Back driver and chip with overdrive capability
By using pull-up and pull-down circuits and bias circuits in the rear driver to provide voltage offset protection transistors, the transistor damage and reliability problems caused by overdrive design in semiconductor manufacturing are solved, and higher system reliability is achieved.
Patent Information
- Application Number
- CN202210911066.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Priority Date
- 2022-07-12
- Filing Date
- 2022-07-29
- Publication Date
- 2026-07-10
- Estimated Expiration
- 2042-07-29
AI Technical Summary
In semiconductor manufacturing, as technology advances, the voltage requirements of new-generation chips differ from those of older chips, leading to an increased need for overdrive design. Traditional designs may damage transistors, and multiplexers can cause reliability issues.
A rear driver with pull-up and pull-down circuits is used to provide voltage offset at the transistor gate through a bias circuit to balance the overdrive voltage, replacing the traditional multiplexer to protect the transistor. PMOS and NMOS transistors are coupled in series and voltage offset is provided through a diode string.
It effectively protects transistors from damage under overdrive voltage, improves system reliability, and avoids reliability problems caused by multiplexers in traditional designs.
Smart Images

Figure CN115811310B_ABST
Abstract
Citation Information
Patent Citations
Output buffer with protective limit of voltage across terminals of devices within the output buffer
US6081152A