Material radiation performance measuring device based on energy method

Abstract

The application provides a material radiation performance measuring device based on an energy method, which comprises a vacuum cover and a refrigerator, a copper screen is arranged in the vacuum cover, and a measuring assembly is arranged in the copper screen; the refrigerator is connected with the vacuum cover, and a refrigeration end of the refrigerator is connected with the measuring assembly; the measuring assembly comprises a black body, at least one sample table, a reflection mechanism and a measuring mechanism, the reflection mechanism is adapted to turn to the black body or the sample table, receive the radiation energy emitted by the black body or the sample table and transmit the radiation energy to the measuring mechanism. Through the above manner, the measuring assembly is arranged in the vacuum cover, the measuring assembly comprises at least one sample table and a black body, the reflection mechanism can turn to the black body or the sample table to transmit the radiation energy emitted by the black body and the sample table to the measuring mechanism, so that the measurement of the radiation energy of the material sample placed on the black body and the sample table is realized, then the radiation energy of the black body and the sample placed on the sample table is compared, and the measurement of the surface radiation performance of the sample at low temperature is realized.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of material radiation performance measurement, and in particular to a material radiation performance measurement device based on an energy method. BACKGROUND

[0002] The radiation performance of a material surface is mainly tested by testing the emissivity of the material surface. The emissivity can be divided into spectral directional emissivity, full-wavelength directional emissivity, spectral hemispherical emissivity and full-wavelength hemispherical emissivity, wherein the hemispherical emissivity can be considered to be approximately equal to the normal emissivity. In practice, the emissivity of a material is affected by many factors. For the measurement of the emissivity of a material surface, there are currently mainly calorimetric method, reflection method and energy method.

[0003] The calorimetric method is widely used in the measurement of full-wavelength hemispherical emissivity of a material surface due to its simplicity, ease of use and wide temperature measurement range. However, the calorimetric method is complicated in sample preparation, long in testing time, and can only measure full-wavelength hemispherical emissivity, and cannot measure spectral emissivity or directional emissivity, which limits its range of use.

[0004] The reflection method is a method for indirectly measuring emissivity. By projecting radiation energy of known intensity onto the surface of a sample to be measured, the energy reflected by the sample surface is measured using a reflectometer, and then the reflectivity p of the sample surface is obtained. The emissivity e of the sample surface can be obtained by using the Kirchhoff's law. However, the reflection method is only suitable for measuring the emissivity of opaque sample surfaces. When testing transparent samples, the radiation signal will be reflected multiple times in the material, which will affect the test results and limit the test range.

[0005] The energy method is a method for directly measuring emissivity. By comparing the radiation energy of a black body per unit area with that of a sample at the same temperature, the emissivity of the material surface can be obtained. According to the Stefan-Boltzmann law, the lower the temperature, the smaller the black body radiation energy, and the actual object radiation force is always smaller than the black body radiation force at the same temperature. Therefore, the lower the temperature, the easier it is to be covered by radiation energy, which also makes it more difficult to measure the emissivity of materials at low temperatures using the energy method, and the energy method is more commonly used in high temperature regions and less commonly used in low temperature regions. SUMMARY

[0006] The embodiment of the present application provides a material radiation performance measurement device based on an energy method, which solves the problem that the energy method cannot accurately measure the radiation performance of materials at low temperatures in the prior art.

[0007] The embodiment of the present application provides a material radiation performance measurement device based on an energy method, which solves the problem that the energy method cannot accurately measure the radiation performance of materials at low temperatures in the prior art.

[0008] A refrigerator is connected with the vacuum cover, and a refrigeration end of the refrigerator is connected with the measuring assembly;

[0009] The measuring assembly comprises a black body, at least one sample table, a reflecting mechanism and a measuring mechanism, the reflecting mechanism is adapted to turn to the black body or the sample table, receive the radiation energy emitted by the black body or the sample table and transmit to the measuring mechanism.

[0010] The energy method-based material radiation performance measuring device according to one embodiment of the present application further comprises a frame, the frame is provided with the vacuum cover at the top, and the refrigerator is arranged on the side of the frame away from the vacuum cover;

[0011] The frame is provided with a support platform at the top, the support platform is used for supporting the copper screen, the copper screen is further provided with a measuring table connected with the support platform, the black body, the sample table and the reflecting mechanism are placed on the measuring table, and the measuring mechanism is installed on the vacuum cover and extends to the inside of the copper screen at the receiving end.

[0012] The energy method-based material radiation performance measuring device according to one embodiment of the present application is connected through an epoxy rod between the support platform and the frame and between the support platform and the measuring table.

[0013] The energy method-based material radiation performance measuring device according to one embodiment of the present application comprises a first reflecting gold mirror fixedly connected with the measuring table and a second reflecting gold mirror rotationally connected with the measuring table;

[0014] The first reflecting gold mirror is located directly above the second reflecting gold mirror, the first reflecting gold mirror is provided with a first reflecting surface, the second reflecting gold mirror is provided with a second reflecting surface arranged at an angle with the first reflecting surface and facing the first reflecting surface, and the receiving end of the measuring mechanism corresponds to the position of the first reflecting gold mirror.

[0015] The energy method-based material radiation performance measuring device according to one embodiment of the present application is provided with the black body and a plurality of sample tables around the second reflecting gold mirror.

[0016] The energy method-based material radiation performance measuring device according to one embodiment of the present application further comprises a driving assembly, the driving assembly comprises a driving motor and a magnetic fluid sealing mechanism connected with the driving motor, an output end of the driving motor extends to the second reflecting gold mirror through the magnetic fluid sealing mechanism, so that the second reflecting gold mirror is adapted to turn to the black body or the sample table.

[0017] The energy method based material radiation performance measuring device according to one of the embodiments of the present application, wherein the refrigerating machine is arranged with a disc-shaped bellows towards one side of the frame body.

[0018] The energy method based material radiation performance measuring device according to one of the embodiments of the present application, wherein the outer periphery of the copper screen is surrounded with a heat insulation layer, and the inner periphery of the copper screen is coated with a blackbody coating.

[0019] The energy method based material radiation performance measuring device according to one of the embodiments of the present application, wherein the refrigerating machine comprises a first-stage refrigerating head and a second-stage refrigerating head, the first-stage refrigerating head is connected with the copper screen through a first copper braid, and the second-stage refrigerating head is connected with the sample table and the blackbody through a second copper braid.

[0020] The energy method based material radiation performance measuring device according to one of the embodiments of the present application, wherein the blackbody and the sample table are provided with resistance heating sheets and thermometers around the periphery, for controlling and monitoring the temperature of the blackbody and the sample table.

[0021] The energy method based material radiation performance measuring device provided by the embodiments of the present application comprises a vacuum cover and a refrigerating machine, the vacuum cover is internally arranged with a measuring assembly, and the measuring assembly comprises at least one sample table and a blackbody; a reflecting mechanism can be turned to the blackbody or the sample table to transmit the radiation energy emitted by the blackbody and the sample table to a measuring mechanism, so as to measure the radiation energy of a material sample placed on the blackbody and the sample table, and then compare the radiation energy of the blackbody with that of the sample placed on the sample table, thereby realizing the measurement of the radiation performance of the sample surface at low temperature. BRIEF DESCRIPTION OF DRAWINGS

[0022] In order to more clearly illustrate the technical solutions of the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or the prior art description. Obviously, the drawings in the following description are some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without any creative effort on the basis of these drawings.

[0023] Figure 1 The structural schematic diagram of the energy method based material radiation performance measuring device according to the embodiments of the present application;

[0024] Figure 2 The internal structure diagram shown in Figure 1

[0025] Figure 3 The structural schematic diagram of the energy method based material radiation performance measuring device shown in Figure 1

[0026] Figure 4 Figure 3 ​​​The internal structure view of the copper screen shown;

[0027] Figure 5 for Figure 2 The diagram shows a simplified connection between the refrigerator, the blackbody inside the copper screen and copper sheet, and the sample stage.

[0028] Figure label:

[0029] 10. Vacuum chamber; 110. Copper screen; 1110. Measuring stage; 1120. Insulation layer; 1130. Blackbody coating; 120. Measuring assembly; 1210. Blackbody; 1220. Sample stage; 1230. Reflection mechanism; 1231. First reflecting gold mirror; 12310. First reflecting surface; 1232. Second reflecting gold mirror; 12320. Second reflecting surface; 1240. Measuring mechanism; 130. Resistance heating element; 140. Thermometer;

[0030] 20. Refrigeration unit; 210. Disc-shaped corrugated pipe; 220. Primary cooling head; 230. Secondary cooling head; 240. First copper braid; 250. Second copper braid;

[0031] 30. Frame; 310. Supporting platform;

[0032] 40. Drive assembly; 410. Drive motor; 420. Magnetohydrodynamic sealing mechanism. Detailed Implementation

[0033] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0034] In the description of the embodiments of the present invention, it should be noted that the terms "center," "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing the embodiments of the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the embodiments of the present invention. In addition, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0035] In the description of the embodiments of the present invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "connected" and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium. Those skilled in the art can understand the specific meaning of the above terms in the embodiments of the present invention based on the specific circumstances.

[0036] The following is combined Figures 1-5 This invention describes a material radiation performance measurement device based on the energy method, according to an embodiment of the present invention.

[0037] Specifically, the material radiation performance measurement device based on the energy method includes a vacuum chamber 10 and a refrigerator 20. A copper screen 110 is installed inside the vacuum chamber 10, and a measurement component 120 is installed inside the copper screen 110. The refrigerator 20 is connected to the vacuum chamber 10, and its cooling end is connected to the measurement component 120. The measurement component 120 includes a blackbody 1210, at least one sample stage 1220, a reflection mechanism 1230, and a measurement mechanism 1240. The reflection mechanism 1230 is adapted to rotate to the blackbody 1210 or the sample stage 1220 to receive the radiation energy emitted by the blackbody 1210 or the sample stage 1220 and transmit it to the measurement mechanism 1240. That is, the refrigerator 20 can create a low-temperature environment for the vacuum chamber 10, and the reflection mechanism 1230 can sequentially measure the radiation energy of the sample stage 1220 and the blackbody 1210, thereby comparing the radiation energy of the sample on the blackbody 1210 and the sample stage 1220 to achieve the measurement of the surface radiation performance of the sample at low temperature.

[0038] In some embodiments of the present invention, the measuring mechanism 1240 may be, but is not limited to, an infrared detector.

[0039] It should be noted that the system also includes a frame 30, with the vacuum chamber 10 located at the top of the frame 30 and connected to it. The refrigerator 20 is located at the bottom of the frame 30, that is, on the side away from the vacuum chamber 10. It should also be noted that the frame 30 includes a top plate and four supporting legs that support the top plate. With the top plate as a reference, the vacuum chamber 10 is located above the top plate, and the refrigerator 20 is located below the top plate.

[0040] Please continue to refer to Figure 2 and Figure 4The frame 30 has a support platform 310 on top, which supports the copper screen 110 and is located inside the vacuum chamber 10. Inside the copper screen 110, there is also a measuring stage 1110 connected to the support platform 310. The blackbody 1210, sample stage 1220, and reflector 1230 are placed on the measuring stage 1110. The measuring mechanism 1240 is mounted on the vacuum chamber 10, and its receiving end extends to the inside of the copper screen 110. Specifically, the support platform 310 and the frame 30, as well as the support platform 310 and the measuring stage 1110, are connected by epoxy resin rods. The epoxy resin rods have heat insulation properties, which reduces heat conduction and leakage at the blackbody 1210 and sample stage 1220. That is, heat from the frame 30 side will not be transferred to the inside of the vacuum chamber 10 through the epoxy resin rods, thereby ensuring that the low-temperature measurement inside the vacuum chamber 10 is not affected by the external environment. In some embodiments of the present invention, the frame 30 and the support platform 310 are connected by four epoxy resin rods. Similarly, the support platform 310 and the measuring table 1110 are also connected by four epoxy resin rods. In other feasible embodiments, the number of epoxy resin rods may be three, five, six, etc., and is not limited here.

[0041] Please continue to refer to Figure 4 In some embodiments of the present invention, the reflection mechanism 1230 includes a first reflecting gold mirror 1231 fixedly connected to the measuring stage 1110 and a second reflecting gold mirror 1232 rotatably connected to the measuring stage 1110. The first reflecting gold mirror 1231 is located directly above the second reflecting gold mirror 1232. The first reflecting gold mirror 1231 has a first reflecting surface 12310, and the second reflecting gold mirror 1232 has a second reflecting surface 12320 facing the first reflecting surface 12310 and forming an angle with the first reflecting surface 12310. The receiving end of the measuring mechanism 1240 corresponds to the position of the first reflecting gold mirror 1231.

[0042] For the first reflecting gold mirror 1231, a connecting frame is provided on the measuring stage 1110, and the first reflecting gold mirror 1231 is mounted on the connecting frame, that is, the first reflecting gold mirror 1231 is fixedly connected to the measuring stage 1110 through the connecting frame. The second reflecting gold mirror 1232 is located directly below the first reflecting gold mirror 1231. The first reflecting surface 12310 and the second reflecting surface 12320 are both in a non-horizontal or non-vertical state relative to the horizontal plane, that is, the first reflecting surface 12310 and the second reflecting surface 12320 are both set at an angle to the horizontal plane. For the sample stage 1220, the material sample to be tested is placed on the sample stage 1220. The second reflecting gold mirror 1232 can first rotate to the sample stage 1220 to receive the radiation energy of the material sample to be tested on the sample stage 1220, and then reflect it to the first reflecting gold mirror 1231, and then reflect it to the receiving end of the measuring mechanism 1240.

[0043] In some embodiments of the present invention, a blackbody 1210 and a plurality of sample stages 1220 are arranged around a second reflecting gold mirror 1232. Optionally, the number of sample stages 1220 can be three, and they are evenly spaced around the second reflecting gold mirror 1232 together with the blackbody 1210. That is, the second reflecting gold mirror 1232 can first be rotated sequentially to the three sample stages 1220 to measure the radiation properties of the material samples to be tested on the three sample stages 1220, and then rotated to the blackbody 1210 to measure the radiation of the blackbody 1210.

[0044] The bottom of the second reflecting gold mirror 1232 is provided with a drive assembly 40, which includes a drive motor 410 and a magnetohydrodynamic sealing mechanism 420 connected to the drive motor 410. The output end of the drive motor 410 passes through the magnetohydrodynamic sealing mechanism 420 and extends to the second reflecting gold mirror 1232, so that the second reflecting gold mirror 1232 is suitable for rotating to the blackbody 1210 or the sample stage 1220. The drive motor 410 can be, but is not limited to, a stepper motor. Holes can be made in the frame 30, the support platform 310, and the measuring stage 1110, so that the output shaft of the drive motor 410 passes through the hole and connects to the second reflecting gold mirror 1232, that is, the second reflecting gold mirror 1232 can rotate relative to the first reflecting gold mirror 1231. The magnetohydrodynamic sealing mechanism 420 is used to prevent the drive motor 410 from failing in low-temperature environments and to ensure the normal rotation of the drive motor 410. The drive motor 410 and the magnetohydrodynamic sealing device enable precise rotation of the second reflective gold mirror 1232, thereby improving the accuracy of the measurement and the degree of automation.

[0045] Please continue to refer to Figure 2 , Figure 4 and Figure 5 In some embodiments of the present invention, a disc bellows tube 210 is provided on the side of the refrigerator 20 facing the frame 30, so that the vibration of the refrigerator 20 during operation will not cause the vacuum chamber 10 to vibrate. The refrigerator 20 includes a primary cooling head 220 and a secondary cooling head 230. The primary cooling head 220 is connected to the copper screen 110 through a first copper braid 240, and the secondary cooling head 230 is connected to the sample stage 1220 and the blackbody 1210 through a second copper braid 250. Thus, the use of the first copper braid 240, the second copper braid 250, and the disc bellows tube 210 reduces the impact of the vibration of the refrigerator 20 during operation on the internal measurement environment of the copper screen 110.

[0046] Furthermore, the copper screen 110 is surrounded by an insulation layer 1120. The insulation layer 1120 can be composed of multiple layers of insulation materials, which can reduce the internal temperature of the copper screen 110, provide a stable low-temperature environment for testing, and reduce background noise.

[0047] The inner circumference of the copper screen 110 is coated with a blackbody coating 1130, which has a high emissivity. This reduces the impact of sample radiation energy reflection on the test. Specifically, the radiation energy from the sample on the sample stage 1220 is reflected by the inner side of the copper screen 110 to the first reflecting gold mirror 1231 or the second reflecting gold mirror 1232, thus affecting the measurement accuracy of the blackbody 1210 or the sample on the sample stage 1220.

[0048] In some embodiments of the present invention, resistance heating elements 130 and thermometers 140 are provided around the blackbody 1210 and the sample stage 1220 for controlling and monitoring the temperature of the blackbody 1210 and the sample stage 1220. It should be noted that the placement of the resistance heating elements 130 and thermometers 140 utilizes PID control to ensure that the temperature at the blackbody 1210 and the sample stage 1220 remains consistent, thereby improving measurement accuracy. The blackbody 1210 is further designed using the Monte Carlo ray tracing method to ensure that the emissivity of the blackbody 1210 is close to 1.

[0049] In embodiments of the present invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0050] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., refer to specific features, structures, materials, or characteristics described in connection with that embodiment or example, which are included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0051] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A material radiation performance measurement device based on the energy method, characterized in that, include: A vacuum chamber containing a copper screen, and a measuring component is located inside the copper screen. A refrigerator is connected to the vacuum chamber, and the cooling end of the refrigerator is connected to the measuring component; The measurement assembly includes a blackbody, at least one sample stage, a reflection mechanism, and a measurement mechanism. The reflection mechanism is adapted to rotate to the blackbody or the sample stage to receive the radiation energy emitted by the blackbody or the sample stage and transmit it to the measurement mechanism. It also includes a frame, the vacuum hood being installed on the top of the frame, and the refrigeration unit being installed on the side of the frame away from the vacuum hood; The top of the frame is provided with a support platform for supporting the copper screen. The copper screen is also provided with a measuring stage connected to the support platform. The blackbody, the sample stage and the reflection mechanism are placed on the measuring stage. The measuring mechanism is installed on the vacuum hood and the receiving end extends to the inside of the copper screen. The reflection mechanism includes a first reflecting gold mirror fixedly connected to the measuring platform and a second reflecting gold mirror rotatably connected to the measuring platform; The first reflecting gold mirror is located directly above the second reflecting gold mirror. The first reflecting gold mirror has a first reflecting surface. The second reflecting gold mirror has a second reflecting surface facing the first reflecting surface and set at an angle to the first reflecting surface. The receiving end of the measuring mechanism corresponds to the position of the first reflecting gold mirror. It also includes a drive assembly, which includes a drive motor and a magnetohydrodynamic sealing mechanism connected to the drive motor. The output end of the drive motor passes through the magnetohydrodynamic sealing mechanism and extends to the second reflective gold mirror, so that the second reflective gold mirror is adapted to rotate to the blackbody or the sample stage. The refrigeration unit is equipped with a disc corrugated pipe on the side facing the frame. The outer periphery of the copper screen is provided with a heat insulation layer, and the inner periphery of the copper screen is coated with a black body coating.

2. The material radiation performance measurement device based on the energy method according to claim 1, characterized in that, The support platform and the frame, as well as the support platform and the measuring table, are connected by epoxy resin rods.

3. The material radiation performance measurement device based on the energy method according to claim 1, characterized in that, The blackbody and the plurality of sample stages are arranged around the second reflecting gold mirror.

4. The material radiation performance measuring device based on the energy method according to any one of claims 1 to 3, characterized in that, The refrigeration unit includes a primary refrigeration head and a secondary refrigeration head. The primary refrigeration head is connected to the copper screen via a first copper braid, and the secondary refrigeration head is connected to the sample stage and the blackbody via a second copper braid.

5. The material radiation performance measuring device based on the energy method according to any one of claims 1 to 3, characterized in that, The blackbody and the sample stage are equipped with resistance heating elements and thermometers on their periphery for controlling and monitoring the temperature of the blackbody and the sample stage.

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