Spectrometer, portable device and method for detecting electromagnetic radiation

Abstract

A spectrometer (10) comprising an emitter (11) configured to emit electromagnetic radiation; a sample area (12) arranged at an outer surface (13) of the spectrometer (10); a modulation unit (14) comprising an electrochromic material; a filter (15); an optical detector (16); an integrated circuit (17) having a main extension plane and an optical path for electromagnetic radiation emitted by the emitter (11) via the sample area (12), the modulation unit (14) and the filter (15) towards the optical detector (16), wherein the electrochromic material is electrically connected with the integrated circuit (17) and the modulation unit (14) is configured to time-modulate the electromagnetic radiation. Furthermore, a method for detecting electromagnetic radiation is provided.

Description

[0001] This application relates to spectrometers, portable devices, and methods for detecting electromagnetic radiation.

[0002] Infrared spectrometers are widely used in gas detection, medical sensing, environmental monitoring, and industrial process control. To use infrared spectrometers in portable devices such as mobile phones, miniaturization is necessary. Furthermore, cost reduction is required for consumer applications.

[0003] To detect electromagnetic radiation in the infrared range, detector cooling is typically required to increase the signal-to-noise ratio. However, cooling consumes space, which contradicts the miniaturization of spectrometers. Thermal detectors that do not require cooling often have significantly lower detectivity. Furthermore, the performance of the spectrometer's emitter changes significantly with temperature. These factors, among others, can lead to a reduction in the spectrometer's accuracy.

[0004] The objective is to provide a more accurate spectrometer. A further objective is to provide a method for detecting electromagnetic radiation with even higher accuracy.

[0005] These objectives are achieved through the subject matter of the independent claims. Further developments and embodiments are described in the dependent claims.

[0006] According to at least one embodiment of the spectrometer, the spectrometer includes a transmitter configured to emit electromagnetic radiation. For example, the transmitter is a light-emitting diode (LED). The transmitter can be configured to emit electromagnetic radiation in the visible and infrared ranges. In particular, the transmitter is configured to emit electromagnetic radiation in the infrared range. The transmitter can be a single radiation source. Alternatively, the transmitter includes an array of radiation sources. The transmitter can be configured to emit electromagnetic radiation in a predetermined wavelength range. For example, the transmitter is configured to emit electromagnetic radiation in a wavelength range of at least 100 nm.

[0007] The spectrometer also includes a sample region disposed on the outer surface of the spectrometer. The outer surface of the spectrometer is the surface in contact with the spectrometer's environment. This means that the spectrometer is defined by its outer surface. The sample region may be a portion of the outer surface of the spectrometer. For example, the sample region may be disposed on one side of the spectrometer. The sample region may be disposed on the top side of the spectrometer. The sample region is in direct contact with the spectrometer's environment. The sample region may be configured to be in direct contact with the sample substance to be analyzed. The sample substance may be a solid, liquid, or gas.

[0008] The spectrometer further includes a modulation unit comprising an electrochromic material. This electrochromic material is configured to change its optical properties when a voltage is applied to it. For example, the transmission of electromagnetic radiation changes when a voltage is applied to the electrochromic material. The electrochromic material may include tungsten oxide (WO3). It may also include an organic polymer. The modulation unit may include a stack of layers. The modulation unit may include a first electrode on which a charge storage layer is disposed. The charge storage layer may include NiO. An ion-conducting layer may be disposed on the charge storage layer. The ion-conducting layer may include Ta2O5. An active layer may be disposed on the ion-conducting layer. The active layer may include the electrochromic material. The electrochromic material may be deposited by sputtering or evaporation. A second electrode may be disposed on the active layer. The second electrode may be a grid comprising a conductive material. Alternatively, the second electrode may be a very thin layer formed by sputtering. The second electrode includes, for example, nickel, chromium, or a transparent conductive oxide such as indium tin oxide. A voltage may be applied to the modulation unit via the first and second electrodes. An air gap can be set within the modulation unit to improve the spectral response under diffuse light conditions.

[0009] The spectrometer also includes a filter. The filter can be configured to be transmissive over a predetermined wavelength range. Furthermore, the filter can exhibit a high absorption coefficient for electromagnetic radiation outside the predetermined wavelength range. For example, the filter has an absorption coefficient of at least 0.8 for electromagnetic radiation outside the predetermined wavelength range. Specifically, the filter has an absorption coefficient of at least 0.9 for electromagnetic radiation outside the predetermined wavelength range. The filter can be an interference filter, such as a Fabry-Perot interferometer filter. A Fabry-Perot interferometer filter can include Nb₂O₅ and / or Al₂O₃.

[0010] The spectrometer also includes an optical detector. The optical detector is configured to detect electromagnetic radiation. To this end, the optical detector is configured to convert electromagnetic radiation arriving at the optical detector into a modulated voltage signal. The optical detector may be a single optical detector. Alternatively, the optical detector may comprise multiple detectors arranged in a line or matrix array.

[0011] The spectrometer also includes an integrated circuit having a main extension plane. The integrated circuit can be an application-specific integrated circuit (ASIC). The integrated circuit can be configured to read and amplify the modulated voltage signal of the optical detector. The integrated circuit can also be configured to control the readout frequency of the optical detector.

[0012] The spectrometer also includes an optical path for electromagnetic radiation emitted by the transmitter, passing through the sample region, modulation unit, and filter toward the optical detector. This means that at least a portion of the electromagnetic radiation emitted by the transmitter during operation reaches the optical detector via the sample region, modulation unit, and filter. At least a portion of the electromagnetic radiation emitted by the transmitter during operation passes through the sample region, modulation unit, and filter on its way toward the optical detector. The existence of an optical path between the transmitter and the filter can mean that at least a portion of the electromagnetic radiation emitted by the transmitter during operation is not absorbed or reflected on its way from the transmitter to the optical detector.

[0013] The electrochromic material is electrically connected to the integrated circuit. The electrochromic material can be electrically connected to the integrated circuit via a first electrode and a second electrode. The integrated circuit can be configured to control the frequency of the modulation unit. This means that the integrated circuit can be configured to control the frequency of the voltage applied to the electrochromic material. The frequency of the voltage applied to the electrochromic material can be less than 10 kHz.

[0014] The modulation unit is configured to modulate electromagnetic radiation over time. The modulation unit can be configured to modulate electromagnetic radiation emitted by the transmitter over time. This may mean that the intensity of the electromagnetic radiation passing through the modulation unit is modulated. For example, the intensity of the electromagnetic radiation passing through the modulation unit at a first moment may differ from the intensity at a second moment. After modulation, the intensity of the electromagnetic radiation can vary over time. In particular, the intensity of the modulated electromagnetic radiation varies periodically over time.

[0015] The spectrometer described in this article can be configured to detect electromagnetic radiation in the visible and / or infrared range with higher precision. Furthermore, the spectrometer can be configured to be very compact and integrated into portable devices.

[0016] For measurement, the sample is placed on top of the sample region. This means placing a solid or liquid on the sample region, or placing the spectrometer in the environment of the gas to be detected. In this case, the sample region is in direct contact with the gas. Electromagnetic radiation emitted by the transmitter is transmitted, reflected, or absorbed by the sample material. Therefore, the intensity of the wavelength transmitted through the sample region to the optical detector varies depending on the absorption or reflection characteristics of the sample material. Different materials can be analyzed in this way.

[0017] Spectrometers can be configured to be very small because they can employ optical detectors that do not require cooling. In many cases, optical detectors require cooling to improve accuracy. In the case of the spectrometer described in this article, accuracy is improved in a different way.

[0018] Electromagnetic radiation detected by an optical detector passes through a modulation unit. In the modulation unit, the electromagnetic radiation is time-modulated. The modulation frequency is determined by an integrated circuit. The integrated circuit can include a lock-on detection function. This means that even very weak electromagnetic radiation can be detected for a known modulation frequency. In this way, the signal-to-noise ratio is improved. Because very weak electromagnetic radiation can be detected, optical detectors with low detection rates, such as thermal or photon detectors, can be used. The detector does not require cooling, which is why the spectrometer can be very small. More reliable and lower-power emitters with less thermal drift can also be used. Furthermore, low-power emitters are safer for consumer applications.

[0019] In summary, all components of a spectrometer can be integrated into a single compact unit. Specifically, all or part of the spectrometer can be monolithically integrated. This means that different parts of the spectrometer can be stacked on top of each other. Therefore, the spectrometer can be very small and its cost reduced. Furthermore, space is saved by arranging the sample region on the outer surface of the spectrometer.

[0020] According to at least one embodiment of the spectrometer, the filter is configured to transmit electromagnetic radiation modulated by the modulation unit. For electromagnetic radiation emitted by the transmitter and modulated by the modulation unit, the filter may have a transmission coefficient of at least 0.9. Specifically, the filter has a transmission coefficient of at least 0.95 for electromagnetic radiation emitted by the transmitter and modulated by the modulation unit. For electromagnetic radiation with a wavelength different from the wavelength emitted by the transmitter, the filter may also have an absorption coefficient of at least 0.8. In this way, the filter absorbs electromagnetic radiation that is undesirable to be detected by the optical detector. Therefore, the signal-to-noise ratio of the spectrometer can be improved.

[0021] According to at least one embodiment of the spectrometer, the integrated circuit includes a lock-on detection function. The lock-on detection function is a phase-sensitive technique used to extract low-level signals hidden in noise. In this case, the lock-on detection function is used to detect electromagnetic radiation modulated by a modulation unit. The electromagnetic radiation arriving at the optical detector may also have components other than those modulated by the modulation unit. The lock-on detection function is able to extract modulated electromagnetic radiation from ambient electromagnetic radiation. Therefore, employing the lock-on detection function improves the signal-to-noise ratio.

[0022] According to at least one embodiment of the spectrometer, the optical detector is configured to detect electromagnetic radiation in the visible and infrared ranges. In particular, the optical detector is configured to detect electromagnetic radiation in the infrared range. Due to the spectrometer's configuration, a far-infrared sensitive optical detector can be used. Sensitivity in the far-infrared range (e.g., up to 10 μm) is advantageous because it allows for the analysis of a wider range of materials.

[0023] According to at least one embodiment of the spectrometer, the optical detector is either a photon detector or a thermal detector. Neither of these detectors requires cooling within the spectrometer described herein. The detector sensitivity is optimized by employing a modulation unit and a lock-on detection function using integrated circuits. Photon detectors have the advantage of high detectivity. Thermal detectors have the advantage of being able to detect electromagnetic radiation over a wide wavelength range. By using either photon or thermal detectors, the size of the spectrometer can be reduced because cooling is not required, and the cost of the spectrometer can also be reduced.

[0024] According to at least one embodiment of the spectrometer, an additional optical detector is arranged adjacent to the emitter. This additional optical detector can be configured to detect electromagnetic radiation emitted by the emitter and reflected at the sample material. This means that there exists an optical path from the emitter through the sample region toward the additional optical detector. By detecting the electromagnetic radiation reflected back from the modulation unit, the temperature drift of the emitter can be determined and calibrated. In this way, more repeatable and reliable measurements can be performed on the spectrometer.

[0025] According to at least one embodiment of the spectrometer, the emitter, modulation unit, filter, optical detector, and integrated circuit are arranged on the same side of the sample region. In other words, in a vertical direction perpendicular to the main extension plane of the integrated circuit, the emitter, modulation unit, filter, optical detector, and integrated circuit are arranged below the sample region. This means that the sample region can be arranged on the top side of the spectrometer. The advantage of this arrangement is that sample material can be arranged on the sample region. This makes it possible to analyze a wide variety of different materials. Furthermore, the spectrometer has a very compact design, thus allowing it to be integrated into a small, portable device. For the compact design of the spectrometer, its components can be integrated together. This means that different components of the spectrometer can overlap each other.

[0026] According to at least one embodiment of the spectrometer, a modulation unit is arranged between the emitter and the sample region in a vertical direction perpendicular to the main extension plane of the integrated circuit. This means that the electromagnetic radiation emitted by the emitter is modulated by the modulation unit before reaching the sample region. This arrangement makes the spectrometer design very compact.

[0027] According to at least one embodiment of the spectrometer, a transmission region is arranged vertically between the sample region and the emitter, wherein the transmission region has a transmittance of at least 0.7 for electromagnetic radiation emitted by the emitter. Specifically, the transmission region has a transmittance of at least 0.9 for electromagnetic radiation emitted by the emitter. The transmission region may also be arranged vertically between the sample region and the optical detector. This means that the transmission region covers both the emitter and the optical detector. Electromagnetic radiation emitted by the emitter can reach the sample region via the transmission region. Furthermore, electromagnetic radiation emitted by the emitter can reach the optical detector via the transmission region. The presence of sample material in close or direct contact with the sample region alters the intensity of the wavelength of electromagnetic radiation transmitted to the optical detector. This characteristic allows for the determination of changes in the intensity characteristics of the sample material.

[0028] According to at least one embodiment of the spectrometer, a sample region is arranged vertically between the emitter and the optical detector, and the sample region is arranged adjacent to an opening within the spectrometer. Vertically, the emitter is positioned above the sample region, which is positioned above the optical detector. The opening within the spectrometer is in direct contact with the spectrometer's environment. This means that gases in the spectrometer environment can reach the opening, and thus the sample region. The opening can be surrounded by the spectrometer from at least two different sides. The opening can be a channel extending through the spectrometer. To analyze the sample material, the sample material must be placed within the opening. For example, gases can easily reach the opening. Electromagnetic radiation emitted by the emitter can pass through the opening and the sample material. Therefore, the intensity of the wavelength transmitted by the sample material changes according to the absorption characteristics of the sample material. By detecting the transmitted electromagnetic radiation using the optical detector, the properties of the sample material can be determined. Thus, the spectrometer is capable of analyzing different materials.

[0029] According to at least one embodiment of the spectrometer, a filter is arranged vertically between the modulation unit and the optical detector. Electromagnetic radiation emitted by the transmitter reaches the modulation unit after passing through the sample region or transmission region. After modulation of the electromagnetic radiation, unwanted components are filtered out by the filter. Subsequently, the electromagnetic radiation is detected by the optical detector. Due to the use of locking technology, the wavelength of interest can be detected with higher precision.

[0030] According to at least one embodiment of the spectrometer, a modulation unit is arranged vertically between a filter and an optical detector. After passing through the sample region or transmission region, the electromagnetic radiation emitted by the emitter reaches the filter and filters out unwanted components. The filtered electromagnetic radiation is then modulated by the modulation unit. Subsequently, the electromagnetic radiation is detected by the optical detector. Due to the use of locking technology, the wavelength of interest can be detected with higher accuracy.

[0031] Furthermore, a portable device for the consumer electronics market is provided. The portable device includes the spectrometer. The portable device is particularly suitable for mobile phones, wearable devices, or laptop computers. The spectrometer is especially suitable for portable devices because it can be designed to be very small.

[0032] Furthermore, a method for detecting electromagnetic radiation is provided. The spectrometer can preferably be used in the method for detecting electromagnetic radiation described herein. This means that all features disclosed in the spectrometer are also disclosed in the method for detecting electromagnetic radiation, and vice versa.

[0033] According to at least one embodiment of a method for detecting electromagnetic radiation, the method includes emitting electromagnetic radiation by a transmitter. The electromagnetic radiation emitted by the transmitter may be broadband and / or in the visible and infrared ranges.

[0034] The method also includes directing the emitted electromagnetic radiation toward the sample region. For this purpose, the electromagnetic radiation emitted by the transmitter can be emitted in the direction of the sample region. In this case, redirection of the electromagnetic radiation is not required. This means that the main emitting surface of the transmitter faces the sample region.

[0035] The method also includes placing the sample material on or above the sample area. If the sample material is a solid or liquid, it can be placed directly on the sample area. If the sample material is a gas, the gas can be supplied from the spectrometer environment. In this way, the gas is in direct contact with or close to the sample area.

[0036] The method further includes time-modulating the electromagnetic radiation emitted by the transmitter in a modulation unit comprising an electrochromic material. The electromagnetic radiation is time-modulated by applying a modulation voltage to the electrochromic material. The electrochromic material changes its transmittance according to the applied voltage. Therefore, the modulation unit with the electrochromic material has the effect of a chopper.

[0037] The method also includes transmitting electromagnetic radiation within a predetermined wavelength range through a filter. The predetermined wavelength range depends on the characteristics of the filter. The filter can be configured to have a transmittance coefficient of at least 0.8 within the predetermined wavelength range. More possibly, the filter has a transmittance coefficient of at least 0.9 within the predetermined wavelength range.

[0038] The method also includes detecting electromagnetic radiation transmitted through the filter using an optical detector.

[0039] The modulation of the modulation unit is controlled by an integrated circuit. This means that the integrated circuit is configured to apply a voltage to the modulation unit. For this purpose, the electrochromic material of the modulation unit is electrically connected to the integrated circuit.

[0040] Because electromagnetic radiation is modulated by a modulation unit, it can be detected using lock-in techniques. The combination of using electrochromic materials in integrated circuits to modulate the electromagnetic radiation to be detected and lock-in techniques enables the detection of electromagnetic radiation with improved accuracy, particularly for electromagnetic radiation in the visible and / or infrared range. Since the components of a spectrometer can be arranged very compactly, spectrometers can be advantageously integrated into small devices, such as portable devices.

[0041] According to at least one embodiment of the method, the electromagnetic radiation emitted by the transmitter is modulated before passing through a filter, and the filter is configured to transmit the modulated electromagnetic radiation. In this way, the signal-to-noise ratio of the electromagnetic radiation to be detected by the optical detector is further improved.

[0042] The following description of the accompanying drawings further illustrates and explains exemplary embodiments. Components that have the same function or effect are denoted by the same reference numerals. Identical or functionally identical components may be described only with reference to the drawings in which they first appear. Their description is not necessarily repeated in subsequent drawings.

[0043] Figure 1A , Figure 1B , Figure 1C , Figure 1D and Figure 1E An exemplary embodiment of the spectrometer is shown.

[0044] Figure 2A , Figure 2B , Figure 2C , Figure 2D and Figure 2E Further exemplary embodiments of the spectrometer are shown.

[0045] Figure 3 A cross-section of an exemplary embodiment of the spectrometer is shown.

[0046] Figure 4 An exemplary embodiment of the modulation unit is shown.

[0047] Figure 5 The simulated transmission through the modulation unit is shown.

[0048] Figure 6 Another exemplary embodiment of the modulation unit is shown.

[0049] Figure 7 An exemplary embodiment of a portable device is shown.

[0050] exist Figure 1AAn exemplary embodiment of a spectrometer 10 is shown in the figure. The spectrometer 10 includes an emitter 11 configured to emit electromagnetic radiation. The emitter 11 is arranged adjacent to a sample region 12 disposed on an outer surface 13 of the spectrometer 10. The sample region 12 is arranged adjacent to an opening 22 within the spectrometer 10. The opening 22 extends completely through the spectrometer 10. The opening 22 is disposed between the emitter 11 and a modulation unit 14. This means that the opening 22 is a channel between the emitter 11 and the modulation unit 14. The sample region 12 is located on the outer surface of the spectrometer 10 within the opening 22. Within the opening 22, the outer surface of the spectrometer 10 is in direct contact with the environment of the spectrometer 10. The opening 22 is configured to allow gases from the environment of the spectrometer 10 to pass through the opening 22.

[0051] The modulation unit 14 includes an electrochromic material. Furthermore, the modulation unit 14 is configured to modulate electromagnetic radiation temporally. The spectrometer 10 also includes a filter 15 on which the modulation unit 14 is disposed. The filter 15 is disposed on an optical detector 16. The filter 15 is configured to transmit the electromagnetic radiation modulated by the modulation unit 14. Furthermore, the optical detector 16 is configured to detect electromagnetic radiation in the visible and infrared ranges. The optical detector 16 can be a photon detector or a thermal detector. The optical detector 16 is disposed on an integrated circuit 17, which has a main extension plane and includes a lock-on detection function. The electrochromic material of the modulation unit 14 is electrically connected to the integrated circuit 17. Thus, the integrated circuit 17 can control the modulation frequency.

[0052] In this configuration, there is an optical path for electromagnetic radiation emitted by the transmitter 11, which passes through the sample region 12, the modulation unit 14, and the filter 15 toward the optical detector 16.

[0053] In the vertical direction z, perpendicular to the main extension plane of integrated circuit 17, sample region 12 is arranged between emitter 11 and optical detector 16. Filter 15 is arranged in the vertical direction z between modulation unit 14 and optical detector 16. Opening 22 extends through spectrometer 10 in the transverse direction x, parallel to the main extension plane of integrated circuit 17.

[0054] Optionally, an additional optical detector 18 is arranged adjacent to the transmitter 11. Since the additional optical detector 18 is optional, it is separated from the transmitter 11 only by a dashed line. The additional optical detector 18 is configured to detect electromagnetic radiation emitted by the transmitter 11 and reflected by the sample material or modulation unit 14 within the opening 22. This allows for the determination and calibration of the temperature drift of the transmitter 11, making the measurements of the spectrometer 10 more repeatable and reliable. Figure 1A The illustrated embodiment is particularly suitable for monitoring the temperature drift of transmitter 11.

[0055] The spectrometer 10 described herein can be used in a method for detecting electromagnetic radiation. The method includes emitting electromagnetic radiation via an emitter 11. The emitted electromagnetic radiation is directed to a sample region 12. Figure 1A In this configuration, emitter 11 primarily emits electromagnetic radiation in the direction of sample region 12. Sample material is placed on or above sample region 12. Sample material can be solid, liquid, or gas. Figure 1A The illustrated embodiment is best suited for gases because they readily reach opening 22. The electromagnetic radiation emitted by emitter 11 and transmitted through the sample material is then time-modulated in modulation unit 14. Filter 15 transmits electromagnetic radiation within a predetermined wavelength range. Furthermore, filter 15 is configured to transmit modulated electromagnetic radiation. Subsequently, the electromagnetic radiation transmitted by filter 15 is detected by optical detector 16. Optical detector 16 converts the electromagnetic radiation arriving at it into a modulated voltage signal. This voltage signal is amplified by integrated circuit 17. From the voltage signal, it can be determined how the intensity of the electromagnetic radiation transmitted through the sample material is altered by the sample material. This allows the determination of the properties of the sample material.

[0056] Figure 1B Another exemplary embodiment of the spectrometer 10 is shown. This setup is related to… Figure 1A The difference lies in the arrangement of the modulation unit 14 and the filter 15 above the sample region 12. This means that the modulation unit 14 is arranged vertically between the emitter 11 and the filter 15. The filter 15 is arranged vertically between the sample region 12 and the modulation unit 14.

[0057] Figure 1C Another exemplary embodiment of the spectrometer 10 is shown. This setup is related to… Figure 1A The difference lies in the arrangement of the modulation unit 14, which is positioned vertically z-axis between the transmitter 11 and the sample region 12. The sample region 12 is positioned vertically z-axis between the modulation unit 14 and the filter 15.

[0058] Figure 1D Another exemplary embodiment of the spectrometer 10 is shown. This setup is related to… Figure 1B The difference lies in the interchange of the positions of the modulation unit 14 and the filter 15. This means that the filter 15 is arranged along the vertical direction z between the emitter 11 and the modulation unit 14. The modulation unit 14 is arranged along the vertical direction z between the filter 15 and the sample region 12.

[0059] Figure 1E Another exemplary embodiment of the spectrometer 10 is shown. This setup is related to… Figure 1AThe difference lies in the interchange of the positions of filter 15 and modulation unit 14. This means that filter 15 is arranged along the vertical direction z between sample region 12 and modulation unit 14. Modulation unit 14 is arranged along the vertical direction z between filter 15 and optical detector 16.

[0060] Figure 1A , Figure 1B , Figure 1C , Figure 1D and Figure 1E The embodiments shown illustrate different possibilities for stacking the various components of spectrometer 10 on top of each other. Some or all of the components of spectrometer 10 can be monolithically integrated. This means that some or all of the components of spectrometer 10 can be directly stacked on top of each other.

[0061] Figure 2A , Figure 2B , Figure 2C , Figure 2D and Figure 2E Another set of exemplary embodiments of the spectrometer 10 is shown. These arrangements differ from the embodiments shown in the previous figures in that the sample region 12 is arranged on the top side 19 of the spectrometer 10. This means that the emitter 11, modulation unit 14, filter 15, optical detector 16, and integrated circuit 17 are arranged on the same side of the sample region 12.

[0062] Figure 2A Another exemplary embodiment of the spectrometer 10 is shown. An emitter 11 is arranged on an integrated circuit 17. Optionally, an additional optical detector 18 is arranged adjacent to the emitter 11 on the integrated circuit 17. An optical detector 16 is arranged on the integrated circuit 17 along a lateral direction x, next to the emitter 11, wherein the lateral direction x extends parallel to the main extension plane of the integrated circuit 17. A filter 15 is arranged on the optical detector 16. A modulation unit 14 is arranged on the filter 15. A transmission region 21 is arranged on the emitter 11, the additional optical detector 18, and the modulation unit 14. The transmission region 21 has a transmittance of at least 0.7 for electromagnetic radiation emitted by the emitter 11. A sample region 12 is arranged on top of the transmission region 21. This means that the sample region 12 is arranged on the top side 19 of the spectrometer 10. The top side 19 of the spectrometer 10 forms an outer surface 13. Sample material can be easily placed on the sample region 12. Figures 2A to 2E The illustrated embodiments are particularly suitable for a wide variety of sample substances. Solids and liquids can be placed on sample area 12, and gases can be supplied in the environment of spectrometer 10.

[0063] Figure 2B Another exemplary embodiment of the spectrometer 10 is shown. This setup is related to… Figure 2AThe difference in the arrangement shown is that the modulation unit 14 is arranged on top of the transmitter 11. Furthermore, the filter 15 is arranged on top of the modulation unit 14. An optical detector 16 is arranged along the lateral direction x next to the transmitter 11, the modulation unit 14, and the filter 15.

[0064] Figure 2C Another exemplary embodiment of the spectrometer 10 is shown. This setup is related to… Figure 2A The difference in the arrangement shown is that the modulation unit 14 is arranged on top of the transmitter 11. The filter 15 and the optical detector 16 are arranged along the lateral direction x next to the transmitter 11 and the modulation unit 14.

[0065] Figure 2D Another exemplary embodiment of the spectrometer 10 is shown. This setup is related to… Figure 2B The difference in the arrangement shown is that the positions of the modulation unit 14 and the filter 15 are swapped. This means that the transmitter 11, the filter 15, and the modulation unit 14 are arranged next to the optical detector 16 along the lateral direction x.

[0066] Figure 2E Another exemplary embodiment of the spectrometer 10 is shown. This setup is related to… Figure 2A The difference in the arrangement shown is that the positions of the filter 15 and the modulation unit 14 are interchanged. This means that the modulation unit 14 is arranged between the filter 15 and the optical detector 16 along the vertical direction z.

[0067] Figure 3 A cross-section of another exemplary embodiment of the spectrometer 10 is shown. An emitter 11 and a further optical detector 18 are arranged adjacent to each other on an integrated circuit 17. A modulation unit 14 is arranged above the emitter 11 and the further optical detector 18. Furthermore, an optical detector 16 is arranged on the integrated circuit 17. The optical detector 16 is arranged spaced apart from the further optical detector 18 and the emitter 11. A filter 15 is arranged above the optical detector 16. A sample region 12 is arranged above the modulation unit 14 and the filter 15. The emitter 11 and the optical detector 16 are arranged in different cavities 20 of the spectrometer 10.

[0068] Figure 4 An exemplary embodiment of the modulation unit 14 is shown. The modulation unit 14 includes a first electrode 27, and a charge storage layer 25 is disposed on the first electrode 27. An ion-conducting layer 24 is disposed on the charge storage layer 25. An active layer 26 comprising an electrochromic material is disposed on the ion-conducting layer 24. A grid-shaped second electrode 28 is disposed on the active layer 26. The second electrode 28 is thin enough to have a transmittance of at least 0.9.

[0069] Figure 5The simulated transmission through modulation unit 14 is shown. Wavelengths are plotted in nanometers on the x-axis. Transmission is expressed as a percentage on the y-axis. The transmission of modulation unit 14, arranged as a Fabry-Perot interferometer filter 15, is simulated. Filter 15 has a peak transmission of 1500 nm. First electrode 27 and second electrode 28 are not included in the simulation.

[0070] The continuous line shows the transmission of the filter 15 without the modulation unit 14. The dotted line shows the transmission of the filter 15 with the modulation unit 14 in the maximum transmission state of the electrochromic material. The dashed line shows the transmission of the filter 15 with the modulation unit 14 in the minimum transmission state of the electrochromic material. By introducing the modulation unit 14, the maximum transmission is slightly reduced. For the minimum transmission state of the electrochromic material, the total transmission is reduced to below 5%. The electromagnetic radiation through the modulation unit 14 is modulated by switching between the maximum and minimum transmission states.

[0071] Figure 6 Another exemplary embodiment of the modulation unit 14 is shown. The modulation unit 14 has, as shown in the example below... Figure 4 The settings shown. Figure 6 The arrangement of the modulation unit 14 on top of the integrated circuit 17 is shown. The modulation unit 14 is fixed above the surface of the integrated circuit 17 by a first metal bracket 29 and a second metal bracket 30. The modulation unit 14 is clamped between the metal brackets 29 and 30. In this way, the position of the modulation unit 14 is fixed. The modulation unit 14 is electrically connected to the integrated circuit 17 through the metal brackets 29 and 30. The first metal bracket 29 is in electrical contact with the first electrode 27 of the modulation unit 14. The upper part of the first metal bracket 29 includes an isolator 31, such that the first metal bracket 29 is in electrical contact only with the first electrode 27. The second metal bracket 30 is in electrical contact with the second electrode 28. A portion of the second metal bracket 30 includes an isolator 31, such that the second metal bracket 30 is in electrical contact only with the second electrode 28.

[0072] Figure 7 An exemplary embodiment of a portable device 23 for the consumer electronics market is shown. The portable device 23 includes the spectrometer 10. The portable device 23 may be a mobile phone, wearable device, or laptop computer.

[0073] This patent application claims priority to European Patent Application 20173170.0, the disclosure of which is incorporated herein by reference.

[0074] Figure Labels

[0075] 10. Spectrometer

[0076] 11. Transmitter

[0077] 12 Sample Area

[0078] 13. Outer surface

[0079] 14 Modulation Unit

[0080] 15 Filters

[0081] 16 Optical detectors

[0082] 17 Integrated Circuits

[0083] 18. Other optical detectors

[0084] 19 Top side

[0085] 20 Cavity

[0086] 21 Transmission Area

[0087] 22 Opening

[0088] 23 Portable devices

[0089] 24 Ion Conducting Layer

[0090] 25 Charge storage layer

[0091] 26 Active layer

[0092] 27 First Electrode

[0093] 28 Second electrode

[0094] 29 First Metal Support

[0095] 30 Second metal bracket

[0096] 31 Isolation components

[0097] x Horizontal direction

[0098] z Vertical direction

Claims

1. A spectrometer (10), comprising: - A transmitter configured to emit electromagnetic radiation (11). - Sample area (12) arranged on the outer surface (13) of the spectrometer (10); -Including a modulation unit (14) for electrochromic materials; - Filter (15); -Optical detector (16); - Integrated circuits with a main extension plane (17); and -A light path for electromagnetic radiation emitted by the transmitter (11) and directed toward the optical detector (16) via the sample region (12), the modulation unit (14), and the filter (15), wherein - The electrochromic material is electrically connected to the integrated circuit (17), and -The modulation unit (14) is configured to modulate electromagnetic radiation in time. - wherein the sample region (12) is arranged in the vertical direction (z) between the emitter (11) and the optical detector (16), and the sample region (12) is arranged adjacent to the opening (22) in the spectrometer (10), wherein the vertical direction (z) is perpendicular to the main extension plane of the integrated circuit (17).

2. The spectrometer (10) as described in claim 1, wherein, The filter (15) is configured to transmit electromagnetic radiation modulated by the modulation unit (14).

3. The spectrometer (10) as described in claim 1, wherein, The integrated circuit (17) includes a lock detection function.

4. The spectrometer (10) as described in claim 1, wherein, The optical detector (16) is configured to detect electromagnetic radiation in the visible and infrared ranges.

5. The spectrometer (10) as described in claim 1, wherein, The optical detector (16) is a photon detector or a thermal detector.

6. The spectrometer (10) as claimed in claim 1, wherein, Another optical detector (18) is arranged adjacent to the transmitter (11).

7. The spectrometer (10) as claimed in claim 1, wherein, In the vertical direction (z) perpendicular to the main extension plane of the integrated circuit (17), the modulation unit (14) is arranged between the transmitter (11) and the sample region (12).

8. The spectrometer (10) as claimed in claim 1, wherein, In the vertical direction (z) perpendicular to the main extension plane of the integrated circuit (17), the filter (15) is arranged between the modulation unit (14) and the optical detector (16).

9. The spectrometer (10) as claimed in claim 1, wherein, In the vertical direction (z) perpendicular to the main extension plane of the integrated circuit (17), the modulation unit (14) is arranged between the filter (15) and the optical detector (16).

10. The spectrometer (10) as claimed in claim 1, wherein, The integrated circuit (17) is configured to control the frequency of the voltage applied to the electrochromic material.

11. The spectrometer (10) as claimed in claim 1, wherein, The intensity of electromagnetic radiation through the modulation unit (14) is modulated.

12. A portable device (23) for the consumer electronics market, the portable device (23) comprising the spectrometer (10) according to claim 1.

13. The portable device (23) of claim 12, wherein the portable device (23) is a mobile phone, wearable device or laptop computer.

14. A method for detecting electromagnetic radiation using a spectrometer (10) as described in claim 1, the method comprising: -Emit electromagnetic radiation through transmitter (11), -Guide the emitted electromagnetic radiation to the sample area (12). - Place the sample material on or above the sample area (12), - The electromagnetic radiation emitted by the transmitter (11) is modulated in time in the modulation unit (14) including the electrochromic material. - Electromagnetic radiation within a predetermined wavelength range is transmitted through the filter (15), and - The electromagnetic radiation transmitted by the filter (15) is detected by an optical detector (16), wherein The modulation of the modulation unit (14) is controlled by the integrated circuit (17). - wherein the sample region (12) is arranged in the vertical direction (z) between the emitter (11) and the optical detector (16), and the sample region (12) is arranged adjacent to the opening (22) in the spectrometer (10), wherein the vertical direction (z) is perpendicular to the main extension plane of the integrated circuit (17).

15. The method of claim 14, wherein, The electromagnetic radiation emitted by the transmitter (11) is modulated before passing through the filter (15), and the filter (15) is configured to transmit the modulated electromagnetic radiation.

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