequency quantities using component differences. By performing high- and low-frequency separation on each static correction quantity separately, the low-frequency and high-frequency components corresponding to each static correction quantity are obtained. For example, some application software usually includes a function for high- and low-frequency separation of static correction quantities. This function can be used directly to perform high- and low-frequency separation on each static correction quantity to obtain the corresponding low-frequency and high-frequency components. As an example, assuming five static correction methods are used to calculate seismic data, five static correction quantities can be obtained. Performing high- and low-frequency separation on each of these five static correction quantities separately yields five low-frequency components and five high-frequency components corresponding to each of the five static correction quantities.

[0062] In one example, such as Figure 2 This is a schematic diagram showing the low-frequency and high-frequency components obtained after separating the static correction quantity, where TM represents the low-frequency component and high represents the high-frequency component. For example... Figure 3A As shown, a static correction value calculated using the tomographic inversion method is obtained. After high- and low-frequency separation, the tomographic inversion low-frequency static correction value (a) and tomographic inversion low-frequency static correction value (b) can be obtained. Figure 3B As shown, a static correction value calculated using the generalized linear inversion method is obtained. After high- and low-frequency separation, the generalized linear inversion low-frequency static correction value (a) and the generalized linear inversion low-frequency static correction value (b) can be obtained.

[0063] Step 103: Determine the target low-frequency component from the multiple low-frequency components;

[0064] Specifically, multiple static corrections can be applied to seismic data for stacking to obtain stacked profiles corresponding to the various static corrections. Then, the stacked profile with better imaging effect is determined from the stacked profiles, and the low-frequency component corresponding to the stacked profile with better imaging effect is selected as the target low-frequency component.

[0065] Step 104: By overlaying profiles, determine the first area where the imaging effect does not meet the requirements and the second area where the imaging effect meets the requirements;

[0066] Specifically, by applying multiple static corrections to seismic data for overlay processing, overlay profiles corresponding to the various static corrections are obtained. The overlay profiles are then analyzed to determine the first section where the imaging effect does not meet the requirements and the second section where the imaging effect meets the requirements.

[0067] Existing static correction methods may have poor processing effects in some local areas. In this embodiment of the invention, a first section with unsatisfactory imaging effect and a second section with satisfactory imaging effect can be determined by determining the superimposed profile. For the first section with unsatisfactory imaging effect, it is necessary to perturb the high-frequency components of the first section to improve the imaging effect of the first section through the high-frequency components; while for the second section with satisfactory imaging effect, it is not necessary to perturb the high-frequency components of the second section.

[0068] Step 105: Perturb the high-frequency components corresponding to the first location to obtain multiple perturbated high-frequency components corresponding to the first location, and determine the target high-frequency component corresponding to the first location from the multiple perturbated high-frequency components.

[0069] Specifically, multiple preset perturbation algorithms can be used to perturb the high-frequency components corresponding to the first location segment, resulting in multiple perturbed high-frequency components for the first location segment. The target high-frequency component for the first location segment can then be determined from these multiple perturbed high-frequency components. The preset perturbation algorithms can be pre-defined algorithms used to perturb the high-frequency components; for example, the preset perturbation algorithm can be a trigonometric function.

[0070] Step 106: Fuse the target low-frequency component, the target high-frequency component corresponding to the first location, and the high-frequency component corresponding to the second location to obtain the target static correction amount.

[0071] In this embodiment of the invention, the target static correction value can be obtained by fusing the target low-frequency component, the target high-frequency component corresponding to the first location, and the high-frequency component corresponding to the second location. Specifically, some application software typically includes a high-low frequency fusion function, which can be used directly to fuse the target low-frequency component, the target high-frequency component corresponding to the first location, and the high-frequency component corresponding to the second location.

[0072] In practice, after the target static correction is calculated, it can be applied to the seismic data for overlay processing to verify whether the effect of the overlay profile meets the requirements. If the effect meets the requirements, the target static correction can be saved for subsequent calculations. If the effect does not meet the requirements, the process can return to step 105 to re-perturb the high-frequency components to ensure the quality of the static correction.

[0073] As an example, suppose it is applied to seismic data in the Loess Plateau region, such as Figure 4 As shown, this diagram illustrates the effects of the overlay profiles before and after optimization by perturbating the static correction. In the unoptimized overlay profile, some sections exhibit poor imaging quality, such as discontinuities. In the optimized overlay profile, perturbing the high-frequency components of these poorly imaging sections improves their continuity. This demonstrates that the proposed solution effectively addresses the problem of poor imaging in localized sections of the thick Loess Plateau. Without altering the geological morphology, the continuity of the phase axis is significantly improved, thus resolving the issue of poor imaging quality caused by inaccurate first arrival picking and insufficient accuracy of the surface velocity model under complex surface conditions, further enhancing overall imaging quality.

[0074] In a preferred embodiment of the present invention, step 104 may specifically include the following steps:

[0075] The various static correction values ​​are applied to the seismic data for stacking processing to obtain various stacked profiles corresponding to the various static correction values; the first section with unsatisfactory imaging effect and the second section with satisfactory imaging effect are determined by the various stacked profiles.

[0076] Specifically, by applying various static corrections to seismic data and performing overlay processing, multiple overlay profiles corresponding to the various static corrections are obtained. By analyzing the multiple overlay profiles, the first section where the imaging effect does not meet the requirements and the second section where the imaging effect meets the requirements are determined.

[0077] Existing static correction methods may have poor processing effects in some local areas. In this embodiment of the invention, a first section with unsatisfactory imaging effect and a second section with satisfactory imaging effect can be determined by determining the superimposed profile. For the first section with unsatisfactory imaging effect, it is necessary to perturb the high-frequency components of the first section to improve the imaging effect of the first section through the high-frequency components; while for the second section with satisfactory imaging effect, it is not necessary to perturb the high-frequency components of the second section.

[0078] In a preferred embodiment of the present invention, step 105 may specifically include the following sub-steps:

[0079] The high-frequency components corresponding to the first location are perturbed by various preset trigonometric functions to obtain the various perturbed high-frequency components corresponding to the first location.

[0080] The preset trigonometric functions can be pre-defined algorithms used to perturb high-frequency components. Perturbation using preset trigonometric functions can produce a water ripple effect. Since the effect of perturbing high-frequency components is uncertain, in this embodiment of the invention, multiple preset trigonometric functions are used to perturb the high-frequency components corresponding to the first location, resulting in multiple perturbed high-frequency components for the first location. The best-performing component can then be selected from these multiple perturbed high-frequency components. For example, assuming there are ten preset trigonometric functions, perturbing the high-frequency components corresponding to the first location using these ten preset trigonometric functions can yield ten perturbed high-frequency components for the first location.

[0081] As an example, the predefined trigonometric function can be expressed as F(x) = Acos(wx + k), where F represents the high-frequency component disturbance value, x represents the geodetic coordinates of the shot-receiver point, A represents the amplitude, k represents the phase, k = 2π / n, n: a natural number, w represents the frequency, w = 2π / L, L = x i -x0. Additionally, a random function can be added to the preset trigonometric functions as a perturbation function, which generates a random variable in the range (-n, n). For example... Figure 5A The image shown is a schematic diagram of a preset trigonometric function curve. (As shown...) Figure 5B The image shown is a schematic diagram of the water ripple characteristics after perturbation using preset trigonometric functions, as follows: Figure 5C The image shown is a schematic diagram of another type of water ripple feature after perturbation using a preset trigonometric function.

[0082] like Figure 6A This is a schematic diagram of the static correction quantity curves and quantity difference curves before and after optimization. The quantity difference curve has two segments with non-zero values; a value of 0 indicates no quantity difference. After magnifying the quantity difference curve, the characteristics of the optimized static correction high-frequency quantity difference curves corresponding to the first section mentioned above can be seen. Figure 6B This is another schematic diagram of the static correction curves and difference curves before and after optimization, in which... Figure 6B The curve below is a feature of the difference curve after the optimization of the static correction high-frequency quantity corresponding to the first section mentioned above.

[0083] In a preferred embodiment of the present invention, step 105 may further include the following sub-steps:

[0084] The high-frequency components after various disturbances are fused with the target low-frequency components and then applied to the seismic data for superposition processing to obtain superimposed profiles corresponding to the high-frequency components after various disturbances. The corresponding target high-frequency components of the first section are determined through the superimposed profiles after various disturbances.

[0085] Specifically, the high-frequency components after various disturbances are fused with the target low-frequency components, and the resulting static correction is applied to the seismic data for superposition processing to obtain superimposed profiles corresponding to the high-frequency components after various disturbances. By analyzing the superimposed profiles after various disturbances, the corresponding target high-frequency components of the first segment are determined.

[0086] It should be noted that, for the sake of simplicity, the method embodiments are all described as a series of actions. However, those skilled in the art should understand that the embodiments of the present invention are not limited to the described order of actions, because according to the embodiments of the present invention, some steps can be performed in other orders or simultaneously. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions involved are not necessarily essential to the embodiments of the present invention.

[0087] Reference Figure 7 The diagram shows a structural block diagram of a static correction processing device for seismic data provided in an embodiment of the present invention, which may specifically include the following modules:

[0088] The static correction calculation module 701 is used to calculate various static correction quantities from seismic data using multiple static correction methods.

[0089] The high-low frequency separation module 702 is used to separate and obtain the multiple low-frequency components and multiple high-frequency components corresponding to the multiple static correction quantities;

[0090] The target low-frequency component determination module 703 is used to determine the target low-frequency component from the plurality of low-frequency components;

[0091] The site determination module 704 is used to determine the first site that does not meet the imaging requirements and the second site that meets the imaging requirements by overlaying profiles;

[0092] The high-frequency component perturbation module 705 is used to perturb the high-frequency components corresponding to the first location to obtain multiple perturbed high-frequency components corresponding to the first location, and to determine the target high-frequency component corresponding to the first location from the multiple perturbed high-frequency components.

[0093] The high-low frequency fusion module 706 is used to fuse the target low-frequency component, the target high-frequency component corresponding to the first section, and the high-frequency component corresponding to the second section to obtain the target static correction amount.

[0094] In a preferred embodiment of the present invention, the site determination module 704 includes:

[0095] The overlay submodule is used to apply the various static corrections to the seismic data for overlay processing to obtain various overlay profiles corresponding to the various static corrections.

[0096] The site determination submodule is used to determine, through the multiple superimposed profiles, a first site where the imaging effect does not meet the requirements and a second site where the imaging effect meets the requirements.

[0097] In a preferred embodiment of the present invention, the high-frequency component perturbation module 705 includes:

[0098] The high-frequency component perturbation submodule is used to perturb the high-frequency components corresponding to the first location using various preset trigonometric functions to obtain various perturbed high-frequency components corresponding to the first location.

[0099] In a preferred embodiment of the present invention, the high-frequency component perturbation module 705 includes:

[0100] The high-frequency component superposition submodule is used to fuse the various perturbed high-frequency components with the target low-frequency component, and apply them to the seismic data for superposition processing to obtain the superimposed profiles of the various perturbed high-frequency components respectively.

[0101] The high-frequency component determination submodule is used to determine the corresponding target high-frequency component of the first area through the superimposed profile after the various disturbances.

[0102] As the device embodiment is basically similar to the method embodiment, the description is relatively simple, and relevant parts can be found in the description of the method embodiment.

[0103] This invention also provides an electronic device, comprising:

[0104] The device includes a processor and a storage medium, the storage medium storing machine-readable instructions executable by the processor. When the electronic device is running, the processor executes the machine-readable instructions to perform the method described in any of the embodiments of the present invention. Specific implementations and technical effects are similar and will not be repeated here.

[0105] This invention also provides a computer-readable storage medium storing a computer program, which, when executed by a processor, performs the method described in any one of the embodiments of this invention. The specific implementation and technical effects are similar and will not be repeated here.

[0106] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other.

[0107] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, apparatus, or computer program products. Therefore, embodiments of the present invention can take the form of entirely hardware embodiments, entirely software embodiments, or embodiments combining software and hardware aspects. Furthermore, embodiments of the present invention can take the form of computer program products implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0108] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, terminal devices (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing terminal device to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing terminal device, generate instructions for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0109] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing terminal device to operate in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0110] These computer program instructions can also be loaded onto a computer or other programmable data processing terminal equipment, causing a series of operational steps to be performed on the computer or other programmable terminal equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable terminal equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0111] Although preferred embodiments of the present invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments as well as all changes and modifications falling within the scope of the embodiments of the present invention.

[0112] Finally, it should be noted that in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or terminal device that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or terminal device. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or terminal device that includes said element.

[0113] The static correction processing method and apparatus for seismic data provided by the present invention have been described in detail above. Specific examples have been used to illustrate the principle and implementation of the present invention. The description of the above embodiments is only for the purpose of helping to understand the method and core idea of ​​the present invention. At the same time, for those skilled in the art, there will be changes in the specific implementation and application scope based on the idea of ​​the present invention. Therefore, the content of this specification should not be construed as a limitation of the present invention.

Claims

1. A method of statics processing of seismic data, characterized in that, The method comprises the following steps: a plurality of static correction amounts are calculated by using a plurality of static correction methods on seismic data; a plurality of low-frequency components and a plurality of high-frequency components corresponding to the plurality of static correction amounts are separated; a target low-frequency component is determined from the plurality of low-frequency components; a first section with an imaging effect not meeting a requirement and a second section with an imaging effect meeting the requirement are determined by using a stack profile; a target high-frequency component corresponding to the first section is determined by performing perturbation processing on a high-frequency component corresponding to the first section to obtain a plurality of perturbed high-frequency components corresponding to the first section; the perturbation processing on the high-frequency component corresponding to the first section to obtain the plurality of perturbed high-frequency components corresponding to the first section comprises: the high-frequency component corresponding to the first section is perturbed by using a plurality of preset trigonometric functions to obtain the plurality of perturbed high-frequency components corresponding to the first section; the target high-frequency component corresponding to the first section is determined from the plurality of perturbed high-frequency components by: the plurality of perturbed high-frequency components are fused with the target low-frequency component respectively, and are applied to seismic data for stack processing to obtain a plurality of perturbed stack profiles corresponding to the plurality of perturbed high-frequency components; the target high-frequency component corresponding to the first section is determined by using the plurality of perturbed stack profiles; a target static correction amount is obtained by fusing the target low-frequency component, the target high-frequency component corresponding to the first section, and a high-frequency component corresponding to the second section.

2. The method of claim 1, wherein, the first section with the imaging effect not meeting the requirement and the second section with the imaging effect meeting the requirement are determined by using a stack profile, which comprises: a plurality of stack profiles corresponding to the plurality of static correction amounts are obtained by applying the plurality of static correction amounts to seismic data for stack processing; the first section with the imaging effect not meeting the requirement and the second section with the imaging effect meeting the requirement are determined by using the plurality of stack profiles.

3. An apparatus for static correction processing of seismic data, characterized by, The method comprises the following steps: a static correction amount calculation module is configured to calculate a plurality of static correction amounts by using a plurality of static correction methods on seismic data; a high-low frequency separation module is configured to separate a plurality of low-frequency components and a plurality of high-frequency components corresponding to the plurality of static correction amounts; a target low-frequency component determination module is configured to determine a target low-frequency component from the plurality of low-frequency components; a section determination module is configured to determine a first section with an imaging effect not meeting a requirement and a second section with an imaging effect meeting the requirement by using a stack profile; a high-frequency component perturbation module is configured to determine a target high-frequency component corresponding to the first section by performing perturbation processing on a high-frequency component corresponding to the first section to obtain a plurality of perturbed high-frequency components corresponding to the first section; a high-low frequency fusion module is configured to fuse the target low-frequency component, the target high-frequency component corresponding to the first section, and a high-frequency component corresponding to the second section to obtain a target static correction amount; the high-frequency component perturbation module comprises: The high-frequency component perturbation submodule is configured to perturb the high-frequency components corresponding to the first area by using a plurality of preset trigonometric functions respectively, to obtain a plurality of perturbed high-frequency components corresponding to the first area; The high-frequency component superposition submodule is configured to fuse the plurality of perturbed high-frequency components with the target low-frequency component respectively, and apply the plurality of perturbed high-frequency components to seismic data for superposition processing, to obtain a plurality of perturbed superposition profiles corresponding to the plurality of perturbed high-frequency components respectively; The high-frequency component determination submodule is configured to determine the target high-frequency component of the first area by using the plurality of perturbed superposition profiles.

4. The apparatus of claim 3, wherein, The area determination module comprises: The superposition submodule is configured to apply the plurality of static correction amounts to seismic data for superposition processing, to obtain a plurality of superposition profiles corresponding to the plurality of static correction amounts respectively; The area determination submodule is configured to determine a first area with an imaging effect that does not meet requirements and a second area with an imaging effect that meets requirements by using the plurality of superposition profiles.

5. An electronic device, comprising: The processor and the storage medium, the storage medium stores the machine readable instructions executable by the processor, when the electronic equipment runs, the processor executes the machine readable instructions, to execute the method as claimed in any one of claims 1-2. The storage medium stores a computer program, and the computer program is executed by the processor to execute the method as claimed in any one of claims 1-2.

6. A computer-readable storage medium, characterized in that, ​

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